TLV5617AIDG4 [TI]

2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOGnull;
TLV5617AIDG4
型号: TLV5617AIDG4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOGnull

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TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F – JULY 1999 – REVISED JULY 2002  
features  
applications  
D
D
Dual 10-Bit Voltage Output DAC  
D
D
D
D
D
Digital Servo Control Loops  
Digital Offset and Gain Adjustment  
Industrial Process Control  
Programmable Settling Time  
– 3 µs in Fast Mode  
– 10 µs in Slow Mode  
Machine and Motion Control Devices  
Mass Storage Devices  
D
D
D
D
Compatible With TMS320 and SPI Serial  
Ports  
Differential Nonlinearity <0.1 LSB Typ  
Monotonic Over Temperature  
D PACKAGE  
(TOP VIEW)  
Direct Replacement for TLC5617A  
DIN  
SCLK  
CS  
V
DD  
OUTB  
REF  
1
2
3
4
8
7
6
5
description  
TheTLV5617Aisadual10-bitvoltageoutputDAC  
with a flexible 3-wire serial interface. The serial  
interface is compatible with TMS320, SPI ,  
OUTA  
AGND  
QSPI , and Microwire  
serial ports. It is  
programmed with a 16-bit serial string containing  
4 control bits and 10 data bits.  
The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class-AB  
output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows  
the designer to optimize speed versus power dissipation.  
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It  
is available in an 8-pin SOIC package in standard commercial and industrial temperature ranges.  
AVAILABLE OPTIONS  
PACKAGE  
T
A
SOIC  
(D)  
0°C to 70°C  
TLV5617ACD  
TLV5617AID  
40°C to 85°C  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SPI and QSPI are trademarks of Motorola, Inc.  
Microwire is a trademark of National Semiconductor Corporation.  
Copyright 2002, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
functional block diagram  
REF  
AGND  
V
DD  
Power and  
Speed Control  
Power-On  
Reset  
2
x2  
OUTA  
DIN  
10-Bit  
DAC A  
Latch  
10  
10  
SCLK  
CS  
Serial  
Interface  
and  
10  
Buffer  
Control  
10  
10  
10-Bit  
DAC B  
Latch  
x2  
OUTB  
Terminal Functions  
TERMINAL  
I/O/P  
DESCRIPTION  
NAME  
NO.  
5
AGND  
CS  
P
I
Ground  
3
Chip select. Digital input active low, used to enable/disable inputs.  
Digital serial data input  
DIN  
1
I
OUTA  
OUTB  
REF  
4
O
O
I
DAC A analog voltage output  
DAC B analog voltage output  
Analog reference voltage input  
Digital serial clock input  
7
6
SCLK  
2
I
V
DD  
8
P
Positive power supply  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage (V  
to AGND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V  
DD  
Reference input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to V  
Digital input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to V  
+ 0.3 V  
+ 0.3 V  
DD  
DD  
Operating free-air temperature range, T : TLV5617AC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
A
TLV5617AI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40°C to 85°C  
Storage temperature range, T  
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
Stresses beyond those listed under absolute maximum ratingsmay cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditionsis not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
recommended operating conditions  
MIN NOM  
MAX  
5.5  
3.3  
2
UNIT  
V
V
= 5 V  
= 3 V  
4.5  
2.7  
5
3
DD  
Supply voltage, V  
V
V
DD  
DD  
Power on reset, POR  
0.55  
V
DD  
V
DD  
V
DD  
V
DD  
V
DD  
V
DD  
= 2.7 V  
2
High-level digital input voltage, V  
V
V
V
IH  
= 5.5 V  
2.4  
= 2.7 V  
0.6  
1
Low-level digital input voltage, V  
IL  
= 5.5 V  
= 5 V (see Note 1)  
= 3 V (see Note 1)  
AGND 2.048  
AGND 1.024  
2
V
V
1.5  
1.5  
DD  
Reference voltage, V to REF terminal  
ref  
DD  
Load resistance, R  
kΩ  
pF  
L
Load capacitance, C  
100  
20  
L
Clock frequency, f  
MHz  
CLK  
TLV5617AC  
TLV5617AI  
0
70  
Operating free-air temperature, T  
°C  
A
40  
85  
NOTE 1: Due to the x2 output buffer, a reference input voltage (V 0.4 V)/2 causes clipping of the transfer function.  
DD  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
electrical characteristics over recommended operating conditions (unless otherwise noted)  
power supply  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Fast  
1.6  
2.5  
No load, All inputs = AGND or V  
DAC latch = 0x800  
,
DD  
I
Power supply current  
mA  
µA  
dB  
DD  
Slow  
0.6  
1
1
Power down supply current  
Power supply rejection ratio  
Zero scale, See Note 2  
Full scale, See Note 3  
65  
65  
PSRR  
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying V  
and is given by:  
and is given by:  
DD  
PSRR = 20 log [(E (V max) E (V min)/V max]  
ZS DD ZS DD DD  
3. Power supply rejection ratio at full scale is measured by varying V  
DD  
PSRR = 20 log [(E (V max) E (V min)/V max]  
DD DD DD  
G
G
static DAC specifications  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
bits  
Resolution  
10  
INL  
Integral nonlinearity  
See Note 4  
See Note 5  
See Note 6  
See Note 7  
±0.7  
±0.1  
±1  
±0.5  
±12  
LSB  
DNL  
Differential nonlinearity  
LSB  
E
Zero-scale error (offset error at zero scale)  
TC Zero-scale-error temperature coefficient  
mV  
ZS  
ZS  
E
3
ppm/°C  
V
V
= 2.7 V to 3.3 V  
= 4.5 V to 5.5 V  
±0.6  
DD  
% full  
scale V  
E
Gain error  
See Note 8  
See Note 9  
G
±0.29  
DD  
E
G
T
Gain-error temperature coefficient  
1
ppm/°C  
C
NOTES: 4. The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output  
from the line between zero and full scale, excluding the effects of zero-code and full-scale errors.  
5. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal  
1-LSB amplitude change of any two adjacent codes.  
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.  
6
7. Zero-scale-error temperature coefficient is given by: E  
ZS  
TC = [E  
(T  
ZS max  
) E  
(T  
)]/2V × 10 /(T  
ref max  
T  
).  
min  
ZS min  
8. Gain error is the deviation from the ideal output (2V 1 LSB) with an output load of 10 kΩ.  
ref  
= [E (T  
6
9. Gain temperature coefficient is given by: E  
T
) E (T  
)]/2V × 10 /(T T  
max  
).  
min  
G
C
G
max  
g
min  
ref  
output specifications  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
0.4  
UNIT  
V
V
Output voltage range  
R
= 10 kΩ  
V
V
O
L
DD  
Output load regulation accuracy  
V
O
= 4.096 V, 2.048 V,  
R
L
= 2 kto 10 kΩ  
±0.1  
% FS  
reference input  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
V
V
I
Input voltage range  
Input resistance  
0
DD1.5  
R
C
10  
5
MΩ  
pF  
I
I
Input capacitance  
Fast  
1.3  
525  
80  
MHz  
kHz  
dB  
Reference input bandwidth  
Reference feedthrough  
REF = 0.2 V + 1.024 V dc  
pp  
Slow  
REF = 1 V at 1 kHz + 1.024 V dc (see Note 10)  
pp  
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
electrical characteristics over recommended operating conditions (unless otherwise noted)  
(Continued)  
digital inputs  
PARAMETER  
High-level digital input current  
TEST CONDITIONS  
V = V  
MIN  
TYP  
MAX  
UNIT  
µA  
I
I
1
IH  
I
DD  
Low-level digital input current  
Input capacitance  
V = 0 V  
I
1  
µA  
IL  
C
8
pF  
i
analog output dynamic performance  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
1
MAX  
3
UNIT  
Fast  
Slow  
Fast  
Slow  
Fast  
Slow  
t
t
Output settling time, full scale  
Output settling time, code to code  
Slew rate  
R
R
R
= 10 k,  
= 10 k,  
= 10 k,  
C
C
C
= 100 pF, See Note 11  
= 100 pF, See Note 12  
= 100 pF, See Note 13  
µs  
s(FS)  
L
L
L
L
L
L
3
10  
1
µs  
s(CC)  
2
3
SR  
V/µs  
0.5  
5
Glitch energy  
DIN = 0 to 1,  
FCLK = 100 kHz, CS = V  
nVs  
DD  
SNR  
Signal-to-noise ratio  
68  
65  
62  
64  
SINAD  
THD  
Signal-to-noise + distortion  
Total harmonic distortion  
Spurious free dynamic range  
f = 102 kSPS,  
f = 1 kHz, R = 10 k,  
out L  
s
dB  
C
= 100 pF  
L
SFDR  
NOTES: 11. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change  
of 0x020 to 0xFDC and 0xFDC to 0x020 respectively. Not tested, assured by design.  
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change  
of one count. Not tested, assured by design.  
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% of full-scale voltage.  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
digital input timing requirements  
MIN NOM  
MAX  
UNIT  
V
V
= 2.7 V to 3.3 V  
= 4.5 V to 5.5 V  
10  
5
DD  
t
Setup time, CS low before first negative SCLK edge  
ns  
su(CSCK)  
DD  
th  
t
t
t
Setup time, 16 negative SCLK edge before CS rising edge  
10  
25  
25  
10  
5
ns  
ns  
ns  
su(C16-CS)  
SCLK pulse width high  
SCLK pulse width low  
wH  
wL  
V
V
V
= 2.7 V to 3.3 V  
= 4.5 V to 5.5 V  
= 2.7 V to 3.3 V  
DD  
DD  
DD  
t
Setup time, data ready before SCLK falling edge  
Hold time, data held valid after SCLK falling edge  
ns  
ns  
su(D)  
h(D)  
10  
t
V
DD  
= 4.5 V to 5.5 V  
5
timing requirements  
t
t
wL  
wH  
SCLK  
DIN  
X
X
X
1
2
3
4
15  
16  
t
t
su(D) h(D)  
D15  
D14  
D13  
D12  
D1  
D0  
X
t
su(C16-CS)  
t
su(CS-CK)  
CS  
Figure 1. Timing Diagram  
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
TYPICAL CHARACTERISTICS  
OUTPUT VOLTAGE  
OUTPUT VOLTAGE  
vs  
vs  
LOAD CURRENT  
LOAD CURRENT  
2.050  
2.048  
2.046  
2.044  
2.042  
2.040  
2.038  
2.036  
4.105  
4.100  
4.095  
4.090  
4.085  
4.080  
4.075  
4.070  
3-V Slow Mode, SOURCE  
V
V
=3 V  
REF  
V
=5 V  
DD  
DD  
=1 V  
V
=2 V  
REF  
5-V Slow Mode, SOURCE  
Full scale  
Full scale  
3-V Fast Mode, SOURCE  
5-V Fast Mode, SOURCE  
0 0.01 0.02 0.5 0.1 0.2 0.5 0.8 1  
2  
0 0.02 0.04 0.1 0.2 0.4 0.8 1  
Load Current mA  
2  
4  
Load Current mA  
Figure 2  
Figure 3  
OUTPUT VOLTAGE  
vs  
LOAD CURRENT  
OUTPUT VOLTAGE  
vs  
LOAD CURRENT  
0.20  
0.18  
0.16  
0.14  
0.12  
0.10  
0.08  
0.06  
0.04  
0.02  
0.00  
0.35  
0.30  
0.25  
0.20  
0.15  
0.10  
0.05  
0.00  
V
V
=3 V  
REF  
V
V
=5 V  
REF  
DD  
DD  
=1 V  
=2 V  
Zero scale  
Zero scale  
3-V Slow Mode, SINK  
5-V Slow Mode, SINK  
5-V Fast Mode, SINK  
3-V Fast Mode, SINK  
0
0.01 0.02 0.05 0.1 0.2 0.5 0.8  
1
2
0
0.02 0.04 0.1 0.2 0.4 0.8  
1
2
4
Load Current mA  
Load Current mA  
Figure 4  
Figure 5  
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
TYPICAL CHARACTERISTICS  
SUPPLY CURRENT  
vs  
SUPPLY CURRENT  
vs  
FREE-AIR TEMPERATURE  
FREE-AIR TEMPERATURE  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
V
V
=3 V  
REF  
DD  
=1 V  
Full scale  
Fast Mode  
Fast Mode  
V
V
=5 V  
REF  
DD  
=2 V  
Full scale  
Slow Mode  
Slow Mode  
40 20  
0
20  
40  
60  
80  
100 120  
40 20  
0
20  
40  
60  
80  
100 120  
T
A
- Free-Air Temperature - C  
T
A
- Free-Air Temperature - C  
Figure 6  
Figure 7  
TOTAL HARMONIC DISTORTION  
TOTAL HARMONIC DISTORTION  
vs  
vs  
FREQUENCY  
FREQUENCY  
0
0
V
= 1 V + 1 V  
Sinewave,  
V
= 1 V + 1 V  
Sinewave,  
P/P  
REF  
P/P  
REF  
Output Full Scale  
10  
20  
30  
40  
50  
60  
70  
80  
90  
10  
Output Full Scale  
20  
30  
40  
50  
60  
70  
80  
90  
3-V Slow Mode  
3-V Fast Mode  
5 V Slow Mode  
5 V Fast Mode  
1
10  
100  
1
10  
100  
f Frequency kHz  
f Frequency kHz  
Figure 8  
Figure 9  
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
TYPICAL CHARACTERISTICS  
INTEGRAL NONLINEARITY ERROR  
vs  
DIGITAL CODE  
1
0.75  
0.5  
0.25  
0
0.25  
0.5  
0.75  
1  
0
128  
256  
384  
512  
640  
768  
896  
1024  
Digital Code  
Figure 10  
DIFFERENTIAL NONLINEARITY ERROR  
vs  
DIGITAL CODE  
0.2  
0.15  
0.1  
0.05  
0
0.05  
0.1  
0.15  
0.2  
0
128  
256  
384  
512  
640  
768  
896  
1024  
Digital Code  
Figure 11  
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
APPLICATION INFORMATION  
general function  
The TLV5617A is a dual 10-bit, single-supply DAC, based on a resistor-string architecture. It consists of a serial  
interface, speed and power-down control logic, a resistor string, and a rail-to-rail output buffer.  
The output voltage (full scale determined by the reference) is given by:  
CODE  
2
2 REF  
[V]  
n
n
Where REF is the reference voltage and CODE is the digital input value within the range of 0 to 2 1, where  
10  
n=10 (bits). The 16-bit data word, consisting of control bits and the new DAC value, is illustrated in the data  
format section. A power-on reset initially resets the internal latches to a defined state (all bits zero).  
serial interface  
A falling edge of CS starts shifting the data bit-per-bit (starting with the MSB) to the internal register on the falling  
edges of SCLK. After 16 bits have been transferred or CS rises, the content of the shift register is moved to the  
target latches (DAC A, DAC B, BUFFER, CONTROL), depending on the control bits within the data word.  
Figure 12 shows examples of how to connect the TLV5617A to TMS320, SPI, and Microwire.  
TMS320  
DSP  
TLV5617A  
CS  
DIN  
SPI  
TLV5617A  
CS  
DIN  
Microwire  
I/O  
TLV5617A  
CS  
DIN  
FSX  
DX  
I/O  
MOSI  
SCK  
SO  
SK  
CLKX  
SCLK  
SCLK  
SCLK  
Figure 12. Three-Wire Interface  
Notes on SPI and Microwire: Before the controller starts the data transfer, the software has to generate a falling  
edge on the pin connected to CS. If the word width is 8 bits (SPI and Microwire) two write operations must be  
performed to program the TLV5617A. After the write operation(s), the holding registers or the control register  
of the DAC update automatically on the rising CS edge, ending the write cycle to the DAC. Note: After transfer  
oftheLSBduringadataorcontrolwritecycle, oneadditionalrisingedgeonSCLKisrequiredtoresettheinternal  
state machine. This edge can occur when CS is high or low, but must occur before the next falling CS edge that  
begins the following write cycle. Refer to the timing diagram for more information.  
serial clock frequency and update rate  
The maximum serial clock frequency is given by:  
1
f
+
+ 20 MHz  
sclkmax  
t
) t  
whmin  
wlmin  
The maximum update rate is:  
1
f
+
+ 1.25 MHz  
updatemax  
16 ǒt  
Ǔ
wlmin  
) t  
whmin  
Note that the maximum update rate is just a theoretical value for the serial interface, as the settling time of the  
TLV5617A should also be considered.  
10  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
APPLICATION INFORMATION  
data format  
The 16-bit data word for the TLV5617A consists of two parts:  
D
D
Program bits  
New data  
(D15..D12)  
(D11..D0)  
D15  
R1  
D14  
D13  
D12  
R0  
D11  
D10  
D9  
D8  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
0
D0  
0
SPD  
PWR  
MSB  
10 Data bits  
LSB  
SPD: Speed control bit  
PWR: Power control bit  
1 fast mode  
1 power down  
0 slow mode  
0 normal operation  
On power up, SPD and PWD are reset to 0 (slow mode and normal operation)  
The following table lists all possible combinations of register-select bits:  
register-select bits  
R1  
0
R0  
0
REGISTER  
Write data to DAC B and BUFFER  
Write data to BUFFER  
0
1
1
0
Write data to DAC A and update DAC B with BUFFER content  
Reserved  
1
1
The meaning of the 12 data bits depends on the register. If one of the DAC registers or the BUFFER is selected,  
then the 12 data bits determine the new DAC value:  
examples of operation  
D
Set DAC A output, select fast mode:  
Write new DAC A value and update DAC A output:  
D15  
1
D14  
1
D13  
0
D12  
0
D11  
D10  
D9  
D8  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
0
D0  
0
New DAC A output value  
The DAC A output is updated on the rising clock edge after D0 is sampled.  
D
Set DAC B output, select fast mode:  
Write new DAC B value to BUFFER and update DAC B output:  
D15  
0
D14  
1
D13  
0
D12  
0
D11  
D10  
D9  
D8  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
0
D0  
0
New BUFFER content and DAC B output value  
The DAC A output is updated on the rising clock edge after D0 is sampled.  
D
Set DAC A value, set DAC B value, update both simultaneously, select slow mode:  
1. Write data for DAC B to BUFFER:  
D15  
0
D14  
0
D13  
0
D12  
1
D11  
D10  
D9  
D8  
D7  
D6  
D5  
D4  
D3  
D2  
D2  
D1  
0
D0  
0
New DAC B value  
2. Write new DAC A value and update DAC A and B simultaneously:  
D15  
1
D14  
0
D13  
0
D12  
0
D11  
D10  
D9  
D8  
D7  
D6  
D5  
D4  
D3  
D1  
0
D0  
0
New DAC A value  
11  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
APPLICATION INFORMATION  
examples of operation (continued)  
Both outputs are updated on the rising clock edge after D0 from the DAC A data word is sampled.  
D
Set powerdown mode:  
D15  
X
D14  
X
D13  
1
D12  
X
D11  
X
D10  
X
D9  
X
D8  
X
D7  
X
D6  
X
D5  
X
D4  
X
D3  
X
D2  
X
D1  
X
D0  
X
X = Dont care  
linearity, offset, and gain error using single ended supplies  
When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative. With  
a positive offset, the output voltage changes on the first code change. With a negative offset, the output voltage  
may not change with the first code, depending on the magnitude of the offset voltage.  
The output amplifier attempts to drive the output to a negative voltage. However, because the most negative  
supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.  
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage  
to overcome the negative offset voltage, resulting in the transfer function shown in Figure 13.  
Output  
Voltage  
0 V  
DAC Code  
Negative  
Offset  
Figure 13. Effect of Negative Offset (Single Supply)  
This offset error, not the linearity error, produces this breakpoint. The transfer function would have followed the  
dotted line if the output buffer could drive below the ground rail.  
For a DAC, linearity is measured between zero-input code (all inputs 0) and full-scale code (all inputs 1) after  
offset and full scale are adjusted out or accounted for in some way. However, single supply operation does not  
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity  
is measured between full-scale code and the lowest code that produces a positive output voltage.  
definitions of specifications and terminology  
integral nonlinearity (INL)  
The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum  
deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale  
errors.  
differential nonlinearity (DNL)  
The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the  
measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage  
changes in the same direction (or remains constant) as a change in the digital input code.  
12  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV5617A  
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG  
CONVERTER WITH POWER DOWN  
SLAS234F JULY 1999 REVISED JULY 2002  
definitions of specifications and terminology (continued)  
zero-scale error (E  
)
ZS  
Zero-scale error is defined as the deviation of the output from 0 V at a digital input value of 0.  
gain error (E )  
G
Gain error is the error in slope of the DAC transfer function.  
total harmonic distortion (THD)  
THD is the ratio of the rms value of the first six harmonic components to the value of the fundamental signal.  
The value for THD is expressed in decibels.  
signal-to-noise ratio + distortion (S/N+D)  
S/N+D is the ratio of the rms value of the output signal to the rms sum of all other spectral components below  
the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels.  
spurious free dynamic range (SFDR)  
Spurious free dynamic range is the difference between the rms value of the output signal and the rms value of  
the largest spurious signal within a specified bandwidth. The value for SFDR is expressed in decibels.  
13  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
PACKAGE OPTION ADDENDUM  
www.ti.com  
22-Jun-2013  
PACKAGING INFORMATION  
Orderable Device  
TLV5617ACD  
Status Package Type Package Pins Package  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
0 to 70  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
ACTIVE  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
D
8
8
8
8
8
8
8
8
75  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
CU NIPDAU  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
TV5617  
TLV5617ACDG4  
TLV5617ACDR  
TLV5617ACDRG4  
TLV5617AID  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
D
D
D
D
D
D
D
75  
2500  
2500  
75  
Green (RoHS  
& no Sb/Br)  
0 to 70  
TV5617  
TV5617  
TV5617  
TY5617  
TY5617  
TY5617  
TY5617  
Green (RoHS  
& no Sb/Br)  
0 to 70  
Green (RoHS  
& no Sb/Br)  
0 to 70  
Green (RoHS  
& no Sb/Br)  
-40 to 85  
-40 to 85  
-40 to 85  
-40 to 85  
TLV5617AIDG4  
TLV5617AIDR  
75  
Green (RoHS  
& no Sb/Br)  
2500  
2500  
Green (RoHS  
& no Sb/Br)  
TLV5617AIDRG4  
Green (RoHS  
& no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
22-Jun-2013  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
26-Jan-2013  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TLV5617AIDR  
SOIC  
D
8
2500  
330.0  
12.4  
6.4  
5.2  
2.1  
8.0  
12.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
26-Jan-2013  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SOIC  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 35.0  
TLV5617AIDR  
D
8
2500  
Pack Materials-Page 2  
IMPORTANT NOTICE  
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changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest  
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TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms  
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TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and  
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Copyright © 2013, Texas Instruments Incorporated  

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