SN74F27 [TI]
TRIPLE 3-INPUT POSITIVE-NOR GATES; 三路3输入正或非门
| 型号： | SN74F27 |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | TRIPLE 3-INPUT POSITIVE-NOR GATES |
| 文件： | 总5页 (文件大小：70K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
SN54F27, SN74F27
TRIPLE 3-INPUT POSITIVE-NOR GATES
SDFS042A – MARCH 1987 – REVISED OCTOBER 1993
SN54F27 . . . J PACKAGE
SN74F27 . . . D OR N PACKAGE
(TOP VIEW)
• Package Options Include Plastic
Small-Outline Packages, Ceramic Chip
Carriers, and Standard Plastic and Ceramic
300-mil DIPs
1A
1B
2A
2B
2C
V
CC
1
2
3
4
5
6
7
14
13
12
11
10
9
1C
1Y
3C
3B
3A
3Y
description
These devices contain three independent 3-input
NOR gates. They perform the Boolean functions
Y = A • B • C or Y = A + B + C in positive logic.
2Y
GND
8
The SN54F27 is characterized for operation over
the full military temperature range of –55°C to
125°C. The SN74F27 is characterized for
operation from 0°C to 70°C.
SN54F27 . . . FK PACKAGE
(TOP VIEW)
FUNCTION TABLE
(each gate)
3
2
1
20 19
18
INPUTS
OUTPUT
Y
2A
NC
2B
1Y
NC
3C
NC
3B
4
5
6
7
8
A
H
X
X
L
B
X
H
X
L
C
X
X
H
L
17
16
15
14
L
L
NC
2C
L
9 10 11 12 13
H
†
logic symbol
NC – No internal connection
1
1A
≥1
2
12
6
logic diagram, each gate (positive logic)
1B
1Y
2Y
3Y
13
1C
A
B
C
3
Y
2A
4
2B
5
2C
9
3A
10
8
3B
11
3C
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
Copyright 1993, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
2–1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54F27, SN74F27
TRIPLE 3-INPUT POSITIVE-NOR GATES
SDFS042A – MARCH 1987 – REVISED OCTOBER 1993
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
CC
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –1.2 V to 7 V
I
Input current range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –30 mA to 5 mA
Voltage range applied to any output in the high state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to V
CC
Current into any output in the low state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 mA
Operating free-air temperature range: SN54F27 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to 125°C
SN74F27 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input voltage ratings may be exceeded provided the input current ratings are observed.
recommended operating conditions
SN54F27
SN74F27
UNIT
MIN NOM
MAX
MIN NOM
MAX
V
V
V
Supply voltage
4.5
2
5
5.5
4.5
2
5
5.5
V
V
CC
IH
IL
High-level input voltage
Low-level input voltage
Input clamp current
0.8
–18
– 1
0.8
–18
– 1
20
V
I
I
I
mA
mA
mA
°C
IK
High-level output current
Low-level output current
Operating free-air temperature
OH
OL
20
T
A
–55
125
0
70
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54F27
SN74F27
PARAMETER
TEST CONDITIONS
UNIT
V
‡
‡
MIN TYP
MAX
MIN TYP
MAX
V
V
V
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
= 4.5 V,
= 4.5 V,
= 4.75 V,
= 4.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
= 5.5 V,
I = –18 mA
I
–1.2
–1.2
IK
I
I
I
= – 1 mA
= – 1 mA
= 20 mA
2.5
3.4
0.3
2.5
2.7
3.4
0.3
OH
OH
OL
V
OH
OL
0.5
0.1
0.5
0.1
V
I
I
I
I
I
I
V = 7 V
I
mA
µA
I
V = 2.7 V
I
20
20
IH
IL
V = 0.5 V
I
– 0.6
–150
5.5
– 0.6
–150
5.5
mA
mA
mA
mA
§
V
O
= 0
–60
–60
OS
V = 0
I
3.8
8.4
3.8
8.4
CCH
CCL
See Note 2
12
12
‡
§
All typical values are at V
= 5 V, T = 25°C.
A
CC
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second.
is measured with one input at 4.5 V and all others grounded.
NOTE 2:
I
CCL
2–2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54F27, SN74F27
TRIPLE 3-INPUT POSITIVE-NOR GATES
SDFS042A – MARCH 1987 – REVISED OCTOBER 1993
switching characteristics (see Note 3)
V
C
R
= 5 V,
= 50 pF,
= 500 Ω,
= 25°C
V
C
R
= 4.5 V to 5.5 V,
= 50 pF,
CC
L
L
CC
L
L
= 500Ω,
FROM
(INPUT)
TO
(OUTPUT)
†
PARAMETER
UNIT
T
A
T
A
= MIN to MAX
′F27
TYP
3.1
SN54F27
SN74F27
MIN
1.2
1
MAX
5
MIN
1
MAX
MIN
1
MAX
t
t
6
5.5
4.5
PLH
A, B, or C
Y
ns
2.1
4.5
1
5.5
1
PHL
†
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
NOTE 3: Load circuits and waveforms are shown in Section 1.
2–3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
2–4
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
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BE FULLY AT THE CUSTOMER’S RISK.
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safeguards must be provided by the customer to minimize inherent or procedural hazards.
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intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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