TLC540IJ [TI]

IC IC,DATA ACQ SYSTEM,11-CHANNEL,8-BIT,DIP,20PIN,CERAMIC, Analog IC:Other;
TLC540IJ
型号: TLC540IJ
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

IC IC,DATA ACQ SYSTEM,11-CHANNEL,8-BIT,DIP,20PIN,CERAMIC, Analog IC:Other

转换器 输入元件
文件: 总11页 (文件大小:166K)
中文:  中文翻译
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TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
DW OR N PACKAGE  
(TOP VIEW)  
8-Bit Resolution A/D Converter  
Microprocessor Peripheral or Stand-Alone  
Operation  
INPUT A0  
INPUT A1  
INPUT A2  
INPUT A3  
INPUT A4  
INPUT A5  
INPUT A6  
INPUT A7  
INPUT A8  
GND  
V
CC  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
On-Chip 12-Channel Analog Multiplexer  
Built-in Self-Test Mode  
SYSTEM CLOCK  
I/O CLOCK  
ADDRESS INPUT  
DATA OUT  
CS  
REF+  
REF–  
INPUT A10  
INPUT A9  
Software-Controllable Sample and Hold  
Total Unadjusted Error . . . ±0.5 LSB Max  
TLC541 is Direct Replacement for Motorola  
MC145040 and National Semiconductor  
ADC0811. TLC540 is Capable of Higher  
Speed  
Pinout and Control Signals Compatible  
with TLC1540 Family of 10-Bit A/D  
Converters  
FN PACKAGE  
(TOP VIEW)  
CMOS Technology  
PARAMETER  
TLC540  
TLC541  
Channel Acquisition Sample Time  
Conversion Time (Max)  
Samples per Second (Max)  
Power Dissipation (Max)  
2 µs  
9 µs  
75 x 10  
12.5 mW  
3.6 µs  
17 µs  
40 x 10  
12.5 mW  
3
3
description  
3
2
1
20 19  
18  
I/O CLOCK  
INPUT A3  
4
5
6
7
8
The TLC540 and TLC541 are CMOS A/D  
converters built around an 8-bit switched-  
capacitor  
converters. They are designed for serial interface  
to a microprocessor or peripheral via a 3-state  
output with up to four control inputs, including  
independent SYSTEM CLOCK, I/O CLOCK, chip  
select (CS), and ADDRESS INPUT. A 4-MHz  
system clock for the TLC540 and a 2.1-MHz  
system clock for the TLC541 with a design that  
ADDRESS INPUT  
DATA OUT  
CS  
INPUT A4  
INPUT A5  
INPUT A6  
INPUT A7  
17  
16  
15  
14  
successive-approximation  
A/D  
REF+  
9 10 11 12 13  
includes simultaneous read/write operation allow high-speed data transfers and sample rates of up to  
75,180samples per second for the TLC540 and 40,000 samples per second for the TLC541. In addition to the  
high-speed converter and versatile control logic, there is an on-chip 12-channel analog multiplexer that can be  
used to sample any one of 11 inputs or an internal self-test voltage, and a sample-and-hold that can operate  
automatically or under microprocessor control. Detailed information on interfacing to most popular  
microprocessors is readily available from the factory.  
AVAILABLE OPTIONS  
PACKAGE  
T
A
SO PLASTIC DIP  
(DW)  
PLASTIC DIP  
(N)  
CHIP CARRIER  
(FN)  
TLC540IN  
TLC541IN  
TLC540IFN  
TLC541IFN  
40°C to 85°C  
55°C to 125°C  
TLC541IDW  
TLC541MN  
Copyright 1995, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
The converters incorporated in the TLC540 and TLC541 feature differential high-impedance reference inputs  
that facilitate ratiometric conversion, scaling, and analog circuitry isolation from logic and supply noises. A  
switched-capacitor design allows low-error (±0.5 LSB) conversion in 9 µs for the TLC540 and 17 µs for the  
TLC541 over the full operating temperature range.  
The TLC540I and TLC541I are characterized for operation from 40°C to 85°C.The TLC541M is characterized  
for operation from 55°C to 125°C.  
functional block diagram  
REF+  
14  
REF–  
13  
8-Bit  
Analog-to-Digital  
Converter  
1
2
3
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
A10  
Sample  
and  
Hold  
(Switched-Capacitors)  
4
5
6
7
8
9
11  
12  
12-Channel  
Analog  
Multiplexer  
8
Analog  
Inputs  
Output  
Data  
Register  
8-to-1 Data  
Selector  
and Driver  
8
16  
DATA  
OUT  
Input  
Address  
Register  
4
4
4
Self-Test  
Reference  
Control Logic  
and I/O  
Counters  
Input  
Multiplexer  
2
17  
ADDRESS  
INPUT  
18  
I/O  
CLOCK  
15  
19  
CS  
SYSTEM  
CLOCK  
typical equivalent inputs  
INPUT CIRCUIT IMPEDANCE DURING SAMPLING MODE  
INPUT CIRCUIT IMPEDANCE DURING HOLD MODE  
1 kTYP  
INPUT  
A0A10  
5 MTYP  
INPUT  
A0A10  
C = 60 pF TYP  
i
(equivalent input  
capacitance)  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
operating sequence  
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
I/O  
CLOCK  
Don’t  
Care  
Access  
Cycle B  
(see Note C)  
Sample  
Cycle B  
Access  
Cycle C  
t
Sample  
Cycle C  
conv  
See Note A  
CS  
t
wH(CS)  
Don’t Care  
MSB  
LSB  
MSB  
LSB  
ADDRESS  
INPUT  
Don’t Care  
B3 B2 B1 B0  
C3 C2 C1 C0  
Hi-Z  
Hi-Z State  
A7  
State  
DATA  
OUT  
A7  
A6 A5 A4 A3 A2 A1 A0  
B7 B6 B5 B4 B3 B2 B1 B0  
Conversion Data B  
B7  
Previous Conversion Data A  
LSB  
MSB  
MSB  
MSB  
LSB  
MSB  
(See Note B)  
NOTES: A. The conversion cycle, which requires 36 system clock periods, is initiated on the 8th falling edge of I/O CLOCK after CS goes low  
for the channel whose address exists in memory at that time. If CS is kept low during conversion, I/O CLOCK must remain low  
for at least 36 system clock cycles to allow conversion to be completed.  
B. The most significant bit (MSB) will automatically be placed on the DATA OUT bus after CS is brought low. The remaining seven  
bits (A6A0) will be clocked out on the first seven I/O CLOCK falling edges.  
C. To minimize errors caused by noise at CS, the internal circuitry waits for three system clock cycles (or less) after a chip select  
falling edge is detected before responding to control input signals. Therefore, no attempt should be made to clock-in address data  
until the minimum chip-select setup time has elapsed.  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage, V  
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.5 V  
CC  
Input voltage range, V (any input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to V  
Output voltage range, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to V  
+0.3 V  
+0.3 V  
I
CC  
CC  
O
Peak input current range (any input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±10 mA  
Peak total input current (all inputs) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±30 mA  
Operating free-air temperature range, T : TLC540I, TLC541I . . . . . . . . . . . . . . . . . . . . . . . . . . 40°C to 85°C  
A
Storage temperature range, T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
Case temperature for 10 seconds: FN package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C  
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: DW or N package . . . . . . . . . . . . . . . 260°C  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values are with respect to digital ground with REF– and GND wired together (unless otherwise noted).  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
recommended operating conditions  
TLC540  
NOM  
5
TLC541  
UNIT  
MIN  
4.75  
2.5  
0.1  
1
MAX  
5.5  
MIN NOM  
MAX  
5.5  
Supply voltage, V  
4.75  
2.5  
– 0.1  
1
5
V
V
V
V
V
V
V
CC  
Positive reference voltage, V  
(see Note 2)  
(see Note 2)  
– V (see Note 2)  
V
CC  
0
V
V
+0.1  
2.5  
V
V
V
V
+0.1  
2.5  
ref+  
CC  
CC  
0
CC  
Negative reference voltage, V  
ref–  
Differential reference voltage, V  
V
CC  
+0.2  
+0.2  
ref+  
ref–  
CC  
CC  
CC  
Analog input voltage (see Note 2)  
High-level control input voltage, V  
0
V
CC  
0
V
CC  
2
2
IH  
Low-level control input voltage, V  
0.8  
0.8  
IL  
Setup time, address bits at data input before I/O CLOCK,  
200  
0
400  
0
ns  
t
su(A)  
Hold time, address bits after I/O CLOCK, t  
ns  
h(A)  
System  
clock  
cycles  
Setup time, CS low before clocking in first address bit, t  
(see Note 3)  
su(CS)  
3
3
System  
clock  
cycles  
CS high during conversion, t  
wH(CS)  
36  
0
36  
0
I/O CLOCK frequency, f  
clock(I/O)  
2.048  
4
1.1  
2.1  
MHz  
MHz  
MHz  
MHz  
ns  
Pulse duration, SYSTEM CLOCK frequency, f  
f
f
clock(SYS)  
clock(I/O)  
110  
clock(I/O)  
210  
Pulse duration, SYSTEM CLOCK high, t  
Pulse duration, SYSTEM CLOCK low, t  
wH(SYS)  
100  
200  
200  
190  
404  
404  
wL(SYS)  
Pulse duration, I/O clock high, t  
wH(I/O)  
Pulse duration, I/O clock low, t  
ns  
wL(I/O)  
f
1048 kHz  
30  
20  
30  
20  
clock(SYS)  
System  
I/O  
f
f
f
> 1048 kHz  
Clock transition time  
(see Note 4)  
clock(SYS)  
ns  
525 kHz  
100  
40  
100  
40  
clock(I/O)  
clock(I/O)  
> 525 kHz  
Operating free-air temperature, T  
TLC540I, TLC541I  
40  
85  
40  
85  
°C  
A
NOTES: 2. Analog input voltages greater than that applied to REF + convert as all “1”s (11111111), while input voltages less than that applied  
to REF– convert as all “0”s (00000000). For proper operation, REF+ voltage must be at least 1 V higher than REF– voltage. Also,  
the total unadjusted error may increase as this differential reference voltage falls below 4.75 V.  
3. To minimize errors caused by noise at CS, the internal circuitry waits for three SYSTEM CLOCK cycles (or less) after a chip select  
falling edge is detected before responding to control input signals. Therefore, no attempt should be made to clock in an address until  
the minimum chip select setup time has elapsed.  
4. This is the time required for the clock input signal to fall from V min to V max or to rise from V max to V min. In the vicinity  
IH  
IL  
IL  
IH  
of normal room temperature, the devices function with input clock transition time as slow as 2 µs for remote data acquisition  
applications where the sensor and the A/D converter are placed several feet away from the controlling microprocessor.  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
electrical characteristics over recommended operating temperature range, V  
= V  
= 4.75 V to  
CC  
ref+  
5.5 V, f  
= 2.048 MHz for TLC540 or f  
= 1.1 MHz for TLC541 (unless otherwise noted)  
clock(I/O)  
clock(I/O)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
V
V
V
High-level output voltage, DATA OUT  
V
V
V
V
= 4.75 V,  
= 4.75 V,  
I
= 360 µA  
2.4  
OH  
CC  
OH  
Low-level output voltage  
I
= 1.6 mA  
0.4  
10  
V
OL  
CC  
OL  
= V  
CC  
= 0,  
,
CS at V  
O
O
CC  
CC  
I
Off-state (high-impedance state) output current  
µA  
OZ  
CS at V  
10  
2.5  
I
I
I
High-level input current  
Low-level input current  
Operating supply current  
V =V  
0.005  
0.005  
1.2  
µA  
µA  
IH  
I
CC  
V = 0  
2.5  
2.5  
IL  
I
CS at 0 V  
mA  
CC  
Selected channel at V  
Unselected channel at 0 V  
,
CC  
0.4  
1
Selected channel leakage current  
Supply and reference current  
µA  
Selected channel at 0 V,  
0.4  
–1  
Unselected channel at V  
CC  
CS at 0 V  
I
+ I  
V
ref+  
= V  
,
CC  
1.3  
7
3
55  
15  
mA  
pF  
CC ref  
Analog inputs  
Input capacitance  
C
i
Control inputs  
5
All typical values are at T = 25°C.  
A
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
operating characteristics over recommended operating free-air temperature range,  
V
= V  
– 4.75 V to 5.5 V, f  
= 2.048 MHz for TLC540 or 1.1 MHz for TLC541,  
CC  
ref+  
clock(I/O)  
f
= 4 MHz for TLC540 or 2.1 MHz for TLC541  
clock(SYS)  
TLC540  
MIN MAX  
TLC541  
MIN MAX  
PARAMETER  
TEST CONDITIONS  
UNIT  
E
E
E
Linearity error  
See Note 5  
±0.5  
±0.5  
±0.5  
±0.5  
±0.5  
±0.5  
±0.5  
±0.5  
LSB  
LSB  
LSB  
LSB  
L
Zero–scale error  
Full-scale error  
See Notes 2 and 6  
See Notes 2 and 6  
See Note 7  
ZS  
FS  
Total unadjusted error  
Input A11 address = 1011,  
(see Note 8)  
01111101 10000011 01111101 10000011  
Self-test output code  
(125)  
(131)  
(125)  
(131)  
t
t
Conversion time  
See Operating Sequence  
See Operating Sequence  
9
17  
µs  
µs  
conv  
Total access and conversion time  
13.3  
25  
I/O  
clock  
cylces  
Channel acquisition time (sample cycle)  
See Operating Sequence  
4
4
a
Time output data remains valid after  
I/O CLOCK↓  
t
t
10  
10  
ns  
ns  
v
Delay time, I/O CLOCKto data output  
valid  
300  
400  
d
See Parameter  
Measurement  
Information  
t
t
t
t
Output enable time  
Output disable time  
Data bus rise time  
Data bus fall time  
150  
150  
300  
300  
150  
150  
300  
300  
ns  
ns  
ns  
ns  
en  
dis  
r(bus)  
f(bus)  
NOTES: 2. Analog input voltages greater than that applied to REF+ convert to all “1”s (11111111) while input voltages less than that applied to  
REF– convert to all “0”s (00000000). For proper operation, REF+ voltage must be at least 1 V higher than REF– voltage. Also, the  
total unadjusted error may increase as this differential reference voltage falls below 4.75 V.  
5. Linearity error is the maximum deviation from the best straight line through the A/D transfer characteristics.  
6. Zero-scale error is the difference between 00000000 and the converted output for zero input voltage; full-scale error is the difference  
between 11111111 and the converted output for full-scale input voltage.  
7. Total unadjusted error is the sum of linearity, zero-scale, and full-scale errors.  
8. Both the input address and the output codes are expressed in positive logic.  
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
PARAMETER MEASUREMENT INFORMATION  
V
CC  
1.4 V  
3 kΩ  
3 kΩ  
Test  
Point  
Output  
Under Test  
Test  
Point  
Output  
Under Test  
Test  
Point  
Output  
Under Test  
C
C
L
C
L
3 kΩ  
L
(see Note A)  
(see Note A)  
(see Note A)  
See Note B  
See Note B  
LOAD CIRCUIT FOR  
LOAD CIRCUIT FOR  
LOAD CIRCUIT FOR  
t AND t  
PZL PLZ  
t , t , AND t  
d
r
f
t
AND t  
PHZ  
PZH  
V
CC  
50%  
CS  
0 V  
SYSTEM  
CLOCK  
t
PZL  
t
PLZ  
V
CC  
Output Waveform 1  
(see Note C)  
50%  
See Note B  
10%  
0 V  
t
PZH  
t
PHZ  
V
OH  
90%  
Output Waveform 2  
(see Note C)  
50%  
0 V  
VOLTAGE WAVEFORMS FOR ENABLE AND DISABLE TIMES  
I/O CLOCK  
0.8 V  
2.4 V  
0.4 V  
Output  
t
d
t
t
f
r
2.4 V  
0.8 V  
DATA OUT  
VOLTAGE WAVEFORMS FOR RISE AND FALL TIMES  
VOLTAGE WAVEFORMS FOR DELAY TIME  
= 50 pF for TLC540 and 100 pF for TLC541.  
NOTES: A.  
B.  
C
L
en PZH  
t
= t  
or t  
, t  
= t  
or t  
.
PLZ  
PZL dis PHZ  
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
APPLICATION INFORMATION  
simplified analog input analysis  
Using the equivalent circuit in Figure 1, the time required to charge the analog input capacitance from 0 to V  
within 1/2 LSB can be derived as follows:  
S
The capacitance charging voltage is given by  
–t R C  
c
t
i
(1)  
V
V
1–e  
C
S
where  
R = R + r  
i
t
s
The final voltage to 1/2 LSB is given by  
V (1/2 LSB) = V – (V /512)  
(2)  
C
S
S
Equating equation 1 to equation 2 and solving for time t gives  
c
–t R C  
c
t
i
V
V
512  
V
1–e  
(3)  
(4)  
S
S
S
and  
t (1/2 LSB) = R × C × ln(512)  
c
t
i
Therefore, with the values given the time for the analog input signal to settle is  
t (1/2 LSB) = (R + 1 k) × 60 pF × ln(512)  
(5)  
c
s
This time must be less than the converter sample time shown in the timing diagrams.  
Driving Source  
TLC540/1  
R
r
i
s
V
I
V
S
V
C
1 kMAX  
C
i
50 pF MAX  
V
V
= Input Voltage at INPUT A0A10  
= External Driving Source Voltage  
I
S
s
R = Source Resistance  
r
= Input Resistance  
i
C = Equivalent Input Capacitance  
i
Driving source requirements:  
Noise and distortion for the source must be equivalent to the  
resolution of the converter.  
R must be real at the input frequency.  
s
Figure 1. Equivalent Input Circuit Including the Driving Source  
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
PRINCIPLES OF OPERATION  
The TLC540 and TLC541 are each complete data acquisition systems on a single chip. They include such functions  
as analog multiplexer, sample and hold, 8-bit A/D converter, data and control registers, and control logic. For flexibility  
and access speed, there are four control inputs [two clocks, chip select (CS), and address]. These control inputs and  
a TTL-compatible 3-state output are intended for serial communications with a microprocessor or microcomputer.  
With judicious interface timing, with TLC540 a conversion can be completed in 9 µs, while complete  
input-conversion-output cycles can be repeated every 13 µs. With TLC541 a conversion can be completed in 17 µs,  
while complete input-conversion-output cycles are repeated every 25 µs. Furthermore, this fast conversion can be  
executed on any of 11 inputs or its built-in self-test and in any order desired by the controlling processor.  
The system and I/O clocks are normally used independently and do not require any special speed or phase  
relationships between them. This independence simplifies the hardware and software control tasks for the device.  
Once a clock signal within the specification range is applied to SYSTEM CLOCK, the control hardware and software  
need only be concerned with addressing the desired analog channel, reading the previous conversion result, and  
starting the conversion by using I/O CLOCK. SYSTEM CLOCK will drive the conversion crunching circuitry so that  
the control hardware and software need not be concerned with this task.  
WhenCSishigh, DATAOUTisina3-stateconditionandADDRESSINPUTandI/OCLOCKaredisabled. Thisfeature  
allows each of these terminals, with the exception of CS, to share a control logic point with their counterpart terminals  
on additional A/D devices when additional TLC540/541 devices are used. In this way, the above feature serves to  
minimize the required control logic terminals when using multiple A/D devices.  
The control sequence has been designed to minimize the time and effort required to initiate conversion and obtain  
the conversion result. A normal control sequence is:  
1. CS is brought low. To minimize errors caused by noise at CS, the internal circuitry waits for two rising edges  
and then a falling edge of SYSTEM CLOCK after a low CS transition, before the low transition is recognized.  
This technique is used to protect the device against noise when the device is used in a noisy environment.  
The MSB of the previous conversion result automatically appears on DATA OUT.  
2. A new positive-logic multiplexer address is shifted in on the first four rising edges of I/O CLOCK. The MSB  
of the address is shifted in first. The negative edges of these four I/O clock pulses shift out the second, third,  
fourth, and fifth most significant bits of the previous conversion result. The on-chip sample and hold begins  
sampling the newly addressed analog input after the fourth falling edge. The sampling operation basically  
involves the charging of internal capacitors to the level of the analog input voltage.  
3. Three clock cycles are then applied to I/O CLOCK and the sixth, seventh, and eighth conversion bits are  
shifted out on the negative edges of these clock cycles.  
4. The final eighth clock cycle is applied to I/O CLOCK. The falling edge of this clock cycle completes the  
analog sampling process and initiates the hold function. Conversion is then performed during the next 36  
system clock cycles. After this final I/O clock cycle, CS must go high or the I/O CLOCK must remain low  
for at least 36 system clock cycles to allow for the conversion function.  
CS can be kept low during periods of multiple conversion. When keeping CS low during periods of multiple  
conversion, special care must be exercised to prevent noise glitches on I/O CLOCK. If glitches occur on I/O CLOCK,  
the I/O sequence between the microprocessor/controller and the device loses synchronization. Also, if CS is taken  
high, itmustremainhighuntiltheendoftheconversion. Otherwise, avalidfallingedgeofCScausesaresetcondition,  
which aborts the conversion in progress.  
A new conversion can be started and the ongoing conversion simultaneously aborted by performing steps 1 through  
4 before the 36 system clock cycles occur. Such action yields the conversion result of the previous conversion and  
not the ongoing conversion.  
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC540I, TLC541I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 INPUTS  
SLAS065A – OCTOBER 1983 – REVISED MARCH 1995  
PRINCIPLES OF OPERATION  
It is possible to connect SYSTEM CLOCK and I/O clock together in special situations in which controlling circuitry  
points must be minimized. In this case, the following special points must be considered in addition to the requirements  
of the normal control sequence previously described.  
1. The first two clocks are required for this device to recognize CS is at a valid low level when the common clock  
signal is used as an I/O CLOCK. When CS is recognized by the device to be at a high level, the common clock  
signal is used for the conversion clock also.  
2. A low CS must be recognized before the I/O CLOCK can shift in an analog channel address. The device  
recognizes a CS transition when the SYSTEM CLOCK terminal receives two positive edges and then a  
negative edge. For this reason, after a CS negative edge, the first two clock cycles do not shift in the address.  
Also, upon shifting in the address, CS must be raised after the eighth valid (10 total) I/O CLOCK. Otherwise,  
additional common clock cycles are recognized as I/O CLOCKS and will shift in an erroneous address.  
For certain applications, such as strobing applications, it is necessary to start conversion at a specific point in time.  
This device accommodates these applications. Although the on-chip sample and hold begins sampling upon the  
negative edge of the fourth valid I/O clock cycle, the hold function is not initiated until the negative edge of the eighth  
valid I/O clock cycle. Thus, the control circuitry can leave the I/O clock signal in its high state during the eighth valid  
I/O clock cycle until the moment at which the analog signal must be converted. The TLC540/TLC541 continues  
sampling the analog input until the eighth falling edge of the I/O clock. The control circuitry or software then  
immediately lowers the I/O clock signal and holds the analog signal at the desired point in time and start conversion.  
Detailed information on interfacing to most popular microprocessors is readily available from the factory.  
10  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1999, Texas Instruments Incorporated  

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