SN888C [TI]

总线极性借助 IEC-ESD 保护校正 RS-485 收发器;
SN888C
型号: SN888C
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

总线极性借助 IEC-ESD 保护校正 RS-485 收发器

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中文:  中文翻译
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SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
针对静电计 (E-Meter) 的总线极性纠正 RS-485 收发器  
查询样片: SN888C  
1
特性  
应用范围  
超过 EIA-485 标准的要求  
静电计  
76ms 内的总线极性纠正  
数据速率:300bps 250kbps  
具有两个工作配置:  
说明  
SN888C 是一款低功耗 RS-485 收发器,此收发器具  
有总线极性纠正和瞬态保护功能。 热插拔时,此器件  
在总线闲置的头 76ms 内检测并纠正总线极性。 片载  
瞬态保护功能保护此器件不受 IEC61000 静电放电  
(ESD) 和瞬态放电 (EFT) 瞬态的影响。  
只作为故障安全电阻器  
故障安全和端接电阻器  
一条总线上多达 256 个节点  
小外形尺寸集成电路 (SOIC)-8 封装以实现向后兼  
容性  
SN888C 采用 SOIC-8 封装。 此器件额定温度范围介  
-40°C 85°C 之间。  
总线引脚保护:  
±16kV 的人体模型 (HBM) 保护  
±12kV IEC61000-4-2 接触放电  
+4kV IEC61000-4-4 快速瞬态突发  
Cross-wire  
Vcc  
fault  
0
R
RE  
DE  
D
R
R
R
1k  
A
A
B
RE  
DE  
D
120ꢀ  
B
1kꢀ  
D
D
A
B
A
B
Master  
SN65HVD82  
Slave  
SN888C  
R
R
D
D
POLCOR  
RE DE  
POLCOR  
RE DE  
R
D
R
D
Slave  
Slave  
SN888C  
SN888C  
1. 支持极性纠正 (POLCOR) 的典型网络应用  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2013, Texas Instruments Incorporated  
English Data Sheet: SLLSEI4  
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
SOIC-8  
Block Diagram  
(TOP VIEW)  
R
RE  
DE  
D
1
2
3
4
8
7
6
5
Vcc  
B
R
RE  
DE  
D
Vcc  
B
A
GND  
A
GND  
DRIVER PIN FUNCTIONS  
INPUT  
D
ENABLE  
OUTPUTS  
DESCRIPTION  
DE  
A
B
NORMAL MODE  
Actively drives bus high  
Actively drives bus low  
Driver disabled  
H
H
H
L
L
H
Z
Z
L
L
X
H
L
Z
Z
H
X
OPEN  
H
Driver disabled by default  
Actively drives bus high  
POLARITY-CORRECTING MODE(1)  
Actively drives bus low  
Actively drives bus high  
Driver disabled  
OPEN  
H
H
L
H
Z
Z
L
H
L
L
X
H
L
Z
Z
H
X
OPEN  
H
Driver disabled by default  
Actively drives bus low  
OPEN  
(1) The polarity-correcting mode is entered when VID < VIT– and t > tFS and DE = low. This state is latched when /RE turns from low to high.  
RECEIVER PIN FUNCTIONS  
DIFFERENTIAL  
ENABLE  
/RE  
OUTPUT  
R
INPUT  
DESCRIPTION  
VID = VA – VB  
NORMAL MODE  
Receive valid bus high  
Indeterminate bus state  
Receive valid bus low  
Receiver disabled  
VIT+ < VID  
L
H
?
L
Z
Z
?
VIT– < VID < VIT+  
L
VID < VIT–  
L
H
X
X
OPEN  
L
Receiver disabled  
Open, short, idle bus  
Indeterminate bus state  
POLARITY-CORRECTING MODE(1)  
VIT+ < VID  
L
L
?
Receive valid bus low  
VIT– < VID < VIT+  
L
Indeterminate bus state  
Receive polarity corrected bus high  
Receiver disabled  
VID < VIT–  
L
H
H
Z
Z
?
X
X
OPEN  
L
Receiver disabled  
Open, short, idle bus  
Indeterminate bus state  
(1) The polarity-correcting mode is entered when VID < VIT– and t > tFS and DE = low. This state is latched when /RE turns from low to high.  
2
Copyright © 2013, Texas Instruments Incorporated  
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
ABSOLUTE MAXIMUM RATINGS(1)  
VALUE  
UNIT  
MIN  
–0.5  
–0.3  
–100  
–18  
MAX  
VCC  
Supply voltage  
7
Input voltage range at any logic pin  
5.7  
100  
18  
V
Voltage input range, transient pulse, A and B, through 100 Ω  
Voltage range at A or B inputs  
Receiver output current  
–24  
24  
mA  
Continuous total-power dissipation  
See THERMAL INFORMATION table  
IEC 61000-4-2 ESD (Contact Discharge), bus terminals and GND  
IEC 61000-4-4 EFT (Fast transient or burst) bus terminals and GND  
IEC 60749-26 ESD (HBM), bus terminals and GND  
Test Method A114 (HBM), all pins  
±12  
±4  
±16  
±8  
kV  
JEDEC Standard 22  
Test Method C101 (Charged Device Model), all pins  
Test Method A115 (Machine Model), all pins  
±1.5  
±200  
170  
150  
V
TJ  
Junction temperature  
Storage temperature  
°C  
TSTG  
–65  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
THERMAL INFORMATION  
SN888C  
THERMAL METRIC(1)  
UNITS  
PACKAGE SOIC  
(D)  
θJA  
Junction-to-ambient thermal resistance  
116.1  
60.8  
57.1  
13.9  
56.5  
NA  
θJCtop  
θJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance(2)  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
°C/W  
ψJT  
ψJB  
θJCbot  
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.  
(2) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB  
temperature, as described in JESD51-8.  
POWER DISSIPATION  
PARAMETER  
TEST CONDITIONS  
RL = 300 Ω,  
CL = 50 pF (driver)  
VALUE  
UNITS  
164  
Unterminated  
RS-422 load  
RS-485 load  
Power dissipation  
Driver and receiver enabled,  
VCC = 5.5 V, TJ = 150°C  
50% duty cycle square-wave signal at  
250-kbps signaling rate:  
RL = 100 Ω,  
CL = 50 pF (driver)  
247  
316  
PD  
mW  
RL = 54 Ω,  
CL = 50 pF (driver)  
Copyright © 2013, Texas Instruments Incorporated  
3
 
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
RECOMMENDED OPERATING CONDITIONS  
MIN  
4.5  
–12  
–7  
NOM  
MAX  
UNIT  
VCC  
VID  
VI  
Supply voltage  
5
5.5  
12  
Differential input voltage  
Input voltage at any bus terminal (separate or common mode)(1)  
High-level input voltage (driver, driver-enable, and receiver-enable inputs)  
Low-level input voltage (driver, driver-enable, and receiver-enable inputs)  
12  
V
VIH  
VIL  
2
VCC  
0.8  
60  
0
Driver  
–60  
–8  
IO  
Output current  
Receiver  
mA  
8
CL  
Differential load capacitance  
Differential load resistance  
Signaling rate  
50  
60  
pF  
Ω
RL  
1/tUI  
TJ  
0.3  
–40  
–40  
250  
150  
85  
kbps  
Junction temperature  
(2)  
°C  
TA  
Operating free-air temperature (see THERMAL INFORMATION for additional  
information)  
(1) The algebraic convention in which the least positive (most negative) limit is designated as minimum is used in this data sheet.  
(2) Operation is specified for internal (junction) temperatures up to 150°C. Self-heating due to internal power dissipation should be  
considered for each application. Maximum junction temperature is internally limited by the thermal shut-down (TSD) circuit which  
disables the driver outputs when the junction temperature reaches 170°C.  
ELECTRICAL CHARACTERISTICS  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
RL = 60 Ω, 375 Ω on each  
See Figure 2  
See Figure 3  
See Figure 3  
1.5  
2.5  
output from –7 to +12 V  
RL = 54 Ω (RS-485)  
RL = 100 Ω (RS-422)  
RL = 54 Ω, CL = 50 pF  
Driver differential-output  
voltage magnitude  
VOD│  
V
1.5  
2
2.5  
3
Change in magnitude of  
driver differential-output  
voltage  
–0.2  
0
0.2  
Δ│VOD  
V
V
Steady-state common-mode  
output voltage  
1
VCC / 2  
0
3
VOC(SS)  
Change in differential driver  
common-mode output  
voltage  
–0.2  
0.2  
Center of two 27-Ω load  
resistors  
ΔVOC  
See Figure 3  
mV  
Peak-to-peak driver common-  
mode output voltage  
850  
8
VOC(PP)  
COD  
Differential output  
capacitance  
pF  
Positive-going receiver  
differential-input voltage  
threshold  
35  
100  
VIT+  
mV  
Negative-going receiver  
differential-input voltage  
threshold  
–100  
40  
–35  
60  
VIT–  
mV  
mV  
Receiver differential-input  
voltage threshold hysteresis  
(1)  
VHYS  
(VIT+ – VIT–  
)
Receiver high-level output  
voltage  
IOH = –8 mA  
IOL = 8 mA  
2.4  
VCC – 0.3  
0.2  
VOH  
VOL  
V
V
Receiver low-level output  
voltage  
0.4  
2
Driver input, driver enable,  
and receiver enable input  
current  
–2  
II  
µA  
(1) Under any specific conditions, VIT+ is ensured to be at least VHYS higher than VIT–  
.
4
Copyright © 2013, Texas Instruments Incorporated  
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
ELECTRICAL CHARACTERISTICS (continued)  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
VO = 0 V or VCC, /RE at VCC  
MIN  
TYP  
MAX  
UNIT  
Receiver high-impedance  
output current  
–10  
10  
IOZ  
µA  
Driver short-circuit output  
current  
IOSwith VA or VB from –7 to +12 V  
150  
125  
IOS  
mA  
µA  
VCC = 4.5 to 5.5 V or  
VI = 12 V  
75  
Bus input current (driver  
disabled)  
II  
VCC = 0 V, DE at 0 V  
VI = –7 V  
–100  
–40  
750  
Driver and receiver enabled  
DE = VCC, /RE =  
GND, No load  
900  
650  
750  
5
Driver enabled, receiver  
disabled  
DE = VCC, /RE = VCC  
No load  
,
ICC  
Supply current (quiescent)  
Supply current (dynamic)  
µA  
Driver disabled, receiver  
enabled  
DE = GND, /RE =  
GND, No load  
Driver and receiver disabled DE = GND, D = GND  
/RE = VCC, No load  
0.4  
See  
SWITCHING CHARACTERISTICS  
3.3 ms > bit time > 4 μs (unless otherwise noted)  
PARAMETER  
DRIVER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
tr, tf  
Driver differential-output rise and  
fall times  
400  
90  
700  
1200  
RL = 54 Ω, CL = 50  
pF  
See Figure 4  
ns  
tPHL, tPLH  
tSK(P)  
tPHZ, tPLZ  
tPHZ, tPLZ  
Driver propagation delay  
700  
25  
50  
500  
3
1000  
200  
500  
1000  
9
Driver pulse skew, |tPHL – tPLH  
|
Driver disable time  
ns  
µs  
See Figure 5 and  
Figure 6  
Driver enable time  
Receiver enabled  
Receiver disabled  
RECEIVER  
tr, tf  
Receiver output rise and fall times  
Receiver propagation delay time  
18  
85  
1
30  
195  
15  
tPHL, tPLH  
tSK(P)  
CL = 15 pF  
See Figure 7  
ns  
Receiver pulse skew, |tPHL – tPLH  
|
tPHZ, tPLZ  
Receiver disable time  
50  
20  
2
500  
130  
8
tPZL(1)  
tPZH(1)  
tPZL(2)  
tPZH(2)  
,
Driver enabled  
Driver disabled  
See Figure 8  
See Figure 9  
ns  
µs  
Receiver enable time  
Bus failsafe time  
,
tFS  
Driver disabled  
See Figure 10  
44  
58  
76  
ms  
Copyright © 2013, Texas Instruments Incorporated  
5
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
PARAMETER MEASUREMENT INFORMATION  
DRIVER  
Vcc  
DE  
375 Ÿ  
A
B
D
-7V < Vtest < 12 V  
0V or 5 V  
VOD  
60 Ÿ  
375 Ÿ  
Figure 2. Measurement of Driver Differential-Output Voltage With Common-Mode Load  
A
VA  
RL/2  
RL/2  
A
B
B
D
VB  
0V or 5 V  
VOD  
VOC(PP)  
ûVOC(SS)  
VOC  
CL  
VOC  
Figure 3. Measurement of Driver Differential and Common-Mode Output With RS-485 Load  
5V  
Vcc  
50%  
VI  
tPLH  
0V  
DE  
A
B
tPHL  
D
CL=  
50 pF  
54 Ÿ  
§ꢀ2V  
VOD  
90%  
50%  
10%  
Input  
Generator  
50Ÿ  
VI  
VOD  
§ꢀ-2V  
tr  
tf  
Figure 4. Measurement of Driver Differential-Output Rise and Fall Times and Propagation Delays  
A
B
5V  
S1  
VO  
D
50%  
VI  
0V  
RL=  
110 Ÿ  
DE  
50Ÿ  
tPZH  
CL=  
50 pF  
VOH  
Input  
Generator  
90%  
VI  
50%  
VO  
§ꢀ0V  
tPHZ  
Figure 5. Measurement of Driver Enable and Disable Times With Active-High Output and Pull-Down Load  
5V  
5V  
50%  
RL= 110 Ÿ  
VI  
tPZL  
VO  
A
B
0V  
S1  
D
VO  
tPLZ  
§ꢀ5V  
DE  
50Ÿ  
CL=  
50%  
Input  
Generator  
50 pF  
10%  
VI  
VOL  
Figure 6. Measurement of Driver Enable and Disable Times With Active-Low Output and Pull-Up Load  
6
Copyright © 2013, Texas Instruments Incorporated  
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
PARAMETER MEASUREMENT INFORMATION (continued)  
RECEIVER  
5V  
50%  
VI  
tPLH  
0V  
A
R
VO  
tPHL  
Input  
Generator  
50Ÿ  
VI  
1.5V  
0V  
VOH  
90%  
50%  
10%  
B
CL= 15 pF  
RE  
VOD  
VOL  
tr  
tf  
Figure 7. Measurement of Receiver Output Rise and Fall Times and Propagation Delays  
5V  
Vcc  
DE  
Vcc  
VI  
tPZH(1)  
50%  
0V  
A
B
1 kŸ  
tPHZ  
D
VO  
D at 5V  
S1 to GND  
R
S1  
0V or 5 V  
VOH  
§ꢀ0V  
VCC  
VOL  
90%  
VO  
50%  
CL= 15 pF  
RE  
tPZL(1)  
tPLZ  
D at 0V  
S1 to VCC  
Input  
Generator  
50Ÿ  
VI  
VO  
50%  
10%  
Figure 8. Measurement of Receiver Enable and Disable Times With Driver Enabled  
5V  
Vcc  
VI  
tPZH(2)  
50%  
0V  
A
B
1 kŸ  
0V or 1.5 V  
1.5 V or 0 V  
R
VO  
S1  
VOH  
§ꢀ0V  
VCC  
VOL  
A at 1.5V  
B at 0V  
S1 to GND  
VO  
50%  
CL= 15 pF  
RE  
tPZL(2)  
Input  
Generator  
A at 0V  
B at 1.5V  
S1 to VCC  
50Ÿ  
VI  
VO  
50%  
Figure 9. Measurement of Receiver Enable Times With Driver Disabled  
VI  
50%  
0V  
A
B
R
VO  
10 kŸ  
Input  
Generator  
tPHL  
tFS  
50Ÿ  
VI  
1.5V  
0V  
VCC  
RE  
VO  
50%  
(DE = Low)  
Figure 10. Measurement of Receiver Polarity-Correction Time With Driver Disabled  
Copyright © 2013, Texas Instruments Incorporated  
7
 
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS  
D and RE Inputs  
DE Input  
R Output  
Vcc  
Vcc  
Vcc  
100k  
1k  
1k  
1k  
D,RE  
DE  
R
100k  
9V  
9V  
9V  
Driver Outputs  
Vcc  
16V  
Receiver Inputs  
Vcc  
16V  
R1  
R2  
R3  
R2  
R3  
A
B
A
B
R
R1  
16V  
16V  
8
Copyright © 2013, Texas Instruments Incorporated  
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
DEVICE INFORMATION  
Low-Power Standby Mode  
When the driver and the receiver are both disabled (DE = low and RE = high) the device enters standby mode. If  
the enable inputs are in the disabled state for only a brief time (for example: less than 100 ns), the device does  
not enter standby mode, preventing the SN888C device from entering standby mode during driver or receiver  
enabling. Only when the enable inputs are held in the disabled state for a duration of 300 ns or more does the  
device enter low-power standby mode. In this mode most internal circuitry is powered down, and the steady-state  
supply current is typically less than 400 nA. When either the driver or the receiver is re-enabled, the internal  
circuitry becomes active. During VCC power-up, when the device is set for both driver and receiver disabled  
mode, the device may consume more than 5-µA of ICC disabled current because of capacitance charging  
effects. This condition occurs only during VCC power-up.  
Bus Polarity Correction  
The SN888C device automatically corrects a wrong bus-signal polarity caused by a cross-wire fault. In order to  
detect the bus polarity, all three of the following conditions must be met:  
A failsafe-biasing network (commonly at the master node) must define the signal polarity of the bus.  
A slave node must enable the receiver and disable the driver (/RE = DE = low).  
The bus must idle for the failsafe time, tFS-max  
.
After the failsafe time has passed, the polarity correction is complete and applied to both the receive and transmit  
channels. The status of the bus polarity latches within the transceiver and maintains for subsequent data  
transmissions.  
NOTE  
Avoid data string durations of consecutive 0s or 1s exceeding tFS-min, which can accidently  
trigger a wrong polarity correction.  
Figure 11 shows a simple point-to-point data link between a master node and a slave node. Because the master  
node with the failsafe biasing network determines the signal polarity on the bus, an RS-485 transceiver without  
polarity correction, such as SN65HVD82, suffices. All other bus nodes, typically performing as slaves, require the  
SN888C transceiver with polarity correction.  
VS-Master  
VS-Master  
VS-Slave  
VS-Slave  
Master  
node  
Slave  
node  
VSM  
Vdd  
Vcc  
Vcc  
Vdd  
R
R
RxD  
RxD  
RFS  
A
B
A
B
MCU  
MCU  
RE  
DE  
D
RE  
DE  
D
RT  
RT  
(opt.)  
DIR  
TxD  
DIR  
TxD  
(opt.)  
RFS  
DGND  
GND  
GND  
DGND  
Figure 11. Point-To-Point Data Link With Cross-Wire Fault  
Prior to initiating data transmission the master transceiver must idle for a time span that exceeds the maximum  
failsafe time, tFS-max, of a slave transceiver. To accomplish this idle time, drive the direction control line, DIR, low.  
After a time, t > tFS-max, the master begins transmitting data.  
Because of the indicated cross-wire fault between master and slave, the slave node receives bus signals with  
reversed polarity. Assuming the slave node has just been connected to the bus, the direction-control pin is  
pulled-down during power-up, and then is actively driven low by the slave MCU. The polarity correction begins as  
soon as the slave supply is established and ends after approximately 44 to 76 ms.  
Copyright © 2013, Texas Instruments Incorporated  
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SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
Low due to pull-down  
or actively driven  
DIRm  
Dm  
high Z  
Master  
signals  
VAm  
0V  
VFS  
-Vod  
+Vid  
+Vod  
-Vid  
VBm  
VBs  
0V  
VFS  
VAs  
VSs  
Slave  
signals  
Low due to pull-down and then actively driven  
DIRs  
Rs  
tFS  
Uncorrected R output:  
R is in phase with  
wrong V polarity  
Corrected R output:  
R is reversed to  
wrong V polarity  
ID  
ID  
Figure 12. Polarity Correction Timing Prior to a Data Transmission  
Initially the slave receiver assumes that the correct bus polarity is applied to the inputs and performs no polarity  
reversal. Because of the reversed polarity of the bus-failsafe voltage, the output of the slave receiver, RS, turns  
low. After tFS has passed and the receiver has detected the wrong bus polarity, the internal POLCOR logic  
reverses the input signal and RS turns high.  
At this point, all incoming bus data with reversed polarity are polarity-corrected within the transceiver. Because  
polarity correction is also applied to the transmit path, the data sent by the slave MCU are reversed by the  
POLCOR logic, then fed into the driver.  
The reversed data from the slave MCU are reversed again by the cross-wire fault in the bus, and the correct bus  
polarity is reestablished at the master end.  
This process repeats each time the device powers up and detects an incorrect bus polarity.  
10  
Copyright © 2013, Texas Instruments Incorporated  
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
APPLICATION INFORMATION  
Device Configuration  
The SN888C device is a half-duplex RS-485 transceiver operating from a single 5-V ±10% supply. The driver  
and receiver enable pins that allow for the configuration of different operating modes.  
R
R
R
R
Vcc  
B
R
Vcc  
B
R
Vcc  
B
RE  
RE  
RE  
DE  
D
DE  
D
DE  
D
A
A
A
D
GND  
D
GND  
D
GND  
c) Receiver always on  
b) Combined enable signals for  
use as directional control pin  
a) Independent driver and  
receiver enable signals  
Figure 13. Transceiver Configurations  
Using independent enable lines provides the most flexible control as the lines allow for the driver and the  
receiver to be turned on and off individually. While this configuration requires two control lines, it allows for  
selective listening to the bus traffic, whether the driver is transmitting data or not. Only this configuration allows  
the SN888C device to enter low-power standby mode because it allows both the driver and receiver to be  
disabled simultaneously.  
Combining the enable signals simplifies the interface to the controller by forming a single direction-control signal.  
Thus, when the direction-control line is high, the transceiver is configured as a driver, while when low, the device  
operates as a receiver.  
Tying the receiver enable to ground and controlling only the driver-enable input also uses only one control line. In  
this configuration, a node not only receives the data on the bus sent by other nodes, but also receives the data  
sent on the bus, enabling the node to verify the correct data has been transmitted.  
Bus Design  
An RS-485 bus consists of multiple transceivers connected in parallel to a bus cable. To eliminate line  
reflections, each cable end is terminated with a termination resistor, RT, whose value matches the characteristic  
impedance, Z0, of the cable. This method, known as parallel termination, allows for relatively high data rates over  
long cable length.  
Common cables used are unshielded twisted pair (UTP), such as low-cost CAT-5 cable with Z0 = 100 Ω, and  
RS-485 cable with Z0 = 120 Ω. Typical cable sizes are AWG 22 and AWG 24.  
The maximum bus length is typically given as 4000 ft or 1200 m, and represents the length of an AWG 24 cable  
whose cable resistance approaches the value of the termination resistance, thus reducing the bus signal by half  
or 6 dB. Actual maximum usable cable length depends on the signaling rate, cable characteristics, and  
environmental conditions.  
Table 1. VID With a Failsafe Network and Bus Termination  
VCC  
RL Differential  
Termination  
RFS Pull-Up  
RFS Pull-Down  
VID  
560 Ω  
1 KΩ  
560 Ω  
1 KΩ  
230 mV  
131 mV  
29 mV  
13 mV  
5 V  
54 Ω  
4.7 KΩ  
10 KΩ  
4.7 KΩ  
10 KΩ  
An external failsafe-resistor network must be used to ensure failsafe operation during an idle bus state. When the  
bus is not actively driven, the differential receiver inputs could float allowing the receiver output to assume a  
random output. A proper failsafe network forces the receiver inputs to exceed the VIT threshold, thus forcing the  
SN888C receiver output into the failsafe (high) state. Table 1 shows the differential input voltage (VID) for various  
failsafe networks with a 54-Ω differential bus termination.  
Copyright © 2013, Texas Instruments Incorporated  
11  
 
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
Cable Length Versus Data Rate  
There is an inverse relationship between data rate and cable length, which means the higher the data rate, the  
shorter the cable length; and conversely, the lower the data rate, the longer the cable length. While most RS-485  
systems use data rates between 10 kbps and 100 kbps, applications such as e-metering often operate at rates of  
up to 250 kbps even at distances of 4000 ft and longer. Longer distances are possible by allowing for small  
signal jitter of up to 5 or 10%.  
CABLE LENGTH (FT)  
vs  
DATA RATE (BPS)  
10000  
5,10,20 % Jitter  
1000  
Conservative  
Characteristics  
100  
10  
100  
1k  
10k  
100k  
1M  
10M  
100M  
DATA RATE - bps  
Stub Length  
When connecting a node to the bus, the distance between the transceiver inputs and the cable trunk, known as  
the stub, should be as short as possible. The reason for the short distance is because a stub presents a non-  
terminated piece of bus line, which can introduce reflections if the distance is too long. As a general guideline,  
the electrical length or round-trip delay of a stub should be less than one-tenth of the rise time of the driver, thus  
leading to a maximum physical stub length as shown in Equation 1.  
LStub 0.1 × tr × v × c  
where  
tr is the 10 / 90 rise time of the driver  
c is the speed of light (3 × 108 m/s or 9.8 × 108 ft/s)  
v is the signal velocity of the cable (v = 78%) or trace (v = 45%) as a factor of c  
(1)  
Based on Equation 1, with a minimum rise time of 400 ns, Equation 2 shows the maximum cable-stub length of  
the SN888C device.  
L
Stub 0.1 × 400 × 10-9 × 3 × 108 × 0.78 = 9,4 m (or 30.6 ft)  
(2)  
L
S
A
B
R
R
D
D
RE DE  
Figure 14. Stub Length  
12  
Copyright © 2013, Texas Instruments Incorporated  
 
 
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
3-V to 5-V Interface  
Interfacing the SN888C device to a 3-V controller is easy. Because the 5-V logic inputs of the transceiver accept  
3-V input signals, they can be directly connected to the controller I/O. The 5-V receiver output, R, however, must  
be level-shifted by a Schottky diode and a 10-k resistor to connect to the controller input (see Figure 15). When  
R is high, the diode is reverse biased and the controller supply potential lies at the controller RxD input. When R  
is low, the diode is forward biased and conducts. Only in this case, the diode forward voltage of 0.2 V lies at the  
controller RxD input.  
3.3V  
10k  
5V  
BAS70  
1
2
3
4
8
7
6
5
RxD  
RCV  
DRV  
TxD  
R
Vcc  
A
0.1µF  
RE  
DE  
D
MCU  
XCVR  
B
GND  
Figure 15. 3-V to 5-V Interface  
Noise Immunity  
The input sensitivity of a standard RS-485 transceiver is ±200 mV. When the differential input voltage, VID, is  
greater than +200 mV, the receiver output turns high, for VID < –200 mV the receiver outputs low.  
The SN888C transceiver implements high receiver noise-immunity by providing a typical positive-going input  
threshold of 35 mV and a minimum hysteresis of 40 mV. In the case of a noisy input condition, a differential  
noise voltage of up to 40 mVPP can be present without causing the receiver output to change states from high to  
low.  
Transient Protection  
The bus terminals of the SN888C transceiver family possess on-chip ESD protection against ±16 kV HBM and  
±12 kV IEC61000-4-2 contact discharge. The International Electrotechnical Commision (IEC) ESD test is far  
more severe than the HBM ESD test. The 50% higher charge capacitance, CS, and 78% lower discharge  
resistance, RD of the IEC model produce significantly higher discharge currents than the HBM model.  
As stated in the IEC 61000-4-2 standard, contact discharge is the preferred transient protection test method.  
Although IEC air-gap testing is less repeatable than contact testing, air discharge protection levels are inferred  
from the contact discharge test results.  
R
R
D
C
40  
35  
30  
25  
20  
15  
10  
5
50M  
(1M)  
330Ω  
(1.5k)  
10kV IEC  
High-Voltage  
Pulse  
Generator  
Device  
Under  
Test  
150pF  
C
S
(100pF)  
10kV HBM  
0
0
50  
100  
150  
200  
250  
300  
Time - ns  
Figure 16. HBM and IEC-ESD Models and Currents in Comparison (HBM Values in Parenthesis)  
Copyright © 2013, Texas Instruments Incorporated  
13  
 
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
The on-chip implementation of IEC ESD protection significantly increases the robustness of equipment. Common  
discharge events occur because of human contact with connectors and cables. Designers may choose to  
implement protection against longer duration transients, typically referred to as surge transients. Figure 10  
suggests two circuit designs providing protection against short and long-duration surge transients, in addition to  
ESD and Electrical Fast Transients (EFT) transients. Table 2 lists the bill of materials for the external protection  
devices.  
EFTs are generally caused by relay-contact bounce, or the interruption of inductive loads. Surge transients often  
result from lightning strikes (direct strike or an indirect strike which induces voltages and currents), or the  
switching of power systems, including load changes and short circuits switching. These transients are often  
encountered in industrial environments, such as in factory automation and power-grid systems.  
Figure 17 compares the pulse-power of the EFT and surge transients with the power caused by an IEC ESD  
transient. In the diagram on the left of Figure 17, the tiny blue blip in the bottom left corner represents the power  
of a 10-kV ESD transient, which is low compared to the significantly higher EFT power spike, and certainly lower  
than the 500-V surge transient. This type of transient power is well representative of factory environments in  
industrial and process automation. The diagram on the right of Figure 17 compares the enormous power of a 6-  
kV surge transient, most likely occurring in e-metering applications of power generating and power grid systems,  
with the aforementioned 500-V surge transient.  
NOTE  
The unit of the pulse-power changes from kW to MW, thus making the power of the 500-V  
surge transient almost disappear from the scale.  
3.0  
2.8  
2.6  
2.4  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0
6kV Surge  
22  
20  
18  
16  
14  
12  
10  
8
0.5kV Surge  
4kV EFT  
6
4
2
0.5kV Surge  
10kV ESD  
0
0
5
10 15 20 25 30 35 40  
0
5
10 15 20 25 30 35 40  
Time - μs  
Time - μs  
Figure 17. Power Comparison of ESD, EFT, and Surge Transients  
In the case of surge transients, hgih-energy content is signified by long pulse duration and slow-decaying pulse  
power  
The electrical energy of a transient that is dumped into the internal protection cells of the transceiver is converted  
into thermal energy. This thermal energy heats the protection cells and literally destroys them, thus destroying  
the transceiver. Figure 18 shows the large differences in transient energies for single ESD, EFT, and surge  
transients as well as for an EFT pulse train, commonly applied during compliance testing.  
14  
Copyright © 2013, Texas Instruments Incorporated  
 
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
1000  
100  
10  
Surge  
1
EFT Pulse Train  
0.1  
0.01  
10-3  
10-4  
10-5  
10-6  
EFT  
ESD  
0.5  
1
2
4
6
8 10  
15  
Peak Pulse Voltage - kV  
Figure 18. Comparison of Transient Energies  
Table 2. Bill of Materials  
Device  
XCVR  
Function  
5-V, 250-kbps RS-485 Transceiver  
10-Ω, Pulse-Proof Thick-Film Resistor  
Bidirectional 400-W Transient Suppressor  
Bidirectional.  
Order Number  
Manufacturer  
TI  
SN888C  
R1, R2  
CRCW0603010RJNEAHP  
CDSOT23-SM712  
Vishay  
TVS  
Bourns  
Bourns  
TBU1, TBU2  
TBU-CA-065-200-WH  
200mA Transient Blocking Unit 200-V, Metal-  
Oxide Varistor  
MOV1, MOV2  
MOV-10D201K  
Bourns  
Vcc  
10k  
Vcc  
Vcc  
Vcc  
10k  
0.1μF  
0.1μF  
TBU1  
R1  
R1  
1
2
3
4
8
1
2
3
4
8
7
6
5
RxD  
MCU  
R
Vcc  
A
RxD  
MCU  
DIR  
TxD  
R
Vcc  
A
MOV1  
TVS  
TVS  
7
6
5
RE  
DE  
D
RE  
DE  
D
XCVR  
XCVR  
DIR  
TxD  
B
B
MOV2  
GND  
GND  
R2  
R2  
TBU2  
10k  
10k  
Figure 19. Transient Protections Against ESD, EFT, and Surge Transients  
The left circuit shown in Figure 19 provides surge protection of 500-V transients, while the right protection  
circuits can withstand surge transients of 5 kV.  
Copyright © 2013, Texas Instruments Incorporated  
15  
 
 
SN888C  
ZHCSC10 SEPTEMBER 2013  
www.ti.com.cn  
Design and Layout Considerations for Transient Protection  
Because ESD and EFT transients have a wide frequency bandwidth from approximately 3 MHz to 3 GHz, high-  
frequency layout techniques must be applied during PCB design.  
In order for PCB design to be successful, begin with the design of the protection circuit in mind.  
1. Place the protection circuitry close to the bus connector to prevent noise transients from penetrating your  
board.  
2. Use Vcc and ground planes to provide low-inductance. Note that high-frequency currents follow the path of  
least inductance, not the path of least impedance.  
3. Design the protection components into the direction of the signal path. Do not force the transients currents to  
divert from the signal path to reach the protection device.  
4. Apply 100-NF to 220-nF bypass capacitors as close as possible to the VCC-pins of transceiver, UART,  
controller ICs on the board.  
5. Use at least two vias for VCC and ground connections of bypass capacitors and protection devices to  
minimize effective via-inductance.  
6. Use 1-k to 10-k pull-up or pull-down resistors for enable lines to limit noise currents in these lines during  
transient events.  
7. Insert pulse-proof resistors into the A and B bus lines, if the TVS clamping voltage is higher than the  
specified maximum voltage of the transceiver bus terminals. These resistors limit the residual clamping  
current into the transceiver and prevent it from latching up.  
While pure TVS protection is sufficient for surge transients up to 1 kV, higher transients require metal-  
oxide varistors (MOVs), which reduce the transients to a few-hundred volts of clamping voltage, and  
transient blocking units (TBUs) that limit transient current to 200 mA.  
16  
Copyright © 2013, Texas Instruments Incorporated  
SN888C  
www.ti.com.cn  
ZHCSC10 SEPTEMBER 2013  
Isolated Bus Node Design  
Many RS-485 networks use isolated bus nodes to prevent the creation of unintended ground loops and their  
disruptive impact on signal integrity. An isolated bus node typically includes a micro controller that connects to  
the bus transceiver through a multi-channel, digital isolator (Figure 20).  
0.1μF  
2
MBR0520L  
1:1.33  
3.3V  
ISO  
3
1
4
1
2
Vcc  
D2  
IN  
OUT  
TLV70733  
EN GND  
SN6501  
10μF 0.1μF  
10μF  
3
D1  
GND  
4,5  
10μF  
MBR0520L  
L1  
N
ISO-BARRIER  
3.3V  
0.1μF  
0.1μF  
PSU  
PE  
0.1μF  
0.1μF  
1
16  
4.7k  
4.7k  
Vcc1  
Vcc2  
PE  
2
7
6
3
4
5
10  
11  
14  
13  
12  
8
EN1 ISO7241 EN2  
DVcc  
16  
11  
12  
15  
1
2
3
4
Vcc  
OUTD  
INA  
IND  
OUTA  
OUTB  
UCA0RXD  
P3.0  
R
R1  
R2  
5
6
7
6
XOUT  
XIN  
B
RE  
MSP430  
F2132  
SN888C  
INB  
P3.1  
DE  
D
A
INC  
OUTC  
GND2  
9,15  
UCA0TXD  
DVss  
4
GND2  
5
GND1  
2,8  
TVS  
R
C
HV  
HV  
Short thick earth wire or chassis  
PE  
island  
Protective Earth Ground,  
Equipment Safety Ground  
R1,R2, TVS: see A. below  
= 1MΩ, 2kV high-voltageresistor, TT electronics, HVC 2010 1M0 G T3  
= 4.7nF, 2kV high-voltagecapacitor, NOVACAP, 1812 B 472 K 202 N T  
R
HV  
C
HV  
Floating RS-485 Common  
A. See Table 2.  
Figure 20. Isolated Bus Node With Transient Protection  
Power isolation is accomplished using the push-pull transformer driver SN6501 and a low-cost LDO, TLV70733.  
Signal isolation uses the quadruple digital isolator ISO7241. Notice that both enable inputs, EN1 and EN2, are  
pulled-up via 4.7-k resistors to limit input currents during transient events.  
While the transient protection is similar to the one in Figure 19 (left circuit), an additional high-voltage capacitor  
diverts transient energy from the floating RS-485 common further towards protective earth (PE) ground. This  
diversion is necessary as noise transients on the bus are usually referred to earth potential.  
RVH refers to a high-voltage resistor, and in some applications, even a varistor. This resistance is applied to  
prevent charging of the floating ground to dangerous potentials during normal operation.  
Occasionally varistors are used instead of resistors in order to rapidly discharge CHV, if expecting that fast  
transients might charge CHV to high-potentials.  
Note that the PE island represents a copper island on the PCB for the provision of a short, thick earth wire  
connecting this island to PE ground at the entrance of the power supply unit (PSU).  
In equipment designs using a chassis, the PE connection is usually provided through the chassis itself. Typically  
the PE conductor is tied to the chassis at one end, while the high-voltage components, CHV and RHV, connect to  
the chassis at the other end.  
Copyright © 2013, Texas Instruments Incorporated  
17  
 
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
SN888CD  
ACTIVE  
SOIC  
SOIC  
D
D
8
8
75  
RoHS & Green  
NIPDAU  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 85  
-40 to 85  
RS485N  
EESA  
SN888CDR  
ACTIVE  
2500 RoHS & Green  
NIPDAU  
RS485N  
EESA  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
Addendum-Page 2  
PACKAGE OUTLINE  
D0008A  
SOIC - 1.75 mm max height  
SCALE 2.800  
SMALL OUTLINE INTEGRATED CIRCUIT  
C
SEATING PLANE  
.228-.244 TYP  
[5.80-6.19]  
.004 [0.1] C  
A
PIN 1 ID AREA  
6X .050  
[1.27]  
8
1
2X  
.189-.197  
[4.81-5.00]  
NOTE 3  
.150  
[3.81]  
4X (0 -15 )  
4
5
8X .012-.020  
[0.31-0.51]  
B
.150-.157  
[3.81-3.98]  
NOTE 4  
.069 MAX  
[1.75]  
.010 [0.25]  
C A B  
.005-.010 TYP  
[0.13-0.25]  
4X (0 -15 )  
SEE DETAIL A  
.010  
[0.25]  
.004-.010  
[0.11-0.25]  
0 - 8  
.016-.050  
[0.41-1.27]  
DETAIL A  
TYPICAL  
(.041)  
[1.04]  
4214825/C 02/2019  
NOTES:  
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.  
Dimensioning and tolerancing per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed .006 [0.15] per side.  
4. This dimension does not include interlead flash.  
5. Reference JEDEC registration MS-012, variation AA.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
D0008A  
SOIC - 1.75 mm max height  
SMALL OUTLINE INTEGRATED CIRCUIT  
8X (.061 )  
[1.55]  
SYMM  
SEE  
DETAILS  
1
8
8X (.024)  
[0.6]  
SYMM  
(R.002 ) TYP  
[0.05]  
5
4
6X (.050 )  
[1.27]  
(.213)  
[5.4]  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE:8X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
EXPOSED  
METAL  
EXPOSED  
METAL  
.0028 MAX  
[0.07]  
.0028 MIN  
[0.07]  
ALL AROUND  
ALL AROUND  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4214825/C 02/2019  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
D0008A  
SOIC - 1.75 mm max height  
SMALL OUTLINE INTEGRATED CIRCUIT  
8X (.061 )  
[1.55]  
SYMM  
1
8
8X (.024)  
[0.6]  
SYMM  
(R.002 ) TYP  
[0.05]  
5
4
6X (.050 )  
[1.27]  
(.213)  
[5.4]  
SOLDER PASTE EXAMPLE  
BASED ON .005 INCH [0.125 MM] THICK STENCIL  
SCALE:8X  
4214825/C 02/2019  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
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