SN888C [TI]
总线极性借助 IEC-ESD 保护校正 RS-485 收发器;型号: | SN888C |
厂家: | TEXAS INSTRUMENTS |
描述: | 总线极性借助 IEC-ESD 保护校正 RS-485 收发器 |
文件: | 总23页 (文件大小:700K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
针对静电计 (E-Meter) 的总线极性纠正 RS-485 收发器
查询样片: SN888C
1
特性
应用范围
•
•
•
•
超过 EIA-485 标准的要求
•
静电计
76ms 内的总线极性纠正
数据速率:300bps 至 250kbps
具有两个工作配置:
说明
SN888C 是一款低功耗 RS-485 收发器,此收发器具
有总线极性纠正和瞬态保护功能。 热插拔时,此器件
在总线闲置的头 76ms 内检测并纠正总线极性。 片载
瞬态保护功能保护此器件不受 IEC61000 静电放电
(ESD) 和瞬态放电 (EFT) 瞬态的影响。
–
–
只作为故障安全电阻器
故障安全和端接电阻器
•
•
一条总线上多达 256 个节点
小外形尺寸集成电路 (SOIC)-8 封装以实现向后兼
容性
SN888C 采用 SOIC-8 封装。 此器件额定温度范围介
于 -40°C 和 85°C 之间。
•
总线引脚保护:
–
–
–
±16kV 的人体模型 (HBM) 保护
±12kV IEC61000-4-2 接触放电
+4kV IEC61000-4-4 快速瞬态突发
Cross-wire
Vcc
fault
0
R
RE
DE
D
R
R
R
1kꢀꢀ
A
A
B
RE
DE
D
120ꢀꢀ
B
1kꢀꢀ
D
D
A
B
A
B
Master
SN65HVD82
Slave
SN888C
R
R
D
D
POLCOR
RE DE
POLCOR
RE DE
R
D
R
D
Slave
Slave
SN888C
SN888C
图 1. 支持极性纠正 (POLCOR) 的典型网络应用
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated
English Data Sheet: SLLSEI4
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
SOIC-8
Block Diagram
(TOP VIEW)
R
RE
DE
D
1
2
3
4
8
7
6
5
Vcc
B
R
RE
DE
D
Vcc
B
A
GND
A
GND
DRIVER PIN FUNCTIONS
INPUT
D
ENABLE
OUTPUTS
DESCRIPTION
DE
A
B
NORMAL MODE
Actively drives bus high
Actively drives bus low
Driver disabled
H
H
H
L
L
H
Z
Z
L
L
X
H
L
Z
Z
H
X
OPEN
H
Driver disabled by default
Actively drives bus high
POLARITY-CORRECTING MODE(1)
Actively drives bus low
Actively drives bus high
Driver disabled
OPEN
H
H
L
H
Z
Z
L
H
L
L
X
H
L
Z
Z
H
X
OPEN
H
Driver disabled by default
Actively drives bus low
OPEN
(1) The polarity-correcting mode is entered when VID < VIT– and t > tFS and DE = low. This state is latched when /RE turns from low to high.
RECEIVER PIN FUNCTIONS
DIFFERENTIAL
ENABLE
/RE
OUTPUT
R
INPUT
DESCRIPTION
VID = VA – VB
NORMAL MODE
Receive valid bus high
Indeterminate bus state
Receive valid bus low
Receiver disabled
VIT+ < VID
L
H
?
L
Z
Z
?
VIT– < VID < VIT+
L
VID < VIT–
L
H
X
X
OPEN
L
Receiver disabled
Open, short, idle bus
Indeterminate bus state
POLARITY-CORRECTING MODE(1)
VIT+ < VID
L
L
?
Receive valid bus low
VIT– < VID < VIT+
L
Indeterminate bus state
Receive polarity corrected bus high
Receiver disabled
VID < VIT–
L
H
H
Z
Z
?
X
X
OPEN
L
Receiver disabled
Open, short, idle bus
Indeterminate bus state
(1) The polarity-correcting mode is entered when VID < VIT– and t > tFS and DE = low. This state is latched when /RE turns from low to high.
2
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
ABSOLUTE MAXIMUM RATINGS(1)
VALUE
UNIT
MIN
–0.5
–0.3
–100
–18
MAX
VCC
Supply voltage
7
Input voltage range at any logic pin
5.7
100
18
V
Voltage input range, transient pulse, A and B, through 100 Ω
Voltage range at A or B inputs
Receiver output current
–24
24
mA
Continuous total-power dissipation
See THERMAL INFORMATION table
IEC 61000-4-2 ESD (Contact Discharge), bus terminals and GND
IEC 61000-4-4 EFT (Fast transient or burst) bus terminals and GND
IEC 60749-26 ESD (HBM), bus terminals and GND
Test Method A114 (HBM), all pins
±12
±4
±16
±8
kV
JEDEC Standard 22
Test Method C101 (Charged Device Model), all pins
Test Method A115 (Machine Model), all pins
±1.5
±200
170
150
V
TJ
Junction temperature
Storage temperature
°C
TSTG
–65
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
THERMAL INFORMATION
SN888C
THERMAL METRIC(1)
UNITS
PACKAGE SOIC
(D)
θJA
Junction-to-ambient thermal resistance
116.1
60.8
57.1
13.9
56.5
NA
θJCtop
θJB
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance(2)
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
°C/W
ψJT
ψJB
θJCbot
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
POWER DISSIPATION
PARAMETER
TEST CONDITIONS
RL = 300 Ω,
CL = 50 pF (driver)
VALUE
UNITS
164
Unterminated
RS-422 load
RS-485 load
Power dissipation
Driver and receiver enabled,
VCC = 5.5 V, TJ = 150°C
50% duty cycle square-wave signal at
250-kbps signaling rate:
RL = 100 Ω,
CL = 50 pF (driver)
247
316
PD
mW
RL = 54 Ω,
CL = 50 pF (driver)
Copyright © 2013, Texas Instruments Incorporated
3
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
RECOMMENDED OPERATING CONDITIONS
MIN
4.5
–12
–7
NOM
MAX
UNIT
VCC
VID
VI
Supply voltage
5
5.5
12
Differential input voltage
Input voltage at any bus terminal (separate or common mode)(1)
High-level input voltage (driver, driver-enable, and receiver-enable inputs)
Low-level input voltage (driver, driver-enable, and receiver-enable inputs)
12
V
VIH
VIL
2
VCC
0.8
60
0
Driver
–60
–8
IO
Output current
Receiver
mA
8
CL
Differential load capacitance
Differential load resistance
Signaling rate
50
60
pF
Ω
RL
1/tUI
TJ
0.3
–40
–40
250
150
85
kbps
Junction temperature
(2)
°C
TA
Operating free-air temperature (see THERMAL INFORMATION for additional
information)
(1) The algebraic convention in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
(2) Operation is specified for internal (junction) temperatures up to 150°C. Self-heating due to internal power dissipation should be
considered for each application. Maximum junction temperature is internally limited by the thermal shut-down (TSD) circuit which
disables the driver outputs when the junction temperature reaches 170°C.
ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
RL = 60 Ω, 375 Ω on each
See Figure 2
See Figure 3
See Figure 3
1.5
2.5
output from –7 to +12 V
RL = 54 Ω (RS-485)
RL = 100 Ω (RS-422)
RL = 54 Ω, CL = 50 pF
Driver differential-output
voltage magnitude
│VOD│
V
1.5
2
2.5
3
Change in magnitude of
driver differential-output
voltage
–0.2
0
0.2
Δ│VOD
│
V
V
Steady-state common-mode
output voltage
1
VCC / 2
0
3
VOC(SS)
Change in differential driver
common-mode output
voltage
–0.2
0.2
Center of two 27-Ω load
resistors
ΔVOC
See Figure 3
mV
Peak-to-peak driver common-
mode output voltage
850
8
VOC(PP)
COD
Differential output
capacitance
pF
Positive-going receiver
differential-input voltage
threshold
35
100
VIT+
mV
Negative-going receiver
differential-input voltage
threshold
–100
40
–35
60
VIT–
mV
mV
Receiver differential-input
voltage threshold hysteresis
(1)
VHYS
(VIT+ – VIT–
)
Receiver high-level output
voltage
IOH = –8 mA
IOL = 8 mA
2.4
VCC – 0.3
0.2
VOH
VOL
V
V
Receiver low-level output
voltage
0.4
2
Driver input, driver enable,
and receiver enable input
current
–2
II
µA
(1) Under any specific conditions, VIT+ is ensured to be at least VHYS higher than VIT–
.
4
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
ELECTRICAL CHARACTERISTICS (continued)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VO = 0 V or VCC, /RE at VCC
MIN
TYP
MAX
UNIT
Receiver high-impedance
output current
–10
10
IOZ
µA
Driver short-circuit output
current
│IOS│ with VA or VB from –7 to +12 V
150
125
│IOS
│
mA
µA
VCC = 4.5 to 5.5 V or
VI = 12 V
75
Bus input current (driver
disabled)
II
VCC = 0 V, DE at 0 V
VI = –7 V
–100
–40
750
Driver and receiver enabled
DE = VCC, /RE =
GND, No load
900
650
750
5
Driver enabled, receiver
disabled
DE = VCC, /RE = VCC
No load
,
ICC
Supply current (quiescent)
Supply current (dynamic)
µA
Driver disabled, receiver
enabled
DE = GND, /RE =
GND, No load
Driver and receiver disabled DE = GND, D = GND
/RE = VCC, No load
0.4
See
SWITCHING CHARACTERISTICS
3.3 ms > bit time > 4 μs (unless otherwise noted)
PARAMETER
DRIVER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tr, tf
Driver differential-output rise and
fall times
400
90
700
1200
RL = 54 Ω, CL = 50
pF
See Figure 4
ns
tPHL, tPLH
tSK(P)
tPHZ, tPLZ
tPHZ, tPLZ
Driver propagation delay
700
25
50
500
3
1000
200
500
1000
9
Driver pulse skew, |tPHL – tPLH
|
Driver disable time
ns
µs
See Figure 5 and
Figure 6
Driver enable time
Receiver enabled
Receiver disabled
RECEIVER
tr, tf
Receiver output rise and fall times
Receiver propagation delay time
18
85
1
30
195
15
tPHL, tPLH
tSK(P)
CL = 15 pF
See Figure 7
ns
Receiver pulse skew, |tPHL – tPLH
|
tPHZ, tPLZ
Receiver disable time
50
20
2
500
130
8
tPZL(1)
tPZH(1)
tPZL(2)
tPZH(2)
,
Driver enabled
Driver disabled
See Figure 8
See Figure 9
ns
µs
Receiver enable time
Bus failsafe time
,
tFS
Driver disabled
See Figure 10
44
58
76
ms
Copyright © 2013, Texas Instruments Incorporated
5
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
PARAMETER MEASUREMENT INFORMATION
DRIVER
Vcc
DE
375
A
B
D
-7V < Vtest < 12 V
0V or 5 V
VOD
60
375
Figure 2. Measurement of Driver Differential-Output Voltage With Common-Mode Load
A
VA
RL/2
RL/2
A
B
B
D
VB
0V or 5 V
VOD
VOC(PP)
ûVOC(SS)
VOC
CL
VOC
Figure 3. Measurement of Driver Differential and Common-Mode Output With RS-485 Load
5V
Vcc
50%
VI
tPLH
0V
DE
A
B
tPHL
D
CL=
50 pF
54
§ꢀ2V
VOD
90%
50%
10%
Input
Generator
50
VI
VOD
§ꢀ-2V
tr
tf
Figure 4. Measurement of Driver Differential-Output Rise and Fall Times and Propagation Delays
A
B
5V
S1
VO
D
50%
VI
0V
RL=
110
DE
50
tPZH
CL=
50 pF
VOH
Input
Generator
90%
VI
50%
VO
§ꢀ0V
tPHZ
Figure 5. Measurement of Driver Enable and Disable Times With Active-High Output and Pull-Down Load
5V
5V
50%
RL= 110
VI
tPZL
VO
A
B
0V
S1
D
VO
tPLZ
§ꢀ5V
DE
50
CL=
50%
Input
Generator
50 pF
10%
VI
VOL
Figure 6. Measurement of Driver Enable and Disable Times With Active-Low Output and Pull-Up Load
6
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
PARAMETER MEASUREMENT INFORMATION (continued)
RECEIVER
5V
50%
VI
tPLH
0V
A
R
VO
tPHL
Input
Generator
50
VI
1.5V
0V
VOH
90%
50%
10%
B
CL= 15 pF
RE
VOD
VOL
tr
tf
Figure 7. Measurement of Receiver Output Rise and Fall Times and Propagation Delays
5V
Vcc
DE
Vcc
VI
tPZH(1)
50%
0V
A
B
1 k
tPHZ
D
VO
D at 5V
S1 to GND
R
S1
0V or 5 V
VOH
§ꢀ0V
VCC
VOL
90%
VO
50%
CL= 15 pF
RE
tPZL(1)
tPLZ
D at 0V
S1 to VCC
Input
Generator
50
VI
VO
50%
10%
Figure 8. Measurement of Receiver Enable and Disable Times With Driver Enabled
5V
Vcc
VI
tPZH(2)
50%
0V
A
B
1 k
0V or 1.5 V
1.5 V or 0 V
R
VO
S1
VOH
§ꢀ0V
VCC
VOL
A at 1.5V
B at 0V
S1 to GND
VO
50%
CL= 15 pF
RE
tPZL(2)
Input
Generator
A at 0V
B at 1.5V
S1 to VCC
50
VI
VO
50%
Figure 9. Measurement of Receiver Enable Times With Driver Disabled
VI
50%
0V
A
B
R
VO
10 k
Input
Generator
tPHL
tFS
50
VI
1.5V
0V
VCC
RE
VO
50%
(DE = Low)
Figure 10. Measurement of Receiver Polarity-Correction Time With Driver Disabled
Copyright © 2013, Texas Instruments Incorporated
7
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
D and RE Inputs
DE Input
R Output
Vcc
Vcc
Vcc
100k
1k
1k
1k
D,RE
DE
R
100k
9V
9V
9V
Driver Outputs
Vcc
16V
Receiver Inputs
Vcc
16V
R1
R2
R3
R2
R3
A
B
A
B
R
R1
16V
16V
8
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
DEVICE INFORMATION
Low-Power Standby Mode
When the driver and the receiver are both disabled (DE = low and RE = high) the device enters standby mode. If
the enable inputs are in the disabled state for only a brief time (for example: less than 100 ns), the device does
not enter standby mode, preventing the SN888C device from entering standby mode during driver or receiver
enabling. Only when the enable inputs are held in the disabled state for a duration of 300 ns or more does the
device enter low-power standby mode. In this mode most internal circuitry is powered down, and the steady-state
supply current is typically less than 400 nA. When either the driver or the receiver is re-enabled, the internal
circuitry becomes active. During VCC power-up, when the device is set for both driver and receiver disabled
mode, the device may consume more than 5-µA of ICC disabled current because of capacitance charging
effects. This condition occurs only during VCC power-up.
Bus Polarity Correction
The SN888C device automatically corrects a wrong bus-signal polarity caused by a cross-wire fault. In order to
detect the bus polarity, all three of the following conditions must be met:
•
•
•
A failsafe-biasing network (commonly at the master node) must define the signal polarity of the bus.
A slave node must enable the receiver and disable the driver (/RE = DE = low).
The bus must idle for the failsafe time, tFS-max
.
After the failsafe time has passed, the polarity correction is complete and applied to both the receive and transmit
channels. The status of the bus polarity latches within the transceiver and maintains for subsequent data
transmissions.
NOTE
Avoid data string durations of consecutive 0s or 1s exceeding tFS-min, which can accidently
trigger a wrong polarity correction.
Figure 11 shows a simple point-to-point data link between a master node and a slave node. Because the master
node with the failsafe biasing network determines the signal polarity on the bus, an RS-485 transceiver without
polarity correction, such as SN65HVD82, suffices. All other bus nodes, typically performing as slaves, require the
SN888C transceiver with polarity correction.
VS-Master
VS-Master
VS-Slave
VS-Slave
Master
node
Slave
node
VSM
Vdd
Vcc
Vcc
Vdd
R
R
RxD
RxD
RFS
A
B
A
B
MCU
MCU
RE
DE
D
RE
DE
D
RT
RT
(opt.)
DIR
TxD
DIR
TxD
(opt.)
RFS
DGND
GND
GND
DGND
Figure 11. Point-To-Point Data Link With Cross-Wire Fault
Prior to initiating data transmission the master transceiver must idle for a time span that exceeds the maximum
failsafe time, tFS-max, of a slave transceiver. To accomplish this idle time, drive the direction control line, DIR, low.
After a time, t > tFS-max, the master begins transmitting data.
Because of the indicated cross-wire fault between master and slave, the slave node receives bus signals with
reversed polarity. Assuming the slave node has just been connected to the bus, the direction-control pin is
pulled-down during power-up, and then is actively driven low by the slave MCU. The polarity correction begins as
soon as the slave supply is established and ends after approximately 44 to 76 ms.
Copyright © 2013, Texas Instruments Incorporated
9
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
Low due to pull-down
or actively driven
DIRm
Dm
high Z
Master
signals
VAm
0V
VFS
-Vod
+Vid
+Vod
-Vid
VBm
VBs
0V
VFS
VAs
VSs
Slave
signals
Low due to pull-down and then actively driven
DIRs
Rs
tFS
Uncorrected R output:
R is in phase with
wrong V polarity
Corrected R output:
R is reversed to
wrong V polarity
ID
ID
Figure 12. Polarity Correction Timing Prior to a Data Transmission
Initially the slave receiver assumes that the correct bus polarity is applied to the inputs and performs no polarity
reversal. Because of the reversed polarity of the bus-failsafe voltage, the output of the slave receiver, RS, turns
low. After tFS has passed and the receiver has detected the wrong bus polarity, the internal POLCOR logic
reverses the input signal and RS turns high.
At this point, all incoming bus data with reversed polarity are polarity-corrected within the transceiver. Because
polarity correction is also applied to the transmit path, the data sent by the slave MCU are reversed by the
POLCOR logic, then fed into the driver.
The reversed data from the slave MCU are reversed again by the cross-wire fault in the bus, and the correct bus
polarity is reestablished at the master end.
This process repeats each time the device powers up and detects an incorrect bus polarity.
10
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
APPLICATION INFORMATION
Device Configuration
The SN888C device is a half-duplex RS-485 transceiver operating from a single 5-V ±10% supply. The driver
and receiver enable pins that allow for the configuration of different operating modes.
R
R
R
R
Vcc
B
R
Vcc
B
R
Vcc
B
RE
RE
RE
DE
D
DE
D
DE
D
A
A
A
D
GND
D
GND
D
GND
c) Receiver always on
b) Combined enable signals for
use as directional control pin
a) Independent driver and
receiver enable signals
Figure 13. Transceiver Configurations
Using independent enable lines provides the most flexible control as the lines allow for the driver and the
receiver to be turned on and off individually. While this configuration requires two control lines, it allows for
selective listening to the bus traffic, whether the driver is transmitting data or not. Only this configuration allows
the SN888C device to enter low-power standby mode because it allows both the driver and receiver to be
disabled simultaneously.
Combining the enable signals simplifies the interface to the controller by forming a single direction-control signal.
Thus, when the direction-control line is high, the transceiver is configured as a driver, while when low, the device
operates as a receiver.
Tying the receiver enable to ground and controlling only the driver-enable input also uses only one control line. In
this configuration, a node not only receives the data on the bus sent by other nodes, but also receives the data
sent on the bus, enabling the node to verify the correct data has been transmitted.
Bus Design
An RS-485 bus consists of multiple transceivers connected in parallel to a bus cable. To eliminate line
reflections, each cable end is terminated with a termination resistor, RT, whose value matches the characteristic
impedance, Z0, of the cable. This method, known as parallel termination, allows for relatively high data rates over
long cable length.
Common cables used are unshielded twisted pair (UTP), such as low-cost CAT-5 cable with Z0 = 100 Ω, and
RS-485 cable with Z0 = 120 Ω. Typical cable sizes are AWG 22 and AWG 24.
The maximum bus length is typically given as 4000 ft or 1200 m, and represents the length of an AWG 24 cable
whose cable resistance approaches the value of the termination resistance, thus reducing the bus signal by half
or 6 dB. Actual maximum usable cable length depends on the signaling rate, cable characteristics, and
environmental conditions.
Table 1. VID With a Failsafe Network and Bus Termination
VCC
RL Differential
Termination
RFS Pull-Up
RFS Pull-Down
VID
560 Ω
1 KΩ
560 Ω
1 KΩ
230 mV
131 mV
29 mV
13 mV
5 V
54 Ω
4.7 KΩ
10 KΩ
4.7 KΩ
10 KΩ
An external failsafe-resistor network must be used to ensure failsafe operation during an idle bus state. When the
bus is not actively driven, the differential receiver inputs could float allowing the receiver output to assume a
random output. A proper failsafe network forces the receiver inputs to exceed the VIT threshold, thus forcing the
SN888C receiver output into the failsafe (high) state. Table 1 shows the differential input voltage (VID) for various
failsafe networks with a 54-Ω differential bus termination.
Copyright © 2013, Texas Instruments Incorporated
11
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
Cable Length Versus Data Rate
There is an inverse relationship between data rate and cable length, which means the higher the data rate, the
shorter the cable length; and conversely, the lower the data rate, the longer the cable length. While most RS-485
systems use data rates between 10 kbps and 100 kbps, applications such as e-metering often operate at rates of
up to 250 kbps even at distances of 4000 ft and longer. Longer distances are possible by allowing for small
signal jitter of up to 5 or 10%.
CABLE LENGTH (FT)
vs
DATA RATE (BPS)
10000
5,10,20 % Jitter
1000
Conservative
Characteristics
100
10
100
1k
10k
100k
1M
10M
100M
DATA RATE - bps
Stub Length
When connecting a node to the bus, the distance between the transceiver inputs and the cable trunk, known as
the stub, should be as short as possible. The reason for the short distance is because a stub presents a non-
terminated piece of bus line, which can introduce reflections if the distance is too long. As a general guideline,
the electrical length or round-trip delay of a stub should be less than one-tenth of the rise time of the driver, thus
leading to a maximum physical stub length as shown in Equation 1.
LStub ≤ 0.1 × tr × v × c
where
•
•
•
tr is the 10 / 90 rise time of the driver
c is the speed of light (3 × 108 m/s or 9.8 × 108 ft/s)
v is the signal velocity of the cable (v = 78%) or trace (v = 45%) as a factor of c
(1)
Based on Equation 1, with a minimum rise time of 400 ns, Equation 2 shows the maximum cable-stub length of
the SN888C device.
L
Stub ≤ 0.1 × 400 × 10-9 × 3 × 108 × 0.78 = 9,4 m (or 30.6 ft)
(2)
L
S
A
B
R
R
D
D
RE DE
Figure 14. Stub Length
12
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
3-V to 5-V Interface
Interfacing the SN888C device to a 3-V controller is easy. Because the 5-V logic inputs of the transceiver accept
3-V input signals, they can be directly connected to the controller I/O. The 5-V receiver output, R, however, must
be level-shifted by a Schottky diode and a 10-k resistor to connect to the controller input (see Figure 15). When
R is high, the diode is reverse biased and the controller supply potential lies at the controller RxD input. When R
is low, the diode is forward biased and conducts. Only in this case, the diode forward voltage of 0.2 V lies at the
controller RxD input.
3.3V
10k
5V
BAS70
1
2
3
4
8
7
6
5
RxD
RCV
DRV
TxD
R
Vcc
A
0.1µF
RE
DE
D
MCU
XCVR
B
GND
Figure 15. 3-V to 5-V Interface
Noise Immunity
The input sensitivity of a standard RS-485 transceiver is ±200 mV. When the differential input voltage, VID, is
greater than +200 mV, the receiver output turns high, for VID < –200 mV the receiver outputs low.
The SN888C transceiver implements high receiver noise-immunity by providing a typical positive-going input
threshold of 35 mV and a minimum hysteresis of 40 mV. In the case of a noisy input condition, a differential
noise voltage of up to 40 mVPP can be present without causing the receiver output to change states from high to
low.
Transient Protection
The bus terminals of the SN888C transceiver family possess on-chip ESD protection against ±16 kV HBM and
±12 kV IEC61000-4-2 contact discharge. The International Electrotechnical Commision (IEC) ESD test is far
more severe than the HBM ESD test. The 50% higher charge capacitance, CS, and 78% lower discharge
resistance, RD of the IEC model produce significantly higher discharge currents than the HBM model.
As stated in the IEC 61000-4-2 standard, contact discharge is the preferred transient protection test method.
Although IEC air-gap testing is less repeatable than contact testing, air discharge protection levels are inferred
from the contact discharge test results.
R
R
D
C
40
35
30
25
20
15
10
5
50M
(1M)
330Ω
(1.5k)
10kV IEC
High-Voltage
Pulse
Generator
Device
Under
Test
150pF
C
S
(100pF)
10kV HBM
0
0
50
100
150
200
250
300
Time - ns
Figure 16. HBM and IEC-ESD Models and Currents in Comparison (HBM Values in Parenthesis)
Copyright © 2013, Texas Instruments Incorporated
13
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
The on-chip implementation of IEC ESD protection significantly increases the robustness of equipment. Common
discharge events occur because of human contact with connectors and cables. Designers may choose to
implement protection against longer duration transients, typically referred to as surge transients. Figure 10
suggests two circuit designs providing protection against short and long-duration surge transients, in addition to
ESD and Electrical Fast Transients (EFT) transients. Table 2 lists the bill of materials for the external protection
devices.
EFTs are generally caused by relay-contact bounce, or the interruption of inductive loads. Surge transients often
result from lightning strikes (direct strike or an indirect strike which induces voltages and currents), or the
switching of power systems, including load changes and short circuits switching. These transients are often
encountered in industrial environments, such as in factory automation and power-grid systems.
Figure 17 compares the pulse-power of the EFT and surge transients with the power caused by an IEC ESD
transient. In the diagram on the left of Figure 17, the tiny blue blip in the bottom left corner represents the power
of a 10-kV ESD transient, which is low compared to the significantly higher EFT power spike, and certainly lower
than the 500-V surge transient. This type of transient power is well representative of factory environments in
industrial and process automation. The diagram on the right of Figure 17 compares the enormous power of a 6-
kV surge transient, most likely occurring in e-metering applications of power generating and power grid systems,
with the aforementioned 500-V surge transient.
NOTE
The unit of the pulse-power changes from kW to MW, thus making the power of the 500-V
surge transient almost disappear from the scale.
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
6kV Surge
22
20
18
16
14
12
10
8
0.5kV Surge
4kV EFT
6
4
2
0.5kV Surge
10kV ESD
0
0
5
10 15 20 25 30 35 40
0
5
10 15 20 25 30 35 40
Time - μs
Time - μs
Figure 17. Power Comparison of ESD, EFT, and Surge Transients
In the case of surge transients, hgih-energy content is signified by long pulse duration and slow-decaying pulse
power
The electrical energy of a transient that is dumped into the internal protection cells of the transceiver is converted
into thermal energy. This thermal energy heats the protection cells and literally destroys them, thus destroying
the transceiver. Figure 18 shows the large differences in transient energies for single ESD, EFT, and surge
transients as well as for an EFT pulse train, commonly applied during compliance testing.
14
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
1000
100
10
Surge
1
EFT Pulse Train
0.1
0.01
10-3
10-4
10-5
10-6
EFT
ESD
0.5
1
2
4
6
8 10
15
Peak Pulse Voltage - kV
Figure 18. Comparison of Transient Energies
Table 2. Bill of Materials
Device
XCVR
Function
5-V, 250-kbps RS-485 Transceiver
10-Ω, Pulse-Proof Thick-Film Resistor
Bidirectional 400-W Transient Suppressor
Bidirectional.
Order Number
Manufacturer
TI
SN888C
R1, R2
CRCW0603010RJNEAHP
CDSOT23-SM712
Vishay
TVS
Bourns
Bourns
TBU1, TBU2
TBU-CA-065-200-WH
200mA Transient Blocking Unit 200-V, Metal-
Oxide Varistor
MOV1, MOV2
MOV-10D201K
Bourns
Vcc
10k
Vcc
Vcc
Vcc
10k
0.1μF
0.1μF
TBU1
R1
R1
1
2
3
4
8
1
2
3
4
8
7
6
5
RxD
MCU
R
Vcc
A
RxD
MCU
DIR
TxD
R
Vcc
A
MOV1
TVS
TVS
7
6
5
RE
DE
D
RE
DE
D
XCVR
XCVR
DIR
TxD
B
B
MOV2
GND
GND
R2
R2
TBU2
10k
10k
Figure 19. Transient Protections Against ESD, EFT, and Surge Transients
The left circuit shown in Figure 19 provides surge protection of ≥ 500-V transients, while the right protection
circuits can withstand surge transients of 5 kV.
Copyright © 2013, Texas Instruments Incorporated
15
SN888C
ZHCSC10 –SEPTEMBER 2013
www.ti.com.cn
Design and Layout Considerations for Transient Protection
Because ESD and EFT transients have a wide frequency bandwidth from approximately 3 MHz to 3 GHz, high-
frequency layout techniques must be applied during PCB design.
In order for PCB design to be successful, begin with the design of the protection circuit in mind.
1. Place the protection circuitry close to the bus connector to prevent noise transients from penetrating your
board.
2. Use Vcc and ground planes to provide low-inductance. Note that high-frequency currents follow the path of
least inductance, not the path of least impedance.
3. Design the protection components into the direction of the signal path. Do not force the transients currents to
divert from the signal path to reach the protection device.
4. Apply 100-NF to 220-nF bypass capacitors as close as possible to the VCC-pins of transceiver, UART,
controller ICs on the board.
5. Use at least two vias for VCC and ground connections of bypass capacitors and protection devices to
minimize effective via-inductance.
6. Use 1-k to 10-k pull-up or pull-down resistors for enable lines to limit noise currents in these lines during
transient events.
7. Insert pulse-proof resistors into the A and B bus lines, if the TVS clamping voltage is higher than the
specified maximum voltage of the transceiver bus terminals. These resistors limit the residual clamping
current into the transceiver and prevent it from latching up.
–
While pure TVS protection is sufficient for surge transients up to 1 kV, higher transients require metal-
oxide varistors (MOVs), which reduce the transients to a few-hundred volts of clamping voltage, and
transient blocking units (TBUs) that limit transient current to 200 mA.
16
Copyright © 2013, Texas Instruments Incorporated
SN888C
www.ti.com.cn
ZHCSC10 –SEPTEMBER 2013
Isolated Bus Node Design
Many RS-485 networks use isolated bus nodes to prevent the creation of unintended ground loops and their
disruptive impact on signal integrity. An isolated bus node typically includes a micro controller that connects to
the bus transceiver through a multi-channel, digital isolator (Figure 20).
0.1μF
2
MBR0520L
1:1.33
3.3V
ISO
3
1
4
1
2
Vcc
D2
IN
OUT
TLV70733
EN GND
SN6501
10μF 0.1μF
10μF
3
D1
GND
4,5
10μF
MBR0520L
L1
N
ISO-BARRIER
3.3V
0.1μF
0.1μF
PSU
PE
0.1μF
0.1μF
1
16
4.7k
4.7k
Vcc1
Vcc2
PE
2
7
6
3
4
5
10
11
14
13
12
8
EN1 ISO7241 EN2
DVcc
16
11
12
15
1
2
3
4
Vcc
OUTD
INA
IND
OUTA
OUTB
UCA0RXD
P3.0
R
R1
R2
5
6
7
6
XOUT
XIN
B
RE
MSP430
F2132
SN888C
INB
P3.1
DE
D
A
INC
OUTC
GND2
9,15
UCA0TXD
DVss
4
GND2
5
GND1
2,8
TVS
R
C
HV
HV
Short thick earth wire or chassis
PE
island
Protective Earth Ground,
Equipment Safety Ground
R1,R2, TVS: see A. below
= 1MΩ, 2kV high-voltageresistor, TT electronics, HVC 2010 1M0 G T3
= 4.7nF, 2kV high-voltagecapacitor, NOVACAP, 1812 B 472 K 202 N T
R
HV
C
HV
Floating RS-485 Common
A. See Table 2.
Figure 20. Isolated Bus Node With Transient Protection
Power isolation is accomplished using the push-pull transformer driver SN6501 and a low-cost LDO, TLV70733.
Signal isolation uses the quadruple digital isolator ISO7241. Notice that both enable inputs, EN1 and EN2, are
pulled-up via 4.7-k resistors to limit input currents during transient events.
While the transient protection is similar to the one in Figure 19 (left circuit), an additional high-voltage capacitor
diverts transient energy from the floating RS-485 common further towards protective earth (PE) ground. This
diversion is necessary as noise transients on the bus are usually referred to earth potential.
RVH refers to a high-voltage resistor, and in some applications, even a varistor. This resistance is applied to
prevent charging of the floating ground to dangerous potentials during normal operation.
Occasionally varistors are used instead of resistors in order to rapidly discharge CHV, if expecting that fast
transients might charge CHV to high-potentials.
Note that the PE island represents a copper island on the PCB for the provision of a short, thick earth wire
connecting this island to PE ground at the entrance of the power supply unit (PSU).
In equipment designs using a chassis, the PE connection is usually provided through the chassis itself. Typically
the PE conductor is tied to the chassis at one end, while the high-voltage components, CHV and RHV, connect to
the chassis at the other end.
Copyright © 2013, Texas Instruments Incorporated
17
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
SN888CD
ACTIVE
SOIC
SOIC
D
D
8
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
Level-1-260C-UNLIM
-40 to 85
-40 to 85
RS485N
EESA
SN888CDR
ACTIVE
2500 RoHS & Green
NIPDAU
RS485N
EESA
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
Addendum-Page 2
PACKAGE OUTLINE
D0008A
SOIC - 1.75 mm max height
SCALE 2.800
SMALL OUTLINE INTEGRATED CIRCUIT
C
SEATING PLANE
.228-.244 TYP
[5.80-6.19]
.004 [0.1] C
A
PIN 1 ID AREA
6X .050
[1.27]
8
1
2X
.189-.197
[4.81-5.00]
NOTE 3
.150
[3.81]
4X (0 -15 )
4
5
8X .012-.020
[0.31-0.51]
B
.150-.157
[3.81-3.98]
NOTE 4
.069 MAX
[1.75]
.010 [0.25]
C A B
.005-.010 TYP
[0.13-0.25]
4X (0 -15 )
SEE DETAIL A
.010
[0.25]
.004-.010
[0.11-0.25]
0 - 8
.016-.050
[0.41-1.27]
DETAIL A
TYPICAL
(.041)
[1.04]
4214825/C 02/2019
NOTES:
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.
www.ti.com
EXAMPLE BOARD LAYOUT
D0008A
SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55]
SYMM
SEE
DETAILS
1
8
8X (.024)
[0.6]
SYMM
(R.002 ) TYP
[0.05]
5
4
6X (.050 )
[1.27]
(.213)
[5.4]
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:8X
SOLDER MASK
OPENING
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
METAL
EXPOSED
METAL
EXPOSED
METAL
.0028 MAX
[0.07]
.0028 MIN
[0.07]
ALL AROUND
ALL AROUND
SOLDER MASK
DEFINED
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
4214825/C 02/2019
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
www.ti.com
EXAMPLE STENCIL DESIGN
D0008A
SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55]
SYMM
1
8
8X (.024)
[0.6]
SYMM
(R.002 ) TYP
[0.05]
5
4
6X (.050 )
[1.27]
(.213)
[5.4]
SOLDER PASTE EXAMPLE
BASED ON .005 INCH [0.125 MM] THICK STENCIL
SCALE:8X
4214825/C 02/2019
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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