SN74BCT8374ADW [TI]

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS; 与八D型边沿触发触发器扫描测试设备
SN74BCT8374ADW
型号: SN74BCT8374ADW
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
与八D型边沿触发触发器扫描测试设备

触发器 测试
文件: 总28页 (文件大小:644K)
下载:  下载PDF数据表文档文件

SN74BCT8374ADWE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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7 TI

SN74BCT8374ADWE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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20 TI

SN74BCT8374ADWG4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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16 TI

SN74BCT8374ADWR

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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24 TI

SN74BCT8374ADWR

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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29 TI

SN74BCT8374ADWRE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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12 TI

SN74BCT8374ADWRE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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12 TI

SN74BCT8374ADWRG4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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11 TI

SN74BCT8374ANT

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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24 TI

SN74BCT8374ANT

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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16 TI

SN74BCT8374ANTE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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19 TI

SN74BCT8374ANTE4

SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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18 TI

SN74BCT8374DWR

暂无描述

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0 TI

SN74BCT8374DWR

Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, DSO-24

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0 ROCHESTER

SN74BCT899

9-BIT LATCHABLE TRANSCEIVER WITH PARITY GENERATOR/CHECKER

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14 TI