SN74ACT374PW [TI]

OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS; 八D型边沿触发触发器具有三态输出
SN74ACT374PW
型号: SN74ACT374PW
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS
八D型边沿触发触发器具有三态输出

总线驱动器 总线收发器 触发器 逻辑集成电路 光电二极管 输出元件
文件: 总6页 (文件大小:86K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SN54ACT374, SN74ACT374  
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
WITH 3-STATE OUTPUTS  
SCAS539E – OCTOBER 1995 – REVISED JANUARY 2000  
SN54ACT374 . . . J OR W PACKAGE  
SN74ACT374 . . . DB, DW, N, OR PW PACKAGE  
(TOP VIEW)  
Inputs Are TTL-Voltage Compatible  
EPIC (Enhanced-Performance Implanted  
CMOS) 1-µm Process  
Package Options Include Plastic  
OE  
1Q  
1D  
2D  
2Q  
3Q  
3D  
4D  
4Q  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
V
CC  
Small-Outline (DW) Shrink Small-Outline  
(DB), and Thin Shrink Small-Outline (PW)  
Packages, Ceramic Chip Carriers (FK) and  
Flatpacks (W), and Standard Plastic (N) and  
Ceramic (J) DIPs  
8Q  
8D  
7D  
7Q  
6Q  
6D  
5D  
5Q  
CLK  
description  
These 8-bit flip-flops feature 3-state outputs  
designed specifically for driving highly capacitive  
or relatively low-impedance loads. The devices  
are particularly suitable for implementing buffer  
registers, I/O ports, bidirectional bus drivers, and  
working registers.  
GND  
SN54ACT374 . . . FK PACKAGE  
(TOP VIEW)  
The eight flip-flops of the ’ACT374 devices are  
D-type edge-triggered flip-flops. On the positive  
transition of the clock (CLK) input, the Q outputs  
are set to the logic levels set up at the data (D)  
inputs.  
3
2 1 20 19  
18  
2D  
2Q  
3Q  
3D  
4D  
8D  
7D  
7Q  
6Q  
4
5
6
7
8
17  
16  
15  
A buffered output-enable (OE) input can be used  
to place the eight outputs in either a normal logic  
state (high or low logic levels) or the  
high-impedance state. In the high-impedance  
state, the outputs neither load nor drive the bus  
lines significantly. The high-impedance state and  
the increased drive provide the capability to drive  
bus lines in bus-organized systems without need  
for interface or pullup components.  
14 6D  
9 10 11 12 13  
OE does not affect internal operations of the flip-flop. Old data can be retained or new data can be entered while  
the outputs are in the high-impedance state.  
The SN54ACT374 is characterized for operation over the full military temperature range of –55°C to 125°C. The  
SN74ACT374 is characterized for operation from –40°C to 85°C.  
FUNCTION TABLE  
(each flip-flop)  
INPUTS  
OUTPUT  
Q
OE  
L
CLK  
D
H
L
H
L
L
L
H or L  
X
X
X
Q
0
H
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments Incorporated.  
Copyright 2000, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54ACT374, SN74ACT374  
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
WITH 3-STATE OUTPUTS  
SCAS539E – OCTOBER 1995 – REVISED JANUARY 2000  
logic symbol  
logic diagram (positive logic)  
1
OE  
1
EN  
C1  
OE  
11  
CLK  
11  
CLK  
3
1D  
4
2
5
1D  
1Q  
2Q  
3Q  
4Q  
5Q  
6Q  
7Q  
8Q  
C1  
1D  
2
2D  
7
1Q  
6
3
3D  
8
1D  
9
4D  
13  
12  
15  
16  
19  
5D  
14  
To Seven Other Channels  
6D  
17  
7D  
18  
8D  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and  
IEC Publication 617-12.  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V  
CC  
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to V  
+ 0.5 V  
+ 0.5 V  
I
CC  
CC  
Output voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to V  
O
Input clamp current, I (V < 0 or V > V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
IK  
I
I
CC)  
O
Output clamp current, I  
(V < 0 or V > V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
CC)  
OK  
O
Continuous output current, I (V = 0 to V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA  
Continuous current through V  
Package thermal impedance, θ (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70°C/W  
O
O
CC  
CC  
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±200 mA  
JA  
DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58°C/W  
N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69°C/W  
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83°C/W  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
2. The package thermal impedance is calculated in accordance with JESD 51.  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54ACT374, SN74ACT374  
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
WITH 3-STATE OUTPUTS  
SCAS539E – OCTOBER 1995 – REVISED JANUARY 2000  
recommended operating conditions (see Note 3)  
SN54ACT374 SN74ACT374  
UNIT  
MIN  
4.5  
2
MAX  
MIN  
4.5  
2
MAX  
V
V
V
V
V
Supply voltage  
5.5  
5.5  
V
V
CC  
IH  
IL  
High-level input voltage  
Low-level input voltage  
Input voltage  
0.8  
0.8  
V
0
0
V
V
0
0
V
V
V
I
CC  
CC  
Output voltage  
V
O
CC  
CC  
I
I
High-level output current  
Low-level output current  
Input transition rise or fall rate  
Operating free-air temperature  
–24  
24  
–24  
24  
8
mA  
mA  
ns/V  
°C  
OH  
OL  
t/v  
0
8
0
T
–55  
125  
–40  
85  
A
NOTE 3: All unused inputs of the device must be held at V  
or GND to ensure proper device operation. Refer to the TI application report  
CC  
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
T
A
= 25°C  
TYP  
SN54ACT374 SN74ACT374  
PARAMETER  
TEST CONDITIONS  
V
UNIT  
CC  
MIN  
4.4  
MAX  
MIN  
4.4  
MAX  
MIN  
4.4  
MAX  
4.5 V  
5.5 V  
4.5 V  
5.5 V  
5.5 V  
5.5 V  
4.5 V  
5.5 V  
4.5 V  
5.5 V  
5.5 V  
5.5 V  
5.5 V  
5.5 V  
5.5 V  
4.49  
I
I
= –50 µA  
OH  
5.4  
5.49  
5.4  
5.4  
3.86  
4.86  
3.7  
3.76  
4.76  
V
OH  
= –24 mA  
V
OH  
4.7  
I
I
= –50 mA  
= –75 mA  
3.85  
OH  
3.85  
OH  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
I
= 50 µA  
OL  
OL  
0.36  
0.36  
0.44  
0.5  
0.44  
0.44  
V
OL  
I
= 24 mA  
V
I
I
= 50 mA  
1.65  
OL  
= 75 mA  
1.65  
±2.5  
±1  
OL  
I
I
I
V
= V or GND  
CC  
±0.25  
±0.1  
4
±5  
±1  
80  
µA  
µA  
µA  
OZ  
O
V = V  
or GND  
or GND,  
I
I
CC  
CC  
V = V  
I = 0  
O
40  
CC  
I
One input at 3.4 V,  
Other inputs at GND or V  
5.5 V  
0.6  
4.5  
1.6  
1.5  
mA  
pF  
I  
CC  
CC  
C
V = V  
or GND  
CC  
5 V  
i
I
Not more than one output should be tested at a time, and the duration of the test should not exceed 2 ms.  
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or V  
.
CC  
timing requirements over recommended operating free-air temperature range, V  
(unless otherwise noted) (see Figure 1)  
= 5 V ± 0.5 V  
CC  
T
= 25°C  
SN54ACT374 SN74ACT374  
A
UNIT  
MIN  
5
MAX  
MIN  
5
MAX  
MIN  
5
MAX  
t
w
t
su  
t
h
Pulse duration, CLK high or low  
Setup time, data before CLK↑  
Hold time, data after CLK↑  
ns  
ns  
ns  
5
5.5  
1.5  
5.5  
1.5  
1.5  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54ACT374, SN74ACT374  
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
WITH 3-STATE OUTPUTS  
SCAS539E – OCTOBER 1995 – REVISED JANUARY 2000  
switching characteristics over recommended operating free-air temperature range,  
V
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)  
CC  
T
A
= 25°C  
TYP  
160  
8.5  
8
SN54ACT374 SN74ACT374  
FROM  
(INPUT)  
TO  
(OUTPUT)  
PARAMETER  
UNIT  
MHz  
ns  
MIN  
100  
2
MAX  
MIN  
70  
MAX  
MIN  
90  
2
MAX  
f
t
t
t
t
t
t
max  
PLH  
PHL  
PZH  
PZL  
PHZ  
PLZ  
10  
9.5  
9.5  
9
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
12  
11.5  
11.5  
11.5  
13  
11.5  
11  
CLK  
Q
Q
Q
2
1.5  
1.5  
1.5  
1
2
8
10.5  
10.5  
12.5  
10  
ns  
ns  
OE  
OE  
1.5  
1.5  
1.5  
8
8.5  
7
11.5  
8.5  
11  
1
operating characteristics, V  
= 5 V, T = 25°C  
A
CC  
PARAMETER  
TEST CONDITIONS  
= 50 pF, f = 1 MHz  
TYP  
UNIT  
C
Power dissipation capacitance  
C
40  
pF  
pd  
L
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54ACT374, SN74ACT374  
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS  
WITH 3-STATE OUTPUTS  
SCAS539E – OCTOBER 1995 – REVISED JANUARY 2000  
PARAMETER MEASUREMENT INFORMATION  
2 × V  
CC  
Open  
TEST  
S1  
S1  
500 Ω  
t
t
/t  
Open  
PLH PHL  
/t  
From Output  
Under Test  
t
2 × V  
CC  
Open  
PLZ PZL  
/t  
PHZ PZH  
C
= 50 pF  
L
500 Ω  
(see Note A)  
3 V  
0 V  
1.5 V  
Timing Input  
Data Input  
LOAD CIRCUIT  
t
h
t
su  
3 V  
0 V  
1.5 V  
1.5 V  
t
w
3 V  
VOLTAGE WAVEFORMS  
1.5 V  
1.5 V  
Input  
Output  
Control  
(low-level  
enabling)  
0 V  
3 V  
0 V  
VOLTAGE WAVEFORMS  
1.5 V  
1.5 V  
t
t
PZL  
PLZ  
Output  
Waveform 1  
V  
3 V  
CC  
Input  
50% V  
1.5 V  
1.5 V  
CC  
CC  
S1 at 2 × V  
(see Note B)  
CC  
V
V
+ 0.3 V  
OL  
V
OL  
0 V  
t
t
t
t
PZH  
PHZ  
PLH  
PHL  
Output  
Waveform 2  
S1 at Open  
(see Note B)  
V
OH  
V
OH  
Output  
– 0.3 V  
OH  
50% V  
50% V  
50% V  
CC  
VOLTAGE WAVEFORMS  
includes probe and jig capacitance.  
CC  
V
0 V  
OL  
VOLTAGE WAVEFORMS  
NOTES: A.  
C
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, Z = 50 , t 2.5 ns, t 2.5 ns.  
O
r
f
D. The outputs are measured one at a time with one input transition per measurement.  
Figure 1. Load Circuit and Voltage Waveforms  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 2000, Texas Instruments Incorporated  

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