TLC545 [TI]

8-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 19 INPUTS; 8位模拟数字转换器与串行控制和19输入量
TLC545
型号: TLC545
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

8-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 19 INPUTS
8位模拟数字转换器与串行控制和19输入量

转换器 输入元件
文件: 总13页 (文件大小:185K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
N PACKAGE  
(TOP VIEW)  
8-Bit Resolution A/D Converter  
Microprocessor Peripheral or Stand-Alone  
Operation  
INPUT A0  
INPUT A1  
INPUT A2  
INPUT A3  
INPUT A4  
INPUT A5  
INPUT A6  
INPUT A7  
INPUT A8  
INPUT A9  
INPUT A10  
INPUT A11  
INPUT A12  
GND  
V
CC  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
On-Chip 20-Channel Analog Multiplexer  
Built-in Self-Test Mode  
SYSTEM CLOCK  
I/O CLOCK  
ADDRESS INPUT  
DATA OUT  
CS  
2
3
Software-Controllable Sample and Hold  
Total Unadjusted Error . . . ±0.5 LSB Max  
4
5
6
Timing and Control Signals Compatible  
With 8-Bit TLC540 and 10-Bit TLC1540 A/D  
Converter Families  
REF+  
REF–  
7
8
INPUT A18  
INPUT A17  
INPUT A16  
INPUT A15  
INPUT A14  
INPUT A13  
9
CMOS Technology  
10  
11  
12  
13  
14  
PARAMETER  
TL545  
TL546  
Channel Acquisition Time  
Conversion Time (Max)  
Sampling Rate (Max)  
1.5 µs  
9 µs  
76 x 10  
15 mW  
2.7 µs  
17 µs  
40 x 10  
15 mW  
3
3
Power Dissipation (Max)  
FN PACKAGE  
(TOP VIEW)  
description  
The TLC545 and TLC546 are CMOS  
analog-to-digital converters built around an 8-bit  
switched capacitor successive-approximation  
analog-to-digital converter. They are designed for  
serial interface to a microprocessor or peripheral  
via a 3-state output with up to four control inputs  
including independent SYSTEM CLOCK, I/O  
CLOCK, chip select (CS), and ADDRESS INPUT.  
A 4-MHz system clock for the TLC545 and a  
2.1-MHz system clock for the TLC546 with a  
design that includes simultaneous read/write  
operation allowing high-speed data transfers and  
sample rates of up to 76,923 samples per second  
for the TLC545, and 40,000 samples per second  
for the TLC546.  
4
3
2 1 28 27 26  
INPUT A4  
5
25  
24  
23  
22  
21  
20  
19  
ADDRESS INPUT  
DATA OUT  
CS  
REF+  
REF–  
INPUT A5  
INPUT A6  
INPUT A7  
INPUT A8  
INPUT A9  
INPUT A10  
6
7
8
9
INPUT A18  
INPUT A17  
10  
11  
12 13 14 15 16 17 18  
In addition to the high-speed converter and  
versatile control logic, there is an on-chip  
20-channel analog multiplexer that can be used to  
sample any one of 19 inputs or an internal self-test  
voltage, and a sample-and-hold that can operate  
automatically or under microprocessor control.  
The converters incorporated in the TLC545 and TLC546 feature differential high-impedance reference inputs  
thatfacilitateratiometricconversion, scaling, andanalogcircuitryisolationfromlogicandsupplynoises. Atotally  
switched capacitor design allows low-error (±0.5 LSB) conversion in 9 µs for the TLC545, and 17 µs for the  
TLC546, over the full operating temperature range.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 1996, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
AVAILABLE OPTIONS  
PACKAGE  
CHIP CARRIER  
T
A
PLASTIC DIP  
(N)  
(FN)  
TLC545CFN  
TLC545CN  
0°C to 70°C  
TLC545IFN  
TLC546IFN  
TLC545IN  
TLC546IN  
40°C to 85°C  
description (continued)  
The TLC545C and the TLC546C are characterized for operation from 0°C to 70°C. The TLC545I and the  
TLC546I are characterized for operation from 40°C to 85°C.  
functional block diagram  
1
A0  
2
A1  
REF+  
22  
REF–  
21  
3
4
5
6
7
8
9
A2  
A3  
A4  
A5  
A6  
8-Bit  
Analog-to-Digital  
Converter  
A7  
A8  
Sample  
and  
Hold  
20-Channel  
Analog  
Multiplexer  
10  
11  
12  
13  
15  
16  
17  
18  
19  
20  
(Switched-capacitors)  
A9  
INPUTS  
A10  
A11  
A12  
A13  
A14  
A15  
A16  
A17  
A18  
8
Output  
8
Data  
Register  
8-to-1 Data  
Selector and  
Driver  
24  
DATA  
OUT  
Input  
Address  
Register  
5
4
5
Self-Test  
Reference  
Control Logic  
and I/O  
Counters  
2
25  
Input  
Multiplexer  
ADDRESS  
INPUT  
26  
23  
27  
I/O  
CLOCK  
CS  
SYSTEM  
CLOCK  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
typical equivalent inputs  
INPUT CIRCUIT IMPEDANCE DURING SAMPLING MODE  
INPUT CIRCUIT IMPEDANCE DURING HOLD MODE  
1 kTYP  
INPUT  
A0A18  
5 MTYP  
INPUT  
A0A18  
C = 60 pF TYP  
i
(equivalent input  
capacitance)  
operating sequence  
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
I/O  
CLOCK  
Don’t  
t
Care  
Sample  
Cycle C  
conv  
Access  
Cycle C  
Sample Cycle B  
Access  
Cycle B  
(see Note C)  
See Note A  
CS  
t
wH(CS)  
MSB  
LSB  
MSB  
LSB  
ADDRESS  
INPUT  
Don’t Care  
Don’t Care  
B4 B3 B2 B1 B0  
C4 C3 C2 C1 C0  
Hi-Z  
State  
Hi-Z State  
DATA  
OUT  
A7  
A6 A5 A4 A3 A2 A1 A0  
B7 B6 B5 B4 B3 B2 B1 B0  
A7  
B7  
LSB  
LSB  
MSB  
(see Note B)  
Previous Conversion Data A  
Conversion Data B  
MSB  
MSB  
MSB  
NOTES: A. The conversion cycle, which requires 36 system clock periods, is initiated with the eighth I/O CLOCKafter CSfor the channel  
whose address exists in memory at that time.  
B. The most significant bit (MSB) will automatically be placed on the DATA OUT bus after CS is brought low. The remaining seven bits  
(A6–A0) will be clocked out on the first seven I/O CLOCK falling edges.  
C. To minimize errors caused by noise at the CS input, the internal circuitry waits for three system clock cycles (or less) after a chip  
select transition before responding to control input signals. Therefore, no attempt should be made to clock-in address data until the  
minimum chip-select setup time has elapsed.  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage, V  
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6.5 V  
CC  
Input voltage range, V (any input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to V  
Output voltage range, V  
+0.3 V  
+0.3 V  
I
CC  
CC  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to V  
O
Peak input current range (any input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±10 mA  
Peak total input current (all inputs) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±30 mA  
Operating free-air temperature range, T : TLC545C, TLC546C . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
A
TLC545I, TLC546I . . . . . . . . . . . . . . . . . . . . . . . . . . 40°C to 85°C  
Storage temperature range, T  
Case temperature for 10 seconds, T : FN package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C  
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds: N package . . . . . . . . . . . . . . . . . . . . . 260°C  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values are with respect to network ground terminal.  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
recommended operating conditions  
TLC545  
NOM  
5
TLC546  
NOM  
5
UNIT  
MIN  
4.75  
0
MAX  
5.5  
MIN  
4.75  
0
MAX  
5.5  
Supply voltage, V  
V
V
V
V
V
V
V
CC  
Positive reference voltage, V  
(see Note 2)  
(see Note 3)  
– V (see Note 3)  
V
CC  
0
V
V
+0.1  
V
CC  
0
V
V
+0.1  
ref+  
Negative reference voltage, V  
CC  
CC  
0.1  
0
V
CC  
+0.2  
0.1  
0
V
CC  
+0.2  
ref–  
Differential reference voltage, V  
V
CC  
V
CC  
ref+  
ref–  
CC  
CC  
Analog input voltage (see Note 3)  
High-level control input voltage, V  
0
V
CC  
0
V
CC  
2
2
IH  
Low-level control input voltage, V  
0.8  
0.8  
IL  
Setup time, address bits at data input before I/O CLOCK,  
200  
0
400  
0
ns  
ns  
t
su(A)  
Address hold time, t  
h
System  
clock  
cycles  
Setup time, CS low before clocking in first address bit, t  
(see Note 2)  
su(CS)  
3
3
I/O CLOCK frequency, f  
clock(I/O)  
0
2.048  
4
0
1.1  
2.1  
MHz  
MHz  
SYSTEM CLOCK frequency, f  
f
f
clock(I/O)  
clock(SYS)  
clock(I/O)  
System  
clock  
cycles  
Pulse duration, CS high during conversion, t  
wH(CS)  
36  
36  
Pulse duration, SYSTEM CLOCK high, t  
wH(SYS)  
110  
100  
200  
200  
210  
190  
404  
404  
ns  
ns  
ns  
ns  
Pulse duration, SYSTEM CLOCK low, t  
wL(SYS)  
Pulse duration, I/O CLOCK high, t  
wH(I/O)  
Pulse duration, I/O CLOCK low, t  
wL(I/O)  
f
f
f
f
1048 kHz  
30  
20  
30  
20  
clock(SYS)  
System  
ns  
ns  
> 1048 kHz  
Clock transition time  
clock(SYS)  
(see Note 4)  
I/O  
525 kHz  
100  
40  
100  
40  
clock(I/O)  
clock(I/O)  
> 525 kHz  
TLC545C, TLC546C  
TLC545I, TLC546I  
0
70  
0
70  
Operating free-air temperature, T  
A
40  
85  
40  
85  
°C  
NOTES: 2. To minimize errors caused by noise at CS, the internal circuitry waits for three system clock cycles (or less) after a chip select falling  
edge or rising edge is detected before responding to control input signals. Therefore, no attempt should be made to clock-in address  
data until the minimum chip select setup time has elapsed.  
3. Analog input voltages greater than that applied to REF+ convert as all “1”s (11111111), while input voltages less than that applied  
to REF– convert asall0”s(00000000). Asthedifferentialreferencevoltagedecreasesbelow4.75V, thetotalunadjustederrortends  
to increase.  
4. This is the time required for the clock input signal to fall from V min to V max or to rise from V max to V min. In the vicinity  
IH  
IL  
IL  
IH  
of normal room temperature, the devices function with input clock transition time as slow as 2 µs for remote data acquisition  
applications where the sensor and the A/D converter are placed several feet away from the controlling microprocessor.  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
electrical characteristics over recommended operating temperature range,  
V
= V  
= 4.75 V to 5.5 V, f  
= 2.048 MHz for TLC545 or f  
= 1.1 MHz for TLC546  
CC  
ref+  
clock(I/O)  
clock(I/O)  
(unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
2.4  
TYP  
MAX  
UNIT  
V
V
V
High-level output voltage (DATA OUT)  
V
V
V
V
= 4.75 V,  
= 4.75 V,  
I
I
= 360 µA  
OH  
CC  
OH  
Low-level output voltage  
= 3.2 mA  
0.4  
10  
V
OL  
CC  
OL  
= V  
,
CS at V  
CS at V  
O
O
CC  
= 0,  
CC  
I
Off-state (high-impedance state) ouput current  
µA  
OZ  
10  
2.5  
CC  
I
I
I
High-level input current  
Low-level input current  
Operating supply current  
V = V  
CC  
0.005  
0.005  
1.2  
µA  
µA  
IH  
I
V = 0  
I
2.5  
2.5  
IL  
CS at 0 V  
mA  
CC  
Selected channel at V  
Unselected channel at 0 V  
,
CC  
0.4  
1
Selected channel leakage current  
µA  
Selected channel at 0 V,  
0.4  
–1  
Unselected channel at V  
CC  
CS at 0 V  
I + I  
CC ref  
Supply and reference current  
V
ref+  
= V  
,
CC  
1.3  
7
3
55  
15  
mA  
pF  
Analog inputs  
Input capacitance  
C
i
Control inputs  
5
All typical values are at T = 25°C.  
A
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
operating characteristics over recommended operating free-air temperature range,  
= V = 4.75 V to 5.5 V, f = 2.048 MHz for TLC545 or 1.1 MHz for TLC546,  
V
CC  
ref+  
clock(I/O)  
f
= 4 MHz for TLC545 or 2.1 MHz for TLC546  
clock(SYS)  
TLC545  
TLC546  
PARAMETER  
TEST CONDITIONS  
See Note 5  
UNIT  
MIN TYP  
MAX  
±0.5  
±0.5  
±0.5  
±0.5  
MIN TYP  
MAX  
±0.5  
±0.5  
±0.5  
±0.5  
E
E
E
Linearity error  
LSB  
LSB  
LSB  
LSB  
L
Zero-scale error  
Full-scale error  
See Note 6  
See Note 6  
See Note 7  
ZS  
FS  
Total unadjusted error  
INPUT A19 address = 10011  
(see Note 8)  
01111101  
(125)  
10000011 01111101  
10000011  
(131)  
Self-test output code  
Conversion time  
(131)  
(125)  
t
t
See Operating Sequence  
9
17  
µs  
µs  
conv  
Total access and  
conversion time  
See Operating Sequence  
13  
3
25  
I/O  
clock  
cycles  
Channel acquisition time  
(sample cycle)  
See Operating Sequence  
3
acq  
Time output data remains  
valid after I/O CLOCK↓  
t
t
10  
10  
ns  
ns  
v
Delay time, I/O CLOCK to  
DATA OUT valid  
300  
400  
d
t
t
t
t
Output enable time  
Output disable time  
Data bus rise time  
Data bus fall time  
150  
150  
300  
300  
150  
150  
300  
300  
ns  
ns  
ns  
ns  
en  
See Parameter  
Measurement Information  
dis  
r(bus)  
f(bus)  
NOTES: 5. Linearity error is the maximum deviation from the best straight line through the A/D transfer characteristics.  
6. Zero-scale error is the difference between 00000000 and the converted output for zero input voltage; full-scale error is the difference  
between 11111111 and the converted output for full-scale input voltage.  
7. Total unadjusted error is the sum of linearity, zero-scale, and full-scale errors.  
8. Both the input address and the output codes are expressed in positive logic. The INPUT A19 analog input signal is internally  
generated and is used for test purposes.  
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
PARAMETER MEASUREMENT INFORMATION  
V
CC  
1.4 V  
3 kΩ  
3 kΩ  
Test  
Point  
Output  
Under Test  
Test  
Point  
Output  
Under Test  
Test  
Point  
Output  
Under Test  
C
C
L
C
L
3 kΩ  
L
(see Note A)  
(see Note A)  
(see Note A)  
See Note B  
See Note B  
LOAD CIRCUIT FOR  
LOAD CIRCUIT FOR  
LOAD CIRCUIT FOR  
t AND t  
PZL PLZ  
t , t , AND t  
d
r
f
t
AND t  
PHZ  
PZH  
V
CC  
50%  
CS  
0 V  
SYSTEM  
CLOCK  
t
PZL  
t
PLZ  
V
CC  
Output Waveform 1  
(see Note C)  
50%  
See Note B  
10%  
0 V  
t
PZH  
t
PHZ  
V
OH  
90%  
Output Waveform 2  
(see Note C)  
50%  
0 V  
VOLTAGE WAVEFORMS FOR ENABLE AND DISABLE TIMES  
I/O CLOCK  
0.8 V  
2.4 V  
0.4 V  
Output  
t
d
t
t
f
r
2.4 V  
0.8 V  
DATA OUT  
VOLTAGE WAVEFORMS FOR RISE AND FALL TIMES  
VOLTAGE WAVEFORMS FOR DELAY TIME  
= 50 pF for TLC545 and 100 pF for TLC546  
NOTES: A.  
B.  
C
L
t = t  
en PZH  
or t  
, t or t  
= t  
PZL dis PHZ PLZ  
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
PARAMETER MEASUREMENT INFORMATION  
simplified analog input analysis  
Using the equivalent circuit in Figure 1, the time required to charge the analog input capacitance from 0 to V  
within 1/2 LSB can be derived as follows:  
S
The capacitance charging voltage is given by  
–t /R C  
c
t i  
(1)  
V = V 1e  
(
)
C
S
where  
R = R + r  
i
t
s
The final voltage to 1/2 LSB is given by  
V (1/2 LSB) = V – (V /512)  
(2)  
C
S
S
Equating equation 1 to equation 2 and solving for time t gives  
c
–t /R C  
c
t i  
V (V /512) = V 1e  
(3)  
(4)  
(
)
S
S
S
and  
t (1/2 LSB) = R × C × ln(512)  
c
t
i
Therefore, with the values given the time for the analog input signal to settle is  
t (1/2 LSB) = (R + 1 k) × 60 pF × ln(512)  
(5)  
c
s
This time must be less than the converter sample time shown in the timing diagrams.  
Driving Source  
TLC545/6  
R
r
i
s
V
I
V
S
V
C
1 kMAX  
C
i
50 pF MAX  
V
V
= Input Voltage at INPUT A0A18  
= External Driving Source Voltage  
I
S
s
R = Source Resistance  
r
= Input Resistance  
i
C = Input Capacitance  
i
Driving source requirements:  
Noise and distortion for the source must be equivalent to the  
resolution of the converter.  
R must be real at the input frequency.  
s
Figure 1. Equivalent Input Circuit Including the Driving Source  
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
PRINCIPLES OF OPERATION  
The TLC545 and TLC546 are both complete data acquisition systems on single chips. Each includes such functions  
as system clock, sample and hold, 8-bit A/D converter, data and control registers, and control logic. For flexibility and  
access speed, there are four control inputs; CS, ADDRESSINPUT, I/OCLOCK, andSYSTEMCLOCK. Thesecontrol  
inputs and a TTL-compatible 3-state output facilitate serial communications with a microprocessor or microcomputer.  
The TLC545 and TLC546 can complete conversions in a maximum of 9 and 17 µs respectively, while complete  
input-conversion-output cycles can be repeated at a maximum of 13 and 25 µs, respectively.  
The system clock and I/O clock are normally used independently and do not require any special speed or phase  
relationships between them. This independence simplifies the hardware and software control tasks for the device.  
Once a clock signal within the specification range is applied to the SYSTEM CLOCK input, the control hardware and  
softwareneedonlybeconcernedwithaddressingthedesiredanalogchannel, readingthepreviousconversionresult,  
and starting the conversion by using the I/O CLOCK. SYSTEM CLOCK will drive the “conversion crunching” circuitry  
so that the control hardware and software need not be concerned with this task.  
When CS is high, DATA OUT is in a high-impedance condition, and ADDRESS INPUT and I/O CLOCK are disabled.  
This feature allows each of these terminals, with the exception of CS, to share a control logic point with their  
counterpart terminals on additional A/D devices when additional TLC545/TLC546 devices are used. Thus, the above  
feature serves to minimize the required control logic terminals when using multiple A/D devices.  
The control sequence has been designed to minimize the time and effort required to initiate conversion and obtain  
the conversion result. A normal control sequence is:  
1. CS is brought low. To minimize errors caused by noise at CS, the internal circuitry waits for two rising edges  
and then a falling edge of the SYSTEM CLOCK after a CS transition before the transition is recognized. The  
MSB of the previous conversion result automatically appears on DATA OUT.  
2. A new positive-logic multiplexer address is shifted in on the first five rising edges of I/O CLOCK. The MSB of  
the address is shifted in first. The negative edges of these five I/O clocks shift out the second, third, fourth,  
fifth, and sixth most significant bits of the previous conversion result. The on-chip sample and hold begins  
sampling the newly addressed analog input after the fifth falling edge. The sampling operation basically  
involves the charging of internal capacitors to the level of the analog input voltage.  
3. Two clock cycles are then applied to I/O CLOCK and the seventh and eighth conversion bits are shifted out on  
the negative edges of these clock cycles.  
4. The final eighth clock cycle is applied to I/O CLOCK. The falling edge of this clock cycle completes the analog  
sampling process and initiates the hold function. Conversion is then performed during the next 36 system  
clock cycles. After this final I/O clock cycle, CS must go high or the I/O CLOCK must remain low for at least 36  
system clock cycles to allow for the conversion function.  
CS can be kept low during periods of multiple conversion. When keeping CS low during periods of multiple  
conversion, special care must be exercised to prevent noise glitches on the I/O CLOCK line. If glitches occur on the  
I/O CLOCK line, the I/O sequence between the microprocessor/controller and the device loses synchronization. Also,  
if CS is taken high, it must remain high until the end of conversion. Otherwise, a valid falling edge of CS causes a  
reset condition, which aborts the conversion in progress.  
A new conversion may be started and the ongoing conversion simultaneously aborted by performing steps 1 through  
4 before the 36 system clock cycles occur. Such action yields the conversion result of the previous conversion and  
not the ongoing conversion.  
10  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLC545C, TLC545I, TLC546C, TLC546I  
8-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 19 INPUTS  
SLAS066B – DECEMBER 1985 – REVISED OCTOBER 1996  
PRINCIPLES OF OPERATION  
It is possible to connect SYSTEM CLOCK and I/O CLOCK together in special situations in which controlling circuitry  
points must be minimized. In this case, the following special points must be considered in addition to the requirements  
of the normal control sequence previously described.  
1. The first two clocks are required for this device to recognize CS is at a valid low level when the common clock  
signal is used as an I/O CLOCK. When CS is recognized by the device to be at a high level, the common clock  
signal is used for the conversion clock also.  
2. A low CS must be recognized before the I/O CLOCK can shift in an analog channel address. The device  
recognizes a CS transition when the SYSTEM CLOCK terminal receives two positive edges and then a  
negative edge. For this reason, after a CS negative edge, the first two clock cycles do not shift in the address.  
Also, upon shifting in the address, CS must be raised after the eighth valid (10 total) I/O CLOCK. Otherwise,  
additional common clock cycles are recognized as I/O CLOCKS and shift in an erroneous address.  
For certain applications, such as strobing applications, it is necessary to start conversion at a specific point in time.  
This device accommodates these applications. Although the on-chip sample and hold begins sampling upon the  
negative edge of the fourth valid I/O clock cycle, the hold function is not initiated until the negative edge of the eighth  
valid I/O clock cycle. Thus, the control circuitry can leave the I/O clock signal in its high state during the eighth valid  
I/O clock cycle, until the moment at which the analog signal must be converted. The TLC545/546 continues sampling  
the analog input until the eighth valid falling edge of the I/O clock. The control circuitry or software must then  
immediately lower the I/O clock signal to initiate the hold function at the desired point in time and to start conversion.  
11  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
12  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1999, Texas Instruments Incorporated  

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