SN74F2373_10 [TI]

25-ohm OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS;
SN74F2373_10
型号: SN74F2373_10
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

25-ohm OCTAL TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS

输出元件
文件: 总6页 (文件大小:94K)
中文:  中文翻译
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SN74F2373  
25-OCTAL TRANSPARENT D-TYPE LATCH  
WITH 3-STATE OUTPUTS  
SDFS100 – JANUARY 1996  
DB, DW, OR N PACKAGE  
(TOP VIEW)  
Eight Latches in a Single Package  
3-State True Outputs With 25-Sink  
Resistors  
OE  
1Q  
1D  
2D  
2Q  
3Q  
3D  
4D  
4Q  
V
CC  
1
2
3
4
5
6
7
8
9
20  
19  
18  
17  
16  
15  
14  
Full Parallel Access for Loading  
Buffered Control Inputs  
8Q  
8D  
7D  
7Q  
6Q  
6D  
Package Options Include Plastic  
Small-Outline (DW), Shrink Small-Outline  
(DB) Packages, and Plastic (N) DIPs  
description  
13 5D  
12 5Q  
11 LE  
This 8-bit latch features 3-state outputs designed  
to sink up to 12 mA, and include 25-sink resitors  
to reduce overshoot and undershoot.  
GND 10  
The eight latches of the SN74F2373 are transparent D-type latches. While the latch-enable (LE) input is high,  
the Q outputs follow the data (D) inputs. When the LE is taken low, the Q outputs are latched at the logic levels  
set up at the D inputs.  
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal  
logic state (high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither  
load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability  
to drive bus lines without need for interface or pullup components.  
OE input does not affect the internal operations of the latches. Old data can be retained or new data can be  
entered while the outputs are in the high-impedance state.  
The SN74F373 is available in TI’s shrink small-outline package (DB), which provides the same I/O pin count  
and functionality of standard small-outline packages in less than half the printed-circuit-board area.  
The SN74F373 is characterized for operation from 0°C to 70°C.  
FUNCTION TABLE  
(each latch)  
INPUTS  
OUTPUT  
Q
OE  
L
LE  
H
H
L
D
H
L
H
L
L
L
X
X
Q
0
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1996, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F2373  
25-OCTAL TRANSPARENT D-TYPE LATCH  
WITH 3-STATE OUTPUTS  
SDFS100 – JANUARY 1996  
logic symbol  
logic diagram (positive logic)  
1
1
OE  
LE  
EN  
C1  
OE  
11  
11  
LE  
3
2
5
1D  
2D  
3D  
4D  
5D  
6D  
7D  
8D  
1D  
1Q  
2Q  
3Q  
4Q  
5Q  
6Q  
7Q  
8Q  
4
C1  
2
1Q  
7
6
3
1D  
1D  
8
9
13  
14  
17  
18  
12  
15  
16  
19  
To Seven Other Channels  
This symbol is in accordance with ANSI/IEEE Std 91-1984  
and IEC Publication 617-12.  
schematic diagram  
V
CC  
Q
25  
(nominal)  
Typical Output Configuration  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F2373  
25-OCTAL TRANSPARENT D-TYPE LATCH  
WITH 3-STATE OUTPUTS  
SDFS100 – JANUARY 1996  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to 7 V  
CC  
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.2 V to 7 V  
I
Input current range, I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA to 5 mA  
I
Voltage range applied to any output in the disabled or power-off state, V . . . . . . . . . . . . . . . 0.5 V to 5.5 V  
O
Voltage range applied to any output in the high state, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to V  
Current into any output in the low state, I  
Operating free-air temperature range,T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
Storage temperature range, T  
O
CC  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA  
O
A
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: The input voltage ratings may be exceeded if the input current ratings are observed.  
recommended operating conditions  
MIN NOM  
MAX  
UNIT  
V
V
V
V
Supply voltage  
4.5  
2
5
5.5  
CC  
IH  
IL  
High-level input voltage  
Low-level input voltage  
Input clamp current  
V
0.8  
18  
– 3  
12  
V
I
I
I
mA  
mA  
mA  
°C  
IK  
High-level output current  
Low-level output current  
Operating free-air temperature  
OH  
OL  
T
A
0
70  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
PARAMETER  
TEST CONDITIONS  
I = 18 mA  
MIN TYP  
MAX  
UNIT  
V
IK  
V
V
V
V
= 4.5 V,  
= 4.5 V  
= 4.75 V,  
= 4.5 V  
1.2  
V
CC  
CC  
CC  
CC  
I
I
I
I
I
I
= – 1 mA  
= – 3 mA  
= -1 mA to – 3 mA  
= 1 mA  
2.5  
2.4  
2.7  
3.4  
OH  
OH  
OH  
OL  
OL  
V
OH  
3.3  
V
0.2  
0.5  
0.5  
0.75  
50  
V
OL  
V
= 12 mA  
I
I
I
I
I
I
I
I
I
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
V
O
V
O
= 2.7 V  
µA  
µA  
OZ(H)  
= 0.5 V  
50  
0.1  
OZ(L)  
V = 7 V  
I
mA  
µA  
I
V = 2.7 V  
I
20  
IH  
IL  
V = 0.5 V  
I
– 0.6  
150  
55  
mA  
mA  
mA  
mA  
§
V
O
= 0  
60  
OS  
See Note 2, Condition A  
See Note 2, Condition B  
See Note 2, Condition C  
38  
46  
43  
CC(H)  
CC(L)  
CC(Z)  
66  
V
CC  
= 5.5 V,  
62  
mA  
§
All typical values are at V  
= 5 V, T = 25°C.  
A
CC  
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second.  
NOTE 2:  
I
is measured with the outputs open under the following conditions:  
CC  
A. OE at ground (0) and all other inputs at 4.5 V.  
B. LE at 4.5 V and all other inputs grounded.  
C. OE at 4.5 V and all other inputs grounded.  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F2373  
25-OCTAL TRANSPARENT D-TYPE LATCH  
WITH 3-STATE OUTPUTS  
SDFS100 – JANUARY 1996  
timing requirements over recommended ranges of supply voltage and operating free-air  
temperature (unless otherwise noted)  
V
T
= 5 V,  
= 25°C  
CC  
A
MIN  
MAX  
UNIT  
MIN  
6
MAX  
t
w
t
su  
t
h
Pulse duration, LE high  
Setup time, data before LE↓  
Hold time, data after LE↓  
6
2
6
ns  
ns  
ns  
2
5
switching characteristics (see Figure 1)  
V
= 5 V,  
= 50 PF,  
= 500 ,  
= 500 ,  
= 25°C  
V
= 4.5 V TO 5.5 V, C  
L
CC  
CC  
= 50 PF,  
C
R
R
L
1
2
R
R
T
A
= 500,  
FROM  
PARAMETER  
TO  
(OUTPUT)  
1
2
UNIT  
= 500,  
= MIN TO MAX  
(INPUT)  
T
A
MIN  
2.2  
1.2  
4.2  
2.2  
1.2  
1.2  
1.2  
1.2  
TYP  
4.4  
4.1  
7.3  
4.2  
4.1  
6
MAX  
MIN  
2.1  
1.2  
4.2  
2.2  
1.2  
1.2  
1.2  
1.2  
MAX  
t
t
t
t
t
t
t
t
7
5.5  
11.5  
7
9
7
PLH  
PHL  
PLH  
PHL  
PZH  
PZL  
PHZ  
PLZ  
D
ns  
ns  
ns  
ns  
Q
Q
Q
13  
8
LE  
11  
12  
9.5  
7.5  
6
OE  
8.3  
6.5  
6
4.2  
3.5  
OE  
Q
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN74F2373  
25-OCTAL TRANSPARENT D-TYPE LATCH  
WITH 3-STATE OUTPUTS  
SDFS100 – JANUARY 1996  
PARAMETER MEASUREMENT INFORMATION  
7 V (t  
, t  
, O.C.)  
PZL PLZ  
Open  
(all others)  
From Output  
Under Test  
Test  
Point  
S1  
C
L
R1  
(see Note A)  
R1  
From Output  
Under Test  
Test  
Point  
C
L
R2  
LOAD CIRCUIT FOR  
TOTEM-POLE OUTPUTS  
(see Note A)  
R
= R1 = R2  
L
LOAD CIRCUIT FOR  
3-STATE AND OPEN-COLLECTOR OUTPUTS  
High-Level  
Pulse  
(see Note C)  
3 V  
0 V  
1.5 V  
1.5 V  
t
w
3 V  
3 V  
0 V  
Timing Input  
(see Note C)  
1.5 V  
Low-Level  
Pulse  
1.5 V  
1.5 V  
0 V  
3 V  
0 V  
t
h
t
su  
VOLTAGE WAVEFORMS  
PULSE DURATION  
Data Input  
(see Note C)  
1.5 V  
1.5 V  
VOLTAGE WAVEFORMS  
SETUP AND HOLD TIMES  
3 V  
Output  
Control  
1.5 V  
1.5 V  
(low-level enable)  
0 V  
3 V  
Input  
(see Note C)  
t
PZL  
1.5 V  
1.5 V  
t
PLZ  
0 V  
3.5 V  
t
Waveform 1  
(see Notes B and E)  
PHL  
t
PLH  
In-Phase  
Output  
(see Note E)  
V
OL  
1.5 V  
1.5 V  
1.5 V  
t
V
0.3 V  
t
OL  
PHZ  
t
PZH  
PLH  
t
V
PHL  
OH  
0.3 V  
0 V  
V
OH  
Waveform 2  
(see Notes B and E)  
Out-of-Phase  
Output  
(see Note E)  
1.5 V  
1.5 V  
V
OL  
VOLTAGE WAVEFORMS  
PROPAGATION DELAY TIMES (see Note D)  
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS  
NOTES: A.  
C includes probe and jig capacitance.  
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, t = t 2.5 ns, duty cycle = 50%.  
r
f
D. When measuring propagation delay times of 3-state outputs, switch S1 is open.  
E. The outputs are measured one at a time with one transition per measurement.  
Figure 1. Load Circuit and Voltage Waveforms  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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