SN74ALS528FN [TI]
IC,ADDRESS COMPARATOR,ALS-TTL,LDCC,20PIN,PLASTIC;
| 型号： | SN74ALS528FN |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | IC,ADDRESS COMPARATOR,ALS-TTL,LDCC,20PIN,PLASTIC |
| 文件： | 总7页 (文件大小：97K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1994 – REVISED MAY 1986
•
•
Can Be Programmed and Verified on Most
Incoming Test Equipment
•
•
Dependable Texas Instruments Quality and
Reliability
Reduces Board and Package Size for
Similar Fixed Comparator Functions
Programming Capabilities
’ALS526 – Fuse Programmable 16-Bit
Identity Comparator
•
•
High-Speed Address Recognition
’ALS527 – Fuse Programmable 8-Bit
Identity Comparator and 4-Bit
Comparator
’ALS528 – Fuse Programmable 12-Bit
Identity Comparator
Package Options Include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
SN54ALS526 . . . J PACKAGE
SN54ALS527 . . . J PACKAGE
SN54ALS528 . . . J PACKAGE
SN74ALS526 . . . DW OR N PACKAGE
SN74ALS527 . . . DW OR N PACKAGE
SN54ALS528 . . . DW OR N PACKAGE
(TOP VIEW)
(TOP VIEW)
(TOP VIEW)
V
G
P0
P1
P2
P3
P4
P5
P6
P7
V
G
P0
P1
P2
P3
P4
P5
P6
P7
V
G
P0
P1
P2
P3
P4
P5
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
CC
CC
CC
P = Q
P11
P10
P9
P8
P7
P = Q
P15
P14
P13
P12
P11
P10
P9
P = Q
Q11
P11
Q10
P10
Q9
P9
Q8
P8
P6
GND
P8
GND
SN54ALS526 . . . FK PACKAGE
(TOP VIEW)
SN54ALS527 . . . FK PACKAGE
(TOP VIEW)
SN54ALS528 . . . FK PACKAGE
(TOP VIEW)
3
2
1
20 19
18
3
2
1
20 19
18
3
2
1
20 19
18
P15
P14
P13
P12
P11
Q11
P11
Q10
P10
Q9
P11
P10
NC
P9
P2
P3
P4
P5
P6
P2
P3
P4
P5
P6
P1
P2
4
5
6
7
8
4
5
6
7
8
4
5
6
7
8
17
16
15
14
17
16
15
14
17
16
15
14
N C
P3
P8
P4
9 10 11 12 13
9 10 11 12 13
9 10 11 12 13
NC–No internal connection
Copyright 1986, Texas Instruments Incorporated
5BASIC
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1984–REVISED MAY 1986
description
The ’ALS526 and ’ALS528 are fuse-programmable identity comparators designed for easy programming in
fixed-comparator applications. The ’ALS526 compares a 16-bit data word against a preprogrammed 16-bit data
word while the ’ALS528 compares a 12-bit data word against a preprogrammed 12-bit data word. The P = Q
output will go low when the applied data word (P inputs) matches the preprogrammed data word (Q represents
the preprogrammed data word). Programming is easily accomplished on the bench or with conventional
automatic test equipment. Special equipment such as PROM programmers are not required.
The ’ALS527 is a combination of an 8-bit fuse-programmable comparator and a conventional 4-bit comparator.
For the P = Q output to go low, the applied data word P0 through P7 must match the preprogrammed data word
Q0 through Q7, and the applied data word P8 through P11 must match the applied data word Q8 through Q11.
The SN54ALS526, SN54ALS527, and SN54ALS528 are characterized for operation over the full military
temperature range of –55°C to 125°C. The SN74ALS526, SN74ALS527, and SN74ALS528 are characterized
for operation from 0°C to 70°C.
programming procedure
Before any fuses are blown, the inputs will recognize a low logic level. Therefore, only the bits that are to
recognize a high logic level require programming. A fuse is blown by applying 12 volts (V
) to the desired P
IHH
input and also to the G input. This permanently programs the pin to recognize a high. Only one input pin should
be programmed at a time.
†
Step 1.
Step 2.
Step 3.
Step 4.
Take G to V and apply V to all P inputs .
IL
IH
Take desired P input to V
, output will be low if the fuse is intact.
IHH
Pulse G to V
. After G has returned to V , the output will be high indicating that the fuse is blown.
IHH
IL
Take P input back to V . Repeat steps 2 through 4 to program additional inputs.
IH
verification procedure
These devices can be checked to determine which fuses, if any, are blown. Figure 1 shows how verification can
be accomplished during programming.
†
Step 1.
Step 2.
Take G and all P inputs to V . If the output is low, all fuses are intact.
IL
†
Take all P inputs to V The output should be high except when all fuses are blown. If all fuses are
IH.
blown then the output will be low.
Step 3.
Take test input to V
, leaving other inputs at V . If the output goes low, the fuse is intact. If the
IHH IH
output goes high, the fuse is blown.
Step 4. Take test input back to V . Repeat steps 3 and 4 to test additional inputs.
IH
†
For the ’ALS527, P8 through P11 inputs must match the Q8 through Q11 inputs.
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1984–REVISED MAY 1986
†
logic symbols
’ALS526
&
’ALS527
2
2
&
P0
3
*
*
*
P0
P1
P2
*
*
*
3
4
P1
4
P2
5
5
6
7
P3
6
*
*
*
P3
P4
P5
*
*
*
P4
7
P5
8
P6
8
9
*
P6
P7
*
*
9
P7
*
*
11
19
P8
P=Q
19
12
13
14
1
P=Q
P9
P10
P11
*
*
*
G
*
COMP
11
13
15
16
17
18
P8
P9
8
P12
P13
P14
P15
*
*
*
*
15
17
P
P10
P11
11
8
P=Q
12
14
16
18
1
Q8
Q9
G
Q
Q10
Q11
11
’ALS528
&
2
3
4
P0
P1
P2
*
*
*
5
6
7
P3
P4
P5
*
*
*
9
15
P6
*
P=Q
10
11
P7
P8
*
*
12
13
14
P9
P10
P11
*
*
*
1
G
*
†
These symbols are in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for DW, J, and N packages.
These inputs can be programmed to be active high. The asterisk is not a part of the symbol. For a correct symbol for the programmed device,
delete the polarity symbol ( ) at any input whose programming fuse has been blown.
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1984–REVISED MAY 1986
logic diagrams (positive logic)
’ALS526
’ALS527
P0
P0
Programming
Circuit
Blown = 0
Intact = 1
Programming
Circuit
Blown = 0
Intact = 1
P=Q
P=Q
P15
P7
Programming
Circuit
Programming
Circuit
Blown = 0
Intact = 1
Blown = 0
Intact = 1
Programming
Enable
Circuit
Programming
Enable
Circuit
G
G
P8
Q8
P9
Q9
P10
Q10
P11
Q11
’ALS528
P0
Programming
Circuit
Blown = 0
Intact = 1
P=Q
P11
Programming
Circuit
Blown = 0
Intact = 1
Programming
Enable
Circuit
G
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1984–REVISED MAY 1986
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
CC
Input voltage (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Operating free-air temperature range: SN54ALS’ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to 125°C
SN74ALS’ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
NOTE 1: These ratings apply except for programming pins during a programming cycle.
recommended operating conditions
SN54ALS’
SN74ALS’
UNIT
MIN NOM
MAX
5.5
5.5
0.7
–1
MIN NOM
MAX
5.5
5.5
0.8
–2.6
24
V
V
V
Supply voltage
4.5
2
5
4.5
2
5
V
V
CC
IH
High-level input voltage
Low-level input voltage
High-level output current
Low-level output current
Operating free-air temperature
V
IL
I
I
mA
mA
°C
OH
12
OL
T
A
–55
125
0
70
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54ALS’
SN74ALS’
PARAMETER
TEST CONDITIONS
UNIT
†
TYP
†
TYP
MIN
MAX
MIN
MAX
V
V
V
V
V
V
V
V
V
V
V
V
= 4.5 V,
I = –18 mA
–1.5
–1.5
V
IK
CC
CC
CC
CC
CC
CC
CC
CC
CC
CC
I
= 4.5 V to 5.5 V,
= 4.5 V,
I
I
I
I
I
= –0.4 mA
= –1 mA
V
–2
V
CC
–2
OH
OH
OH
OL
OL
CC
2.4
3
V
OH
OL
= 4.5 V,
= –2.6 mA
= 12 mA
2.4
2.9
0.25
0.35
= 4.5 V,
0.25
0.4
0.4
0.5
V
V
= 4.5 V,
= 24 mA
I
I
I
I
= 5.5 V,
V = 5.5 V
I
0.1
20
0.1
mA
µA
I
= 5.5 V,
V
O
= 2.7 V
20
IH
IL
= 5.5 V,
V = 0.4 V
I
–0.2
–130
27
–0.2
–130
27
mA
mA
‡
= 5.5 V,
V
O
= 2.25 V
–30
–30
O
’ALS526
’ALS527
’ALS528
16
15
13
16
15
13
I
V
CC
= 5.5 V,
All inputs at 4.5 V
24
24
mA
CC
21
21
†
‡
All typical values are at V
= 5 V, T = 25°C.
A
CC
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, I
.
OS
switching characteristics (see Note 2)
V
= 4.5 V to 5.5 V,
CC
R = 50 pF,
L
UNIT
FROM
TO
R
= 680 Ω,
L
PARAMETER
(INPUT)
§
(OUTPUT)
T
A
= MIN to MAX
SN54ALS’
SN74ALS’
MIN
MAX
MIN
3
MAX
t
t
t
t
3
2
2
2
18
15
18
15
15
12
15
12
PLH
PHL
PLH
PHL
P or Q
G
P = Q
P = Q
ns
ns
2
2
2
§
The conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
NOTE 2: Load circuit and voltage waveforms are shown in Section 1.
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1984–REVISED MAY 1986
programing parameters
PARAMETER
MIN
MAX
5.5
0.8
12.5
7.5
10
UNIT
V
V
V
V
High-level input voltage
Low-level input voltage
Program-pulse input voltage
Supply voltage
2
V
V
V
V
IH
IL
11.5
6.5
IHH
CC
Pin (G low)
G
I
Program-pulse input current
mA
IHH
1.24
31
’ALS526
’ALS527
’ALS528
I
Supply current with V
applied
IHH
29
mA
CCHH
26
t
W
t
r
Pulse duration, program
Rise time, program voltage
10
50
µs
µs
10
Test
Test
Test
Blow Fuse
Verify
Verify
Verify
V
V
IH
P
Inputs
IL
V
IHH
V
V
IH
Pn
IL
t
w
V
IHH
IL
90%
10%
90%
G
V
t
r
V
IH
V
IL
Don’t Care
P=Q
Illustrated above is the following sequence:
NOTES: A. It is desired to program a particular input to recognize a high level input. With G low and all P inputs at V , the output is low if no
†
IL
fuses are blown.
†
B. With G low and all P inputs at V , the output is high unless all fuses are blown.
IH
C. When the desired input is taken to V
, the output goes low if the fuse is intact.
IHH
blowing the desired fuse.
D. G is pulsed to V
IHH
E. After G is low, output will be high indicating that the fuse is blown.
F. The programmed input returns to V , the output is high unless all fuses have been blown.
IH
†
G. All P inputs are taken to V , the output is high if a fuse has been blown.
IL
†
For the ’ALS527, P8 through P11 inputs must match the Q8 through Q11 inputs.
Figure 1. Programming Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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