INA212-Q1 [TI]

36-V, Single-Supply, 10-MHz, Rail-to-Rail Output Operational Amplifiers; 36 -V ,单电源, 10 - MHz的轨至轨输出运算放大器
INA212-Q1
型号: INA212-Q1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

36-V, Single-Supply, 10-MHz, Rail-to-Rail Output Operational Amplifiers
36 -V ,单电源, 10 - MHz的轨至轨输出运算放大器

运算放大器
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OPA172  
OPA2172  
OPA4172  
www.ti.com  
SBOS618 DECEMBER 2013  
36-V, Single-Supply, 10-MHz, Rail-to-Rail Output  
Operational Amplifiers  
Check for Samples: OPA172, OPA2172, OPA4172  
1
FEATURES  
DESCRIPTION  
The OPA172, OPA2172 and OPA4172 (OPAx172)  
23  
Wide Supply Range: +4.5 V to +36 V, ±2.25 V to  
±18 V  
are family of 36-V, single-supply, low-noise  
a
operational amplifiers with the ability to operate on  
supplies ranging from +4.5 V (±2.25 V) to +36 V (±18  
V). This latest addition of high voltage CMOS  
operational amplifiers, in conjunction with the  
Low Offset Voltage: ±0.2 mV  
Low Offset Drift: ±0.3 µV/°C  
Gain Bandwidth: 10 MHz  
OPAx171 and OPAx170 provide  
a
family of  
Low Input Bias Current: ±8 pA  
Low Quiescent Current: 1.6 mA per Amplifier  
Low Noise: 6 nV/Hz  
bandwidth, noise, and power options to meet the  
needs of a wide variety of applications. The OPAx172  
are available in micropackages and offer low offset,  
drift, and quiescent current. These devices also offer  
wide bandwidth, fast slew rate, and high output  
current drive capability. The single, dual, and quad  
versions all have identical specifications for maximum  
design flexibility.  
EMI and RFI Filtered Inputs  
Input Range Includes the Negative Supply  
Input Range Operates to Positive Supply  
Rail-to-Rail Output  
Unlike most op amps, which are specified at only one  
supply voltage, the OPAx172 family is specified from  
+4.5 V to +36 V. Input signals beyond the supply rails  
do not cause phase reversal. The input can operate  
100 mV below the negative rail and within 2 V of the  
top rail during normal operation. Note that these  
devices can operate with full rail-to-rail input 100 mV  
beyond the top rail, but with reduced performance  
within 2 V of the top rail.  
High Common-Mode Rejection: 120 dB  
Industry-Standard Packages:  
8-Pin SOIC  
8-Pin MSOP  
14-Pin SOIC  
14-Pin TSSOP  
microPackages:  
Single in SC-70, SOT-23  
The OPAx172 series of op amps are specified from  
–40°C to +125°C.  
APPLICATIONS  
PRODUCT FAMILY  
Tracking Amplifier in Power Modules  
Merchant Power Supplies  
Transducer Amplifiers  
Bridge Amplifiers  
DEVICE  
PACKAGE  
SC-70, SOT23-5, SO-8  
SO-8, MSOP-8  
OPA172 (single)(1)  
OPA2172 (dual)  
OPA4172 (quad)  
TSSOP-14, SO-14  
Temperature Measurements  
Strain Gauge Amplifiers  
Precision Integrators  
AMPLIFIER SELECTION TABLE  
QUIESCENT  
CURRENT  
(IQ)  
GAIN  
BANDWIDTH  
(GBW)  
VOLTAGE  
NOISE DENSITY  
(en)  
Battery-Powered Instruments  
Test Equipment  
DEVICE  
OPAx172  
OPAx171  
OPAx170  
1600 µA  
475 µA  
110 µA  
10 MHz  
3.0 MHz  
1.2 MHz  
6 nV/Hz  
14 nV/Hz  
19 nV/Hz  
(1) OPA172 SO-8 package is production data. All other devices  
are product preview.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
3
Bluetooth is a registered trademark of Bluetooth SIG, Inc.  
All other trademarks are the property of their respective owners.  
UNLESS OTHERWISE NOTED this document contains  
PRODUCTION DATA information current as of publication date.  
Products conform to specifications per the terms of Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2013, Texas Instruments Incorporated  
OPA172  
OPA2172  
OPA4172  
SBOS618 DECEMBER 2013  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
PACKAGE/ORDERING INFORMATION(1)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the  
device product folder at www.ti.com.  
ABSOLUTE MAXIMUM RATINGS(1)  
Over operating free-air temperature range, unless otherwise noted.  
VALUE  
UNIT  
V
Supply voltage  
±20 (+40 single supply)  
Common-mode  
Differential  
(V–) – 0.5 to (V+) + 0.5  
V
Voltage(2)  
Current  
Signal input  
terminals  
±0.5  
±10  
V
mA  
Output short circuit(3)  
Operating temperature  
Storage temperature  
Junction temperature  
Continuous  
–55 to +150  
–65 to +150  
+150  
°C  
°C  
°C  
kV  
Electrostatic  
discharge (ESD)  
ratings:  
Human body model (HBM)  
Charged device model (CDM)  
4
1
kV  
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
(2) Transient conditions that exceed these voltage ratings should be current limited to 10 mA or less.  
(3) Short-circuit to ground, one amplifier per package.  
2
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Copyright © 2013, Texas Instruments Incorporated  
Product Folder Links: OPA172 OPA2172 OPA4172  
OPA172  
OPA2172  
OPA4172  
www.ti.com  
SBOS618 DECEMBER 2013  
ELECTRICAL CHARACTERISTICS  
At TA = +25°C, VS = ±2.25 V to ±18 V, VCM = VOUT = VS/2, and RL = 10 kΩ connected to VS/2, unless otherwise noted.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
OFFSET VOLTAGE  
VOS  
Input offset voltage  
Over temperature  
Drift  
±0.2  
±1  
±1.15  
±1.5  
±3  
mV  
mV  
TA = –40°C to +125°C  
dVOS/dT  
PSRR  
TA = –40°C to +125°C  
TA = –40°C to +125°C  
±0.3  
±1  
µV/°C  
µV/V  
vs power supply  
INPUT BIAS CURRENT  
IB  
Input bias current  
±8  
±2  
±15  
±14  
±15  
±1  
pA  
nA  
pA  
nA  
Over temperature  
Input offset current  
Over temperature  
TA = –40°C to +125°C  
TA = –40°C to +125°C  
IOS  
NOISE  
En  
Input voltage noise  
f = 0.1 Hz to 10 Hz  
f = 100 Hz  
1.2  
8.6  
6
µVPP  
nV/Hz  
nV/Hz  
Input voltage noise  
density  
en  
in  
f = 1 kHz  
Input current noise  
density  
f = 1 kHz  
1.6  
fA/Hz  
INPUT VOLTAGE  
Common-mode voltage  
VCM  
(V–) – 0.1 V  
(V+) – 2 V  
V
range(1)  
VS = ±2.25 V, (V–) – 0.1 V < VCM < (V+) – 2 V,  
TA = –40°C to +125°C  
90  
104  
120  
dB  
dB  
Common-mode rejection  
ratio  
CMRR  
VS = ±18 V, (V–) – 0.1 V < VCM < (V+) – 2 V,  
TA = –40°C to +125°C  
110  
INPUT IMPEDANCE  
Differential  
Common-mode  
OPEN-LOOP GAIN  
100 || 4  
6 || 4  
MΩ || pF  
1013Ω || pF  
(V–) + 0.35 V < VO < (V+) – 0.35 V, RL = 10 kΩ,  
TA = –40°C to +125°C  
110  
130  
116  
dB  
dB  
AOL  
Open-loop voltage gain  
(V–) + 0.5 V < VO < (V+) – 0.5 V, RL = 2 kΩ,  
TA = –40°C to +125°C  
FREQUENCY RESPONSE  
GBP  
SR  
Gain bandwidth product  
10  
10  
MHz  
V/µs  
µs  
Slew rate  
G = +1  
To 0.1%, VS = ±18 V, G = +1, 10-V step  
To 0.01% (12 bit), VS = ±18 V, G = +1, 10-V step  
VIN × Gain > VS  
2
tS  
Settling time  
3.2  
200  
µs  
Overload recovery time  
ns  
Total harmonic distortion  
+ noise  
THD+N  
VS = +36 V, G = +1, f = 1 kHz, VO = 3.5 VRMS  
0.00005  
%
(1) The input range can be extended beyond (V+) – 2 V up to (V+) + 0.1 V. See the Typical Characteristics and Application Information  
sections for additional information.  
Copyright © 2013, Texas Instruments Incorporated  
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3
Product Folder Links: OPA172 OPA2172 OPA4172  
OPA172  
OPA2172  
OPA4172  
SBOS618 DECEMBER 2013  
www.ti.com  
ELECTRICAL CHARACTERISTICS (continued)  
At TA = +25°C, VS = ±2.25 V to ±18 V, VCM = VOUT = VS/2, and RL = 10 kΩ connected to VS/2, unless otherwise noted.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
OUTPUT  
RL = 10 kΩ  
RL = 2 kΩ  
RL = 10 kΩ  
RL = 2 kΩ  
RL = 10 kΩ  
RL = 2 kΩ  
RL = 10 kΩ  
RL = 2 kΩ  
75  
330  
80  
400  
20  
mV  
mV  
mV  
mV  
mV  
mV  
mV  
mV  
mA  
pF  
VS = +36 V  
VS = +4.5V  
VS = +36 V  
VS = +4.5 V  
Voltage output swing  
from rail  
VO  
10  
40  
50  
105  
110  
530  
20  
480  
Over temperature  
15  
55  
70  
ISC  
Short-circuit current  
Capacitive load drive  
+75/–75  
CLOAD  
See Typical Characteristics  
60  
Open-loop output  
impedance  
ZO  
f = 1 MHz, IO = 0 A  
Ω
POWER SUPPLY  
VS  
IQ  
Specified voltage range  
+4.5  
+36  
1.8  
2
V
Quiescent current per  
amplifier  
IO = 0 A  
1.6  
mA  
mA  
Over temperature  
IO = 0 A, TA = –40°C to +125°C  
TEMPERATURE  
Specified range  
Operating range  
–40  
–55  
+125  
+150  
°C  
°C  
THERMAL INFORMATION: OPA172  
OPA172  
THERMAL METRIC(1)  
D (SO)  
8 PINS  
126.5  
80.6  
DBV (SOT23)  
5 PINS  
227.9  
115.7  
65.9  
DCK (SC-70)  
UNITS  
5 PINS  
285.2  
60.5  
78.9  
0.8  
θJA  
Junction-to-ambient thermal resistance  
Junction-to-case(top) thermal resistance  
Junction-to-board thermal resistance  
θJC(top)  
θJB  
67.1  
°C/W  
ψJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case(bottom) thermal resistance  
31.0  
10.7  
ψJB  
66.6  
65.3  
77.9  
N/A  
θJC(bottom)  
N/A  
N/A  
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.  
4
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Copyright © 2013, Texas Instruments Incorporated  
Product Folder Links: OPA172 OPA2172 OPA4172  
OPA172  
OPA2172  
OPA4172  
www.ti.com  
SBOS618 DECEMBER 2013  
PIN CONFIGURATIONS  
DCK PACKAGE: OPA172  
SC-70  
D AND DGK PACKAGES: OPA2172  
SO-8 AND MSOP-8  
(TOP VIEW)  
(TOP VIEW)  
V+  
IN+  
V-  
1
2
3
5
4
OUT A  
-IN A  
+IN A  
V-  
1
2
3
4
8
7
6
5
V+  
OUT B  
-IN B  
+IN B  
OUT  
IN-  
DBV PACKAGE: OPA172  
SOT23-5  
(TOP VIEW)  
D AND PW PACKAGES: OPA4172  
SO-14 AND TSSOP-14  
(TOP VIEW)  
V+  
OUT  
V-  
1
2
3
5
4
OUT A  
-IN A  
+IN A  
V+  
1
2
3
4
5
6
7
14 OUT D  
13 -IN D  
12 +IN D  
11 V-  
-IN  
+IN  
D PACKAGE: OPA172  
SO-8  
+IN B  
-IN B  
OUT B  
10 +IN C  
(TOP VIEW)  
9
8
-IN C  
NC(1)  
-IN  
+IN  
V-  
1
2
3
4
8
7
6
5
NC(1)  
V+  
OUT C  
OUT  
NC(1)  
(1) No internal connection.  
NOTE: OPA172 D package is production data. All other packages are product preview.  
Copyright © 2013, Texas Instruments Incorporated  
Submit Documentation Feedback  
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Product Folder Links: OPA172 OPA2172 OPA4172  
OPA172  
OPA2172  
OPA4172  
SBOS618 DECEMBER 2013  
www.ti.com  
TYPICAL CHARACTERISTICS: TABLE OF GRAPHS  
Table 1. List of Typical Characteristics  
DESCRIPTION  
Offset Voltage Production Distribution  
FIGURE  
Figure 1  
Offset Voltage Drift Distribution  
Offset Voltage vs Temperature (VS = ±18 V)  
Offset Voltage vs Common-Mode Voltage (VS = ±18 V)  
Offset Voltage vs Common-Mode Voltage (Upper Stage)  
Offset Voltage vs Power Supply  
Figure 2  
Figure 3  
Figure 4  
Figure 5  
Figure 6  
IB vs Common-Mode Voltage  
Figure 7  
Input Bias Current vs Temperature  
Output Voltage Swing vs Output Current (Maximum Supply)  
CMRR and PSRR vs Frequency (Referred-to Input)  
CMRR vs Temperature  
Figure 8  
Figure 9  
Figure 10  
Figure 11  
PSRR vs Temperature  
Figure 12  
0.1-Hz to 10-Hz Noise  
Figure 13  
Input Voltage Noise Spectral Density vs Frequency  
THD+N Ratio vs Frequency  
Figure 14  
Figure 15  
THD+N vs Output Amplitude  
Figure 16  
Quiescent Current vs Temperature  
Quiescent Current vs Supply Voltage  
Open-Loop Gain and Phase vs Frequency  
Closed-Loop Gain vs Frequency  
Figure 17  
Figure 18  
Figure 19  
Figure 20  
Open-Loop Gain vs Temperature  
Figure 21  
Open-Loop Output Impedance vs Frequency  
Small-Signal Overshoot vs Capacitive Load (100-mV Output Step)  
Positive Overload Recovery  
Figure 22  
Figure 23, Figure 24  
Figure 25, Figure 26  
Figure 27, Figure 28  
Figure 29, Figure 30  
Figure 31, Figure 32  
Figure 33, Figure 34  
Figure 35  
Negative Overload Recovery  
Small-Signal Step Response (10 mV)  
Small-Signal Step Response (100 mV)  
Large-Signal Step Response (1 V)  
Large-Signal Settling Time (10-V Positive Step)  
Large-Signal Settling Time (10-V Negative Step)  
No Phase Reversal  
Figure 36  
Figure 37  
Short-Circuit Current vs Temperature  
Maximum Output Voltage vs Frequency  
EMIRR vs Frequency  
Figure 38  
Figure 39  
Figure 40  
6
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Product Folder Links: OPA172 OPA2172 OPA4172  
 
OPA172  
OPA2172  
OPA4172  
www.ti.com  
SBOS618 DECEMBER 2013  
TYPICAL CHARACTERISTICS  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
25  
25  
20  
15  
10  
5
Distribution Taken From 5185 Amplifiers  
Distribution Taken From 47 Amplifiers  
Temperature = -40ƒC to 125ƒC  
20  
15  
10  
5
0
0
Offset Voltage Drift (µV/ƒC)  
Offset Voltage (mV)  
C013  
C013  
Figure 1. OFFSET VOLTAGE PRODUCTION DISTRIBUTION  
Figure 2. OFFSET VOLTAGE DRIFT PRODUCTION  
DISTRIBUTION  
250  
225  
5 Typical Units Shown  
VS = ±18 V  
5 Typical Units Shown  
VS = ±18 V  
200  
150  
75  
VCM =16V  
150  
100  
50  
VCM = -18.1V  
0
0
±50  
±100  
±150  
±200  
±250  
±75  
±150  
±225  
±75 ±50 ±25  
0
25  
50  
75  
100 125 150  
±20  
±15  
±10  
±5  
0
5
10  
15  
20  
Temperature (ƒC)  
C001  
VCM (V)  
C001  
Figure 3. OFFSET VOLTAGE vs TEMPERATURE  
(VS = ±18 V)  
Figure 4. OFFSET VOLTAGE vs COMMON-MODE VOLTAGE  
(VS = ±18 V)  
500  
20  
10  
5 Typical Units Shown  
5 Typical Units Shown  
VS = ±18 V  
400  
VS = ±2.25V to “18V  
Vs = ±2.25V  
300  
0
200  
100  
-10  
-20  
-30  
-40  
-50  
0
±100  
±200  
±300  
±400  
±500  
0.0  
2.0  
4.0  
6.0 8.0 10.0 12.0 14.0 16.0 18.0  
VSUPPLY (V)  
14  
15  
16  
17  
18  
VCM (V)  
C001  
C001  
Figure 5. Offset Voltage vs Common-Mode Voltage  
(Upper Stage)  
Figure 6. OFFSET VOLTAGE vs POWER SUPPLY  
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Product Folder Links: OPA172 OPA2172 OPA4172  
OPA172  
OPA2172  
OPA4172  
SBOS618 DECEMBER 2013  
www.ti.com  
TYPICAL CHARACTERISTICS (continued)  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
12  
10  
8
8000  
6000  
4000  
2000  
0
IB+  
IB -  
Ios  
IbP  
6
IbN  
4
2
0
±2  
±4  
Ios  
TA = 25°C  
±2000  
±18.0 ±13.5 ±9.0 ±4.5  
0.0  
4.5  
9.0  
13.5 18.0  
±50  
±25  
0
25  
50  
75  
100  
125  
150  
VCM (V)  
Temperature (ƒC)  
C001  
C001  
Figure 7. INPUT BIAS CURRENT vs COMMON-MODE  
VOLTAGE  
Figure 8. INPUT BIAS CURRENT vs TEMPERATURE  
160.0  
18  
140.0  
120.0  
100.0  
80.0  
60.0  
40.0  
20.0  
0.0  
- 40ƒC  
12  
+25°C  
6
0
+85ƒC  
+125ƒ  
-6  
+PSRR  
-PSRR  
CMRR  
+125°C  
-12  
-18  
- 40°C  
1
10  
100  
1k  
10k  
100k  
1M  
0
10 20 30 40 50 60 70 80 90 100 110  
C012  
Frequency (Hz)  
Iout (mA)  
C001  
Figure 9. OUTPUT VOLTAGE SWING vs OUTPUT  
CURRENT (Maximum Supply)  
Figure 10. CMRR AND PSRR vs FREQUENCY  
(Referred-to-Input)  
30  
20  
10  
8
VS = ±2.25V, -ꢅꢂꢆꢇ9ꢃ”ꢃ9CM ”ꢃꢈꢂꢅꢇ9  
6
10  
4
2
0
0
VS = “18 V, -ꢀꢁꢂꢀ9ꢃ”ꢃ9CM ”ꢃꢀꢄ9  
±10  
±2  
±75 ±50 ±25  
0
25  
50  
75  
100 125 150  
±75 ±50 ±25  
0
25  
50  
75  
100 125 150  
Temperature (ƒC)  
Temperature (ƒC)  
C001  
C001  
Figure 11. CMRR vs TEMPERATURE  
Figure 12. PSRR vs TEMPERATURE  
8
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OPA4172  
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SBOS618 DECEMBER 2013  
TYPICAL CHARACTERISTICS (continued)  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
1000  
100  
10  
Peak-to-Peak Noise = 1.20 Vpp  
1
Time (1 s/div)  
0.1  
1
10  
100  
1k  
10k  
100k  
C001  
C002  
Frequency (Hz)  
Figure 13. 0.1-Hz TO 10-Hz NOISE  
Figure 14. INPUT VOLTAGE NOISE SPECTRAL DENSITY vs  
FREQUENCY  
0.01  
0.001  
-80  
0.1  
0.01  
-60  
G = +1 V/V, RL = 10 k  
G = +1 V/V, RL = 2 kꢀ  
G = +1 V/V, RL = 600 ꢀ  
G = -1 V/V, RL = 10 kꢀ  
G = -1 V/V, RL = 2 kꢀ  
G = -1 V/V, RL = 600 ꢀ  
G = +1 V/V, RL = 10 k  
G = +1 V/V, RL = 2 kꢀ  
G = +1 V/V, RL = 600 ꢀ  
G = -1 V/V, RL = 10 kꢀ  
G = -1 V/V, RL = 2 kꢀ  
G = -1 V/V, RL = 600 ꢀ  
-80  
-100  
-120  
-140  
0.001  
-100  
-120  
-140  
0.0001  
0.00001  
0.0001  
VOUT = 3.5 VRMS  
BW = 80 kHz  
f = 1 kHz  
BW = 80 kHz  
0.00001  
10  
100  
1k  
10k  
0.01  
0.1  
1
10  
Frequency (Hz)  
Output Amplitude (VRMS)  
C007  
C008  
Figure 15. THD+N RATIO vs FREQUENCY  
Figure 16. THD+N vs OUTPUT AMPLITUDE  
2.0  
1.8  
1.6  
1.4  
1.2  
1.8  
1.7  
1.6  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
Vs = ±18V  
Vs = ±2.25V  
±75 ±50 ±25  
0
25  
50  
75  
100 125 150  
0
4
8
12  
16  
20  
24  
28  
32  
36  
Temperature (ƒC)  
Supply Voltage (V)  
C001  
C001  
Figure 17. QUIESCENT CURRENT vs TEMPERATURE  
Figure 18. QUIESCENT CURRENT vs SUPPLY VOLTAGE  
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TYPICAL CHARACTERISTICS (continued)  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
140  
120  
100  
80  
180  
135  
90  
25.0  
20.0  
15.0  
10.0  
5.0  
CLOAD = 15 pF  
Open-Loop Gain  
Phase  
60  
0.0  
40  
±5.0  
±10.0  
±15.0  
±20.0  
20  
45  
G = +1  
G = -10  
G = -1  
0
±20  
0
1
10  
100  
1k  
10k  
100k  
1M  
10M  
1000  
10k  
100k  
1M  
10M  
Frequency (Hz)  
C004  
C003  
Frequency (Hz)  
Figure 19. OPEN-LOOP GAIN AND PHASE vs FREQUENCY  
Figure 20. CLOSED-LOOP GAIN vs FREQUENCY  
2.0  
1000  
100  
10  
1
1.5  
1.0  
Vs = 4.5 V  
0.5  
Vs = 36 V  
0.0  
RL = 10kŸ  
±0.5  
0
±75 ±50 ±25  
0
25  
50  
75  
100 125 150  
10  
100  
1k  
10k  
100k  
1M  
10M  
100M  
Temperature (ƒC)  
Frequency (Hz)  
C001  
C016  
Figure 21. OPEN-LOOP GAIN vs TEMPERATURE  
Figure 22. OPEN-LOOP OUTPUT IMPEDANCE vs  
FREQUENCY  
60  
50  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
RI  
=
1
k  
RF  
=
+
1 kꢀ  
G = +1  
G = -1  
18  
V
V
±
ROUT  
+
OPA172  
VIN  
= 100mV  
+
CL  
±
±
18  
+
18  
V
V
ROUT = 0  
ROUT= 0  
±
ROUT  
OPA172  
+
+
RL  
CL  
R
= 25 ꢀ  
RO = 25  
RRO ==2255ꢀ  
OUT  
VIN = 100mV  
OUT  
±
18  
±
RRO ==5500 ꢀ  
RO = 50  
ROUT= 50 ꢀ  
OUT  
0p  
100p  
200p  
300p  
400p  
500p  
0p  
100p  
200p  
300p  
400p  
500p  
Capacitive Load (F)  
Capacitive Load (F)  
C013  
C013  
Figure 23. SMALL-SIGNAL OVERSHOOT vs CAPACITIVE  
LOAD (100-mV Output Step)  
Figure 24. SMALL-SIGNAL OVERSHOOT vs CAPACITIVE  
LOAD (100-mV Output Step)  
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TYPICAL CHARACTERISTICS (continued)  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
RI = 1 k  
RF = 10 kꢁ  
+ 18 V  
±
+
OPA172  
VOUT  
VIN = 2V  
+
VOUT  
±
± 18 V  
RI  
=
1
k  
RF = 10 kꢁ  
+
18  
V
VOUT  
±
+
OPA172  
VOUT  
VIN  
= 2V  
+
±
±
18  
V
VIN  
VIN  
Time (1 s/div)  
Time (1 s/div)  
C009  
C010  
C006  
C009  
C010  
C014  
Figure 25. POSITIVE OVERLOAD RECOVERY  
Figure 26. POSITIVE OVERLOAD RECOVERY  
(Zoomed In)  
VIN  
VIN  
RI  
=
1
k  
RF = 10 kꢁ  
+
18  
V
±
+
OPA172  
VOUT  
VIN  
= 2V  
+
±
±
18  
V
VOUT  
RI  
=
1 k  
RF  
=
10 kꢁ  
+
18 V  
VOUT  
±
+
OPA172  
VOUT  
VIN  
= 2V  
+
±
± 18 V  
Time (1 s/div)  
Time (1 s/div)  
Figure 27. NEGATIVE OVERLOAD RECOVERY  
Figure 28. NEGATIVE OVERLOAD RECOVERY  
(Zoomed In)  
+ 18 V  
RL  ꢀꢁNŸ  
CL = 10pF  
CL = 10pF  
±
OPA172  
+
+
CL  
VIN = 10mV  
± 18 V  
±
RI  
=
1
k  
RF  
=
+
1 kꢀ  
18  
V
±
+
OPA172  
VIN  
= 10mV  
+
RL  
CL  
±
±
18  
V
Time (200 ns/div)  
Time (200 ns/div)  
Figure 29. SMALL-SIGNAL STEP RESPONSE  
(10 mV, G = –1)  
Figure 30. SMALL-SIGNAL STEP RESPONSE  
(10 mV, G = +1)  
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TYPICAL CHARACTERISTICS (continued)  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
+ 18 V  
CL = 10pF  
RL  ꢀꢁNŸ  
CL = 10pF  
±
OPA172  
+
+
CL  
VIN = 100mV  
± 18 V  
±
RI  
=
1
k  
RF  
=
+
1 kꢀ  
18  
V
±
+
OPA172  
VIN  
= 100mV  
+
RL  
CL  
±
±
18  
V
Time (200 ns/div)  
Time (200 ns/div)  
C006  
C014  
Figure 31. SMALL-SIGNAL STEP RESPONSE  
(100 mV, G = –1)  
Figure 32. SMALL-SIGNAL STEP RESPONSE  
(100 mV, G = +1)  
+ 18 V  
RL  ꢀꢁNŸ  
CL = 10 pF  
CL = 10pF  
±
OPA172  
+
+
CL  
VIN = 10V  
± 18 V  
±
RI  
=
1
k  
RF  
=
+
1 kꢀ  
18  
V
±
+
OPA172  
VIN  
= 10V  
+
RL  
CL  
±
±
18  
V
Time (500 ns/div)  
Time (500 ns/div)  
C005  
C014  
Figure 33. LARGE-SIGNAL STEP RESPONSE  
(10 V, G = –1)  
Figure 34. LARGE-SIGNAL STEP RESPONSE  
(10 V, G = +1)  
20  
15  
10  
5
20  
15  
10  
5
G = +1  
CL = 10 pF  
G = +1  
CL = 10 pF  
0
0
-5  
-5  
0.1% Settling = ±10 mV  
0.1% Settling = ±10 mV  
-10  
-15  
-20  
-10  
-15  
-20  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
Time (s)  
Time (s)  
C034  
C034  
Figure 35. LARGE-SIGNAL SETTLING TIME  
(10-V Positive Step)  
Figure 36. LARGE-SIGNAL SETTLING TIME  
(10-V Negative Step)  
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TYPICAL CHARACTERISTICS (continued)  
VS = ±18 V, VCM = VS/2, RLOAD = 10 kΩ connected to VS/2, and CL = 100 pF, unless otherwise noted.  
100  
+ 18 V  
±
OPA172  
VOUT  
VOUT  
+
+
75  
50  
25  
0
± 18 V  
37 VPP  
ISC, Sink “18V  
±
Sine Wave  
(±18.5V)  
I
SC, Source ±18V  
VIN  
Time (200 s/div)  
±75 ±50 ±25  
0
25  
50  
75  
100 125 150  
C011  
Temperature (ƒC)  
C001  
Figure 37. NO PHASE REVERSAL  
Figure 38. SHORT-CIRCUIT CURRENT vs TEMPERATURE  
160.0  
30  
25  
20  
15  
10  
5
PRF = -10 dBm  
VSUPPLY = ±18 V  
VCM = 0 V  
VS = ±15 V  
140.0  
120.0  
100.0  
80.0  
60.0  
40.0  
20.0  
0.0  
Maximum output voltage without  
slew-rate induced distortion.  
VS = ±5 V  
VS = ±2.25 V  
0
10k  
100k  
1M  
Frequency (Hz)  
10M  
10M  
100M  
Frequency (Hz)  
1G  
10G  
C017  
C033  
Figure 39. MAXIMUM OUTPUT VOLTAGE vs FREQUENCY  
Figure 40. EMIRR vs FREQUENCY  
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APPLICATION INFORMATION  
The OPAx172 family of operational amplifiers provide high overall performance, making them ideal for many  
general-purpose applications. The excellent offset drift of only 1.5 µV/°C (max) provides excellent stability over  
the entire temperature range. In addition, the device offers very good overall performance with high CMRR,  
PSRR, AOL and THD.  
OPERATING CHARACTERISTICS  
The OPAx172 family of amplifiers is specified for operation from 4.5 V to 36 V (±2.25 V to ±18 V). Many of the  
specifications apply from –40°C to +125°C. Parameters that can exhibit significant variance with regard to  
operating voltage or temperature are presented in the Typical Characteristics.  
EMI REJECTION  
The OPAx172 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from  
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and  
digital components. EMI immunity can be improved with circuit design techniques; the OPAx172 benefits from  
these design improvements. Texas Instruments has developed the ability to accurately measure and quantify the  
immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz.  
Figure 41 shows the results of this testing on the OPAx172. Table 2 shows the EMIRR IN+ values for the  
OPAx172 at particular frequencies commonly encountered in real-world applications. Applications listed in  
Table 2 can be centered on or operated near the particular frequency shown. Detailed information can also be  
found in Application Report SBOA128, EMI Rejection Ratio of Operational Amplifiers, available for download  
from www.ti.com.  
160.0  
PRF = -10 dBm  
VSUPPLY = ±18 V  
VCM = 0 V  
140.0  
120.0  
100.0  
80.0  
60.0  
40.0  
20.0  
0.0  
10M  
100M  
Frequency (Hz)  
1G  
10G  
C017  
Figure 41. EMIRR Testing  
Table 2. OPAx172 EMIRR IN+ for Frequencies of Interest  
FREQUENCY  
APPLICATION OR ALLOCATION  
EMIRR IN+  
Mobile radio, mobile satellite, space operation, weather, radar, ultrahigh frequency  
(UHF) applications  
400 MHz  
47.6 dB  
Global system for mobile communications (GSM) applications, radio  
communication, navigation, GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF  
applications  
900 MHz  
1.8 GHz  
2.4 GHz  
58.5 dB  
68 dB  
GSM applications, mobile personal communications, broadband, satellite, L-band  
(1 GHz to 2 GHz)  
802.11b, 802.11g, 802.11n, Bluetooth®, mobile personal communications,  
industrial, scientific and medical (ISM) radio band, amateur radio and satellite, S-  
band (2 GHz to 4 GHz)  
69.2 dB  
3.6 GHz  
5.0 GHz  
Radiolocation, aero communication and navigation, satellite, mobile, S-band  
82.9 dB  
114 dB  
802.11a, 802.11n, aero communication and navigation, mobile communication,  
space and satellite operation, C-band (4 GHz to 8 GHz)  
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GENERAL LAYOUT GUIDELINES  
For best operational performance of the device, good printed circuit board (PCB) layout practices are  
recommended. Including:  
Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as  
close to the device as possible. A single bypass capacitor from V+ to ground is applicable to single-  
supply applications.  
In order to reduce parasitic coupling, run the input traces as far away from the supply lines as possible.  
A ground plane helps distribute heat and reduces EMI noise pickup.  
Place the external components as close to the device as possible. This configuration prevents parasitic  
errors (such as the Seebeck effect) from occurring.  
Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly  
reduce leakage currents from nearby traces that are at different potentials.  
COMMON-MODE VOLTAGE RANGE  
The input common-mode voltage range of the OPAx172 series extends 100 mV below the negative rail and  
within 2 V of the top rail for normal operation.  
This device can operate with full rail-to-rail input 100 mV beyond the top rail, but with reduced performance within  
2 V of the top rail. The typical performance in this range is summarized in Table 3.  
Table 3. Typical Performance Range (VS = ±18V)  
PARAMETER  
Input Common-Mode Voltage  
Offset voltage  
MIN  
TYP  
MAX  
UNIT  
V
(V+) – 2  
(V+) + 0.1  
5
10  
70  
60  
4
mV  
vs Temperature (TA = –40°C to +125°C)  
Common-mode rejection  
Open-loop gain  
µV/°C  
dB  
dB  
GBW  
MHz  
V/µs  
nV/Hz  
Slew rate  
4
Noise at f = 1 kHz  
22  
PHASE-REVERSAL PROTECTION  
The OPAx172 family has an internal phase-reversal protection. Many op amps exhibit a phase reversal when the  
input is driven beyond its linear common-mode range. This condition is most often encountered in noninverting  
circuits when the input is driven beyond the specified common-mode voltage range, causing the output to  
reverse into the opposite rail. The input of the OPAx172 prevents phase reversal with excessive common-mode  
voltage. Instead, the output limits into the appropriate rail. This performance is shown in Figure 42.  
+ 18 V  
±
OPA172  
VOUT  
VOUT  
+
+
± 18 V  
37 VPP  
±
Sine Wave  
(±18.5V)  
VIN  
Time (200 s/div)  
C011  
Figure 42. No Phase Reversal  
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CAPACITIVE LOAD AND STABILITY  
The dynamic characteristics of the OPAx172 have been optimized for commonly-encountered operating  
conditions. The combination of low closed-loop gain and high capacitive loads decreases the phase margin of  
the amplifier and can lead to gain peaking or oscillations. As a result, heavier capacitive loads must be isolated  
from the output. The simplest way to achieve this isolation is to add a small resistor (for example, ROUT = 50 Ω)  
in series with the output. Figure 43 and Figure 44 illustrate graphs of small-signal overshoot versus capacitive  
load for several values of ROUT. Also, refer to Application Bulletin SBOA015 (AB-028), Feedback Plots Define Op  
Amp AC Performance, available for download from www.ti.com, for details of analysis techniques and application  
circuits.  
60  
RI  
=
1
kꢀ  
RF  
=
+
1 kꢀ  
G = -1  
18  
V
±
ROUT  
50  
40  
30  
20  
10  
0
+
OPA172  
VIN  
= 100mV  
+
CL  
±
±
18  
V
ROUT = 0 ꢀ  
R
= 25 ꢀ  
RO = 25  
OUT  
RRO ==5500 ꢀ  
OUT  
0p  
100p  
200p  
300p  
400p  
500p  
Capacitive Load (F)  
C013  
Figure 43. Small-Signal Overshoot vs Capacitive Load (100-mV Output Step)  
50  
G = +1  
40  
30  
20  
+
18  
V
V
ROUT= 0 ꢀ  
±
ROUT  
OPA172  
10  
0
+
+
RL  
CL  
RRO ==2255ꢀ  
VIN  
= 100mV  
OUT  
±
18  
±
RO = 50  
ROUT= 50 ꢀ  
0p  
100p  
200p  
300p  
400p  
500p  
Capacitive Load (F)  
C013  
Figure 44. Small-Signal Overshoot vs Capacitive Load (100-mV Output Step)  
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ELECTRICAL OVERSTRESS  
Designers often ask questions about the capability of an operational amplifier to withstand electrical overstress.  
These questions tend to focus on the device inputs, but may involve the supply voltage pins or even the output  
pin. Each of these different pin functions have electrical stress limits determined by the voltage breakdown  
characteristics of the particular semiconductor fabrication process and specific circuits connected to the pin.  
Additionally, internal electrostatic discharge (ESD) protection is built into these circuits to protect them from  
accidental ESD events both before and during product assembly.  
Having a good understanding of this basic ESD circuitry and its relevance to an electrical overstress event is  
helpful. See Figure 45 for an illustration of the ESD circuits contained in the OPAx172 (indicated by the dashed  
line area). The ESD protection circuitry involves several current-steering diodes connected from the input and  
output pins and routed back to the internal power-supply lines, where the diodes meet at an absorption device  
internal to the operational amplifier. This protection circuitry is intended to remain inactive during normal circuit  
operation.  
TVS  
RF  
+VS  
VDD  
OPA172  
R1  
RS  
250Ÿꢀ  
250Ÿꢀ  
IN-  
IN+  
Power supply  
ESD cell  
ID  
VIN  
RL  
+
±
VSS  
-VS  
TVS  
Figure 45. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application  
An ESD event produces a short-duration, high-voltage pulse that is transformed into a short-duration, high-  
current pulse while discharging through a semiconductor device. The ESD protection circuits are designed to  
provide a current path around the operational amplifier core to prevent damage. The energy absorbed by the  
protection circuitry is then dissipated as heat.  
When an ESD voltage develops across two or more amplifier device pins, current flows through one or more  
steering diodes. Depending on the path that the current takes, the absorption device may activate. The  
absorption device has a trigger, or threshold voltage, that is above the normal operating voltage of the OPAx172  
but below the device breakdown voltage level. When this threshold is exceeded, the absorption device quickly  
activates and clamps the voltage across the supply rails to a safe level.  
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When the operational amplifier connects into a circuit (such as the one Figure 45 depicts), the ESD protection  
components are intended to remain inactive and do not become involved in the application circuit operation.  
However, circumstances may arise where an applied voltage exceeds the operating voltage range of a given pin.  
If this condition occurs, there is a risk that some internal ESD protection circuits can turn on and conduct current.  
Any such current flow occurs through steering-diode paths and rarely involves the absorption device.  
Figure 45 shows a specific example where the input voltage (VIN) exceeds the positive supply voltage (+VS) by  
500 mV or more. Much of what happens in the circuit depends on the supply characteristics. If +VS can sink the  
current, one of the upper input steering diodes conducts and directs current to +VS. Excessively high current  
levels can flow with increasingly higher VIN. As a result, the data sheet specifications recommend that  
applications limit the input current to 10 mA.  
If the supply is not capable of sinking the current, VIN can begin sourcing current to the operational amplifier, and  
then take over as the source of positive supply voltage. The danger in this case is that the voltage can rise to  
levels that exceed the operational amplifier absolute maximum ratings.  
Another common question involves what happens to the amplifier if an input signal is applied to the input while  
the power supplies +VS or –VS are at 0 V. Again, this question depends on the supply characteristic while at 0 V,  
or at a level below the input-signal amplitude. If the supplies appear as high impedance, then the operational  
amplifier supply current can be supplied by the input source through the current-steering diodes. This state is not  
a normal bias condition; the amplifier most likely will not operate normally. If the supplies are low impedance,  
then the current through the steering diodes can become quite high. The current level depends on the ability of  
the input source to deliver current, and any resistance in the input path.  
If there is any uncertainty about the ability of the supply to absorb this current, add external zener diodes to the  
supply pins, as shown in Figure 45. Select the zener voltage so that the diode does not turn on during normal  
operation. However, the zener voltage should be low enough so that the zener diode conducts if the supply pin  
begins to rise above the safe-operating, supply-voltage level.  
The OPAx172 input terminals are protected from excessive differential voltage with back-to-back diodes, as  
shown in Figure 45. In most circuit applications, the input protection circuitry has no effect. However, in low-gain  
or G = 1 circuits, fast-ramping input signals can forward-bias these diodes because the output of the amplifier  
cannot respond rapidly enough to the input ramp. If the input signal is fast enough to create this forward-bias  
condition, limit the input signal current to 10 mA or less. If the input signal current is not inherently limited, an  
input series resistor can be used to limit the input signal current. This input series resistor degrades the low-noise  
performance of the OPAx172. Figure 45 shows an example configuration that implements a current-limiting  
feedback resistor.  
OVERLOAD RECOVERY  
Overload recovery is defined as the time it takes for the op amp output to recover from the saturated state to the  
linear state. The output devices of the op amp enter the saturation region when the output voltage exceeds the  
rated operating voltage, either due to the high input voltage or the high gain. After the device enters the  
saturation region, the charge carriers in the output devices need time to return back to the normal state. After the  
charge carriers return back to the equilibrium state, the device begins to slew at the normal slew rate. Thus, the  
propagation delay in case of an overload condition is the sum of the overload recovery time and the slew time.  
The overload recovery time for the OPAx172 is approximately 200 ns.  
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APPLICATION EXAMPLES  
The following application examples highlight only a few of the circuits where the OPAx172 can be used.  
BI-DIRECTIONAL CURRENT SOURCE  
The improved Howland current pump topology shown in Figure 46 provides excellent performance due to the  
extremely tight tolerances of the on chip resistors of the INA132. By buffering the output using and OPA172, the  
output current the circuit is able to deliver is greatly extended.  
The circuit dc transfer function is show in Equation 1:  
IOUT = VIN / R1  
(1)  
The OPA172 can also be used as the feedback amplifier because the low bias current will minimize error  
voltages produced across R1. However, for improved performance, a FET-input device with extremely low offset  
can be selected, such as the OPA192, OPA140, or OPA188 for the feedback amplifier.  
IN-  
40k  
40k  
SENSE  
-
+
OUTPUT  
OPA172  
VIN  
+
-
+
40k  
40k  
REF  
IN+  
INA132  
R1  
OPA172  
+
-
+
I OUT  
Figure 46. Bidirectional Current Source  
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JFET-INPUT LOW-NOISE AMPLIFIER  
A low-noise composite amplifier can be built adding a low noise JFET pair (Q1 and Q2) as an input preamplifier  
for the OPA172 as shown in Figure 47. Transistors Q3 and Q4 form a 2-mA current sink that biases each JFET  
with 1 mA of drain current. Using 3.9-kΩ drain resistors produces a gain of approximately 10 in the input  
amplifier, making the extremely-low, broadband-noise spectral density of the LSK489 the dominant noise source  
of the amplifier. The output impedance of the input differential amplifier is large enough that a FET-input amplifier  
such as the OPA172 provides superior noise performance over bipolar-input amplifiers.  
The gain of the composite amplifier is given by Equation 2:  
AV = (1 + R3 / R4 )  
(2)  
The resistances shown are standard 1% resistor values that produce a gain of approximately 100 (99.26) with  
68° of phase margin. Gains less than 10 may require additional compensation methods to provide stability.  
Seleect low resistor values to minimize the resistor thermal noise contribution to the total output noise.  
V1 15  
V2 15  
VEE  
OPA172  
-
VO  
+
+
VCC  
Q1  
Q2  
LSK489  
R6 27.4k  
Q3  
MMBT4401  
R5 300  
Q4  
MMBT4401  
VEE  
Figure 47. JFET-Input Low-Noise Amplifier  
20  
Submit Documentation Feedback  
Copyright © 2013, Texas Instruments Incorporated  
Product Folder Links: OPA172 OPA2172 OPA4172  
 
 
PACKAGE OPTION ADDENDUM  
www.ti.com  
22-Dec-2013  
PACKAGING INFORMATION  
Orderable Device  
OPA172ID  
Status Package Type Package Pins Package  
Eco Plan  
Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
-40 to 125  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(6)  
(3)  
(4/5)  
ACTIVE  
SOIC  
SOT-23  
SOT-23  
SC70  
D
8
5
5
5
5
8
75  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-2-260C-1 YEAR  
OPA172  
OPA172IDBVR  
OPA172IDBVT  
OPA172IDCKR  
OPA172IDCKT  
OPA172IDR  
PREVIEW  
PREVIEW  
PREVIEW  
PREVIEW  
ACTIVE  
DBV  
DBV  
DCK  
DCK  
D
3000  
250  
Green (RoHS  
& no Sb/Br)  
OUWQ  
OUWQ  
SIU  
Green (RoHS  
& no Sb/Br)  
3000  
250  
Green (RoHS  
& no Sb/Br)  
SC70  
Green (RoHS  
& no Sb/Br)  
SIU  
SOIC  
2500  
Green (RoHS  
& no Sb/Br)  
OPA172  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
22-Dec-2013  
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish  
value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
15-Jan-2014  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
OPA172IDR  
SOIC  
D
8
2500  
330.0  
12.4  
6.4  
5.2  
2.1  
8.0  
12.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
15-Jan-2014  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SOIC  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 35.0  
OPA172IDR  
D
8
2500  
Pack Materials-Page 2  
IMPORTANT NOTICE  
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
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