TLC354CN [TI]
LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS; LinCMOSE四路差动比较仪
| 型号： | TLC354CN |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | LinCMOSE QUADRUPLE DIFFERENTIAL COMPARATORS |
| 文件： | 总11页 (文件大小：185K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
D, N, OR PW PACKAGE
(TOP VIEW)
Single- or Dual-Supply Operation
Wide Range of Supply Voltages
1.4 V to 18 V
1OUT
2OUT
3OUT
4OUT
1
2
3
4
5
6
7
14
13
12
11
10
9
Very Low Supply Current Drain
300 µA Typ at 5 V
V
V
/GND
DD
DD–
130 µA Typ at 1.4 V
2IN–
2IN+
1IN–
1IN+
4IN+
4IN–
3IN+
3IN–
Built-In ESD Protection
12
High Input Impedance . . . 10 Ω Typ
8
Extremely Low Input Blas Current
5 pA Typ
Ultrastable Low Input Offset Voltage
Input Offset Voltage Change at Worst-Case
Input Conditions Typically 0.23 µV/Month,
Including the First 30 Days
symbol (each comparator)
IN+
IN–
Common-Mode Input Voltage Range
Includes Ground
OUT
Outputs Compatible With TTL, MOS, and
CMOS
Pin-Compatible With LM339
description
This device is fabricated using LinCMOS technology and consists of four independent differential voltage
comparators; each is designed to operate from a single power supply. Operation from dual supplies is also
possible if the difference between the two supplies is 1.4 V to 18 V. Each device features extremely high input
12
impedance (typically greater than 10 Ω), which allows direct interface to high-impedance sources. The
outputs are n-channel open-drain configurations and can be connected to achieve positive-logic wired-AND
relationships. The capability of the TLC354 to operate from a 1.4-V supply makes this device ideal for
low-voltage battery applications.
The TLC354 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V
ESD rating tested under MIL-STD-833C, Method 3015. However, care should be exercised in handling this
device as exposure to ESD may result in degradation of the device parametric performance.
The TLC354C is characterized for operation from 0°C to 70°C. The TLC354I is characterized for operation over
the industrial temperature range of –40° to 85°C. The TLC354M is characterized for operation over the full
military temperature range –55°C to 125°C.
AVAILABLE OPTIONS
PACKAGED DEVICES
CHIP
FORM
(Y)
V
max
IO
T
A
SMALL OUTLINE
PLASTIC DIP
(P)
TSSOP
(PW)
AT 25°C
(D)
0°C to 70°C
–40°C to 85°C
–55°C to 125°C
5 mV
5 mV
5 mV
TLC354CD
TLC354ID
TLC354MD
TLC354CN
TLC354IN
TLC354MN
TLC354CPW TLC354Y
—
—
—
—
The D packages are available taped and reeled. Add R suffix to device type (e.g., TLC354CDR).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
LinCMOS is a trademark of Texas Instruments Incorporated.
Copyright 1997, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
equivalent schematic (each comparator)
Common to All Channels
V
DD
OUT
V
/
DD–
GND
IN+
IN–
†
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage, V
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 V
DD
Differential input voltage, V (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±18 V
ID
Input voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
I
DD
Input voltage range, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to 18 V
I
Output voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 V
O
Input current, I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±5 mA
I
Output current, I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
O
Duration of output short circuit to ground (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Unlimited
Continuous total dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Dissipation Rating Table
Operating free-air temperature range, T : TLC354C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
A
TLC354I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to 85°C
TLC354M . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to 125°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values except differential voltages are with respect to network ground.
2. Differential voltages are at IN+ with respect to IN–.
3. Short circuits from outputs to V
can cause excessive heating and eventual device destruction.
DD
DISSIPATION RATING TABLE
T
≤ 25°C
DERATING
FACTOR
DERATE
ABOVE T
T
= 70°C
T
= 85°C
T = 125°C
A
A
A
A
PACKAGE
POWER RATING
POWER RATING POWER RATING POWER RATING
A
D
N
500 mW
7.6 mW/°C
9.2 mW/°C
5.6 mW/°C
84°C
96°C
25°C
500 mW
500 mW
448 mW
494 mW
500 mW
N/A
190 mW
230 mW
N/A
500 mW
PW
700 mW
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
TLC364Y chip information
This chip, when properly assembled, displays characteristics similar to the TLC354C. Thermal compression or
ultrasonic bonding can be used on the doped-aluminum bonding pads. Chips can be mounted with conductive
epoxy or a gold-silicon preform.
V
DD
(3)
BONDING PAD ASSIGNMENTS
(7)
(6)
1IN+
1IN–
+
–
(1)
(13)
(11)
(10)
(12)
(9)
1OUT
(5)
(4)
+
2IN+
2IN–
(2)
2OUT
3 IN+
–
(14)
(1)
(9)
(8)
+
–
(8)
(7)
(14)
3OUT
65
3IN–
(11)
(10)
+
–
4IN+
4IN–
(13)
4OUT
(12)
/GND
V
DD–
(6)
(4)
(5)
(3)
(2)
CHIP THICKNESS: 15 TYPICAL
90
BONDING PADS: 4 × 4 MINIMUM
T
= 150°C
JMAX
TOLERANCES ARE ±10%.
ALL DIMENSIONS ARE IN MILS.
PIN (4) IS INTERNALLY CONNECTED
TO BACKSIDE OF CHIP.
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions
TLC354C
TLC354I
TLC354M
UNIT
MIN
1.4
0
MAX
MIN
1.4
0
MAX
MIN
1.4
0
MAX
Supply voltage, V
16
0.2
3.5
8.5
70
16
0.2
3.5
8.5
85
16
0.2
3.5
8.5
125
V
DD
V
DD
V
DD
V
DD
= 1.4 V
= 5 V
Common-mode input voltage, V
0
0
0
V
IC
= 10 V
0
0
0
Operating free-air temperature, T
0
–40
–55
°C
A
electrical characteristics at specified free-air temperature, V
= 1.4 V
DD
TLC354C
TLC354I
TYP
2
TLC354M
†
PARAMETER
Input offset voltage
Input offset current
Input bias current
TEST CONDITIONS
UNIT
T
A
MIN
TYP
MAX
5
MIN
MAX
MIN
TYP
MAX
5
25°C
2
5
7
2
V
IO
V
IC
= V
ICR
min, See Note 4
mV
Full range
25°C
6.5
10
1
5
1
5
1
5
pA
nA
pA
nA
I
I
IO
MAX
0.3
0.6
1
2
10
20
25°C
IB
MAX
Common-mode input voltage
range
0 to
0.2
0 to
0.2
0 to
0.2
V
ICR
25°C
V
V
V
= 5 V
25°C
Full range
25°C
0.1
0.1
0.1
nA
OH
I
High-level output current
V
ID
= 1 V
OH
= 15 V
1
200
200
1
200
200
1
200
200
µA
OH
100
100
100
V
Low-level output voltage
Low-level output current
V
ID
V
ID
V
ID
= –0.5 V,
= –0.5 V,
= 0.5 V,
I
= 0.6 mA
mV
mA
µA
OL
OL
Full range
25°C
I
I
V
OL
= 300 mV
1
1.6
1
1.6
1
1.6
OL
25°C
130
300
400
130
300
400
130
300
400
Supply current
(four comparators)
No load
DD
Full range
†
All characteristics are measured with zero common-mode input voltage unless otherwise noted. Full range is 0°C to 70°C for TLC354C, –40°C to 85°C for TLC354I, and –55°C
to 125°C for the TLC354M. MAX is 70°C for TLC354C, 85°C TLC354I, and 125°C for the TLC354M. IMPORTANT: See Parameter Measurement Information.
NOTE 4: The offset voltage limits given are the maximum values required to drive the output above 1.25 V or below 150 mV with a 10-kΩ resistor between the output and V . They
DD
can be verified by applying the limit value to the input and checking for the appropriate output state.
electrical characteristics at specified free-air temperature, V
= 5 V
DD
TLC354C
TLC354I
TYP MAX
TLC354M
TYP MAX
†
PARAMETER
Input offset voltage
Input offset current
Input bias current
TEST CONDITIONS
UNIT
T
A
MIN
TYP MAX
MIN
MIN
25°C
Full range
25°C
2
1
5
5
2
5
7
2
1
5
5
V
IO
V
IC
= V
min, See Note 5
ICR
mV
6.5
10
1
5
pA
nA
pA
nA
I
IO
MAX
0.3
0.6
1
2
10
20
25°C
I
IB
MAX
0 to
0 to
0 to
25°C
V
–1
V
–1
V
–1
DD
DD
DD
Common-mode input
voltage range
V
ICR
V
0 to
0 to
0 to
Full range
V
–1.5
V
–1.5
V
–1.5
DD
DD
DD
V
V
= 5 V
25°C
Full range
25°C
0.1
0.1
0.1
nA
OH
I
High-level output current
V
ID
= 1 V
OH
= 15 V
1
400
700
1
400
700
1
400
700
µA
OH
150
150
150
V
Low-level output voltage
Low-level output current
V
ID
V
ID
V
ID
= –1 V,
= –1 V,
= 1 V,
I
= 4 mA
mV
mA
mA
OL
OL
Full range
25°C
I
I
V
OL
= 1.5 mV
6
16
6
16
6
16
OL
25°C
0.3
0.6
0.8
0.3
0.6
0.8
0.3
0.6
0.8
Supply current
(four comparators)
No load
DD
Full range
†
All characteristics are measured with zero common-mode input voltage unless otherwise noted. Full range is 0°C to 70 °C for TLC354C, –40°C to 85°C for TLC354I, and –55°C to
125°C for the TLC354M. MAX is 70°C for TLC354C, 85°C TLC354I, and 125°C for the TLC354M. IMPORTANT: See Parameter Measurement Information.
NOTE 5: The offset voltage limits given are the maximum values required to drive the output above 4 V or below 400 mV with a 10-kΩ resistor between the output and V . They can
DD
be verified by applying the limit value to the input and checking for the appropriate output state.
switching characteristics, V
= 5 V, T = 25°C
A
DD
TLC354C, TLC354I
TLC354M
PARAMETER
TEST CONDITIONS
UNIT
MIN
TYP
650
200
MAX
100-mV input step with 5-mV overdrive
TTL-level input step
R
C
connected to 5 V through 5.1 kΩ,
L
L
Response time
ns
‡
= 15 pF ,
See Note 6
‡
C
includes probe and jig capacitance.
L
NOTE 6: The response time specified is the interval between the input step function and the instant when the output crosses 1.4 V.
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
electrical characteristics at specified free-air temperature, V = 1.4 V, T = 25°C (unless otherwise
DD
A
noted)
TLC354Y
PARAMETER
Input offset voltage
TEST CONDITIONS
UNIT
MIN
TYP
MAX
V
IO
V
IC
= V min, See Note 4
ICR
2
1
5
5
mV
pA
pA
I
I
Input offset current
Input bias current
IO
IB
0 to
0.2
V
ICR
Common-mode input voltage range
V
I
High-level output current
Low-level output voltage
Low-level output current
V
ID
V
ID
V
ID
V
ID
= 1 V,
V
= 5 V
0.1
100
1.6
nA
mV
mA
µA
OH
OH
= 0.6 mA
V
= –0.5 V,
= –0.5 V,
= 0.5 V,
I
200
300
OL
OL
I
V
= 300 mV
1
OL
DD
OL
No load
I
Supply current (four comparators)
130
NOTE 4: The offset voltage limits given are the maximum values required to drive the output above 1.25 V or below 150 mV with a 10-kΩ resistor
between the output and V . They can be verified by applying the limit value to the input and checking for the appropriate output state.
DD
electrical characteristics at specified free-air temperature, V
noted)
= 5 V, T = 25°C (unless otherwise
DD
A
TLC354Y
PARAMETER
TEST CONDITIONS
= V min, See Note 5
UNIT
MIN
TYP
MAX
V
IO
Input offset voltage
V
IC
2
1
5
5
mV
pA
pA
ICR
I
I
Input offset current
Input bias current
IO
IB
0 to
V
ICR
Common-mode input voltage range
V
V
–1
DD
I
High-level output current
Low-level output voltage
Low-level output current
V
ID
V
ID
V
ID
V
ID
= 1 V,
V
= 5 V
0.1
150
16
nA
mV
mA
mA
OH
OH
= 4 mA
V
= –1 V,
= –1 V,
= 1 V,
I
400
0.6
OL
OL
I
I
V
= 1.5 mV
6
OL
OL
No load
Supply current (four comparators)
0.3
DD
NOTE 5: The offset voltage limits given are the maximum values required to drive the output above 4 V or below 400 mV with a 10-kΩ resistor
between the output and V . They can be verified by applying the limit value to the input and checking for the appropriate output state.
DD
switching characteristics, V
= 5 V, T = 25°C
A
DD
TLC354Y
TYP
PARAMETER
TEST CONDITIONS
UNIT
MIN
MAX
100-mV input step with 5-mV overdrive
TTL-level input step
650
R
C
connected to 5 V through 5.1 kΩ,
L
L
Response time
ns
‡
= 15 pF ,
See Note 6
200
‡
C
includes probe and jig capacitance.
L
NOTE 6: The response time specified is the interval between the input step function and the instant when the output crosses 1.4 V.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
The digital output stage of the TLC354 can be damaged if it is held in the linear region of the transfer curve.
Conventional operational amplifier/comparator testing incorporates the use of a servo loop that is designed to force
the device output to a level within this linear region. Since the servo-loop method of testing cannot be used, the
following alternative for measuring parameters such as input offset voltage, common-mode rejection, etc., are
offered.
To verify that the input offset voltage falls within the limits specified, the limit value is applied to the input as shown
in Figure 1(a). With the noninverting input positive with respect to the inverting input, the output should be high. With
the input polarity reversed, the output should be low.
A similar test can be made to verify the input offset voltage at the common-mode extremes. The supply voltages can
be slewed as shown in Figure 1(b) for the V
accuracy.
test, rather than changing the input voltages, to provide greater
ICR
A close approximation of the input offset voltage can be obtained by using a binary search method to vary the
differential input voltage while monitoring the output state. When the applied input voltage differential is equal but
opposite in polarity to the input offset voltage, the output changes state.
5 V
1 V
5.1 kΩ
5.1 kΩ
Applied V
Limit
Applied V
Limit
IO
IO
V
O
V
O
–4 V
(a) V WITH V = 0
IO IC
(b) V WITH V = 4 V
IO IC
Figure 1. Method for Verifying That Input Offset Voltage is Within Specified Limits
7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
Figure 2 illustrates a practicle circuit for direct dc measurement of input offset voltage that does not bias the
comparator into the linear region. The circuit consists of a switching-mode servo loop in which U1a generates a
triangular waveform of approximately 20-mV amplitude. U1b acts as a buffer with C2 and R4 removing any residual
dc offset. The signal is then applied to the inverting input of the comparator under test, while the noninverting input
is driven by the output of the integrator formed by U1c through the voltage divider formed by R9 and R10. The loop
reaches a stable operating point when the output of the comparator under test has a duty cycle of exactly 50%, which
can only occur when the incoming triangle wave is sliced symmetrically or when the voltage at the noninverting input
exactly equals the input offset voltage.
Voltage divider R9 and R10 provides a step up of the input offset voltage by a factor of 100 to make measurement
easier. The values of R5, R8, R9, and R10 can significantly influence the accuracy of the reading; therefore, it is
suggested that their tolerance level be 1% or lower.
Measuring the extremely low values of input current requires isolation from all other sources of leakage current and
compensation for the leakage of the test socket and board. With a good picoammeter, the socket and board leakage
can be measured with no device in the socket. Subsequently, this open-socket leakage value can be subtracted from
the measurement obtained with a device in the socket to obtain the actual input current of the device.
C3
0.68 µF
R5
1.8 kΩ, 1%
V
DD
U1b
1/4 TLC274CN
C2
1 µF
U1c
1/4 TLC274CN
R6
5.1 kΩ
Buffer
+
–
–
OUT
V
R4
47 kΩ
IO
(X100)
R7
1 MΩ
+
R1
Integrator
240 kΩ
C4
R8
0.1 µF
1.8 kΩ, 1%
U1a
+
–
1/4 TLC274CN
C1
0.1 µF
Triangle
Generator
R9
10 kΩ, 1%
R10
100 Ω, 1%
R2
10 kΩ
R3
100 kΩ
Figure 2. Test Circuit for Input Offset Voltage Measurement
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC354
LinCMOS QUADRUPLE DIFFERENTIAL COMPARATORS
SLCS116B – SEPTEMBER 1985 – REVISED FEBRUARY 1997
PARAMETER MEASUREMENT INFORMATION
Response time is defined as the interval between the application of an input step function and the instant when the
output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the trailing
edge of the input pulse. Response-time measurement at low input signal levels can be greatly affected by the input
offset voltage. The offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3)
so that the circuit is just at the transition point. Then a low signal, for example, 105-mV or 5-mV overdrive, causes
the output to change.
V
DD
1 µF
5.1 kΩ
Pulse Generator
OUT
C
L
50 Ω
(see Note A)
1 V
Input
Offset Voltage
Compensation
Adjustment
10 Ω
10 Turn
1 kΩ
0.1 µF
–1 V
TEST CIRCUIT
Overdrive
Input
100 mV
Overdrive
Input
100 mV
90%
10%
90%
50%
10%
50%
Low-to-High-
Level Ouptut
High-to-Low-
Level Ouptut
t
t
t
r
f
t
PLH
PLH
VOLTAGE WAVEFORMS
NOTE A: C includes probe and jig capacitance.
L
Figure 3. Response, Rise, and Fall Times Test Circuit and Voltage Waveforms
9
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
10
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
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