SN54HC00TDF2 [TI]

4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25;
SN54HC00TDF2
型号: SN54HC00TDF2
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25

逻辑集成电路
文件: 总6页 (文件大小:327K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Sample &  
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Community  
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Folder  
Tools &  
Software  
Technical  
Documents  
SN54HC00-DIE  
ZHCSC36 FEBRUARY 2014  
SN54HC00-DIE 四路 2 输入正与非门  
1
1 特性  
宽工作电压范围  
低功耗  
低输入电流  
2 说明  
SN54AC00-DIE 器件包含 4 个独立的 2 输入与非门。 每个门在正逻辑中执行布尔函数:Y = A • B Y = A +  
B。  
Ordering Information(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
SN54HC00TDF1  
SN54HC00TDF2  
400  
10  
SN54HC00  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SCLS747  
SN54HC00-DIE  
ZHCSC36 FEBRUARY 2014  
www.ti.com.cn  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
3 Bare Die Information  
BACKSIDE  
POTENTIAL  
BOND PAD  
METALLIZATION COMPOSITION  
BOND PAD  
THICKNESS  
DIE THICKNESS  
BACKSIDE FINISH  
Silicon with backgrind  
10.5 mils.  
Floating  
TiW/AlCu2%  
1199 nm  
2
Copyright © 2014, Texas Instruments Incorporated  
SN54HC00-DIE  
www.ti.com.cn  
ZHCSC36 FEBRUARY 2014  
Bond Pad Coordinates in Microns  
DESCRIPTION  
PAD NUMBER  
X MIN  
166.5  
166.5  
504.9  
645.3  
902.7  
1097.1  
1097.1  
1097.1  
1090.8  
834.3  
693.9  
375.3  
166.5  
166.5  
Y MIN  
413.1  
155.7  
155.7  
155.7  
155.7  
299.7  
440.1  
580.5  
888.3  
888.3  
888.3  
888.3  
888.3  
632.7  
X MAX  
267.3  
267.3  
605.7  
746.1  
1003.5  
1197.9  
1197.9  
1197.9  
1191.6  
935.1  
794.7  
476.1  
267.3  
267.3  
Y MAX  
513.9  
256.5  
256.5  
256.5  
256.5  
400.5  
540.9  
681.3  
989.1  
989.1  
989.1  
989.1  
989.1  
733.5  
1A  
1B  
1
2
1Y  
3
2A  
4
2B  
5
2Y  
6
GND  
3Y  
7
8
3A  
9
3B  
10  
11  
12  
13  
14  
4Y  
4A  
4B  
VCC  
xxx  
Copyright © 2014, Texas Instruments Incorporated  
3
PACKAGE OPTION ADDENDUM  
www.ti.com  
9-Nov-2021  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
SN54HC00TDF1  
SN54HC00TDF2  
ACTIVE  
ACTIVE  
0
0
400  
10  
RoHS & Green  
RoHS & Green  
Call TI  
N / A for Pkg Type  
N / A for Pkg Type  
25 to 25  
25 to 25  
Call TI  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
9-Nov-2021  
OTHER QUALIFIED VERSIONS OF SN54HC00-DIE :  
Space : SN54HC00-SP  
NOTE: Qualified Version Definitions:  
Space - Radiation tolerant, ceramic packaging and qualified for use in Space-based application  
Addendum-Page 2  
重要声明和免责声明  
TI“按原样提供技术和可靠性数据(包括数据表)、设计资源(包括参考设计)、应用或其他设计建议、网络工具、安全信息和其他资源,  
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保。  
这些资源可供使用 TI 产品进行设计的熟练开发人员使用。您将自行承担以下全部责任:(1) 针对您的应用选择合适的 TI 产品,(2) 设计、验  
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TI 反对并拒绝您可能提出的任何其他或不同的条款。IMPORTANT NOTICE  
邮寄地址:Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2021,德州仪器 (TI) 公司  

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