SN74HCS237PW [TI]

SN74HCS237 3- to 8-Line Decoder/Demultiplexer with Address Latches and Schmitt-Trigger Inputs;
SN74HCS237PW
型号: SN74HCS237PW
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
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SN74HCS237 3- to 8-Line Decoder/Demultiplexer with Address Latches and Schmitt-Trigger Inputs

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SN74HCS237
SCLS834 – SEPTEMBER 2020  
SN74HCS237 3- to 8-Line Decoder/Demultiplexer with Address Latches and Schmitt-  
Trigger Inputs  
1 Features  
3 Description  
Wide operating voltage range: 2 V to 6 V  
Schmitt-trigger inputs allow for slow or noisy input  
signals  
Low power consumption  
– Typical ICC of 100 nA  
– Typical input leakage current of ±100 nA  
±7.8-mA output drive at 6 V  
Extended ambient temperature range: –40°C to  
+125°C, TA  
The SN74HCS237 is a three to eight decoder with  
latched address inputs, one standard output strobe  
(G0), and one active low output strobe (G1). When the  
latch enable (LE) input is high, the device acts as a  
standard three to eight decoder. When the latch  
enable (LE) input is low, the address latch retains its  
previous state. When the outputs are gated by either  
strobe input, they are all forced into the low state.  
When the outputs are not disabled by one or both of  
the strobe inputs, only the selected output is high  
while all others are low.  
2 Applications  
Memory device selection with shared data bus  
Reduce required number of outputs for chip select  
applications  
Device Information  
PART NUMBER  
SN74HCS237PW  
SN74HCS237D  
PACKAGE(1)  
TSSOP (16)  
SOIC (16)  
BODY SIZE (NOM)  
5.00 mm × 4.40 mm  
9.90 mm × 3.90 mm  
Route data  
(1) For all available packages, see the orderable addendum at  
the end of the data sheet.  
Supports Slow Inputs  
Low Power  
Noise Rejection  
Input Voltage  
Waveforms  
Time  
Input Voltage  
Time  
Standard  
CMOS Input  
Response  
Waveforms  
Time  
Time  
Input Voltage  
Schmitt-trigger  
CMOS Input  
Response  
Waveforms  
Time  
Time  
Input Voltage  
Benefits of Schmitt-trigger inputs  
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
 
 
 
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Table of Contents  
1 Features............................................................................1  
2 Applications.....................................................................1  
3 Description.......................................................................1  
4 Revision History.............................................................. 2  
5 Pin Configuration and Functions...................................3  
6 Specifications.................................................................. 4  
6.1 Absolute Maximum Ratings ....................................... 4  
6.2 ESD Ratings .............................................................. 4  
6.3 Recommended Operating Conditions ........................4  
6.4 Thermal Information ...................................................4  
6.5 Electrical Characteristics ............................................5  
6.6 Timing Characteristics ................................................5  
6.7 Switching Characteristics ...........................................5  
6.8 Operating Characteristics .......................................... 6  
6.9 Typical Characteristics................................................7  
7 Parameter Measurement Information............................8  
8 Detailed Description........................................................9  
8.1 Overview.....................................................................9  
8.2 Functional Block Diagram...........................................9  
8.3 Feature Description.....................................................9  
8.4 Device Functional Modes..........................................11  
9 Application and Implementation..................................12  
9.1 Application Information............................................. 12  
9.2 Typical Application.................................................... 12  
10 Power Supply Recommendations..............................15  
11 Layout...........................................................................15  
11.1 Layout Guidelines................................................... 15  
11.2 Layout Example...................................................... 15  
12 Device and Documentation Support..........................16  
12.1 Documentation Support.......................................... 16  
12.2 Receiving Notification of Documentation Updates..16  
12.3 Support Resources................................................. 16  
12.4 Trademarks.............................................................16  
12.5 Electrostatic Discharge Caution..............................16  
12.6 Glossary..................................................................16  
13 Mechanical, Packaging, and Orderable  
Information.................................................................... 17  
4 Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
DATE  
REVISION  
NOTES  
September 2020  
*
Initial Release  
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5 Pin Configuration and Functions  
A0  
A1  
VCC  
Y0  
1
2
3
4
5
6
16  
15  
14  
A2  
Y1  
13  
12  
11  
10  
9
LE  
G1  
Y2  
Y3  
G0  
Y4  
Y5  
Y6  
Y7  
7
8
GND  
D or PW Package 16-Pin SOIC or TSSOP Top View  
Table 5-1. Pin Functions  
PIN  
I/O  
DESCRIPTION  
SOIC or TSSOP  
NO.  
NAME  
1
A0  
A1  
I
I
Address select 0  
Address select 1  
Address select 2  
Latch enable  
Strobe input 1, active low  
Strobe input 0  
Output 7  
2
3
A2  
I
4
LE  
G1  
G0  
Y7  
I
5
I
6
I
7
O
O
O
O
O
O
O
O
8
GND  
Y6  
Ground  
9
Output 6  
10  
11  
12  
13  
14  
15  
16  
Y5  
Output 5  
Y4  
Output 4  
Y3  
Output 3  
Y2  
Output 2  
Y1  
Output 1  
Y0  
Output 0  
VCC  
Positive supply  
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6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
MAX  
7
UNIT  
V
VCC  
IIK  
Supply voltage  
–0.5  
Input clamp current(2)  
VI < –0.5 V or VI > VCC + 0.5 V  
VI < –0.5 V or VI > VCC + 0.5 V  
VO = 0 to VCC  
±20  
±20  
±35  
±70  
150  
150  
mA  
mA  
mA  
mA  
°C  
IOK  
IO  
Output clamp current(2)  
Continuous output current  
Continuous current through VCC or GND  
Junction temperature(3)  
Storage temperature  
TJ  
Tstg  
–65  
°C  
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under  
Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
(3) Guaranteed by design.  
6.2 ESD Ratings  
VALUE  
UNIT  
Human-body model (HBM), per ANSI/ESDA/  
JEDEC JS-001(1)  
±4000  
V(ESD)  
Electrostatic discharge  
V
Charged-device model (CDM), per JEDEC  
specification JESD22-C101(2)  
±1500  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
2
NOM  
MAX  
6
UNIT  
V
VCC  
VI  
Supply voltage  
Input voltage  
5
0
VCC  
VCC  
125  
V
VO  
TA  
Output voltage  
Ambient temperature  
0
V
–40  
°C  
6.4 Thermal Information  
SN74HCS137  
PW (TSSOP)  
THERMAL METRIC(1)  
D (SOIC)  
16 PINS  
122.2  
80.9  
UNIT  
16 PINS  
141.2  
78.8  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
85.8  
80.6  
ΨJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
27.7  
40.4  
ΨJB  
85.5  
80.3  
RθJC(bot)  
N/A  
N/A  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
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6.5 Electrical Characteristics  
over operating free-air temperature range; typical values measured at TA = 25°C (unless otherwise noted).  
PARAMETER  
TEST CONDITIONS  
VCC  
MIN  
0.7  
1.7  
2.1  
0.3  
0.9  
1.2  
0.2  
0.4  
0.6  
TYP  
MAX UNIT  
2 V  
1.5  
VT+  
Positive switching threshold  
4.5 V  
6 V  
3.15  
4.2  
1.0  
2.2  
3.0  
1.0  
1.4  
1.6  
V
V
V
V
V
2 V  
VT-  
Negative switching threshold  
Hysteresis (VT+ - VT-)(1)  
High-level output voltage  
Low-level output voltage  
4.5 V  
6 V  
2 V  
ΔVT  
VOH  
VOL  
4.5 V  
6 V  
IOH = -20 µA  
VI = VIH or VIL IOH = -6 mA  
IOH = -7.8 mA  
2 V to 6 V  
4.5 V  
6 V  
VCC – 0.1 VCC – 0.002  
4.0  
5.4  
4.3  
5.75  
0.002  
0.18  
0.22  
±100  
0.1  
IOL = 20 µA  
2 V to 6 V  
4.5 V  
6 V  
0.1  
0.30  
0.33  
VI = VIH or VIL IOL = 6 mA  
IOL = 7.8 mA  
II  
Input leakage current  
Supply current  
VI = VCC or 0  
6 V  
±1000 nA  
ICC  
Ci  
VI = VCC or 0, IO = 0  
6 V  
2
5
µA  
pF  
Input capacitance  
2 V to 6 V  
(1) Guaranteed by design.  
6.6 Timing Characteristics  
CL = 50 pF; over operating free-air temperature range (unless otherwise noted). See Parameter Measurement  
Information.  
Operating free-air temperature (TA)  
PARAMETER  
VCC  
25°C  
MIN  
–40°C to 125°C  
UNIT  
ns  
MAX  
MIN  
9
MAX  
2 V  
6
5
5
4
3
3
4
4
4
tw  
Pulse duration  
Setup time  
Hold time  
LE pulse width  
4.5 V  
6 V  
7
7
2 V  
5
tsu  
An to LE setup time 4.5 V  
4
ns  
6 V  
2 V  
4
5
th  
An to LE hold time  
4.5 V  
6 V  
5
ns  
5
6.7 Switching Characteristics  
CL = 50 pF; over operating free-air temperature range (unless otherwise noted). See Parameter Measurement  
Information.  
Operating free-air temperature (TA)  
PARAMETER  
FROM  
TO  
VCC  
25°C  
TYP  
–40°C to 125°C  
MIN TYP MAX  
UNIT  
MIN  
MAX  
35  
2 V  
4.5 V  
17  
7
51  
20  
tpd  
Propagation delay  
An  
Y
ns  
14  
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CL = 50 pF; over operating free-air temperature range (unless otherwise noted). See Parameter Measurement  
Information.  
Operating free-air temperature (TA)  
PARAMETER  
FROM  
TO  
VCC  
25°C  
TYP  
–40°C to 125°C  
MIN TYP MAX  
UNIT  
MIN  
MAX  
12  
30  
11  
9
6 V  
2 V  
6
15  
7
17  
48  
17  
15  
60  
24  
21  
16  
9
G or G  
Y or Y  
Y or Y  
4.5 V  
6 V  
6
2 V  
18  
8
39  
16  
15  
9
LE  
4.5 V  
6 V  
7
2 V  
tt  
Transition-time  
Any output 4.5 V  
6 V  
5
ns  
4
8
6.8 Operating Characteristics  
over operating free-air temperature range; typical values measured at TA = 25°C (unless otherwise noted).  
PARAMETER  
TEST CONDITIONS  
VCC  
MIN  
TYP  
MAX UNIT  
Power dissipation capacitance  
per gate  
Cpd  
No load  
2 V to 6 V  
40  
pF  
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6.9 Typical Characteristics  
TA = 25°C  
46  
44  
42  
40  
38  
36  
34  
32  
30  
28  
26  
70  
65  
60  
55  
50  
45  
40  
35  
30  
VCC = 2 V  
VCC = 3.3 V  
VCC = 4.5 V  
VCC = 6 V  
VCC = 2 V  
VCC = 3.3 V  
VCC = 4.5 V  
VCC = 6 V  
0
2.5  
5
7.5 10 12.5 15 17.5 20 22.5 25  
Output Sink Current (mA)  
0
2.5  
5
7.5 10 12.5 15 17.5 20 22.5 25  
Output Source Current (mA)  
Figure 6-1. Output driver resistance in LOW state. Figure 6-2. Output driver resistance in HIGH state.  
0.2  
0.18  
0.16  
0.14  
0.12  
0.1  
0.65  
0.6  
VCC = 2 V  
VCC = 4.5 V  
VCC = 5 V  
VCC = 6 V  
0.55  
0.5  
VCC = 2.5 V  
VCC = 3.3 V  
0.45  
0.4  
0.35  
0.3  
0.08  
0.06  
0.04  
0.02  
0
0.25  
0.2  
0.15  
0.1  
0.05  
0
0
0.5  
1
1.5  
2
2.5  
3
3.5  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
5.5  
6
VI œ Input Voltage (V)  
VI œ Input Voltage (V)  
Figure 6-3. Supply current across input voltage, 2-,  
2.5-, and 3.3-V supply  
Figure 6-4. Supply current across input voltage,  
4.5-, 5-, and 6-V supply  
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7 Parameter Measurement Information  
Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators  
having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tt < 2.5 ns.  
For clock inputs, fmax is measured when the input duty cycle is 50%.  
The outputs are measured one at a time with one input transition per measurement.  
tw  
Test  
Point  
VCC  
0 V  
Input  
50%  
50%  
From Output  
Under Test  
Figure 7-2. Voltage Waveforms, Pulse Duration  
(1)  
CL  
(1) CL includes probe and test-fixture capacitance.  
Figure 7-1. Load Circuit for Push-Pull Outputs  
VCC  
VCC  
Clock  
Input  
50%  
Input  
Output  
Output  
50%  
50%  
0 V  
0 V  
VOH  
VOL  
VOH  
VOL  
(1)  
(1)  
tPLH  
tPHL  
tsu  
th  
VCC  
Data  
Input  
50%  
50%  
50%  
50%  
0 V  
(1)  
(1)  
tPHL  
tPLH  
Figure 7-3. Voltage Waveforms, Setup and Hold  
Times  
50%  
50%  
(1) The greater between tPLH and tPHL is the same as tpd  
.
Figure 7-4. Voltage Waveforms Propagation Delays  
VCC  
90%  
Input  
90%  
10%  
0 V  
10%  
tr(1)  
tf(1)  
VOH  
90%  
90%  
Output  
10%  
10%  
VOL  
tr(1)  
tf(1)  
(1) The greater between tr and tf is the same as tt.  
Figure 7-5. Voltage Waveforms, Input and Output Transition Times  
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8 Detailed Description  
8.1 Overview  
The SN74HCS237 is a high speed silicon gate CMOS decoder well suited to memory address decoding or data  
routing applications. It contains a single 3:8 decoder. All inputs include Schmitt-triggers allowing for slow input  
transitions and providing additional noise margin.  
The SN74HCS237 has three address select inputs (A2, A1, and A0). When the latch enable (LE) input is high,  
the circuit functions as a normal one-of-eight decoder. When the latch enable (LE) input is low, the address  
latches will maintain their previous states, regardless of any changes at the address select inputs.  
Two strobe inputs (G 1 and G0) are provided to simplify cascading and to facilitate demultiplexing. When any  
input strobe is active, all outputs are forced into the low state.  
The demultiplexing function is accomplished by first using the select inputs to choose the desired output, and  
then using one of the strobe inputs as the data input.  
The outputs for the SN74HCS237 are normally low, and high when selected.  
8.2 Functional Block Diagram  
3-BIT  
3:8 DECODER  
000  
OUTPUT  
ENABLE  
LE  
A0  
A1  
A2  
LATCH  
Y0  
Y1  
Y2  
Y3  
Y4  
Y5  
Y6  
Y7  
D
Q
Q
LE  
001  
010  
011  
100  
101  
110  
111  
D
Q
Q
LE  
D
Q
Q
LE  
G0  
G1  
Figure 8-1. Logic Diagram (Positive Logic) for the SN74HCS237  
8.3 Feature Description  
8.3.1 Balanced CMOS Push-Pull Outputs  
This device includes balanced CMOS push-pull outputs. The term "balanced" indicates that the device can sink  
and source similar currents. The drive capability of this device may create fast edges into light loads so routing  
and load conditions should be considered to prevent ringing. Additionally, the outputs of this device are capable  
of driving larger currents than the device can sustain without being damaged. It is important for the output power  
of the device to be limited to avoid damage due to overcurrent. The electrical and thermal limits defined in the  
Absolute Maximum Ratings must be followed at all times.  
Unused push-pull CMOS outputs should be left disconnected.  
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8.3.2 CMOS Schmitt-Trigger Inputs  
This device includes inputs with the Schmitt-trigger architecture. These inputs are high impedance and are  
typically modeled as a resistor in parallel with the input capacitance given in the Electrical Characteristics table  
from the input to ground. The worst case resistance is calculated with the maximum input voltage, given in the  
Absolute Maximum Ratings table, and the maximum input leakage current, given in the Electrical Characteristics  
table, using Ohm's law (R = V ÷ I).  
The Schmitt-trigger input architecture provides hysteresis as defined by ΔVT in the Electrical Characteristics  
table, which makes this device extremely tolerant to slow or noisy inputs. While the inputs can be driven much  
slower than standard CMOS inputs, it is still recommended to properly terminate unused inputs. Driving the  
inputs with slow transitioning signals will increase dynamic current consumption of the device. For additional  
information regarding Schmitt-trigger inputs, please see Understanding Schmitt Triggers.  
8.3.3 Clamp Diode Structure  
The inputs and outputs to this device have both positive and negative clamping diodes as depicted in Electrical  
Placement of Clamping Diodes for Each Input and Output.  
CAUTION  
Voltages beyond the values specified in the Absolute Maximum Ratings table can cause damage to  
the device. The input and output voltage ratings may be exceeded if the input and output clamp-  
current ratings are observed.  
VCC  
Device  
+IIK  
+IOK  
Input  
Output  
Logic  
GND  
-IIK  
-IOK  
Figure 8-2. Electrical Placement of Clamping Diodes for Each Input and Output  
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8.4 Device Functional Modes  
Function Table lists the functional modes of the SN74HCS237.  
Table 8-1. Function Table  
INPUTS(1)  
LE G0  
OUTPUTS  
G
1
A2  
A1  
A0  
Y0 Y1  
Y2  
Y3  
Y4  
Y5  
Y6  
Y7  
X
X
L
L
L
L
L
L
L
L
H
X
L
H
X
L
L
L
L
L
L
L
L
L
X
X
L
X
X
L
X
X
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
L
L
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
H
H
L
L
H
L
L
H
H
L
L
H
L
H
H
H
H
X
L
H
L
H
H
X
H
X
Depends upon the address previously applied while LE was at a logic low.  
(1) H = High Voltage Level, L = Low Voltage Level, X = Don't Care  
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9 Application and Implementation  
Note  
Information in the following applications sections is not part of the TI component specification, and TI  
does not warrant its accuracy or completeness. TI’s customers are responsible for determining  
suitability of components for their purposes. Customers should validate and test their design  
implementation to confirm system functionality.  
9.1 Application Information  
The SN74HCS237 is used to control multiple devices that operate on a shared data bus. A decoder provides the  
capability to have a binary encoded input activate only one of the device's outputs. This is ideal for solid state  
memory applications where multiple devices have to be read or written to with a limited number of GPIO pins  
used on the system controller. The decoder is used to activate the chip select (CS) input to the selected memory  
device, and the controller can then read or write from that device alone when using a shared bus.  
9.2 Typical Application  
LE  
A0  
A1  
A2  
Y0  
Y1  
Y2  
Y3  
Y4  
Y5  
Y6  
Y7  
Device 1  
Device 2  
Device 3  
Device 4  
Device 5  
Device 6  
Device 7  
Device 8  
3-BIT  
LATCH  
System  
Controller  
G0  
G1  
CONTROL  
LOGIC  
Data Bus  
Figure 9-1. Typical application block diagram  
9.2.1 Design Requirements  
9.2.1.1 Power Considerations  
Ensure the desired supply voltage is within the range specified in the Recommended Operating Conditions. The  
supply voltage sets the device's electrical characteristics as described in the Electrical Characteristics.  
The positive voltage supply must be capable of sourcing current equal to the total current to be sourced by all  
outputs of the SN74HCS237 plus the maximum static supply current, ICC, listed in Electrical Characteristics and  
any transient current required for switching. The logic device can only source as much current as is provided by  
the positive supply source. Be sure not to exceed the maximum total current through VCC listed in the Absolute  
Maximum Ratings.  
The ground must be capable of sinking current equal to the total current to be sunk by all outputs of the  
SN74HCS237 plus the maximum supply current, ICC, listed in Electrical Characteristics, and any transient  
current required for switching. The logic device can only sink as much current as can be sunk into its ground  
connection. Be sure not to exceed the maximum total current through GND listed in the Absolute Maximum  
Ratings.  
The SN74HCS237 can drive a load with a total capacitance less than or equal to 50 pF while still meeting all of  
the datasheet specifications. Larger capacitive loads can be applied, however it is not recommended to exceed  
50 pF.  
The SN74HCS237 can drive a load with total resistance described by RL ≥ VO / IO, with the output voltage and  
current defined in the Electrical Characteristics table with VOH and VOL. When outputting in the high state, the  
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output voltage in the equation is defined as the difference between the measured output voltage and the supply  
voltage at the VCC pin.  
Total power consumption can be calculated using the information provided in CMOS Power Consumption and  
Cpd Calculation.  
Thermal increase can be calculated using the information provided in Thermal Characteristics of Standard Linear  
and Logic (SLL) Packages and Devices.  
CAUTION  
The maximum junction temperature, TJ(max) listed in the Absolute Maximum Ratings, is an additional  
limitation to prevent damage to the device. Do not violate any values listed in the Absolute Maximum  
Ratings. These limits are provided to prevent damage to the device.  
9.2.1.2 Input Considerations  
Input signals must cross Vt-(min) to be considered a logic LOW, and Vt+(max) to be considered a logic HIGH. Do  
not exceed the maximum input voltage range found in the Absolute Maximum Ratings.  
Unused inputs must be terminated to either VCC or ground. These can be directly terminated if the input is  
completely unused, or they can be connected with a pull-up or pull-down resistor if the input is to be used  
sometimes, but not always. A pull-up resistor is used for a default state of HIGH, and a pull-down resistor is used  
for a default state of LOW. The resistor size is limited by drive current of the controller, leakage current into the  
SN74HCS237, as specified in the Electrical Characteristics, and the desired input transition rate. A 10-kΩ  
resistor value is often used due to these factors.  
The SN74HCS237 has no input signal transition rate requirements because it has Schmitt-trigger inputs.  
Another benefit to having Schmitt-trigger inputs is the ability to reject noise. Noise with a large enough amplitude  
can still cause issues. To know how much noise is too much, please refer to the ΔVT(min) in the Electrical  
Characteristics. This hysteresis value will provide the peak-to-peak limit.  
Unlike what happens with standard CMOS inputs, Schmitt-trigger inputs can be held at any valid value without  
causing huge increases in power consumption. The typical additional current caused by holding an input at a  
value other than VCC or ground is plotted in the Typical Characteristics.  
Refer to the Feature Description section for additional information regarding the inputs for this device.  
9.2.1.3 Output Considerations  
The positive supply voltage is used to produce the output HIGH voltage. Drawing current from the output will  
decrease the output voltage as specified by the VOH specification in the Electrical Characteristics. The ground  
voltage is used to produce the output LOW voltage. Sinking current into the output will increase the output  
voltage as specified by the VOL specification in the Electrical Characteristics.  
Push-pull outputs that could be in opposite states, even for a very short time period, should never be connected  
directly together. This can cause excessive current and damage to the device.  
Two channels within the same device with the same input signals can be connected in parallel for additional  
output drive strength.  
Unused outputs can be left floating. Do not connect outputs directly to VCC or ground.  
Refer to Feature Description section for additional information regarding the outputs for this device.  
9.2.2 Detailed Design Procedure  
1. Add a decoupling capacitor from VCC to GND. The capacitor needs to be placed physically close to the  
device and electrically close to both the VCC and GND pins. An example layout is shown in the Layout  
section.  
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2. Ensure the capacitive load at the output is ≤ 50 pF. This is not a hard limit, however it will ensure optimal  
performance. This can be accomplished by providing short, appropriately sized traces from the SN74HCS237  
to the receiving device(s).  
3. Ensure the resistive load at the output is larger than (VCC / IO(max)) Ω. This will ensure that the maximum  
output current from the Absolute Maximum Ratings is not violated. Most CMOS inputs have a resistive load  
measured in megaohms; much larger than the minimum calculated above.  
4. Thermal issues are rarely a concern for logic gates, however the power consumption and thermal increase  
can be calculated using the steps provided in the application report, CMOS Power Consumption and Cpd  
Calculation.  
9.2.3 Application Curve  
LE  
G0  
A[2:0]  
Y[7:0]  
b000  
0x00  
b010  
0x04  
b111  
0x80  
b001  
b101  
0x02  
b100  
0x10  
0x00  
Figure 9-2. Application timing diagram  
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10 Power Supply Recommendations  
The power supply can be any voltage between the minimum and maximum supply voltage rating located in the  
Recommended Operating Conditions. Each VCC terminal should have a good bypass capacitor to prevent power  
disturbance. A 0.1-μF capacitor is recommended for this device. It is acceptable to parallel multiple bypass caps  
to reject different frequencies of noise. The 0.1-μF and 1-μF capacitors are commonly used in parallel. The  
bypass capacitor should be installed as close to the power terminal as possible for best results, as shown in  
given example layout image.  
11 Layout  
11.1 Layout Guidelines  
When using multiple-input and multiple-channel logic devices inputs must not ever be left floating. In many  
cases, functions or parts of functions of digital logic devices are unused; for example, when only two inputs of a  
triple-input AND gate are used or only 3 of the 4 buffer gates are used. Such unused input pins must not be left  
unconnected because the undefined voltages at the outside connections result in undefined operational states.  
All unused inputs of digital logic devices must be connected to a logic high or logic low voltage, as defined by the  
input voltage specifications, to prevent them from floating. The logic level that must be applied to any particular  
unused input depends on the function of the device. Generally, the inputs are tied to GND or VCC, whichever  
makes more sense for the logic function or is more convenient.  
11.2 Layout Example  
GND VCC  
Recommend GND flood fill for  
improved signal isolation, noise  
reduction, and thermal dissipation  
Bypass capacitor  
placed close to the  
device  
0.1 F  
16  
Unused  
inputs tied to  
VCC  
A0  
1
VCC  
A1  
A2  
2
3
4
5
6
7
8
15  
14  
13  
12  
11  
10  
9
Y0  
Y1  
Y2  
Y3  
Y4  
Y5  
Y6  
LE  
G1  
G0  
Y7  
Avoid 90°  
corners for  
signal lines  
GND  
Unused  
output left  
floating  
Figure 11-1. Example layout for the SN74HCS237 in the PW package.  
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12 Device and Documentation Support  
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,  
generate code, and develop solutions are listed below.  
12.1 Documentation Support  
12.1.1 Related Documentation  
For related documentation see the following:  
Texas Instruments, HCMOS Design Considerations application report (SCLA007)  
Texas Instruments, CMOS Power Consumption and Cpd Calculation application report (SDYA009)  
Texas Instruments, Designing With Logic application report  
12.2 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on  
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For  
change details, review the revision history included in any revised document.  
12.3 Support Resources  
TI E2Esupport forums are an engineer's go-to source for fast, verified answers and design help — straight  
from the experts. Search existing answers or ask your own question to get the quick design help you need.  
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do  
not necessarily reflect TI's views; see TI's Terms of Use.  
12.4 Trademarks  
TI E2Eis a trademark of Texas Instruments.  
All other trademarks are the property of their respective owners.  
12.5 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
12.6 Glossary  
TI Glossary  
This glossary lists and explains terms, acronyms, and definitions.  
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13 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
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11-Sep-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
SN74HCS237DR  
PREVIEW  
PREVIEW  
SOIC  
D
16  
16  
2500  
2000  
TBD  
Call TI  
Call TI  
-40 to 125  
-40 to 125  
SN74HCS237PWR  
TSSOP  
PW  
Green (RoHS  
& no Sb/Br)  
NIPDAU | SN  
Level-1-260C-UNLIM  
HCS237  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
11-Sep-2020  
OTHER QUALIFIED VERSIONS OF SN74HCS237 :  
Automotive: SN74HCS237-Q1  
NOTE: Qualified Version Definitions:  
Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects  
Addendum-Page 2  
IMPORTANT NOTICE AND DISCLAIMER  
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE  
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”  
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable  
standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you  
permission to use these resources only for development of an application that uses the TI products described in the resource. Other  
reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third  
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TI’s products are provided subject to TI’s Terms of Sale (www.ti.com/legal/termsofsale.html) or other applicable terms available either on  
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Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2020, Texas Instruments Incorporated  

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