SN74ALS564BNSR [TI]
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS;型号: | SN74ALS564BNSR |
厂家: | TEXAS INSTRUMENTS |
描述: | OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS 驱动 光电二极管 输出元件 逻辑集成电路 触发器 |
文件: | 总5页 (文件大小:85K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SN54ALS564B, SN74ALS564B
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SDAS164B – APRIL 1982 – REVISED JANUARY 1995
SN54ALS564B . . . J OR W PACKAGE
SN74ALS564B . . . DW OR N PACKAGE
(TOP VIEW)
• 3-State Buffer-Type Inverting Outputs Drive
Bus Lines Directly
• Bus-Structured Pinout
• Buffered Control Inputs
• Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), Standard Plastic (N) and
Ceramic (J) 300-mil DIPs, and Ceramic Flat
(W) Packages
OE
1D
2D
3D
4D
5D
6D
7D
8D
V
CC
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
1Q
2Q
3Q
4Q
5Q
6Q
description
13 7Q
12 8Q
These octal D-type edge-triggered flip-flops
feature inverting 3-state outputs designed
specifically for bus driving. They are particularly
suitable for implementing buffer registers, I/O
ports, bidirectional bus drivers, and working
registers.
11
GND
CLK
SN54ALS564B . . . FK PACKAGE
(TOP VIEW)
The eight flip-flops enter data on the low-to-high
transition of the clock (CLK) input.
3
2
1
20 19
18
2Q
3Q
4Q
5Q
6Q
3D
4D
5D
6D
7D
4
5
6
7
8
The output-enable (OE) input does not affect
internal operations of the flip-flops. Old data can
be retained or new data can be entered while the
outputs are in the high-impedance state.
17
16
15
14
9 10 11 12 13
The SN54ALS564B is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74ALS564B is characterized for
operation from 0°C to 70°C.
FUNCTION TABLE
(each flip-flop)
INPUTS
OUTPUT
Q
OE
L
CLK
D
H
L
↑
↑
L
L
H
L
L
X
X
X
Q
0
H
Z
Copyright 1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS564B, SN74ALS564B
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SDAS164B – APRIL 1982 – REVISED JANUARY 1995
†
logic symbol
logic diagram (positive logic)
1
OE
1
EN
C1
OE
11
CLK
11
CLK
2
1D
3
19
18
17
16
15
14
13
12
1D
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
C1
1D
2D
4
19
1Q
2
1D
3D
5
4D
6
5D
7
6D
8
7D
9
To Seven Other Channels
8D
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
‡
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
CC
Input voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
I
Voltage applied to a disabled 3-state output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V
Operating free-air temperature range, T : SN54ALS564B . . . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to 125°C
A
SN74ALS564B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
‡
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
SN54ALS564B
MIN NOM MAX
SN74ALS564B
MIN NOM MAX
UNIT
V
V
V
Supply voltage
4.5
2
5
5.5
4.5
2
5
5.5
V
V
CC
High-level input voltage
Low-level input voltage
High-level output current
Low-level output current
Clock frequency
IH
0.7
–1
12
22
0.8
–2.6
24
V
IL
I
I
f
t
t
t
mA
mA
MHz
ns
OH
OL
clock
w
0
25
0
14
15
0
30
Pulse duration, CLK high or low
Setup time, data before CLK↑
Hold time, data after CLK↑
Operating free-air temperature
15
ns
su
4
ns
h
T
A
–55
125
0
70
°C
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS564B, SN74ALS564B
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SDAS164B – APRIL 1982 – REVISED JANUARY 1995
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54ALS564B
SN74ALS564B
PARAMETER
TEST CONDITIONS
UNIT
†
†
MIN TYP
MAX
MIN TYP
MAX
V
V
V
= 4.5 V,
I = –18 mA
–1.2
–1.2
V
IK
CC
I
= 4.5 V to 5.5 V,
I
I
I
I
I
= –0.4 mA
= –1 mA
= –2.6 mA
= 12 mA
= 24 mA
= 2.7 V
V
–2
V
CC
–2
CC
OH
OH
OH
OL
OL
CC
2.4
V
OH
3.3
V
V
= 4.5 V
= 4.5 V
CC
CC
2.4
3.2
0.25
0.35
0.25
0.4
0.4
0.5
20
V
OL
V
V
I
I
I
I
I
I
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
V
20
–20
0.1
µA
µA
OZH
OZL
I
O
O
V
= 0.4 V
–20
0.1
20
V = 7 V
I
mA
µA
V = 2.7 V
I
20
IH
V = 0.4 V
I
–0.2
–112
18
–0.2
–112
18
mA
mA
IL
‡
V
O
= 2.25 V
–20
–30
O
Outputs high
Outputs low
10
15
16
10
15
16
I
V
CC
= 5.5 V
24
24
mA
CC
Outputs disabled
30
30
†
‡
All typical values are at V
= 5 V, T = 25°C.
A
CC
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, I
.
OS
switching characteristics (see Figure 1)
V
C
= 4.5 V to 5.5 V,
= 50 pF,
CC
L
R1 = 500 Ω,
R2 = 500 Ω,
T
A
FROM
TO
(OUTPUT)
PARAMETER
(INPUT)
UNIT
§
= MIN to MAX
SN54ALS564B SN74ALS564B
MIN
22
4
MAX
MIN
30
3
MAX
f
t
t
t
t
t
t
MHz
ns
max
PLH
PHL
PZH
PZL
PHZ
PLZ
24
20
24
23
14
29
14
14
18
18
10
15
CLK
Any Q
Any Q
Any Q
4
4
4
3
ns
ns
OE
OE
3
4
2
1
3
2
§
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS564B, SN74ALS564B
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
WITH 3-STATE OUTPUTS
SDAS164B – APRIL 1982 – REVISED JANUARY 1995
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
7 V
R
= R1 = R2
V
CC
L
S1
R1
R
L
Test
Point
From Output
Under Test
From Output
Under Test
Test
Point
Test
Point
From Output
Under Test
C
C
L
R
L
R2
L
C
L
(see Note A)
(see Note A)
(see Note A)
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
LOAD CIRCUIT
FOR OPEN-COLLECTOR OUTPUTS
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
3.5 V
3.5 V
Timing
Input
High-Level
1.3 V
1.3 V
1.3 V
Pulse
0.3 V
0.3 V
t
h
t
w
t
su
3.5 V
3.5 V
0.3 V
Data
Input
Low-Level
1.3 V
1.3 V
1.3 V
1.3 V
Pulse
0.3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATIONS
3.5 V
0.3 V
Output
Control
(low-level
enabling)
1.3 V
1.3 V
3.5 V
t
PZL
Input
1.3 V
1.3 V
t
PLZ
0.3 V
PHL
3.5 V
t
Waveform 1
S1 Closed
(see Note B)
t
PLH
1.3 V
V
OH
In-Phase
Output
1.3 V
1.3 V
1.3 V
V
OL
0.3 V
V
OL
t
PHZ
t
PLH
t
PZH
t
PHL
V
OH
V
Waveform 2
S1 Open
(see Note B)
OH
OL
Out-of-Phase
Output
(see Note C)
1.3 V
1.3 V
0.3 V
V
0 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
NOTES: A.
C includes probe and jig capacitance.
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, t = t = 2 ns, duty cycle = 50%.
r
f
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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