TLC352ID [TI]
LinCMOSE DUAL DIFFERENTIAL COMPARATOR; LinCMOSE双路差分比较器型号: | TLC352ID |
厂家: | TEXAS INSTRUMENTS |
描述: | LinCMOSE DUAL DIFFERENTIAL COMPARATOR |
文件: | 总9页 (文件大小:142K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
TLC352
LinCMOS DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
TLC352C, TLC352I . . . D OR P PACKAGE
TLC352M . . . JG PACKAGE
(TOP VIEW)
Single- or Dual-Supply Operation
Wide Range of Supply Voltages
1.5 V to 18 V
Very Low Supply Current Drain
150 µA Typ at 5 V
1OUT
1IN–
1IN+
GND
V
DD
1
2
3
4
8
7
6
5
2OUT
2IN–
2IN+
65 µA Typ at 1.4 V
Built-In ESD Protection
12
High Input Impedance . . . 10 Ω Typ
Extremely Low Input Bias Current 5 pA Typ
Ultrastable Low Input Offset Voltage
TLC352M . . . FK PACKAGE
(TOP VIEW)
Input Offset Voltage Change at Worst-Case
Input Conditions Typically 0.23 µV/ Month,
Including the First 30 Days
3
2
1
20 19
18
Common-Mode Input Voltage Range
Includes Ground
NC
NC
1IN–
NC
4
5
6
7
8
2OUT
NC
17
16
15
14
Outputs Compatible With TTL, MOS, and
CMOS
2IN–
NC
1IN+
NC
Pin-Compatible With LM393
9 10 11 12 13
description
This device is fabricated using LinCMOS
technology and consists of two independent
voltage comparators, each designed to operate
from a single power supply. Operation from dual
supplies is also possible if the difference between
the two supplies is 1.4 V to 18 V. Each device
features extremely high input impedance
NC — No Internal connection
symbol (each comparator)
IN+
IN–
OUT
12
(typically greater than 10 Ω), which allows direct
interface to high-impedance sources. The output
are n-channel open-drain configurations and can
beconnectedtoachievepositive-logicwired-AND
relationships. The capability of the TLC352 to
operate from 1.4-V supply makes this device ideal
for low-voltage battery applications.
The TLC352 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V
ESD rating tested under MIL-STD-883C, Method 3015. However, care should be exercised in handling this
device as exposure to ESD may result in degradation of the device parametric performance.
The TLC352C is characterized for operation from 0°C to 70°C. The TLC352I is characterized for operation over
the industrial temperature range of – 40°C to 85°C. The TLC352M is characterized for operation over the full
military temperature range – 55°C to 125°C.
LinCMOS is a trademark of Texas Instruments Incorporated.
Copyright 1990, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC352
LinCMOS DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
AVAILABLE OPTIONS
PACKAGE
CHIP-CARRIER
V
max
IO
T
SMALL-OUTLINE
CERAMIC DIP
(JG)
PLASTIC DIP
(P)
A
AT 25°C
(D)
TLC352CD
TLC352ID
—
(FK)
0°C to 70°C
– 40°C to 85°C
– 55°C to 125°C
5 mV
5 mV
5 mV
—
—
—
TLC352CP
TLC352IP
—
—
TLC352MFK
TLC352MJG
The D packages are available taped and reeled. Add R suffix to device type (e.g., TLC352 CDR).
equivalent schematic (each comparator)
Common to All Channels
V
DD
OUT
GND
IN–
IN+
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC352
LinCMOS DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 V
DD
Differential input voltage, V (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 18 V
ID
Input voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
I
DD
Input voltage range, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to 18 V
I
Output voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 V
O
Input current, I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 5 mA
I
Output current, I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
O
Duration of output short circuit to ground (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . unlimited
Continuous total dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Dissipation Rating Table
Operating free-air temperature range, T TLC352C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
A
TLC352I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 85°C
TLC352M . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 55°C to 125°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
Case temperature for 60 seconds: FK package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
Lead temperature 1,6 mm (1/16 inch) from case for 60 seconds: JG package . . . . . . . . . . . . . . . . . . . . 300°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: D or P package . . . . . . . . . . . . . . . . . 260°C
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values except differential voltages are with respect to the network ground.
2. Differential voltages are at IN+ with respect to IN –.
3. Short circuits from outputs to V
can cause excessive heating and eventual device destruction.
DD
DISSIPATION RATING TABLE
T
≤ 25°C
DERATING
FACTOR
DERATE
ABOVE T
T
= 70°C
T
= 85°C
T = 125°C
A
A
A
A
PACKAGE
POWER RATING
POWER RATING POWER RATING POWER RATING
A
D
FK
JG
P
500 mW
500 mW
500 mW
500 mW
5.8 mW/°C
11.0 mW/°C
8.4 mW/°C
N/A
64°C
104°C
90°C
N/A
464 mW
500 mW
500 mW
500 mW
377 mW
500 mW
500 mW
500 mW
N/A
275 mW
210 mW
N/A
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions
TLC352C
TLC352I
TLC352M
UNIT
V
MIN
1.4
0
MAX
MIN
1.4
0
MAX
MIN
1.4
0
MAX
Supply voltage, V
16
3.5
8.5
70
16
3.5
8.5
85
16
3.5
8.5
125
DD
V
V
= 5 V
DD
Common-mode input voltage, V
V
IC
Operating free-air temperature, T
= 10 V
0
0
0
DD
0
– 40
– 55
°C
A
electrical characteristics at specified free-air temperature, V
= 1.4 V (unless otherwise noted)
DD
TLC352C
MIN TYP
2
TLC352I
MIN TYP
2
TLC352M
†
PARAMETER
Input offset voltage
Input offset current
Input bias current
TEST CONDITIONS
T
A
UNIT
MAX
5
MAX
MIN TYP
MAX
5
25°C
5
7
2
V
V
IC
= V min, See Note 4
ICR
mV
IO
Full range
25°C
6.5
10
1
5
1
5
1
5
pA
nA
pA
nA
I
IO
MAX
0.3
0.6
1
2
10
20
25°C
I
IB
MAX
Common-mode input voltage
range
0 to
0.2
0 to
0.2
0 to
0.2
V
V
Full range
V
ICR
25°C
Full range
25°C
100
200
200
100
200
200
100
200
200
Low-level output voltage
mV
mA
µA
OL
I
I
Low-level output current
V
V
= – 0.5 V,
= 0.5 V,
V
= 0.3 V
1
1.6
65
1
1.6
65
1
1.6
65
OL
ID
OL
25°C
150
200
150
200
150
200
Supply current (two comparators)
No load
DD
ID
Full range
†
All characteristics are measured with zero common-mode input voltage unless otherwise noted. Full range is 0°C to 70°C for TLC352C, – 40°C to 85°C for TLC352I, – 55°C to 125°C
for TLC352M. IMPORTANT: See Parameter Measurement Information.
NOTE 4: The offset voltage limits given are the maximum values required to drive the output above 1.25 V or below 150 mV with a 10-kΩ resistor between the output and V . They
DD
can be verified by applying the limit value to the input and checking for the appropriate output state.
electrical characteristics at specified free-air temperature, V
= 5 V (unless otherwise noted)
DD
TLC352C
TLC352I
TYP
1
TLC352M
†
PARAMETER
TEST CONDITIONS
T
A
UNIT
MIN
TYP
MAX
5
MIN
MAX
MIN
TYP
MAX
5
25°C
Full range
25°C
1
5
7
1
V
IO
Input offset voltage
Input offset current
Input bias current
V
IC
= V
min, See Note 5
ICR
mV
6.5
10
1
5
1
5
1
5
pA
nA
pA
nA
I
IO
MAX
0.3
0.6
1
2
10
20
25°C
I
IB
MAX
0 to
0 to
0 to
25°C
V
– 1
V
– 1
V
– 1
DD
0 to
– 1.5
DD
0 to
– 1.5
DD
0 to
– 1.5
Common-mode
input voltage range
V
ICR
V
Full range
V
V
V
DD
DD
DD
V
V
= 5 V
25°C
Full range
25°C
0.1
0.1
0.1
nA
High-level output
current
OH
I
V
ID
= 1 V
OH
= 15 V
1
400
700
1
400
700
1
400
700
µA
OH
150
150
150
Low-level output
voltage
V
V
ID
V
ID
V
ID
= 1 V,
I
= 4 mA
mV
mA
mA
OL
OL
Full range
Low-level output
current
I
I
= – 1 V,
= 1 V,
V
OL
= 1.5 V
25°C
6
16
6
16
6
16
OL
25°C
0.15
0.3
0.4
0.15
0.3
0.4
0.15
0.3
0.4
Supply current
(two comparators)
No load
DD
Full range
†
All characteristics are measured with zero common-mode input voltage unless otherwise noted. Full range is 0°C to 70°C for TLC352C, – 40°C to 85°C for TLC352I, – 55°C to 125°C
for TLC352M. IMPORTANT: See Parameter Measurement Information.
NOTE 5: The offset voltage limits given are the maximum values required to drive the output above 4 V or below 400 mV with a 10-kΩ resistor between the output and V . They
DD
can be verified by applying the limit value to the input and checking for the appropriate output state.
switching characteristics, V
= 5 V, T = 25°C
A
DD
TLC352C, TLC352I
TLC352M
PARAMETER
TEST CONDITIONS
UNIT
MIN
TYP
650
200
MAX
R
C
connected to 5 V through 5.1 kΩ,,
100-mV input step with 5-mV overdrive
TTL-level input step
L
L
Response time
ns
‡
= 15 pF ,
See Note 6
‡
C
includes probe and jig capacitance.
L
NOTE 6: The response time specified is the interval between the input step function and the instant when the output crosses 1.4 V.
TLC352
LinCMOS DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
PARAMETER MEASUREMENT INFORMATION
The digital output stage of the TLC352 can be damaged if it is held in the linear region of the transfer curve.
Conventional operational amplifier/comparator testing incorporates the use of a servo loop that is designed to force
the device output to a level within this linear region. Since the servo-loop method of testing cannot be used, the
following alternative for measuring parameters such as input offset voltage, common-mode rejection, etc., are
offered.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as shown
in Figure 1(a). With the noninverting input positive with respect to the inverting input, the output should be high. With
the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages can
be slewed as shown in Figure 1(b) for the V
accuracy.
test, rather than changing the input voltages, to provide greater
ICR
A close approximation of the input offset voltage can be obtained by using a binary search method to vary the
differential input voltage while monitoring the output state. When the applied input voltage differential is equal but
opposite in polarity to the input offset voltage, the output changes state.
5 V
1 V
5.1 kΩ
5.1 kΩ
+
–
+
–
Applied V
Limit
Applied V
Limit
IO
IO
V
O
V
O
– 4 V
(a) V WITH V = 0
IO IC
(b) V WITH V = 4 V
IO IC
Figure 1. Method for Verifying That Input Offset Voltage Is Within Specified Limits
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC352
LinCMOS DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
PARAMETER INFORMATION
Figure 2 illustrates a practical circuit for direct dc measurement of input offset voltage that does not bias the
comparator into the linear region. The circuit consists of a switching-mode servo loop in which U1a generates a
triangular waveform of approximately 20-mV amplitude. U1b acts as a buffer, with C2 and R4 removing any residual
dc offset. The signal is then applied to the inverting input of the comparator under test, while the noninverting input
is driven by the output of the integrator formed by U1c through the voltage divider formed by R9 and R10. The loop
reaches a stable operating point when the output of the comparator under test has a duty cycle of exactly 50%, which
can only occur when the incoming triangle wave is sliced symmetrically or when the voltage at the noninverting input
exactly equals the input offset voltage.
Voltage divider R9 and R10 provides a step up of the input offset voltage by a factor of 100 to make measurement
easier. The values of R5, R8, R9, and R10 can significantly influence the accuracy of the reading; therefore, it is
suggested that their tolerance level be 1% or lower.
Measuring the extremely low values of input current requires isolation from all other sources of leakage current and
compensation for the leakage of the test socket and board. With a good picoammeter, the socket and board leakage
can be measured with no device in the socket. Subsequently, this open-socket leakage value can be subtracted from
the measurement obtained with a device in the socket to obtain the actual input current of the device.
R5
1.8 kΩ, 1%
V
DD
C3 0.68 µF
U1b
1/4 TLC274CN
C2
U1c
1/4 TLC274CN
1 µF
R6
Buffer
+
–
5.1 kΩ
–
+
DUT
V
IO
(X100)
R7
1MΩ
R4
47 kΩ
R1
Integrator
240 kΩ
R8
1.8 kΩ, 1%
C4
0.1 µF
U1a
–
+
1/4 TLC274CN
C1
0.1 µF
Triangle
Generator
R9
10 kΩ, 1%
R10
100 Ω, 1%
R2
10 kΩ
R3
100 kΩ
Figure 2. Circuit for Input Offset Voltage Measurement
7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC352
LinCMOS DUAL DIFFERENTIAL COMPARATOR
SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the leading
edge of the input pulse, while response time, high-to-low level output, is measured from the trailing edge of the input
pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The
offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3) so that the circuit
is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change
state.
V
DD
5.1 kΩ
1 µF
Pulse Generator
DUT
50 Ω
C
L
(see Note A)
1 V
Input
Offset Voltage
Compensation
Adjustment
10 Ω
10 Turn
1 kΩ
0.1 mF
– 1 V
TEST CIRCUIT
Overdrive
Overdrive
Input
Input
100 mV
100 mV
90%
50%
10%
90%
10%
Low-to-High-
Level Output
50 %
High-to-Low-
Level Output
t
r
t
t
f
t
PLH
PHL
VOLTAGE WAVEFORMS
NOTE A: C includes probe and jig capacitance.
L
Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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