OPA928 [TI]

具有 RRIO 的高电压、毫微微安输入偏置精密 e-trim™ 运算放大器;
OPA928
型号: OPA928
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

具有 RRIO 的高电压、毫微微安输入偏置精密 e-trim™ 运算放大器

放大器 运算放大器
文件: 总25页 (文件大小:1646K)
中文:  中文翻译
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OPA928  
ZHCSNI6 MARCH 2023  
OPA928 16V、毫微微安输入偏置、精密、轨到轨输入/输出、e-trim™ 运算放大  
1 特性  
3 说明  
• 超低输入偏置电流  
25ºC 85ºC 20fA测试最大值)  
• 低噪声:  
0.1 Hz 0.05fA/Hz  
1 kHz 15nV/Hz  
• 高直流精度  
OPA928 是新一代 16V、毫微微安输入偏置 e-trim运  
算放大器。该器件在 25ºC 85ºC 时提供 20fA最大  
的超低输入偏置电流。OPA928 输入偏置性能在两  
种温度下均进行了量产测试。  
该器件具有接近零的输入偏置以及出色的直流精度和交  
流性能包括轨到轨输入/输出、低失调电压±5µV,  
典型值、低温漂±0.1µV/°C典型值和低电流噪  
0.1Hz 0.05fA/ Hz 这些特性使得  
OPA928 成为低光光电二极管和高源阻抗应用的理想选  
择。  
±5µV 输入失调电压  
±0.1µV/°C 失调电压漂移  
• 宽带宽2.5MHz GBW  
• 低静态电流275µA  
EMI RFI 已滤除的输入  
OPA928 具有内部高精度保护缓冲器可在敏感应用中  
保护高阻抗输入布线免受不良电流泄漏的影响。  
OPA928 封装和引脚排列旨在支持低泄漏电路设计。  
• 高精度保护缓冲器  
• 宽电源电压±2.25 V ±8 V4.5 V 16 V  
• 轨到轨输入和输出  
OPA928 的额定工作温度范围-40°C +125°C。  
• 高容性负载驱动能力1nF  
• 工作温度范围40ºC +125ºC  
• 行业标准封装:  
封装信息  
器件型号  
封装(1)  
封装尺寸标称值)  
8 SOIC  
OPA928  
DSOIC84.90mm × 3.90mm  
2 应用  
(1) 如需了解所有可用封装请参阅数据表末尾的可订购产品附  
录。  
• 电化学仪- pH 计  
实验室和现场仪表  
质谱仪  
• 离子色谱分(IC) 仪器  
• 分光光度计  
1000  
10 G  
IB  
IB  
100  
Guard  
OPA928  
VOUT  
10  
1
+
GND  
GND  
高增益跨阻放大器  
0.1  
0.01  
0.001  
25 30 35 40 45 50 55 60 65 70 75 80 85  
Temperature [C]  
输入偏置电流与温度间的关系  
VS = 16VVCM = 1/2 Vs)  
本文档旨在为方便起见提供有TI 产品中文版本的信息以确认产品的概要。有关适用的官方英文版本的最新信息请访问  
www.ti.com其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前请务必参考最新版本的英文版本。  
English Data Sheet: SBOSA77  
 
 
 
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Table of Contents  
8 Application and Implementation..................................10  
8.1 Application Information............................................. 10  
8.2 Typical Applications.................................................. 12  
8.3 Power-Supply Recommendations.............................16  
8.4 Layout....................................................................... 17  
9 Device and Documentation Support............................19  
9.1 Device Support......................................................... 19  
9.2 Documentation Support............................................ 19  
9.3 接收文档更新通知..................................................... 19  
9.4 支持资源....................................................................19  
9.5 Trademarks...............................................................20  
9.6 静电放电警告............................................................ 20  
9.7 术语表....................................................................... 20  
10 Mechanical, Packaging, and Orderable  
1 特性................................................................................... 1  
2 应用................................................................................... 1  
3 说明................................................................................... 1  
4 Revision History.............................................................. 2  
5 Pin Configuration and Functions...................................3  
6 Specifications.................................................................. 4  
6.1 Absolute Maximum Ratings........................................ 4  
6.2 ESD Ratings............................................................... 4  
6.3 Recommended Operating Conditions.........................4  
Thermal Information..........................................................4  
6.4 Electrical Characteristics.............................................5  
7 Detailed Description........................................................7  
7.1 Overview.....................................................................7  
7.2 Functional Block Diagram...........................................7  
7.3 Feature Description.....................................................8  
7.4 Device Functional Modes............................................9  
Information.................................................................... 20  
4 Revision History  
以前版本的页码可能与当前版本的页码不同  
DATE  
REVISION  
NOTES  
March 2023  
*
Initial release.  
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5 Pin Configuration and Functions  
IN+  
GRD  
NC  
IN–  
GRD  
Out  
V+  
1
2
3
4
8
7
6
5
V–  
Not to scale  
5-1. D Package, 8-Pin SOIC (Top View)  
5-1. Pin Functions  
PIN  
TYPE  
DESCRIPTION  
NAME  
NO.  
2, 7  
1
GRD  
IN+  
Guard buffer  
Input  
Noninverting input  
8
Input  
Inverting input  
IN–  
DNC  
OUT  
V+  
3
Do not connect (leave floating)  
Output  
6
Output  
Power  
5
Positive (highest) power supply  
Negative (lowest) power supply  
4
Power  
V–  
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6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
MAX  
UNIT  
Dual supply  
±20  
40  
VS  
Supply voltage  
V
Single supply  
Common-mode  
Differential(2)  
(V+) + 0.5  
±0.5  
(V) 0.5  
Signal input pin voltage  
V
Signal input pin current  
Output short circuit(3)  
Junction temperature  
Storage temperature  
±10  
mA  
ISC  
TJ  
Continuous  
150  
150  
°C  
Tstg  
65  
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply  
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If  
used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully  
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.  
(2) Input pins are diode-clamped to the power-supply rails. Current limit input signals that can swing more than 0.5 V beyond the supply  
rails to 10 mA or less.  
(3) Short-circuit to ground.  
6.2 ESD Ratings  
VALUE  
±3000  
±1000  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001((1))  
Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002((2))  
V(ESD)  
Electrostatic discharge  
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
±2.25  
4.5  
NOM  
MAX  
±8  
UNIT  
Dual supply  
VS  
V
Supply voltage, VS = (V+) (V)  
Single supply  
16  
RH  
TA  
Relative humidity  
50  
%
Ambient temperature  
125  
°C  
40  
Thermal Information  
OPA928  
D (SOIC)  
8 PINS  
113.9  
51.4  
THERMAL METRIC(1)  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case(top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
58.0  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case(bottom) thermal resistance  
9.0  
ψJT  
57.1  
ψJB  
RθJC(bot)  
N/A  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
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English Data Sheet: SBOSA77  
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6.4 Electrical Characteristics  
at TA = 25°C, VS = 4.5 V to 16 V, VCM = VOUT = VS / 2, and RL = 10 kΩconnected to VS/2 (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
INPUT BIAS CURRENT  
±1  
±20  
±20  
±20  
±20  
IB  
Input bias current  
fA  
fA  
TA = 40°C to +85°C  
TA = 40°C to +85°C  
±1  
IOS  
Input offset current  
OFFSET VOLTAGE  
±5  
±8  
±25  
±75  
TA = 40°C to +125°C  
VCM = (V+) 1.5 V  
µV  
±10  
±25  
±50  
VOS  
Input offset voltage  
±150  
TA = 40°C to +125°C  
VCM = (V+) 1.5 V  
See Typical Characteristics  
(V+) 3 V < VCM < (V+) 1.5 V  
TA = 40°C to +125°C  
±0.1  
±0.5  
±0.8  
±1.0  
Input offset voltage  
drift  
dVOS/dT  
µV/°C  
µV/V  
Power-supply  
rejection ratio  
PSRR  
±0.3  
TA = 40°C to +125°C  
NOISE  
1.4  
7
(V) 0.1 V < VCM < (V+) 3 V  
Input voltage noise  
f = 0.1 Hz to 10 Hz  
µVPP  
(V+) 1.5 V < VCM < (V+) + 0.1 V  
f = 100 Hz  
f = 1 kHz  
f = 100 Hz  
f = 1 kHz  
18  
15  
53  
24  
(V) 0.1 V < VCM < (V+) 3 V  
Input voltage noise  
density  
en  
nV/Hz  
(V+) 1.5 V < VCM < (V+) + 0.1 V  
Input current noise  
density  
in  
f = 0.1 Hz  
0.05  
fA/Hz  
INPUT VOLTAGE  
Common-mode  
voltage  
(V) –  
VCM  
(V+) + 0.1  
V
0.1  
120  
114  
96  
140  
126  
120  
100  
(V) 0.1 V < VCM < (V+) 3 V  
TA = 40°C to +125°C  
TA = 40°C to +125°C  
dB  
Common-mode  
rejection ratio  
CMRR  
(V+) 1.5 V < VCM < (V+)  
86  
See Typical Characteristics  
(V+) 3 V < VCM < (V+) 1.5 V  
INPUT IMPEDANCE  
ZID  
ZIC  
Differential  
100 || 1.6  
1 || 6.4  
MΩ|| pF  
1013Ω|| pF  
Common-mode  
OPEN-LOOP GAIN  
124  
114  
126  
120  
134  
126  
140  
134  
(V) + 0.6 V < VO < (V+) 0.6 V,  
RL = 2 kΩ  
TA = 40°C to +125°C  
TA = 40°C to +125°C  
Open-loop voltage  
gain  
AOL  
dB  
(V) + 0.3 V < VO < (V+) 0.3 V,  
RL = 10 kΩ  
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6.4 Electrical Characteristics (continued)  
at TA = 25°C, VS = 4.5 V to 16 V, VCM = VOUT = VS / 2, and RL = 10 kΩconnected to VS/2 (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
FREQUENCY RESPONSE  
GBW  
Unity gain bandwidth  
2.5  
7.5  
5.5  
0.7  
1
MHz  
V/µs  
Falling  
Rising  
SR  
Slew rate  
Gain = 1, 10-V step  
To 0.01%, CL = 20 pF  
To 0.001%, CL = 20 pF  
Gain = 1, 2-V step  
Gain = 1, 5-V step  
ts  
Settling time  
µs  
µs  
Gain = 1, 2-V step  
1.8  
3.7  
0.4  
1
Gain = 1, 5-V step  
From overload to negative rail  
From overload to positive rail  
Overload recovery  
time  
tOR  
VIN × gain = VS  
Total harmonic  
distortion + noise  
THD+N  
Gain = 1, f = 1 kHz, VO = 3.5 VRMS  
0.0012%  
OUTPUT  
No load  
5
50  
15  
110  
500  
15  
Positive rail  
RL = 10 kΩ  
RL = 2 kΩ  
No load  
200  
5
Voltage output swing  
from rail  
VO  
mV  
50  
110  
500  
Negative rail  
VS = ±18 V  
RL = 10 kΩ  
RL = 2 kΩ  
200  
±65  
ISC  
CL  
Short-circuit current  
Capacitive load drive  
mA  
See Typical Characteristics  
Open-loop output  
impedance  
ZO  
f = 1 MHz, IO = 0 A  
700  
Ω
POWER SUPPLY  
275  
400  
500  
Quiescent current per  
amplifier  
IQ  
IO = 0 A  
µA  
TA = 40°C to +125°C  
TEMPERATURE  
Thermal protection  
180  
30  
°C  
°C  
Thermal hysteresis  
INTERNAL GUARD BUFFER  
±5  
±8  
±25  
±75  
Guard input offset  
voltage  
VOSG  
µV  
TA = 40°C to +125°C  
TA = 40°C to +125°C  
±0.1  
±0.5  
2.5  
±0.8  
Guard input offset  
dVOSG/dT  
µV/°C  
voltage drift  
VCM = (V+) 1.5 V  
BW  
Bandwidth  
MHz  
Guard output  
impedance  
IO = 0 A  
1
kΩ  
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English Data Sheet: SBOSA77  
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7 Detailed Description  
7.1 Overview  
The OPA928 op amp is an ultra-low input bias current, high-precision, low-power, e-trim operational amplifier.  
This op amp provides extremely low input bias current (< 20 fA) across the entire industrial temperature range of  
40ºC to 85ºC. In addition, the OPA928 operates from 4.5 V to 16 V, is unity-gain stable, and post-package  
trimmed to achieve very low offset and offset drift performance.  
The amplifier features state-of-the art CMOS technology and advanced design features to achieve extremely low  
input bias current across a wide temperature range, wide input and output voltage ranges, high loop gain, and  
low, flat output impedance. The OPA928 strengths include a wide bandwidth of 2.5 MHz, low noise spectral  
density of 15 nV/Hz, low 1/f noise of 1.4 μVPP, and low quiescent current of 400 μA. This combination of  
features make the OPA928 an excellent choice for interfacing very high impedance sensors, and photodiodes.  
7.2 Functional Block Diagram  
V+  
OPA928  
NCH Input  
Stage  
IN+  
+
GRD  
1 k  
High  
Capacitive Load  
Compensation  
Output  
Stage  
Slew  
Boost  
OUT  
e-trim™  
GRD  
IN–  
+
PCH Input  
Stage  
V  
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7.3 Feature Description  
7.3.1 Guard Buffer  
The OPA928 uses input protection diodes to limit the input differential voltage range and protect the device  
against transient currents. The back-to-back, or antiparallel, input protection diodes can be activated by fast  
transient step responses and cause relatively large amounts of current to flow through the inputs. The inrush  
current is routed through the antiparallel diodes and to the power supplies to avoid internal damage to the  
OPA928.  
To achieve a femtoampere-level input bias current, the OPA928 uses an internal, high-precision, rail-to-rail guard  
buffer connected to the noninverting input. The guard buffer drives the voltage at the input of the OPA928 to the  
guard pins (pins 2 and 7) and sets a 0-V differential voltage across the antiparallel diodes, greatly reducing  
leakage current though the diodes. The guard buffer is isolated from large capacitive loads at the guard pins by a  
nominal 1-kΩ resistor. Use the guard pins to guard external components and input traces from possible current  
leakage paths. For more on guarding, see 8.1.2.  
7.3.2 Thermal Protection  
The internal power dissipation of any amplifier causes the junction temperature (TJ) to rise. This phenomenon is  
called self heating. To prevent damage from overheating, the OPA928 has a thermal protection feature.  
This thermal protection works by monitoring the temperature of the output stage and turning off the op amp  
output drive for temperatures above approximately 180°C. Thermal protection forces the output to a high-  
impedance state. The OPA928 is also designed with approximately 30°C of thermal hysteresis. The OPA928  
returns to normal operation when the output stage temperature reaches a safe operating temperature of  
approximately 150°C.  
CAUTION  
The absolute maximum TJ of the OPA928 is 150°C. Exceeding the limits shown in the Absolute  
Maximum Ratings can cause damage to the device. Thermal protection triggers at approximately  
180°C and does not interfere with device operation up to the absolute maximum ratings. This  
thermal protection is not designed to prevent this device from exceeding absolute maximum ratings,  
but rather from excessive thermal overload.  
7.3.3 Capacitive Load and Stability  
The OPA928 features a patented output stage capable of driving large capacitive loads, and in a unity-gain  
configuration, directly drives up to 1 nF of pure capacitive load. Increasing the gain enhances the ability of the  
amplifier to drive greater capacitive loads; see 7-1. The particular op-amp circuit configuration, layout, gain,  
and output loading are some of the factors to consider when establishing whether an amplifier will be stable in  
operation.  
G = +1 V/V  
Time (2 ms/Div)  
7-1. Transient Response With a Purely Capacitive Load of 1 nF  
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For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small,  
10Ω to 20Ω isolation resistor (RISO) in series with the output; 7-2 shows this resistor. This resistor  
significantly reduces ringing while maintaining dc performance for purely capacitive loads. However, if there is a  
resistive load in parallel with the capacitive load, a voltage divider is created, introducing a gain error at the  
output and slightly reducing the output swing. The error introduced is proportional to the ratio RISO / RL, and is  
generally negligible at low output levels. RISO modifies the open-loop gain of the system for increased phase  
margin.  
+Vs  
Vout  
Riso  
+
Cload  
+
Vin  
-Vs  
œ
7-2. Extending Capacitive Load Drive With the OPA928  
7.3.4 EMI Rejection  
The OPA928 uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from  
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and  
digital components. The OPA928 features improved design techniques to enhance EMI immunity.  
7.3.5 Common-Mode Voltage Range  
The OPA928 is a 16-V, true rail-to-rail input/output operational amplifier with an input common-mode range that  
extends 100 mV beyond either supply rail. This wide range is achieved with paralleled complementary N-channel  
and P-channel differential input pairs. The N-channel pair is active for input voltages close to the positive rail,  
typically (V+) 3 V to 100 mV above the positive supply. The P-channel pair is active for inputs from 100 mV  
below the negative supply to approximately (V+) 1.5 V. There is a small transition region, typically (V+) 3 V  
to (V+) 1.5 V in which both input pairs are active. This transition region varies modestly with process variation.  
Within this region PSRR, CMRR, offset voltage, offset drift, noise, and THD performance are degraded  
compared to operation outside this region.  
The OPA928 uses a precision trim for both the N-channel and P-channel regions enabling significantly lower  
levels of offset than previous-generation devices. In inverting configurations, such as with a transimpedance  
amplifier, the common-mode voltage is constant and set by the voltage at the noninverting pin. Therefore, in  
inverting configurations, the transition region can be easily avoided and is typically not a problem. In noninverting  
configurations, such as with a buffer, the common-mode voltage can vary widely; take care to avoid the transition  
region when possible.  
The OPA928 guard buffer features the same complementary input stage. The input bias performance of the  
OPA928 is sensitive to small shifts in offset voltage. The shift in offset in the transition region is presented across  
the internal protection diodes and causes increased leakage. The increase in leakage can be significant and  
degrade the input bias performance of the OPA928. Avoid operating in the transistion region when possible to  
achieve specified input bias current performance.  
7.4 Device Functional Modes  
The OPA928 has a single functional mode and is operational when the power-supply voltage is greater than  
4.5 V (±2.25 V). The maximum power supply voltage for the OPA928 is 16 V (±8 V).  
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8 Application and Implementation  
备注  
以下应用部分中的信息不属TI 器件规格的范围TI 不担保其准确性和完整性。TI 的客 户应负责确定  
器件是否适用于其应用。客户应验证并测试其设计以确保系统功能。  
8.1 Application Information  
The OPA928 offers femtoampere level input bias current, and excellent dc precision and ac performance. This  
device provides 2.5MHz bandwidth and very low noise, 15 nV/Hz and 0.05 fA/Hz. The OPA928 can operate  
with a 16V supply and offers true rail-to-rail input/output performance to allow for a wide linear output voltage  
swing. The ultra-low input bias, low noise and wide output voltage swing capability make this device an excellent  
choice for low-light photodiode applications.  
8.1.1 Contamination Considerations  
Applications requiring femtoampere-level performance are extremely sensitive to contamination. Contaminants  
in the form of solder flux, salts, oils, organic acids, and more can form conductive paths over PCB traces and  
allow small currents to leak into input traces or other sensitive nodes, severely degrading performance. Proper  
handling and cleaning is required to achieve femtoampere level input bias performance in a PCB featuring the  
OPA928.  
The following list of best practices helps prevent a PCB from contamination:  
Always wear a pair of clean, powder-free gloves or finger cots when handling the PCB.  
Always hold the PCB by the edges when handling is required.  
Avoid touching the surface of the PCB and other component packages, especially near sensitive nodes or  
input traces.  
Be cautious when breathing, speaking, and sneezing to prevent moisture or saliva from contacting the PCB.  
Do not allow direct airflow onto the board. Moving air can blow dust and moisture onto sensitive nodes.  
Airflow also introduces moving charges that manifest as a small current at the input.  
When not in use, place the PCB in an ESD bag or other enclosure to prevent dust and other contaminants  
from settling on the board.  
If configuring through-hole components in sensitive nodes, handle the components by the wire leads only.  
A rigorous cleaning protocol is required after PCB assembly to remove all contaminants that can degrade input  
bias performance of the OPA928. Repeat the cleaning procedure any time the board is soldered or modified  
near sensitive nodes, or if contamination of these nodes is suspected.  
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8.1.2 Guarding Considerations  
8-1 details how to implement a guard in printed circuit board (PCB) layout. This section explores  
considerations for driving the PCB guard with the OPA928 internal guard buffer, an external guard driver, or by  
connecting the guard copper directly to the analog ground.  
OPA928  
Input  
+
2.5 V  
VOUT  
Leakage  
Path  
CSTRAY  
RLEAK  
V = 0 V  
RISO  
Guard  
2.5 V  
Leakage  
Path  
CSTRAY  
RLEAK  
V = 2.5 V  
GND  
8-1. Driving the Guard, Internal Guard Buffer  
The guard presents a low-impedance path for leakage currents of equal potential to the high-impedance node  
that is being guarded. For a noninverting configuration, the common-mode changes with the input signal and the  
guard must be actively driven by a voltage follower that tracks the input signal. Choose a low-offset, low-noise  
amplifier for the guard driver because any voltage potential between guard and input causes current to leak into  
the high-impedance trace. The OPA928 features a high-performance internal guard buffer that can be accessed  
at pin 2 and pin 7 to drive the PCB guard copper; see the Electrical Characteristics. The internal guard buffer  
tracks the voltage of the OPA928 input signal and is isolated from capacitive loads through a 1-kΩ isolation  
resistor, RISO  
.
8-2 shows how the PCB guard is driven with an external guard driver instead of the OPA928 internal guard  
buffer. To prevent the input bias current of the external guard driver from degrading the input signal, track the  
low-impedance input of the OPA928. If an external guard driver is used, the OPA928 guard pins can be left  
unconnected or can be overdriven by the external guard driver. Include an isolation resistor at the output of the  
guard driver to prevent gain peaking due to capacitive loading and to provide short-circuit protection. Make sure  
that the guard driver is stable and capable of driving the capacitive load presented by the guard, including long  
cable lengths, if applicable.  
Input  
2.5 V  
+
OPA928  
VOUT  
Leakage  
Path  
CSTRAY  
RLEAK  
V = 0 V  
RISO  
Guard  
2.5 V  
Leakage  
Path  
External  
Guard Driver  
V = 2.5 V  
RLEAK  
CSTRAY  
GND  
8-2. Driving the Guard, External Guard Driver  
For inverting configurations, the input common-mode voltage is fixed to the analog ground or some dc reference  
voltage applied to the noninverting input. In this case, tie the PCB guard directly to the ground or low-impedance  
reference of the signal amplifier. Tying the PCB guard makes sure that the guard potential is always equal to the  
input common-mode voltage, without the additional offset and noise of an active guard driver. If the PCB guard is  
connected to the analog ground of the circuit, make sure to ground return paths in the PCB. Keep power and  
digital grounds separate from the guard and prevent ground loops from occurring. For inverting configurations,  
the OPA928 internal guard buffer or an external guard driver can be used to drive the PCB guard, and the same  
considerations apply as discussed for noninverting configurations.  
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8.1.3 Humidity Considerations  
The resistance of insulators is substantially affected by both temperature and humidity. Humidity can significantly  
lower the effective resistance of insulators and cause an increase in leakage current around the affected  
material. When water molecules settle on the surface of a given material, such as the plastic packaging and  
PCB, a parallel and more electrically conductive path is created. Effective guarding techniques and appropriate  
materials can help mitigate this behavior in the sensitive applications.  
In some cases, water molecules can also penetrate the surface of a given material. The water molecules in the  
material increase the conductivity of the body of the material and a reduction of resitance is established across  
all adjacent nodes. Contrary to surface level leakge paths, leakage through the material cannot me mitigated  
with guarding techniques. Use PCB materials with low humidity absorption properties to reduce moisture related  
errors.  
8.1.4 Dielectric Relaxation  
All materials are prone to polarization in the presence of an electric field. The molecules of the given material  
within the electric field become aligned at varying rates; a phenomena known as polarization. The rate depends  
on the strength of the electric field and the susceptibility of the material. When the electric field is removed, the  
molecules in the material return to the original alignment and random distribution, a phenomena known as  
relaxation. The rate at which the molecules return to normal alignment depends on the permittivity and resistivity  
of the material. In conductors, polarization and relaxation happens nearly instantaneously. In dielectrics, the time  
delay for polarization and relaxation can be significant.  
In most applications, dielectric relaxation is not a major design concern. However, for femtoampere leakage  
current, dielectric relaxation becomes a major concern. The realignment of molecules causes a small  
displacement current to appear across the material. The displacement current from the dielectric relaxation is  
often greater than the input bias current level of the OPA928. The time required for the displacement current in  
common FR-4 PCB materials to dissipate under the input bias current level of the OPA928 can take well over an  
hour. To minimize the dielectric relaxation time and the leakage effects, use ceramic-based PCB materials such  
as Rogers 4350B.  
8.2 Typical Applications  
8.2.1 High-Impedance (Hi-Z) Amplifier  
The OPA928 behaves very close to an ideal op amp in regards to the input current. The near-zero input bias  
current performance enables applications with extremely high impedance signal sources. For example, pH  
probes can have an output impedance of up to 10 GΩ. Most op amps are inadequate to use with this kind of  
sensor impedance. For example, a CMOS op amp with 1 pA of input bias current loads the sensor and causes a  
large, and unacceptable, 10-mV error at the input. In 8-3, the OPA928 is used to gain up the small signal from  
the pH probe sensor. The large input impedance and ultra-low bias current into the positive input pin of the  
OPA928 does not load the sensor and minimizes the input bias current error.  
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1 k  
13 k  
VREF  
15 V  
OPA928  
VOUT  
Guard  
+
GND  
15 V  
pH  
Probe  
Sensor  
15 V  
+
11.4 k  
VREF  
OPA206  
1 nF  
GND  
10 k  
GND  
8-3. High Impedance pH Probe Amplifier Circuit  
8.2.1.1 Design Requirements  
The primary objective is to design a single-supply, pH-probe gain amplifier.  
Supply voltage: 15 V  
pH-probe sensor impedance: 10 GΩ  
Temperature range: 25ºC to 85ºC  
8.2.1.2 Detailed Design Procedure  
In the 8-3 example, the pH-probe sensor is assumed to produce an output of ±59 mV/pH at room  
temperature, or 25°C, and ±71 mV/pH at 85°C. The pH probe can be modeled as a small, variable battery in  
series with a 10GΩ resistor. As a result of the intrinsic characteristics of the pH probe, a near 0V output is  
produced for a neutral pH value of 7. A gain of 14 V/V provides a wide output swing of approximately ±7 V. To  
enable single supply operation, a 7-V reference voltage (VREF) is created using the 15-V supply voltage and a  
simple voltage divider. The output swing is shifted to 0 V to 14 V, and is conveniently proportional to the  
approximately 1 V/pH at 85°C. Temperature calibration of the pH sensor (not shown) is necessary for accurate  
results when wide temperature variation is expected.  
8.2.1.3 Application Curve  
14  
13  
12  
11  
10  
9
8
7
6
5
4
3
2
1
0
-500 -400 -300 -200 -100  
0
100 200 300 400 500  
pH Sensor Voltage (mV)  
8-4. Single Supply, pH-Probe Sensor Transfer Function  
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8.2.2 Transimpedance Amplifier  
8-5 shows the OPA928 configured as a transimpedance amplifier (TIA) for a low-light photodiode. TIAs are  
needed to amplify the light-dependent current of the photodiode. In low-light conditions, photodiodes produce a  
very small current and ultra-low input bias current and large gain in excess of 109 V/A is required. For a full  
analysis of the TIA circuit, including theory, calculations, and measured data, see the Transimpedance Amplifiers  
(TIA): Choosing the Best Amplifier for the Job application brief.  
10 G  
Guard  
OPA928  
VOUT  
+
GND  
GND  
8-5. OPA928 Simplified Photodiode Transimpedance Amplifier  
8.2.2.1 Design Requirements  
The design requirements for this design are:  
Transimpedance gain: 10,000,000,000 A/V  
Supply voltage rail: 5 V  
Photodiode shunt resistance: 5 GΩ  
Photodiode shunt capacitance: 35 pF  
8.2.2.2 Detailed Design Procedure  
Some photodiode applications operate in dark conditions and require low-light detection. In these cases, the  
current output from the photodiode can be miniscule. To make the small diode current measurable, a  
transimpedance amplifier (TIA) with a very large gain is required. The ideal transfer function of a resistive  
transimpedance amplifier is given by 方程1:  
V
= I  
× R  
F
(1)  
OUT  
PD  
The photodiode current (IPD) flows through the feedback resistor (RF) and forces an output voltage (VOUT) equal  
to the voltage drop across RF. The ideal transfer function gives an intuitive understanding of TIA operation. In  
practice, however, nonidealities must be taken into consideration to achieve desirable performance. 8-6  
illustrates important nonidealities of the transimpedance amplifier circuit.  
CSTRAY  
CF  
RF  
GND  
Guard  
CIN  
5 V  
Photodiode  
CCM  
OPA928  
VOUT  
CDIF  
RPD  
CPD  
+
0.2 V  
GND  
GND  
8-6. Transimpedance Photodiode Application  
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One very important consideration, is the input bias current of the op amp. The input bias current directly adds to  
IPD and creates an undesired error. The input bias current typically determines the minimum measurable IPD  
within a given error tolerance. For example, a 1pA input bias current yields a 20% error when measuring a 5pA  
photodiode current. A 1% error target requires a 50-fA input bias current maximum specification. The ultra-low  
input bias current of the OPA928 enables accurate, extremely low IPD measurements. For information on how to  
maintain the specified input bias performance, see 8.4.  
The input offset voltage (VOS) of the op amp is another significant source of error. The input offset voltage forces  
a voltage across the effective shunt resistance of the diode (RD) and creates an error current (IRPD) equal to  
VOS / RPD. In many cases, VOS can be a major source of error. For example, a VOS of 25 μV and an RPD of 1  
GΩ creates an IRPD of 25 fA. Take into consideration offset voltage variation with temperature and common-  
mode voltage.  
In low-light applications, a very large RF is needed to provide the required gain, giving rise to potential stability  
problems. RF interacts with the input capacitance (CIN) of the op amp, the photodiode capacitance (CPD), and  
stray PCB capacitance to create a low-frequency zero in the noise gain transfer function (1/β). Remember that  
CIN includes the differential (CDF) and common-mode (CCM) capacitance of the op amp. The value of CDF and  
C
CM are found in the Electrical Characteristics. The zero in 1/β causes the gain to increase over frequency and  
is the basis for instability problems. To counteract the zero, create a pole by adding a compensation capacitor  
(CF) in the feedback loop. The optimal value selection of CF depends on several parameters and extensive  
literature exists on this topic. One approach is to equate two expressions of noise gain. 方程式 2 makes the  
assumption that the noise gain only depends on the capacitance of the circuit at a high enough frequency; a  
reasonable approximation.  
C
+ C  
F
GBW  
IN  
=
(2)  
2πR C  
C
F F  
F
Solving 方程式 2 for CF yields a quadratic equation with one real solution. The quadratic equation is given by 方  
3:  
1 ± 1 + 8πGBWR C  
F I  
C
=
(3)  
F
4πGBWR  
F
方程式 3 yields more than 45° of phase margin and some amount of gain peaking. Increasing the value of CF  
yields a higher phase margin and limits the peaking response at the expense of signal bandwidth, given by 方程  
4. For a flat frequency response, use a compensation capacitor calculator. For a very large RF, a very small  
capacitor (< 0.5 pA) is required to maintain stability, and stray capacitance in the feedback loop can be sufficient.  
1
f
=
(4)  
3dB  
2πR C  
F F  
Another issue arises when using a very large RF. All resistors are sources of thermal noise. The magnitude of  
noise density contribution from a resistor is directly correlated to the square root of the resistance value. In a  
gain configuration, the feedback resistance and input resistance contribute to the total noise of the circuit. The  
thermal noise resistance value in 8-6 is given by the parallel combination of RF and RPD. 方程式 5 shows the  
input-referred-resistor noise-density equation. The low voltage noise of the OPA928 is not a significant  
contributor of noise because RF and RPD are typically very large.  
R
R
PD F  
e
=
4kT  
(5)  
n_R  
R
+ R  
PD  
F
In this application, a 5-V output is required from the 500-pA current input from a Si photodiode. A 10-GΩresistor  
is used to achieve the required gain of 10,000,000,000 V/A. RPD and CPD of the photodiode is assumed to be 5  
GΩ and 35 pF, respectively. Using the specifications of the OPA928 and the aforementioned photodiode  
specifications, 方程式 3 calculates CF to be approximately 0.017 pF. The value obtained by calculation is  
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impractical; therefore, the smallest standard capacitor available is used (1 pF). If settling time is a major concern,  
consider making the required small-value capacitor using PCB traces.  
8.3 Power-Supply Recommendations  
The OPA928 is specified for operation from 4.5 V to 16 V (±2.25 V to ±8 V). The OPA928 features a high power-  
supply rejection ratio (PSRR) and significantly reduces power supply errors at dc. However, a decreasing PSRR  
at high frequencies means that high-frequency components in the power supply, such as noise, can be coupled  
to the output. Use a linear, low-noise power supply to optimize noise performance. Place 0.1-μF bypass  
capacitors close to the power-supply pins to further reduce errors coupling in from the power supplies. For more  
detailed information on bypass capacitor placement, see 8.4. Switching power supplies generate switching  
noise that can manifest at the output of the OPA928. When switching power supplies cannot be avoided, use  
proper filtering and a low-dropout regulator to attenuate the switching noise and respective harmonics to an  
acceptable level.  
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8.4 Layout  
8.4.1 Layout Guidelines  
For best operational performance of the device, follow PCB layout best practices, including:  
Connect 0.1-µF ceramic bypass capacitors with low equivalent series resistance (ESR) between each supply  
pin and ground. Place the capacitors as close to the device as possible. For single-supply applications, use a  
single bypass capacitor from V+ to ground. Bypass capacitors are used to reduce coupled noise by providing  
low-impedance power sources local to the analog circuitry.  
Physically separate digital and analog grounds, paying attention to the flow of the ground current. Separate  
grounding for analog and digital circuitry is one of the simplest and most effective methods for noise  
suppression. A ground plane helps distribute heat and reduces EMI noise pickup.  
Place external components as close to the device as possible.  
Keep the length of input traces as short as possible. Input traces are the most sensitive part of the circuit.  
In addition to general PCB layout considerations, specific layout techniques must be implemented to achieve  
femtoampere-level input bias current. Every insulator, including PCB material, has a finite resistance that can  
become a path for current to leak into input traces and degrade input bias performance. To minimize leakage  
current paths, implement a guard in the PCB layout. The guard presents a low-impedance path equipotential to  
the input traces. Leakage current toward the high impedance input path can be diverted to the low-impedance  
guard path. The guard is driven to a potential equal to the input common-mode voltage (see guarding  
considerations). Current flowing between the input and guard traces is negligible because both traces are ideally  
at the same potential.  
Surround all high-impedance input traces with copper guard traces all the way from the source to the input pins  
of the OPA928. For inverting configurations, extend the guard copper to the middle of the feedback components,  
separating the low-impedance output from the high-impedance input node. Remove all solder mask and  
silkscreen from the guard area to reduce surface-charge accumulation and prevent surface-level leakage paths  
to the input.  
Leakage currents can flow between layers vertically or diagonally through the PCB, as well as horizontally on the  
surface layer. The guard must be implemented in a three-dimensional scheme to prevent leakage currents  
originating in other layers from flowing into the signal path. Place the guard copper on the next layer directly  
below the surface-level signal and guard traces to protect from vertical leakage paths. Surround the sensitive  
input traces with a via fence connecting the guard copper on different layers to complete the three-dimensional  
guard enclosure. 8-9 shows the internal copper layers of a four-layer PCB using a three-dimensional guarding  
scheme.  
A copper ground pour around the OPA928 and guard area is recommended to reduce noise and EMI. In addition  
to noise and EMI benefits, this ground pour presents another low-impedance path for leakage currents to take.  
Keep voltage potentials other than guard and ground as far as possible from sensitive nodes. The OPA928 SOIC  
pinout places the input and power supply pins at opposite ends of the amplifier package to reduce leakage  
currents across the package and PCB material. If the power supplies (or other voltages) are present in vias or  
through-holes near the OPA928, a ground-potential via fence can be applied locally to these through-holes to  
provide a low-impedance path for leakage currents in the direction of sensitive nodes.  
High-impedance, femtoampere-level circuits are highly sensitive to electromagnetic interference (EMI). Ground  
planes and ground pours in the PCB layout can help reduce the effects of EMI. During operation, a  
femtoampere-level PCB is commonly placed within a shielded enclosure tied to ground for further EMI rejection.  
In layout, consider enclosing the OPA928 and all high-impedance traces within a local grounded RF shield. An  
example of localized RF shielding for high-impedance nodes is available in the OPA928EVM user's guide.  
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8.4.2 Layout Examples  
Silk screen removed  
from guard area  
Low-impedance  
output node  
High-impedance  
input node  
Guard copper  
(solder mask removed)  
Ground plane vias  
Silk screen  
removed from  
Ground plane vias  
guard area  
High-impedance  
input node  
Guard via fence  
Guard via fence  
Guard copper  
(solder mask removed)  
8-7. Layout Example: Noninverting  
8-8. Layout Example: Inverting Configuration  
Configuration  
8-9. Layout Example: Three-Dimensional Guard (4-Layer PCB)  
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9 Device and Documentation Support  
9.1 Device Support  
9.1.1 Development Support  
9.1.1.1 PSpice® for TI  
PSpice® for TI 是可帮助评估模拟电路性能的设计和仿真环境。在进行布局和制造之前创建子系统设计和原型解决  
方案可降低开发成本并缩短上市时间。  
9.1.1.2 TINA-TI™ 仿真软件免费下载)  
TINA-TI仿真软件是一款简单易用、功能强大且基于 SPICE 引擎的电路仿真程序。TINA-TI 仿真软件是 TINA™  
软件的一款免费全功能版本除了一系列无源和有源模型外此版本软件还预先载入了一个宏模型库。TINA-TI 仿  
真软件提供所有传统SPICE 直流、瞬态和频域分析以及其他设计功能。  
TINA-TI 仿真软件提供全面的后处理能力便于用户以多种方式获得结果用户可从设计工具和仿真网页免费下  
。虚拟仪器提供选择输入波形和探测电路节点、电压以及波形的能力从而构建一个动态的快速启动工具。  
备注  
必须安装 TINA 软件或者 TINA-TI 软件后才能使用这些文件。请从 TINA-TI™ 软件文件夹中下载免费的  
TINA-TI 仿真软件。  
9.1.1.3 TI 参考设计  
TI 参考设计是TI 的精密模拟应用专家创建的模拟解决方案。TI 参考设计提供了许多实用电路的工作原理、组件  
选择、仿真、完整印刷电路板 (PCB) 电路原理图和布局布线、物料清单以及性能测量结果。TI 参考设计可在线获  
网址https://www.ti.com/reference-designs。  
9.2 Documentation Support  
9.2.1 Related Documentation  
Texas Instruments, OPA928EVM User's Guide  
9.3 接收文档更新通知  
要接收文档更新通知请导航至 ti.com 上的器件产品文件夹。点击订阅更新 进行注册即可每周接收产品信息更  
改摘要。有关更改的详细信息请查看任何已修订文档中包含的修订历史记录。  
9.4 支持资源  
TI E2E支持论坛是工程师的重要参考资料可直接从专家获得快速、经过验证的解答和设计帮助。搜索现有解  
答或提出自己的问题可获得所需的快速设计帮助。  
链接的内容由各个贡献者“按原样”提供。这些内容并不构成 TI 技术规范并且不一定反映 TI 的观点请参阅  
TI 《使用条款》。  
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9.5 Trademarks  
e-trim, TINA-TI, and TI E2Eare trademarks of Texas Instruments.  
TINAis a trademark of DesignSoft, Inc.  
PSpice® is a registered trademark of Cadence Design Systems, Inc.  
所有商标均为其各自所有者的财产。  
9.6 静电放电警告  
静电放(ESD) 会损坏这个集成电路。德州仪(TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理  
和安装程序可能会损坏集成电路。  
ESD 的损坏小至导致微小的性能降级大至整个器件故障。精密的集成电路可能更容易受到损坏这是因为非常细微的参  
数更改都可能会导致器件与其发布的规格不相符。  
9.7 术语表  
TI 术语表  
本术语表列出并解释了术语、首字母缩略词和定义。  
10 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
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24-Mar-2023  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
POPA928DR  
ACTIVE  
SOIC  
D
8
2500  
TBD  
Call TI  
Call TI  
-40 to 85  
Samples  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
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(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
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In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OUTLINE  
D0008A  
SOIC - 1.75 mm max height  
SCALE 2.800  
SMALL OUTLINE INTEGRATED CIRCUIT  
C
SEATING PLANE  
.228-.244 TYP  
[5.80-6.19]  
.004 [0.1] C  
A
PIN 1 ID AREA  
6X .050  
[1.27]  
8
1
2X  
.189-.197  
[4.81-5.00]  
NOTE 3  
.150  
[3.81]  
4X (0 -15 )  
4
5
8X .012-.020  
[0.31-0.51]  
B
.150-.157  
[3.81-3.98]  
NOTE 4  
.069 MAX  
[1.75]  
.010 [0.25]  
C A B  
.005-.010 TYP  
[0.13-0.25]  
4X (0 -15 )  
SEE DETAIL A  
.010  
[0.25]  
.004-.010  
[0.11-0.25]  
0 - 8  
.016-.050  
[0.41-1.27]  
DETAIL A  
TYPICAL  
(.041)  
[1.04]  
4214825/C 02/2019  
NOTES:  
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.  
Dimensioning and tolerancing per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed .006 [0.15] per side.  
4. This dimension does not include interlead flash.  
5. Reference JEDEC registration MS-012, variation AA.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
D0008A  
SOIC - 1.75 mm max height  
SMALL OUTLINE INTEGRATED CIRCUIT  
8X (.061 )  
[1.55]  
SYMM  
SEE  
DETAILS  
1
8
8X (.024)  
[0.6]  
SYMM  
(R.002 ) TYP  
[0.05]  
5
4
6X (.050 )  
[1.27]  
(.213)  
[5.4]  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE:8X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
EXPOSED  
METAL  
EXPOSED  
METAL  
.0028 MAX  
[0.07]  
.0028 MIN  
[0.07]  
ALL AROUND  
ALL AROUND  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4214825/C 02/2019  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
D0008A  
SOIC - 1.75 mm max height  
SMALL OUTLINE INTEGRATED CIRCUIT  
8X (.061 )  
[1.55]  
SYMM  
1
8
8X (.024)  
[0.6]  
SYMM  
(R.002 ) TYP  
[0.05]  
5
4
6X (.050 )  
[1.27]  
(.213)  
[5.4]  
SOLDER PASTE EXAMPLE  
BASED ON .005 INCH [0.125 MM] THICK STENCIL  
SCALE:8X  
4214825/C 02/2019  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
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