TLK1201IRCP [TI]

ETHERNET TRANSCEIVERS; 以太网收发器
TLK1201IRCP
型号: TLK1201IRCP
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

ETHERNET TRANSCEIVERS
以太网收发器

网络接口 电信集成电路 电信电路 以太网 以太网:16GBASE-T
文件: 总19页 (文件大小:279K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ꢀ ꢁꢂ ꢃ ꢄ ꢅꢃ ꢆ ꢉ ꢀ ꢂ ꢃꢄ ꢅꢃ ꢊꢆ ꢇ ꢈ  
ꢋꢀ ꢌꢋ ꢆꢍꢋꢀ ꢀ ꢆꢎꢍꢏꢇ ꢋ ꢊꢐ ꢋ ꢆꢏ  
SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
D
D
D
0.6-Gbps to 1.3-Gbps Serializer/Deserializer  
D
D
D
D
D
D
D
D
Advanced 0.25-µm CMOS Technology  
No External Filter Capacitors Required  
Comprehensive Suite of Built-In Testability  
IEEE 1149.1 JTAG Support  
Low Power Consumption <200 mW  
at 1.25 Gbps  
LVPECL Compatible Differential I/O on High  
Speed Interface  
2.5-V Supply Voltage for Lowest Power  
Operation  
D
Single Monolithic PLL Design  
D
Support For 10-Bit Interface or Reduced  
Interface 5-Bit DDR (Double Data Rate)  
Clocking  
3.3-V Tolerant on LVTTL Inputs  
Hot Plug Protection  
64-Pin VQFP With Thermally Enhanced  
Package (PowerPAD)  
CPRI Data Rate Compatible (614 Mbps and  
1.22 Gbps)  
D
Receiver Differential Input Thresholds  
200 mV Minimum  
D
D
D
IEEE 802.3 Gigabit Ethernet Compliant  
D
ANSI X3.230-1994 (FC-PH) Fibre Channel  
Compliant  
Industrial Temperature Range Supported:  
−40°C to 85°C  
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49  
GND  
TD0  
TD1  
TD2  
VDD  
TD3  
TD4  
TD5  
TD6  
VDD  
JTDI  
1
2
3
4
5
6
7
8
9
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
SYNC/PASS  
GND  
RD0  
RD1  
RD2  
VDD  
RD3  
RD4  
RD5  
10  
TD7 11  
TD8 12  
TD9 13  
38 RD6  
37 VDD  
36  
35  
34  
33  
RD7  
RD8  
RD9  
GND  
14  
15  
16  
GND  
MODESEL  
PRBSEN  
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32  
description  
The TLK1201 gigabit ethernet transceiver provides for ultrahigh-speed, full-duplex, point-to-point data  
transmissions. This device is based on the timing requirements of the 10-bit interface specification by the IEEE  
802.3 gigabit ethernet specification and is also compliant with the ANSI X3.230-1994 (FC-PH) fibre channel  
standard. The device supports data rates from 0.6 Gbps to 1.3 Gbps.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PowerPAD is a trademark of Texas Instruments.  
ꢀꢟ  
Copyright 2001 − 2004, Texas Instruments Incorporated  
ꢛ ꢟ ꢜ ꢛꢔ ꢕꢩ ꢗꢖ ꢚ ꢢꢢ ꢠꢚ ꢘ ꢚ ꢙ ꢟ ꢛ ꢟ ꢘ ꢜ ꢤ  
1
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ꢋ ꢀ ꢌꢋ ꢆꢍ ꢋꢀ ꢀ ꢆ ꢎꢍ ꢏꢇ ꢋꢊ ꢐ ꢋ ꢆꢏ  
SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
description (continued)  
The primary application of this device is to provide building blocks for point-to-point baseband data transmission  
over controlled impedance media of 50 or 75 . The transmission media can be printed-circuit board traces,  
copper cables, or fiber-optical media. The ultimate rate and distance of data transfer is dependent upon the  
attenuation characteristics of the media and the noise coupling to the environment.  
The TLK1201I performs the data serialization, deserialization, and clock extraction functions for a physical layer  
interface device. The transceiver operates at 1.25 Gbps (typical), providing up to 1 Gbps of data bandwidth over  
a copper or optical media interface.  
The TLK1201I supports both the defined 10-bit interface (TBI) and a reduced 5-bit interface utilizing double data  
rate (DDR) clocking. In the TBI mode the serializer/deserializer (SERDES) accepts 10-bit wide 8b/10b parallel  
encoded data bytes. The parallel data bytes are serialized and transmitted differentially at PECL compatible  
voltage levels. The SERDES extracts clock information from the input serial stream and deserializes the data,  
outputting a parallel 10-bit data byte.  
In the DDR mode the parallel interface accepts 5-bit wide 8b/10b encoded data aligned to both the rising and  
falling edge of the reference clock. The data is clocked most significant bit first, (bits 0 − 4 of the 8b/10b encoded  
data) on the rising edge of the clock and the least significant bits (bits 5 − 9 of the 8b/10b encoded data) are  
clocked on the falling edge of the clock.  
The device provides a comprehensive series of built-in tests for self-test purposes including loopback and  
pseudorandom binary sequence (PRBS) generation and verification. An IEEE 1149.1 JTAG port is also  
supported.  
The TLK1201I is housed in a high-performance, thermally enhanced, 64-pin VQFP PowerPAD package. Use  
of the PowerPAD package does not require any special considerations except to note that the PowerPAD, which  
is an exposed die pad on the bottom of the device, is a metallic thermal and electrical conductor. It is  
recommended that the device’s PowerPAD be soldered to the thermal land on the board.  
The TLK1201I is characterized for operation from −0°C to 70°C (TLK1201), or −40°C to 85°C (TLK1201I).  
The TLK1201I uses a 2.5-V supply. The I/O section is 3.3-V compatible. With a 2.5-V supply the chipset is very  
power-efficient, dissipating less than 200 mW typical power when operating at 1.25 Gbps.  
The TLK1201I is designed to be hot plug capable. A power-on reset causes RBC0, RBC1, the parallel output  
signal terminals, TXP, and TXN to be held in a high-impedance state.  
differences between TLK1201/TLK1201I and TNETE2201  
The TLK1201/TLK1201I is the functional equivalent of the TNETE2201. There are several differences between  
the devices as noted below. See Figure 12 in the Application Information section for an example of a typical  
application circuit.  
D
D
The V  
is 2.5 V for the TLK1201 vs 3.3 V for TNETE2201.  
CC  
The PLL filter capacitors on pins 16, 17, 48, and 49 of the TNETE2201 are no longer required. The TLK1201  
uses these pins to provide added test capabilities. The capacitors, if present, do not affect the operation  
of the device.  
D
No pulldown resistors are required on the TXP/TXN outputs.  
AVAILABLE OPTIONS  
PACKAGE  
T
A
PLASTIC QUAD FLAT PACK  
(RCP)  
TAPE and REEL OPTION  
−0°C to 70°C  
−40°C to 85°C  
TLK1201RCP  
TLK1201IRCP  
TLK1201RCPR  
TLK1201IRCPR  
2
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ꢋꢀ ꢌꢋ ꢆꢍꢋꢀ ꢀ ꢆꢎꢍꢏꢇ ꢋ ꢊꢐ ꢋ ꢆꢏ  
SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
block diagram  
PRBSEN  
LOOPEN  
PRBS  
Generator  
TXP  
TXN  
2:1  
MUX  
Parallel to  
Serial  
10 Bit  
Registers  
TD(0−9)  
Clock  
Phase Generator  
REFCLK  
MODESEL  
Control  
Logic  
ENABLE  
TESTEN  
Clock  
2:1  
MUX  
Interpolator  
and  
Clock Extraction  
PRBS  
RBC1  
Verification  
RBC0  
SYNC/PASS  
Clock  
Serial to Parallel  
and  
Comma Detect  
2:1  
MUX  
Data  
RD(0−9)  
RXP  
RXN  
SYNCEN  
LOS  
RBCMODE  
JTMS  
JTAG  
Control  
Register  
JTDO  
JTRSTN  
JTDI  
TCK  
Terminal Functions  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
NO.  
SIGNAL  
MODESEL  
15  
I
Mode select. This terminal selects between the 10-bit interface and a reduced 5-bit DDR interface. When  
low the 10-bit interface (TBI) is selected. When pulled high, the 5-bit DDR mode is selected. The default  
mode is the TBI.  
P/D  
LOS  
26  
32  
O
Loss of signal. Indicates a loss of signal on the high-speed differential inputs RXP and RXN.  
If magnitude of RXP−RXN > 150 mV, LOS = 1, valid input signal  
If magnitude of RXP−RXN < 150 mV and > 50 mV, LOS is undefined  
If magnitude of RXP−RXN < 50 mV, LOS = 0, loss of signal  
RBCMODE  
I
Receive clock mode select. When RBCMODE and MODESEL are low, half-rate clocks are output on  
RBC0 and RBC1. When MODESEL is low and RBCMODE is high, a full baud-rate clock is output on  
RBC0 and RBC1 is held low. When MODESEL is high, RBCMODE is ignored and a full baud-rate clock is  
output on RBC0 and RBC1 is held low.  
P/D  
P/D = Internal pulldown  
3
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
Terminal Functions (Continued)  
TERMINAL  
I/O  
DESCRIPTION  
NAME  
NO.  
SIGNAL (continued)  
RBC0  
RBC1  
31  
30  
O
Receive byte clock. RBC0 and RBC1 are recovered clocks used for synchronizing the 10-bit output data  
on RD0−RD9. The operation of these clocks is dependent upon the receive clock mode selected.  
In the half-rate mode, the 10-bit output data words are valid on the rising edges of RBC0 and RBC1.  
These clocks are adjusted to half-word boundaries in conjunction with synchronous detect. The clocks  
are always expanded during data realignment and never slivered or truncated. RBC0 registers bytes  
1 and 3 of received data. RBC1 registers bytes 0 and 2 of received data.  
In the normal rate mode, only RBC0 is valid and operates at 1/10 the serial data rate. Data is aligned  
to the rising edge.  
In the DDR mode, only RBC0 is valid and operates at 1/10 the serial data rate. Data is aligned to both  
the rising and falling edges.  
RD0−RD9  
REFCLK  
45, 44, 43,  
41, 40, 39,  
38, 36, 35,  
34  
O
Receive data. When in TBI mode (MODESEL = low) these outputs carry 10-bit parallel data output from  
the transceiver to the protocol layer. The data is referenced to terminals RBC0 and RBC1, depending  
on the receive clock mode selected. RD0 is the first bit received.  
When in the DDR mode (MODESEL = high) only RD0−RD4 are valid. RD5−RD9 are held low. The 5-bit  
parallel data is clocked out of the transceiver on the rising edge of RBC0.  
22  
I
Reference clock. REFCLK is an external input clock that synchronizes the receiver and transmitter  
interface (60 MHz to 130 MHz). The transmitter uses this clock to register the input data (TD0−TD9) for  
serialization.  
In the TBI mode that data is registered on the rising edge of REFCLK.  
In the DDR mode, the data is registered on both the rising and falling edges of REFCLK with the most  
significant bits aligned to the rising edge of REFCLK.  
RXP  
RXN  
54  
52  
PECL Differential input receive. RXP and RXN together are the differential serial input interface from a copper  
I
or an optical I/F module.  
SYNCEN  
24  
I
Synchronous function enable. When SYNCEN is high, the internal synchronization function is activated.  
When this function is activated, the transceiver detects the K28.5 comma character (0011111 negative  
beginning disparity) in the serial data stream and realigns data on byte boundaries if required. When  
SYNCEN is low, serial input data is unframed in RD0 − RD9.  
P/U  
SYNC/PASS  
TD0−TD9  
47  
O
I
Synchronous detect. The SYNC output is asserted high upon detection of the comma pattern in the serial  
data path. SYNC pulses are output only when SYNCEN is activated (asserted high). In PRBS test mode  
(PRBSEN=high), SYNC/PASS outputs the status of the PRBS test results (high=pass).  
2−4, 6−9,  
11−13  
Transmit data. When in the TBI mode (MODESEL = low) these inputs carry 10-bit parallel data output  
from a protocol device to the transceiver for serialization and transmission. This 10-bit parallel data is  
clocked into the transceiver on the rising edge of REFCLK and transmitted as a serial stream with TD0  
sent as the first bit.  
When in the DDR mode (MODESEL = high) only TD0−TD4 are valid. The 5-bit parallel data is clocked  
into the transceiver on the rising and falling edge of REFCLK and transmitted as a serial stream with TD0  
sent as the first bit.  
TXP  
TXN  
62  
61  
PECL Differential output transmit. TXP and TXN are differential serial outputs that interface to a copper or an  
O
optical I/F module. TXP and TXN are put in a high-impedance state when LOOPEN is high and are active  
when LOOPEN is low.  
TEST  
ENABLE  
28  
48  
I
When this terminal is low, the device is disabled for Iddq testing. RD0 − RD9, RBCn, TXP, and TXN are  
high impedance. The pullup and pulldown resistors on any input are disabled. When ENABLE is high, the  
device operates normally.  
P/U  
JTDI  
I
Test data input. IEEE1149.1 (JTAG)  
P/U  
JTDO  
JTMS  
27  
55  
O
Test data output. IEEE1149.1 (JTAG)  
Test mode select. IEEE1149.1 (JTAG)  
I
P/U  
P/D = Internal pulldown  
P/U = Internal pullup  
4
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
Terminal Functions (Continued)  
TERMINAL  
NAME NO.  
I/O  
DESCRIPTION  
TEST (continued)  
JTRSTN  
56  
19  
I
Reset signal. IEEE1149.1 (JTAG)  
P/U  
LOOPEN  
PRBSEN  
I
Loop enable. When LOOPEN is high (active), the internal loop-back path is activated. The transmitted  
serial data is directly routed to the inputs of the receiver. This provides a self-test capability in conjunction  
with the protocol device. The TXP and TXN outputs are held in a high-impedance state during the  
loop-back test. LOOPEN is held low during standard operational state with external serial outputs and  
inputs active.  
P/D  
16  
I
PRBS enable. When PRBSEN is high, the PRBS generation circuitry is enabled. The PRBS verification  
circuit in the receive side is also enabled. A PRBS signal can be fed to the receive inputs and checked for  
errors, that are reported by the SYNC/PASS terminal indicating low.  
P/D  
TCK  
49  
17  
I
Test clock. IEEE1149.1 (JTAG)  
Manufacturing test terminal  
TESTEN  
I
P/D  
POWER  
VDD  
5, 10, 20,  
23, 29, 37,  
42, 50, 63  
Supply Digital logic power. Provides power for all digital circuitry and digital I/O buffers.  
VDDA  
53, 57, 59, Supply Analog power. VDDA provides power for the high-speed analog circuits, receiver, and transmitter  
60  
VDDPLL  
GROUND  
GND  
18  
Supply PLL power. Provides power for the PLL circuitry. This terminal requires additional filtering.  
1, 14, 21,  
25, 33, 46  
Ground Digital logic ground. Provides a ground for the logic circuits and digital I/O buffers.  
GNDA  
51, 58  
64  
Ground Analog ground. GNDA provides a ground for the high-speed analog circuits RX and TX.  
Ground PLL ground. Provides a ground for the PLL circuitry.  
GNDPLL  
P/D = Internal pulldown  
P/U = Internal pullup  
detailed description  
data transmission  
This device supports both the defined 10-bit interface (TBI) and a reduced 5-bit interface utilizing DDR clocking.  
When MODESEL is low, the TBI mode is selected. When MODESEL is high, the DDR mode is selected.  
In the TBI mode, the transmitter portion registers incoming 10-bit wide data words (8b/10b encoded data,  
TD0−TD9) on the rising edge of REFCLK. The REFCLK is also used by the serializer, which multiplies the clock  
by a factor of 10, providing a signal that is fed to the shift register. The 8b/10b encoded data is transmitted  
sequentially bit 0 through 9 over the differential high-speed I/O channel.  
In the DDR mode, the transmitter accepts 5-bit wide 8b/10b encoded data on pins TD0−TD4. In this mode, data  
is aligned to both the rising and falling edges of REFCLK. The data is then formed into a 10-bit wide word and  
sent to the serializer. The rising edge REFCLK clocks in bit 0−4, and the falling edge of REFCLK clocks in bits  
5−9. (Bit 0 is the first bit transmitted).  
5
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
detailed description (continued)  
transmission latency  
Data transmission latency is defined as the delay from the initial 10-bit word load to the serial transmission of  
bit 9. The minimum latency in TBI mode is 19 bit times. The maximum latency in TBI mode is 20 bit times. The  
minimum latency in DDR mode is 29 bit times, and maximum latency in DDR mode is 30 bit times.  
Measured 10-Bits  
Next 10-Bit Code  
TXP, TXN  
b7 b8 b9 b0 b1 b2 b3  
t
d(Tlxatency)  
10-Bit Code  
TD(0−9)  
REFCLK  
Figure 1. Transmitter Latency Full Rate Mode  
data reception  
The receiver portion deserializes the differential serial data. The serial data is retimed based on an interpolated  
clock generated from the reference clock. The serial data is then aligned to the 10-bit word boundaries and  
presented to the protocol controller along with receive byte clocks (RBC0, RBC1).  
receiver clock select mode  
There are two modes of operation for the parallel bus. 1)The 10-bit (TBI) mode and 2) 5-bit (DDR) mode. When  
in TBI mode, there are two user-selectable clock modes that are controlled by the RBCMODE terminal. 1)  
Full-rate clock on RBC0 and 2) Half-rate clocks on RBC0 and RBC1. When in the DDR mode, only a full-rate  
clock is available on RBC0; see Table 1.  
Table 1. Mode Selection  
FREQUENCY  
MODESEL  
RBCMODE  
MODE  
TLK1201  
30−65 MHz  
60−130 MHz  
60−130 MHz  
60−130 MHz  
TLK1201I  
30−65 MHz  
60−130 MHz  
60−130 MHz  
60−130 MHz  
0
0
1
1
0
1
0
1
TBI half-rate  
TBI full-rate  
DDR  
DDR  
In the half-rate mode, two receive byte clocks (RBC0 and RBC1) are 180 degrees out of phase and operate  
at one-half the data rate. The clocks are generated by dividing down the recovered clock. The received data  
is output with respect to the two receive byte clocks (RBC0, RBC1) allowing a protocol device to clock the  
parallel bytes using the RBC0 and RBC1 rising edges. The outputs to the protocol device, byte 0 of the received  
data is valid on the rising edge of RBC1. See the timing diagram shown in Figure 2.  
6
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
receiver clock select mode (continued)  
t
d(S)  
RBC0  
t
d(S)  
RBC1  
SYNC  
t
d(H)  
t
d(H)  
RD(0−9)  
K28.5  
DXX.X  
DXX.X  
DXX.X  
K28.5  
DXX.X  
Figure 2. Synchronous Timing Characteristics Waveforms (TBI half-rate mode)  
In the normal-rate mode, only RBC0 is used and operates at full data rate (i.e., 1.25-Gbps data rate produces  
a 125-MHz clock). The received data is output with respect to the rising edge of RBC0. RBC1 is low in this mode.  
See the timing diagram shown in Figure 3.  
RBC0  
t
t
d(H)  
d(S)  
SYNC  
RD(0−9)  
K28.5  
DXX.X  
DXX.X  
DXX.X  
K28.5  
DXX.X  
Figure 3. Synchronous Timing Characteristics Waveforms (TBI full-rate mode)  
In the double data rate mode, the receiver presents the data on both the rising and falling edges of RBC0. RBC1  
is low impedance. The data is clocked bit-0 first, and aligned to the rising edge of RBC0. See the timing diagram  
shown in Figure 4.  
t
d(S)  
RBC0  
t
d(S)  
t
d(H)  
t
d(H)  
SYNC  
RD(0−4)  
K28.5  
K28.5 DXX.X DXX.X DXX.X DXX.X DXX.X DXX.X K28.5 K28.5 DXX.X  
Bits 0−4 Bits 5−9  
Figure 4. Synchronous Timing Characteristics Waveforms (DDR mode)  
The receiver clock interpolator can lock to the incoming data without the need for a lock-to-reference preset.  
The received serial data rate (RXP and RXN) is at the same baud rate as the transmitted data stream, 0.02%  
(200 PPM) for proper operation (see the recommended operating tables).  
7
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
receiver word alignment  
This device uses the IEEE 802.3 gigabit ethernet defined 10-bit K28.5 character (comma character) word  
alignment scheme. The following sections explain how this scheme works and how it realigns itself.  
comma character on expected boundary  
This device provides 10-bit K28.5 character recognition and word alignment. The 10-bit word alignment is  
enabled by forcing the SYNCEN terminal high. This enables the function that examines and compares serial  
input data to the seven bit synchronization pattern. The K28.5 character is defined by 8-bit/10-bit coding scheme  
as a pattern consisting of 0011111010 (a negative number beginning with disparity) with the 7 MSBs (0011111),  
referred to as the comma character. The K28.5 character was implemented specifically for aligning data words.  
As long as the K28.5 character falls within the expected 10-bit boundary, the received 10-bit data is properly  
aligned and data realignment is not required. Figure 2 shows the timing characteristics of RBC0, RBC1, SYNC,  
and RD0−RD9 while synchronized. (Note: the K28.5 character is valid on the rising edge of RBC1).  
comma character not on expected boundary  
If synchronization is enabled and a K28.5 character straddles the expected 10-bit word boundary, then word  
realignment is necessary. Realignment or shifting the 10-bit word boundary truncates the character following  
the misaligned K28.5, but the following K28.5 and all subsequent data is aligned properly as shown in  
Figure 5. The RBC0 and RBC1 pulse widths are stretched or stalled in their current state during realignment.  
With this design, the maximum stretch that occurs is 20 bit times. This occurs during a worst case scenario when  
the K28.5 is aligned to the falling edge of RBC1 instead of the rising edge. Figure 5 shows the timing  
characteristics of the data realignment.  
31 Bit  
Times  
30 Bit  
Times (Max)  
Max Receive  
Path Latency  
K28.5  
DXX.X  
K28.5  
DXX.X  
DXX.X  
K28.5  
DXX.X  
DXX.X  
INPUT DATA  
RBC0  
RBC1  
Worst Case  
Misaligned K28.5  
Corrupt Data  
DXX.X  
Misalignment Corrected  
DXX.X  
RD(0−9)  
SYNC  
DXX.X  
DXX.X  
K28.5  
DXX.X  
K28.5  
DXX.X  
K28.5  
DXX.X  
Figure 5. Word Realignment Timing Characteristics Waveforms  
Systems that do not require framed data may disable byte alignment by tying SYNCEN low.  
When a SYNC character is detected, the SYNC signal is brought high and is aligned with the K28.5 character.  
The duration of the SYNC pulse is equal to the duration of the data when in TBI mode. When in DDR mode the  
SYNC pulse is present for the entire RBC0 period.  
data reception latency  
The serial to parallel data latency is the time from when the first bit arrives at the receiver until it is output in the  
aligned parallel word with RD0 received as first bit. The minimum latency in TBI mode is 21 bit times, and the  
maximum latency is 31 bit times. The minimum latency in DDR mode is 27 bit times and maximum latency is  
34 bit times.  
8
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
10-Bit Code  
RXP, RXN  
t
d(Rx latency)  
RD(0−9)  
RBC0  
10-Bit Code  
Figure 6. Receiver Latency − TBI Normal Mode Shown  
loss of signal detection  
This device has a loss of signal (LOS) detection circuit for conditions where the incoming signal no longer has  
sufficient voltage level to keep the clock recovery circuit in lock. The LOS is intended to be an indication of gross  
signal error conditions, such as a detached cable or no signal being transmitted, and not an indication of signal  
coding health. Under a PRBS serial input pattern, LOS is high for signal amplitudes greater than 150 mV. The  
LOS is low for all amplitudes below 50 mV. Between 50 mV and 150 mV, LOS is undetermined.  
testability  
The loopback function provides for at-speed testing of the transmit/receive portions of the circuitry. The enable  
function allows for all circuitry to be disabled so that an Iddq test can be performed. The PRBS function also  
allows for a BIST( built-in self test). The terminal setting, TESTEN high, enables the test mode. The terminal  
TESTEN has an internal pulldown resistor, so it defaults to normal operation. The TESTEN is only used for  
factory testing, and is not intended for end-user control.  
loopback testing  
The transceiver can provide a self-test function by enabling (setting LOOPEN to high level) the internal loopback  
path. Enabling this function causes serial transmitted data to be routed internally to the receiver. The parallel  
data output can be compared to the parallel input data for functional verification. The external differential output  
is held in a high-impedance state during the loopback testing.  
enable function  
When held low, ENABLE disables all quiescent power in both the analog and digital circuitry. This allows an  
ultralow-power idle state when the link is not active.  
PRBS function  
7
This device has a built-in 2 −1 PRBS function. When the PRBSEN control bit is set high, the PRBS test is  
enabled. A PRBS is generated and fed into the 10-bit parallel transmitter input bus. Data from the normal parallel  
input source is ignored during PRBS test mode. The PRBS pattern is then fed through the transmit circuitry as  
if it were normal data and sent out to the transmitter. The output can be sent to a bit error rate tester (BERT)  
or to the receiver of another TLK1201I. Since the PRBS is not really random and is really a predetermined  
sequence of ones and zeros, the data can be captured and checked for errors by a BERT. This device also has  
a built-in BERT function on the receiver side that is enabled by PRBSEN. It can receive a PRBS pattern and  
check for errors, and then reports the errors by forcing the SYNC/PASS terminal low. The PRBS testing supports  
two modes (normal and latched), which are controlled by the SYNCEN input. When SYNCEN is low, the result  
of the PRBS bit error rate test is passed to the SYNC/PASS terminal. When SYNCEN is high the result of the  
PRBS verification is latched on the SYNC/PASS output (i.e., a single failure forces SYNC/PASS to remain low).  
9
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
absolute maximum ratings over operating free-air temperature (unless otherwise noted)  
Supply voltage, V  
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to 3 V  
DD  
Input voltage range at TTL terminals, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to 4 V  
Input voltage range at any other terminal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.3 V to V  
Storage temperature, T  
I
+0.3 V  
DD  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C  
stg  
Electrostatic discharge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CDM: 1 kV, HBM:2 kV  
Characterized free-air operating temperature range: TLK1201 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
TLK1201I . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 85°C  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.  
DISSIPATION RATING TABLE  
T
A
25°C  
OPERATING FACTOR  
T = 70°C  
A
POWER RATING  
PACKAGE  
POWER RATING  
ABOVE T = 25°C  
A
§
RCP64  
5.25 W  
46.58 mW/°C  
23.70 mW/°C  
13.19 mW/°C  
2.89 W  
RCP64  
3.17 W  
1.74 W  
#
RCP64  
2.01 W  
1.11 W  
§
#
This is the inverse of the traditional junction-to-ambient thermal resistance (R  
2 oz. Trace and copper pad with solder  
2 oz. Trace and copper pad without solder  
Standard JEDEC high-K board  
).  
θJA  
NOTE: For more information, see the TI application note PowerPAD Thermally Enhanced  
Package, TI literature number SLMA002.  
thermal characteristics  
PARAMETER  
TEST CONDITION  
MIN  
TYP  
MAX  
UNIT  
Board-mounted, no air flow, high conductivity TI  
recommended test board, chip soldered or greased to  
thermal land  
21.47  
Board-mounted, no air flow, high conductivity TI  
recommended test board with thermal land but no  
solder or grease thermal connection to thermal land  
R
Junction-to-free-air thermal resistance  
°C/W  
θJA  
θJC  
42.2  
75.83  
0.38  
Board-mounted, no air flow, JEDEC test board  
Board-mounted, no air flow, high conductivity TI  
recommended test board, chip soldered or greased to  
thermal land  
Board-mounted, no air flow, high conductivity TI  
recommended test board with thermal land but no  
solder or grease thermal connection to thermal land  
R
Junction-to-case-thermal resistance  
°C/W  
0.38  
7.8  
Board-mounted, no air flow, JEDEC test board  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
recommended operating conditions  
MIN NOM  
MAX  
2.7  
UNIT  
V
Supply voltage, V , V  
DD DD(A)  
2.3  
2.5  
Total supply current, I , I  
DD DD(A)  
Frequency = 1.25 Gbps,  
Frequency = 1.25 Gbps,  
Frequency = 1.25 Gbps,  
Enable = 0,  
PRBS pattern  
PRBS pattern  
90  
mA  
mW  
mW  
µA  
250  
Total power dissipation, P  
D
Worst case  
, V  
245  
50  
Total shutdown current, I , I  
DD DD(A)  
V
= 2.7 V  
DD(A) DD  
Startup lock time, PLL  
V
, V  
= 2.5 V, ENto PLL acquire  
500  
70  
µs  
DD DD(A)  
TLK1201  
TLK1201I  
0
Operating free-air temperature, T  
°C  
A
−40  
85  
The worst case pattern is a pattern that creates a maximum transition density on the serial transceiver.  
reference clock (REFCLK) timing requirements over recommended operating conditions (unless  
otherwise noted)  
PARAMETER  
TEST CONDITIONS  
TLK1201  
MIN  
TYP−0.01%  
TYP−0.01%  
TYP−0.01%  
−100  
TYP  
MAX  
UNIT  
60 TYP+0.01%  
60 TYP+0.01%  
130 TYP+0.01%  
100  
Frequency  
Minimum data rate  
Maximum data rate  
TLK1201I  
MHz  
ppm  
ps  
Frequency  
Accuracy  
Duty cycle  
40%  
50%  
60%  
40  
Jitter, peak-to-peak 20 kHz to 10 MHz  
TTL electrical characteristics over recommended operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
2.3  
MAX  
UNIT  
V
V
V
V
V
High-level output voltage  
Low-level output voltage  
High-level input voltage  
Low-level input voltage  
High-level Input current  
Low-level Input current  
Input capacitance  
I
I
= −400 µA  
V −0.2  
DD  
OH  
OL  
IH  
OH  
= 1 mA  
GND  
1.7  
0.25  
0.5  
3.6  
0.8  
40  
V
OL  
V
V
IL  
I
I
V
V
= 2.3 V,  
= 2.3 V,  
V
V
= 2 V  
µA  
µA  
pF  
IH  
DD  
IN  
= 0.4 V  
−40  
IL  
DD  
IN  
C
4
IN  
11  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
transmitter/receiver characteristics  
PARAMETER  
TEST CONDITIONS  
R = 50 Ω  
MIN  
600  
800  
TYP  
850  
MAX UNIT  
1100  
mV  
t
V
OD  
= |TxD−TxN|  
R = 75 Ω  
t
1050  
1200  
R = 50 Ω  
t
V
Transmit common mode voltage range  
1100  
200  
1250  
1250  
1400  
1600  
2250  
mV  
mV  
mV  
(cm)  
R = 75 Ω  
t
Receiver input voltage requirement, V = |RxP − RxN|  
ID  
Receiver common mode voltage range, (RxP +  
RxN)/2  
1000  
−350  
I
Receiver input leakage current  
Receiver input capacitance  
350  
2
µA  
lkg(R)  
C
pF  
I
Differential output jitter,  
Random + deterministic,  
0.24  
0.2  
UI  
UI  
PRBS pattern, R = 125 MHz  
ω
t
Serial data total jitter (peak-to-peak)  
(TJ)  
Differential output jitter,  
Random + deterministic,  
PRBS pattern, R = 106.25 MHz  
ω
Differential output jitter,  
t
Serial data deterministic jitter (peak-to-peak)  
Differential signal rise, fall time (20% to 80%)  
0.12  
250  
UI  
ps  
(DJ)  
PRBS pattern, R = 125 MHz  
ω
R
= 50 ,  
C = 5 pF,  
L
L
t , t  
r f  
100  
See Figure 7 and Figure 8  
Differential input jitter,  
Random + deterministic,  
0.25  
UI  
R
= 125 MHz  
Serial data jitter tolerance minimum required eye  
opening, (per IEEE-802.3 specification)  
ω
Differential input jitter, random +  
determinisitc, PRBS pattern at  
zero crossing  
0.3  
UI  
Receiver data acquisition lock time from powerup  
Data relock time from loss of synchronization  
500  
µs  
1024 Bit times  
TBI modes See Figure 1  
DDR mode  
19  
29  
20  
27  
20  
UI  
30  
t
t
Tx latency  
d(Tx latency)  
TBI modes See Figure 6  
DDR mode  
31  
34  
TBI mode  
DDR mode 600 − 620 Mbps  
TBI mode 1222.8 Mbps  
600 − 620 Mbps  
24  
27  
25  
27  
28  
Rx latency  
UI  
d(Rx latency)  
31  
29  
33  
DDR mode 1222.8 Mbps  
UI = serial bit time  
12  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
V  
V  
80%  
50%  
20%  
TX+  
t
f
t
r
V  
V  
C
5 pF  
L
80%  
50%  
20%  
50 Ω  
50 Ω  
TX−  
t
t
f
r
1V  
80%  
20%  
0 V  
VOD  
C
5 pF  
L
−1V  
Figure 7. Differential and Common-Mode  
Output Voltage Definitions  
Figure 8. Transmitter Test Setup  
LVTTL output switching characteristics over recommended operating conditions (unless  
otherwise noted)  
PARAMETER  
Clock rise time  
TEST CONDITIONS  
MIN  
0.3  
0.3  
0.3  
0.3  
TYP  
MAX  
1.5  
UNIT  
t
t
t
t
r(RBC)  
ns  
Clock fall time  
Data rise time  
Data fall time  
1.5  
f(RBC)  
80% to 20% output voltage, C = 5 pF (see Figure 9)  
1.5  
r
f
ns  
ns  
ns  
1.5  
Data setup time (RD0..RD9), Data  
valid prior to RBC0 rising  
t
t
TBI normal mode, (see Figure 3)  
TBI normal mode, (see Figure 3)  
2.5  
2
su(D1)  
h(D1)  
Data hold time (RD0..RD9), Data valid  
after RBC0 rising  
t
t
t
t
Data setup time (RD0..RD4)  
Data hold time (RD0..RD4)  
Data setup time (RD0..RD9)  
Data hold time (RD0..RD9)  
DDR mode, R = 125 MHz, (see Figure 4)  
2
0.8  
2.5  
1.5  
ns  
ns  
ns  
ns  
su(D2)  
ω
DDR mode, R = 125 MHz, (see Figure 4)  
h(D2)  
ω
TBI half-rate mode, R = 125 MHz, (see Figure 2)  
su(D3)  
h(D3)  
ω
TBI half-rate mode, R = 125 MHz, (see Figure 2)  
ω
1.4 V  
CLOCK  
t
f
t
r
2 V  
80%  
50%  
DATA  
20%  
0.8 V  
t
f
t
r
Figure 9. TTL Data I/O Valid Levels for AC Measurement  
transmitter timing requirements over recommended operating conditions (unless otherwise  
noted)  
PARAMETER  
Data setup time (TD0..TD9)  
Data hold time (TD0..TD9)  
Data setup time (TD0..TD9)  
Data hold time (TD0..TD9)  
TD[0,9] data rise and fall time  
TEST CONDITIONS  
MIN  
1.6  
0.8  
0.7  
0.5  
TYP  
MAX  
UNIT  
t
t
t
t
su(D4)  
TBI modes  
ns  
h(D4)  
su(D5)  
h(D5)  
DDR modes  
See Figure 9  
ns  
ns  
t , t  
r f  
2
13  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
APPLICATION INFORMATION  
8B/10B transmission code  
The PCS maps GMII signals into 10-bit code groups and vice versa, using an 8b/10b block coding scheme. The  
PCS uses the transmission code to improve the transmission characteristics of information to be transferred  
across the link. The encoding defined by the transmission code ensures that sufficient transitions are present  
in the PHY bit stream to make clock recovery possible in the receiver. Such encoding also greatly increases  
the likelihood of detecting any single or multiple bit errors that may occur during transmission and reception of  
information. The 8b/10b transmission code specified for use has a high-transition density, is run length limited,  
and is dc-balanced. The transition density of the 8b/10b symbols range from 3 to 8 transitions per symbol. The  
definition of the 8b/10b transmission code is specified in IEEE 802.3 gigabit ethernet and ANSI X3.230-1994  
(FC−PH), clause 11.  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
APPLICATION INFORMATION  
8B/10B transmission code (continued)  
The 8b/10b transmission code uses letter notation describing the bits of an unencoded information octet. The  
bit notation of A,B,C,D,E,F,G,H for an unencoded information octet is used in the description of the 8b/10b  
transmission code-groups, where A is the LSB. Each valid code group has been given a name using the  
following convention: /Dx.y/ for the 256 valid data code-groups and /Kx.y/ for the special control code-groups,  
where y is the decimal value of bits EDCBA and x is the decimal value of bits HGF (noted as K<HGF.EDCBA>).  
Thus, an octet value of FE representing a code-group value of K30.7 would be represented in bit notation as  
111 11110.  
V
DD  
5 kΩ  
TXP  
Z
O
RXP  
7.5 kΩ  
Z
Z
O
GND  
VDD  
+
_
O
5 kΩ  
Z
O
TXN  
RXN  
7.5 kΩ  
GND  
Receiver  
Transmitter  
Media  
Figure 10. High-Speed I/O Directly-Coupled Mode  
V
DD  
5 kΩ  
TXP  
Z
O
RXP  
7.5 kΩ  
Z
Z
O
GND  
VDD  
+
_
O
5 kΩ  
Z
O
TXN  
RXN  
7.5 kΩ  
GND  
Receiver  
Transmitter  
Media  
Figure 11. High-Speed I/O AC-Coupled Mode  
15  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
APPLICATION INFORMATION  
5 at 100 MHz  
2.5 V  
2.5 V  
18  
0.01 µF  
VDD VDDA  
VDDPLL  
64  
GND  
GNDPLL  
GNDA  
TLK1201I  
TLK1201II  
17  
22  
TESTEN  
10  
Controlled Impedance  
Transmission Line  
62  
61  
TD0−TD9  
REFCLK  
PRBSEN  
TXP  
TXN  
16  
19  
LOOPEN  
SYNCEN  
24  
47  
Controlled Impedance  
Transmission Line  
Host  
Protocol  
Device  
SYNC/PASS  
RD0−RD9  
10  
2
RBC0−RBC1  
ENABLE  
28  
Controlled Impedance  
Transmission Line  
54  
RXP  
26  
32  
LOS  
50 Ω  
50 Ω  
R
t
t
RBCMODE  
MODESEL  
TCK  
15  
49  
55  
48  
56  
R
Controlled Impedance  
Transmission Line  
52  
RXN  
JTMS  
JTAG  
Controller  
JTDI  
JTRSTN  
JTDO  
27  
Figure 12. Typical Application Circuit (AC mode)  
designing with PowerPAD  
The TLK1201/TLK1201I is housed in a high-performance, thermally enhanced, 64-pin VQFP (RCP64)  
PowerPADpackage. Use of the PowerPAD package does not require any special considerations except to note  
that the PowerPAD, which is an exposed die pad on the bottom of the device, is a metallic thermal and electrical  
conductor. Therefore, if not implementing PowerPAD PCB features, the use of solder masks (or other assembly  
techniques) may be required to prevent any inadvertent shorting by the exposed PowerPAD of connection  
etches or vias under the package. It is strongly recommended that the PowerPAD be soldered to the thermal  
land. The recommended convention, however, is to not run any etches or signal vias under the device, but to  
have only a grounded thermal land as explained below. Although the actual size of the exposed die pad may  
vary, the minimum size required for the keepout area for the 64-pin PFP PowerPAD package is 8 mm × 8 mm.  
16  
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SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
APPLICATION INFORMATION  
designing with PowerPAD (continued)  
It is recommended that there be a thermal land, which is an area of solder-tinned-copper, underneath the  
PowerPAD package. The thermal land varies in size depending on the PowerPAD package being used, the PCB  
construction, and the amount of heat that needs to be removed. In addition, the thermal land may or may not  
contain numerous thermal vias depending on PCB construction.  
Other requirements for thermal lands and thermal vias are detailed in the TI application note PowerPAD  
Thermally Enhanced Package Application Report, TI literature number SLMA002, available via the TI Web  
pages beginning at URL: http://www.ti.com.  
Figure 13. Example of a Thermal Land  
For the TLK1201I, this thermal land must be grounded to the low-impedance ground plane of the device. This  
improves not only thermal performance but also the electrical grounding of the device. It is also recommended  
that the device ground pin landing pads be connected directly to the grounded thermal land. The land size must  
be as large as possible without shorting device signal pins. The thermal land may be soldered to the exposed  
PowerPAD using standard reflow soldering techniques.  
While the thermal land may be electrically floated and configured to remove heat to an external heat sink, it is  
recommended that the thermal land be connected to the low-impedance ground plane for the device. More  
information may be obtained from the TI application note PHY Layout, TI literature number SLLA020.  
17  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
ꢀ ꢁ ꢂ ꢃꢄ ꢅ ꢃ ꢆꢇ  ꢂꢃ ꢄ ꢅ ꢃ ꢊ ꢆꢇꢈ  
ꢋ ꢀ ꢌꢋ ꢆꢍ ꢋꢀ ꢀ ꢆ ꢎꢍ ꢏꢇ ꢋꢊ ꢐ ꢋ ꢆꢏ  
SLLS506D − AUGUST 2001 − REVISED AUGUST 2004  
MECHANICAL DATA  
RCP (S-PQFP-G64)  
PowerPADPLASTIC QUAD FLATPACK  
0,27  
M
0,08  
0,50  
48  
0,17  
33  
49  
32  
Thermal Pad  
(See Note D)  
64  
17  
0,13 NOM  
1
16  
7,50 TYP  
Gage Plane  
10,20  
SQ  
9,80  
0,25  
12,20  
0,15  
0,05  
0° − 7°  
SQ  
11,80  
0,85  
0,75  
0,75  
0,45  
Seating Plane  
0,08  
1,00 MAX  
4147711/A 10/98  
NOTES: A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion.  
D. The package thermal performance may be enhanced by bonding the thermal pad to an external thermal plane.  
This pad is electrically and thermally connected to the backside of the die and possibly selected leads.  
E. Falls within JEDEC MS-026  
PowerPAD is a trademark of Texas Instruments.  
18  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications,  
enhancements, improvements, and other changes to its products and services at any time and to discontinue  
any product or service without notice. Customers should obtain the latest relevant information before placing  
orders and should verify that such information is current and complete. All products are sold subject to TI’s terms  
and conditions of sale supplied at the time of order acknowledgment.  
TI warrants performance of its hardware products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI  
deems necessary to support this warranty. Except where mandated by government requirements, testing of all  
parameters of each product is not necessarily performed.  
TI assumes no liability for applications assistance or customer product design. Customers are responsible for  
their products and applications using TI components. To minimize the risks associated with customer products  
and applications, customers should provide adequate design and operating safeguards.  
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Following are URLs where you can obtain information on other Texas Instruments products and application  
solutions:  
Products  
Applications  
Audio  
Amplifiers  
amplifier.ti.com  
www.ti.com/audio  
Data Converters  
dataconverter.ti.com  
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dsp.ti.com  
Broadband  
Digital Control  
Military  
www.ti.com/broadband  
www.ti.com/digitalcontrol  
www.ti.com/military  
Interface  
Logic  
interface.ti.com  
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Microcontrollers  
power.ti.com  
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Copyright 2004, Texas Instruments Incorporated  

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