TLV5617AIDG4 [TI]
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOGnull;型号: | TLV5617AIDG4 |
厂家: | TEXAS INSTRUMENTS |
描述: | 2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOGnull |
文件: | 总20页 (文件大小:823K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
features
applications
D
D
Dual 10-Bit Voltage Output DAC
D
D
D
D
D
Digital Servo Control Loops
Digital Offset and Gain Adjustment
Industrial Process Control
Programmable Settling Time
– 3 µs in Fast Mode
– 10 µs in Slow Mode
Machine and Motion Control Devices
Mass Storage Devices
D
D
D
D
Compatible With TMS320 and SPI Serial
Ports
Differential Nonlinearity <0.1 LSB Typ
Monotonic Over Temperature
D PACKAGE
(TOP VIEW)
Direct Replacement for TLC5617A
DIN
SCLK
CS
V
DD
OUTB
REF
1
2
3
4
8
7
6
5
description
TheTLV5617Aisadual10-bitvoltageoutputDAC
with a flexible 3-wire serial interface. The serial
interface is compatible with TMS320, SPI ,
OUTA
AGND
QSPI , and Microwire
serial ports. It is
programmed with a 16-bit serial string containing
4 control bits and 10 data bits.
The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class-AB
output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows
the designer to optimize speed versus power dissipation.
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It
is available in an 8-pin SOIC package in standard commercial and industrial temperature ranges.
AVAILABLE OPTIONS
PACKAGE
T
A
SOIC
(D)
0°C to 70°C
TLV5617ACD
TLV5617AID
–40°C to 85°C
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
Copyright 2002, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
functional block diagram
REF
AGND
V
DD
Power and
Speed Control
Power-On
Reset
2
x2
OUTA
DIN
10-Bit
DAC A
Latch
10
10
SCLK
CS
Serial
Interface
and
10
Buffer
Control
10
10
10-Bit
DAC B
Latch
x2
OUTB
Terminal Functions
TERMINAL
I/O/P
DESCRIPTION
NAME
NO.
5
AGND
CS
P
I
Ground
3
Chip select. Digital input active low, used to enable/disable inputs.
Digital serial data input
DIN
1
I
OUTA
OUTB
REF
4
O
O
I
DAC A analog voltage output
DAC B analog voltage output
Analog reference voltage input
Digital serial clock input
7
6
SCLK
2
I
V
DD
8
P
Positive power supply
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage (V
to AGND) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
DD
Reference input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to V
Digital input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to V
+ 0.3 V
+ 0.3 V
DD
DD
Operating free-air temperature range, T : TLV5617AC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
A
TLV5617AI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to 85°C
Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
stg
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
MIN NOM
MAX
5.5
3.3
2
UNIT
V
V
= 5 V
= 3 V
4.5
2.7
5
3
DD
Supply voltage, V
V
V
DD
DD
Power on reset, POR
0.55
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
= 2.7 V
2
High-level digital input voltage, V
V
V
V
IH
= 5.5 V
2.4
= 2.7 V
0.6
1
Low-level digital input voltage, V
IL
= 5.5 V
= 5 V (see Note 1)
= 3 V (see Note 1)
AGND 2.048
AGND 1.024
2
V
V
–1.5
–1.5
DD
Reference voltage, V to REF terminal
ref
DD
Load resistance, R
kΩ
pF
L
Load capacitance, C
100
20
L
Clock frequency, f
MHz
CLK
TLV5617AC
TLV5617AI
0
70
Operating free-air temperature, T
°C
A
–40
85
NOTE 1: Due to the x2 output buffer, a reference input voltage ≥ (V –0.4 V)/2 causes clipping of the transfer function.
DD
3
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TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
electrical characteristics over recommended operating conditions (unless otherwise noted)
power supply
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Fast
1.6
2.5
No load, All inputs = AGND or V
DAC latch = 0x800
,
DD
I
Power supply current
mA
µA
dB
DD
Slow
0.6
1
1
Power down supply current
Power supply rejection ratio
Zero scale, See Note 2
Full scale, See Note 3
–65
–65
PSRR
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying V
and is given by:
and is given by:
DD
PSRR = 20 log [(E (V max) – E (V min)/V max]
ZS DD ZS DD DD
3. Power supply rejection ratio at full scale is measured by varying V
DD
PSRR = 20 log [(E (V max) – E (V min)/V max]
DD DD DD
G
G
static DAC specifications
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
bits
Resolution
10
INL
Integral nonlinearity
See Note 4
See Note 5
See Note 6
See Note 7
±0.7
±0.1
±1
±0.5
±12
LSB
DNL
Differential nonlinearity
LSB
E
Zero-scale error (offset error at zero scale)
TC Zero-scale-error temperature coefficient
mV
ZS
ZS
E
3
ppm/°C
V
V
= 2.7 V to 3.3 V
= 4.5 V to 5.5 V
±0.6
DD
% full
scale V
E
Gain error
See Note 8
See Note 9
G
±0.29
DD
E
G
T
Gain-error temperature coefficient
1
ppm/°C
C
NOTES: 4. The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output
from the line between zero and full scale, excluding the effects of zero-code and full-scale errors.
5. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal
1-LSB amplitude change of any two adjacent codes.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
6
7. Zero-scale-error temperature coefficient is given by: E
ZS
TC = [E
(T
ZS max
) – E
(T
)]/2V × 10 /(T
ref max
– T
).
min
ZS min
8. Gain error is the deviation from the ideal output (2V – 1 LSB) with an output load of 10 kΩ.
ref
= [E (T
6
9. Gain temperature coefficient is given by: E
T
) – E (T
)]/2V × 10 /(T – T
max
).
min
G
C
G
max
g
min
ref
output specifications
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
–0.4
UNIT
V
V
Output voltage range
R
= 10 kΩ
V
V
O
L
DD
Output load regulation accuracy
V
O
= 4.096 V, 2.048 V,
R
L
= 2 kΩ to 10 kΩ
±0.1
% FS
reference input
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
V
V
I
Input voltage range
Input resistance
0
DD–1.5
R
C
10
5
MΩ
pF
I
I
Input capacitance
Fast
1.3
525
–80
MHz
kHz
dB
Reference input bandwidth
Reference feedthrough
REF = 0.2 V + 1.024 V dc
pp
Slow
REF = 1 V at 1 kHz + 1.024 V dc (see Note 10)
pp
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
4
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TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
electrical characteristics over recommended operating conditions (unless otherwise noted)
(Continued)
digital inputs
PARAMETER
High-level digital input current
TEST CONDITIONS
V = V
MIN
TYP
MAX
UNIT
µA
I
I
1
IH
I
DD
Low-level digital input current
Input capacitance
V = 0 V
I
–1
µA
IL
C
8
pF
i
analog output dynamic performance
PARAMETER
TEST CONDITIONS
MIN
TYP
1
MAX
3
UNIT
Fast
Slow
Fast
Slow
Fast
Slow
t
t
Output settling time, full scale
Output settling time, code to code
Slew rate
R
R
R
= 10 kΩ,
= 10 kΩ,
= 10 kΩ,
C
C
C
= 100 pF, See Note 11
= 100 pF, See Note 12
= 100 pF, See Note 13
µs
s(FS)
L
L
L
L
L
L
3
10
1
µs
s(CC)
2
3
SR
V/µs
0.5
5
Glitch energy
DIN = 0 to 1,
FCLK = 100 kHz, CS = V
nV–s
DD
SNR
Signal-to-noise ratio
68
65
–62
64
SINAD
THD
Signal-to-noise + distortion
Total harmonic distortion
Spurious free dynamic range
f = 102 kSPS,
f = 1 kHz, R = 10 kΩ,
out L
s
dB
C
= 100 pF
L
SFDR
NOTES: 11. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
of 0x020 to 0xFDC and 0xFDC to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% of full-scale voltage.
5
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TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
digital input timing requirements
MIN NOM
MAX
UNIT
V
V
= 2.7 V to 3.3 V
= 4.5 V to 5.5 V
10
5
DD
t
Setup time, CS low before first negative SCLK edge
ns
su(CS–CK)
DD
th
t
t
t
Setup time, 16 negative SCLK edge before CS rising edge
10
25
25
10
5
ns
ns
ns
su(C16-CS)
SCLK pulse width high
SCLK pulse width low
wH
wL
V
V
V
= 2.7 V to 3.3 V
= 4.5 V to 5.5 V
= 2.7 V to 3.3 V
DD
DD
DD
t
Setup time, data ready before SCLK falling edge
Hold time, data held valid after SCLK falling edge
ns
ns
su(D)
h(D)
10
t
V
DD
= 4.5 V to 5.5 V
5
timing requirements
t
t
wL
wH
SCLK
DIN
X
X
X
1
2
3
4
15
16
t
t
su(D) h(D)
D15
D14
D13
D12
D1
D0
X
t
su(C16-CS)
t
su(CS-CK)
CS
Figure 1. Timing Diagram
6
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TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
TYPICAL CHARACTERISTICS
OUTPUT VOLTAGE
OUTPUT VOLTAGE
vs
vs
LOAD CURRENT
LOAD CURRENT
2.050
2.048
2.046
2.044
2.042
2.040
2.038
2.036
4.105
4.100
4.095
4.090
4.085
4.080
4.075
4.070
3-V Slow Mode, SOURCE
V
V
=3 V
REF
V
=5 V
DD
DD
=1 V
V
=2 V
REF
5-V Slow Mode, SOURCE
Full scale
Full scale
3-V Fast Mode, SOURCE
5-V Fast Mode, SOURCE
0 –0.01 –0.02 –0.5 –0.1 –0.2 –0.5 –0.8 –1
–2
0 –0.02 –0.04 –0.1 –0.2 –0.4 –0.8 –1
Load Current – mA
–2
–4
Load Current – mA
Figure 2
Figure 3
OUTPUT VOLTAGE
vs
LOAD CURRENT
OUTPUT VOLTAGE
vs
LOAD CURRENT
0.20
0.18
0.16
0.14
0.12
0.10
0.08
0.06
0.04
0.02
0.00
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
V
V
=3 V
REF
V
V
=5 V
REF
DD
DD
=1 V
=2 V
Zero scale
Zero scale
3-V Slow Mode, SINK
5-V Slow Mode, SINK
5-V Fast Mode, SINK
3-V Fast Mode, SINK
0
0.01 0.02 0.05 0.1 0.2 0.5 0.8
1
2
0
0.02 0.04 0.1 0.2 0.4 0.8
1
2
4
Load Current – mA
Load Current – mA
Figure 4
Figure 5
7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
TYPICAL CHARACTERISTICS
SUPPLY CURRENT
vs
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
FREE-AIR TEMPERATURE
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
V
V
=3 V
REF
DD
=1 V
Full scale
Fast Mode
Fast Mode
V
V
=5 V
REF
DD
=2 V
Full scale
Slow Mode
Slow Mode
–40 –20
0
20
40
60
80
100 120
–40 –20
0
20
40
60
80
100 120
T
A
- Free-Air Temperature - C
T
A
- Free-Air Temperature - C
Figure 6
Figure 7
TOTAL HARMONIC DISTORTION
TOTAL HARMONIC DISTORTION
vs
vs
FREQUENCY
FREQUENCY
0
0
V
= 1 V + 1 V
Sinewave,
V
= 1 V + 1 V
Sinewave,
P/P
REF
P/P
REF
Output Full Scale
–10
–20
–30
–40
–50
–60
–70
–80
–90
–10
Output Full Scale
–20
–30
–40
–50
–60
–70
–80
–90
3-V Slow Mode
3-V Fast Mode
5 V Slow Mode
5 V Fast Mode
1
10
100
1
10
100
f – Frequency – kHz
f – Frequency – kHz
Figure 8
Figure 9
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
TYPICAL CHARACTERISTICS
INTEGRAL NONLINEARITY ERROR
vs
DIGITAL CODE
1
0.75
0.5
0.25
0
–0.25
–0.5
–0.75
–1
0
128
256
384
512
640
768
896
1024
Digital Code
Figure 10
DIFFERENTIAL NONLINEARITY ERROR
vs
DIGITAL CODE
0.2
0.15
0.1
0.05
0
–0.05
–0.1
–0.15
–0.2
0
128
256
384
512
640
768
896
1024
Digital Code
Figure 11
9
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
APPLICATION INFORMATION
general function
The TLV5617A is a dual 10-bit, single-supply DAC, based on a resistor-string architecture. It consists of a serial
interface, speed and power-down control logic, a resistor string, and a rail-to-rail output buffer.
The output voltage (full scale determined by the reference) is given by:
CODE
2
2 REF
[V]
n
n
Where REF is the reference voltage and CODE is the digital input value within the range of 0 to 2 –1, where
10
n=10 (bits). The 16-bit data word, consisting of control bits and the new DAC value, is illustrated in the data
format section. A power-on reset initially resets the internal latches to a defined state (all bits zero).
serial interface
A falling edge of CS starts shifting the data bit-per-bit (starting with the MSB) to the internal register on the falling
edges of SCLK. After 16 bits have been transferred or CS rises, the content of the shift register is moved to the
target latches (DAC A, DAC B, BUFFER, CONTROL), depending on the control bits within the data word.
Figure 12 shows examples of how to connect the TLV5617A to TMS320, SPI, and Microwire.
TMS320
DSP
TLV5617A
CS
DIN
SPI
TLV5617A
CS
DIN
Microwire
I/O
TLV5617A
CS
DIN
FSX
DX
I/O
MOSI
SCK
SO
SK
CLKX
SCLK
SCLK
SCLK
Figure 12. Three-Wire Interface
Notes on SPI and Microwire: Before the controller starts the data transfer, the software has to generate a falling
edge on the pin connected to CS. If the word width is 8 bits (SPI and Microwire) two write operations must be
performed to program the TLV5617A. After the write operation(s), the holding registers or the control register
of the DAC update automatically on the rising CS edge, ending the write cycle to the DAC. Note: After transfer
oftheLSBduringadataorcontrolwritecycle, oneadditionalrisingedgeonSCLKisrequiredtoresettheinternal
state machine. This edge can occur when CS is high or low, but must occur before the next falling CS edge that
begins the following write cycle. Refer to the timing diagram for more information.
serial clock frequency and update rate
The maximum serial clock frequency is given by:
1
f
+
+ 20 MHz
sclkmax
t
) t
whmin
wlmin
The maximum update rate is:
1
f
+
+ 1.25 MHz
updatemax
16 ǒt
Ǔ
wlmin
) t
whmin
Note that the maximum update rate is just a theoretical value for the serial interface, as the settling time of the
TLV5617A should also be considered.
10
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TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
APPLICATION INFORMATION
data format
The 16-bit data word for the TLV5617A consists of two parts:
D
D
Program bits
New data
(D15..D12)
(D11..D0)
D15
R1
D14
D13
D12
R0
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
0
D0
0
SPD
PWR
MSB
10 Data bits
LSB
SPD: Speed control bit
PWR: Power control bit
1 → fast mode
1 → power down
0 → slow mode
0 → normal operation
On power up, SPD and PWD are reset to 0 (slow mode and normal operation)
The following table lists all possible combinations of register-select bits:
register-select bits
R1
0
R0
0
REGISTER
Write data to DAC B and BUFFER
Write data to BUFFER
0
1
1
0
Write data to DAC A and update DAC B with BUFFER content
Reserved
1
1
The meaning of the 12 data bits depends on the register. If one of the DAC registers or the BUFFER is selected,
then the 12 data bits determine the new DAC value:
examples of operation
D
Set DAC A output, select fast mode:
Write new DAC A value and update DAC A output:
D15
1
D14
1
D13
0
D12
0
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
0
D0
0
New DAC A output value
The DAC A output is updated on the rising clock edge after D0 is sampled.
D
Set DAC B output, select fast mode:
Write new DAC B value to BUFFER and update DAC B output:
D15
0
D14
1
D13
0
D12
0
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
0
D0
0
New BUFFER content and DAC B output value
The DAC A output is updated on the rising clock edge after D0 is sampled.
D
Set DAC A value, set DAC B value, update both simultaneously, select slow mode:
1. Write data for DAC B to BUFFER:
D15
0
D14
0
D13
0
D12
1
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D2
D1
0
D0
0
New DAC B value
2. Write new DAC A value and update DAC A and B simultaneously:
D15
1
D14
0
D13
0
D12
0
D11
D10
D9
D8
D7
D6
D5
D4
D3
D1
0
D0
0
New DAC A value
11
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
APPLICATION INFORMATION
examples of operation (continued)
Both outputs are updated on the rising clock edge after D0 from the DAC A data word is sampled.
D
Set powerdown mode:
D15
X
D14
X
D13
1
D12
X
D11
X
D10
X
D9
X
D8
X
D7
X
D6
X
D5
X
D4
X
D3
X
D2
X
D1
X
D0
X
X = Don’t care
linearity, offset, and gain error using single ended supplies
When an amplifier is operated from a single supply, the voltage offset can still be either positive or negative. With
a positive offset, the output voltage changes on the first code change. With a negative offset, the output voltage
may not change with the first code, depending on the magnitude of the offset voltage.
The output amplifier attempts to drive the output to a negative voltage. However, because the most negative
supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage
to overcome the negative offset voltage, resulting in the transfer function shown in Figure 13.
Output
Voltage
0 V
DAC Code
Negative
Offset
Figure 13. Effect of Negative Offset (Single Supply)
This offset error, not the linearity error, produces this breakpoint. The transfer function would have followed the
dotted line if the output buffer could drive below the ground rail.
For a DAC, linearity is measured between zero-input code (all inputs 0) and full-scale code (all inputs 1) after
offset and full scale are adjusted out or accounted for in some way. However, single supply operation does not
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity
is measured between full-scale code and the lowest code that produces a positive output voltage.
definitions of specifications and terminology
integral nonlinearity (INL)
The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum
deviation of the output from the line between zero and full scale excluding the effects of zero code and full-scale
errors.
differential nonlinearity (DNL)
The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the
measured and ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage
changes in the same direction (or remains constant) as a change in the digital input code.
12
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLV5617A
2.7-V TO 5.5-V LOW-POWER DUAL 10-BIT DIGITAL-TO-ANALOG
CONVERTER WITH POWER DOWN
SLAS234F – JULY 1999 – REVISED JULY 2002
definitions of specifications and terminology (continued)
zero-scale error (E
)
ZS
Zero-scale error is defined as the deviation of the output from 0 V at a digital input value of 0.
gain error (E )
G
Gain error is the error in slope of the DAC transfer function.
total harmonic distortion (THD)
THD is the ratio of the rms value of the first six harmonic components to the value of the fundamental signal.
The value for THD is expressed in decibels.
signal-to-noise ratio + distortion (S/N+D)
S/N+D is the ratio of the rms value of the output signal to the rms sum of all other spectral components below
the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels.
spurious free dynamic range (SFDR)
Spurious free dynamic range is the difference between the rms value of the output signal and the rms value of
the largest spurious signal within a specified bandwidth. The value for SFDR is expressed in decibels.
13
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PACKAGE OPTION ADDENDUM
www.ti.com
22-Jun-2013
PACKAGING INFORMATION
Orderable Device
TLV5617ACD
Status Package Type Package Pins Package
Eco Plan Lead/Ball Finish
MSL Peak Temp
Op Temp (°C)
0 to 70
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
ACTIVE
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
D
8
8
8
8
8
8
8
8
75
Green (RoHS
& no Sb/Br)
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
CU NIPDAU
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
Level-1-260C-UNLIM
TV5617
TLV5617ACDG4
TLV5617ACDR
TLV5617ACDRG4
TLV5617AID
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
D
D
D
D
D
D
D
75
2500
2500
75
Green (RoHS
& no Sb/Br)
0 to 70
TV5617
TV5617
TV5617
TY5617
TY5617
TY5617
TY5617
Green (RoHS
& no Sb/Br)
0 to 70
Green (RoHS
& no Sb/Br)
0 to 70
Green (RoHS
& no Sb/Br)
-40 to 85
-40 to 85
-40 to 85
-40 to 85
TLV5617AIDG4
TLV5617AIDR
75
Green (RoHS
& no Sb/Br)
2500
2500
Green (RoHS
& no Sb/Br)
TLV5617AIDRG4
Green (RoHS
& no Sb/Br)
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
22-Jun-2013
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
26-Jan-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
TLV5617AIDR
SOIC
D
8
2500
330.0
12.4
6.4
5.2
2.1
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
26-Jan-2013
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SOIC
SPQ
Length (mm) Width (mm) Height (mm)
367.0 367.0 35.0
TLV5617AIDR
D
8
2500
Pack Materials-Page 2
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