SN74F112NE4 [TI]

具有清零和预置端的双路负边沿触发式 J-K 触发器 | N | 16 | 0 to 70;
SN74F112NE4
型号: SN74F112NE4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

具有清零和预置端的双路负边沿触发式 J-K 触发器 | N | 16 | 0 to 70

光电二极管 逻辑集成电路 触发器 锁存器
文件: 总5页 (文件大小:75K)
中文:  中文翻译
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SN74F112  
DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP  
WITH CLEAR AND PRESET  
SDFS048A – D2932, MARCH 1987 – REVISED OCTOBER 1993  
D OR N PACKAGE  
(TOP VIEW)  
Package Options Include Plastic  
Small-Outline Packages and Standard  
Plastic 300-mil DIPs  
V
1CLK  
1K  
1
2
3
4
5
6
7
8
16  
CC  
description  
15 1CLR  
14 2CLR  
1J  
The SN74F112 contains two independent J-K  
negative-edge-triggered flip-flops. A low level at  
the preset (PRE) or clear (CLR) inputs sets or  
resets the outputs regardless of the levels of the  
other inputs. When PRE and CLR are inactive  
(high), dataattheJandKinputsmeetingthesetup  
time requirements is transferred to the outputs on  
the negative-going edge of the clock pulse. Clock  
triggering occurs at a voltage level and is not  
directly related to the rise time of the clock pulse.  
Following the hold-time interval, data at the J and  
K inputs may be changed without affecting the  
levels at the outputs. The SN74F112 can perform  
as a toggle flip-flop by tying J and K high.  
13  
12  
11  
10  
9
2CLK  
2K  
1PRE  
1Q  
2J  
1Q  
2PRE  
2Q  
2Q  
GND  
The SN74F112 is characterized for operation from  
0°C to 70°C.  
FUNCTION TABLE  
INPUTS  
OUTPUTS  
PRE  
L
CLR  
H
CLK  
X
J
X
X
X
L
K
X
X
X
L
Q
H
L
Q
L
H
L
X
H
H
L
L
X
H
H
H
Q
Q
0
0
H
H
H
L
L
H
L
H
H
H
H
X
L
H
H
H
H
X
Toggle  
H
H
H
Q
Q
0
0
The output levels in this configuration are not guaranteed to  
meet the minimum levels for V . Furthermore, this  
OH  
configuration is nonstable; that is, it will not persist when  
either PRE or CLR returns to its inactive (high) level.  
Copyright 1993, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
2–1  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F112  
DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP  
WITH CLEAR AND PRESET  
SDFS048A – D2932, MARCH 1987 – REVISED OCTOBER 1993  
logic symbol  
4
S
1PRE  
1J  
5
6
3
1Q  
1Q  
1J  
1
1CLK  
1K  
C1  
2
1K  
R
15  
1CLR  
10  
11  
13  
12  
14  
2PRE  
2J  
9
7
2Q  
2Q  
2CLK  
2K  
2CLR  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.  
logic diagram, each flip-flop (positive logic)  
Q
Q
PRE  
CLR  
K
J
CLK  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to 7 V  
CC  
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.2 V to 7 V  
I
Input current range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA to 5 mA  
Voltage range applied to any output in the high state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to V  
CC  
Current into any output in the low state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 mA  
Operating free-air temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: The input voltage ratings may be exceeded provided the input current ratings are observed.  
2–2  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F112  
DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP  
WITH CLEAR AND PRESET  
SDFS048A – D2932, MARCH 1987 – REVISED OCTOBER 1993  
recommended operating conditions  
MIN NOM  
MAX  
UNIT  
V
V
V
V
Supply voltage  
4.5  
2
5
5.5  
CC  
IH  
IL  
High-level input voltage  
Low-level input voltage  
Input clamp current  
V
0.8  
18  
– 1  
20  
V
I
I
I
mA  
mA  
mA  
°C  
IK  
High-level output current  
Low-level output current  
Operating free-air temperature  
OH  
OL  
T
A
0
70  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
PARAMETER  
TEST CONDITIONS  
I = 18 mA  
MIN TYP  
MAX  
UNIT  
V
V
V
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 4.5 V,  
= 4.5 V,  
= 4.75 V,  
= 4.5 V,  
= 5.5 V,  
= 5.5 V,  
1.2  
V
IK  
I
I
I
I
= – 1 mA  
= – 1 mA  
= 20 mA  
2.5  
2.7  
3.4  
0.3  
OH  
OH  
OL  
V
OH  
OL  
0.5  
0.1  
V
I
I
V = 7 V  
I
mA  
µA  
I
IH  
V = 2.7 V  
I
20  
J or K  
– 0.6  
– 3  
I
IL  
PRE or CLR  
CLK  
V
= 5.5 V,  
V = 0.5 V  
mA  
CC  
I
– 2.4  
–150  
19  
I
I
V
V
= 5.5 V,  
= 5.5 V,  
V = 0  
O
60  
mA  
mA  
OS  
CC  
CC  
See Note 2  
12  
CC  
All typical values are at V  
= 5 V, T = 25°C.  
A
CC  
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second.  
NOTE 2:  
I
is measured with all outputs open, the Q and Q outputs alternately high and the clock input grounded at the time of measurement.  
CC  
timing requirements over recommended ranges of supply voltage and operating free-air  
temperature (unless otherwise noted)  
V
T
= 5 V,  
= 25°C  
CC  
A
MIN  
MAX  
UNIT  
MIN  
0
MAX  
f
t
Clock frequency  
Pulse duration  
110  
0
5
100  
MHz  
ns  
clock  
CLK high or low  
CLR or PRE low  
High  
4.5  
4.5  
4
w
5
5
t
su  
Setup time, data before CLK↓  
ns  
Low  
3
3.5  
0
High  
0
t
t
Hold time, data after CLK↓  
ns  
ns  
h
Low  
0
0
§
Setup time, inactive state, data before CLK↓  
CLR or PRE high  
4
5
su  
§
Inactive-state state setup time is also referred to as recovery time.  
2–3  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F112  
DUAL NEGATIVE-EDGE-TRIGGERED J-K FLIP-FLOP  
WITH CLEAR AND PRESET  
SDFS048A – D2932, MARCH 1987 – REVISED OCTOBER 1993  
switching characteristics (see Note 3)  
V
C
R
= 5 V,  
= 50 pF,  
= 500 ,  
= 25°C  
V
C
R
= 4.5 V to 5.5 V,  
= 50 pF,  
CC  
L
L
CC  
L
L
FROM  
(INPUT)  
TO  
(OUTPUT)  
= 500,  
PARAMETER  
UNIT  
T
A
T
A
= MIN to MAX  
MIN  
110  
1.2  
1.2  
1.2  
1.2  
TYP  
130  
4.6  
4.6  
4.1  
4.1  
MAX  
MIN  
100  
1.2  
1.2  
1.2  
1.2  
MAX  
f
MHz  
ns  
max  
PLH  
PHL  
PLH  
PHL  
t
t
t
t
6.5  
6.5  
6.5  
6.5  
7.5  
7.5  
7.5  
7.5  
CLK  
Q or Q  
Q or Q  
PRE or CLR  
ns  
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.  
NOTE 3: Load circuits and waveforms are shown in Section 1.  
2–4  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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