SN74AHCT1G08DBV [TI]
SINGLE 2-INPUT POSITIVE-AND GATE; 单路2输入正与门![SN74AHCT1G08DBV](http://pdffile.icpdf.com/pdf1/p00091/img/icpdf/SN74AHCT1_480961_icpdf.jpg)
型号: | SN74AHCT1G08DBV |
厂家: | ![]() |
描述: | SINGLE 2-INPUT POSITIVE-AND GATE |
文件: | 总5页 (文件大小:72K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
![](http://public.icpdf.com/style/img/ads.jpg)
SN74AHCT1G08
SINGLE 2-INPUT POSITIVE-AND GATE
SCLS315I – MARCH 1996 – REVISED JANUARY 2000
DBV OR DCK PACKAGE
(TOP VIEW)
EPIC (Enhanced-Performance Implanted
CMOS) Process
Inputs Are TTL-Voltage Compatible
A
B
GND
V
Y
1
2
3
5
4
CC
Latch-Up Performance Exceeds 250 mA Per
JESD 17
Package Options Include Plastic
Small-Outline Transistor (DBV, DCK)
Packages
description
The SN74AHCT1G08 is a single 2-input positive-AND gate. The device performs the Boolean function
A • B or Y B in positive logic.
Y
A
The SN74AHCT1G08 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OUTPUT
Y
A
B
H
X
L
H
L
H
L
L
X
†
logic symbol
1
2
&
A
B
4
Y
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
1
2
A
B
4
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
Copyright 2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN74AHCT1G08
SINGLE 2-INPUT POSITIVE-AND GATE
SCLS315I – MARCH 1996 – REVISED JANUARY 2000
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
CC
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
I
Output voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to V
+ 0.5 V
O
CC
Input clamp current, I (V < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20 mA
IK
I
Output clamp current, I
(V < 0 or V > V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
OK
O O CC
Continuous output current, I (V = 0 to V ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 mA
Continuous current through V
Package thermal impedance, θ (see Note 2): DBV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 347°C/W
O
O
CC
CC
or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA
JA
DCK package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 389°C/W
Storage temperature range, T
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
stg
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
recommended operating conditions (see Note 3)
MIN
MAX
UNIT
V
V
V
V
V
V
Supply voltage
4.5
2
5.5
CC
IH
IL
High-level input voltage
Low-level input voltage
Input voltage
V
0.8
5.5
V
0
0
V
I
Output voltage
V
V
O
CC
–8
I
I
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature
mA
mA
ns/V
°C
OH
OL
8
20
85
∆t/∆v
T
A
–40
NOTE 3: All unused inputs of the device must be held at V
or GND to ensure proper device operation. Refer to the TI application report,
CC
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
T
A
= 25°C
TYP
PARAMETER
TEST CONDITIONS
V
MIN
MAX
UNIT
V
CC
MIN
4.4
MAX
I
I
I
I
= –50
A
4.5
4.4
3.8
OH
OH
OL
OL
V
4.5 V
4.5 V
OH
OL
= –8 mA
= 50
= 8 mA
3.94
A
0.1
0.36
±0.1
1
0.1
0.44
±1
V
V
I
I
V = V
or GND
0 V to 5.5 V
5.5 V
A
A
I
I
CC
CC
V = V
or GND,
I = 0
O
10
CC
I
‡
∆I
CC
One input at 3.4 V, Other inputs at V
or GND
5.5 V
1.35
10
1.5
10
mA
pF
CC
C
V = V or GND
I CC
5 V
4
i
‡
This is the increase in supply current for each input at one of the specified TTL voltage levels rather than 0 V or V
.
CC
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN74AHCT1G08
SINGLE 2-INPUT POSITIVE-AND GATE
SCLS315I – MARCH 1996 – REVISED JANUARY 2000
switching characteristics over recommended operating free-air temperature range,
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
V
CC
T
A
= 25°C
TYP
5
FROM
(INPUT)
TO
(OUTPUT)
LOAD
CAPACITANCE
PARAMETER
MIN
MAX
UNIT
ns
MIN
MAX
6.9
t
t
t
t
1
1
1
1
8
8
9
9
PLH
PHL
PLH
PHL
A or B
A or B
Y
Y
C
C
= 15 pF
= 50 pF
L
L
5
6.9
5.5
5.5
7.9
ns
7.9
operating characteristics, V
= 5 V, T = 25°C
A
CC
PARAMETER
Power dissipation capacitance
TEST CONDITIONS
No load, f = 1 MHz
TYP
UNIT
C
18
pF
pd
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN74AHCT1G08
SINGLE 2-INPUT POSITIVE-AND GATE
SCLS315I – MARCH 1996 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
V
CC
Open
GND
S1
R
= 1 kΩ
L
TEST
S1
From Output
Under Test
Test
Point
From Output
Under Test
t
t
/t
Open
PLH PHL
/t
C
C
L
t
V
CC
L
PLZ PZL
/t
(see Note A)
(see Note A)
GND
PHZ PZH
Open Drain
V
CC
LOAD CIRCUIT FOR
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
3-STATE AND OPEN-DRAIN OUTPUTS
3 V
1.5 V
Timing Input
0 V
t
w
t
h
3 V
t
su
3 V
0 V
1.5 V
1.5 V
Input
Input
1.5 V
1.5 V
Data Input
0 V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3 V
0 V
3 V
0 V
Output
Control
1.5 V
1.5 V
1.5 V
1.5 V
t
t
t
t
t
PZL
PLZ
PLH
PHL
Output
Waveform 1
V
≈V
OH
CC
In-Phase
Output
50% V
50% V
50% V
CC
50% V
CC
CC
V
S1 at V
(see Note B)
CC
V
V
+ 0.3 V
OL
V
OL
OL
t
t
t
PHL
PLH
PZH
PHZ
Output
Waveform 2
S1 at GND
V
OH
V
OH
Out-of-Phase
Output
– 0.3 V
OH
50% V
50% V
CC
CC
CC
V
≈0 V
(see Note B)
OL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. includes probe and jig capacitance.
C
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, Z = 50 Ω, t ≤ 3 ns, t ≤ 3 ns.
O
r
f
D. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
相关型号:
©2020 ICPDF网 联系我们和版权申明