SN54HC132TDG1 [TI]

4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25;
SN54HC132TDG1
型号: SN54HC132TDG1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

4 通道、2 输入、2V 至 6V 与非门 | TD | 0 | 25 to 25

逻辑集成电路
文件: 总6页 (文件大小:378K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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SN54HC132-DIE  
ZHCSCE3 APRIL 2014  
SN54HC132-DIE 四路正与非 (NAND) 门,具有施密特触发器输入  
1 特性  
3 说明  
1
宽工作电压范围  
低功耗  
这个电路的功能为 NAND 门,但是由于施密特操作,  
它对于正向和负向信号有不同的输入阀值电平。  
SN54HC132-DIE 在正逻辑电路中执行布尔函数  
Y = A • B Y = A + B。  
低输入电流  
极低输入转换运行  
高抗扰度  
这个电路是温度补偿电路,可由输入斜坡的最低点触  
发,并且仍然能够提供清洁的无抖动输出信号。  
2 应用范围  
手机  
掌上电脑 (PDA)  
便携式仪表  
音频和视频信号路由  
低压数据采集系统  
通信电路  
调制解调器  
硬盘  
计算机外设  
无线终端和外设  
Ordering Information(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
SN54HC132TDG1  
SN54HC132TDG2  
154  
10  
SN54HC132  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SCLS750  
SN54HC132-DIE  
ZHCSCE3 APRIL 2014  
www.ti.com.cn  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
4 Bare Die Information  
BACKSIDE  
POTENTIAL  
BOND PAD  
METALLIZATION COMPOSITION  
BOND PAD  
THICKNESS  
DIE THICKNESS  
BACKSIDE FINISH  
Silicon with backgrind  
10.5 mils.  
Floating  
TiW/ALCU2%  
1210 nm  
2
Copyright © 2014, Texas Instruments Incorporated  
SN54HC132-DIE  
www.ti.com.cn  
ZHCSCE3 APRIL 2014  
Bond Pad Coordinates in Microns  
DESCRIPTION  
PAD NUMBER  
X MIN  
Y MIN  
568.8  
262.8  
171.9  
175.5  
175.5  
388.8  
741.6  
994.5  
1191.6  
1191.6  
1195.2  
1191.6  
1042.2  
762.3  
X MAX  
279.9  
Y MAX  
669.6  
363.6  
272.7  
276.3  
276.3  
489.6  
842.4  
1095.3  
1292.4  
1292.4  
1296  
1A  
1B  
1
2
179.1  
179.1  
279.9  
1Y  
3
534.6  
635.4  
2A  
4
821.25  
1127.25  
1280.7  
1282.95  
1280.7  
1170.45  
948.15  
598.95  
172.8  
922.05  
1228.05  
1381.5  
1383.75  
1381.5  
1271.25  
1048.95  
699.75  
273.6  
2B  
5
2Y  
6
GND  
3Y  
7
8
3A  
9
3B  
10  
11  
12  
13  
14  
4Y  
4A  
1292.4  
1143  
4B  
179.1  
279.9  
VCC  
179.1  
279.9  
863.1  
Copyright © 2014, Texas Instruments Incorporated  
3
PACKAGE OPTION ADDENDUM  
www.ti.com  
13-Jul-2022  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
SN54HC132TDG1  
SN54HC132TDG2  
ACTIVE  
ACTIVE  
0
0
100  
10  
RoHS & Green  
RoHS & Green  
Call TI  
N / A for Pkg Type  
N / A for Pkg Type  
25 to 25  
25 to 25  
Samples  
Samples  
Call TI  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
13-Jul-2022  
OTHER QUALIFIED VERSIONS OF SN54HC132-DIE :  
Space : SN54HC132-SP  
NOTE: Qualified Version Definitions:  
Space - Radiation tolerant, ceramic packaging and qualified for use in Space-based application  
Addendum-Page 2  
重要声明和免责声明  
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保。  
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邮寄地址:Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2022,德州仪器 (TI) 公司  

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