TIC12400QDCPRQ1 [TI]
具有 SPI 和集成 ADC 的汽车类 35V 多开关检测接口 (MSDI) | DCP | 38 | -40 to 125;型号: | TIC12400QDCPRQ1 |
厂家: | TEXAS INSTRUMENTS |
描述: | 具有 SPI 和集成 ADC 的汽车类 35V 多开关检测接口 (MSDI) | DCP | 38 | -40 to 125 开关 光电二极管 |
文件: | 总137页 (文件大小:3718K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
TIC12400-Q1
ZHCSGP5C –AUGUST 2017 –REVISED FEBRUARY 2022
适用于汽车系统,具有集成式ADC 和可调湿性电流的
TIC12400-Q1 24 路输入多开关检测接口(MSDI)
1 特性
3 说明
• 符合汽车应用要求
• 具有符合AEC-Q100 标准的下列特性:
TIC12400-Q1 是一款先进的多开关检测接口 (MSDI),
用于检测 12V 汽车系统中的外部开关状态。
TIC12400-Q1 配有集成的 10 位 ADC,用于对多位模
拟开关进行监控,并采用比较器以独立于 MCU 的方式
对数字开关进行监控。可为 ADC 和比较器设定检测阈
值,从而支持各种开关拓扑和系统非理想特性。该器件
监控多达 24 路直接开关输入,并可配置其中 10 路输
入以监控接地或连接到电池的开关。可为每路输入设定
6 种独特的湿性电流设置,从而支持不同的应用场景。
该器件支持所有开关输入的唤醒操作,因此无需持续使
MCU 保持活动状态, 进而可降低系统功耗。
TIC12400-Q1 还提供集成故障检测、ESD 保护和诊断
功能,从而提高系统稳健性。TIC12400-Q1 支持 2 种
工作模式:连续模式和轮询模式。连续模式下将连续提
供湿性电流。轮询模式下将根据可编程计时器来定期接
通湿性电流以对输入状态进行采样,从而显著降低系统
功耗。
– 器件温度等级1:–40°C 至125°C 的工作环境
温度范围
– 器件HBM ESD 分类等级H2
– 器件CDM ESD 分类等级C4B
• 提供功能安全
– 有助于进行功能安全系统设计的文档
• 旨在支持12V 汽车系统,并提供过压和欠压警告
• 监控多达24 路直接开关输入,并可配置其中10 路
输入以监控接地或连接到电池的开关
• 开关输入可承受高达40V 的电压(负载突降条件)
和低至−24V 的电压(反极性条件)
• 6 种可配置的湿性电流设置:
(0mA、1mA、2mA、5mA、10mA 和15mA)
• 适用于多位模拟开关监控的10 位集成ADC
• 适用于数字开关监控并具有4 个可编程阈值的集成
比较器
器件信息
封装(1)
• 轮询模式下的超低工作电流:
封装尺寸(标称值)
器件型号
68μA 典型值(tPOLL = 64ms,tPOLL_ACT
128μs,
=
TIC12400-Q1
TSSOP (38)
9.70mm × 4.40mm
全部24 路输入均有效,比较器模式,所有开关均
打开)
• 使用3.3V/5V 串行外设接口(SPI) 协议直接与MCU
对接
(1) 如需了解所有可用封装,请参阅数据表末尾的可订购产品附
录。
VBAT
Voltage
Regulator
GND
37
38
• 可产生中断来支持所有输入的唤醒操作
• 集成电池和温度传感
VS
VS
VDD 19
VDD
/INT
IN0
IN1
IN2
13
14
25
/INT
/CS
24
15
/CS
• 采用适当的外部组件根据ISO-10605 在输入引脚上
实现±8kV 接触放电ESD 保护
• 38 引脚TSSOP 封装
IN9
33
MCU
SCLK 16
SCLK
MOSI
MISO
GPIO
SI
17
SO 18
IN10
IN11
IN12
34
35
36
TIC12400-Q1
RESET 21
20
CAP_A
CAP_D 23
2 应用
IN23
12
22
9
CAP_PRE
• 车身控制模块和网关
• 汽车照明
AGND
EP
DGND 28
Copyright
©
2016, Texas Instruments Incorporated
• 制热和制冷
• 电动座椅
• 后视镜
简化版原理图
本文档旨在为方便起见,提供有关TI 产品中文版本的信息,以确认产品的概要。有关适用的官方英文版本的最新信息,请访问
www.ti.com,其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前,请务必参考最新版本的英文版本。
English Data Sheet: SCPS260
TIC12400-Q1
ZHCSGP5C –AUGUST 2017 –REVISED FEBRUARY 2022
www.ti.com.cn
Table of Contents
8.6 Register Maps...........................................................48
8.7 Programming Guidelines.........................................115
9 Application Information Disclaimer........................... 119
9.1 Application Information............................................119
9.2 Using TIC12400-Q1 in a 12 V Automotive System.119
9.3 Resistor-coded Switches Detection in
Automotive Body Control Module..............................121
10 Power Supply Recommendations............................125
11 Layout.........................................................................126
11.1 Layout Guidelines................................................. 126
11.2 Layout Example.................................................... 127
12 Device and Documentation Support........................128
12.1 接收文档更新通知................................................. 128
12.2 支持资源................................................................128
12.3 Trademarks...........................................................128
12.4 Electrostatic Discharge Caution............................128
12.5 术语表................................................................... 128
13 Mechanical, Packaging, and Orderable
1 特性................................................................................... 1
2 应用................................................................................... 1
3 说明................................................................................... 1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................3
6 Specifications.................................................................. 5
6.1 Absolute Maximum Ratings........................................ 5
6.2 ESD Ratings............................................................... 5
6.3 Recommended Operating Conditions.........................5
6.4 Thermal Information....................................................6
6.5 Electrical Characteristics.............................................6
6.6 Timing Requirements................................................10
6.7 Typical Characteristics.............................................. 11
7 Parameter Measurement Information..........................13
8 Detailed Description......................................................14
8.1 Overview...................................................................14
8.2 Functional Block Diagram.........................................15
8.3 Feature Description...................................................16
8.4 Device Functional Modes..........................................29
8.5 Programming............................................................ 45
Information.................................................................. 128
4 Revision History
注:以前版本的页码可能与当前版本的页码不同
Changes from Revision B (February 2020) to Revision C (February 2022)
Page
• 添加了特性“提供功能安全”.............................................................................................................................1
• 将提到的旧术语实例全部更改为控制器和响应器................................................................................................ 1
Changes from Revision A (September 2017) to Revision B (February 2020)
Page
• Added ADC error for 0 mA current setting in 节6.5 table...................................................................................6
• Added RIN_SC spec for VS above 7 V in 节6.5 table........................................................................................6
• Added RIN_COMP spec for VS above 7 V in 节6.5 table..................................................................................6
• Changed WC_CFG0 for CSO and CSI in matrix mode in 表8-59 .................................................................115
Changes from Revision * (August 2017) to Revision A (September 2017)
Page
• Changed the IWETT value in the Electrical Characteristics table.........................................................................6
• Changed From: 4.5 V ≤VS ≤5 V To: 4.5 V ≤VS < 5.5 V in 图6-6 ..............................................................11
• Changed From: 4.5 V ≤VS ≤35 V To: 5.5 V ≤VS ≤35 V in 图6-7 ........................................................... 11
• Changed the Microcontroller Wake-Up section, and 图8-9 .............................................................................24
• Changed 表9-5 ............................................................................................................................................. 123
• Changed text in list item 2 From: current ranging between 4.3 mA and 5.6 mA. To: current ranging between
4.5 mA and 5.5 mA (for VS –INX ≥3 V condition). .....................................................................................123
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5 Pin Configuration and Functions
IN13
1
2
3
38
VS
37
36
IN14
IN15
VS
IN12
35
34
IN16
IN17
4
5
IN11
IN10
6
7
33
32
IN18
IN19
IN9
IN8
IN20
AGND
IN21
8
9
31
30
IN7
IN6
IN5
Exposed
Pad
10
11
29
28
IN22
IN23
DGND
IN4
12
13
27
26
IN0
IN1
IN3
IN2
14
15
25
24
/CS
/INT
16
17
18
19
23
22
21
20
SCLK
CAP_D
SI
CAP_PRE
RESET
SO
VDD
CAP_A
Not to Scale
图5-1. DCP (TSSOP) Package, 38-Pin, Top View
Pin Functions
PIN
TYPE(1)
DESCRIPTION
NO.
1
NAME
IN13
IN14
IN15
IN16
IN17
IN18
IN19
IN20
AGND
IN21
IN22
IN23
IN0
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
P
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground for analog circuitry.
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
I/O
I/O
I/O
I/O
I/O
I
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Active-low input. Chip select from the controller for the SPI Interface.
Serial clock output from the controller for the SPI Interface.
Serial data input for the SPI Interface.
IN1
CS
SCLK
SI
I
I
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Pin Functions (continued)
PIN
TYPE(1)
DESCRIPTION
NO.
NAME
18
SO
O
P
Serial data output for the SPI Interface.
3.3 V to 5.0 V logic supply for the SPI communication. The SPI I/Os are not fail-safe
protected: VDD needs to be present during any SPI traffic to avoid excessive leakage
currents and corrupted SPI I/O logic levels.
19
20
VDD
CAP_A
I/O
External capacitor connection for the analog LDO. Use capacitance value of 100 nF.
Keep RESET low for normal operation and drive RESET high and release it to perform a
hardware reset of the device. The RESET pin is connected to ground via a 1MΩ pull-down
resistor. If not used, the RESET pin shall be grounded to avoid any accidental device reset
due to coupled noise onto this pin.
21
RESET
I
22
23
CAP_Pre
CAP_D
I/O
I/O
External capacitor connection for the pre-regulator. Use capacitance value of 1 μF.
External capacitor connection for the digital LDO. Use capacitance value of 100 nF.
Open drain output. Pulled low (internally) upon change of state on the input or occurrence of
a special event.
24
INT
O
25
26
27
28
29
30
31
32
33
34
35
36
37
38
IN2
IN3
I/O
I/O
I/O
P
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground for digital circuitry.
IN4
DGND
IN5
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
P
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground/VBAT switch monitoring input with configurable current sink or source.
Ground switch monitoring input with current source.
IN6
IN7
IN8
IN9
IN10
IN11
IN12
VS
Ground switch monitoring input with current source.
Ground switch monitoring input with current source.
Power supply input pin.
VS
P
Power supply input pin.
Exposed Pad. The exposed pad is not electrically connected to AGND or DGND. Connect
EP to the board ground to achieve rated thermal and ESD performance.
---
EP
P
(1) I = input, O = output, I/O = input and output, P = power.
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6 Specifications
6.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted).(1)
MIN
-0.3
-0.3
-24
MAX
40(2)
6
UNIT
V
VS, INT
VDD, SCLK, SI, SO, CS, RESET
V
IN0- IN23
Input voltage
40(2)
5.5
5.5
2
V
CAP_Pre
-0.3
-0.3
-0.3
-40
V
CAP_A
CAP_D
V
V
Operating junction temperature, TJ
Storage temperature, Tstg
150
155
°C
°C
-55
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) Tested for load dump and jump start conditions with nominal operating voltage no greater than 16 V for the life of a 12-V automotive
system. Refer to 节9.2 for more details.
6.2 ESD Ratings
VALUE
±2000
±4000
±500
UNIT
All pins
Pins IN0-IN23(2)
Human-body model (HBM), per AEC Q100-002(1)
All pins
Charged-device model (CDM), per AEC Q100-011
Contact discharge, un-powered, per ISO- 10605:
Corner pins (pin 1, 19, 20 and 38)
±750
•
External components: capacitor = 15 nF; resistor = 10 Ω
Pins IN0-IN23
±8000
•
ESD generator parameters: storage capacitance = 150 pF; discharge
V(ESD)
Electrostatic discharge
V
resistance = 330 Ωor 2000 Ω
Contact discharge, powered-up, per ISO- 10605:
•
External components: capacitor = 15 nF; resistor = 33 Ω
Pins IN0-IN23
±8000
•
ESD generator parameters: storage capacitance = 150 pF or 330pF;
discharge resistance = 330 Ωor 2000 Ω
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(2) ±4-kV rating on pins IN0-IN23 are stressed with respect to GND (with AGND, DGND, and EP tied together).
6.3 Recommended Operating Conditions
Over operating free-air temperature range and VS = 12 V (unless otherwise noted).
MIN
4.5
3.0
0
NOM
MAX
35 (2)
5.5
UNIT
V
VS
Power supply voltage
Logic supply voltage
VDD
V
V/INT
VINX
VRESET
VSPI_IO
fSPI
INT pin voltage
35(2)
35(2)
5.5
V
IN0 to IN23 input voltage
RESET pin voltage
0
V
0
V
SPI input/output logic level
SPI communication frequency
Operating free-air temperature
0
VDD
4M
V
20(1)
-40
Hz
°C
TA
125
(1) Lowest frequency characterized.
(2) Tested for load dump and jump start conditions with nominal operating voltage no greater than 16-V for the life of a 12-V automotive
system. Refer to 节9.2 for more details.
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6.4 Thermal Information
TIC12400-Q1
DCP (TSSOP)
38 PINS
33.6
THERMAL METRIC(1)
UNIT
RθJA
Junction-to-ambient thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
18.4
15.2
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
0.5
ψJT
15.0
ψJB
RθJC(bot)
1.2
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.5 Electrical Characteristics
Over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
POWER SUPPLY
Continuous mode VS Continuous mode, IWETT= 10 mA, all switches open, no active ADC
power supply current conversion or comparator comparison, no unserviced interrupt
IS_CONT
5.6
7
mA
IS_POLL_COMP_25
IS_POLL_COMP_85
IS_POLL_COMP
IS_POLL_ADC_25
IS_POLL_ADC_85
IS_POLL_ADC
TA= 25°
68
68
68
75
75
75
100
110
170
105
120
180
µA
µA
µA
µA
µA
µA
Polling mode VS
power supply average
current in comparator
mode
Polling mode, tPOLL= 64 ms, tPOLL_ACT= 128
µs, all 24 channels active and configured to
TA= -40° to 85°C
TA= -40° to 125°C
TA= 25°
comparator mode, all switches open, IWETT
10 mA, no unserviced interrupt
=
Polling mode, tPOLL= 64 ms, tPOLL_ACT= 128
µs, all 24 channels active and configured to
ADC mode, all switches open, IWETT= 10 mA,
no unserviced interrupt
Polling mode VS
power supply average TA= -40° to 85°C
current in ADC mode
TA= -40° to 125°C
Reset mode VS power
supply current
IS_RESET
IS_IDLE_25
IS_IDLE_85
IS_IDLE
Reset mode, VRESET= VDD. VS= 12 V, all switches open, TA=25°C
12
50
50
50
1.5
17
75
µA
µA
µA
µA
µA
V
TRIGGER bit in CONFIG register = logic 0, TA= 25°C, no
unserviced interrupt
VS power supply
average current in
idle state
TRIGGER bit in CONFIG register = logic 0, TA= -40°C to 85°C, no
unserviced interrupt
95
TRIGGER bit in CONFIG register = logic 0, TA= -40°C to 125°C, no
unserviced interrupt
145
10
Logic supply current
from VDD
IDD
SCLK = SI = 0 V, CS = INT = VDD, no SPI communication
Threshold for rising VS from device OFF condition resulting in INT
pin assertion and a flagged POR bit in the INT_STAT register
VPOR_R
VPOR_F
VOV_R
3.85
1.95
35
4.5
2.8
40
Power on reset (POR)
voltage for VS
Threshold for falling VS from device normal operation to reset mode
and loss of SPI communication
V
Over-voltage (OV)
condition for VS
Threshold for rising VS from device normal operation resulting in
INT pin assertion and a flagged OV bit in the INT_STAT register
V
Over-voltage (OV)
condition hysteresis
for VS
VOV_HYST
1
3.5
V
Threshold for rising VS from under-voltage condition resulting in INT
pin assertion and a flagged UV bit in the INT_STAT register
VUV_R
VUV_F
3.85
3.7
4.5
4.4
V
V
Under-voltage (UV)
condition for VS
Threshold for falling VS from under-voltage condition resulting in
INT pin assertion and a flagged UV bit in the INT_STAT register
Under-voltage (UV)
condition hysteresis
for VS
VUV_HYST
75
275
mV
(1)
VDD_F
Threshold for falling VDD resulting in loss of SPI communication
2.5
50
2.9
V
Valid VDD voltage
hysteresis
VDD_HYST
150
mV
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6.5 Electrical Characteristics (continued)
Over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
WETTING CURRENT ACCURACY (DIGITAL SWITCHES, MAXIMUM RESISTANCE VALUE WITH SWITCH CLOSED ≤100Ω , MINIMUM RESISTANCE
VALUE WITH SWITCH OPEN ≥5000 Ω)
1 mA setting
2 mA setting
0.84
1.71
2.39
4.3
1
2
1.14
2.32
5.5
4.5 V ≤VS ≤35 V
4.5 V ≤VS < 5 V
5 V ≤VS ≤35 V
4.5 V ≤VS < 6 V
6 V ≤VS ≤35 V
4.5 V ≤VS < 6.5 V
6.5 V ≤VS ≤35 V
5 mA setting
10 mA setting
15 mA setting
Wetting current
accuracy for CSO
(switch closed)
5
5.6
IWETT (CSO)
mA
2.4
11
8.4
10
11.4
16.5
17
2.4
12.5
0.75
1.6
15
1.1
1 mA setting
2 mA setting
5 mA setting
10 mA setting
2.05
3.3
2.2
4.5 V ≤VS ≤35 V
Wetting current
accuracy for CSI
(switch closed)
4.3
5.6
7.1
IWETT (CSI)
mA
9.2
11.5
16.5
16.5
13.4
19.2
19.2
11
4.5 V ≤VS < 6 V
6 V ≤VS ≤35 V
15 mA setting
10 mA setting,
13.7
1.7
1.7
Voltage drop from INx
pin to AGND across
CSI (switch open)
R
SW= 5 kΩ
15 mA setting,
SW= 5 kΩ
VCSI_DROP_OPEN
V
4.5 V ≤VS ≤35 V
R
2 mA setting, IIN= 1
mA (4.5V ≤VS ≤
35V)
1.2
1.3
1.5
V
V
V
5 mA setting, IIN
=
1mA or 2 mA
Voltage drop from INx
pin to ground across
CSI (switch closed)
VCSI_DROP_CLOSED
4.5 V ≤VS ≤35 V
10 mA setting, IIN
1 mA, 2 mA, or 5
mA
=
15 mA setting, IIN
=
1 mA, 2 mA, 5 mA,
or 10 mA
2.1
V
WETTING CURRENT ACCURACY (ANALOG SWITCHES)
1 mA setting
2 mA setting
0.88
1.8
4.3
4.5
9
1
2
1.13
2.25
5.5
4.5 V ≤VS ≤35 V, VS –VINX ≥2.5 V
5
5.5 V ≤VS ≤35 V, VS –VINX ≥2.5 V
5.5 V ≤VS ≤35 V, VS –VINX ≥3 V
6 V ≤VS ≤35 V, VS –VINX ≥4 V
6.5 V ≤VS ≤35 V, VS –VINX ≥5 V
Wetting current
accuracy
5 mA setting
IWETT
mA
5
5.5
10 mA setting
15 mA setting
10
15
11
12.5
16.5
LEAKAGE CURRENTS
IIN_LEAK_OFF
-4
5.3
0.5
0 V ≤VINx ≤VS , channel disabled (EN_INx register bit= logic 0)
Leakage current at
input INx when
channel is disabled
µA
0 V ≤VINx ≤VS , channel disabled (EN_INx register bit= logic 0),
TA = 25°C
IIN_LEAK_OFF_25
-0.5
Leakage current at
input INx when
wetting current setting
is 0mA
µA
µA
IIN_LEAK_0mA
-110
-5
110
0 V ≤VINx ≤6 V, 6 V ≤VS ≤35 V , IWETT setting = 0 mA
Leakage current at
input INx under loss
of GND condition
VS = 24 V, 0 V ≤VINx ≤24 V, all grounds (AGND, DGND, and EP)
IIN_LEAK_LOSS_OF_GND
µA
µA
= 24 V, VDD shorted to the grounds(1)
Leakage current at
input INx under loss
of VS condition
IIN_LEAK_LOSS_OF_VS
5
0 V ≤VINx ≤24 V, VS shorted to the grounds = 0 V, VDD = 0 V
LOGIC LEVELS
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6.5 Electrical Characteristics (continued)
Over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
0.35
UNIT
I/INT = 2 mA
I/INT = 4 mA
INT output low
voltage
V/INT_L
V
0.6
VSO_L
VSO_H
SO output low voltage ISO = 2 mA
0.2VDD
V
V
SO output high
ISO = -2 mA
voltage
0.8VDD
0.7VDD
1.6
SI, SCLK, and CS
input low voltage
VIN_L
0.3VDD
V
V
V
V
SI, SCLK, and CS
input high voltage
VIN_H
RESET input low
voltage
VRESET_L
VRESET_H
0.8
RESET input high
voltage
RRESET_25
RRESET
VRESET= 0 to 5.5 V, TA =25°C
0.85
0.2
1.25
1.7
2.1
RESET pin internal
pull-down resistor
MΩ
VRESET= 0 to 5.5 V, TA = –40° to 125°C
SWITCH INPUT AND VS MEASUREMENT CONVERSION PARAMETERS
RES
Resolution
10
–1
Bits
LSB
LSB
VOFFSET
VFSE
ADC Offset error
0 mA setting
0
0
1
ADC Full-scale error 0 mA setting
10
–10
4.5 V ≤VS ≤35 V, 100 Ω resistance to
12
42
17
51
26
64
ground at INx
4.5 V ≤VS ≤35 V, 300 Ω resistance to
ground at INx
1 mA setting
LSB
LSB
LSB
LSB
LSB
4.5 V ≤VS ≤35 V, 600 Ω resistance to
87
102
34
122
45
ground at INx
4.5 V ≤VS ≤35 V, 100 Ω resistance to
ground at INx
28
4.5 V ≤VS ≤35 V, 300 Ω resistance to
ground at INx
2 mA setting
89
102
205
85
122
236
105
296
620
202
486
823
301
582
879
4.5 V ≤VS ≤35 V, 600 Ω resistance to
ground at INx
181
72
5 V ≤VS ≤35 V, 100 Ω resistance to ground
at INx
Switch input
conversion output
5 V ≤VS ≤35 V, 300 Ω resistance to ground
at INx
OUTSW
5 mA setting
223
393
142
333
430
166
325
450
256
512
171
427
683
256
512
768
5 V ≤VS ≤35 V, 600 Ω resistance to ground
at INx
6 V ≤VS ≤35 V, 100 Ω resistance to ground
at INx
6 V ≤VS ≤35 V, 250 Ω resistance to ground
at INx
10 mA setting
6 V ≤VS ≤35 V, 400 Ω resistance to ground
at INx
6.5 V ≤VS ≤35 V, 100 Ω resistance to
ground at INx
6.5 V ≤VS ≤35 V, 200 Ω resistance to
ground at INx
15 mA setting
6.5 V ≤VS ≤35 V, 300 Ω resistance to
ground at INx
VS measurement
output tolerance to
full-scale range
±2%
±2%
VS measurements (VS ≥4.5 V), VS_RATIO= 0 in register CONFIG
VS measurements (VS ≥4.5 V), VS_RATIO= 1 in register CONFIG
INx measurements
OUTVS
6
9
VFSR
Input full-scale range VS measurements (VS ≥4.5 V), VS_RATIO= 0 in register CONFIG
VS measurements (VS ≥4.5 V), VS_RATIO= 1 in register CONFIG
V
30
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6.5 Electrical Characteristics (continued)
Over operating free-air temperature range, VS = 4.5 V to 35 V, and VDD = 3 V to 5.5 V (unless otherwise noted).
PARAMETER
Input resistance
ADC Equivalent input
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INx measurements
240
kΩ
RIN, SC
resistance, VS above Input switch measurement, ILOAD= 30 µA
7 V
135
234
356
kΩ
kΩ
THRES_COMP Setting = 2 V
88
85
73
68
130
126
105
95
172
170
137
124
ADC Equivalent input
resistance, VS above
THRES_COMP Setting = 3 V
7 V
THRES_COMP Setting = 2.7 V
RIN, COMP
THRES_COMP Setting = 4 V
INx measurements
2
-
-
VS measurements (VS ≥4.5 V), VS_RATIO = 0 in register
3
Input voltage divider
factor(1)
RRATIO
CONFIG
VS measurements (VS ≥4.5 V), VS_RATIO = 1 in register
CONFIG
10
-
COMPARATOR PARAMETERS
Comparator threshold
for 2 V
VTH_ COMP_2V
VTH_ COMP_2p7V
VTH_ COMP_3V
VTH_ COMP_4V
THRES_COMP = 2 V
THRES_COMP = 2.7 V
THRES_COMP = 3 V
THRES_COMP = 4 V
1.85
2.4
2.25
2.9
V
V
V
V
Comparator threshold
for 2.7 V
Comparator threshold
for 3 V
2.85
3.7
3.3
Comparator threshold
for 4 V
4.35
THRES_COMP = 2 V
THRES_COMP = 2.7 V
THRES_COMP = 3 V
THRES_COMP = 4 V
THRES_COMP = 2 V
THRES_COMP = 2.7 V
THRES_COMP = 3 V
THRES_COMP = 4 V
4.5
5
Minimum VS
requirement for
proper detection
VS_COMP
V
5.5
6.5
30
35
35
43
130
130
105
95
Comparator
equivalent input
resistance
RIN, COMP
kΩ
(1) Verified by design.
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6.6 Timing Requirements
VS= 4.5 V to 35 V, VDD= 3 V to 5.5 V, and 10 pF capacitive load on SO unless otherwise noted; verified by design and
characterization.
PARAMETER
TEST CONDITION
MIN
NOM
MAX UNIT
SWITCH MONITORING, INTERRUPT, STARTUP AND RESET
tPOLL_ACT Polling active time accuracy
Polling mode
-12%
-12%
-12%
12%
12%
tPOLL_ACT
Polling mode with matrix
enabled
Polling active time accuracy for matrix inputs
_M
tPOLL
Polling time accuracy
Polling mode
12%
µs
tCOMP
Comparator detection time
18
24
Sample and hold time
included
tADC
ADC Conversion time
µs
tCCP_TRA Transition time between last input sampling and start of
20
µs
clean current
N
tCCP_ACT Clean current active time
tSTARTUP Polling startup time
-12%
200
12%
300
2
400
2.5
µs
tINT_ACTIV
Active INT assertion duration
1.5
ms
E
tINT_INACT
INT de-assertion duration during a pending interrupt
3
80
2
4
5
ms
µs
µs
IVE
tINT_IDLE Interrupt idle time
100
120
Time required to keep the RESET pin high to successfully
tRESET
reset the device (no pending interrupt)(1)
Delay between a fault event (OV, UV, TW, or TSD) to a
high to low transition on the INT pin
tREACT
20
µs
See 图7-2 for OV example.
SPI INTERFACE
tLEAD
tLAG
Falling edge of CS to rising edge of SCLK setup time
Falling edge of SCLK to rising edge of CS setup time
SI to SCLK falling edge setup time
100
100
30
ns
ns
ns
ns
ns
ns
tSU
tHOLD
tVALID
tSO(EN)
SI hold time after falling edge of SCLK
20
Time from rising edge of SCLK to valid SO data
Time from falling edge of CS to SO low-impedance
70
60
Loading of 1 kΩ to GND.
See 图7-3.
tSO(DIS)
Time from rising edge of CS to SO high-impedance
60
ns
tR
tF
SI, CS, and SCLK signals rise time
SI, CS, and SCLK signals fall time
5
5
30
30
ns
ns
tINTER_FR Delay between two SPI communication ( CS low)
1.5
µs
sequences
AME
tCKH
tCKL
SCLK High time
SCLK Low time
120
120
ns
ns
Delay between valid VDD voltage and initial SPI
communication
tINITIATION
45
µs
(1) If there is a pending interrupt (/INT pin asserted low), it can take up to 1ms for the device to complete the reset.
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6.7 Typical Characteristics
18
16
14
12
10
8
16
14
12
10
8
IWETT=1mA
IWETT=2mA
IWETT=5mA
IWETT=10mA
IWETT=15mA
IWETT=1mA
IWETT=2mA
IWETT=5mA
IWETT=10mA
IWETT=15mA
6
6
4
4
2
2
0
0
0
5
10
15
20
VS voltage (V)
25
30
35
40
-40 -20
0
20
40
60
Temperature (C)
80 100 120 140 160
D001
D001
TA = 25°C
VS = 12 V
图6-1. Wetting Current Output - CSO vs. VS Voltage
图6-2. Wetting Current Output - CSO vs. Temperature
4
1000
ADC Code Min
ADC Code Max
3.75
3.5
3.25
3
THRES_COMP=2V
THRES_COMP=2.7V
THRES_COMP=3V
THRES_COMP=4V
800
600
400
200
0
2.75
2.5
2.25
2
1.75
5
505 1005 1505 2005 2505 3005 3505 4005 4505 5000
Equivalent Input Resistance (W)
0
5
10
15
20
VS voltage (V)
25
30
35
40
ADDP0C0lo1_t
D001
I(WETT) = 1 mA
图6-4. ADC Code vs. Equivalent Input Resistance
TA = 25°C
4.5 V ≤VS ≤35 V
图6-3. Comparator Threshold vs. VS Voltage
1200
1000
800
600
400
200
0
700
ADC Code Min
ADC Code Max
600
500
400
300
200
100
0
ADC Code Min
ADC Code Max
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
ADD0C01_
ADD0C01_
I(WETT) = 2 mA
4.5 V ≤VS ≤35 V
I(WETT) = 5 mA
4.5 V ≤VS < 5.5 V
图6-5. ADC Code vs. Equivalent Input Resistance
图6-6. ADC Code vs. Equivalent Input Resistance
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6.7 Typical Characteristics (continued)
1100
1000
900
800
700
600
500
400
300
200
900
800
700
600
500
400
300
200
100
0
ADC Code Min
ADC Code Max
ADC Code Min
ADC Code Max
100
0
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
ADD0C01_
ADD0C01_
I(WETT) = 5 mA
图6-7. ADC Code vs. Equivalent Input Resistance
5.5 V ≤VS ≤35 V
I(WETT) = 10 mA
4.5 V ≤VS < 6 V
图6-8. ADC Code vs. Equivalent Input Resistance
1100
900
1000
900
800
700
600
500
400
300
200
100
0
800
700
600
500
400
300
200
100
0
ADC Code Min
ADC Code Max
ADC Code Min
ADC Code Max
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
ADD0C01_
ADD0C01_
I(WETT) = 10 mA
6 V ≤VS ≤35 V
I(WETT) = 15 mA
4.5 V ≤VS < 6.5 V
图6-9. ADC Code vs. Equivalent Input Resistance
图6-10. ADC Code vs. Equivalent Input Resistance
1100
1000
900
800
700
600
500
400
300
200
100
0
ADC Code Min
ADC Code Max
0
500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Equivalent Input Resistance (W)
ADD0C01_
I(WETT) = 15 mA
图6-11. ADC Code vs. Equivalent Input Resistance
6.5 V ≤VS ≤35 V
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7 Parameter Measurement Information
VDD
tINITIATION
tINTERFRAME
/CS
ttLAG
t
ttCKH
t
ttCKLt
ttLEAD
t
SCLK
tHOLD
ttSU
t
SI
tSO(EN)
tVALID
tSO(DIS)
SO
图7-1. SPI Timing Parameters
VOV_R
VS
tREACT
/INT
V/INT_L
图7-2. tREACT Timing Parameters
VIN_H
/CS
SO
tSO(DIS)
SO
VSO_H
GND
图7-3. tSO(DIS) Timing Parameters
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8 Detailed Description
8.1 Overview
The TIC12400-Q1 is an advanced 24-input Multiple Switch Detection Interface (MSDI) device designed to detect
external mechanical switch status in a 12 V automotive system by acting as an interface between the switches
and the low-voltage microcontroller. The TIC12400-Q1 is an integrated solution that replaces many discrete
components and provides integrated protection, input serialization, and system wake-up capability.
The device monitors 14 switches to GND and 10 additional switches that can be programmed to be connected to
either GND or VBAT. It features SPI interface to report individual switch status and provides programmability to
control the device operation. The TIC12400-Q1 features a 10-bit ADC which is useful to monitor analog inputs
such as resistor coded switches that have multiple switching positions. To monitor only digital switches, an
integrated comparator can be used instead to monitor the input status. The device has 2 modes of operation:
continuous mode and polling mode. The polling mode is a low-power mode that can be activated to reduce
current drawn in the system by only turning on the wetting current for a small duty cycle to detect switch status
changes. An interrupt is generated upon detection of switch status change and it can be used to wake up the
microcontroller to bring the entire system back to operation.
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8.2 Functional Block Diagram
VS
37
VS
38
VS
Over-voltage
protection
1mA to 15mA
or
Over-temperature
protection
OFF
SW
Under-voltage
protection
IN0
IN1
IN2
IN3
13
14
AGND
ESD
Protection
1mA to 15mA
22
Pre-regulator
CAP_PRE
or
OFF
25
26
SW
AGND
20
23
Analog LDO
Digital LDO
CAP_A
CAP_D
Vtest
+
VS
œ
AGND
Power management
AGND
1mA to 15mA
VS
or
OFF
IN9
33
SW
SW
ESD
Protection
1mA to 15mA
VDIG
or
OFF
Oscillator
24
/INT
AGND
AGND
R1
SW
ADC
State
machine
AGND
19
15
16
17
18
21
VDD
/CS
VS
Control
logic
SCLK
SI
AGND
MUX
Input/
output
buffer
1mA to 15mA
or
OFF
SO
Registers
SW
RESET
IN10 34
R5
SW
+
ESD
Protection
Digital Block
35
œ
IN11
1MΩ
+
VS
DGND
œ
AGND
IN12 36
AGND
AGND
1
IN13
1mA to 15mA
or
OFF
SW
IN23 12
ESD
Protection
AGND
DGND
9
28
DGND
AGND
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8.3 Feature Description
8.3.1 VS Pin
The VS supply provides power to the entire chip and it is designed to be connected directly to a 12 V automotive
battery via a reverse-polarity blocking diode.
8.3.2 VDD Pin
The VDD supply is used to determine the logic level on the SPI communication interface, source the current for
the SO driver, and sets the pull-up voltage for the CS pin. It can also be used as a possible external pull-up
supply for the INT pin in addition to the VS and it shall be connected to a 3 V to 5.5 V logic supply. Removing
VDD from the device disables SPI communications but does not reset the register configurations.
8.3.3 Device Initialization
When the device is powered up for the first time, the condition is called Power-On Reset (POR), which sets the
registers to their default values and initializes the device state machine. The internal POR controller holds the
device in a reset condition until VS has reached VPOR_R, at which the reset condition is released with the device
registers and state machine initialized to their default values. After the initialization process is completed, the INT
pin is asserted low to notify the microcontroller, and the register bit POR in the INT_STAT register is asserted to
logic 1. The SPI flag bit POR is also asserted at the SPI output (SO).
During device initialization, factory settings are programmed into the device to allow accurate device operation.
The device performs a self-check after the device is programmed to ensure correct settings are loaded. If the
self-check returns an error, the CHK_FAIL bit in the INT_STAT register will be flagged to logic 1 along with the
POR bit. If this event occurs the microcontroller is recommended to initiate software reset (see section Software
Reset) to re-initialize the device to allow the correct settings to be re-programmed.
8.3.4 Device Trigger
After device initialization, the TIC12400-Q1 is ready to be configured. The microcontroller can use SPI
commands to program desired settings to the configuration registers. Once the device configuration is
completed, the microcontroller is required to set the bit TRIGGER in the CONFIG register to logic 1 in order to
activate wetting current and start external switch monitoring.
After switch monitoring initiates, the configuration registers turn into read-only registers (with the exception of the
TRIGGER, CRC_T, and RESET bits in the CONFIG register and all bits in the CCP_CFG1 register). If at any
time the device setting needs to be re-configured, the microcontroller is required to first set the bit TRIGGER in
the CONFIG register to logic 0 to stop wetting current and switch monitoring. The microcontroller can then
program configuration registers to the desired settings. Once the re-configuration is completed the
microcontroller can set the TRIGGER bit back to logic 1 to re-start switch monitoring.
Note the cyclic redundancy check (CRC) feature stays accessible when TRIGGER bit is in logic 1, allowing the
microcontroller to verify device settings at all time. Refer to section Cyclic Redundancy Check (CRC) for more
details of the CRC feature.
8.3.5 Device Reset
There are 3 ways to reset the TIC12400-Q1 and re-initialize all registers to their default values:
8.3.5.1 VS Supply POR
The device is turned off and all register contents are lost if the VS voltage drops below VPOR_F. To turn the device
back on, the VS voltage must be raised back above VPOR_R, as illustrated in 图 8-1. The device then starts the
initialization process as described in section Device Initialization.
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VS
Device
OFF
Normal
Operation
Device
OFF
Normal
Operation
VPOR_R
VPOR_F
Time
图8-1. VS is Lowered Below the POR Threshold, Then Ramped Back Up to Complete a POR Cycle
8.3.5.2 Hardware Reset
Microcontroller can toggle the RESET pin to perform a hardware reset to the device. The RESET pin is internally
pulled-down via a resistor (1.25 MΩ typical) and must be kept low for normal operation. When the RESET pin is
toggled high, the device enters the reset state with most of the internal blocks turned off and consumes very little
current of IS_RESET. Switch monitoring and SPI communications are stopped in the reset state, and all register
contents are cleared. When RESET pin is toggled back low, all the registers are set to their default values and
the device state machine is re-initialized, similar to a POR event. When the re-initialization process is completed
the INT pin is asserted low, and the interrupt register bit POR and the SPI status flag POR are both asserted to
notify the microcontroller that the device has completed the reset process.
Note in order to successfully reset the device, the RESET pin needs to be kept high for a minimum duration of
tRESET. The pin is required to be driven with a stable input (below VRESET_L for logic low or above VRESET_H for
logic H) to prevent the device from accidental reset.
8.3.5.3 Software Reset
In addition to hardware reset the microcontroller can also issue a SPI command to initiate software reset.
Software reset is triggered by setting the RESET bit in the register CONFIG to logic 1, which re-initializes the
device with all registers set to their default values. Once the re-initialization process is completed, the INT pin is
asserted low, and the interrupt register bit POR and the SPI status flag POR are both asserted to notify the
microcontroller that the device has completed the reset process.
8.3.6 VS Under-Voltage (UV) Condition
During normal operation of a typical 12 V automotive system, the VS voltage is usually quite stable and stays
well above 11 V. However, the VS voltage may drop temporarily during certain vehicle operations, such as cold
cranking. If the VS voltage drops below VUV_F, the TIC12400-Q1 enters the under-voltage (UV) condition since
there is not enough voltage headroom for the device to accurately generate wetting currents. The following
describes the behavior of the TIC12400-Q1 under UV condition:
1. All current sources and sinks de-activate and switch monitoring stops.
2. Interrupt is generated by asserting the INT pin low and the bit UV in the interrupt register (INT_STAT) is
flagged to logic 1. The bit UV_STAT is asserted to logic 1 in the register IN_STAT_MISC. The OI SPI flag is
asserted during any SPI transactions. The INT pin is released and the interrupt register (INT_STAT) is
cleared on the rising edge of CS provided that the interrupt register has been read during the SPI
transaction.
3. SPI communication stays active, and all register settings stay intact without resetting. Previous switch status,
if needed, can be retrieved without interruption.
4. The device continues to monitor the VS voltage, and the UV condition sustains if the VS voltage continues to
stay below VUV_R. No further interrupt is generated once cleared.
Note: the device resets as described in section VS Supply POR if the VS voltage drops below VPOR_F
.
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When the VS voltage rises above VUV_R, the INT pin is asserted low to notify the microcontroller that the UV
condition no longer exists. The UV bit in the register INT_STAT is flagged to logic 1 and the bit UV_STAT bit is
de-asserted to logic 0 in the register IN_STAT_MISC to reflect the clearance of the UV condition. The device
resumes operation using current register settings (regardless of the INT pin and SPI communication status) with
polling restarted from the first enabled channel. The Switch State Change (SSC) interrupt is generated at the
end of the first polling cycle and the detected switch status becomes the baseline switch status for subsequent
polling cycles. The content of the INT_STAT register, once read by the microcontroller, is cleared, and the INT
pin is released afterwards.
The following diagram describes the TIC12400-Q1 operation at various different VS voltages. If the VS voltage
stays above VUV_F (Case 1), the device stays in normal operation. If the VS voltage drops below VUV_F but stays
above VPOR_F (Case 2), the device enters the UV condition. If VS voltage drops below VPOR_F (Case 3), the
device resets and all register settings are cleared. The microcontroller is then required to re-program all the
configuration registers in order to resume normal operation after the VS voltage recovers.
VS
tCrankingt
Device
OFF
VPOR_R
Case 1
VUV_F
Case 2
VPOR_F
Case 3
Time
图8-2. TIC12400-Q1 Operation at Various VS Voltage Levels
8.3.7 VS Over-Voltage (OV) Condition
If VS voltage rises above VOV_R, the TIC12400-Q1 enters the over-voltage (OV) condition to prevent damage to
internal structures of the device on the VS and INx (for battery-connected switches) pins. The following describes
the behavior of the TIC12400-Q1 under OV condition:
1. All current sources and sinks de-activate and switch monitoring stops.
2. Interrupt is generated by asserting the INT pin low and the bit OV in the interrupt register (INT_STAT) is
flagged to logic 1. The bit OV_STAT is asserted to logic 1 in the register IN_STAT_MISC. The OI SPI flag is
asserted during any SPI transactions. The INT pin is released and the interrupt register (INT_STAT) is
cleared on the rising edge of CS provided that the interrupt register has been read during the SPI
transaction.
3. SPI communication stays active, and all register settings stay intact without resetting. Previous switch status,
if needed, can be retrieved without any interruption.
4. The device continues to monitor the VS voltage, and the OV condition sustains if the VS voltage continues to
stay above VOV_R- VOV_HYST. No further interrupt is generated once cleared.
When the VS voltage drops below VOV_R - VOV_HYST, the INT pin is asserted low to notify the microcontroller that
the over-voltage condition no longer exists. The OV bit in the register INT_STAT is flagged to logic 1 and the bit
OV_STAT bit is de-asserted to logic 0 in the register IN_STAT_MISC to reflect the clearance of the OV condition.
The device resumes operation using current register settings (regardless of the INT pin and SPI communication
status) with polling restarted from the first enabled channel. The Switch State Change (SSC) interrupt is
generated at the end of the first polling cycle and the detected switch status becomes the baseline status for
subsequent polling cycles. The content of the INT_STAT register, once read by the microcontroller, is cleared
and the INT pin is released afterwards.
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8.3.8 Switch Inputs Settings
IN0 to IN23 are inputs connected to external mechanical switches. The switch status of each input, whether
open or closed, is indicated by the status registers. 表 8-1 below describes various settings that can be
configured for each input. Note: some settings are shared between multiple inputs. It is required to first stop
device operation by setting the TRIGGER bit low in the register CONFIG before making any configuration
changes, as described in Device Trigger.
表8-1. TIC12400-Q1 Wetting Current and Threshold Setting Details
Threshold
Current Source (CSO) /
Current Sink (CSI)
Supported Switch
Type
Input
Wetting Current
Comparator Input
Mode
ADC Input Mode
THRES0 to
CSO
CSI
Switch to GND
Switch to VBAT
IN0
IN1
THRES7
WC_IN0_IN1
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
THRES_COMP_IN
0_IN3
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN2
WC_IN2_IN3
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN3
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN4
WC_IN4
WC_IN5
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN5
THRES_COMP_IN
4_IN7
THRES_COM
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN6
WC_IN6_IN7
WC_IN8_IN9
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN7
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN8
THRES0 to
THRES7
CSO
CSI
Switch to GND
Switch to VBAT
IN9
THRES_COMP_IN
8_IN11
THRES0 to
THRES7
IN10
IN11
IN12
IN13
IN14
IN15
IN16
IN17
WC_IN10
WC_IN11
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
Switch to GND
Switch to GND
Switch to GND
Switch to GND
Switch to GND
Switch to GND
Switch to GND
Switch to GND
THRES0 to
THRES7
THRES2A
THRES2B
WC_IN12_13
WC_IN14_15
WC_IN16_17
THRES2A
THRES2B
THRES_COMP_IN
12_IN15
THRES2A
THRES2B
THRES2A
THRES2B
THRES2A
THRES2B
THRES2A
THRES2B
THRES_COMP_IN
16_IN19
THRES3A
THRES3B
THRES3C
IN18
IN19
CSO
CSO
Switch to GND
Switch to GND
WC_IN18_19
THRES3A
THRES3B
THRES3C
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表8-1. TIC12400-Q1 Wetting Current and Threshold Setting Details (continued)
Threshold
Current Source (CSO) /
Current Sink (CSI)
Supported Switch
Type
Input
Wetting Current
Comparator Input
Mode
ADC Input Mode
THRES3A
THRES3B
THRES3C
IN20
IN21
IN22
CSO
CSO
CSO
Switch to GND
Switch to GND
Switch to GND
WC_IN20_21
THRES3A
THRES3B
THRES3C
THRES_COMP_IN
20_IN23
THRES3A
THRES3B
THRES3C
WC_IN22
WC_IN23
THRES3A
THRES3B
THRES3C
THRES8
IN23
CSO
Switch to GND
THRES9
8.3.8.1 Input Current Source and Sink Selection
Among the 24 inputs, IN10 to IN23 are intended for monitoring only ground-connected switches and are
connected to current sources. IN0 to IN9 can be programmed to monitor either ground-connected switches or
battery-connected switches by configuring the CS_SELECT register. The default configuration of the IN0-IN9
inputs after POR is to monitor ground-connected switches (current sources are selected). To set an input to
monitor battery-connected switches, set the corresponding bit to logic 1.
8.3.8.2 Input Mode Selection
The TIC12400-Q1 has a built-in ADC and a comparator that can be used to monitor resistor coded switches or
digital switches. Digital switch inputs have only two states, either open or closed, and can be adequately
detected by a comparator. Resistor coded switches may have multiple positions that need to be detected and an
ADC is appropriate to monitor the different states. Each input of the TIC12400-Q1 can be individually
programmed to use either a comparator or an ADC by configuring the appropriate bits in the MODE register
depending on the knowledge of the external switch connections. The benefit of using a comparator instead of an
ADC to monitor digital switches is its reduced polling time which translates to overall power saving when the
device operates in the low-power polling mode.
Comparator input mode is selected by default for all enabled inputs upon device reset.
8.3.8.3 Input Enable Selection
The TIC12400-Q1 provides switch status monitoring for up to 24 inputs, but there might be circumstances in
which not all inputs need to be constantly monitored. The microcontroller may choose to enable or disable
monitoring of certain inputs by configuring the IN_EN register. Setting the corresponding bit to logic 0 de-
activates the wetting current source and sink, and stops switch status monitoring for the input. Disabling
monitoring of unused inputs reduces overall power consumption of the device.
All inputs are disabled by default upon device reset.
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8.3.8.4 Thresholds Adjustment
When an input is configured as comparator input mode, the threshold level for interrupt generation can be
programmed by setting the THRES_COMP register. The threshold level settings can be set for each individual
input groups and each group consists of 4 inputs. Four threshold levels are available: 2 V, 2.7 V, 3 V, and 4 V.
When an input is configured as ADC input mode the threshold level for interrupt generation can be configured
from 0 to 1023 different levels by setting the THRES_CFG1 to THRES_CFG2 registers. One threshold level can
be programmed individually for each of the inputs from IN0 to IN11. Additionally, one common threshold, shared
between inputs IN0 to IN11, can be programmed by configuring the THRES_COM bits in register MATRIX. The
common threshold acts independently from the threshold THRES0 to THRES7. Inputs IN12 to IN17 use 2 preset
threshold levels (THRES2A and THRES2B). Inputs 18 to 22 use 3 preset threshold levels (THRES3A,
THRES3B, and THRES3C). Input 23 uses 5 preset threshold levels (THRES3A, THRES3B, THRES3C,
THRES8, and THRES9).
When multiple threshold settings are used for ADC inputs, the thresholds levels need to be configured properly.
Use the rules below (see 表8-2) when setting up the threshold levels:
表8-2. Proper Threshold Configuration for ADC Inputs
INPUT
IN12 to IN17
IN18 to IN22
IN23
PROPER THRESHOLD CONFIGURATION
THRES2B ≥THRES2A
THRES3C ≥THRES3B ≥THRES3A
THRES9 ≥THRES8 ≥THRES3C ≥THRES3B ≥THRES3A
Remember to use caution when setting up the threshold for switches that are connected externally to the battery
as there is a finite voltage drop (as high as VCSI_DROP_OPEN for 10 mA and 15 mA settings) across the current
sinks. Therefore, even for an open switch, the voltage on the INx pin can be as high as VCSI_DROP_OPEN and the
detection threshold shall be configured above it. It shall also be noted that a lower wetting current sink setting
may not be strong enough to pull the INx pin close to ground in the presence of a leaky open external switch, as
illustrated in the diagram below (see 图8-3). In this example, the external switch, although in the open state, has
large leakage current and can be modelled as an equivalent resistor (RDIRT) of 5 kΩ. The 2 mA current sink is
only able to pull the INx pin voltage down to 4 V, even if the switch is in the open state.
Battery- connected switch
+
14V
RDIRT
RSW
œ
VBAT
5kΩ
GND
Open
TIC12400-Q1
INx
2mA
GND
图8-3. Example Showing the Calculation of the INx Pin Voltage for A Leaky Battery-Connected Switch
It is possible to configure an input to ADC input mode, instead of comparator input mode, to monitor single-
threshold digital switches. The following programming procedure is recommended under such configuration:
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表8-3. Recommended Threshold Configuration When Using an ADC Input to Monitor Digital Switches
INPUT
RECOMMENDED THRESHOLD CONFIGURATION
IN0 to IN11
Configure the desired threshold to one of the settings from THRES0 to THRES7 and map it accordingly
•
•
•
Configure the desired threshold to THRES2B
Set THRES2A to the same code as THRES2B
Disable interrupt generation for THRES2A by configuring the INT_EN_CFG1 or INT_EN_CFG2
register.
IN12 to IN17
IN18 to IN22
IN23
•
•
•
Configure the desired threshold to THRES3C
Set THRES3A and THRES3B to the same code as THRES3C.
Disable interrupt generation for THRES3A and THRES3B by configuring the INT_EN_CFG3 or
INT_EN_CFG4 register.
•
•
•
Configure the desired threshold to THRES9
Set THRES3A, THRES3B, THRES3C, and THRES8 to the same code as THRES9.
Disable interrupt generation for THRES3A, THRES3B, THRES3C, and THRES8 by configuring the
INT_EN_CFG4 register.
8.3.8.5 Wetting Current Configuration
There are 6 different wetting current settings (0 mA, 1 mA, 2 mA, 5 mA, 10 mA, and 15 mA) that can be
programmed by configuring the WC_CFG0 and WC_CFG1 registers. 0 mA is selected by default upon device
reset.
To monitor resistor coded switches, a lower wetting current setting (1 mA, 2 mA, or 5 mA) is generally desirable
to get the resolution needed to resolve different input voltages while keeping them within the ADC full-scale
range (0 V to 6 V). Higher wetting current settings (10 mA and 15 mA) are useful to clean switch contact
oxidation that may form on the surface of an open switch contact. If switch contact cleaning is required for
resistor coded switches, the clean current polling (CCP) feature (Refer to 节 8.4.3.1) can be activated to
generate short cleaning pulses periodically using higher wetting current settings at the end of every polling cycle.
The accuracy of the wetting current has stronger dependency on the VS voltage when VS voltage is low. The
lower the VS voltage falls, the more deviation on the wetting currents from their nominal values. Refer to
IWETT (CSO) and IWETT (CSI) specifications for more details.
8.3.9 Interrupt Generation and INT Assertion
The INT pin is an active-low, open-drain output that asserts low when an event such as switch input state
change, temperature warning, over-voltage shutdown, and so fourth, is detected by the TIC12400-Q1. An
external pull-up resistor to VDD is needed on the INT pin (see 图8-4). The INT pin can also be connected directly
to a 12 V automotive battery to support the microcontroller wake-up feature, as describe in 节8.3.9.3.
TIC12400-Q1
Microcontroller
VDD
VDD
/INT
GPI
AGND
GND
AGND
GND
图8-4. INT Connection Example #1
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8.3.9.1 INT Pin Assertion Scheme
TIC12400-Q1 supports two configurable schemes for INT assertion: static and dynamic. The scheme can be
adjusted by configuring the INT_CONFIG bit in the CONFIG register.
If the static INT assertion scheme is used (INT_CONFIG = 0 in the CONFIG register), the INT pin is asserted low
upon occurrence of an event. The INT pin is released on the rising edge of CS only if a READ command has
been issued to read the INT_STAT register while CS is low, otherwise the INT will be kept low indefinitely. The
content of the INT_STAT interrupt register is latched on the first rising edge of SCLK after CS goes low for every
SPI transaction, and the content is cleared upon a READ command issued to the INT_STAT register, as
illustrated in 图8-5.
ñ INT_STAT register
content cleared
Event occurance
ñ /INT pin released
/INT
/CS
Register READ
(non- INT_STAT register)
Register READ
(INT_STAT register)
图8-5. Static INT Assertion Scheme
In some system implementations an edge-triggered based microcontroller might potentially miss the INT
assertion if it is configured to the static scheme, especially when the microcontroller is in the process of waking
up. To prevent missed INT assertion and improve robustness of the interrupt behavior, the TIC12400-Q1
provides the option to use the dynamic assertion scheme for the INT pin. When the dynamic scheme is used
(INT_CONFIG= 1 in the CONFIG register), the INT pin is asserted low for a duration of tINT_ACTIVE and is de-
asserted back to high if the INT_STAT register has not been read after tINT_ACTIVE has elapsed. The INT is kept
high for a duration of tINT_INACTIVE, and is re-asserted low after tINT_INACTIVE has elapsed. The INT pin continues
to toggle until the INT_STAT register is read.
If the INT_STAT register is read when INT pin is asserted low, the INT pin is released on the READ command’s
CS rising edge and the content of the INT_STAT register is also cleared, as shown in 图 8-6. If the INT_STAT
register is read when INT pin is de-asserted, the content of the INT_STAT register is cleared on the READ
command’s CS rising edge, and the INT pin is not re-asserted back low, as shown in 图8-7.
ñ INT_STAT register
content cleared
Event
ñ /INT pin released
occurance
ttINT_INACTIVE
t
/INT
/CS
tINT_ACTIVE
Register READ
(INT_STAT register)
图8-6. Dynamic INT Assertion Scheme With INT_STAT Register Read During tINT_ACTIVE
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ñ INT_STAT register
content cleared
ñ /INT pin will not be re-
asserted tINT_INACTIVE
after /INT returns high
Event
occurance
ttINT_INACTIVE
t
/INT
/CS
tINT_ACTIVE
Register READ
(INT_STAT register)
图8-7. Dynamic INT Assertion Scheme With INT_STAT Register Read During tINT_INACTIVE
The static INT assertion scheme is selected by default upon device reset. The INT pin assertion scheme can
only be changed when bit TRIGGER is logic 0 in the CONFIG register.
8.3.9.2 Interrupt Idle Time (tINT_IDLE) Time
Interrupt idle time (tINT_IDLE) is implemented in TIC12400-Q1 to:
• Allow the INT pin enough time to be pulled back high by the external pull-up resistor and allow the next
assertion to be detectable by an edge-triggered microcontroller.
• Minimize the chance of glitching on the INT pin if back-to-back events occur.
When there is a pending interrupt event and the interrupt event is not masked, tINT_IDLE is applied after the
READ command is issued to the INT_STAT register. If another event occurs during the interrupt idle time the
INT_STAT register content is updated instantly but the INT pin is not asserted low until tINT_IDLE has elapsed. If
another READ command is issued to the INT_STAT register during tINT_IDLE, the INT_STAT register content is
cleared immediately, but the INT pin is not re-asserted back low after tINT_IDLE has elapsed. An example of the
interrupt idle time is given below to illustrate the INT pin behavior under the static INT assertion schemes:
/INT pin is not
asserted until
tINT_IDLE has expired
1st Event
occurance
2nd Event
occurance
/INT
/CS
ttINT_IDLE
Register READ
(INT_STAT register)
Register READ
(INT_STAT register)
图8-8. INT Assertion Scheme With tINT_IDLE
8.3.9.3 Microcontroller Wake-Up
Using a few external components, the INT pin can be used for wake-up purpose to activate a voltage regulator
via its inhibit inputs. An implementation example is shown in 图 8-9. This implementation is especially useful for
waking up a microcontroller in sleep mode to allow significant system-level power savings.
Before the wake-up event, the INT pin is in high impedance state on the TIC12400-Q1. The microcontroller can
be kept in sleep state with all its GPIOs in logic low. Hence, Q2 remains off with its based in logic low state and
the base of Q1 is weakly pulled-high to the VS level. This causes Q1 to remain off, and the LDO_EN signal is
pulled-down to logic low to disable the regulator's output. VDD is therefore unavailable to both the TIC12400-Q1
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device and the microcontroller and SPI communication is not supported. Switch status monitoring, however, is
still active in the TIC12400-Q1.
When an event such as switch status change, temperature warning, O V and so fourth occurs, the INT pin is
asserted low by TIC12400-Q1, causing Q1 to turn on to activate the voltage regulator. The microcontroller is
then reactivated, and the communication between the microcontroller and the TIC12400-Q1 is reestablished.
The microcontroller can then access stored event information using SPI communication. Note: since the INT pin
is de-asserted after the INT_STAT register is read, the microcontroller is required to keep the regulator on by
driving the μC_LDO_EN signal high. This allows VDD to stay high to provide power to the microcontroller and
support SPI communications.
The wake-up implementation is applicable only when the device is configured to use the static INT assertion
scheme.
Regulator
VIN
+
VBAT
10kΩ
œ
VOUT
Q1
GND
Microcontroller
LDO_EN
10kΩ
TIC12400-Q1
10kΩ
GND
V3p3
VDD
VDD
10kΩ
/INT
ꢀC_INT
GPIO 1
GPIO 2
Q2
ꢀC_LDO_EN
AGND
GND
GND
10kΩ
GND
GND
图8-9. INT Connection to Support Microcontroller Wake-Up
8.3.9.4 Interrupt Enable or Disable and Interrupt Generation Conditions
Each switch input can be programmed to enable or disable interrupt generation upon status change by
configuring registers INT_EN_COMP1 to INT_EN_COMP2 (for comparator inputs) and INT_EN_CFG1 to
INT_EN_CFG4 (for ADC inputs). Interrupt generation condition can be adjusted for THRES_COM (for IN0-IN11)
by adjusting the IN_COM_EN bit in the MATRIX register.
The abovementioned registers can also be used to control interrupt generation condition based on the following
settings:
1. Rising edge: an interrupt is generated if the current input measurement is above the corresponding
threshold and the previous measurement was below.
2. Falling edge: an interrupt is generated if the current input measurement is below the corresponding
threshold and the previous measurement was above.
3. Both edges: changes of the input voltage in either direction results in an interrupt generation.
Note interrupt generation from switch status change is disabled for all inputs by default upon device reset.
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8.3.9.5 Detection Filter
When monitoring the switch input status, a detection filter can be configured by setting the DET_FILTER bits in
the CONFIG register to generate Switch Status Change (SSC) interrupt only if the same input status (w.r.t the
threshold) is sampled consecutively. This detection filter can be useful to debounce inputs during a switch toggle
event. Four different filtering schemes are available:
1. Generate an SSC interrupt, if the voltage level at an input crossed its threshold.
2. Generate an SSC interrupt, if the voltage level at an input crossed its threshold and the status is stable (w.r.t.
the threshold) for at least 2 consecutive polling cycles.
3. Generate an SSC interrupt, if the voltage level at an input crossed its threshold and the status is stable (w.r.t.
the threshold) for at least 3 consecutive polling cycles.
4. Generate an SSC interrupt, if the voltage level at an input crossed its threshold and the status is stable (w.r.t.
the threshold) for at least 4 consecutive polling cycles.
The default value of switch status is stored internally after the 1st detection cycle, even if detection filter (by
configure the DET_FILTER in the CONFIG register) is used. An example is illustrated below with the assumption
that DET_FILTER in register CONFIG is set to 11 (SSC interrupt is generated if the input crosses the threshold
and the status is stable w.r.t. the threshold for at least 4 consecutive detection cycles). Assume switch status
change is detected in the 3rd detection cycle and stays the same for the next 3 cycles.
DETECTION CYCLE
1
2
3
4
5
6
•
•
•
Default Switch status stored
INT asserted
•
•
INT asserted
SSC flagged
Switch status change
detected
Event
—
—
—
SSC flagged
The detection filter applies to all enabled inputs regardless of their input modes (ADC or comparator) selection.
The detection filter counter is reset to 0 when the TRIGGER bit in the CONFIG register is de-asserted to logic 0.
Upon device reset, the default setting for the detection filter is set to generating an SSC interrupt at every
threshold crossing.
Note: the detection filter does not apply to the common threshold THRES_COM.
8.3.10 Temperature Monitor
When multiple switch inputs are closed and high wetting current setting is enabled, considerable power can be
dissipated by the device and raise the device temperature. TIC12400-Q1 has integrated temperature monitoring
and protection circuitry to put the device in low power mode to prevent damage due to overheating. Two types of
temperature protection mechanisms are integrated in the device: Temperature Warning (TW) and Temperature
Shutdown (TSD). The triggering temperatures and hysteresis are specified in 表8-4 below:
表8-4. Temperature Monitoring Characteristics of TIC12400-Q1
PARAMETER
MIN
130
150
TYP
140
160
15
MAX
155
UNIT
°C
Temperature warning trigger temperature (TTW
)
Temperature shutdown trigger temperature (TTSD
)
175
°C
Temperature hysteresis (THYS) for TTW and TTSD
°C
8.3.10.1 Temperature Warning (TW)
When the device temperature goes above the temperature warning trigger temperature (TTW), the TIC12400-Q1
performs the following operations:
1. Generate an interrupt by asserting the INT pin low and flag the TW bit in INT_STAT register to logic 1. The
TEMP bit in the SPI flag is also flagged to logic 1 for all SPI transactions.
2. The TW_STAT bit of the IN_STAT_MISC register is flagged to logic 1.
3. If the TW_CUR_DIS_CSO or TW_CUR_DIS_CSO bit in CONFIG register is set to logic 0 (default), the
wetting current is adjusted down to 2 mA for 10 mA or 15 mA settings. The wetting current stays at its pre-
configured value if 0 mA, 1 mA, 2 mA, or 5 mA setting is used.
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4. Maintain the low wetting current as long as the device junction temperature stays above TTW - THYS
.
The INT pin is released and the INT_STAT register content is cleared on the rising edge of CS provided the
INT_STAT register has been read during CS low. The TIC12400-Q1 continues to monitor the temperature, but
does not issue further interrupts if the temperature continues to stay above TTW- THYS. The status bit TW_STAT
in register IN_STAT_MISC continues to stay at logic 1 as long as the temperature warning condition exists.
If desired, the reduction of wetting current down to 2 mA setting (from 10 mA or 15 mA) can be disabled by
setting the TW_CUR_DIS_CSO or TW_CUR_DIS_CSI bit in the CONFIG register to 1. The interrupt is still
generated ( INT asserted low and INT_STAT interrupt register is updated) when the temperature warning event
occurs but the wetting current is not reduced. This setting applies to both the polling and continuous mode
operation. Note: if the feature is enabled, switch detection result might be impacted upon TTW event if the wetting
current is reduced to 2 mA from 10 mA or 15 mA.
When the temperature drops below TTW- THYS, the INT pin is asserted low (if released previously) to notify the
microcontroller that the temperature warning condition no longer exists. The TW bit of the interrupt register
INT_STAT is flagged logic 1. The TW_STAT bit in the IN_STAT_MISC register is de-asserted back to logic 0. The
device resumes operation using the current programmed settings (regardless of the INT and CS status).
8.3.10.2 Temperature Shutdown (TSD)
After the device enters TW condition, if the junction temperature continues to rise and goes above the
temperature shutdown threshold (TTSD), the TIC12400-Q1 enters the Temperature Shutdown (TSD) condition
and performs the following operations:
1. Opens all the switches connected to the current sources and sinks to prevent any further heating due to
excessive current flow.
2. Generate an interrupt by asserting the INT pin (if not already asserted) low and flag the TSD bit in the
INT_STAT register to logic 1. The TEMP bit in the SPI flag is also flagged to logic 1 for all SPI transactions.
3. The TSD_STAT bit of the IN_STAT_MISC register is flagged to logic 1. The TW_STAT bit also stays at logic
1.
4. SPI communication stays on and all register settings stay intact without resetting. Previous switch status, if
needed, can be retrieved without any interruption.
5. Maintain the setting as long as the junction temperature stays above TTSD- THYS
.
The INT pin is released and the INT_STAT register content is cleared on the rising edge of CS provided the
INT_STAT register has been read during CS low. The TIC12400-Q1 continues to monitor the temperature, but
does not issue further interrupts if the temperature continues to stay above TTSD - THYS. The status bit
TSD_STAT in register IN_STAT_MISC continues to stay at logic 1 as long as the temperature shutdown
condition exists.
When the temperature drops below TTSD - THYS, the INT pin is asserted low (if released previously) to notify the
microcontroller that the temperature shutdown condition no longer exists. The TSD bit of the interrupt register
INT_STAT is flagged logic 1. In the IN_STAT_MISC register, the TSD_STAT bit is de-asserted back to logic 0,
while the TW_STAT bit stays at logic 1. The device resumes operation using the wetting current setting
described in section Temperature Warning if the temperature stays above TTW - THYS. Note: the polling restarts
from the first enabled channel and the SSC interrupt is generated at the end of the first polling cycle. The
detected switch status from the first polling cycle becomes the default switch status for subsequent polling.
8.3.11 Parity Check and Parity Generation
The TIC12400-Q1 uses parity bit check to ensure error-free data transmission from and to the SPI controller.
The device uses odd parity, for which the parity bit is set so that the total number of ones in the transmitted data
on SO (including the parity bit) is an odd number (that is Bit0 ⊕Bit1 ⊕–⊕Bit30 ⊕Bit31⊕Parity = 1).
The device also uses odd parity check after receiving data on SI from the SPI controller. If the total number of
ones in the received data (including the parity bit) is an even number the received data is discarded. The INT will
be asserted low and the PRTY_FAIL bit in the interrupt register (INT_STAT) is flagged to logic 1 to notify the host
that transmission error occurred. The PRTY_FAIL flag is also asserted during SPI communications.
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8.3.12 Cyclic Redundancy Check (CRC)
The TIC12400-Q1 includes a CRC module to support redundancy checks on the configuration registers to
ensure the integrity of data. The CRC calculation is based on the ITU-T X.25 implementation, and the CRC
polynomial (0x1021) used is popularly known as CRC-CCITT-16 since it was initially proposed by the ITU-T
(formerly CCITT) committee. The CRC calculation rule is defined in 表8-5:
表8-5. CRC Calculation Rule
CRC RULE
CRC result width
Polynomial
VALUE
16 bits
x16 + x12 + x5 +1 (1021h)
Initial (seed) value
Input data reflected
Result data reflected
XOR value
FFFFh
No
No
0000h
The CRC calculation is done on all the configuration registers starting from register CONFIG and ending at
register MODE. The device substitutes a zero for each reserved configuration register bit during the CRC
calculation. The CRC calculation can be triggered by asserting the CRC_T bit in the CONFIG register. Once
completed, the CRC_CALC interrupt bit in the INT_STAT register is asserted and an interrupt is issued. The 16-
bit CRC calculation result is stored in the register CRC. This interrupt can be disabled by de-asserting the
CRC_CALC_EN bit in the INT_EN_CFG0 register. It is important to avoid writing data to the configuration
registers when the device is undergoing CRC calculations to prevent false calculation results.
图 8-10 shows the block diagram of the CRC module. The module consists of 16 shift-registers and 3 exclusive-
OR gates. The registers start with 1111-1111-1111-1111 (or FFFFh) and the module performs an XOR function
and shifts its content until the last bit of the register string is used. The final register’s content after the last data
bit is the calculated CRC value of the data set and the content is stored in the CRC register.
Note the CRC_T bit self-clears after the CRC calculation is completed. Logic 1 is used for CRC_T bit during
CRC calculation.
X15 X14 X13 X12
X11 X10
X9
X8
X7
X6
X5
X4
X3
X2
X1
X0
+
+
+
XOR
XOR
XOR
Data
MSB
LSB
图8-10. CCITT-16 CRC Module Block Diagram
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8.4 Device Functional Modes
The TIC12400-Q1 has 2 modes of operation: continuous mode and polling mode. The following sections
describe the two operation modes in details as well as some of the advanced features that could be activated
during normal operations.
8.4.1 Continuous Mode
In continuous mode, wetting current is continuously applied to each enabled input channel, and the status of
each channel is sampled sequentially (starting from the IN0 to IN23). The TIC12400-Q1 monitors enabled inputs
and issues an interrupt (if enabled) if a switch status change event is detected. The wetting current setting for
each input can be individually adjusted by configuring the WC_CFG0 and WC_CFG1 to the 0 mA, 1 mA, 2 mA, 5
mA, 10 mA, or 15 mA setting. Each input is monitored by either a comparator or an ADC depending on the
setting of the input mode in the register MODE.
图 8-11 below illustrates an example of the timing diagram of the detection sequence in continuous mode. After
the TRIGGER bit in register CONFIG is set to logic 1, it takes tSTARTUP to activate the wetting current for all
enabled inputs. The wetting currents stay on continuously, while each input is routed to the ADC and comparator
for sampling in a sequential fashion. After conversion and comparison is done for an input, the switch status
(below or above detection threshold) is stored in registers (IN_STAT_COMP for comparator inputs and
IN_STAT_ADC0 to IN_STAT_ADC1 for ADC inputs) to be used as the default state for subsequent detection
cycles. The digital values (if the input is configured as ADC input mode) are stored in the registers ANA_STAT0
to ANA_STAT11. After the end of the first polling cycle, the INT pin is asserted low to notify the microcontroller
that the default switch status is ready to be read. The SSC bit in INT_STAT register and the SPI status flag SSC
are also asserted to logic 1. The polling cycle time (tPOLL) determines how frequently each input is sampled and
can be configured in the register CONFIG.
Input sampling restarts
from first enabled input
after tPOLL_TIME
Wetting
current
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
t
ttSTARTUP
t
IN0
IN1
IN3
ttADC or tCOMP
t
ttADC or tCOMP
t
IN23
/INT
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
Time
图8-11. An Example of the Detection Sequence in Continuous Mode
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The INT_STAT register is cleared and INT pin de-asserted if a SPI READ command is issued to the register.
Note: the interrupt is always generated after the 1st detection cycle (after the TRIGGER bit in register CONFIG is
set to logic 1). In subsequent detection cycles, the interrupt is generated only if switch status change is detected.
No wetting currents are applied to 0 mA- configured inputs, although some biasing current (as specified by
IIN_LEAK_0mA) may still flow in and out of the input. Threshold crossing monitoring is still performed for the input
using one or more of the defined thresholds. The 0 mA setting is useful for the integrated ADC or comparator to
measure applied voltage on a specific input without being affected by the device wetting current.
8.4.2 Polling Mode
The polling mode can be activated to reduce current drawn in ignition-off condition to conserve battery charge.
Unlike the continuous mode, the current sources and sinks do not stay on continuously in the polling mode.
Instead, they are turned on or off sequentially from IN0 to IN23 and cycled through each individual input channel.
The microcontroller can be put to sleep to reduce overall system power. If a switch status change (SSC) is
detected by the TIC12400-Q1, the INT pin (if enabled for the input channel) is asserted low (and the SSC bit in
INT_STAT register and the SPI status flag SSC are also asserted to logic 1). The INT pin assertion can be used
to wake up the system regulator which, in turn, wakes up the microcontroller as described in section
Microcontroller Wake-Up. The microcontroller can then use SPI communication to read the switch status
information.
The polling is activated when the TRIGGER bit in the CONFIG register is set to logic 1. There are 2 different
polling schemes that can be configured in TIC12400-Q1: standard polling and matrix polling.
8.4.2.1 Standard Polling
In standard polling mode, wetting current is applied to each input for a pre-programmed polling active time
between 64 μs and 2048 μs, set by the POLL_ACT_TIME bits in the CONFIG register. At the end of the
wetting current application, the input voltage is sampled by the comparator (if input is configured as comparator
input mode) or the ADC (if input is configured as ADC input mode). Each input is cycled through in sequential
order from IN0 to IN23. Sampling is repeated at a frequency from 2 ms to 4096 ms, set by the POLL_TIME bits
in the CONFIG register. Wetting currents are applied to closed switches only during the polling active time;
hence, the overall system current consumption can be greatly reduced.
Similar to continuous mode, after the first polling cycle, the switch status of each input (below or above detection
threshold) is stored in registers (IN_STAT_COMP for comparator inputs and IN_STAT_ADC0 to IN_STAT_ADC1
for ADC inputs) to be used as the default state for subsequent polling cycles. The digital values (if the input is
configured as ADC input mode) are stored in the registers ANA_STAT0 to ANA_STAT11. The INT pin is asserted
low to notify the microcontroller that the default switch status is ready to be read. The SSC bit in INT_STAT
register and the SPI status flag SSC are also asserted to logic 1. The INT_STAT register is cleared and INT pin
de-asserted if a SPI READ command is issued to the register. Note the interrupt is always generated after the
1st polling cycle (after the TRIGGER bit in register CONFIG is set to logic 1). In subsequent polling cycles the
interrupt is generated only if switch status change is detected.
An example of the timing diagram of the polling mode operation is shown in 图8-12.
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Wetting current is
activated for
tPOLL_ACT_TIME
Wetting
current
Input sampling restarts
from first enabled input
after tPOLL_TIME
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_ACT_TIMEt
ttPOLL_TIME
t
ttSTARTUP
t
ttPOLL_ACT_TIMEt
ttSTARTUP
t
IN0
IN1
IN3
ttADC or tCOMP
t
ttADC or tCOMP
t
IN23
/INT
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
ttADC or tCOMP
t
Time
图8-12. An Example of the Polling Sequence in Standard Polling Mode
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If the switch position changes between two active polling times, no interrupt will be generated and the status
registers (IN_STAT_COMP for comparator inputs and IN_STAT_ADC0 to IN_STAT_ADC1 for ADC inputs) will
not reflect such a change. An example is shown in 图8-13.
Wetting
current
Switch
state
Ignored
Initial switch
switch state
state change
change
/INT
/INT asserted
due to initial
state change
/CS
Time
图8-13. Example for Ignored Switch Position Change Between 2 Wetting Current Cycles
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8.4.2.2 Matrix polling
TIC12400-Q1
VS
1mA to 15mA
or
OFF
IN10
34
ESD
Protection
IN11
35
IN12
36
VS
IN13
1
IN14
2
1mA to 15mA
or
OFF
IN15
3
6 x 6 matrix
ESD
Protection
5 x 5 matrix
4 x 4 matrix
SW
SW
SW
SW
SW
IN4
27
ESD
SW
SW
SW
SW
SW
1mA to 15mA
Protection
or
OFF
IN5
29
AGND
SW
SW
SW
SW
SW
IN6
30
SW
SW
SW
SW
SW
IN7
31
SW
SW
SW
SW
SW
IN8
32
SW
SW
SW
SW
SW
IN9
33
ESD
1mA to 15mA
Protection
or
OFF
AGND
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图8-14. TIC12400-Q1 Matrix Configuration
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From IN4 to IN15 a special input switch matrix (see 图 8-14) can be configured and monitored in addition to the
standard switches to GND and VBAT. This feature could be useful to monitor a special switch input configuration
called Matrix Inputs as required by some specific OEMs.
Three different matrix configurations are possible, and are defined by MATRIX bits in the MATRIX register. If the
MATRIX bits are set to ‘00’ all inputs are treated as standard inputs with identical polling active time
according to the POLL_ACT_TIME bits in the CONFIG register. Any settings other than ‘00’ for MATRIX bits
causes the polling active time for the matrix inputs to be configured according to POLL_ACT_TIME_M bits in the
MATRIX register. Inputs that are not part of the matrix configuration will be configured using the
POLL_ACT_TIME bits in the CONFIG register. tPOLL_ACT_TIME_M should be configured properly to allow sufficient
time for the current source and sink to charge or discharge the capacitors (if any) connected to the switch inputs.
表8-6. TIC12400-Q1 Matrix Configuration Settings
4 x 4 MATRIX
5 x 5 MATRIX
6 x 6 MATRIX
Input
Current Source Or Polling Active Time
Current Source Or
Polling Active Time
Setting
Current Source Or
Polling Active Time
Setting
Sink
CSI
CSI
CSI
CSI
Setting
Sink
CSI
CSI
CSI
CSI
Sink
CSI
CSI
CSI
CSI
IN4
IN5
IN6
IN7
POLL_ACT_TIME_
M
POLL_ACT_TIME_M
POLL_ACT_TIME
Configurable to
CSO or CSI
IN8
IN9
CSI
CSI
CSI
POLL_ACT_TIME
Configurable to
CSO or CSI
Configurable to CSO
or CSI
POLL_ACT_TIME_M
IN10
IN11
IN12
IN13
IN14
IN15
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
CSO
POLL_ACT_TIME_
M
POLL_ACT_TIME_M
POLL_ACT_TIME
POLL_ACT_TIME
The TIC12400-Q1 implements a different polling scheme when matrix input is configured. After the polling
sequence is started (by setting TRIGGER bit in CONFIG register to logic 1), the polling takes place within the
matrix input group first before the rest of the standard inputs are polled. After the matrix inputs are polled, the
switch status of each input combination (below or above detection threshold) is stored internally in registers
IN_STAT_MATRIX0 and IN_STAT_MATRIX1, and it is used as the default state for subsequent matrix polling
cycles. The standard inputs follow the same polling behavior as described in section Standard Polling. After the
polling cycle is completed on matrix and standard inputs, the INT pin is asserted low to notify the microcontroller
that the default switch status is ready to be read. The SSC bit in the INT_STAT register and the SPI status flag
SSC are also asserted to logic 1.
The INT_STAT register is cleared and INT pin de-asserted if a SPI READ command is issued to the register.
Note: the interrupt is always generated after the 1st complete polling cycle (after the TRIGGER bit in register
CONFIG is set to logic 1). In subsequent polling cycles, the interrupt is generated only if switch status change is
detected.
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Note the following programming requirement when using the matrix polling:
• It is critical to program the CSO/CSI configuration for each matrix input appropriately according to 表8-6 to
avoid incorrect switch status detection.
• It is mandatory to set higher wetting current for the sinks (IN4-IN9) than the sources (IN10-IN15). The actual
current flowing through the external switches will be the lesser of the two settings. If the same setting is used
for both the sink and the source, the detected result might be incorrect. Because of this, the 15 mA setting
shall not be used for the current sources and the 1 mA setting shall not be used for the current sinks.
Depending on the type of matrix switches, the TIC12400-Q1 might require some specific wetting current
settings to be able to distinguish between switch open or closed states.
• If TW_CUR_DIS_CSO or TW_CUR_DIS_CSI is set to logic 0 in the CONFIG register, wetting current is
reduced to 2 mA for 10 mA and 15 mA settings upon TW event. Since it’s mandatory to have higher wetting
current for the sinks (IN4-IN9) than the sources (IN10-IN15) during matrix polling, 表8-7 below summarizes
the only possible settings if TW event is expected:
表8-7. Possible Wetting Current Settings for the Matrix Polling Mode if TW_CUR_DIS=0 and TW Event is
Expected
CSO (IN10-IN15)
1 mA
CSI (IN4-IN9)
2 mA, 5 mA, 10 mA, and 15 mA
5 mA
RESULTING WETTING CURRENT
1 mA
2 mA
2 mA
If higher wetting current is needed and TW event might be expected, the TW wetting current reduction feature
needs to be disabled by setting TW_CUR_DIS_CSO or TW_CUR_DIS_CSI bit in the CONFIG register to 1.
• Only comparator input mode is supported for the matrix polling. Do not program the matrix inputs into ADC
input mode. The comparison takes place on the source side (IN10-IN15) since the sink side is pulled to
ground. Interrupt generation condition can be set by configuring the INT_EN_COMP1 and INT_EN_COMP2
registers for inputs IN10 to IN15.
Some programmability is removed when matrix polling mode is used, as listed below:
• To keep the polling scheme simple, the ability to disable inputs is removed for the matrix inputs. Only 3
configurations (4×4, 5×5, and 6×6) can be used for the matrix polling. Standard inputs outside the matrix
input group can still be disabled, if desired.
• Detection filter (by configuring the DET_FILTER in the CONFIG register) does not apply to the matrix inputs,
but still applies to the standard inputs outside the matrix input group.
• When matrix polling is selected, continuous mode is not available to the standard inputs outside the matrix
input group.
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图8-15 illustrates an example of the polling sequence for the 6×6 matrix input configuration:
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
t
Wetting
current
tPOLL_ACT_TIME_M
tSTARTUP
tSTARTUP
IN10
IN11
IN12
IN13
IN14
IN15
IN4 to IN5 to IN6 to IN7 to IN8 to IN9 to
GND
GND
GND
GND
GND
GND
IN0
IN1
ttPOLL_ACT_TIME
t
ttADC or tCOMP
t
IN2
IN3
IN16
IN17
IN23
/INT
/CS
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
Read on INT_STAT register
release the /INT pin
Time
图8-15. Polling Scheme for 6×6 Matrix Inputs
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图 8-16 illustrates an example of the polling sequence for the 5×5 matrix input configuration. Note: the input IN9
and IN15 are included in the standard polling sequence.
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
t
Wetting
current
tPOLL_ACT_TIME_M
tSTARTUP
tSTARTUP
IN10
IN11
IN12
IN13
IN14
IN0
IN4 to IN5 to IN6 to IN7 to IN8 to
GND GND GND GND GND
ttPOLL_ACT_TIME
t
IN1
ttADC or tCOMP
t
IN2
IN3
IN9
IN15
IN23
/INT
/CS
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
Read on INT_STAT register
release the /INT pin
Time
图8-16. Polling Scheme for 5×5 Matrix Inputs
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图 8-17 illustrates an example of the polling sequence for the 4×4 matrix input configuration. Note: inputs IN8,
IN9, IN14, and IN15 are included in the standard polling sequence.
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
t
Wetting
current
tPOLL_ACT_TIME_M
tSTARTUP
tSTARTUP
IN10
IN11
IN12
IN13
IN4 to IN5 to IN6 to IN7 to
GND GND GND GND
IN0
IN1
IN2
IN3
IN8
IN9
IN14
ttPOLL_ACT_TIME
t
ttADC or tCOMP
t
IN23
/INT
/CS
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
Read on INT_STAT register
release the /INT pin
Time
图8-17. Polling Scheme for 4×4 Matrix Inputs
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8.4.3 Additional Features
There are additional features that can be enabled during continuous and polling mode to increase robustness of
device operation or provide more system information. These features are described in detail in the following
sections.
8.4.3.1 Clean Current Polling (CCP)
To detect resistor coded switches or reduce overall power consumption of the chip, a lower wetting current
setting is recommended. However, certain system design requires 10 mA or higher cleaning current to clear
oxide build-up on the mechanical switch contact surface when the current is applied to closed switches. A
special type of polling, called the Clean Current Polling (CCP), can be used for this application.
If CCP is enabled each polling cycle consists of two wetting current activation steps. The first step uses the
wetting current setting configured in the WC_CFG0 and WC_CFG1 registers as in the continuous mode or
polling mode. The second step (cleaning cycle) is activated simultaneously for all CCP enabled inputs at a time
tCCP_TRAN after the normal polling step of the last enabled input. Interrupt generation and INT pin assertion is not
impacted by the clean current pulses.
The wetting current and its active time for the cleaning cycle can be configured in the CCP_CFG0 register. The
cleaning cycle can be disabled, if desired, for each individual input by programming the CCP_CFG1 register.
CCP is available for both continuous mode and polling mode. To use the CCP feature, at least one input
(standard or matrix) or the 节8.4.3.3 has to be enabled.
Note: that although CCP can be enabled in Matrix polling mode, it is not an effective way to clean the matrix
switch contact, since the current supplied from the TIC12400-Q1 is divided and distributed across multiple matrix
channels.
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图8-18 illustrates the operation of the CCP when the device is configured to the standard polling mode.
Wetting
current
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
t
tSTARTUP
IN0
tSTARTUP
IN1
IN2
ttADC or tCOMP
t
ttCCP_TIME
t
IN22
IN23
ttCCP_TRAN
t
/INT
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
/CS
Read on INT_STAT register
release the /INT pin
Time
图8-18. Standard Polling With CCP Enabled
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图8-19 illustrates the operation of the CCP when the device is configured to the continuous mode:
Wetting
current
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
t
tSTARTUP
IN0
tSTARTUP
IN1
IN2
ttADC or tCOMP
t
ttCCP_TIME
t
IN22
IN23
/INT
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
/CS
Read on INT_STAT register
release the /INT pin
Time
图8-19. Continue Mode With CCP Enabled
8.4.3.2 Wetting Current Auto-Scaling
The 10 mA and 15 mA wetting current settings are useful to clean oxide build-up on the mechanical switch
contact surface when the switch changes state from open to close. After the switch is closed, it is undesirable to
keep the wetting current level at high level if only digital switches are monitored since it results in high current
consumption and could potentially heat up the device quickly if multiple inputs are monitored. The wetting current
auto-scaling feature helps mitigate this issue.
When enabled (AUTO_SCALE_DIS_CSO or AUTO_SCALE_DIS_CSI bit = logic 0 in the WC_CFG1 register),
wetting current is reduced to 2 mA from 10 mA or 15 mA setting after switch closure is detected. The threshold
used to determine a switch closure is the threshold configured in the THRES_COMP register for inputs
configured as comparator input mode. For inputs configured as ADC input mode, the threshold used to
determine a switch closure depends on the input number, as described in 表8-8 below.
表8-8. Threshold Used to Determine a Switch Closure for Wetting Current Auto-scaling for ADC Inputs
INPUT
IN0-IN11
IN12 to IN17
IN18 to IN22
IN23
THRESHOLD USED TO DETERMINE A SWITCH CLOSURE
Mapped threshold from THRES0 to THRES7
THRES2B
THRES3C
THRES9
The current reduction takes place N cycles after switch closure is detected on an input, where N depends on the
setting of the DET_FILTER bits in the CONFIG register:
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• DET_FILTER= 00: wetting current is reduced immediately in the next detection cycle after a closed switch is
detected.
• DET_FILTER= 01: wetting current is reduced when a closed switch is detected and the switch status is stable
for at least 2 consecutive detection cycles.
• DET_FILTER= 10: wetting current is reduced when a closed switch is detected and the switch status is stable
for at least 3 consecutive detection cycles.
• DET_FILTER= 11: wetting current is reduced when a closed switch is detected and the switch status is stable
for at least 4 consecutive detection cycles.
The wetting current is adjusted back to the original setting of 10 mA or 15 mA at a time of N cycles after an open
switch is detected, where N again depends on the DET_FILTER bit setting in the CONFIG register. 图 8-20
depicts the behavior of the wetting current auto-scaling feature.
Switch open
Switch closed
Auto-scaling
disabled
15mA
15mA
0mA
0mA
Auto-scaling
enabled
2mA
图8-20. Wetting Current Auto-scaling Behavior
The wetting current auto-scaling only applies to 10 mA and 15 mA settings and is only available in continuous
mode. If AUTO_SCALE_DIS_CSO or AUTO_SCALE_DIS_CSI bit is set to logic 1 in the WC_CFG1 registers,
the wetting current stays at its original setting when a closed switch is detected. Power dissipation needs to be
closely monitored when wetting current auto-scaling is disabled for multiple inputs as the device could heat up
quickly when high wetting current settings are used. If the auto-scaling feature is disabled in continuous mode,
the total power dissipation can be approximated using 方程式1.
P
=VS ì
IS _CONT + IWETT (TOTAL)
TOTAL
(1)
where IWETT (TOTAL) is the sum of all wetting currents from all input channels. Increase in device junction
temperature can be calculated based on P × RθJA. The junction temperature must be below TTSD for proper
device operation. An interrupt will be issued when the junction temperature exceeds TTW or TTSD. For detailed
description of the temperature monitoring, please refer to sections Temperature Warning (TW) and Temperature
Shutdown (TSD).
8.4.3.3 VS Measurement
When the TIC12400-Q1 is used to monitor resistor-coded switches, the VS supply voltage level becomes critical.
If VS is not sufficiently high, the device might not have enough headroom to produce accurate wetting currents.
This could impact the accuracy of the switch status monitoring. It is imperative for the microcontroller to have
knowledge of the VS voltage on a constant basis in such a case.
Measurement of VS voltage is a feature in TIC12400-Q1 that can be enabled by setting the VS_MEAS_EN bit in
register CONFIG to logic 1. If enabled, at the end of every detection and polling cycle, the voltage on the VS pin
is sampled and converted by the ADC to a digital value. The conversion takes one extra tADC, and the converted
value is recorded in the ANA_STAT12 register.
The VS measurement supports two different VS voltage ranges that can be configured by the VS_RATIO bit in
the CONFIG register. By default (VS_RATIO= logic 0), the supported VS voltage range is from 4.5 V to 9 V, and
VS voltage in excess of 9 V results in a saturated ADC raw code of 1023. This setting provides better
measurement resolution at lower VS voltages. When VS_RATIO bit is set to logic 1, the supported VS voltage
range is widened to 4.5 V to 30 V, and VS voltage in excess of 30 V results in a saturated ADC raw code of
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1023. This setting allows wider measurement range but more coarse measurement resolution. It is important to
adjust the detection thresholds accordingly depending on the VS voltage range configured.
Four different measurement thresholds can be programmed by the TIC12400-Q1: VS0_THRES2A/B and
VS1_THRES2A/B. The value of these thresholds can be programmed by configuring registers THRES_CFG0 to
THRES_CFG3 and the mapping can be programmed by configuring registers THRESMAP_VS0_THRES2A/B
and THRESMAP_VS1_THRES2A/B bits in the register THRESMAP_CFG2. When setting the thresholds follow
the rules in 表8-9 below.
表8-9. Proper Threshold Configuration for VS Measurements
VS THRESHOLD
PROPER THRESHOLD CONFIGURATION
VS0_THRES2B ≥VS0_THRES2A
VS1_THRES2B ≥VS1_THRES2A
VS0
VS1
After the VS measurement is enabled for the first time, the VS measurement interrupt is always generated ( INT
pin is asserted low, and the VS0 or VS1 bit in the INT_STAT register is flagged to logic 1) at the end of the first
polling cycle to notify the microcontroller the initial VS measurement result is ready to be retrieved. The
VS0_STAT and VS1_STAT bits from register IN_STAT_MISC indicate the status of the VS voltage with respect to
the thresholds, and the ANA_STAT12 register stores the converted digital value of the VS voltage. The SPI
status flag VS_TH is also asserted to logic 1 during SPI communications. Note the status detected in the first
polling cycle becomes the baseline value of comparison for subsequent VS measurements and the interrupt will
be generated only if threshold crossing is detected.
Similar to regular inputs, the interrupt generation conditions can be programmed by setting the VS_TH0_EN and
VS_TH1_EN bits in the INT_EN_CFG4 register to the following settings:
1. Rising edge: an interrupt is generated if the current VS measurement is above the corresponding threshold
and the previous measurement was below.
2. Falling edge: an interrupt is generated if the current VS measurement is below the corresponding threshold
and the previous measurement was above.
3. Both edges: changes of the VS measurement status in either direction results in an interrupt generation.
Interrupt generation can also be disabled by setting VS_TH0_EN or VS_TH1_EN to logic 0 in register
INT_EN_CFG4. Once disabled, VS voltage crossing does not flag the VS0 or VS1 bit in INT_STAT register and
does not assert INT pin low. To only mask the INT pin from assertion (while keeping INT_STAT register
updated), configure the VS1_EN and VS0_EN bits in register INT_EN_CFG0 to logic 0.
Note the VS measurement is only intended to be used as part of switch detection sequence to determine the
validity of the switch detection states that are reported by the TIC12400-Q1. It is not intended to be used for
standalone supply monitoring, such as monitoring cranking voltages, due to the potentially delayed response
being part of the polling sequence. The VS measurement result is accurate for VS above 4.5 V.
By default, the VS voltage measurement is disabled upon device reset.
8.4.3.4 Wetting Current Diagnostic
When the TIC12400-Q1 is used to monitor safety-critical switches, it may be valuable for the microcontroller to
have knowledge of the operating status of the wetting current sources and sinks. This can be achieved by
activating the wetting current diagnostic feature provided for inputs IN0 to IN3. IN0 and IN1 can be diagnosed for
defective wetting current sources, while IN2 and IN3 can be diagnosed for defective current sinks.
The wetting current diagnostic feature can be activated by setting the WET_D_INx_EN bits in the CONFIG
register to 1 for the desired inputs, where x can be 0, 1, 2, or 3. If activated, the TIC12400-Q1 checks the status
of the wetting current sources and sinks for the configured input periodically as part of the polling sequence. If
the wetting current is determined to be flawed, the TIC12400-Q1 pulls the INT pin low to notify the host and flag
the WET_DIAG bit in the INT_STAT register to logic 1. The OI bit in the SPI flag is also asserted during SPI
transactions. The microcontroller can then read bits IN0_D to IN3_D in register IN_STAT_MISC to learn more
information on which wetting current source/sink is defective.
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The wetting current diagnostic is not performed for inputs that are disabled (IN_EN_x bit = 0 in the IN_EN
register) from polling, even if the feature is activated for those inputs. Also, it is critical to configure the current
source/sink appropriately (CSO for IN0 and IN1, and CSI for IN2 and IN3) and program the input to ADC input
mode before activating the wetting current diagnostic feature to prevent false interrupts from being generated.
The wetting current diagnostic feature can be performed regardless of the states of external switches, and it is
available in both continuous mode and polling mode.
图 8-21 shows an example of the feature carried out in a typical polling sequence. In this example, it can be
observed that the wetting current is activated for duration of tPOLL_ACT+ tADC for each input diagnosed (IN0 or
IN2). Normal polling sequence resumes with IN4 and the wetting current is activated for tPOLL_ACT for the rest of
the inputs. The diagnostic is not executed on inputs IN1 and IN3 in this example since they are disabled.
Wetting current is activated for
Input sampling restarts
tPOLL_ACT_TIME+ tADC (or tCOMP) for
channels with WCD enabled
Wetting
current
from first enabled input
after tPOLL_TIME
TRIGGER bit set
to logic 1 in
CONFIG register
ttPOLL_TIME
ttADC or tCOMP
t
ttSTARTUP
t
ttPOLL_ACT_TIME
t
t
ttSTARTUP
t
IN0
IN2
IN4
ttADC or tCOMP
t
ttADC or tCOMP
t
IN23
/INT
ñ Default input status is stored
ñ /INT pin is asserted after the
1st detection cycle
ttADC or tCOMP
t
Time
图8-21. An Example of the Polling Sequence in Standard Polling Mode With Wetting Current Diagnostic
Enabled
8.4.3.5 ADC Self-Diagnostic
In addition to the wetting current diagnostic, another feature– the ADC self-diagnostic, can be enabled to
monitor the integrity of the internal ADC.
The ADC self-diagnostic feature is activated by setting the ADC_DIAG_T bit in the CONFIG register to logic 1.
Once enabled, the TIC12400-Q1 periodically sends a test voltage to the ADC. The conversion result is stored in
the ADC_SELF_ANA bits in the register ANA_STAT12 and is compared with a pre-defined code to determine
whether the conversion is performed properly. If an error is detected, the TIC12400-Q1 pulls the INT pin low to
notify the host and flag the ADC_DIAG bit in the INT_STAT to logic 1. The bit ADC_D in register IN_STAT_MISC
is updated with the result from the self-diagnostic. The ADC self-diagnostic feature is available in both
continuous mode and polling mode.
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8.5 Programming
The SPI interface communication consists of the 4 pins: CS, SCLK, SI, and SO. The interface can work with
SCLK frequency up to 4 MHz.
8.5.1 SPI Communication Interface Buses
8.5.1.1 Chip Select ( CS)
The system microcontroller selects the TIC12400-Q1 to receive communication using the CS pin. With the CS
pin in a logic LOW state, command words may be sent to the TIC12400-Q1 through the serial input (SI) pin, and
the device information can be retrieved by the microcontroller via the serial output (SO) pin. The falling edge of
the CS enables the SO output and latches the content of the interrupt register INT_STAT. The microcontroller
may issue a READ command to retrieve information stored in the registers. Rising edge on the CS pin initiates
the following operations:
1. Disable the output driver and makes SO high-impedance.
2. INT pin is reset to logic HIGH if a READ command to the INT_STAT register was issued during CS = LOW.
To avoid corrupted data, it is essential the HIGH-to-LOW and LOW-to-HIGH transitions of the CS signal occur
only when SCLK is in a logic LOW state. A clean CS signal is needed to ensure no incomplete SPI words are
sent to the device. The CS pin should be externally pulled up to VDD by a 10 kΩresistor.
8.5.1.2 System Clock (SCLK)
The system clock (SCLK) input is used to clock the internal shift register of the TIC12400-Q1. The SI data is
latched into the input shift register on the falling edge of the SCLK signal. The SO pin shifts the device stored
information out on the rising edge of SCLK. The SO data is available for the microcontroller to read on the falling
edge of SCLK.
False clocking of the shift register must be avoided to ensure validity of data and it is essential the SCLK pin be
in a logic LOW state whenever CS makes any transition. Therefore, it is recommended that the SCLK pin gets
pulled to a logic LOW state as long as the device is not accessed and CS is in a logic HIGH state. When the CS
is in a logic HIGH state, any signal on the SCLK and SI pins will be ignored and the SO pin remains as a high
impedance output. Refer to 图8-22 and 图8-23 for examples of typical SPI read and write sequence.
8.5.1.3 Slave In (SI)
The SI pin is used for serial instruction data input. SI information is latched into the input register on the falling
edge of the SCLK. To program a complete word, 32 bits of information must be entered into the device. The SPI
logic counts the number of bits clocked into the IC and enables data latching only if exactly 32 bits have been
clocked in. In case the word length exceeds or does not meet the required length, the SPI_FAIL bit of the
INT_STAT register is asserted to logic 1 and the INT pin will be asserted low. The data received is considered
invalid. Note the SPI_FAIL bit is not flagged if SCLK is not present.
8.5.1.4 Slave Out (SO)
The SO pin is the output from the internal shift register. The SO pin remains high-impedance until the CS pin
transitions to a logic LOW state. The negative transition of CS enables the SO output driver and drives the SO
output to the HIGH state (by default). The first positive transition of SCLK makes the status data bit 31 available
on the SO pin. Each successive positive clock makes the next status data bit available for the microcontroller to
read on the falling edge of SCLK. The SI/SO shifting of the data follows a first-in, first-out scheme, with both
input and output words transferring the most significant bit (MSB) first.
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8.5.2 SPI Sequence
图8-22 and 图8-23 depict the SPI communication sequence during read and write operations for the TIC12400-
Q1.
Bit 31
(MSB)
Bit 0
(LSB)
...
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22
Bit 1
Read/
Write
SI
Register address
Data in
PAR
0
Bit 31
(MSB)
Bit 0
(LSB)
...
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22
Bit 1
SO
Status flag
Data out
PAR
SPI_ PRTY_
POR
SSC VS_TH TEMP
OI
FAIL
FAIL
图8-22. TIC12400-Q1 Read SPI Sequence
Bit 31
(MSB)
Bit 0
(LSB)
...
...
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22
Bit 1
Read/
Write
SI
Register address
Data in
PAR
1
Bit 31
(MSB)
Bit 0
(LSB)
Bit 30 Bit 29 Bit 28 Bit 27 Bit 26 Bit 25 Bit 24 Bit 23 Bit 22
Bit 1
SO
Status flag
Previous content of the
register addressed
PAR
SPI_ PRTY_
FAIL FAIL
POR
SSC VS_TH TEMP
OI
图8-23. TIC12400-Q1 Write SPI Sequence
8.5.2.1 Read Operation
The Read/Write bit (bit 31) of the SI bus needs to be set to logic 0 for a READ operation. The 6-bits address of
the register to be accessed follows next on the SI bus. The content from bit 24 to bit 1 does not represent a valid
command for a read operation and will be ignored. The LSB (bit 0) is the parity bit used to detect communication
errors.
On the SO bus, the status flags will be outputted from the TIC12400-Q1, followed by the data content in the
register that was requested. The LSB is the parity bit used to detect communication errors.
Note there are several test mode registers used in the TIC12400-Q1 in addition to the normal functional
registers, and a READ command to these test registers returns the register content. If a READ command is
issued to an invalid register address, the TIC12400-Q1 returns all 0s.
8.5.2.2 Write Operation
The Read/Write bit (bit 31) on the SI bus needs to be set to 1 for a write operation. The 6-bits address of the
register to be accessed follows next on the SI bus. Note: the register needs to be a writable configuration
register, or otherwise the command will be ignored. The content from bit 24 to bit 1 represents the data to be
written to the register. The LSB (bit 0) is the parity bit used to detect communication errors.
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On the SO bus, the status flags will be output from the TIC12400-Q1, followed by the previous data content of
the written register. The previous content of the register is latched after the full register address is decoded in the
SI command (after bit 25 is transmitted). The new data will replace the previous data content at the end of the
SPI transaction if the SI write is a valid command (valid register address and no SPI/parity error). If the write
command is invalid, the new data will be ignored and the register content will remain unchanged. The LSB is the
parity bit used to detect communication errors.
Note: there are several test mode registers used in the TIC12400-Q1 in addition to the normal functional
registers. A WRITE command to these test registers has no effect on the register content, even though the
register content is returned on the SO output. If a WRITE command is issued to an invalid register address, the
SO output returns all 0s.
8.5.2.3 Status Flag
The status flags are output from SO during every READ or WRITE SPI transaction to indicate system conditions.
These bits do not belong to an actual register, but their content is mirrored from the interrupt register INT_STAT.
A READ command executed on the INT_STAT would clear both the bits inside the register and the status flag.
The following table describes the information that can be obtained from each SPI status flag:
表8-10. TIC12400-Q1 SPI Status Flag Description
SYMBOL
NAME
DESCRIPTION
This flag mirrors the POR bit in the interrupt register INT_STAT, and it indicates, if set to 1, that a reset event has
occurred. This bit is asserted after a successful power-on-reset, hardware reset, or software reset. Refer to 节
8.3.5 for more details.
POR
Power-on Reset
This flag mirrors the SPI_FAIL bit in the interrupt register INT_STAT and it indicates, if set to 1, that the last SPI
responder in (SI) transaction is invalid. To program a complete word, 32 bits of information must be entered into
the device. The SPI logic counts the number of bits clocked into the IC and enables data latching only if exactly
32 bits have been clocked in. In case the word length exceeds or does not meet the required size, the SPI_FAIL
bit, which mirrors its value to this SPI_FAIL status flag, of the interrupt register INT_STAT will be set to 1 and the
INT pin will be asserted low. The data received will be considered invalid. Once the INT_STAT register is read, its
content will be cleared on the rising edge of CS. The SPI_FAIL status flag, which mirrors the SPI_FAIL bit in the
INT_STAT register, will also be de-asserted. Note the SPI_FAIL bit is not flagged if SCLK is not present.
SPI_FAIL
SPI Error
This flag mirrors the PRTY_FAIL bit in the interrupt register INT_STAT and it indicates, if set to 1, that the last SPI
responder in (SI) transaction has a parity error. The device uses odd parity. If the total number of ones in the
received data (including the parity bit) is an even number, the received data is discarded. The INT will be
asserted low and the PRTY_FAIL bit in the interrupt register (INT_STAT) is flagged to logic 1, and the
PRTY_FAIL status flag, which mirrors the PRTY_FAIL bit in the INT_STAT register, is also set to 1. Once the
INT_STAT register is read, its content will be cleared on the rising edge of CS. The PRTY_FAIL status flag, which
mirrors the PRTY_FAIL bit in the INT_STAT register, will also be de-asserted.
PRTY_FAIL
Parity Fail
This flag mirrors the SSC bit in the interrupt register INT_STAT and it indicates, if set to 1, that one or more switch
inputs crossed a threshold. To determine the origin of the state change, the microcontroller can read the content
of registers IN_STAT_COMP (if input is set to comparator input mode), IN_STAT_ADC0 to IN_STAT_ADC1 (if
input is set to ADC input mode), or IN_STAT_MATRIX0 to IN_STAT_MATRIX1 (if input is set to matrix input).
Once the interrupt register (INT_STAT) is read, its content will be cleared on the rising edge of CS. The SSC
status flag, which mirrors the SSC bit in the INT_STAT register, will also be de-asserted.
SSC
VS_TH
TEMP
Switch State Change
This flag is set to 1 if either VS0 or VS1 bit in the interrupt register INT_STAT is flagged to 1. It indicates the VS
voltage crosses one or more thresholds defined by VS0_THRES2A, VS0_THRES2B, VS1_THRES2A, or
VS Threshold Crossing VS1_THRES2B. To determine the origin of the threshold crossing, the microcontroller can read register bits
VS0_STAT and VS1_STAT in the register IN_STAT_MISC. Once the interrupt register (INT_STAT) is read, its
content will be cleared on the rising edge of CS, and the VS_TH status flag will also be de-asserted.
This flag is set to 1 if either Temperature Warning (TW) or Temperature Shutdown (TSD) bit in the interrupt
register INT_STAT is flagged to 1. It indicates a TW event or a TSD event has occurred. It is also flagged to 1 if a
TW event or a TSD event is cleared. The interrupt register INT_STAT should be read to determine which event
Temperature Event
occurred. The SPI controller can also read the IN_STAT_MISC register to get information on the temperature
status of the device. Once the interrupt register (INT_STAT) is read, its content will be cleared on the rising edge
of CS, and the TEMP status flag will also be de-asserted.
Other interrupt include interrupts such as OV, UV, CRC_CALC. WET_DIAG, ADC_DIAG and CHK_FAIL. This
flag will be asserted 1 when any of the above mentioned bits is flagged in the interrupt register INT_STAT. The
interrupt register INT_STAT should be read to determine which one or more events occurred. The SPI controller
can also read the IN_STAT_MISC register to get information on the latest status of the device. Once the
OI
Other Interrupt
INT_STAT register is read, its content will be cleared on the rising edge of CS, and the OI status flag will also be
de-asserted.
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8.6 Register Maps
表 8-11 lists the memory-mapped registers for the TIC12400-Q1. All register offset addresses not listed in 表
8-11 should be considered as reserved locations and the register contents should not be modified.
表8-11. TIC12400-Q1 Registers
OFFSET
1h
TYPE
R
RESET
20h
ACRONYM
REGISTER NAME
SECTION
Go
DEVICE_ID
INT_STAT
Device ID Register
2h
RC
R
1h
Interrupt Status Register
CRC Result Register
Go
3h
FFFFh CRC
Go
4h
R
0h
0h
0h
0h
IN_STAT_MISC
IN_STAT_COMP
Miscellaneous Status Register
Comparator Status Register
Go
5h
R
Go
6h-7h
8h-9h
R
IN_STAT_ADC0, IN_STAT_ADC1 ADC Status Register
Go
R
IN_STAT_MATRIX0,
IN_STAT_MATRIX1
Matrix Status Register
Go
Ah-16h
17h-19h
1Ah
R
0h
ANA_STAT0- ANA_STAT12
RESERVED
ADC Raw Code Register
Go
RESERVED
—
—
0h
0h
0h
0h
0h
0h
0h
—
R/W
R/W
R/W
R/W
R/W
R/W
R/W
CONFIG
Device Global Configuration Register
Input Enable Register
Go
Go
Go
Go
Go
Go
Go
1Bh
IN_EN
1Ch
CS_SELECT
Current Source/Sink Selection Register
Wetting Current Configuration Register
Clean Current Polling Register
Comparator Threshold Control Register
1Dh-1Eh
1Fh-20h
21h
WC_CFG0, WC_CFG1
CCP_CFG0, CCP_CFG1
THRES_COMP
22h-23h
INT_EN_COMP1,
INT_EN_COMP2
Comparator Input Interrupt Generation Control
Register
24h
R/W
R/W
0h
0h
INT_EN_CFG0
Global Interrupt Generation Control Register
Go
Go
25h-28h
INT_EN_CFG1- INT_EN_CFG4
ADC Input Interrupt Generation Control
Register
29h-2Dh
2Eh- 30h
R/W
R/W
0h
0h
THRES_CFG0- THRES_CFG4
ADC Threshold Control Register
ADC Threshold Mapping Register
Go
Go
THRESMAP_CFG0-
THRESMAP_CFG2
31h
32h
R/W
R/W
0h
0h
Matrix
Mode
Matrix Setting Register
Mode Setting Register
Go
Go
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8.6.1 DEVICE_ID Register (Offset = 1h) [Reset = 20h]
DEVICE_ID is shown in 图8-24 and described in 表8-12.
Return to Summary Table.
This register represents the device ID of the TIC12400-Q1.
图8-24. DEVICE_ID Register
23
22
10
21
9
20
8
19
18
RESERVED
R-0h
17
16
15
3
14
2
13
1
12
0
11
7
6
5
4
RESERV
ED
MAJOR
MINOR
R-0h
R-0h
R-2h
LEGEND: R = Read only
表8-12. DEVICE_ID Register Field Descriptions
Bit
Field
Type
Reset
Description
23-11
RESERVED
R
0h
RESERVED
10-4
MAJOR
R
2h
These 7 bits represents major revision ID. For TIC12400-Q1 the
major revision ID is 2h.
3-0
MINOR
R
0h
These 4 bits represents minor revision ID. For TIC12400-Q1 the
minor revision ID is 0h
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8.6.2 INT_STAT Register (Offset = 2h) [reset = 1h]
INT_STAT is shown in 图8-25 and described in 表8-13.
Return to Summary Table.
This register records the information of the event as it occurs in the device. A READ command executed on this
register clears its content and resets the register to its default value. The INT pin is released at the rising edge of
the CS pin from the READ command.
图8-25. INT_STAT Register
23
22
21
20
19
18
17
16
RESERVED
R-0h
15
14
13
12
11
10
9
8
RESERVED
R-0h
CHK_FAIL
RC-0h
ADC_DIAG
RC-0h
WET_DIAG
RC-0h
VS1
VS0
CRC_CALC
RC-0h
RC-0h
RC-0h
7
6
5
4
3
2
1
0
UV
OV
TW
TSD
SSC
RC-0h
PRTY_FAIL
RC-0h
SPI_FAIL
RC-0h
POR
RC-1h
RC-0h
RC-0h
RC-0h
RC-0h
LEGEND: R = Read only; RC = Read to clear
表8-13. INT_STAT Register Field Descriptions
Bit
Field
Type
Reset
Description
23-14
RESERVED
R
0h
RESERVED
13
CHK_FAIL
RC
0h
0h = Default factory setting is successfully loaded upon device
initialization or the event status got cleared after a READ command
was executed on the INT_STAT register.
1h = An error is detected when loading factory settings into the
device upon device initialization.
During device initialization, factory settings are programmed into the
device to allow proper device operation. The device performs a self-
check after the device is programmed to diagnose whether correct
settings are loaded. If the self-check returns an error, the CHK_FAIL
bit is flagged to logic 1 along with the POR bit. The host controller is
then recommended to initiate a software reset (see section Software
Reset) to re-initialize the device and allow correct settings to be re-
programmed.
12
ADC_DIAG
RC
0h
0h = No ADC self-diagnostic error is detected or the event status got
cleared after a READ command was executed on the INT_STAT
register.
1h = ADC self-diagnostic error is detected.
The ADC Self-Diagnostic feature (see section ADC Self-Diagnostic)
can be activated to monitor the integrity of the internal ADC. The
ADC_DIAG bit is flagged to logic 1 if an ADC error is diagnosed.
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表8-13. INT_STAT Register Field Descriptions (continued)
Bit
Field
WET_DIAG
Type
Reset
Description
11
RC
0h
0h = No wetting current error is detected, or the event status got
cleared after a READ command was executed on the INT_STAT
register.
1h = Wetting current error is detected.
The Wetting Current Diagnostic feature (see section Wetting Current
Diagnostic) can be activated to monitor the integrity of the internal
current sources or sinks. The WET_DIAG bit is flagged to logic 1 if a
wetting current error is diagnosed.
10
VS1
RC
0h
0h = No VS voltage state change occurred with respect to
VS1_THRES2A or VS1_THRES2B or the status got cleared after a
READ command was executed on the INT_STAT register.
1h = VS voltage state change occurred with respect to
VS1_THRES2A or VS1_THRES2B.
The VS1 interrupt bit indicates whether VS voltage state change
occurred with respect to thresholds VS1_THRES2A and
VS1_THRES2B if the VS Measurement feature (see section VS
Measurement) is activated.
9
VS0
RC
0h
0h = No VS voltage state change occurred with respect to
VS0_THRES2A or VS0_THRES2B or the status got cleared after a
READ command was executed on the INT_STAT register.
1h = VS voltage state change occurred with respect to
VS0_THRES2A or VS0_THRES2B.
The VS0 interrupt bit indicates whether VS voltage state change
occurred with respect to thresholds VS0_THRES2A and
VS0_THRES2B if the VS Measurement feature (see section VS
Measurement) is activated.
8
7
6
CRC_CALC
RC
RC
RC
0h
0h
0h
0h = CRC calculation is running, not started, or was acknowledged
after a READ command was executed on the INT_STAT register.
1h = CRC calculation is finished.
CRC calculation (see section Cyclic Redundancy Check (CRC)) can
be triggered to make sure correct register values are programmed
into the device. Once the calculation is completed, the CRC_CALC
bit is flagged to logic 1 to indicate completion of the calculation, and
the result can then be accessed from the CRC (offset = 3h) register.
UV
0h = No under-voltage condition occurred or cleared on the VS pin,
or the event status got cleared after a READ command was
executed on the INT_STAT register.
1h = Under-voltage condition occurred or cleared on the VS pin.
When the UV bit is flagged to logic 1, it indicates the Under-Voltage
(UV) event has occurred. The bit is also flagged to logic 1 when the
event clears. For more details about the UV operation, please refer
to section VS under-voltage (UV) condition.
OV
0h = No over-voltage condition occurred or cleared on the VS pin, or
the event status got cleared after a READ command was executed
on the INT_STAT register.
1h = Over-voltage condition occurred or cleared on the VS pin.
When the OV bit is flagged to logic 1, it indicates the Over-Voltage
(OV) event has occurred. The bit is also flagged to logic 1 when the
event clears. For more details about the OV operation, please refer
to section VS over-voltage (OV) condition.
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表8-13. INT_STAT Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
5
TW
RC
0h
0h = No temperature warning event occurred or the event status got
cleared after a READ command was executed on the INT_STAT
register.
1h = Temperature warning event occurred or cleared.
When the TW bit is flagged to logic 1, it indicates the temperature
warning event has occurred. The bit is also flagged to logic 1 when
the event clears. For more details about the temperature warning
operation, please refer to section Temperature Warning (TW)
4
TSD
RC
0h
0h = No temperature Shutdown event occurred or the event status
got cleared after a READ command was executed on the INT_STAT
register.
1h = Temperature Shutdown event occurred or cleared.
When the TSD bit is flagged to logic 1, it indicates the temperature
shutdown event has occurred. The bit is also flagged to logic 1 when
the event clears. For more details about the temperature shutdown
operation, please refer to section Temperature shutdown (TSD)
3
SSC
RC
0h
0h = No switch state change occurred or the status got cleared after
a READ command was executed on the INT_STAT register.
1h = Switch state change occurred.
The Switch State Change (SSC) bit indicates whether input threshold
crossing has occurred from switch inputs IN0 to IN23. This bit is also
flagged to logic 1 after the first polling cycle is completed after device
polling is triggered.
2
PRTY_FAIL
RC
0h
0h = No parity error occurred in the last received SI stream or the
error status got cleared after a READ command was executed on the
INT_STAT register.
1h = Parity error occurred.
When the PRTY_FAIL bit is flagged to logic 1, it indicates the last
SPI responder in (SI) transaction has a parity error. The device uses
odd parity. If the total number of ones in the received data (including
the parity bit) is an even number, the received data is discarded. The
value of this register bit is mirrored to the PRTY_FLAG SPI status
flag.
1
SPI_FAIL
RC
0h
0h = 32 clock pulse during a CS = low sequence was detected or the
error status got cleared after a READ command was executed on the
INT_STAT register.
1h = SPI error occurred
When the SPI_FAIL bit is flagged to logic 1, it indicates the last SPI
responder in (SI) transaction is invalid. To program a complete word,
32 bits of information must be entered into the device. The SPI logic
counts the number of bits clocked into the IC and enables data
latching only if exactly 32 bits have been clocked in. In case the word
length exceeds or does not meet the required length, the SPI_FAIL
bit is flagged to logic 1, and the data received is considered invalid.
The value of this register bit is mirrored to the SPI_FLAG SPI status
flag. Note the SPI_FAIL bit is not flagged if SCLK is not present.
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表8-13. INT_STAT Register Field Descriptions (continued)
Bit
Field
POR
Type
Reset
Description
0
RC
1h
0h = no Power-On-Reset (POR) event occurred or the status got
cleared after a READ command was executed on the INT_STAT
register.
1h = Power-On-Reset (POR) event occurred.
The Power-On-Reset (POR) interrupt bit indicates whether a reset
event has occurred. A reset event sets the registers to their default
values and re-initializes the device state machine. This bit is
asserted after a successful power-on-reset, hardware reset, or
software reset. The value of this register bit is mirrored to the POR
SPI status flag.
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8.6.3 CRC Register (Offset = 3h) [Reset = FFFFh]
CRC is shown in 图8-26 and described in 表8-14.
Return to Summary Table.
This register returns the CRC-16-CCCIT calculation result. The microcontroller can compare this value with its
own calculated value to ensure correct register settings are programmed to the device.
图8-26. CRC Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
CRC
R-FFFFh
LEGEND: R = Read only
表8-14. CRC Register Field Descriptions
Bit
Field
Type
Reset
Description
23-16
RESERVED
R
0h
Reserved
15-0
CRC
R
FFFFh
CRC-16-CCITT calculation result: Bit1: LSB of CRC Bit16: MSB or
CRC
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8.6.4 IN_STAT_MISC Register (Offset = 4h) [Reset = 0h]
IN_STAT_MISC is shown in 图8-27 and described in 表8-15.
Return to Summary Table.
This register indicates current device status unrelated to switch input monitoring.
图8-27. IN_STAT_MISC Register
23
15
7
22
21
13
5
20
19
18
17
16
RESERVED
R-0h
14
12
11
10
9
8
RESERVED
R-0h
ADC_D
R-0h
IN3_D
R-0h
IN2_D
R-0h
IN1_D
R-0h
IN0_D
R-0h
6
4
3
2
1
0
VS1_STAT
VS0_STAT
R-0h
UV_STAT
R-0h
OV_STAT
R-0h
TW_STAT
R-0h
TSD_STAT
R-0h
R-0h
表8-15. IN_STAT_MISC Register Field Descriptions
Bit
Field
Type
Reset
Description
23-13
12
RESERVED
R
0h
Reserved
ADC_D
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h = No error is identified from ADC self-diagnostic.
1h = An error is identified from ADC self-diagnostic.
11
10
9
IN3_D
0h = Current sink on IN3 is operational.
1h = Current sink on IN3 is abnormal.
IN2_D
0h = Current sink on IN2 is operational.
1h = Current sink on IN2 is abnormal.
IN1_D
0h = Current source on IN1 is operational.
1h = Current source on IN1 is abnormal.
8
IN0_D
0h = Current source on IN0 is operational.
1h = Current source on IN0 is abnormal.
7-6
VS1_STAT
0h = VS voltage is below threshold VS1_THRES2A.
1h = VS voltage is below threshold VS1_THRES2B and equal to or
above threshold VS1_THRES2A.
2h = VS voltage is equal to or above threshold VS1_THRES2B.
3h = N/A.
5-4
VS0_STAT
R
0h
0h = VS voltage is below threshold VS0_THRES2A.
1h = VS voltage is below threshold VS0_THRES2B and equal to or
above threshold VS0_THRES2A.
2h = VS voltage is equal to or above threshold VS0_THRES2B.
3h = N/A
3
2
1
UV_STAT
OV_STAT
TW_STAT
R
R
R
0h
0h
0h
0h = VS voltage is above the under-voltage condition threshold.
1h = VS voltage is below the under-voltage condition threshold.
0h = VS voltage is below the over-voltage condition threshold.
1h = VS voltage is above the over-voltage condition threshold.
0h = Device junction temperature is below the temperature warning
threshold TTW
1h = Device junction temperature is above the temperature warning
threshold TTW
.
.
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表8-15. IN_STAT_MISC Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
0h = Device junction temperature is below the temperature shutdown
threshold TTSD
1h = Device junction temperature is above the temperature shutdown
threshold TTSD
0
TSD_STAT
R
0h
.
.
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8.6.5 IN_STAT_COMP Register (Offset = 5h) [Reset = 0h]
IN_STAT_COMP is shown in 图8-28 and described in 表8-16.
Return to Summary Table.
This register indicates whether an input is below or above the comparator threshold when it is configured as
comparator input mode.
图8-28. IN_STAT_COMP Register
23
22
21
20
19
18
17
16
INC_23
R-0h
INC_22
R-0h
INC_21
R-0h
INC_20
R-0h
INC_19
R-0h
INC_18
R-0h
INC_17
R-0h
INC_16
R-0h
15
14
13
12
11
10
9
8
INC_15
R-0h
INC_14
R-0h
INC_13
R-0h
INC_12
R-0h
INC_11
R-0h
INC_10
R-0h
INC_9
R-0h
INC_8
R-0h
7
6
5
4
3
2
1
0
INC_7
R-0h
INC_6
R-0h
INC_5
R-0h
INC_4
R-0h
INC_3
R-0h
INC_2
R-0h
INC_1
R-0h
INC_0
R-0h
LEGEND: R = Read only
表8-16. IN_STAT_COMP Register Field Descriptions
Bit
Field
Type
Reset
Description
23
INC_23
R
0h
0h = Input IN23 is below the comparator threshold.
1h = Input IN23 is above the comparator threshold.
22
21
20
19
18
17
16
15
14
13
12
11
INC_22
INC_21
INC_20
INC_19
INC_18
INC_17
INC_16
INC_15
INC_14
INC_13
INC_12
INC_11
R
R
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN22 is below the comparator threshold.
1h = Input IN22 is above the comparator threshold.
0h = Input IN21 is below the comparator threshold.
1h = Input IN21 is above the comparator threshold.
0h = Input IN20 is below the comparator threshold.
1h = Input IN20 is above the comparator threshold.
0h = Input IN19 is below the comparator threshold
1h = Input IN19 is above the comparator threshold
0h = Input IN18 is below the comparator threshold
1h = Input IN18 is above the comparator threshold
0h = Input IN17 is below the comparator threshold
1h = Input IN17 is above the comparator threshold
0h = Input IN16 is below the comparator threshold
1h = Input IN16 is above the comparator threshold
0h = Input IN15 is below the comparator threshold
1h = Input IN15 is above the comparator threshold
0h = Input IN14 is below the comparator threshold
1h = Input IN14 is above the comparator threshold
0h = Input IN13 is below the comparator threshold
1h = Input IN13 is above the comparator threshold
0h = Input IN12 is below the comparator threshold
1h = Input IN12 is above the comparator threshold
0h = Input IN11 is below the comparator threshold
1h = Input IN11 is above the comparator threshold
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表8-16. IN_STAT_COMP Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
10
INC_10
R
0h
0h = Input IN10 is below the comparator threshold
1h = Input IN10 is above the comparator threshold
9
8
7
6
5
4
3
2
1
0
INC_9
INC_8
INC_7
INC_6
INC_5
INC_4
INC_3
INC_2
INC_1
INC_0
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN9 is below the comparator threshold
1h = Input IN9 is above the comparator threshold
0h = Input IN8 is below the comparator threshold
1h = Input IN8 is above the comparator threshold
0h = Input IN7 is below the comparator threshold
1h = Input IN7 is above the comparator threshold
0h = Input IN6 is below the comparator threshold
1h = Input IN6 is above the comparator threshold
0h = Input IN5 is below the comparator threshold
1h = Input IN5 is above the comparator threshold
0h = Input IN4 is below the comparator threshold
1h = Input IN4 is above the comparator threshold
0h = Input IN3 is below the comparator threshold
1h = Input IN3 is above the comparator threshold
0h = Input IN2 is below the comparator threshold
1h = Input IN2 is above the comparator threshold
0h = Input IN1 is below the comparator threshold
1h = Input IN1 is above the comparator threshold
0h = Input IN0 is below the comparator threshold
1h = Input IN0 is above the comparator threshold
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8.6.6 IN_STAT_ADC0 Register (Offset = 6h) [Reset = 0h]
IN_STAT_ADC0 is shown in 图8-29 and described in 表8-17.
Return to Summary Table.
This register indicates whether an input is below or above the programmed threshold (for IN0-IN11) when it is
configured as ADC input mode. For IN12-IN17, there are 2 thresholds and the register bits indicate whether the
input is below, above or in-between the 2 thresholds.
图8-29. IN_STAT_ADC0 Register
23
22
21
20
19
18
17
16
INA_17
R-0h
INA_16
R-0h
INA_15
R-0h
INA_14
R-0h
15
14
13
12
11
10
9
8
INA_13
R-0h
INA_12
R-0h
INA_11
R-0h
INA_10
R-0h
INA_9
R-0h
INA_8
R-0h
7
6
5
4
3
2
1
0
INA_7
R-0h
INA_6
R-0h
INA_5
R-0h
INA_4
R-0h
INA_3
R-0h
INA_2
R-0h
INA_1
R-0h
INA_0
R-0h
LEGEND: R = Read only
表8-17. IN_STAT_ADC0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-22
INA_17
R
0h
0h = Input IN17 is below threshold 2A
1h = Input IN17 is below threshold 2B and equal to or above
threshold 2A
2h = Input IN17 is equal to or above threshold 2B
3h = N/A
21-20
19-18
17-16
15-14
INA_16
INA_15
INA_14
INA_13
R
R
R
R
0h
0h
0h
0h
0h = Input IN16 is below threshold 2A
1h = Input IN16 is below threshold 2B and equal to or above
threshold 2A
2h = Input IN16 is equal to or above threshold 2B
3h = N/A
0h = Input IN15 is below threshold 2A
1h = Input IN15 is below threshold 2B and equal to or above
threshold 2A
2h = Input IN15 is equal to or above threshold 2B
3h = N/A
0h = Input IN14 is below threshold 2A
1h = Input IN14 is below threshold 2B and equal to or above
threshold 2A
2h = Input IN14 is equal to or above threshold 2B
3h = N/A
0h = Input IN13 is below threshold 2A
1h = Input IN13 is below threshold 2B and equal to or above
threshold 2A
2h = Input IN13 is equal to or above threshold 2B
3h = N/A
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表8-17. IN_STAT_ADC0 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
13-12
INA_12
R
0h
0h = Input IN12 is below threshold 2A
1h = Input IN12 is below threshold 2B and equal to or above
threshold 2A
2h = Input IN12 is equal to or above threshold 2B
3h = N/A
11
10
9
INA_11
INA_10
INA_9
INA_8
INA_7
INA_6
INA_5
INA_4
INA_3
INA_2
INA_1
INA_0
R
R
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN11 is below configured threshold
1h = Input IN11 is above configured threshold
0h = Input IN10 is below configured threshold
1h = Input IN10 is above configured threshold
0h = Input IN9 is below configured threshold
1h = Input IN9 is above configured threshold
8
0h = Input IN8 is below configured threshold
1h = Input IN8 is above configured threshold
7
0h = Input IN7 is below configured threshold
1h = Input IN7 is above configured threshold
6
0h = Input IN6 is below configured threshold
1h = Input IN6 is above configured threshold
5
0h = Input IN5 is below configured threshold
1h = Input IN5 is above configured threshold
4
0h = Input IN4 is below configured threshold
1h = Input IN4 is above configured threshold
3
0h = Input IN3 is below configured threshold
1h = Input IN3 is above configured threshold
2
0h = Input IN2 is below configured threshold
1h = Input IN2 is above configured threshold
1
0h = Input IN1 is below configured threshold
1h = Input IN1 is above configured threshold
0
0h = Input IN0 is below configured threshold
1h = Input IN0 is above configured threshold
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8.6.7 IN_STAT_ADC1 Register (Offset = 7h) [Reset = 0h]
IN_STAT_ADC1 is shown in 图8-30 and described in 表8-18.
Return to Summary Table.
This register indicates whether an input is above or below the programmed thresholds 3A, 3B, and 3C when it is
configured as ADC input mode. For IN23, there are 5 thresholds that can be programmed.
图8-30. IN_STAT_ADC1 Register
23
22
21
20
19
18
17
16
15
14
13
12
RESERVED
R-0h
INA_23
R-0h
11
10
9
8
7
6
5
4
3
2
1
0
INA_23
R-0h
INA_22
R-0h
INA_21
R-0h
INA_20
R-0h
INA_19
R-0h
INA_18
R-0h
LEGEND: R = Read only
表8-18. IN_STAT_ADC1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-13
RESERVED
R
0h
Reserved
12-10
INA_23
R
0h
0h = Input IN23 is below threshold 3A
1h = Input IN23 is below threshold 3B and equal to or above
threshold 3A
2h = Input IN23 is below threshold 3C and equal to or above
threshold 3B
3h = Input IN23 is below threshold THRES8 and equal to or above
threshold 3C
4h = Input IN23 is below threshold THRES9 and equal to or above
threshold THRES8
5h = Input IN23 is equal to or above threshold THRES9
9-8
7-6
5-4
INA_22
INA_21
INA_20
R
R
R
0h
0h
0h
0h = Input IN22 is below threshold 3A
1h = Input IN22 is below threshold 3B and equal to or above
threshold 3A
2h = Input IN22 is below threshold 3C and equal to or above
threshold 3B
3h = Input IN22 is equal to or above threshold 3C
0h = Input IN21 is below threshold 3A
1h = Input IN21 is below threshold 3B and equal to or above
threshold 3A
2h = Input IN21 is below threshold 3C and equal to or above
threshold 3B
3h = Input IN21 is equal to or above threshold 3C
0h = Input IN20 is below threshold 3A
1h = Input IN20 is below threshold 3B and equal to or above
threshold 3A
2h = Input IN20 is below threshold 3C and equal to or above
threshold 3B
3h = Input IN20 is equal to or above threshold 3C
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表8-18. IN_STAT_ADC1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
3-2
INA_19
R
0h
0h = Input IN19 is below threshold 3A
1h = Input IN19 is below threshold 3B and equal to or above
threshold 3A
2h = Input IN19 is below threshold 3C and equal to or above
threshold 3B
3h = Input IN19 is equal to or above threshold 3C
1-0
INA_18
R
0h
0h = Input is IN18 is below threshold 3A
1h = Input is IN18 is below threshold 3B and equal to or above
threshold 3A
2h = Input is IN18 is below threshold 3C and equal to or above
threshold 3B
3h = Input is IN18 is equal to or above threshold 3C
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8.6.8 IN_STAT_MATRIX0 Register (Offset = 8h) [Reset = 0h]
IN_STAT_MATRIX0 is shown in 图8-31 and described in 表8-19.
Return to Summary Table.
This register indicates whether an input is below or above the programmed threshold in the matrix polling mode
for switches connected to IN10-IN13.
图8-31. IN_STAT_MATRIX0 Register
23
22
21
20
19
18
17
16
INMAT_13_IN9 INMAT_13_IN8 INMAT_13_IN7 INMAT_13_IN6 INMAT_13_IN5 INMAT_13_IN4 INMAT_12_IN9 INMAT_12_IN8
R-0h
15
R-0h
14
R-0h
13
R-0h
12
R-0h
11
R-0h
10
R-0h
9
R-0h
8
INMAT_12_IN7 INMAT_12_IN6 INMAT_12_IN5 INMAT_12_IN4 INMAT_11_IN9 INMAT_11_IN8 INMAT_11_IN7 INMAT_11_IN6
R-0h
7
R-0h
6
R-0h
5
R-0h
4
R-0h
3
R-0h
2
R-0h
1
R-0h
0
INMAT_11_IN5 INMAT_11_IN4 INMAT_10_IN9 INMAT_10_IN8 INMAT_10_IN7 INMAT_10_IN6 INMAT_10_IN5 INMAT_10_IN4
R-0h R-0h R-0h R-0h R-0h R-0h R-0h R-0h
LEGEND: R = Read only
表8-19. IN_STAT_MATRIX0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23
INMAT_13_IN9
R
0h
0h = Input IN13 is below threshold while IN9 pulled to GND
1h = Input IN13 is above threshold while IN9 pulled to GND
22
21
20
19
18
17
16
15
14
13
12
11
INMAT_13_IN8
INMAT_13_IN7
INMAT_13_IN6
INMAT_13_IN5
INMAT_13_IN4
INMAT_12_IN9
INMAT_12_IN8
INMAT_12_IN7
INMAT_12_IN6
INMAT_12_IN5
INMAT_12_IN4
INMAT_11_IN9
R
R
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN13 is below threshold while IN8 pulled to GND
1h = Input IN13 is above threshold while IN8 pulled to GND
0h = Input IN13 is below threshold while IN7 pulled to GND
1h = Input IN13 is above threshold while IN7 pulled to GND
0h = Input IN13 is below threshold while IN6 pulled to GND
1h = Input IN13 is above threshold while IN6 pulled to GND
0h = Input IN13 is below threshold while IN5 pulled to GND
1h = Input IN13 is above threshold while IN5 pulled to GND
0h = Input IN13 is below threshold while IN4 pulled to GND
1h = Input IN13 is above threshold while IN4 pulled to GND
0h = Input IN12 is below threshold while IN9 pulled to GND
1h = Input IN12 is above threshold while IN9 pulled to GND
0h = Input IN12 is below threshold while IN8 pulled to GND.
1h = Input IN12 is above threshold while IN8 pulled to GND.
0h = Input IN12 is below threshold while IN7 pulled to GND.
1h = Input IN12 is above threshold while IN7 pulled to GND.
0h = Input IN12 is below threshold while IN6 pulled to GND.
1h = Input IN12 is above threshold while IN6 pulled to GND.
0h = Input IN12 is below threshold while IN5 pulled to GND.
1h = Input IN12 is above threshold while IN5 pulled to GND.
0h = Input IN12 is below threshold while IN4 pulled to GND.
1h = Input IN12 is above threshold while IN4 pulled to GND.
0h = Input IN11 is below threshold while IN9 pulled to GND.
1h = Input IN11 is above threshold while IN9 pulled to GND.
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表8-19. IN_STAT_MATRIX0 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
10
INMAT_11_IN8
R
0h
0h = Input IN11 is below threshold while IN8 pulled to GND.
1h = Input IN11 is above threshold while IN8 pulled to GND.
9
8
7
6
5
4
3
2
1
0
INMAT_11_IN7
INMAT_11_IN6
INMAT_11_IN5
INMAT_11_IN4
INMAT_10_IN9
INMAT_10_IN8
INMAT_10_IN7
INMAT_10_IN6
INMAT_10_IN5
INMAT_10_IN4
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN11 is below threshold while IN7 pulled to GND.
1h = Input IN11 is above threshold while IN7 pulled to GND.
0h = Input IN11 is below threshold while IN6 pulled to GND.
1h = Input IN11 is above threshold while IN6 pulled to GND.
0h = Input IN11 is below threshold while IN5 pulled to GND.
1h = Input IN11 is above threshold while IN5 pulled to GND.
0h = Input IN11 is below threshold while IN4 pulled to GND.
1h = Input IN11 is above threshold while IN4 pulled to GND.
0h = Input IN10 is below threshold while IN9 pulled to GND.
1h = Input IN10 is above threshold while IN9 pulled to GND.
0h = Input IN10 is below threshold while IN8 pulled to GND.
1h = Input IN10 is above threshold while IN8 pulled to GND.
0h = Input IN10 is below threshold while IN7 pulled to GND.
1h = Input IN10 is above threshold while IN7 pulled to GND.
0h = Input IN10 is below threshold while IN6 pulled to GND.
1h = Input IN10 is above threshold while IN6 pulled to GND.
0h = Input IN10 is below threshold while IN5 pulled to GND.
1h = Input IN10 is above threshold while IN5 pulled to GND.
0h = Input IN10 is below threshold while IN4 pulled to GND.
1h = Input IN10 is above threshold while IN4 pulled to GND.
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8.6.9 IN_STAT_MATRIX1 Register (Offset = 9h) [Reset = 0h]
IN_STAT_MATRIX1 is shown in 图8-32 and described in 表8-20.
Return to Summary Table.
This register indicates whether an input is below or above the programmed threshold in the matrix polling mode
for switches connected to IN14-IN15. This register also indicates the status of IN0-IN11 with respect to the
common threshold THRES_COM.
图8-32. IN_STAT_MATRIX1 Register
23
22
21
20
19
18
17
16
IN11_COM
R-0h
IN10_COM
R-0h
IN9_COM
R-0h
IN8_COM
R-0h
IN7_COM
R-0h
IN6_COM
R-0h
IN5_COM
R-0h
IN4_COM
R-0h
15
14
13
12
11
10
9
8
IN3_COM
R-0h
IN2_COM
R-0h
IN1_COM
R-0h
IN0_COM
R-0h
INMAT_15_IN9 INMAT_15_IN8 INMAT_15_IN7 INMAT_15_IN6
R-0h
3
R-0h
2
R-0h
1
R-0h
0
7
6
5
4
INMAT_15_IN5 INMAT_15_IN4 INMAT_14_IN9 INMAT_14_IN8 INMAT_14_IN7 INMAT_14_IN6 INMAT_14_IN5 INMAT_14_IN4
R-0h R-0h R-0h R-0h R-0h R-0h R-0h R-0h
LEGEND: R = Read only
表8-20. IN_STAT_MATRIX1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23
IN11_COM
R
0h
0h = Input IN11 below threshold THRES_COM
1h = Input IN11 equal to or above threshold THRES_COM
22
21
20
19
18
17
16
15
14
13
12
IN10_COM
IN9_COM
IN8_COM
IN7_COM
IN6_COM
IN5_COM
IN4_COM
IN3_COM
IN2_COM
IN1_COM
IN0_COM
R
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN10 below threshold THRES_COM
1h = Input IN10 equal to or above threshold THRES_COM
0h = Input IN9 below threshold THRES_COM
1h = Input IN9 equal to or above threshold THRES_COM
0h = Input IN8 below threshold THRES_COM
1h = Input IN8 equal to or above threshold THRES_COM
0h = Input IN7 below threshold THRES_COM
1h = Input IN7 equal to or above threshold THRES_COM
0h = Input IN6 below threshold THRES_COM
1h = Input IN6 equal to or above threshold THRES_COM
0h = Input IN5 below threshold THRES_COM
1h = Input IN5 equal to or above threshold THRES_COM
0h = Input IN4 below threshold THRES_COM
1h = Input IN4 equal to or above threshold THRES_COM
0h = Input IN3 below threshold THRES_COM
1h = Input IN3 equal to or above threshold THRES_COM
0h = Input IN2 below threshold THRES_COM
1h = Input IN2 equal to or above threshold THRES_COM
0h = Input IN1 below threshold THRES_COM
1h = Input IN1 equal to or above threshold THRES_COM
0h = Input IN0 below threshold THRES_COM
1h = Input IN0 equal to or above threshold THRES_COM
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表8-20. IN_STAT_MATRIX1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
11
INMAT_15_IN9
R
0h
0h = Input IN15 below threshold while IN9 pulled to GND
1h = Input IN15 above threshold while IN9 pulled to GND
10
9
8
7
6
5
4
3
2
1
0
INMAT_15_IN8
INMAT_15_IN7
INMAT_15_IN6
INMAT_15_IN5
INMAT_15_IN4
INMAT_14_IN9
INMAT_14_IN8
INMAT_14_IN7
INMAT_14_IN6
INMAT_14_IN5
INMAT_14_IN4
R
R
R
R
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input IN15 below threshold while IN8 pulled to GND
1h = Input IN15 above threshold while IN8 pulled to GND
0h = Input IN15 below threshold while IN7 pulled to GND
1h = Input IN15 above threshold while IN7 pulled to GND
0h = Input IN15 below threshold while IN6 pulled to GND
1h = Input IN15 above threshold while IN6 pulled to GND
0h = Input IN15 below threshold while IN5 pulled to GND
1h = Input IN15 above threshold while IN5 pulled to GND
0h = Input IN15 below threshold while IN4 pulled to GND
1h = Input IN15 above threshold while IN4 pulled to GND
0h = Input IN14 below threshold while IN9 pulled to GND
1h = Input IN14 above threshold while IN9 pulled to GND
0h = Input IN14 below threshold while IN8 pulled to GND
1h = Input IN14 above threshold while IN8 pulled to GND
0h = Input IN14 below threshold while IN7 pulled to GND
1h = Input IN14 above threshold while IN7 pulled to GND
0h = Input IN14 below threshold while IN6 pulled to GND
1h = Input IN14 above threshold while IN6 pulled to GND
0h = Input IN14 below threshold while IN5 pulled to GND
1h = Input IN14 above threshold while IN5 pulled to GND
0h = Input IN14 below threshold while IN4 pulled to GND
1h = Input IN14 above threshold while IN4 pulled to GND
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8.6.10 ANA_STAT0 Register (Offset = Ah) [Reset = 0h]
ANA_STAT0 is shown in 图8-33 and described in 表8-21.
Return to Summary Table.
图8-33. ANA_STAT0 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN1_ANA
R-0h
IN0_ANA
R-0h
LEGEND: R = Read only
表8-21. ANA_STAT0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN1_ANA
R
R
0h
0h
10-bits value of IN1
Bit 10: LSB
Bit 19: MSB
9-0
IN0_ANA
10-bits value of IN0
Bit 0: LSB
Bit 9: MSB
8.6.11 ANA_STAT1 Register (Offset = Bh) [Reset = 0h]
ANA_STAT1 is shown in 图8-34 and described in 表8-22.
Return to Summary Table.
图8-34. ANA_STAT1 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN5_ANA
R-0h
IN4_ANA
R-0h
LEGEND: R = Read only
表8-22. ANA_STAT1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN3_ANA
R
R
0h
0h
10-bits value of IN3
Bit 10: LSB
Bit 19: MSB
9-0
IN2_ANA
10-bits value of IN2
Bit 0: LSB
Bit 9: MSB
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8.6.12 ANA_STAT2 Register (Offset = Ch) [Reset = 0h]
ANA_STAT2 is shown in 图8-35 and described in 表8-23.
Return to Summary Table.
图8-35. ANA_STAT2 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN5_ANA
R-0h
IN4_ANA
R-0h
LEGEND: R = Read only
表8-23. ANA_STAT2 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN5_ANA
R
R
0h
0h
10-bits value of IN5
Bit 10: LSB
Bit 19: MSB
9-0
IN4_ANA
10-bits value of IN4
Bit 0: LSB
Bit 9: MSB
8.6.13 ANA_STAT3 Register (Offset = Dh) [Reset = 0h]
ANA_STAT3 is shown in 图8-36 and described in 表8-24.
Return to Summary Table.
图8-36. ANA_STAT3 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN7_ANA
R-0h
IN6_ANA
R-0h
LEGEND: R = Read only
表8-24. ANA_STAT3 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN7_ANA
R
R
0h
0h
10-bits value of IN7
Bit 10: LSB
Bit 19: MSB
9-0
IN6_ANA
10-bits value of IN6
Bit 0: LSB
Bit 9: MSB
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8.6.14 ANA_STAT4 Register (Offset = Eh) [Reset = 0h]
ANA_STAT4 is shown in 图8-37 and described in 表8-25.
Return to Summary Table.
图8-37. ANA_STAT4 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN9_ANA
R-0h
IN8_ANA
R-0h
LEGEND: R = Read only
表8-25. ANA_STAT4 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN9_ANA
R
R
0h
0h
10-bits value of IN9
Bit 10: LSB
Bit 19: MSB
9-0
IN8_ANA
10-bits value of IN8
Bit 0: LSB
Bit 9: MSB
8.6.15 ANA_STAT5 Register (Offset = Fh) [Reset = 0h]
ANA_STAT5 is shown in 图8-38 and described in 表8-26.
Return to Summary Table.
图8-38. ANA_STAT5 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN11_ANA
R-0h
IN10_ANA
R-0h
LEGEND: R = Read only
表8-26. ANA_STAT5 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN11_ANA
R
R
0h
0h
10-bits value of IN11
Bit 10: LSB
Bit 19: MSB
9-0
IN10_ANA
10-bits value of IN10
Bit 0: LSB
Bit 9: MSB
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8.6.16 ANA_STAT6 Register (Offset = 10h) [reset = 0h]
ANA_STAT6 is shown in 图8-39 and described in 表8-27.
Return to Summary Table.
图8-39. ANA_STAT6 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN13_ANA
R-0h
IN12_ANA
R-0h
LEGEND: R = Read only
表8-27. ANA_STAT6 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN13_ANA
R
R
0h
0h
10-bits value of IN13
Bit 10: LSB
Bit 19: MSB
9-0
IN12_ANA
10-bits value of IN12
Bit 0: LSB
Bit 9: MSB
8.6.17 ANA_STAT7 Register (Offset = 11h) [Reset = 0h]
ANA_STAT7 is shown in 图8-40 and described in 表8-28.
Return to Summary Table.
图8-40. ANA_STAT7 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN15_ANA
R-0h
IN14_ANA
R-0h
LEGEND: R = Read only
表8-28. ANA_STAT7 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN15_ANA
R
R
0h
0h
10-bits value of IN15
Bit 10: LSB
Bit 19: MSB
9-0
IN14_ANA
10-bits value of IN14
Bit 0: LSB
Bit 9: MSB
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8.6.18 ANA_STAT8 Register (Offset = 12h) [Reset = 0h]
ANA_STAT8 is shown in 图8-41 and described in 表8-29.
Return to Summary Table.
图8-41. ANA_STAT8 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN17_ANA
R-0h
IN16_ANA
R-0h
LEGEND: R = Read only
表8-29. ANA_STAT8 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN17_ANA
R
R
0h
0h
10-bits value of IN17
Bit 10: LSB
Bit 19: MSB
9-0
IN16_ANA
10-bits value of IN16
Bit 0: LSB
Bit 9: MSB
8.6.19 ANA_STAT9 Register (Offset = 13h) [Reset = 0h]
ANA_STAT9 is shown in 图8-42 and described in 表8-30.
Return to Summary Table.
图8-42. ANA_STAT9 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN19_ANA
R-0h
IN18_ANA
R-0h
LEGEND: R = Read only
表8-30. ANA_STAT9 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN19_ANA
R
R
0h
0h
10-bits value of IN19
Bit 10: LSB
Bit 19: MSB
9-0
IN18_ANA
10-bits value of IN18
Bit 0: LSB
Bit 9: MSB
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8.6.20 ANA_STAT10 Register (Offset = 14h) [Reset = 0h]
ANA_STAT10 is shown in 图8-43 and described in 表8-31.
Return to Summary Table.
图8-43. ANA_STAT10 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN21_ANA
R-0h
IN20_ANA
R-0h
LEGEND: R = Read only
表8-31. ANA_STAT10 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN21_ANA
R
R
0h
0h
10-bits value of IN21
Bit 10: LSB
Bit 19: MSB
9-0
IN20_ANA
10-bits value of IN20
Bit 0: LSB
Bit 9: MSB
8.6.21 ANA_STAT11 Register (Offset = 15h) [Reset = 0h]
ANA_STAT11 is shown in 图8-44 and described in 表8-32.
Return to Summary Table.
图8-44. ANA_STAT11 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
IN23_ANA
R-0h
IN22_ANA
R-0h
LEGEND: R = Read only
表8-32. ANA_STAT11 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
IN23_ANA
R
R
0h
0h
10-bits value of IN23
Bit 10: LSB
Bit 19: MSB
9-0
IN22_ANA
10-bits value of IN22
Bit 0: LSB
Bit 9: MSB
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8.6.22 ANA_STAT12 Register (Offset = 16h) [Reset = 0h]
ANA_STAT12 is shown in 图8-45 and described in 表8-33.
Return to Summary Table.
图8-45. ANA_STAT12 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
ADC_SELF_ANA
R-0h
VS_ANA
R-0h
LEGEND: R = Read only
表8-33. ANA_STAT12 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
ADC_SELF_ANA
R
R
0h
0h
10-bits value of the ADC self-diagnosis
Bit 10: LSB
Bit 19: MSB
9-0
VS_ANA
10-bits value of VS measurement
Bit 0: LSB
Bit 9: MSB
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8.6.23 CONFIG Register (Offset = 1Ah) [Reset = 0h]
CONFIG is shown in 图8-46 and described in 表8-34.
Return to Summary Table.
图8-46. CONFIG Register
23
22
21
20
19
18
17
16
VS_RATIO
ADC_DIAG_T WET_D_IN3_E WET_D_IN2_E WET_D_IN1_E WET_D_IN0_E VS_MEAS_EN TW_CUR_DIS_
N
N
N
N
CSI
R/W-0h
15
R/W-0h
14
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
13
12
11
10
9
8
DET_FILTER
TW_CUR_DIS_ INT_CONFIG
CSO
TRIGGER
POLL_EN
CRC_T
POLL_ACT_TI
ME
R/W-0h
R/W-0h
5
R/W-0h
4
R/W-0h
3
R/W-0h
2
R/W-0h
1
R/W-0h
7
6
0
POLL_ACT_TIME
R/W-0h
POLL_TIME
R/W-0h
RESET
R/W-0h
LEGEND: R/W = Read/Write
表8-34. CONFIG Register Field Descriptions
Bit
Field
Type
Reset
Description
23
VS_RATIO
R/W
0h
0h = Use voltage divider factor of 3 for the VS measurement
1h = Use voltage divider factor of 10 for the VS measurement
22
ADC_DIAG_T
R/W
0h
For detailed descriptions for the ADC self-diagnostic feature, refer to
section ADC Self-Diagnostic
0h = Disable ADC self-diagnostic feature
1h = Enable ADC self-diagnostic feature
21
20
19
18
17
WET_D_IN3_EN
WET_D_IN2_EN
WET_D_IN1_EN
WET_D_IN0_EN
VS_MEAS_EN
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h = Disable wetting current diagnostic for input IN3
1h = Enable wetting current diagnostic for input IN3
0h = Disable wetting current diagnostic for input IN2
1h = Enable wetting current diagnostic for input IN2
0h = Disable wetting current diagnostic for input IN1
1h = Enable wetting current diagnostic for input IN1
0h = Disable wetting current diagnostic for input IN0
1h = Enable wetting current diagnostic for input IN0
For detailed descriptions for the VS measurement, refer to section
VS Measurement.
0h = Disable VS measurement at the end of every polling cycle
1h = Enable VS measurement at the end of every polling cycle
16
TW_CUR_DIS_CSI
DET_FILTER
R/W
R/W
0h
0h
0h = Enable wetting current reduction (to 2 mA) for 10 mA and 15
mA settings upon TW event for all inputs enabled with CSI.
1h = Disable wetting current reduction (to 2 mA) for 10 mA and 15
mA settings upon TW event for all inputs enabled with CSI.
15-14
For detailed descriptions for the detection filter, refer to section
Detection Filter.
0h = every sample is valid and taken for threshold evaluation
1h = 2 consecutive and equal samples required to be valid data
2h = 3 consecutive and equal samples required to be valid data
3h = 4 consecutive and equal samples required to be valid data
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表8-34. CONFIG Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
13
TW_CUR_DIS_CSO
INT_CONFIG
TRIGGER
R/W
0h
0h = Enable wetting current reduction (to 2 mA) for 10 mA and 15
mA settings upon TW event for all inputs enabled with CSO.
1h = Disable wetting current reduction (to 2 mA) for 10 mA and 15
mA settings upon TW event for all inputs enabled with CSO.
12
11
R/W
R/W
0h
0h
For detailed descriptions for the INT pin assertion scheme, refer to
section Interrupt Generation and /INT Assertion.
0h = INT pin assertion scheme set to static
1h = INT pin assertion scheme set to dynamic
When the TRIGGER bit is set to logic 1, normal device operation
(wetting current activation and polling) starts. To stop device
operation and keep the device in an idle state, de-assert this bit to 0.
After device normal operation is triggered, if at any time the device
setting needs to be re-configured, the microcontroller is required to
first set the bit TRIGGER to logic 0 to stop device operation. Once
the re-configuration is completed, the microcontroller can set the
TRIGGER bit back to logic 1 to re-start device operation. If re-
configuration is done on the fly without first stopping the device
operation, false switch status could be reported and accidental
interrupt might be issued. The following register bits are the
exception and can be configured when TRIGGER bit is set to logic 1:
•
•
•
•
TRIGGER (bit 11 of the CONFIG register)
CRC_T (bit 9 of the CONFIG register)
RESET (bit 0 of the CONFIG register)
The CCP_CFG1 register
0h = Stop TIC12400-Q1 from normal operation.
1h = Trigger TIC12400-Q1 from normal operation.
10
9
POLL_EN
CRC_T
R/W
R/W
0h
0h
0h = Polling disabled. Device operates in continuous mode.
1h = Polling enabled and the device operates in one of the polling
modes.
Set this bit to 1 to trigger a CRC calculation on all the configuration
register bits. Once triggered, it is strongly recommended the SPI
controller does not change the content of the configuration registers
until the CRC calculation is completed to avoid erroneous CRC
calculation result. The TIC12400-Q1 sets the CRC_CALC interrupt
bit and asserts the INT pin low when the CRC calculation is
completed. The calculated result will be available in the CRC
register. This bit self-clears back to 0 after CRC calculation is
executed.
0h = no CRC calculation triggered.
1h = trigger CRC calculation.
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表8-34. CONFIG Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
8-5
POLL_ACT_TIME
R/W
0h
0h = 64 μs
1h = 128 μs
2h = 192 μs
3h = 256 μs
4h = 320 μs
5h = 384 μs
6h = 448 μs
7h = 512 μs
8h = 640 μs
9h = 768 μs
Ah = 896 μs
Bh = 1024 μs
Ch = 2048 μs
Dh-15h = 512 μs (most frequently-used setting)
4-1
POLL_TIME
R/W
0h
0h = 2 ms
1h = 4 ms
2h = 8 ms
3h = 16 ms
4h = 32 ms
5h = 48 ms
6h = 64 ms
7h = 128 ms
8h = 256 ms
9h = 512 ms
Ah = 1024 ms
Bh = 2048 ms
Ch = 4096 ms
Dh-15h = 8 ms (most frequently-used setting)
0
RESET
R/W
0h
0h = No reset.
1h = Trigger software reset of the device.
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8.6.24 IN_EN Register (Offset = 1Bh) [Reset = 0h]
IN_EN is shown in 图8-47 and described in 表8-35.
Return to Summary Table.
图8-47. IN_EN Register
23
22
21
20
19
18
17
16
IN_EN_23
R/W-0h
IN_EN_22
R/W-0h
IN_EN_21
R/W-0h
IN_EN_20
R/W-0h
IN_EN_19
R/W-0h
IN_EN_18
R/W-0h
IN_EN_17
R/W-0h
IN_EN_16
R/W-0h
15
14
13
12
11
10
9
8
IN_EN_15
R/W-0h
IN_EN_14
R/W-0h
IN_EN_13
R/W-0h
IN_EN_12
R/W-0h
IN_EN_11
R/W-0h
IN_EN_10
R/W-0h
IN_EN_9
R/W-0h
IN_EN_8
R/W-0h
7
6
5
4
3
2
1
0
IN_EN_7
R/W-0h
IN_EN_6
R/W-0h
IN_EN_5
R/W-0h
IN_EN_4
R/W-0h
IN_EN_3
R/W-0h
IN_EN_2
R/W-0h
IN_EN_1
R/W-0h
IN_EN_0
R/W-0h
LEGEND: R/W = Read/Write
表8-35. IN_EN Register Field Descriptions
Bit
Field
Type
Reset
Description
23
IN_EN_23
R/W
0h
0h = Input channel IN23 disabled. Polling sequence skips this
channel
1h = Input channel IN23 enabled.
22
21
20
19
18
17
16
15
IN_EN_22
IN_EN_21
IN_EN_20
IN_EN_19
IN_EN_18
IN_EN_17
IN_EN_16
IN_EN_15
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input channel IN22 disabled. Polling sequence skips this
channel
1h = Input channel IN22 enabled.
0h = Input channel IN21 disabled. Polling sequence skips this
channel
1h = Input channel IN21 enabled.
0h = Input channel IN20 disabled. Polling sequence skips this
channel
1h = Input channel IN20 enabled.
0h = Input channel IN19 disabled. Polling sequence skips this
channel
1h = Input channel IN19 enabled.
0h = Input channel IN18 disabled. Polling sequence skips this
channel
1h = Input channel IN18 enabled.
0h = Input channel IN17 disabled. Polling sequence skips this
channel
1h = Input channel IN17 enabled.
0h = Input channel IN16 disabled. Polling sequence skips this
channel
1h = Input channel IN16 enabled.
0h = Input channel IN15 disabled. Polling sequence skips this
channel
1h = Input channel IN15 enabled.
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表8-35. IN_EN Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
14
IN_EN_14
R/W
0h
0h = Input channel IN14 disabled. Polling sequence skips this
channel
1h = Input channel IN14 enabled.
13
12
11
10
IN_EN_13
IN_EN_12
IN_EN_11
IN_EN_10
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h = Input channel IN13 disabled. Polling sequence skips this
channel
1h = Input channel IN13 enabled.
0h = Input channel IN12 disabled. Polling sequence skips this
channel
1h = Input channel IN12 enabled.
0h = Input channel IN11 disabled. Polling sequence skips this
channel
1h = Input channel IN11 enabled.
0h = Input channel IN10 disabled. Polling sequence skips this
channel
1h = Input channel IN10 enabled.
9
8
7
6
5
4
3
2
1
0
IN_EN_9
IN_EN_8
IN_EN_7
IN_EN_6
IN_EN_5
IN_EN_4
IN_EN_3
IN_EN_2
IN_EN_1
IN_EN_0
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Input channel IN9 disabled. Polling sequence skips this channel
1h = Input channel IN9 enabled.
0h = Input channel IN8 disabled. Polling sequence skips this channel
1h = Input channel IN8 enabled.
0h = Input channel IN7 disabled. Polling sequence skips this channel
1h = Input channel IN7 enabled.
0h = Input channel IN6 disabled. Polling sequence skips this channel
1h = Input channel IN6 enabled.
0h = Input channel IN5 disabled. Polling sequence skips this channel
1h = Input channel IN5 enabled.
0h = Input channel IN4 disabled. Polling sequence skips this channel
1h = Input channel IN4 enabled.
0h = Input channel IN3 disabled. Polling sequence skips this channel
1h = Input channel IN3 enabled.
0h = Input channel IN2 disabled. Polling sequence skips this channel
1h = Input channel IN2 enabled.
0h = Input channel IN1 disabled. Polling sequence skips this channel
1h = Input channel IN1 enabled.
0h = Input channel IN0 disabled. Polling sequence skips this channel
1h = Input channel IN0 enabled.
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8.6.25 CS_SELECT Register (Offset = 1Ch) [Reset = 0h]
CS_SELECT is shown in 图8-48 and described in 表8-36.
Return to Summary Table.
图8-48. CS_SELECT Register
23
22
21
20
19
18
RESERVED
R-0h
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
CS_IN9
R/W-0h
CS_IN8
R/W-0h
CS_IN7
R/W-0h
CS_IN6
R/W-0h
CS_IN5
R/W-0h
CS_IN4
R/W-0h
CS_IN3
R/W-0h
CS_IN2
R/W-0h
CS_IN1
R/W-0h
CS_IN0
R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-36. CS_SELECT Register Field Descriptions
Bit
Field
Type
Reset
Description
23-10
RESERVED
R
0h
Reserved
9
8
7
6
5
4
3
2
1
0
CS_IN9
CS_IN8
CS_IN7
CS_IN6
CS_IN5
CS_IN4
CS_IN3
CS_IN2
CS_IN1
CS_IN0
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
0h = Current Source (CSO) selected
1h = Current Sink (CSI) selected
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8.6.26 WC_CFG0 Register (Offset = 1Dh) [Reset = 0h]
WC_CFG0 is shown in 图8-49 and described in 表8-37.
Return to Summary Table.
图8-49. WC_CFG0 Register
23
11
22
21
9
20
8
19
18
17
16
WC_IN8_IN9
R/W-0h
15
3
14
2
13
12
WC_IN11
R/W-0h
10
WC_IN10
R/W-0h
7
WC_IN6_IN7
R/W-0h
6
5
4
1
0
WC_IN5
R/W-0h
WC_IN4
R/W-0h
WC_IN2_IN3
R/W-0h
WC_IN0_IN1
R/W-0h
LEGEND: R/W = Read/Write
表8-37. WC_CFG0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-21
WC_IN11
R/W
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
20-18
17-15
14-12
11-9
WC_IN10
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
WC_IN8_IN9
WC_IN6_IN7
WC_IN5
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
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表8-37. WC_CFG0 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
8-6
WC_IN4
R/W
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
5-3
2-0
WC_IN2_IN3
WC_IN0_IN1
R/W
R/W
0h
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
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8.6.27 WC_CFG1 Register (Offset = 1Eh) [Reset = 0h]
WC_CFG1 is shown in 图8-50 and described in 表8-38.
Return to Summary Table.
图8-50. WC_CFG1 Register
23
22
21
20
19
18
17
16
15
14
13
12
RESERV AUTO_S AUTO_S
WC_IN23
WC_IN22
WC_IN20_IN21
ED
CALE_DI CALE_DI
S_CSI
S_CSO
R/W-0h
9
R-0h
11
R/W-0h
R/W-0h
7
R/W-0h
4
R/W-0h
1
10
8
6
5
3
2
0
WC_IN18_IN19
R/W-0h
WC_IN16_IN17
R/W-0h
WC_IN14_IN15
R/W-0h
WC_IN12_IN13
R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-38. WC_CFG1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23
RESERVED
R
0h
Reserved
22
AUTO_SCALE_DIS_CSI R/W
0h
0h = Enable wetting current auto-scaling (to 2 mA) in continuous
mode for 10 mA and 15 mA settings upon switch closure for all
inputs enabled with CSI
1h = Disable wetting current auto-scaling (to 2 mA) in continuous
mode for 10 mA and 15 mA settings upon switch closure for all
inputs enabled with CS
For detailed descriptions for the wetting current auto-scaling, refer to
section Wetting Current Auto-Scaling.
21
AUTO_SCALE_DIS_CSO R/W
0h
0h = Enable wetting current auto-scaling (to 2 mA) in continuous
mode for 10 mA and 15 mA settings upon switch closure for all
inputs enabled with CSO
1h = Disable wetting current auto-scaling (to 2 mA) in continuous
mode for 10 mA and 15 mA settings upon switch closure for all
inputs enabled with CSO
For detailed descriptions for the wetting current auto-scaling, refer to
section Wetting Current Auto-Scaling.
20-18
17-15
WC_IN23
WC_IN22
R/W
R/W
0h
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
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表8-38. WC_CFG1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
14-12
WC_IN20_IN21
WC_IN18_IN19
WC_IN16_IN17
WC_IN14_IN15
WC_IN12_IN13
R/W
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
11-9
8-6
5-3
2-0
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
0h = no wetting current
1h = 1 mA (typical) wetting current
2h = 2 mA (typical) wetting current
3h = 5 mA (typical) wetting current
4h = 10 mA (typical) wetting current
5h-7h = 15 mA (typical) wetting current
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8.6.28 CCP_CFG0 Register (Offset = 1Fh) [Reset = 0h]
CCP_CFG0 is shown in 图8-51 and described in 表8-39.
Return to Summary Table.
图8-51. CCP_CFG0 Register
23
11
22
10
21
20
8
19
18
RESERVED
R-0h
17
16
15
3
14
2
13
1
12
0
9
7
6
5
4
RESERVED
CCP_TIME
WC_CCP WC_CCP WC_CCP WC_CCP
3
2
1
0
R-0h
R-0h
R-0h
R-0h
R-0h
R-0h
LEGEND: R/W = Read/Write; R = Read only
表8-39. CCP_CFG0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-7
RESERVED
R
0h
Reserved
6-4
CCP_TIME
R/W
0h
Wetting current activation time in CCP mode
0h = 64 μs
1h = 128 μs
2h = 192 μs
3h = 256 μs
4h = 320 μs
5h = 384 μs
6h = 448 μs
7h = 512 μs
3
2
1
0
WC_CCP3
WC_CCP2
WC_CCP1
WC_CCP0
R/W
R/W
R/W
R/W
0h
0h
0h
0h
Wetting current setting for IN18 to IN23 in CCP mode
0h = 10 mA (typical) wetting current
1h = 15 mA (typical) wetting current
Wetting current setting for IN12 to IN17 in CCP mode
0h = 10 mA (typical) wetting current
1h = 15 mA (typical) wetting current
Wetting current setting for IN6 to IN11 in CCP mode
0h = 10 mA (typical) wetting current
1h = 15 mA (typical) wetting current
Wetting current setting for IN0 to IN5 in CCP mode
0h = 10 mA (typical) wetting current
1h = 15 mA (typical) wetting current
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8.6.29 CCP_CFG1 Register (Offset = 20h) [Reset = 0h]
CCP_CFG1 is shown in 图8-52 and described in 表8-40.
Return to Summary Table.
图8-52. CCP_CFG1 Register
23
22
21
20
19
18
17
16
CCP_IN23
R/W-0h
CCP_IN22
R/W-0h
CCP_IN21
R/W-0h
CCP_IN20
R/W-0h
CCP_IN19
R/W-0h
CCP_IN18
R/W-0h
CCP_IN17
R/W-0h
CCP_IN16
R/W-0h
15
14
13
12
11
10
9
8
CCP_IN15
R/W-0h
CCP_IN14
R/W-0h
CCP_IN13
R/W-0h
CCP_IN12
R/W-0h
CCP_IN11
R/W-0h
CCP_IN10
R/W-0h
CCP_IN9
R/W-0h
CCP_IN8
R/W-0h
7
6
5
4
3
2
1
0
CCP_IN7
R/W-0h
CCP_IN6
R/W-0h
CCP_IN5
R/W-0h
CCP_IN4
R/W-0h
CCP_IN3
R/W-0h
CCP_IN2
R/W-0h
CCP_IN1
R/W-0h
CCP_IN0
R/W-0h
LEGEND: R/W = Read/Write
表8-40. CCP_CFG1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23
CCP_IN23
R/W
0h
0h = no CCP wetting current
1h = CCP wetting current activated
22
21
20
19
18
17
16
15
14
13
12
11
10
CCP_IN22
CCP_IN21
CCP_IN20
CCP_IN19
CCP_IN18
CCP_IN17
CCP_IN16
CCP_IN15
CCP_IN14
CCP_IN13
CCP_IN12
CCP_IN11
CCP_IN10
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
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表8-40. CCP_CFG1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
9
CCP_IN9
R/W
0h
0h = no CCP wetting current
1h = CCP wetting current activated
8
7
6
5
4
3
2
1
0
CCP_IN8
CCP_IN7
CCP_IN6
CCP_IN5
CCP_IN4
CCP_IN3
CCP_IN2
CCP_IN1
CCP_IN0
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
0h = no CCP wetting current
1h = CCP wetting current activated
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8.6.30 THRES_COMP Register (Offset = 21h) [Reset = 0h]
THRES_COMP is shown in 图8-53 and described in 表8-41.
Return to Summary Table.
图8-53. THRES_COMP Register
23
15
7
22
14
6
21
13
5
20
12
4
19
18
10
17
9
16
8
RESERVED
R-0h
11
RESERVED
R-0h
THRES_COMP_IN20_IN23
R/W-0h
THRES_COMP_IN16_IN19
R/W-0h
3
2
1
0
THRES_COMP_IN12_IN15
R/W-0h
THRES_COMP_IN8_IN11
R/W-0h
THRES_COMP_IN4_IN7
R/W-0h
THRES_COMP_IN0_IN3
R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-41. THRES_COMP Register Field Descriptions
Bit
Field
Type
Reset
Description
23-12
RESERVED
R
0h
Reserved
11-10
THRES_COMP_IN20_IN2 R/W
3
0h
0h
0h
0h
0h
These 2 bits configure the comparator thresholds for input channels
IN20 to IN23.
0h = comparator threshold set to 2 V
1h = comparator threshold set to 2.7 V
2h = comparator threshold set to 3 V
3h = comparator threshold set to 4 V
9-8
THRES_COMP_IN16_IN1 R/W
9
These 2 bits configure the comparator thresholds for input channels
IN16 to IN19.
0h = comparator threshold set to 2 V
1h = comparator threshold set to 2.7 V
2h = comparator threshold set to 3 V
3h = comparator threshold set to 4 V
7-6
THRES_COMP_IN12_IN1 R/W
5
These 2 bits configure the comparator thresholds for input channels
IN12 to IN15.
0h = comparator threshold set to 2 V
1h = comparator threshold set to 2.7 V
2h = comparator threshold set to 3 V
3h = comparator threshold set to 4 V
5-4
THRES_COMP_IN8_IN11 R/W
These 2 bits configure the comparator thresholds for input channels
IN8 to IN11.
0h = comparator threshold set to 2 V
1h = comparator threshold set to 2.7 V
2h = comparator threshold set to 3 V
3h = comparator threshold set to 4 V
3-2
THRES_COMP_IN4_IN7 R/W
These 2 bits configure the comparator thresholds for input channels
IN4 to IN7
0h = comparator threshold set to 2 V
1h = comparator threshold set to 2.7 V
2h = comparator threshold set to 3 V
3h = comparator threshold set to 4 V
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表8-41. THRES_COMP Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
1-0
THRES_COMP_IN0_IN3 R/W
0h
These 2 bits configure the comparator thresholds for input channels
IN0 to IN3
0h = comparator threshold set to 2 V
1h = comparator threshold set to 2.7 V
2h = comparator threshold set to 3 V
3h = comparator threshold set to 4 V
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8.6.31 INT_EN_COMP1 Register (Offset = 22h) [Reset = 0h]
INT_EN_COMP1 is shown in 图8-54 and described in 表8-42.
Return to Summary Table.
图8-54. INT_EN_COMP1 Register
23
INC_EN_11
R/W-0h
22
21
INC_EN_10
R/W-0h
20
19
INC_EN_9
R/W-0h
18
17
INC_EN_8
R/W-0h
16
15
INC_EN_7
R/W-0h
14
13
INC_EN_6
R/W-0h
12
11
10
9
8
7
6
5
4
3
2
1
0
INC_EN_5
R/W-0h
INC_EN_4
R/W-0h
INC_EN_3
R/W-0h
INC_EN_2
R/W-0h
INC_EN_1
R/W-0h
INC_EN_0
R/W-0h
LEGEND: R/W = Read/Write
表8-42. INT_EN_COMP1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-22
INC_EN_11
R/W
0h
0h = no interrupt generation for IN11.
1h = interrupt generation on rising edge above
THRES_COMP_IN8_IN11 for IN11.
2h = interrupt generation on falling edge below
THRES_COMP_IN8_IN11 for IN11.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN8_IN11 for IN11.
21-20
19-18
17-16
15-14
INC_EN_10
INC_EN_9
INC_EN_8
INC_EN_7
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h = no interrupt generation for IN10
1h = interrupt generation on rising edge above
THRES_COMP_IN8_IN11 for IN10.
2h = interrupt generation on falling edge below
THRES_COMP_IN8_IN11 for IN10.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN8_IN11 for IN10.
0h = no interrupt generation for IN9.
1h = interrupt generation on rising edge above
THRES_COMP_IN8_IN11 for IN9.
2h = interrupt generation on falling edge below
THRES_COMP_IN8_IN11 for IN9.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN8_IN11 for IN9.
0h = no interrupt generation for IN8.
1h = interrupt generation on rising edge above
THRES_COMP_IN8_IN11 for IN8.
2h = interrupt generation on falling edge below
THRES_COMP_IN8_IN11 for IN8.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN8_IN11 for IN8.
0h = no interrupt generation for IN7.
1h = interrupt generation on rising edge above
THRES_COMP_IN4_IN7 for IN7.
2h = interrupt generation on falling edge below
THRES_COMP_IN4_IN7 for IN7.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN4_IN7 for IN7.
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表8-42. INT_EN_COMP1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
13-12
INC_EN_6
R/W
0h
0h = no interrupt generation for IN6.
1h = interrupt generation on rising edge above
THRES_COMP_IN4_IN7 for IN6.
2h = interrupt generation on falling edge below
THRES_COMP_IN4_IN7 for IN6.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN4_IN7 for IN6.
11-10
INC_EN_5
INC_EN_4
INC_EN_3
INC_EN_2
INC_EN_1
INC_EN_0
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h = no interrupt generation for IN5.
1h = interrupt generation on rising edge above
THRES_COMP_IN4_IN7 for IN5.
2h = interrupt generation on falling edge below
THRES_COMP_IN4_IN7 for IN5.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN4_IN7 for IN5.
9-8
0h = no interrupt generation for IN4.
1h = interrupt generation on rising edge above
THRES_COMP_IN4_IN7 for IN4.
2h = interrupt generation on falling edge below
THRES_COMP_IN4_IN7 for IN4.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN4_IN7 for IN4.
7-6
0h = no interrupt generation for IN3.
1h = interrupt generation on rising edge above
THRES_COMP_IN0_IN3 for IN3.
2h = interrupt generation on falling edge below
THRES_COMP_IN0_IN3 for IN3.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN0_IN3 for IN3.
5-4
0h = no interrupt generation for IN2.
1h = interrupt generation on rising edge above
THRES_COMP_IN0_IN3 for IN2.
2h = interrupt generation on falling edge below
THRES_COMP_IN0_IN3 for IN2.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN0_IN3 for IN2.
3-2
0h = no interrupt generation for IN1.
1h = interrupt generation on rising edge above
THRES_COMP_IN0_IN3 for IN1.
2h = interrupt generation on falling edge below
THRES_COMP_IN0_IN3 for IN1.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN0_IN3 for IN1.
1-0
0h = no interrupt generation for IN0.
1h = interrupt generation on rising edge above
THRES_COMP_IN0_IN3 for IN0.
2h = interrupt generation on falling edge below
THRES_COMP_IN0_IN3 for IN0.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN0_IN3 for IN0.
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8.6.32 INT_EN_COMP2 Register (Offset = 23h) [Reset = 0h]
INT_EN_COMP2 is shown in 图8-55 and described in 表8-43.
Return to Summary Table.
图8-55. INT_EN_COMP2 Register
23
INC_EN_23
R/W-0h
22
21
INC_EN_22
R/W-0h
20
19
INC_EN_21
R/W-0h
18
17
INC_EN_20
R/W-0h
16
15
INC_EN_19
R/W-0h
14
13
INC_EN_18
R/W-0h
12
11
10
9
8
7
6
5
4
3
2
1
0
INC_EN_17
R/W-0h
INC_EN_16
R/W-0h
INC_EN_15
R/W-0h
INC_EN_14
R/W-0h
INC_EN_13
R/W-0h
INC_EN_12
R/W-0h
LEGEND: R/W = Read/Write
表8-43. INT_EN_COMP2 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-22
INC_EN_23
R/W
0h
0h = no interrupt generation for IN23.
1h = interrupt generation on rising edge above
THRES_COMP_IN20_IN23 for IN23.
2h = interrupt generation on falling edge below
THRES_COMP_IN20_IN23 for IN23.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN20_IN23 for IN23.
21-20
19-18
17-16
15-14
INC_EN_22
INC_EN_21
INC_EN_20
INC_EN_19
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h = no interrupt generation for IN22.
1h = interrupt generation on rising edge above
THRES_COMP_IN20_IN23 for IN22.
2h = interrupt generation on falling edge below
THRES_COMP_IN20_IN23 for IN22.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN20_IN23 for IN22.
0h = no interrupt generation for IN21.
1h = interrupt generation on rising edge above
THRES_COMP_IN20_IN23 for IN21.
2h = interrupt generation on falling edge below
THRES_COMP_IN20_IN23 for IN21.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN20_IN23 for IN21.
0h = no interrupt generation for IN20.
1h = interrupt generation on rising edge above
THRES_COMP_IN20_IN23 for IN20.
2h = interrupt generation on falling edge below
THRES_COMP_IN20_IN23 for IN20.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN20_IN23 for IN20.
0h = no interrupt generation for IN19.
1h = interrupt generation on rising edge above
THRES_COMP_IN16_IN19 for IN19.
2h = interrupt generation on falling edge below
THRES_COMP_IN16_IN19 for IN19.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN16_IN19 for IN19.
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表8-43. INT_EN_COMP2 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
13-12
INC_EN_18
R/W
0h
0h = no interrupt generation for IN18.
1h = interrupt generation on rising edge above
THRES_COMP_IN16_IN19 for IN18.
2h = interrupt generation on falling edge below
THRES_COMP_IN16_IN19 for IN18.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN16_IN19 for IN18.
11-10
INC_EN_17
INC_EN_16
INC_EN_15
INC_EN_14
INC_EN_13
INC_EN_12
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h = no interrupt generation for IN17.
1h = interrupt generation on rising edge above
THRES_COMP_IN16_IN19 for IN17.
2h = interrupt generation on falling edge below
THRES_COMP_IN16_IN19 for IN17.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN16_IN19 for IN17.
9-8
0h = no interrupt generation for IN16.
1h = interrupt generation on rising edge above
THRES_COMP_IN16_IN19 for IN16.
2h = interrupt generation on falling edge below
THRES_COMP_IN16_IN19 for IN16.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN16_IN19 for IN16.
7-6
0h = no interrupt generation for IN15.
1h = interrupt generation on rising edge above
THRES_COMP_IN12_IN15 for IN15.
2h = interrupt generation on falling edge below
THRES_COMP_IN12_IN15 for IN15.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN12_IN15 for IN15.
5-4
0h = no interrupt generation for IN14.
1h = interrupt generation on rising edge above
THRES_COMP_IN12_IN15 for IN14.
2h = interrupt generation on falling edge below
THRES_COMP_IN12_IN15 for IN14.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN12_IN15 for IN14.
3-2
0h = no interrupt generation for IN13.
1h = interrupt generation on rising edge above
THRES_COMP_IN12_IN15 for IN13.
2h = interrupt generation on falling edge below
THRES_COMP_IN12_IN15 for IN13.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN12_IN15 for IN13.
1-0
0h = no interrupt generation for IN12.
1h = interrupt generation on rising edge above
THRES_COMP_IN12_IN15 for IN12.
2h = interrupt generation on falling edge below
THRES_COMP_IN12_IN15 for IN12.
3h = interrupt generation on falling and rising edge of
THRES_COMP_IN12_IN15 for IN12.
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8.6.33 INT_EN_CFG0 Register (Offset = 24h) [Reset = 0h]
INT_EN_CFG0 is shown in 图8-56 and described in 表8-44.
Return to Summary Table.
图8-56. INT_EN_CFG0 Register
23
15
7
22
14
6
21
20
19
18
10
17
16
RESERVED
R-0h
13
12
11
9
8
RESERVED
R-0h
ADC_DIAG_EN WET_DIAG_EN
VS1_EN
R/W-0h
VS0_EN
R/W-0h
R/W-0h
R/W-0h
5
4
3
2
1
0
CRC_CALC_E
N
UV_EN
OV_EN
TW_EN
TSD_EN
SSC_EN
PRTY_FAIL_EN SPI_FAIL_EN
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-44. INT_EN_CFG0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-12
RESERVED
R
0h
Reserved
11
10
9
ADC_DIAG_EN
WET_DIAG_EN
VS1_EN
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = INT pin assertion due to ADC error disabled.
1h = INT pin assertion due to ADC error enabled.
0h = INT pin assertion due to wetting current error disabled.
1h = INT pin assertion due to wetting current error enabled.
0h = INT pin assertion due to VS1 threshold crossing disabled.
1h = INT pin assertion due to VS1 threshold crossing enabled.
8
VS0_EN
0h = INT pin assertion due to VS0 threshold crossing disabled.
1h = INT pin assertion due to VS0 threshold crossing enabled.
7
CRC_CALC_EN
UV_EN
0h = INT pin assertion due to CRC calculation completion disabled.
1h = INT pin assertion due to CRC calculation completion enabled.
6
0h = INT pin assertion due to UV event disabled.
1h = INT pin assertion due to UV event enabled.
5
OV_EN
0h = INT pin assertion due to OV event disabled.
1h = INT pin assertion due to OV event enabled.
4
TW_EN
0h = INT pin assertion due to TW event disabled.
1h = INT pin assertion due to TW event enabled.
3
TSD_EN
0h = INT pin assertion due to TSD event disabled.
1h = INT pin assertion due to TSD event enabled.
2
SSC_EN
0h = INT pin assertion due to SSC event disabled.
1h = INT pin assertion due to SSC event enabled.
1
PRTY_FAIL_EN
SPI_FAIL_EN
0h = INT pin assertion due to parity fail event disabled.
1h = INT pin assertion due to parity fail event enabled.
0
0h = INT pin assertion due to SPI fail event disabled.
1h = INT pin assertion due to SPI fail event enabled.
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8.6.34 INT_EN_CFG1 Register (Offset = 25h) [Reset = 0h]
INT_EN_CFG1 is shown in 图8-57 and described in 表8-45.
Return to Summary Table.
图8-57. INT_EN_CFG1 Register
23
11
22
10
21
9
20
8
19
18
17
16
15
3
14
2
13
1
12
IN6_EN
R/W-0h
0
IN11_EN
R/W-0h
IN10_EN
R/W-0h
IN9_EN
R/W-0h
IN8_EN
R/W-0h
IN7_EN
R/W-0h
7
6
5
4
IN5_EN
R/W-0h
IN4_EN
R/W-0h
IN3_EN
R/W-0h
IN2_EN
R/W-0h
IN1_EN
R/W-0h
IN0_EN
R/W-0h
LEGEND: R/W = Read/Write
表8-45. INT_EN_CFG1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-22
IN11_EN
R/W
0h
0h = no interrupt generation for IN11.
1h = interrupt generation on rising edge above THRESx for IN11.
2h = interrupt generation on falling edge below THRESx for IN11.
3h = interrupt generation on falling and rising edge of THRESx for
IN11.
21-20
19-18
17-16
15-14
13-12
11-10
IN10_EN
IN9_EN
IN8_EN
IN7_EN
IN6_EN
IN5_EN
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h = no interrupt generation for IN10.
1h = interrupt generation on rising edge above THRESx for IN10.
2h = interrupt generation on falling edge below THRESx for IN10.
3h = interrupt generation on falling and rising edge of THRESx for
IN10.
0h = no interrupt generation for IN9.
1h = interrupt generation on rising edge above THRESx for IN9.
2h = interrupt generation on falling edge below THRESx for IN9.
3h = interrupt generation on falling and rising edge of THRESx for
IN9.
0h = no interrupt generation for IN8.
1h = interrupt generation on rising edge above THRESx for IN8.
2h = interrupt generation on falling edge below THRESx for IN8.
3h = interrupt generation on falling and rising edge of THRESx for
IN8.
0h = no interrupt generation for IN7.
1h = interrupt generation on rising edge above THRESx for IN7.
2h = interrupt generation on falling edge below THRESx for IN7.
3h = interrupt generation on falling and rising edge of THRESx for
IN7.
0h = no interrupt generation for IN6.
1h = interrupt generation on rising edge above THRESx for IN6.
2h = interrupt generation on falling edge below THRESx for IN6.
3h = interrupt generation on falling and rising edge of THRESx for
IN6.
0h = no interrupt generation for IN5.
1h = interrupt generation on rising edge above THRESx for IN5.
2h = interrupt generation on falling edge below THRESx for IN5.
3h = interrupt generation on falling and rising edge of THRESx for
IN5.
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表8-45. INT_EN_CFG1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
9-8
IN4_EN
IN3_EN
IN2_EN
IN1_EN
IN0_EN
R/W
0h
0h = no interrupt generation for IN4.
1h = interrupt generation on rising edge above THRESx for IN4.
2h = interrupt generation on falling edge below THRESx for IN4.
3h = interrupt generation on falling and rising edge of THRESx for
IN4.
7-6
5-4
3-2
1-0
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h = no interrupt generation for IN3.
1h = interrupt generation on rising edge above THRESx for IN3.
2h = interrupt generation on falling edge below THRESx for IN3.
3h = interrupt generation on falling and rising edge of THRESx for
IN3.
0h = no interrupt generation for IN2.
1h = interrupt generation on rising edge above THRESx for IN2.
2h = interrupt generation on falling edge below THRESx for IN2.
3h = interrupt generation on falling and rising edge of THRESx for
IN2.
0h = no interrupt generation for IN1.
1h = interrupt generation on rising edge above THRESx for IN1.
2h = interrupt generation on falling edge below THRESx for IN1.
3h = interrupt generation on falling and rising edge of THRESx for
IN1.
0h = no interrupt generation for IN0.
1h = interrupt generation on rising edge above THRESx for IN0.
2h = interrupt generation on falling edge below THRESx for IN0.
3h = interrupt generation on falling and rising edge of THRESx for
IN0.
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8.6.35 INT_EN_CFG2 Register (Offset = 26h) [Reset = 0h]
INT_EN_CFG2 is shown in 图8-58 and described in 表8-46.
Return to Summary Table.
图8-58. INT_EN_CFG2 Register
23
11
22
10
21
9
20
8
19
18
17
16
15
3
14
2
13
1
12
0
IN17_EN
R/W-0h
IN16_EN
R/W-0h
IN15_EN
R/W-0h
7
6
5
4
IN14_EN
R/W-0h
IN13_EN
R/W-0h
IN12_EN
R/W-0h
LEGEND: R/W = Read/Write
表8-46. INT_EN_CFG2 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
IN17_EN
R/W
0h
xx00: no interrupt generation for IN17 w.r.t. THRES2A.
xx01: interrupt generation on rising edge above THRES2A for IN17.
xx10: interrupt generation on falling edge below THRES2A for IN17.
xx11: interrupt generation on falling and rising edge of THRES2A for
IN17.
00xx: no interrupt generation for IN17 w.r.t. THRES2B.
01xx: interrupt generation on rising edge above THRES2B for IN17.
10xx: interrupt generation on falling edge below THRES2B for IN17.
11xx: interrupt generation on falling and rising edge of THRES2B for
IN17.
19-16
IN16_EN
R/W
0h
xx00: no interrupt generation for IN16 w.r.t. THRES2A.
xx01: interrupt generation on rising edge above THRES2A for IN16.
xx10: interrupt generation on falling edge below THRES2A for IN16.
xx11: interrupt generation on falling and rising edge of THRES2A for
IN16.
00xx: no interrupt generation for IN16 w.r.t. THRES2B.
01xx: interrupt generation on rising edge above THRES2B for IN16.
10xx: interrupt generation on falling edge below THRES2B for IN16.
11xx: interrupt generation on falling and rising edge of THRES2B for
IN16.
15-12
IN15_EN
R/W
0h
xx00: no interrupt generation for IN15 w.r.t. THRES2A.
xx01: interrupt generation on rising edge above THRES2A for IN15.
xx10: interrupt generation on falling edge below THRES2A for IN15.
xx11: interrupt generation on falling and rising edge of THRES2A for
IN15.
00xx: no interrupt generation for IN15 w.r.t. THRES2B.
01xx: interrupt generation on rising edge above THRES2B for IN15.
10xx: interrupt generation on falling edge below THRES2B for IN15.
11xx: interrupt generation on falling and rising edge of THRES2B for
IN15.
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表8-46. INT_EN_CFG2 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
11-8
IN14_EN
IN13_EN
IN12_EN
R/W
0h
xx00: no interrupt generation for IN14 w.r.t. THRES2A.
xx01: interrupt generation on rising edge above THRES2A for IN14.
xx10: interrupt generation on falling edge below THRES2A for IN14.
xx11: interrupt generation on falling and rising edge of THRES2A for
IN14.
00xx: no interrupt generation for IN14 w.r.t. THRES2B.
01xx: interrupt generation on rising edge above THRES2B for IN14.
10xx: interrupt generation on falling edge below THRES2B for IN14.
11xx: interrupt generation on falling and rising edge of THRES2B for
IN14.
7-4
R/W
0h
xx00: no interrupt generation for IN13 w.r.t. THRES2A.
xx01: interrupt generation on rising edge above THRES2A for IN13.
xx10: interrupt generation on falling edge below THRES2A for IN13.
xx11: interrupt generation on falling and rising edge of THRES2A for
IN13.
00xx: no interrupt generation for IN13 w.r.t. THRES2B.
01xx: interrupt generation on rising edge above THRES2B for IN13.
10xx: interrupt generation on falling edge below THRES2B for IN13.
11xx: interrupt generation on falling and rising edge of THRES2B for
IN13.
3-0
R/W
0h
xx00: no interrupt generation for IN12 w.r.t. THRES2A.
xx01: interrupt generation on rising edge above THRES2A for IN12.
xx10: interrupt generation on falling edge below THRES2A for IN12.
xx11: interrupt generation on falling and rising edge of THRES2A for
IN12.
00xx: no interrupt generation for IN12 w.r.t. THRES2B.
01xx: interrupt generation on rising edge above THRES2B for IN12.
10xx: interrupt generation on falling edge below THRES2B for IN12.
11xx: interrupt generation on falling and rising edge of THRES2B for
IN12.
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8.6.36 INT_EN_CFG3 Register (Offset = 27h) [Reset = 0h]
INT_EN_CFG3 is shown in 图8-59 and described in 表8-47.
Return to Summary Table.
图8-59. INT_EN_CFG3 Register
23
11
22
10
21
9
20
8
19
18
17
16
15
3
14
2
13
1
12
0
IN21_EN
R/W-0h
IN20_EN
R/W-0h
7
6
5
4
IN19_EN
R/W-0h
IN18_EN
R/W-0h
LEGEND: R/W = Read/Write
表8-47. INT_EN_CFG3 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-18
IN21_EN
R/W
0h
xxxx00: no interrupt generation for IN21 w.r.t. THRES3A
xxxx01: interrupt generation on rising edge above THRES3A for
IN21
xxxx10: interrupt generation on falling edge below THRES3A for
IN21
xxxx11: interrupt generation on falling and rising edge of THRES3A
for IN21
xx00xx: no interrupt generation for IN21 w.r.t. THRES3B
xx01xx: interrupt generation on rising edge above THRES3B for
IN21
xx10xx: interrupt generation on falling edge below THRES3B for
IN21
xx11xx: interrupt generation on falling and rising edge of THRES3B
for IN21
00xxxx: no interrupt generation for IN21 w.r.t. THRES3C
01xxxx: interrupt generation on rising edge above THRES3C for
IN21
10xxxx: interrupt generation on falling edge below THRES3C for
IN21
11xxxx: interrupt generation on falling and rising edge of THRES3C
for IN21
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表8-47. INT_EN_CFG3 Register Field Descriptions (continued)
Bit
Field
IN20_EN
Type
Reset
Description
17-12
R/W
0h
xxxx00: no interrupt generation for IN20 w.r.t. THRES3A
xxxx01: interrupt generation on rising edge above THRES3A for
IN20
xxxx10: interrupt generation on falling edge below THRES3A for
IN20
xxxx11: interrupt generation on falling and rising edge of THRES3A
for IN20
xx00xx: no interrupt generation for IN20 w.r.t. THRES3B
xx01xx: interrupt generation on rising edge above THRES3B for
IN20
xx10xx: interrupt generation on falling edge below THRES3B for
IN20
xx11xx: interrupt generation on falling and rising edge of THRES3B
for IN20
00xxxx: no interrupt generation for IN20 w.r.t. THRES3C
01xxxx: interrupt generation on rising edge above THRES3C for
IN20
10xxxx: interrupt generation on falling edge below THRES3C for
IN20
11xxxx: interrupt generation on falling and rising edge of THRES3C
for IN20
11-6
IN19_EN
R/W
0h
xxxx00: no interrupt generation for IN19 w.r.t. THRES3A
xxxx01: interrupt generation on rising edge above THRES3A for
IN19
xxxx10: interrupt generation on falling edge below THRES3A for
IN19
xxxx11: interrupt generation on falling and rising edge of THRES3A
for IN19
xx00xx: no interrupt generation for IN19 w.r.t. THRES3B
xx01xx: interrupt generation on rising edge above THRES3B for
IN19
xx10xx: interrupt generation on falling edge below THRES3B for
IN19
xx11xx: interrupt generation on falling and rising edge of THRES3B
for IN19
00xxxx: no interrupt generation for IN19 w.r.t. THRES3C
01xxxx: interrupt generation on rising edge above THRES3C for
IN19
10xxxx: interrupt generation on falling edge below THRES3C for
IN19
11xxxx: interrupt generation on falling and rising edge of THRES3C
for IN19
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表8-47. INT_EN_CFG3 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
5-0
IN18_EN
R/W
0h
xxxx00: no interrupt generation for IN18 w.r.t. THRES3A
xxxx01: interrupt generation on rising edge above THRES3A for
IN18
xxxx10: interrupt generation on falling edge below THRES3A for
IN18
xxxx11: interrupt generation on falling and rising edge of THRES3A
for IN18
xx00xx: no interrupt generation for IN18 w.r.t. THRES3B
xx01xx: interrupt generation on rising edge above THRES3B for
IN18
xx10xx: interrupt generation on falling edge below THRES3B for
IN18
xx11xx: interrupt generation on falling and rising edge of THRES3B
for IN18
00xxxx: no interrupt generation for IN18 w.r.t. THRES3C
01xxxx: interrupt generation on rising edge above THRES3C for
IN18
10xxxx: interrupt generation on falling edge below THRES3C for
IN18
11xxxx: interrupt generation on falling and rising edge of THRES3C
for IN18
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8.6.37 INT_EN_CFG4 Register (Offset = 28h) [Reset = 0h]
INT_EN_CFG4 is shown in 图8-60 and described in 表8-48.
Return to Summary Table.
图8-60. INT_EN_CFG4 Register
23
11
22
VS_TH1_EN
R/W-0h
21
20
8
19
18
VS_TH0_EN
R/W-0h
17
16
15
3
14
2
13
1
12
0
IN23_EN
R/W-0h
10
9
7
6
5
4
IN23_EN
R/W-0h
IN22_EN
R/W-0h
LEGEND: R/W = Read/Write
表8-48. INT_EN_CFG4 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
VS_TH1_EN
R/W
0h
xx00: no interrupt generation for VS w.r.t. VS1_THRES2A.
xx01: interrupt generation on rising edge above VS1_THRES2A for
VS.
xx10: interrupt generation on falling edge below VS1_THRES2A for
VS.
xx11: interrupt generation on falling and rising edge of
VS1_THRES2A for VS.
00xx: no interrupt generation for VS w.r.t. VS1_THRES2B.
01xx: interrupt generation on rising edge above VS1_THRES2B for
VS.
10xx: interrupt generation on falling edge below VS1_THRES2B for
VS.
11xx: interrupt generation on falling and rising edge of
VS1_THRES2B for VS.
19-16
VS_TH0_EN
R/W
0h
xx00: no interrupt generation for VS w.r.t. VS0_THRES2A.
xx01: interrupt generation on rising edge above VS0_THRES2A for
VS.
xx10: interrupt generation on falling edge below VS0_THRES2A for
VS.
xx11: interrupt generation on falling and rising edge of
VS0_THRES2A for VS.
00xx: no interrupt generation for VS w.r.t. VS0_THRES2B.
01xx: interrupt generation on rising edge above VS0_THRES2B for
VS.
10xx: interrupt generation on falling edge below VS0_THRES2B for
VS.
11xx: interrupt generation on falling and rising edge of
VS0_THRES2B for VS.
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表8-48. INT_EN_CFG4 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
15-6
IN23_EN
R/W
0h
xxxxxxxx00: no interrupt generation for IN23 w.r.t. THRES3A.
xxxxxxxx01: interrupt generation on rising edge above THRES3A for
IN23.
xxxxxxxx10: interrupt generation on falling edge below THRES3A for
IN23.
xxxxxxxx11: interrupt generation on falling and rising edge of
THRES3A for IN23.
xxxxxx00xx: no interrupt generation for IN23 w.r.t. THRES3B.
xxxxxx01xx: interrupt generation on rising edge above THRES3B for
IN23.
xxxxxx10xx: interrupt generation on falling edge below THRES3B for
IN23.
xxxxxx11xx: interrupt generation on falling and rising edge of
THRES3B for IN23.
xxxx00xxxx: no interrupt generation for IN23 w.r.t. THRES3C.
xxxx01xxxx: interrupt generation on rising edge above THRES3C for
IN23.
xxxx10xxxx: interrupt generation on falling edge below THRES3C for
IN23.
xxxx11xxxx: interrupt generation on falling and rising edge of
THRES3C for IN23.
xx00xxxxxx: no interrupt generation for IN23 w.r.t. THRES8.
xx01xxxxxx: interrupt generation on rising edge above THRES8 for
IN23.
xx10xxxxxx: interrupt generation on falling edge below THRES8 for
IN23.
xx11xxxxxx: interrupt generation on falling and rising edge of
THRES8 for IN23.
00xxxxxxxx: no interrupt generation for IN23 w.r.t. THRES9.
01xxxxxxxx: interrupt generation on rising edge above THRES9 for
IN23.
10xxxxxxxx: interrupt generation on falling edge below THRES9 for
IN23.
11xxxxxxxx: interrupt generation on falling and rising edge of
THRES9 for IN23.
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表8-48. INT_EN_CFG4 Register Field Descriptions (continued)
Bit
Field
IN22_EN
Type
Reset
Description
5-0
R/W
0h
xxxx00: no interrupt generation for IN22 w.r.t. THRES3A.
xxxx01: interrupt generation on rising edge above THRES3A for
IN22.
xxxx10: interrupt generation on falling edge below THRES3A for
IN22.
xxxx11: interrupt generation on falling and rising edge of THRES3A
for IN22.
xx00xx: no interrupt generation for IN22 w.r.t. THRES3B.
xx01xx: interrupt generation on rising edge above THRES3B for
IN22.
xx10xx: interrupt generation on falling edge below THRES3B for
IN22.
xx11xx: interrupt generation on falling and rising edge of THRES3B
for IN22.
00xxxx: no interrupt generation for IN22 w.r.t. THRES3C.
01xxxx: interrupt generation on rising edge above THRES3C for
IN22.
10xxxx: interrupt generation on falling edge below THRES3C for
IN22.
11xxxx: interrupt generation on falling and rising edge of THRES3C
for IN22.
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8.6.38 THRES_CFG0 Register (Offset = 29h) [Reset = 0h]
THRES_CFG0 is shown in 图8-61 and described in 表8-49.
Return to Summary Table.
图8-61. THRES_CFG0 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
THRES1
R-0h
THRES0
R-0h
LEGEND: R/W = Read/Write; R = Read only
表8-49. THRES_CFG0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
THRES1
R/W
R/W
0h
0h
10-bits value of threshold 1:
Bit10: LSB
Bit19: MSB
9-0
THRES0
10-bits value of threshold 0
Bit0: LSB
Bit9: MSB
8.6.39 THRES_CFG1 Register (Offset = 2Ah) [Reset = 0h]
THRES_CFG1 is shown in 图8-62 and described in 表8-50.
Return to Summary Table.
图8-62. THRES_CFG1 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
THRES3
R-0h
THRES2
R-0h
LEGEND: R/W = Read/Write; R = Read only
表8-50. THRES_CFG1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
THRES3
R/W
R/W
0h
0h
10-bits value of threshold 3:
Bit10: LSB
Bit19: MSB
9-0
THRES2
10-bits value of threshold 2
Bit0: LSB
Bit9: MSB
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8.6.40 THRES_CFG2 Register (Offset = 2Bh) [Reset = 0h]
THRES_CFG2 is shown in 图8-63 and described in 表8-51.
Return to Summary Table.
图8-63. THRES_CFG2 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
THRES5
R-0h
THRES4
R-0h
LEGEND: R/W = Read/Write; R = Read only
表8-51. THRES_CFG2 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
THRES5
R/W
R/W
0h
0h
10-bits value of threshold 5:
Bit10: LSB
Bit19: MSB
10-1
THRES4
10-bits value of threshold 4:
Bit0: LSB
Bit9: MSB
8.6.41 THRES_CFG3 Register (Offset = 2Ch) [Reset = X]
THRES_CFG3 is shown in 图8-64 and described in 表8-52.
Return to Summary Table.
图8-64. THRES_CFG3 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
THRES6
R-0h
THRES7
R-0h
LEGEND: R/W = Read/Write; R = Read only
表8-52. THRES_CFG3 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
THRES7
R/W
R/W
0h
0h
10-bits value of threshold 7:
Bit10: LSB
Bit19: MSB
9-0
THRES6
10-bits value of threshold 6:
Bit0: LSB
Bit9: MSB
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8.6.42 THRES_CFG4 Register (Offset = 2Dh) [Reset = X]
THRES_CFG4 is shown in 图8-65 and described in 表8-53.
Return to Summary Table.
图8-65. THRES_CFG4 Register
23 22 21 20 19 18 17 16 15 14 13 12
11
10
9
8
7
6
5
4
3
2
1
0
RESERVED
R-0h
THRES9
R-0h
THRES8
R-0h
LEGEND: R/W = Read/Write; R = Read only
表8-53. THRES_CFG4 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-20
RESERVED
R
0h
Reserved
19-10
THRES9
R/W
R/W
0h
0h
10-bits value of threshold 9:
Bit10: LSB
Bit19: MSB
9-0
THRES8
10-bits value of threshold 8:
Bit0: LSB
Bit9: MSB
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8.6.43 THRESMAP_CFG0 Register (Offset = 2Eh) [Reset = 0h]
THRESMAP_CFG0 is shown in 图8-66 and described in 表8-54.
Return to Summary Table.
图8-66. THRESMAP_CFG0 Register
23
11
22
THRESMAP_IN7
R/W-0h
21
9
20
8
19
18
17
16
15
3
14
2
13
THRESMAP_IN4
R/W-0h
12
0
THRESMAP_IN6
THRESMAP_IN5
R/W-0h
7
R/W-0h
4
10
6
5
1
THRESMAP_IN3
R/W-0h
THRESMAP_IN2
R/W-0h
THRESMAP_IN1
R/W-0h
THRESMAP_IN0
R/W-0h
LEGEND: R/W = Read/Write
表8-54. THRESMAP_CFG0 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-21
THRESMAP_IN7
R/W
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
20-18
17-15
14-12
THRESMAP_IN6
THRESMAP_IN5
THRESMAP_IN4
R/W
R/W
R/W
0h
0h
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
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表8-54. THRESMAP_CFG0 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
11-9
THRESMAP_IN3
R/W
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
8-6
5-3
2-0
THRESMAP_IN2
THRESMAP_IN1
THRESMAP_IN0
R/W
R/W
R/W
0h
0h
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
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8.6.44 THRESMAP_CFG1 Register (Offset = 2Fh) [Reset = 0h]
THRESMAP_CFG1 is shown in 图8-67 and described in 表8-55.
Return to Summary Table.
图8-67. THRESMAP_CFG1 Register
23
22
21
20
19
18
17
16
15
14
13
12
RESERVED
THRESMAP_IN12_IN17_THRES THRESMAP_IN12_IN17_THRES
2B
R/W-0h
2A
R/W-0h
R/W-0h
11
10
9
8
7
6
5
4
3
2
1
0
THRESMAP_IN11
R/W-0h
THRESMAP_IN10
R/W-0h
THRESMAP_IN9
R/W-0h
THRESMAP_IN8
R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-55. THRESMAP_CFG1 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-18
RESERVED
R
0h
Reserved
17-15
14-12
11-9
THRESMAP_IN12_IN17_ R/W
THRES2B
0h
0h
0h
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
THRESMAP_IN12_IN17_ R/W
THRES2A
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
THRESMAP_IN11
R/W
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
8-6
THRESMAP_IN10
R/W
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
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表8-55. THRESMAP_CFG1 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
5-3
THRESMAP_IN9
R/W
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
2-0
THRESMAP_IN8
R/W
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
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8.6.45 THRESMAP_CFG2 Register (Offset = 30h) [Reset = 0h]
THRESMAP_CFG2 is shown in 图8-68 and described in 表8-56.
Return to Summary Table.
图8-68. THRESMAP_CFG2 Register
23
22
RESERVED
R-0h
21
20
19
18
17
16
15
14
13
12
THRESMAP_VS1_THRES2B
R/W-0h
THRESMAP_VS1_THRES2A
R/W-0h
THRESMAP_VS0_THRES2B
R/W-0h
11
10
9
8
7
6
5
4
3
2
1
0
THRESMAP_VS0_THRES2A
THRESMAP_IN18_IN23_THRES THRESMAP_IN18_IN23_THRES THRESMAP_IN18_IN23_THRES
3C
3B
3A
R/W-0h
R/W-0h
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-56. THRESMAP_CFG2 Register Field Descriptions
Bit
Field
Type
Reset
Description
23-21
RESERVED
R
0h
Reserved
20-18
17-15
14-12
11-9
THRESMAP_VS1_THRE R/W
S2B
0h
0h
0h
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
THRESMAP_VS1_THRE R/W
S2A
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
THRESMAP_VS0_THRE R/W
S2B
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
THRESMAP_VS0_THRE R/W
S2A
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
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表8-56. THRESMAP_CFG2 Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
8-6
THRESMAP_IN18_IN23_ R/W
THRES3C
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
5-3
THRESMAP_IN18_IN23_ R/W
THRES3B
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
2-0
THRESMAP_IN18_IN23_ R/W
THRES3A
0h
0h = THRES0
1h = THRES1
2h = THRES2
3h = THRES3
4h = THRES4
5h = THRES5
6h = THRES6
7h = THRES7
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8.6.46 Matrix Register (Offset = 31h) [Reset = 0h]
Matrix is shown in 图8-69 and described in 表8-57.
Return to Summary Table.
图8-69. Matrix Register
23
11
22
10
21
9
20
RESERVED
R-0h
19
7
18
17
16
15
14
2
13
THRES_COM
R/W-0h
1
12
0
IN_COM_EN
R/W-0h
8
6
5
4
3
THRES_COM
R/W-0h
MATRIX
R/W-0h
POLL_ACT_TIME_M
R/W-0h
LEGEND: R/W = Read/Write; R = Read only
表8-57. Matrix Register Field Descriptions
Bit
Field
Type
Reset
Description
23-17
RESERVED
R
0h
Reserved
16-15
IN_COM_EN
R/W
0h
0h = no interrupt generation for w.r.t. threshold THRES_COM
1h = interrupt generation on rising edge above threshold
THRES_COM
2h = interrupt generation on falling edge below threshold
THRES_COM
3h = interrupt generation on falling and rising edge of threshold
THRES_COM
14-5
4-3
THRES_COM
MATRIX
R/W
R/W
0h
0h
10-bits value of threshold THRES_COM:
Bit5: LSB
Bit14: MSB
0h = no matrix, regular inputs only
1h = 4×4 matrix
2h = 5×5 matrix
3h = 6×6 matrix
2-0
POLL_ACT_TIME_M
R/W
0h
Polling active time setting for the matrix inputs:
0h = 64 μs
1h = 128 μs
2h = 256 μs
3h = 384 μs
4h = 512 μs
5h = 768 μs
6h = 1024 μs
7h = 1360 μs
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8.6.47 Mode Register (Offset = 32h) [Reset = 0h]
Mode is shown in 图8-70 and described in 表8-58.
Return to Summary Table.
图8-70. Mode Register
23
22
21
20
19
18
17
16
15
14
13
12
M_IN23
R/W-0h
11
M_IN22
R/W-0h
10
M_IN21
R/W-0h
9
M_IN20
R/W-0h
8
M_IN19
R/W-0h
7
M_IN18
R/W-0h
6
M_IN17
R/W-0h
5
M_IN16
R/W-0h
4
M_IN15
R/W-0h
3
M_IN14
R/W-0h
2
M_IN13
R/W-0h
1
M_IN12
R/W-0h
0
M_IN11
R/W-0h
M_IN10
R/W-0h
M_IN9
R/W-0h
M_IN8
R/W-0h
M_IN7
R/W-0h
M_IN6
R/W-0h
M_IN5
R/W-0h
M_IN4
R/W-0h
M_IN3
R/W-0h
M_IN2
R/W-0h
M_IN1
R/W-0h
M_IN0
R/W-0h
LEGEND: R/W = Read/Write
表8-58. Mode Register Field Descriptions
Bit
Field
Type
Reset
Description
23
M_IN23
R/W
0h
0h = comparator mode for IN23
1h = ADC mode for IN23
22
21
20
19
18
17
16
15
14
13
12
11
10
9
M_IN22
M_IN21
M_IN20
M_IN19
M_IN18
M_IN17
M_IN16
M_IN15
M_IN14
M_IN13
M_IN12
M_IN11
M_IN10
M_IN9
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h
0h = comparator mode for IN22
1h = ADC mode for IN22
0h = comparator mode for IN21
1h = ADC mode for IN21
0h = comparator mode for IN20
1h = ADC mode for IN20
0h = comparator mode for IN19
1h = ADC mode for IN19
0h = comparator mode for IN18
1h = ADC mode for IN18
0h = comparator mode for IN17
1h = ADC mode for IN17
0h = comparator mode for IN16
1h = ADC mode for IN16
0h = comparator mode for IN15
1h = ADC mode for IN15
0h = comparator mode for IN14
1h = ADC mode for IN14
0h = comparator mode for IN13
1h = ADC mode for IN13
0h = comparator mode for IN12
1h = ADC mode for IN12
0h = comparator mode for IN11
1h = ADC mode for IN11
0h = comparator mode for IN10
1h = ADC mode for IN10
0h = comparator mode for IN9
1h = ADC mode for IN9
8
M_IN8
0h = comparator mode for IN8
1h = ADC mode for IN8
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表8-58. Mode Register Field Descriptions (continued)
Bit
Field
Type
Reset
Description
7
M_IN7
M_IN6
M_IN5
M_IN4
M_IN3
M_IN2
M_IN1
M_IN0
R/W
0h
0h = comparator mode for IN7
1h = ADC mode for IN7
6
5
4
3
2
1
0
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
0h = comparator mode for IN6
1h = ADC mode for IN6
0h = comparator mode for IN5
1h = ADC mode for IN5
0h = comparator mode for IN4
1h = ADC mode for IN4
0h = comparator mode for IN3
1h = ADC mode for IN1
0h = comparator mode for IN2
1h = ADC mode for IN0
0h = comparator mode for IN1
1h = ADC mode for IN1
0h = comparator mode for IN0
1h = ADC mode for IN0
8.7 Programming Guidelines
When configuring the TIC12400-Q1, it is critical to follow the programming guideline summarized below (see 表
8-59) to ensure proper behavior of the device:
表8-59. TIC12400-Q1 Programming Guidelines
Category
Programming requirement
Threshold setup:
•
•
•
THRES2B ≥THRES2A (for IN12 to IN17)
•
•
•
Continuous mode
THRES3C ≥THRES3B ≥THRES3A (for IN18 to IN22)
Regular polling mode
THRES9 ≥THRES8 ≥THRES3C ≥THRES3B ≥THRES3A (for IN23)
Matrix mode (non-matrix inputs)
Threshold setup:
VS measurement
•
•
VS0_THRES2B ≥VS0_THRES2A
VS1_THRES2B ≥VS1_THRES2A
•
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表8-59. TIC12400-Q1 Programming Guidelines (continued)
Category
Programming requirement
•
•
•
•
•
POLL_EN=1
IN_EN[7:4]=4’b1111; IN_EN[13:10]= 4’b1111
MODE[7:4] = 4’b0000; MODE[13:10] = 4’b0000
CS_SELECT[7:4]= 4’b1111; CS_SELECT[13:10]= 4’b0000
IWETT(CSI) > IWETT (CSO):
1. WC_CFG0[20:18] < WC_CFG0[8:6]
2. WC_CFG0[23:21] < WC_CFG0[11:9]
3. WC_CFG1[2:0] > WC_CFG0[14:12]
•
If TW event is expected, CSO can only be set to 1 mA or 2 mA:
4×4 Matrix mode (MATRIX [4:3] = 2'b01)
1. If WC_CFG0[8:6]= 3’b001: WC_CFG0[20:18]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG0[8:6]= 3’b010: WC_CFG0[20:18] = 3’
b011
2. If WC_CFG0[11:9]= 3’b001: WC_CFG0[23:21]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG0[11:9]= 3’b010: WC_CFG0[23:21] = 3’
b011
3. If WC_CFG1[2:0]= 3’b001: WC_CFG0[14:12]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG1[2:0]= 3’b010: WC_CFG0[14:12] = 3’
b011
•
•
•
•
•
POLL_EN=1
IN_EN[8:4]= 5’b11111; IN_EN[14:10]= 5’b11111
MODE[8:4] = 5’b00000; MODE[14:10] = 5’b00000
CS_SELECT[8:4]= 5’b11111; CS_SELECT[14:10]= 5’b00000
IWETT(CSI) > IWETT (CSO):
1. WC_CFG0[20:18] <WC_CFG0[8:6]
2. WC_CFG0[23:21] < WC_CFG0[11:9]
3. WC_CFG1[2:0] > WC_CFG0[14:12]
4. WC_CFG1[5:3] > WC_CFG0[17:15]
•
If TW event is expected, CSO can only be set to 1 mA or 2 mA:
1. If WC_CFG0[8:6]= 3’b001: WC_CFG0[20:18]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG0[8:6]= 3’b010: WC_CFG0[20:18] = 3’
b011
5×5 Matrix mode (MATRIX [4:3] = 2'b10)
2. If WC_CFG0[11:9]= 3’b001: WC_CFG0[23:21]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG0[11:9]= 3’b010: WC_CFG0[23:21] = 3’
b011
3. If WC_CFG1[2:0]= 3’b001: WC_CFG0[14:12]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG1[2:0]= 3’b010: WC_CFG0[14:12] = 3’
b011
4. If WC_CFG1[5:3]= 3’b001: WC_CFG0[17:15]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG1[5:3]= 3’b010:WC_CFG0[17:15] = 3’
b011
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表8-59. TIC12400-Q1 Programming Guidelines (continued)
Category
Programming requirement
•
•
•
•
•
POLL_EN=1
IN_EN[9:4]= 6’b111111; IN_EN[15:10]= 6’b111111
MODE[9:4] = 6’b000000; MODE[15:10] = 6’b000000
CS_SELECT[9:4]= 6’b111111; CS_SELECT[15:10]= 6’b000000
IWETT(CSI) > IWETT (CSO):
1. WC_CFG0[20:18] <WC_CFG0[8:6]
2. WC_CFG0[23:21] < WC_CFG0[11:9]
3. WC_CFG1[2:0] > WC_CFG0[14:12]
4. WC_CFG1[5:3] > WC_CFG0[17:15]
•
If TW event is expected, CSO can only be set to 1 mA or 2 mA:
1. If WC_CFG0[8:6]= 3’b001: WC_CFG0[20:18]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG0[8:6]= 3’b010: WC_CFG0[20:18] = 3’
b011
6×6 Matrix mode (MATRIX [4:3]= 2’b11)
2. If WC_CFG0[11:9]= 3’b001: WC_CFG0[23:21]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG0[11:9]= 3’b010: WC_CFG0[23:21] = 3’
b011
3. If WC_CFG1[2:0]= 3’b001: WC_CFG0[14:12]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG1[2:0]= 3’b010: WC_CFG0[14:12] = 3’
b011
4. If WC_CFG1[5:3]= 3’b001: WC_CFG0[17:15]= 3’b010, 3’b011, 3’b100, 3’
b101, 3’b110, or 3’b111; If WC_CFG1[5:3]= 3’b010: WC_CFG0[17:15] = 3’
b011
At least one input (standard or matrix) or the VS measurement has to be enabled: IN_EN_x=
1 in the IN_EN register or CONFIG [16]= 1’b1(1)
Clean Current Polling (if CCP_INx= 1 in the
CCP_CFG1 register)
•
The wetting current auto-scaling feature is only activated in the continuous mode:
POLL_EN= 0 (2)
Wetting current auto-scaling (if WC_CFG1
[22:21] != 2b’11)
•
The wetting current auto-scaling only applies to 10 mA or 15 mA wetting currents:
WC_INx bits = 3’b100, 3’b101, 3’b110, or 3’b111 in the WC_CFG0 and
WC_CFG1 registers.(2)
•
•
•
•
At least one channel has to be enabled from IN0 to IN3 (IN_EN[3:0] != 4b’0000)
Inputs IN0 to IN3 need to be configured to ADC input mode: MODE[3:0] = 4’b1111
Inputs IN0 and IN1 need to be configured to CSO: CS SELECT [1:0]= 2b’00
Inputs IN2 and IN3 need to be configured to CSI: CS SELECT [3:2]= 2b’11
Wetting current diagnostic (If CONFIG
[21:18] != 4b’0000)
tPOLL_TIME and tPOLL_ACT_TIME settings have to meet the below requirement: tPOLL_TIM E
1.3 ×[ tPOLL_ACT_TIME + n × 24 μs + 10 μs](3) (4)
≥
•
•
Continuous mode
•
•
•
n: the number of enabled channels configured in register IN_EN
tPOLL_TIME: timing setting configured in CONFIG[4:1]
Standard polling mode
tPOLL_ACT_TIME: timing setting configured in CONFIG[8:5]
tPOLL_TIME ,tPOLL_ACT_TIME, and tPOLL_ACT_TIME_M settings have to meet the below
requirement: tPOLL_TIME > 1.3 × [ m × tPOLL_ACT_TIME_M + tPOLL_ACT_TIME + n × 24 μs + 10
μs] (3) (4)
•
•
•
•
•
n: the number of enabled channels configured in register IN_EN
m: 16 for 4×4 matrix; 25 for 5×5 matrix; 36 for 6×6 matrix
tPOLL_TIME: timing setting configured in CONFIG[4:1]
Matrix polling mode
tPOLL_ACT_TIME_M: timing setting configured in MATRIX[2:0]
tPOLL_ACT_TIME: timing setting configured in CONFIG[8:5]
(1) This is a soft requirement to take advantage of the clean current polling feature. The feature takes no effect otherwise.
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(2) These are soft requirements to take advantage of the wetting current auto-scaling feature. The feature takes no effect otherwise.
(3) If WCD is enabled, add additional 96 μs
(4) If CCP is enabled, add tCCP_TRAN +tCCP_TIME, where tCCP_TIME is the timing setting configured in CCP_CFG0[6:4]
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9 Application Information Disclaimer
备注
Information in the following applications sections is not part of the TI component specification, and TI
does not warrant its accuracy or completeness. TI’s customers are responsible for determining
suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
9.1 Application Information
The TIC12400-Q1 is an advanced 24-input Multiple Switch Detection Interface (MSDI) device designed to detect
external mechanical switch status in a 12-V automotive system by acting as an interface between the switches
and the low-voltage microcontroller. The device offers a number of unique features to replace systems
implemented with discrete components, saving board space and reducing the bill of materials (BOM). The device
can also be configured into low-power polling mode, which provides significant savings on system power
consumption.
9.2 Using TIC12400-Q1 in a 12 V Automotive System
US
Voltage
Regulator
GND
12-V
Automotive
Battery
VS
VS
VDD
VDD
/INT
/INT
/CS
INx
/CS
SCLK
SI
SCLK
MOSI
MISO
SO
AGND DGND EP
MCU
TIC12400-Q1
Body Control Module
Copyright © 2016, Texas Instruments Incorporated
图9-1. Typical System Diagram of Battery Connections for TIC12400-Q1
The TIC12400-Q1 is designed to operate with a 12 V automotive system. 图 9-1 depicts a typical system
diagram to show how the device is connected to the battery. Remember to be careful when connecting the
battery directly to the device on the VS supply pin (through a reverse-blocking diode) or the input (INX) pins since
an automotive battery can be subjected to various transient and over-voltage events. Manufacturers have
independently created standards and test procedures in an effort to prevent sensitive electronics from failing due
to these events. Recently, combined efforts are made with ISO to develop the ISO 16750-2 standard (Road
vehicles — Environmental conditions and testing for electrical and electronic equipment — Part 2: Electrical
loads), which describe the possible transients that could occur to an automotive battery and specify test methods
to simulate them.
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It shall be noted that the TIC12400-Q1 is designed and tested according to the ISO 16750-2 standard. A few
voltage stress tests and their test conditions are listed below. Exposing the device to more severe transient
events than described by the standard could potentially causes performance degradation and long-term damage
to the device.
• Direct current supply voltage: VBAT, min= 6 V; VBAT, max= 16 V
• To emulate a jump start event, voltage profile described in 图9-2 is used.
VBAT
VBAT, max
VBAT, min
tr
t1
tf
t
图9-2. Voltage Profile to Test a Jump Start Event
表9-1. Voltage Profile Parameters to Test a Jump Start Event
Parameter
Value
VBAT, min
10.8 V
24 V
VBAT, max
tr
t1
tf
< 10 ms
60 s ± 6 s
< 10 ms
Number of cycles
1
• To emulate a load dump event for an alternator with centralized load dump suppression, voltage profile
described below is used. UA and US* are applied directly to VBAT
.
图9-3. Voltage Profile to Test a Load Dump Event with Centralized Load Dump Suppression
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表9-2. Voltage Profile Used to Test a Load Dump Event With Centralized Load Dump Suppression
Parameter
Value
UA
13.5 V
US
79 V ≤US ≤101
35 V
US*
td
40 ms ≤td ≤400 ms
< 10 ms
tr
Number of cycles
5 pulses at intervals of 1 min
• To emulate a cranking event, voltage profile describe below is used. US, US6, and UA are applied directly to
VBAT
.
图9-4. Voltage Profile to Test a Cranking Event
表9-3. Voltage Profile Used to Test a Cranking Event
Parameter
Value - Level I
Value - Level II
Value - Level IV
6 V
US6
US
UB
tf
8 V
4.5 V
9.5 V
6.5 V
6.5 V
14 V ± 0.2 V
5 ms ± 0.5 ms
15 ms ± 1.5 ms
50 ms ± 5 ms
1000 ms ± 100 ms
40 ms ± 4 ms
14 V ± 0.2 V
5 ms ± 0.5 ms
15 ms ± 1.5 ms
50 ms ± 5 ms
10000 ms ± 1000 ms
100 ms ± 10 ms
14 V ± 0.2 V
5 ms ± 0.5 ms
15 ms ± 1.5 ms
50 ms ± 5 ms
10000 ms ± 1000 ms
100 ms ± 10 ms
t6
t7
t8
tr
9.3 Resistor-coded Switches Detection in Automotive Body Control Module
The body control module (BCM) is an electronic control unit responsible for monitoring and controlling various
electronic accessories in a vehicle's body. Detection of various mechanical switches status in a vehicle is one
important task handled by the BCM. Besides the typical on-and-off (or digital) type of switch, more sophisticated
type of switches, called resistor-coded switches, can also be present in an automotive body control system.
Resistor-coded switches have more than 2 unique switch states, and are often used for implementation of wiper,
illumination, and signal control arms in a vehicle. Due to various voltage potentials generated by different
positions of a resistor-coded switch, an ADC, typically inside the microcontroller, is used to detect the different
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states of the switch. The TIC12400-Q1 can natively support monitoring of a resistor-coded switch with its
integrated 10-bit ADC and configurable thresholds. The following application diagram depicts how the TIC12400-
Q1 is used in a BCM to detect external mechanical resistor-coded switches and a detailed design example is
shown in the following sections.
VBAT
Voltage
Regulator
GND
VS
VS
VDD
VDD
/INT
/INT
/CS
INx
/CS
SCLK
SI
SCLK
MOSI
MISO
Resistor-
coded Switch
SO
TIC12400-Q1
MCU
Body Control Module
Copyright © 2016, Texas Instruments Incorporated
图9-5. Using TIC12400-Q1 to Monitor a Resistor-Coded Switch in Body Control Module Application
9.3.1 Design Requirements
RSW_EQU
R1
RDIRT
RSW2
RSW1
+
VGND_SHIFT
œ
GND
图9-6. Example 3-state Resistor-Coded Switch
表9-4. Example Resistor-Coded Switch Specification
SPECIFICATION
9 V ≤VBAT ≤16 V
680 Ω± 8%
MIN
MAX
16 V
VBAT
R1
9 V
625.6 Ω
734.4 Ω
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表9-4. Example Resistor-Coded Switch Specification (continued)
SPECIFICATION
50 ΩMax when closed
50 ΩMax when closed
5000 ΩMin
MIN
MAX
50 Ω
50 Ω
∞
RSW1
RSW2
RDIRT
0 Ω
0 Ω
5000 Ω
-1 Ω
VGND_SHIFT
±1 V
+1 Ω
An example of a 3-state resistor-coded switch is shown in 图 9-6, with 表 9-4 summarizing its detailed
specification. The goal of this design is to utilize the TIC12400-Q1’s integrated ADC to detect and differentiate
the 3 switch states:
1. State 1: Both SW1 and SW2 open.
2. State 2: SW1 open and SW2 close.
3. State 3: SW1 close and SW2 open.
To mimic real automotive systems, the battery is assumed to be fluctuating between 9 V and 16 V. RDIRT is
introduced to model the small leakage flowing across the switch in open state. There is also a ±1 V ground shift
present in the system, meaning there could be up to ±1 V of potential difference between the switch reference
point and the ground reference of the TIC12400-Q1. When the switch changes position and the switch state
changes from one to another, the TIC12400-Q1 is required to correctly detect the state transition and issue an
interrupt to alert the microcontroller. The switch information needs to be stored in the status registers for the
microcontroller to retrieve.
9.3.2 Detailed Design Procedure
表9-5. Detailed Design Procedure
STEP 1
STEP 2
STEP 3
STEP 4
STEP 5
Equivalent Resistance
VINX (V)
VINX + VGND_SHIFT(V)
ADC Code Spread
Threshold
Value (Ω)
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
State 1: Both SW1 and
SW2 open
5000
> 6 V
-
>6 V
-
1023
-
∞
State 2: SW1 open and
SW2 closed
555.95
0
678.03
49.5
2.502
0
3.729
0.272
1.502
0
4.729
1.272
256
0
806
217
915
237
State 3: SW1 closed and
SW2 open
use the following procedures to calculate thresholds to program to the TIC12400-Q1 for proper switch detection:
1. Calculate the equivalent resistance values at different switch states, taking into account RDIRT and the 8%
resistance variation.
2. Estimate the voltage established when wetting current flows through the switch by utilizing the relationship
VINX = RSW_EQU × IWETT_ACT, where RSW _EQU is the equivalent switch resistance value and IWETT_ACT is the
actual wetting current flowing through the switch. The 5 mA wetting current setting is selected in this design,
because it best uses the dynamic range of the ADC (from 0 to 6 V). The wetting current, however, can vary
depending on manufacturing process variation and operating temperature, and needs to be taken into
account. Referring to the electrical table of the TIC12400-Q1 and assuming enough headroom for the
current source (CSO) to operate, the 5 mA wetting current setting produces current ranging between 4.5 mA
and 5.5 mA (for VS –INX ≥3 V condition). The voltage established on the TIC12400-Q1 input pin (VINX
)
can be calculated accordingly.
3. Take the ground shift non-ideality into account. As defined in 节9.3.1, the ground shift can vary between ±1
V. Therefore, effectively, the actual voltage seen at the TIC12400-Q1 can also vary up to ±1 V.
4. Convert the voltage established on the INx pin into equivalent ADC code. The full-scale range of the 10-bit
ADC is from 0 V to 6 V, with 6 V corresponding to the max code of 1023. Therefore, the ADC code spread
for each of the 3 different switch states can be calculated accordingly.
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5. After the ADC code spread for each switch state is calculated, the detection threshold can be chosen to be
the mid-point between the upper and lower codes of two neighboring states to give best margin for detection.
9.3.3 Application Curves
1500
Both SW1 and SW2 Open
(Code = 1023)
1350
1200
1050
900
SW2 Closed
(Min code = 301)
(Max code = 770)
750
600
SW1 Closed
(Max code = 216)
450
300
150
0
0
1
2
3
DD000011
Switch Status
图9-7. Measured ADC Code Distribution for the 3 Switch States
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10 Power Supply Recommendations
There are two supply input pins for the TIC12400-Q1: VS and VDD. VS is the main power supply for the entire
chip and is essential for all critical functions of the device. The VS supply is designed to be connected to a 12-V
automotive battery (through a reverse blocking diode) with nominal operating voltage no greater than 16 V. The
VDD supply is used to determine the logic level on the SPI communication interface, source the current for the
SO driver, and sets the pull-up voltage for the /CS pin. It can also be used as a possible external pull-up supply
for the /INT pin as an alternative to the VS supply and it shall be connected to a 3 V to 5.5 V logic supply.
Removing VDD from the device disables SPI communications, but does not impact normal operation of the
device.
To improve stability of the supply inputs, some decoupling capacitors are recommended on the PCB. 图 10-1
shows an example on the on-board power supply decoupling scheme. The battery voltage (VBAT) is decoupled
on the Electronic Control Unit (ECU) board using a large decoupling capacitor (CBUFF). The diode is installed to
prevent damage to the internal system under reversed battery condition. CVS shall be installed close to the
TIC12400-Q1 for best decoupling performance. The voltage regulator provides a regulated voltage for the digital
portion of the device and for the local microcontroller and its output is decoupled with CDECOUPLE. 表 10-1 lists
recommended values for each individual decoupling capacitor shown in the system diagram.
表10-1. Decoupling Capacitor Recommendations
CRC RULE
VALUE
CBUFF
100 μF, 50 V rated, ±20%
100 nF, 50V rated, ±10%; X7R
100 nF, 50 V rated
CVBAT
CVS
CDECOUPLE
100 nF ≈1 μF
ECU
connector
VBAT
Voltage
Regulator
CDECOUPLE
GND
CVBAT CBUFF
CVS
37
38
VS
VS
VDD 19
VDD
TIC12400-Q1
MCU
Electronic Control Unit (ECU)
Copyright © 2016, Texas Instruments Incorporated
图10-1. Recommended Power Supply Decoupling
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11 Layout
11.1 Layout Guidelines
1. 图11-1 illustrates an example of a PCB layout with the TIC12400-Q1. Some key considerations are:
2. Decouple the VS and VDD pins with capacitor using recommended values from section Power Supply
Recommendations and place them as close to the pin as possible. Make sure that the capacitor voltage
rating is sufficient for the VS and VDD supplies.
3. Keep the input lines as short as possible.
4. Use a solid ground plane to help distribute heat and reduce electromagnetic interference (EMI) noise pickup.
5. Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if
possible, and only make perpendicular crossings when necessary.
6. To achieve good thermal performance, the exposed thermal pad underneath the device must be soldered to
the board and flooded with vias to ground planes. For simple double-sided PCBs where there are no internal
layers, the surface layers can be used to remove heat. For multilayer PCBs, internal ground planes can be
used for heat removal.
7. Minimize the inductive parasitic between the INx input capacitors and the thermal pad ground return.
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11.2 Layout Example
VIA to
ground plane
C
C
IN13
VS
VIAs to ground
plane and heat
sink of the PCB
IN14
IN15
VS
IN12
IN16
IN17
IN11
IN10
IN18
IN19
IN9
IN8
IN20
AGND
IN21
IN7
IN6
IN5
VIA to
ground plane
VIA to
ground plane
IN22
IN23
DGND
IN4
IN0
IN1
IN3
IN2
/CS
/INT
C
SCLK
CAP_D
VIA to
ground plane
C
SI
CAP_PRE
RESET
SO
VDD
CAP_A
Not to Scale
VIA to
ground plane
C
R
R
VIA to ground plane
图11-1. Example Layout
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12 Device and Documentation Support
12.1 接收文档更新通知
要接收文档更新通知,请导航至 ti.com 上的器件产品文件夹。点击订阅更新 进行注册,即可每周接收产品信息更
改摘要。有关更改的详细信息,请查看任何已修订文档中包含的修订历史记录。
12.2 支持资源
TI E2E™ 支持论坛是工程师的重要参考资料,可直接从专家获得快速、经过验证的解答和设计帮助。搜索现有解
答或提出自己的问题可获得所需的快速设计帮助。
链接的内容由各个贡献者“按原样”提供。这些内容并不构成 TI 技术规范,并且不一定反映 TI 的观点;请参阅
TI 的《使用条款》。
12.3 Trademarks
TI E2E™ is a trademark of Texas Instruments.
所有商标均为其各自所有者的财产。
12.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
12.5 术语表
TI 术语表
本术语表列出并解释了术语、首字母缩略词和定义。
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
TIC12400QDCPRQ1
ACTIVE
HTSSOP
DCP
38
2000 RoHS & Green
NIPDAU
Level-3-260C-168 HR
-40 to 125
TIC12400Q
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF TIC12400-Q1 :
Addendum-Page 1
PACKAGE OPTION ADDENDUM
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Catalog : TIC12400
•
NOTE: Qualified Version Definitions:
Catalog - TI's standard catalog product
•
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
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TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
TIC12400QDCPRQ1
HTSSOP DCP
38
2000
330.0
16.4
6.9
10.2
1.8
12.0
16.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
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3-Jan-2022
*All dimensions are nominal
Device
Package Type Package Drawing Pins
HTSSOP DCP 38
SPQ
Length (mm) Width (mm) Height (mm)
350.0 350.0 43.0
TIC12400QDCPRQ1
2000
Pack Materials-Page 2
GENERIC PACKAGE VIEW
DCP 38
4.4 x 9.7, 0.5 mm pitch
PowerPAD TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
This image is a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4224560/B
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PACKAGE OUTLINE
DCP0038A
PowerPADTM TSSOP - 1.2 mm max height
S
C
A
L
E
2
.
0
0
0
SMALL OUTLINE PACKAGE
C
6.6
6.2
TYP
A
0.1 C
PIN 1 INDEX
AREA
SEATING
PLANE
36X 0.5
38
1
2X
9
9.8
9.6
NOTE 3
19
20
0.27
0.17
0.08
38X
4.5
4.3
B
C A B
SEE DETAIL A
(0.15) TYP
2X 0.95 MAX
NOTE 5
19
20
2X 0.95 MAX
NOTE 5
0.25
GAGE PLANE
1.2 MAX
39
4.70
3.94
THERMAL
PAD
0.15
0.05
0.75
0.50
0 -8
A
20
DETAIL A
TYPICAL
1
38
2.90
2.43
4218816/A 10/2018
PowerPAD is a trademark of Texas Instruments.
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. Reference JEDEC registration MO-153.
5. Features may differ or may not be present.
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EXAMPLE BOARD LAYOUT
DCP0038A
PowerPADTM TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
(3.4)
NOTE 9
METAL COVERED
BY SOLDER MASK
(2.9)
SYMM
38X (1.5)
38X (0.3)
SEE DETAILS
38
1
(R0.05) TYP
36X (0.5)
3X (1.2)
SYMM
39
(4.7)
(9.7)
NOTE 9
(0.6) TYP
SOLDER MASK
DEFINED PAD
(
0.2) TYP
VIA
20
19
(1.2)
(5.8)
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE: 8X
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
OPENING
METAL
EXPOSED METAL
EXPOSED METAL
0.05 MAX
ALL AROUND
0.05 MIN
ALL AROUND
NON-SOLDER MASK
DEFINED
SOLDER MASK
DEFINED
15.000
SOLDER MASK DETAILS
4218816/A 10/2018
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
8. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
numbers SLMA002 (www.ti.com/lit/slma002) and SLMA004 (www.ti.com/lit/slma004).
9. Size of metal pad may vary due to creepage requirement.
10. Vias are optional depending on application, refer to device data sheet. It is recommended that vias under paste be filled, plugged
or tented.
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EXAMPLE STENCIL DESIGN
DCP0038A
PowerPADTM TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
(2.9)
BASED ON
0.125 THICK
STENCIL
38X (1.5)
38X (0.3)
METAL COVERED
BY SOLDER MASK
1
38
(R0.05) TYP
36X (0.5)
(4.7)
SYMM
39
BASED ON
0.125 THICK
STENCIL
19
20
SYMM
(5.8)
SEE TABLE FOR
DIFFERENT OPENINGS
FOR OTHER STENCIL
THICKNESSES
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE: 8X
STENCIL
THICKNESS
SOLDER STENCIL
OPENING
0.1
3.24 X 5.25
2.90 X 4.70 (SHOWN)
2.65 X 4.29
0.125
0.15
0.175
2.45 X 3.97
4218816/A 10/2018
NOTES: (continued)
11. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
12. Board assembly site may have different recommendations for stencil design.
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