SN54HC132TDG1 [TI]
4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25;型号: | SN54HC132TDG1 |
厂家: | TEXAS INSTRUMENTS |
描述: | 4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25 逻辑集成电路 |
文件: | 总6页 (文件大小:378K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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SN54HC132-DIE
ZHCSCE3 –APRIL 2014
SN54HC132-DIE 四路正与非 (NAND) 门,具有施密特触发器输入
1 特性
3 说明
1
•
宽工作电压范围
低功耗
这个电路的功能为 NAND 门,但是由于施密特操作,
它对于正向和负向信号有不同的输入阀值电平。
SN54HC132-DIE 在正逻辑电路中执行布尔函数
Y = A • B 或 Y = A + B。
•
•
•
•
低输入电流
极低输入转换运行
高抗扰度
这个电路是温度补偿电路,可由输入斜坡的最低点触
发,并且仍然能够提供清洁的无抖动输出信号。
2 应用范围
•
•
•
•
•
•
•
•
•
•
手机
掌上电脑 (PDA)
便携式仪表
音频和视频信号路由
低压数据采集系统
通信电路
调制解调器
硬盘
计算机外设
无线终端和外设
Ordering Information(1)
PACKAGE
DESIGNATOR
PRODUCT
PACKAGE
ORDERABLE PART NUMBER
PACKAGE QUANTITY
SN54HC132TDG1
SN54HC132TDG2
154
10
SN54HC132
TD
Bare die in waffle pack(2)
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
English Data Sheet: SCLS750
SN54HC132-DIE
ZHCSCE3 –APRIL 2014
www.ti.com.cn
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
4 Bare Die Information
BACKSIDE
POTENTIAL
BOND PAD
METALLIZATION COMPOSITION
BOND PAD
THICKNESS
DIE THICKNESS
BACKSIDE FINISH
Silicon with backgrind
10.5 mils.
Floating
TiW/ALCU2%
1210 nm
2
Copyright © 2014, Texas Instruments Incorporated
SN54HC132-DIE
www.ti.com.cn
ZHCSCE3 –APRIL 2014
Bond Pad Coordinates in Microns
DESCRIPTION
PAD NUMBER
X MIN
Y MIN
568.8
262.8
171.9
175.5
175.5
388.8
741.6
994.5
1191.6
1191.6
1195.2
1191.6
1042.2
762.3
X MAX
279.9
Y MAX
669.6
363.6
272.7
276.3
276.3
489.6
842.4
1095.3
1292.4
1292.4
1296
1A
1B
1
2
179.1
179.1
279.9
1Y
3
534.6
635.4
2A
4
821.25
1127.25
1280.7
1282.95
1280.7
1170.45
948.15
598.95
172.8
922.05
1228.05
1381.5
1383.75
1381.5
1271.25
1048.95
699.75
273.6
2B
5
2Y
6
GND
3Y
7
8
3A
9
3B
10
11
12
13
14
4Y
4A
1292.4
1143
4B
179.1
279.9
VCC
179.1
279.9
863.1
Copyright © 2014, Texas Instruments Incorporated
3
PACKAGE OPTION ADDENDUM
www.ti.com
13-Jul-2022
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
SN54HC132TDG1
SN54HC132TDG2
ACTIVE
ACTIVE
0
0
100
10
RoHS & Green
RoHS & Green
Call TI
N / A for Pkg Type
N / A for Pkg Type
25 to 25
25 to 25
Samples
Samples
Call TI
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
13-Jul-2022
OTHER QUALIFIED VERSIONS OF SN54HC132-DIE :
Space : SN54HC132-SP
•
NOTE: Qualified Version Definitions:
Space - Radiation tolerant, ceramic packaging and qualified for use in Space-based application
•
Addendum-Page 2
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