SN65MLVD047APWG4 [TI]
Multipoint-LVDS Quad Differential Line Driver 16-TSSOP -40 to 85;型号: | SN65MLVD047APWG4 |
厂家: | TEXAS INSTRUMENTS |
描述: | Multipoint-LVDS Quad Differential Line Driver 16-TSSOP -40 to 85 驱动 光电二极管 接口集成电路 驱动器 |
文件: | 总21页 (文件大小:651K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
MULTIPOINT-LVDS QUAD DIFFERENTIAL LINE DRIVER
FEATURES
DESCRIPTION
D
Differential Line Drivers for 30-Ω to 55-Ω
Loads and Data Rates Up to 200 Mbps,
Clock Frequencies up to 100 MHz
The SN65MLVD047A is a quadruple line driver that
complies with the TIA/EIA-899 standard, Electrical
Characteristics of Multipoint-Low-Voltage Differential
Signaling (M−LVDS). The output current of this M−LVDS
device has been increased, in comparison to standard
LVDS compliant devices, in order to support doubly
terminated transmission lines and heavily loaded
backplane bus applications. Backplane applications
generally require impedance matching termination
resistors at both ends of the bus. The effective impedance
of a doubly terminated bus can be as low as 30 Ω due to
the bus terminations, as well as the capacitive load of bus
interface devices. SN65MLVD047A drivers allow for
operation with loads as low as 30 Ω. The SN65MLVD047A
devices allow for multiple drivers to be present on a single
bus. SN65MLVD047A drivers are high impedance when
disabled or unpowered. Driver edge rate control is
incorporated to support operation. The M−LVDS standard
allows up to 32 nodes (drivers and/or receivers) to be
connected to the same media in a backplane when
multiple bus stubs are expected from the main
(1)
D
D
D
D
Supports Multipoint Bus Architectures
Meets the Requirements of TIA/EIA-899
Operates from a Single 3.3-V Supply
Characterized for Operation from −405C to
855C
D
16-Pin SOIC (JEDEC MS-012) and 16-Pin
TSSOP (JEDEC MS-153) Packaging
APPLICATIONS
D
D
D
AdvancedTCAE (ATCAE) Clock Bus Driver
Clock Distribution
Backplane or Cabled Multipoint Data
Transmission in Telecommunications,
Automotive, Industrial, and Other Computer
Systems
transmission
line
to
interface
devices.
The
D
D
D
D
Cellular Base Stations
SN65MLVD047A provides 9-kV ESD protection on all bus
pins.
Central-Office and PBX Switching
Bridges and Routers
Low-Power High-Speed Short-Reach
Alternative to TIA/EIA-485
LOGIC DIAGRAM (POSITIVE LOGIC)
EN
EN
1 Y
1 Z
1A
2A
2 Y
2 Z
3 Y
3 Z
3A
4A
4 Y
4 Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
(1)
The data rate of a line, is the number of voltage transitions that are made per second expressed in the units bps (bits per second).
AdvancedTCA and ATCA are trademarks of the PCI Industrial Computer Manufacturers Group.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during
storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION
PART NUMBER
PACKAGE MARKING
MLVD047A
MLVD047A
BUL
PACKAGE/CARRIER
16-Pin SOIC/Tube
SN65MLVD047AD
SM65MLVD047ADR
SN65MLVD047APW
SM65MLVD047APWR
16-Pin SOIC/Tape and Reel
16-Pin TSSOP/Tube
BUL
16-Pin TSSOP/Tape and Reel
:
NOTE For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website
at www.ti.com.
PACKAGE DISSIPATION RATINGS
PCB JEDEC
STANDARD
T
≤ 25°C
DERATING FACTOR
T = 85°C
POWER RATING
A
A
PACKAGE
(1)
POWER RATING
ABOVE T = 25°C
A
(2)
D(16)
Low-K
898 mW
7.81 mW/_C
5.15 mW/_C
8.22 mW/_C
429 mW
(2)
Low-K
592 mW
283 mw
PW(16)
(3)
High-K
945 mW
452 mw
(1)
(2)
(3)
This is the inverse of the junction-to-ambient thermal resistance when board mounted and with no air flow.
In accordance with the Low-K thermal metric difinitions of EIA/JESD51−3.
In accordance with the High-K thermal metric difinitions of EIA/JESD51−7.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted
(1)
UNITS
−0.5 V to 4 V
−0.5 V to 4 V
−1.8 V to 4 V
±9 kV
(2)
Supply voltage range , V
CC
Input voltage range, V
A, EN, EN
I
Output voltage range, V
Y, Z
O
Y and Z
All pins
All pins
All pins
(3)
Human Body Model
±4 kV
Electrostatic discharge
Junction temperature, T
(4)
Charged-Device Model
±1500 V
200 V
(5)
Machine Model
140°C
J
(1)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to the circuit ground terminal.
Tested in accordance with JEDEC Standard 22, Test Method A114−B.
(2)
(3)
(4)
(5)
Tested in accordance with JEDEC Standard 22, Test Method C101−A.
Tested in accordance with JEDEC Standard 22, Test Method A115−A.
2
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
RECOMMENDED OPERATING CONDITIONS (see Figure 1)
MIN NOM
MAX UNIT
Supply voltage, V
3
2
3.3
3.6
V
V
V
V
Ω
CC
High-level input voltage, V
V
CC
IH
Low-level input voltage, V
0
0.8
IL
Voltage at any bus terminal (separate or common mode) V or V
−1.4
30
3.8
55
Y
Z
Differential load resistance, R
L
Signaling rate, 1/t
200 Mbps
100 MHz
UI
Clock frequency, f
Junction temperature, T
−40
125
°C
J
THERMAL CHARACTERISTICS
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
(1)
Low-K board , no airflow
D
128
194.2
146.8
133.1
121.6
51.1
(1)
Low-K board , no airflow
(1)
Low-K board , 150 LFM
Junction-to-ambient thermal resistance, Θ
°C/W
JA
PW
(1)
Low-K board , 250 LFM
(2)
High-K board , no airflow
D
(2)
Junction-to-board thermal resistance, Θ
High-K board
°C/W
°C/W
JB
PW
D
85.3
45.4
Junction-to-case thermal resistance, Θ
JC
PW
34.7
EN = V , EN = GND, R = 50 Ω,
CC
L
Device power dissipation, P
Input 100 MHz 50 % duty cycle square wave to
all data inputs, T = 85°C
288.5
mW
D
A
(1)
(2)
In accordance with the Low-K thermal metric difinitions of EIA/JESD51−3.
In accordance with the High-K thermal metric difinitions of EIA/JESD51−7.
ELECTRICAL CHARACTERISTICS
over recommended operating conditions unless otherwise noted
(1)
PARAMETER
TEST CONDITIONS
EN = V , EN = GND, R = 50 Ω, All data inputs = V or
MIN TYP
MAX
UNIT
CC
L
CC
Driver enabled
Driver disabled
59
70
GND
EN = GND, EN = V , R = No load, All data inputs = V
CC
I
Supply current
mA
CC
CC
L
2
4
or GND
(1)
All typical values are at 25°C and with a 3.3-V supply voltage.
3
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
ELECTRICAL CHARACTERISTICS
over recommended operating conditions unless otherwise noted
(1)
(2)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
LVTTL (EN, EN, 1A:4A)
|I
|
0
0
10
10
µA
µA
pF
High-level input current
Low-level input current
Input capacitance
V
V
= 2 V or V
IH
IH
CC
|I |
= GND or 0.8 V
IL
IL
(3)
C
5
V = 0.4 sin(30E6πt) + 0.5 V
I
i
M−LVDS (1Y/1Z:4Y/4Z)
⎪V
⎪
480
−50
0.8
650
50
mV
mV
V
Differential output voltage magnitude
YZ
See Figure 2
See Figure 3
Change in differential output voltage magnitude
between logic states
∆⎪V
⎪
YZ
V
1.2
50
Steady-state common-mode output voltage
OS(SS)
Change in steady-state common-mode output
voltage between logic states
∆V
−50
mV
mV
V
OS(SS)
OS(PP)
Y(OC)
V
V
150
2.4
Peak-to-peak common-mode output voltage
Maximum steady-state open-circuit output
voltage
0
0
See Figure 7
See Figure 5
Maximum steady-state open-circuit output
voltage
V
Z(OC)
2.4
V
V
V
⎪I
1.2 V
V
V
Voltage overshoot, low-to-high level output
Voltage overshoot, high-to-low level output
P(H)
SS
−0.2 V
P(L)
SS
⎪
24
10
mA
Differential short-circuit output current magnitude See Figure 4
OS
−1.4 V ≤ (V or V ) ≤ 3.8 V,
Y
Z
I
−15
−10
µA
High-impedance state output current
OZ
Other output = 1.2 V
−1.4 V ≤ (V or V ) ≤ 3.8 V,
Y
Z
I
10
µA
Power-off output current
Other output = 1.2 V,
= 1.5 V
O(OFF)
V
CC
V or V = 0.4 sin(30E6πt) +
Y
Z
(3)
0.5 V,
C
or C
3
pF
pF
Output capacitance
Y
Z
Other outputs at 1.2 V, driver
disabled
(3)
V
YZ
= 0.4 sin(30E6πt) V,
C
C
2.5
Differential output capacitance
YZ
Driver disabled
0.99
1.01
Output capacitance balance, (C /C )
Y/Z
Y
Z
(1)
The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
All typical values are at 25°C and with a 3.3-V supply voltage.
HP4194A impedance analyzer (or equivalent)
(2)
(3)
4
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
SWITCHING CHARACTERISTICS
over recommended operating conditions unless otherwise noted
(1)
PARAMETER
TEST CONDITIONS
MIN TYP
MAX
2.4
UNIT
ns
t
t
t
t
t
t
t
1
1
1
1
1.5
Propagation delay time, low-to-high-level output
Propagation delay time, high-to-low-level output
Differential output signal rise time
pLH
pHL
r
1.5
2.4
ns
1.9
ns
1.9
ns
Differential output signal fall time
See Figure 5
f
(2)
100
100
600
ps
Output skew
sk(o)
sk(p)
sk(pp)
22
ps
Pulse skew (|t
− t |)
pLH
pHL
(3)
ps
Part-to-part skew
See Figure 8, All data inputs 100 MHz
clock input
(4)
t
t
t
0.2
5
1
36
ps
ps
ps
Period jitter, rms (1 standard deviation)
jit(per)
jit(c−c)
jit(pp)
See Figure 8, All data inputs 100 MHz
clock input
(4)
Cycle-to-cycle jitter
See Figure 8, All data inputs 200 Mbps
(3)(5)
46
158
Peak-to-peak jitter
15
2
−1 PRBS input
t
t
t
t
9
9
ns
ns
ns
ns
Enable time, high-impedance-to-high-level output
Enable time, high-impedance-to-low-level output
Disable time, high-level-to-high-impedance output
pZH
pZL
pHZ
pLZ
See Figure 6
See Figure 6
10
10
Disable time, low-level-to-high-impedance output
(1)
(2)
(3)
All typical values are at 25°C and with a 3.3-V supply voltage.
t
t
, output skew is the magnitude of the time difference in propagation delay times between any specified terminals of a device.
sk(o)
is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate
sk(pp)
with the same supply voltages, at the same temperature, and have identical packages and test circuits.
Stimulus jitter has been subtracted from the measurements.
(4)
(5)
Peak-to-peak jitter includes jitter due to pulse skew (t
).
sk(p)
5
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
PARAMETER MEASUREMENT INFORMATION
V
CC
I
Y
Y
Z
I
I
D
V
YZ
I
Z
V
Y
V
I
V
OS
V
Z
V
Y
+ V
2
Z
Figure 1. Driver Voltage and Current Definitions
3.32 kΩ
Y
+
−1 V ≤ V
≤ 3.4 V
V
YZ
49.9 Ω
D
test
_
Z
3.32 kΩ
:
NOTE All resistors are 1% tolerance.
Figure 2. Differential Output Voltage Test Circuit
Y
Z
R1
24.9 Ω
≈ 1.3 V
≈ 0.7 V
Y
C1
1 pF
D
V
nV
OS(SS)
OS(PP)
V
OS
Z
C3
2.5 pF
R2
24.9 Ω
V
OS(SS)
C2
1 pF
NOTES:A. All input pulses are supplied by a generator having the following characteristics: t or t ≤ 1 ns, pulse frequency = 500 kHz,
r
f
duty cycle = 50 ± 5%.
B. C1, C2 and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%.
C. R1 and R2 are metal film, surface mount, ±1%, and located within 2 cm of the D.U.T.
D. The measurement of V
is made on test equipment with a −3 dB bandwidth of at least 1 GHz.
OS(PP)
Figure 3. Test Circuit and Definitions for the Common-Mode Output Voltage
I
OS
Y
Z
0 V or V
CC
+
V
−
−1 V to 3.4 V
Test
Figure 4. Short-Circuit Test Circuit
6
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
Y
Z
C1
1 pF
C3
0.5 pF
R1
50 Ω
Output
D
C2
1 pF
V
V
CC
/2
CC
Input
0 V
t
pLH
t
pHL
V
SS
0.9V
V
P(H)
SS
Output
0 V
V
P(L)
0.1V
SS
0 V
SS
t
f
t
r
NOTES:A. All input pulses are supplied by a generator having the following characteristics: t or t ≤ 1 ns, frequency = 500 kHz,
r
f
duty cycle = 50 ± 5%.
B. C1, C2, and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%.
C. R1 is a metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T.
D. The measurement is made on test equipment with a −3 dB bandwidth of at least 1 GHz.
Figure 5. Driver Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal
R1
24.9 Ω
Y
C1
1 pF
D
C4
0.5 pF
0 V or V
Output
CC
C3
2.5 pF
C2
1 pF
Z
R2
24.9 Ω
Input
EN or EN
EN
V
CC
V
CC
/2
EN
0 V
t
t
t
pZH
pHZ
∼ 0.6 V
0.1 V
Output With
0 V
D at V
CC
t
pZL
pLZ
Output With
D at 0 V
0 V
−0.1 V
∼ −0.6 V
NOTES:A. All input pulses are supplied by a generator having the following characteristics: t or t ≤ 1 ns, frequency = 500 kHz, duty cycle = 50 ±
r
f
5%.
B. C1, C2, C3, and C4 includes instrumentation and fixture capacitance within 2 cm of the D.U.T. and are ±20%.
C. R1 and R2 are metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T.
D. The measurement is made on test equipment with a −3 dB bandwidth of at least 1 GHz.
Figure 6. Driver Enable and Disable Time Circuit and Definitions
7
SN65MLVD047A
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SLLS736A − JULY 2006 − REVISED MAY 2008
Y
Z
0 V or V
CC
V , or V
Y
1.62 kΩ , ±1%
Z
Figure 7. Driver Maximum Steady State Output Voltage
V
V
CC
CLOCK
INPUT
/2
CC
0 V
1/f0
Period Jitter
IDEAL
OUTPUT
V
V
CC
0 V
PRBS INPUT
/2
CC
V
Y
−V
Z
1/f0
0 V
ACTUAL
OUTPUT
Peak to Peak Jitter
0 V
V
V
−V
Z
Y
V
Y
−V
Z
OUTPUT
0 V
t
c(n)
= ⎮t
−V
Z
t
−1/f0⎮
c(n)
Y
jit(per)
t
jit(pp)
Cycle to Cycle Jitter
OUTPUT
0 V
V − V
Y
Z
t
t
|
c(n)
c(n+1)
t
= | t
− t
jit(cc)
c(n) c(n+1)
NOTES:A. All input pulses are supplied by an Agilent 8304A Stimulus System.
B. The measurement is made on a TEK TDS6604 running TDSJIT3 application software
C. Period jitter and cycle-to-cycle jitter are measured using a 100 MHz 50 ±1% duty cycle clock input.
15
D. Peak-to-peak jitter is measured using a 200 Mbps 2 −1 PRBS input.
Figure 8. Driver Jitter Measurement Waveforms
8
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SLLS736A − JULY 2006 − REVISED MAY 2008
DEVICE INFORMATION
PIN ASSIGNMENTS
D PACKAGE
(TOP VIEW)
PW PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
16
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
EN
1A
2A
VCC
GND
3A
1Z
1Y
2Y
2Z
3Z
3Y
4Y
4Z
EN
1A
2A
VCC
GND
3A
1Z
1Y
2Y
2Z
3Z
3Y
4Y
4Z
15
14
13
12
11
10
9
4A
EN
4A
EN
DEVICE FUNCTION TABLE
INPUTS
EN
OUTPUTS
D
EN
Y
Z
L
H
OPEN
X
H
H
L
L
L
X
L
H
L
Z
Z
H
L
H
Z
Z
H
L or OPEN
X
X
H or OPEN
H = high level, L = low level, Z = high impedance, X = Don’t care
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
DRIVER INPUT AND ACTIVE−HIGH ENABLE
DRIVER OUTPUT
ACTIVE−LOW ENABLE
V
V
CC
CC
V
CC
V
CC
_
_
10 mA
1 mA
+
+
360 kΩ
400 Ω
400 Ω
D or EN
7 V
EN
7 V
Y or Z
360 kΩ
+
_
0.2 V
_
+
10 mA
9
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SLLS736A − JULY 2006 − REVISED MAY 2008
TYPICAL CHARACTERISTICS
RMS SUPPLY CURRENT
RMS SUPPLY CURRENT
vs
vs
INPUT FREQUENCY
FREE-AIR TEMPERATURE
80
75
70
65
60
55
50
65
V
= 3.3 V,
V
= 3.3 V,
CC
CC
f = 50 MHz,
EN = V
EN = GND,
T = 255C,
A
,
EN = V
,
CC
CC
64
63
62
61
60
EN = GND,
R = 50 W,
All Inputs
R = 50 W
L
L
−40
−15
10
35
60
85
25
50
75
100
125
T − Free-Air Temperature − °C
A
f − Input Frequency − MHz
Figure 9
Figure 10
DRIVER PROPAGATION DELAY TIME
DIFFERENTIAL OUTPUT VOLTAGE MAGNITUDE
vs
vs
FREE-AIR TEMPERATURE
INPUT FREQUENCY
600
1.54
T = 255C,
A
V
CC
= 3.3 V,
R = 50 W
L
V
= 3.6 V
f = 500 kHz,
R = 50 W
CC
1.52
1.5
t
PHL
L
V
CC
= 3.3 V
580
560
540
520
500
t
1.48
1.46
1.44
1.42
1.4
PLH
V
CC
= 3 V
1.38
1.36
1.34
25
50
75
100
125
−40
−15
10
35
60
85
f − Input Frequency − MHz
T − Free-Air Temperature − °C
A
Figure 12
Figure 11
10
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SLLS736A − JULY 2006 − REVISED MAY 2008
TYPICAL CHARACTERISTICS
DRIVER TRANSITION TIME
PEAK-TO-PEAK JITTER
vs
vs
FREE-AIR TEMPERATURE
DATA RATE
100
90
80
70
60
50
40
30
20
10
1.8
V
V
= 3.3 V,
= 3.3 V,
CC
CC
T = 255C,
f = 500 kHz,
R = 50 W
A
15
All Inputs = 2 −1 PRBS NRZ,
(See Figure 8)
L
1.7
1.6
1.5
1.4
1.3
1.2
t
f
t
r
−40
−15
10
35
60
85
50
100
150
200
250
T − Free-Air Temperature − °C
A
Data Rate − Mbps
Figure 13
Figure 14
PERIOD JITTER
vs
CYCLE-TO-CYCLE JITTER
vs
CLOCK FREQUENCY
CLOCK FREQUENCY
10
9
8
7
6
5
4
3
2
1
0
1
0.9
0.8
V
= 3.3 V,
V
= 3.3 V,
CC
CC
T = 255C,
T = 255C,
A
A
All Inputs = Clock
(See Figure 8)
All Inputs = Clock
(See Figure 8)
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
25
50
75
100
125
25
50
75
100
125
f − Clock Frequency − MHz
f − Clock Frequency − MHz
Figure 15
Figure 16
11
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SLLS736 − JULY 2006
APPLICATION INFORMATION
SYNCHRONIZATION CLOCK IN ADVANCEDTCA
Advanced Telecommunications Computing Architecture, also known as AdvancedTCA, is an open architecture to meet
the needs of the rapidly changing communications network infrastructure. M−LVDS bused clocking is recommended by
the ATCA.
The ATCA specification includes requirements for three redundant clock signals. An 8-KHz and a 19.44-MHz clock signal,
as well as an user-defined clock signal are included in the specification. The SN65MLVD047A quad driver supports
distribution of these three ATCA clock signals, supporting operation beyond 100 MHz, which is the highest clock frequency
included in the ATCA specification. A pair of SN65MLVD047A devices can be used to support the ATCA redundancy
requirements.
MULTIPOINT CONFIGURATION
The SN65MLVD047A is designed to meet or exceed the requirement of the TIA/EIA−899 (M−LVDS) standard, which allows
multipoint communication on a shared bus.
Multipoint is a bus configuration with multiple drivers and receivers present. An example is shown in Figure 17. The figure
shows transceivers interfacing to the bus, but a combination of drivers, receivers, and transceivers is also possible.
Termination resistors need to be placed on each end of the bus, with the termination resistor value matched to the loaded
bus impedance.
Z
t
Z
t
Figure 17. Multipoint Architecture
MULTIDROP CONFIGURATION
Multidrop configuration is similar to multipoint configuration, but only one driver is present on the bus. A multidrop system
can be configured with the driver at one end of the bus, or in the middle of the bus. When a driver is located at one end,
a single termination resistor is located at the far end, close to the last receiver on the bus. Alternatively, the driver can be
located in the middle of the bus, to reduce the maximum flight time. With a centrally located driver, termination resistors
are located at each end of the bus. In both cases the termination resistor value should be matched to the loaded bus
impedance. Figure 18 shows examples of both cases.
12
SN65MLVD047A
www.ti.com
SLLS736 − JULY 2006
D
Z
t
Z
t
Z
t
Z
t
D
Figure 18. Multidrop Architectures With Different Driver Locations
UNUSED CHANNEL
A 360−kΩ pull−down resistor is built in every LVTTL input. The unused driver inputs should be left floating or connected
to ground. The low−level output of an unused enabled driver may oscillate if left floating and should be connected to ground.
If the input is floating or connected to ground, the unused Y (non−inverting) output of an enabled driver should be connected
to ground. The unused Z (inverting) should be left floating.
13
PACKAGE OPTION ADDENDUM
www.ti.com
6-Dec-2006
PACKAGING INFORMATION
Orderable Device
SN65MLVD047AD
Status (1)
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
Package Package
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)
Qty
Type
Drawing
SOIC
D
16
16
16
16
16
16
16
16
40 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65MLVD047ADG4
SN65MLVD047ADR
SN65MLVD047ADRG4
SN65MLVD047APW
SN65MLVD047APWG4
SN65MLVD047APWR
SN65MLVD047APWRG4
SOIC
SOIC
D
40 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
D
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SOIC
D
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
TSSOP
TSSOP
TSSOP
TSSOP
PW
PW
PW
PW
90 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
90 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
SN65MLVD047ADR
SN65MLVD047APWR
SOIC
D
16
16
2500
2000
330.0
330.0
16.4
12.4
6.5
6.9
10.3
5.6
2.1
1.6
8.0
8.0
16.0
12.0
Q1
Q1
TSSOP
PW
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
SN65MLVD047ADR
SN65MLVD047APWR
SOIC
D
16
16
2500
2000
367.0
367.0
367.0
367.0
38.0
35.0
TSSOP
PW
Pack Materials-Page 2
IMPORTANT NOTICE
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
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Copyright © 2012, Texas Instruments Incorporated
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