SNJ54F86FK [TI]
F/FAST SERIES, QUAD 2-INPUT XOR GATE, CQCC20, CERAMIC, CC-20;型号: | SNJ54F86FK |
厂家: | TEXAS INSTRUMENTS |
描述: | F/FAST SERIES, QUAD 2-INPUT XOR GATE, CQCC20, CERAMIC, CC-20 栅 输入元件 逻辑集成电路 石英晶振 触发器 |
文件: | 总8页 (文件大小:368K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
54F86
54F86 2-Input Exclusive-OR Gate
Literature Number: SNOS219A
December 1994
54F/74F86
2-Input Exclusive-OR Gate
General Description
This device contains four independent gates, each of which
performs the logic exclusive-OR function.
Package
Commercial
74F86PC
Military
Package Description
Number
N14A
J14A
14-Lead (0.300 Wide) Molded Dual-in-Line
×
54F86DM (Note 2)
14-Lead Ceramic Dual-in-Line
74F86SC (Note 1)
74F86SJ (Note 1)
M14A
M14D
W14B
E20A
14-Lead (0.150 Wide) Molded Small Outline, JEDEC
×
14-Lead (0.300 Wide) Molded Small Outline, EIAJ
×
54F86FM (Note 2)
54F86LM (Note 2)
14-Lead Cerpack
20-Lead Ceramic Leadless Chip Carrier, Type C
e
Note 1: Devices also available in 13 reel. Use suffix
SCX and SJX.
×
Note 2: Military grade device with environmental and burn-in processing. Use suffix
e
DMQB, FMQB and LMQB.
Logic Symbol
Connection Diagrams
Pin Assignment for
DIP, SOIC and Flatpak
Pin Assignment
for LCC
IEEE/IEC
TL/F/9470–3
TL/F/9470–2
TL/F/9470–1
Unit Loading/Fan Out
54F/74F
Obsolete
Pin Names
Description
U.L.
Input I /I
IH IL
HIGH/LOW
Output I /I
OH OL
b
20 mA/ 0.6 mA
b
1 mA/20 mA
A , B
n
Inputs
1.0/1.0
50/33.3
n
O
Outputs
n
TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.
C
1995 National Semiconductor Corporation
TL/F/9470
RRD-B30M75/Printed in U. S. A.
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Recommended Operating
Conditions
Free Air Ambient Temperature
Military
Commercial
b
a
55 C to 125 C
§
0 C to 70 C
§
§
b
b
a
65 C to 150 C
Storage Temperature
§
§
§
§
§
a
§
a
55 C to 125 C
Ambient Temperature under Bias
§
Supply Voltage
Military
Commercial
b
b
a
a a
4.5V to 5.5V
a a
4.5V to 5.5V
Junction Temperature under Bias
Plastic
55 C to 175 C
§
§
a
55 C to 150 C
V
Pin Potential to
CC
Ground Pin
b
a
0.5V to 7.0V
b
a
0.5V to 7.0V
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Output
b
a
30 mA to 5.0 mA
e
in HIGH State (with V
Standard Output
0V)
CC
b
0.5V to 5.5V
0.5V to V
CC
b
a
TRI-STATE Output
É
Current Applied to Output
in LOW State (Max)
twice the rated I (mA)
OL
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under
these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
54F/74F
Typ
Symbol
Parameter
Units
V
CC
Conditions
Min
Max
V
V
V
V
Input HIGH Voltage
2.0
V
V
V
Recognized as a HIGH Signal
Recognized as a LOW Signal
IH
Input LOW Voltage
0.8
IL
b
e b
18 mA
Input Clamp Diode Voltage
1.2
Min
Min
I
IN
CD
OH
e b
e b
e b
Output HIGH
Voltage
54F 10% V
2.5
2.5
2.7
I
I
I
1 mA
1 mA
1 mA
CC
OH
OH
OH
74F 10% V
74F 5% V
V
CC
CC
e
e
V
Output LOW
Voltage
54F 10% V
74F 10% V
0.5
I
I
20 mA
20 mA
OL
CC
OL
V
Min
Max
Max
Max
0.0
0.5
CC
OL
I
I
I
Input HIGH
Current
54F
74F
20.0
5.0
IH
e
e
mA
mA
mA
V
V
V
V
2.7V
7.0V
IN
Input HIGH Current
Breakdown Test
54F
74F
100
7.0
BVI
IN
Output HIGH
54F
74F
250
50
CEX
e
V
CC
OUT
Leakage Current
e
All other pins grounded
V
ID
Input Leakage
Test
I
ID
1.9 mA
74F
4.75
e
IOD
I
Output Leakage
Circuit Current
V
150 mV
OD
74F
3.75
mA
0.0
All other pins grounded
b
e
0.5V
I
I
I
I
Input LOW Current
0.6
mA
Max
V
IL
IN
Obsolete
b
b
e
0V
OUT
Output Short-Circuit Current
Power Supply Current
Power Supply Current
60
150
mA
mA
mA
Max
Max
Max
V
V
V
OS
e
12
18
18
28
HIGH
LOW
CCH
CCL
O
e
O
2
AC Electrical Characteristics
74F
54F
74F
e a
T
25 C
§
5.0V
A
e
50 pF
e
T
, V
CC
e
Mil
T
, V
Com
e
50 pF
A
A CC
e a
Symbol
Parameter
V
Units
CC
C
C
L
L
e
C
50 pF
L
Min
Typ
Max
Min
Max
Min
Max
t
t
Propagation Delay
3.0
3.0
4.0
4.2
5.5
5.5
2.5
3.0
7.0
7.0
3.0
3.0
6.5
6.5
PLH
A , B to O
n
ns
ns
PHL
n
n
(Other Input LOW)
t
t
Propagation Delay
3.5
3.0
5.3
4.7
7.0
6.5
3.5
3.0
8.5
8.0
3.5
3.0
8.0
7.5
PLH
A , B to O
n
PHL
n
n
(Other Input HIGH)
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
74F 86
S
C
X
Temperature Range Family
Special Variations
e
e
e
74F
54F
Commercial
Military
QB
Military grade device with
environmental and burn-in
processing
Device Type
e
X
Devices shipped in 13 reel
×
Package Code
Temperature Range
e
e
e
e
e
P
D
F
L
Plastic DIP
Ceramic DIP
Flatpak
Leadless Chip Carrier (LCC)
Small Outline SOIC JEDEC
Small Outline SOIC EIAJ
e
e
a
C
M
Commercial (0 C to 70 C)
§
§
b a
Military ( 55 C to 125 C)
§
§
S
e
SJ
Physical Dimensions inches (millimeters)
Obsolete
20-Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
3
Physical Dimensions inches (millimeters) (Continued)
14-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J14A
14-Lead (0.150 Wide) Molded Small Outline Package, JEDEC (S)
×
Obsolete
NS Package Number M14A
4
Physical Dimensions inches (millimeters) (Continued)
14-Lead (0.300 Wide) Molded Small Outline Package, EIAJ (SJ)
×
NS Package Number M14D
Obsolete
14-Lead (0.300 Wide) Molded Dual-In-Line Package (P)
×
NS Package Number N14A
5
Physical Dimensions inches (millimeters) (Continued)
14-Lead Ceramic Flatpak (F)
NS Package Number W14B
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
Obsolete
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
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Corporation
National Semiconductor
GmbH
National Semiconductor National Semiconductor
Japan Ltd.
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Tel: (55-11) 212-5066
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Fax: (55-11) 212-1181
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Tel: (3) 558-9999
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Fax: (3) 558-9998
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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