TM4EJ64NPU [TI]

EXTENDED-DATA-OUT DYNAMIC RAM MODULES ── SODIMM;
TM4EJ64NPU
型号: TM4EJ64NPU
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

EXTENDED-DATA-OUT DYNAMIC RAM MODULES ── SODIMM

文件: 总24页 (文件大小:378K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ꢖꢀ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
D
Organization  
− TM4xJ64xPU-xx . . . 4194304 × 64 Bits  
− TM8xJ64xPU-xx . . . 8388608 × 64 Bits  
Single 3.3-V Power Supply  
( 10% Tolerance)  
D
Long Refresh Periods:  
− TMxEJ64KPU: 64 ms (4096 Cycles)  
− TMxEJ64NPU: 64 ms (8192 Cycles)  
− TMxFJ64KPU: 128 ms (4096 Cycles)  
− TMxFJ64NPU: 128 ms (8192 Cycles)  
D
D
D
Extended Data Out (EDO) Operation With  
CAS-Before-RAS (CBR), RAS-Only, and  
Hidden Refresh  
JEDEC 144-Pin Small-Outline Dual-In-Line  
Memory Module (SODIMM) Without Buffer  
for Use With Socket  
D
D
D
Serial Presence-Detect (SPD) Using  
EEPROM  
D
D
TM4xJ64xPU-xx — Utilizes Four 64M-Bit  
High-Speed (4M×16-Bit) Dynamic RAMs  
TM4xJ64xPU-xx — Utilizes Eight 64M-Bit  
High-Speed (4M×16-Bit) Dynamic RAMs  
Ambient Temperature Range  
0°C to 70°C  
Performance Ranges  
D
High-Speed, Low-Noise LVTTL Interface  
ACCESS ACCESS ACCESS EDO  
D
High-Reliability 50-Lead 400-Mil-Wide  
Surface-Mount Thin Small-Outline Package  
(TSOP) (DGE Suffix)  
TIME  
TIME  
TIME CYCLE  
t
t
t
t
HPC  
RAC  
CAC  
AA  
(MAX)  
40 ns  
50 ns  
60 ns  
(MAX)  
11 ns  
13 ns  
15 ns  
(MAX)  
20 ns  
25 ns  
30 ns  
(MIN)  
16 ns  
20 ns  
25 ns  
D
D
3-State Output  
’xxJ64xPU-40  
’xxJ64xPU-50  
’xxJ64xPU-60  
Gold-Plated Contacts  
description  
The TM4xJ64KPU is a 32M-byte, 144-pin, small-outline dual-in-line memory module (SODIMM). The SODIMM  
is composed of four TMS465169/P, 4194304 × 16-bit 4K normal or low-power battery-backup refresh EDO  
dynamic random-access memory (DRAM) devices, each in a 400-mil, 50-pin plastic thin small-outline package  
(TSOP) (DGE suffix) package mounted on a substrate with decoupling capacitors. See the TMS465169/P data  
sheet (literature number SMHS566).  
The TM4xJ64NPU is a 32M-byte, 144-pin SODIMM. The SODIMM is composed of four TMS464169/P,  
4194304 × 16-bit 8K normal or low-power battery-backup refresh EDO DRAMs, each in a 400-mil, 50-pin plastic  
TSOP (DGE suffix) mounted on a substrate with decoupling capacitors. See the TMS464169/P data sheet  
(literature number SMHS566).  
The TM8xJ64KPU is a 64M-byte, 144-pin SODIMM. The SODIMM is composed of eight TMS465169/P,  
4194304 × 16-bit 4K normal or low-power battery-backup refresh EDO DRAMs, each in a 400-mil, 50-pin plastic  
TSOP (DGE suffix) mounted on a substrate with decoupling capacitors.  
The TM8xJ64NPU is a 64M-byte, 144-pin SODIMM. The SODIMM is composed of eight TMS464169/P,  
4194304 × 16-bit 8K normal or low-power battery-backup refresh EDO DRAMs, each in a 400-mil, 50-pin plastic  
TSOP (DGE suffix) mounted on a substrate with decoupling capacitors.  
operation  
The TM4xJ64xPU operates as four TMS46x169/Ps that are connected as shown in the TMxxJ64xPU functional  
block diagram. The TM8xJ64xPU operates as eight TMS46x169/Ps that are connected as shown in the  
TMxxJ64xPU functional block diagram.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
ꢭꢪ ꢫ ꢡ ꢱꢢ ꢬꢯ ꢧ ꢫ ꢪ ꢤꢣ ꢭꢪ ꢰ ꢪ ꢲꢤ ꢬꢦꢪ ꢢꢨꢳ ꢚ ꢯꢧ ꢥꢧ ꢩꢨ ꢪꢥ ꢡꢫ ꢨꢡ ꢩ ꢭꢧ ꢨꢧ ꢧꢢ ꢭ ꢤꢨ ꢯꢪꢥ  
Copyright 1997, Texas Instruments Incorporated  
ꢩ ꢯꢧ ꢢ ꢱꢪ ꢤꢥ ꢭꢡ ꢫ ꢩ ꢤꢢ ꢨꢡ ꢢꢮꢪ ꢨ ꢯꢪ ꢫ ꢪ ꢬꢥ ꢤꢭ ꢮꢩꢨ ꢫ ꢵ ꢡꢨꢯ ꢤꢮꢨ ꢢꢤꢨ ꢡꢩꢪ ꢳ  
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢂꢊ  
ꢀꢁ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
DUAL-IN-LINE MEMORY MODULE  
(TOP VIEW)  
TM4xJ64xPU TM8xJ64xPU  
(SIDE VIEW) (SIDE VIEW)  
PIN NOMENCLATURE − TMxxJ64KPU  
A[0:11]  
A[0:9]  
DQ[0:63]  
CAS[0:7]  
RAS0 and RAS1  
WE0  
Row Address Inputs  
Column Address Inputs  
Data In/Data Out  
Column-Address Strobe  
Row-Address Strobe  
Write Enable  
1
OE0  
Output Enable  
SDA  
SCL  
Serial PD Address/Data  
Serial PD Clock  
NC  
No-Connect Pin  
3.3-V Supply  
Ground  
V
DD  
V
SS  
PIN NOMENCLATURE − TMxxJ64NPU  
A[0:12]  
A[0:8]  
DQ[0:63]  
CAS[0:7]  
RAS0 and RAS1  
WE0  
Row Address Inputs  
Column Address Inputs  
Data In/Data Out  
Column-Address Strobe  
Row-Address Strobe  
Write Enable  
59  
61  
OE0  
Output Enable  
SDA  
SCL  
Serial PD Address/Data  
Serial PD Clock  
NC  
No-Connect Pin  
3.3-V Supply  
Ground  
V
DD  
V
SS  
143  
2
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢃꢄ  
ꢁꢂ  
ꢀꢁ  
ꢃꢄ  
ꢁꢕ  
ꢁꢕ  
ꢕꢕ  
ꢓꢑ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
Pin Assignments  
PIN  
PIN  
PIN  
PIN  
NO.  
1
NAME  
NO.  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
57  
58  
59  
60  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
NAME  
NO.  
73  
NAME  
OE0  
NC  
NO.  
109  
110  
111  
112  
113  
114  
115  
116  
117  
118  
119  
120  
121  
122  
123  
124  
125  
126  
127  
128  
129  
130  
131  
132  
133  
134  
135  
136  
137  
138  
139  
140  
141  
142  
143  
144  
NAME  
V
V
DQ8  
A9  
SS  
2
DQ40  
DQ9  
74  
A12  
A10  
NC  
SS  
3
DQ0  
DQ32  
DQ1  
75  
V
V
SS  
4
DQ41  
DQ10  
DQ42  
DQ11  
DQ43  
76  
SS  
5
77  
NC  
NC  
NC  
NC  
V
V
DD  
6
DQ33  
DQ2  
78  
DD  
7
79  
CAS2  
CAS6  
CAS3  
CAS7  
8
DQ34  
DQ3  
80  
9
V
V
81  
V
DD  
DD  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
DQ35  
82  
V
DD  
DD  
V
V
DQ12  
DQ44  
DQ13  
DQ45  
DQ14  
DQ46  
DQ15  
DQ47  
83  
DQ16  
DQ48  
DQ17  
DQ49  
DQ18  
DQ50  
DQ19  
DQ51  
V
V
DD  
SS  
84  
DD  
SS  
DQ4  
DQ36  
DQ5  
85  
DQ24  
DQ56  
DQ25  
DQ57  
DQ26  
DQ58  
DQ27  
DQ59  
86  
87  
DQ37  
DQ6  
88  
89  
DQ38  
DQ7  
90  
V
91  
V
SS  
SS  
SS  
SS  
DQ39  
V
92  
V
V
V
NC  
NC  
NC  
NC  
NC  
NC  
93  
DQ20  
DQ52  
DQ21  
DQ53  
DQ22  
DQ54  
DQ23  
DQ55  
V
V
SS  
DD  
94  
SS  
DD  
CAS0  
CAS4  
CAS1  
CAS5  
95  
DQ28  
DQ60  
DQ29  
DQ61  
DQ30  
DQ62  
DQ31  
DQ63  
96  
97  
98  
V
V
DD  
99  
DD  
DD  
V
V
DD  
100  
101  
102  
103  
104  
105  
106  
107  
108  
A0  
A3  
A1  
A4  
A2  
A5  
NC  
NC  
V
V
DD  
DD  
WE0  
NC  
A6  
A7  
V
V
SS  
SS  
RAS0  
NC  
A8  
SDA  
SCL  
A11  
V
SS  
RAS1  
NC  
V
V
SS  
SS  
DD  
DD  
V
SS  
V
V
3
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢁꢕ  
ꢖꢀ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
small-outline dual-in-line memory module and components  
The small-outline dual-in-line memory module and components include:  
D
D
D
PC substrate: 1,10 " 0,1 mm (0.04 inch) nominal thickness  
Bypass capacitors: Multilayer ceramic  
Contact area: Nickel plate and gold plate over copper  
The following table shows the SODIMM modules and devices (Ux/UBx) that are used.  
Table 1. Component Table  
MODULE  
DEVICES USED  
U[0:3]  
TM4xJ64xPU  
TM8xJ64xPU  
U[0:3], UB[0:3]  
functional block diagram for the TMxxJ64xPU  
RAS0  
WE0  
OE0  
RAS1  
CS  
LCAS  
W
RAS  
RAS  
RAS  
RAS  
CS  
LCAS  
DQ[0:7]  
W
RAS  
RAS  
RAS  
RAS  
CAS0  
DQ[0:7]  
DQ[0:7]  
U0  
UB0  
CAS1  
DQ[8:15]  
UCAS  
DQ[8:15]  
UCAS  
DQ[8:15]  
CS  
LCAS  
W
CS  
W
CAS2  
DQ[16:23]  
LCAS  
DQ[0:7]  
DQ[0:7]  
U1  
UB1  
CAS3  
DQ[24:31]  
UCAS  
DQ[8:15]  
UCAS  
DQ[8:15]  
CS  
W
CS  
W
CAS4  
DQ[32:39]  
LCAS  
DQ[0:7]  
LCAS  
DQ[0:7]  
U2  
UB2  
SPD EEPROM  
CAS5  
DQ[40:47]  
UCAS  
UCAS  
SCL  
SDA  
DQ[8:15]  
DQ[8:15]  
A0  
A1  
A2  
V
SS  
CS  
W
CS  
W
CAS6  
DQ[48:55]  
LCAS  
LCAS  
DQ[0:7]  
DQ[0:7]  
A[0:12] U[0:3], UB[0:3]  
A[0:12]  
U3  
UB3  
LEGEND: SPD = Serial Presence Detect  
CS = Chip Select  
CAS7  
DQ[56:63]  
UCAS  
UCAS  
DQ[8:15]  
DQ[8:15]  
4
A12 is not used in TM4xJ64KPU, TM8xP64KPU  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢃꢄ  
ꢁꢂ  
ꢓꢑ  
ꢀꢁ  
ꢃꢄ  
ꢁꢕ  
ꢕꢕ  
ꢓꢑ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
absolute maximum ratings over ambient temperature range (unless otherwise noted)  
Supply voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V to 4.6 V  
DD  
Voltage range on any pin (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . − 0.5 V to 4.6 V  
Short-circuit output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA  
Power dissipation: TM4xJ64xPU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 W  
TM8xJ64xPU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 W  
Ambient temperature range, T . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
A
stg  
Storage temperature range, T  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . − 55°C to 125°C  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values are with respect to V  
.
SS  
recommended operating conditions  
MIN NOM  
MAX  
UNIT  
V
V
V
V
V
V
Supply voltage  
3
3.3  
0
3.6  
DD  
SS  
IH  
Supply voltage  
V
High-level input voltage  
2
2
V
DD  
+ 0.3  
V
-SPD High-level input voltage for the SPD device  
Low-level input voltage  
5.5  
0.8  
70  
V
IH  
IL  
0.3  
0
V
T
A
Ambient temperature  
°C  
5
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢂꢊ  
ꢀꢁ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
electrical characteristics over recommended ranges of supply voltage and ambient temperature  
(unless otherwise noted)  
TM4xJ64KPU  
’4xJ64KPU-40  
’4xJ64KPU-50  
’4xJ64KPU-60  
PARAMETER  
UNIT  
TEST CONDITIONS  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
High-level  
output  
voltage  
I
I
I
I
= − 2 mA  
LVTTL  
2.4  
2.4  
2.4  
OH  
OH  
OL  
OL  
V
V
V
OH  
= − 100 µA  
= 2 mA  
LVCMOS  
LVTTL  
V
0.2  
V
0.2  
V
0.2  
DD  
DD  
DD  
Low-level  
output  
voltage  
0.4  
0.2  
0.4  
0.2  
0.4  
0.2  
V
OL  
= 100 µA  
LVCMOS  
Input current  
(leakage)  
V
= 3.6 V,  
V = 0 V to 3.9 V,  
DD  
All others = 0 V to V  
I
I
10  
10  
10  
10  
10  
10  
µA  
µA  
I
DD  
Output  
current  
(leakage)  
V
= 3.6 V,  
V = 0 V to V  
O DD  
,
DD  
CASx high  
I
O
Average  
read- or  
write-cycle  
current  
‡§  
I
V
= 3.6 V,  
DD  
Minimum cycle  
640  
4
520  
4
440  
4
mA  
mA  
CC1  
V
IH  
= 2 V LVTTL),  
After one memory cycle,  
RASx and CASx high  
Average  
standby  
current  
I
CC2  
V
= V − 0.2 V  
DD  
IH  
(LVCMOS),  
’4EJ64KPU  
’4FJ64KPU  
2
2
2
mA  
mA  
After one memory cycle,  
RASx and CASx high  
.6  
.6  
.6  
RASx-only  
refresh,  
average  
refresh  
V
= 3.6 V,  
Minimum cycle,  
CASx high  
DD  
RASx cycling,  
§
I
640  
520  
440  
CC3  
curren  
V
= 3.6 V,  
t
= MIN,  
Average  
EDO current  
DD  
RASx low,  
HPC  
‡¶  
I
I
600  
640  
480  
520  
400  
440  
mA  
mA  
CC4  
CASx cycling  
Average  
CBR refresh  
current  
V
DD  
= 3.6 V,  
Minimum cycle,  
CC5  
RASx low after CASx low  
Average  
self-refresh  
current  
CASx < 0.2 V,  
Measured after t  
RASx < 0.2 V,  
min  
#
I
I
1.2  
1.6  
1.2  
1.6  
1.2  
1.6  
mA  
mA  
CC6  
RASS  
Average  
battery  
back-up  
operating  
current,  
CBR only  
t
V
= 31.25 µs,  
DD  
t
300 ns,  
RC  
RAS  
− 0.2 V V 3.9 V,  
IH  
#
CC10  
0 V V 0.2 V, WE0 and OE0 = V  
Address and data stable  
,
IL  
IH  
For conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
Measured with outputs open  
§
#
Measured with a maximum of one address change while RASx = V  
IL  
Measured with a maximum of one address change during each EDO cycle, t  
For TM4FJ64KPU only  
HPC  
6
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢃꢄ  
ꢎꢂ  
ꢀꢁ  
ꢁꢕ  
ꢕꢕ  
ꢓꢑ  
ꢖꢀ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
electrical characteristics over recommended ranges of supply voltage and ambient temperature  
(unless otherwise noted) (continued)  
TM4xJ64NPU  
’4xJ64NPU-40  
’4xJ64NPU-50  
’4xJ64NPU-60  
PARAMETER  
UNIT  
TEST CONDITIONS  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
High-level  
output  
voltage  
I
I
I
I
= − 2 mA  
LVTTL  
2.4  
2.4  
2.4  
OH  
OH  
OL  
OL  
V
V
V
OH  
= − 100 µA  
= 2 mA  
LVCMOS  
LVTTL  
V
0.2  
V
0.2  
V
0.2  
DD  
DD  
DD  
Low-level  
output  
voltage  
0.4  
0.2  
0.4  
0.2  
0.4  
0.2  
V
OL  
= 100 µA  
LVCMOS  
Input current  
(leakage)  
V
= 3.6 V,  
V = 0 V to 3.9 V,  
DD  
All others = 0 V to V  
I
I
10  
10  
10  
10  
10  
10  
µA  
µA  
I
DD  
Output  
current  
(leakage)  
V
= 3.6 V,  
V = 0 V to V  
O DD  
,
DD  
CASx high  
I
O
Average  
read- or  
write-cycle  
current  
‡§  
I
V
= 3.6 V,  
DD  
Minimum cycle  
540  
4
440  
4
400  
4
mA  
mA  
CC1  
V
IH  
= 2 V (LVTTL),  
After one memory cycle,  
RASx and CASx high  
Average  
standby  
current  
I
CC2  
V
= V − 0.2 V  
DD  
IH  
(LVCMOS),  
’4EJ64NPU  
’4FJ64NPU  
2
2
2
mA  
mA  
After one memory cycle,  
RAS and CASx high  
.6  
.6  
.6  
RASx-only  
refresh,  
average  
refresh  
V
= 3.6 V,  
Minimum cycle,  
CASx high  
DD  
RASx cycling,  
§
I
540  
440  
400  
CC3  
curren  
V
= 3.6 V,  
t
= MIN,  
Average  
EDO current  
DD  
RASx low,  
HPC  
‡¶  
I
I
560  
640  
440  
520  
360  
440  
mA  
mA  
CC4  
CASx cycling  
Average  
CBR refresh  
current  
V
DD  
= 3.6 V,  
Minimum cycle,  
CC5  
RASx low after CASx low  
Average  
self-refresh  
current  
CASx < 0.2 V,  
Measured after t  
RASx < 0.2 V,  
min  
#
I
I
1.2  
1.6  
1.2  
1.6  
1.2  
1.6  
mA  
mA  
CC6  
RASS  
Average  
battery  
back-up  
operating  
current, CBR  
only  
t
V
= 31.25 µs,  
DD  
t
300 ns,  
RC  
RAS  
− 0.2 V V 3.9 V,  
IH  
#
CC10  
0 V V 0.2 V, WE0 and OE0 = V  
Address and data stable  
,
IL  
IH  
For conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
Measured with outputs open  
§
#
Measured with a maximum of one address change while RASx = V  
IL  
Measured with a maximum of one address change during each EDO cycle, t  
For TM4FJ64NPU only  
HPC  
7
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ꢂꢊ  
ꢀꢁ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
electrical characteristics over recommended ranges of supply voltage and ambient temperature  
(unless otherwise noted) (continued)  
TM8xJ64KPU  
’8xJ64KPU-40  
’8xJ64KPU-50  
’8xJ64KPU-60  
PARAMETER  
UNIT  
TEST CONDITIONS  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
High-level  
output  
voltage  
I
I
I
I
= − 2 mA  
LVTTL  
2.4  
2.4  
2.4  
OH  
OH  
OL  
OL  
V
V
V
OH  
= − 100 µA  
= 2 mA  
LVCMOS  
LVTTL  
V
0.2  
V
0.2  
V
0.2  
DD  
DD  
DD  
Low-level  
output  
voltage  
0.4  
0.2  
0.4  
0.2  
0.4  
0.2  
V
OL  
= 100 µA  
LVCMOS  
Input current  
(leakage)  
V
= 3.6 V,  
V = 0 V to 3.9 V,  
DD  
All others = 0 V to V  
I
I
10  
10  
10  
10  
10  
10  
µA  
µA  
I
DD  
Output  
current  
(leakage)  
V
= 3.6 V,  
V = 0 V to V  
O DD  
,
DD  
CASx high  
I
O
Average  
read- or  
write-cycle  
current  
‡§  
I
V
= 3.6 V,  
DD  
Minimum cycle  
644  
8
524  
8
444  
8
mA  
mA  
CC1  
V
IH  
= 2 V (LVTTL),  
After one memory cycle,  
RASx and CASx high  
Average  
standby  
current  
I
CC2  
V
= V − 0.2 V  
DD  
IH  
(LVCMOS),  
’8EJ64KPU  
’8FJ64KPU  
4
4
4
mA  
mA  
After one memory cycle,  
RASx and CASx high  
1.2  
1.2  
1.2  
RASx-only  
refresh,  
average  
refresh  
V
= 3.6 V,  
Minimum cycle,  
CASx high  
DD  
RASx cycling,  
§
I
644  
524  
444  
CC3  
curren  
V
= 3.6 V,  
t
= MIN,  
Average  
EDO current  
DD  
RASx low,  
HPC  
‡¶  
I
I
604  
644  
484  
524  
404  
444  
mA  
mA  
CC4  
CASx cycling  
Average  
CBR refresh  
current  
V
DD  
= 3.6 V,  
Minimum cycle,  
CC5  
RASx low after CASx low  
Average  
self-refresh  
current  
CASx < 0.2 V,  
Measured after t  
RASx < 0.2 V,  
min  
#
I
I
2.4  
3.2  
2.4  
3.2  
2.4  
3.2  
mA  
mA  
CC6  
RASS  
Average  
battery  
back-up  
operating  
current,  
CBR only  
t
V
= 31.25 µs,  
DD  
t
300 ns,  
RC  
RAS  
− 0.2 V V 3.9 V,  
IH  
#
CC10  
0 V V 0.2 V, WE0 and OE0 = V  
Address and data stable  
,
IL  
IH  
For conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
Measured with outputs open  
§
#
Measured with a maximum of one address change while RASx = V  
IL  
Measured with a maximum of one address change during each EDO cycle, t  
For TM8FJ64KPU only  
HPC  
8
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ꢀꢁ  
ꢁꢕ  
ꢓꢑ  
ꢖꢀ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
electrical characteristics over recommended ranges of supply voltage and ambient temperature  
(unless otherwise noted) (continued)  
TM8xJ64NPU  
’8xJ64NPU-40  
’8xJ64NPU-50  
’8xJ64NPU-60  
PARAMETER  
UNIT  
TEST CONDITIONS  
MIN  
MAX  
MIN  
MAX  
MIN  
MAX  
High-level  
output  
voltage  
I
I
I
I
= − 2 mA  
LVTTL  
2.4  
2.4  
2.4  
OH  
OH  
OL  
OL  
V
V
V
OH  
= − 100 µA  
= 2 mA  
LVCMOS  
LVTTL  
V
0.2  
V
0.2  
V
0.2  
DD  
DD  
DD  
Low-level  
output  
voltage  
0.4  
0.2  
0.4  
0.2  
0.4  
0.2  
V
OL  
= 100 µA  
LVCMOS  
Input current  
(leakage)  
V
= 3.6 V,  
V = 0 V to 3.9 V,  
DD  
All others = 0 V to V  
I
I
10  
10  
10  
10  
10  
10  
µA  
µA  
I
DD  
Output  
current  
(leakage)  
V
= 3.6 V,  
V = 0 V to V  
O DD  
,
DD  
CASx high  
I
O
Average  
read- or  
write-cycle  
current  
‡§  
I
V
= 3.6 V,  
DD  
Minimum cycle  
544  
8
444  
8
404  
8
mA  
mA  
CC1  
V
IH  
= 2 V (LVTTL),  
After one memory cycle,  
RASx and CASx high  
Average  
standby  
current  
I
CC2  
V
= V − 0.2 V  
DD  
IH  
(LVCMOS),  
’8EJ64NPU  
’8FJ64NPU  
4
4
4
mA  
mA  
After one memory cycle,  
RASx and CASx high  
1.2  
1.2  
1.2  
RASx-only  
refresh,  
average  
refresh  
V
= 3.6 V,  
Minimum cycle,  
CASx high  
DD  
RASx cycling,  
§
I
544  
444  
404  
CC3  
curren  
V
= 3.6 V,  
t
= MIN,  
Average  
EDO current  
DD  
RASx low,  
HPC  
‡¶  
I
I
564  
644  
444  
524  
364  
444  
mA  
mA  
CC4  
CASx cycling  
Average  
CBR refresh  
current  
V
DD  
= 3.6 V,  
Minimum cycle,  
CC5  
RASx low after CASx low  
Average  
self-refresh  
current  
CASx < 0.2 V,  
Measured after t  
RASx < 0.2 V,  
min  
#
I
I
2.4  
3.2  
2.4  
3.2  
2.4  
3.2  
mA  
mA  
CC6  
RASS  
Average  
battery  
back-up  
operating  
current,  
CBR only  
t
V
= 31.25 µs,  
DD  
t
300 ns,  
RC  
RAS  
− 0.2 V V 3.9 V,  
IH  
#
CC10  
0 V V 0.2 V, WE0 and OE0 = V  
Address and data stable  
,
IL  
IH  
For conditions shown as MIN/MAX, use the appropriate value specified in the timing requirements.  
Measured with outputs open  
§
#
Measured with a maximum of one address change while RAS = V  
IL  
Measured with a maximum of one address change during each EDO cycle, t  
For TM8FJ64NPU only  
HPC  
9
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SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
capacitance over recommended ranges of supply voltage and ambient temperature,  
f = 1 MHz (see Note 2)  
’4xJ64xPU  
’8xJ64xPU  
PARAMETER  
UNIT  
MIN MAX  
MIN MAX  
C
C
C
C
C
C
Input capacitance, A0A12  
22  
16  
9
42  
30  
9
pF  
pF  
pF  
pF  
pF  
pF  
i(A)  
Input capacitance, OE0  
Input capacitance, CASx  
Input capacitance, RASx  
Input capacitance, WE0  
Output capacitance  
i(OE)  
i(CAS)  
i(RAS)  
i(W)  
16  
16  
9
16  
30  
16  
o
C
C
Input/output capacitance, SDA input  
9
7
9
7
pF  
pF  
i/o(SDA)  
i(SPD)  
Input capacitance,SPD inputs (except SDA)  
NOTE 2:  
V
DD  
= NOM supply voltage 10%, and the bias on pins under test is 0 V.  
switching characteristics over recommended ranges of supply voltage and ambient temperature  
(see Note 3)  
’xxJ64xPU-40 ’xxJ64xPU-50 ’xxJ64xPU-60  
PARAMETER  
UNIT  
MIN  
MAX  
20  
MIN  
MAX  
25  
MIN  
MAX  
30  
t
t
t
t
t
t
t
t
t
t
Access time from column address (see Note 4)  
Access time from CASx (see Note 4)  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
AA  
11  
13  
15  
CAC  
CPA  
RAC  
OEA  
CLZ  
OEZ  
REZ  
CEZ  
WEZ  
Access time from CASx precharge (see Note 4)  
Access time from RASx (see Note 4)  
22  
28  
35  
40  
50  
60  
Access time from OE0 (see Note 4)  
11  
13  
15  
Delay time, CASx to output in the low-impedance state  
Output buffer turnoff delay from OE0 (see Note 5)  
Output buffer turnoff delay from RASx (see Note 5)  
Output buffer turnoff delay from CASx (see Note 5)  
Output buffer turnoff delay from WE0 (see Note 5)  
0
3
3
3
3
0
3
3
3
3
0
3
3
3
3
11  
11  
11  
11  
13  
13  
13  
13  
15  
15  
15  
15  
NOTES: 3. With ac parameters, it is assumed that t = 2 ns.  
T
4. Access times are measured with output reference levels of V  
= 2 V and V = 0.8 V.  
OL  
OH  
5. The MAX specifications of t  
, t  
, t  
and t are specified when the output is no longer driven. Data-in should not be driven  
REZ CEZ WEZ  
OEZ  
until one of the applicable maximum specifications is satsified.  
EDO timing requirements (see Note 3)  
’xxJ64xPU-40  
’xxJ64xPU-50  
’xxJ64xPU-60  
UNIT  
MIN  
16  
47  
32  
5
MAX  
MIN  
20  
57  
40  
5
MAX  
MIN  
25  
68  
48  
5
MAX  
t
t
t
t
t
t
t
t
t
t
Cycle time, EDO page-mode read or write  
Cycle time, EDO read-write  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
HPC  
PRWC  
CSH  
CHO  
DOH  
CAS  
WPE  
CP  
Delay time, RASx active to CASx precharge  
Hold time, OE0 from CASx  
Hold time, output from CASx active  
Pulse duration, CASx active (see Note 6)  
Pulse duration, WE0 (output disable only)  
Pulse duration, CASx precharge  
5
5
5
6
10000  
8
10000  
10  
5
10000  
5
5
6
8
10  
5
Setup time, OE0 before CASx  
5
5
OCH  
OEP  
Precharge time, OE0 (output disable only)  
5
5
5
NOTES: 3. With ac parameters, it is assumed that t = 2 ns.  
T
6. In a read-write cycle, t  
CWD  
and t must be observed.  
CWL  
10  
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SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
ac timing requirements (see Note 3)  
’xxJ64xPU-40  
’xxJ64xPU-50  
’xxJ64xPU-60  
UNIT  
MIN  
69  
MAX  
MIN  
84  
MAX  
MIN  
104  
135  
MAX  
t
t
t
t
t
t
t
t
t
t
t
t
Cycle time, read  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
RC  
Cycle time, read-write  
92  
111  
RWC  
RASP  
RAS  
RP  
Pulse duration, RASx active, page mode (see Note 7)  
40 100 000  
50 100 000  
60 100 000  
Pulse duration, RASx active, nonpage mode (see Note 7)  
Pulse duration, RASx precharge  
40  
25  
6
10 000  
50  
30  
8
10 000  
60  
40  
10  
0
10 000  
Pulse duration, write command  
WP  
Setup time, column address  
0
0
ASC  
ASR  
DS  
Setup time, row address  
0
0
0
Setup time, data in (see Note 8)  
0
0
0
Setup time, read command  
0
0
0
RCS  
CWL  
RWL  
Setup time, write command before CASx precharge  
Setup time, write command before RASx precharge  
6
8
10  
10  
6
8
Setup time, write command before CASx active  
(early-write only)  
t
0
0
0
ns  
WCS  
t
t
t
t
t
t
t
Setup time, write before RASx active (CBR refresh only)  
Setup time, CASx referenced to RASx (CBR refresh only)  
Hold time, column address  
5
5
6
6
6
0
0
5
5
8
8
8
0
0
5
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
WRP  
CSR  
CAH  
DH  
10  
10  
10  
0
Hold time, data in (see Note 8)  
Hold time, row address  
RAH  
RCH  
RRH  
Hold time, read command referenced to CASx (see Note 9)  
Hold time, read command referenced to RASx (see Note 9)  
0
Hold time, write command during CASx active  
(early-write only)  
t
6
8
10  
ns  
WCH  
t
t
t
t
t
Hold time, RASx active from CASx precharge  
Hold time, OE0 command  
22  
11  
28  
13  
8
35  
15  
ns  
ns  
ns  
ns  
ns  
RHCP  
OEH  
ROH  
WRH  
CHS  
Hold time, RASx referenced to OE0  
6
10  
Hold time, write after RASx active (CBR refresh only)  
Hold time, CASx active after RASx precharge (self-refresh)  
6
8
10  
− 50  
− 50  
− 50  
Delay time, column address to write command  
(read-write only)  
t
35  
42  
49  
ns  
AWD  
t
t
Delay time, CASx referenced to RASx (CBR refresh only)  
Delay time, CASx precharge to RASx  
6
5
8
5
10  
5
ns  
ns  
CHR  
CRP  
Delay time, CASx to write command  
(read-write operation only)  
t
26  
30  
34  
ns  
CWD  
NOTES: 3. With ac parameters, it is assumed that t = 2 ns.  
T
7. In a read-write cycle, t  
and t must be observed.  
RWD  
RWL  
8. Referenced to the later of CASx or WE0 in write operations  
9. Either t or t must be satisfied for a read cycle.  
RRH RCH  
11  
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SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
ac timing requirements (see Note 3) (continued)  
’xxJ64xPU-40 ’xxJ64xPU-50 ’xxJ64xPU-60  
UNIT  
MIN  
11  
8
MAX  
MIN  
13  
10  
25  
15  
12  
5
MAX  
MIN  
15  
12  
30  
18  
14  
5
MAX  
t
t
t
t
t
t
t
t
t
t
t
Delay time, OE0 to data in  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
ns  
ms  
ms  
ns  
OED  
RAD  
RAL  
Delay time, RASx to column address (see Note 10)  
Delay time, column address to RASx precharge  
Delay time, column address to CASx precharge  
Delay time, RASx to CASx (see Note 10)  
Delay time, RASx precharge to CASx  
20  
25  
30  
20  
12  
10  
5
CAL  
29  
37  
45  
RCD  
RPC  
RSH  
RWD  
CPW  
RASS  
RPS  
Delay time, CASx active to RASx precharge  
Delay time, RASx active to write command (read-write only)  
6
8
10  
79  
54  
100  
110  
55  
37  
100  
70  
67  
45  
100  
90  
Delay time, CASx precharge to write command (read-write only)  
Pulse duration, RASx active, self-refresh (see Note 11)  
Pulse duration, RASx precharge after self refresh  
’xEJ64xPU  
64  
128  
50  
64  
128  
50  
64  
128  
50  
t
Refresh time interval  
REF  
T
’xFJ64xPU  
t
Transition time  
1
1
1
NOTES: 3. With ac parameters, it is assumed that t = 2 ns.  
T
10. The maximum value is specified only to assure access time.  
11. During the period of 10 µs t  
RASS  
100 µs, the device is in transition state from normal operational mode to self-refresh mode.  
12  
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ꢓꢑ  
ꢖꢀ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect  
The serial presence detect (SPD) is contained in a 2K-bit serial EEPROM located on the module. The SPD  
nonvolatile EEPROM contains various data such as module configuration, DRAM organization, and timing  
parameters (see tables below). Only the first 128 bytes are programmed by Texas Instruments, while the  
remaining 128 bytes are available for customer use. Programming is done through an IIC bus using the clock  
(SCL) and data (SDA) signals. All Texas Instruments modules comply with the current JEDEC SPD Standard.  
See the Texas Instruments Serial Presence Detect Technical Reference (literature number SMMU001) for  
further details.  
Tables in this section list the SPD contents as follows:  
Table 2TM4EJ64KPU  
Table 4—TM8EJ64KPU  
Table 6—TM4FJ64KPU  
Table 8—TM8FJ64KPU  
Table 3TM4EJ64NPU  
Table 5—TM8EJ64NPU  
Table 7—TM4FJ64NPU  
Table 9—TM8FJ64NPU  
Table 2. Serial-Presence-Detect Data for the TM4EJ64KPU  
’4EJ64KPU-40  
’4EJ64KPU-50  
’4EJ64KPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
01h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
01h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
01h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
10  
10  
10  
Number of module banks on  
this assembly  
1 bank  
64 bits  
1 bank  
64 bits  
1 bank  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
12  
13  
Refresh rate/type  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
DRAM width, primary DRAM  
x16  
x16  
x16  
Error-checking SDRAM data  
width  
14  
N/A  
00h  
N/A  
00h  
N/A  
00h  
62  
63  
SPD revision  
Rev. 1  
38  
01h  
26h  
Rev. 1  
50  
01h  
32h  
Rev. 1  
62  
01h  
3Eh  
Checksum for bytes 062  
13  
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ꢀꢁ  
ꢁꢕ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 2. Serial-Presence-Detect Data for the TM4EJ64KPU (Continued)  
’4EJ64KPU-40  
’4EJ64KPU-50  
’4EJ64KPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
data  
128−166  
TBD  
TBD  
TBD  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
14  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢃꢄ  
ꢁꢂ  
ꢁꢂ  
ꢎꢂ  
ꢀꢁ  
ꢁꢕ  
ꢁꢕ  
ꢕꢕ  
ꢓꢑ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 3. Serial-Presence-Detect Data for the TM4EJ64NPU  
’4EJ64NPU-40  
’4EJ64NPU-50  
’4EJ64NPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
08h  
02h  
0Dh  
09h  
01h  
256 bytes  
08h  
02h  
0Dh  
09h  
01h  
256 bytes  
08h  
02h  
0Dh  
09h  
01h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
EDO  
13  
EDO  
13  
EDO  
13  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
9
9
9
Number of module banks on  
this assembly  
1 bank  
64 bits  
1 bank  
64 bits  
1 bank  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
12  
13  
Refresh rate/type  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
DRAM width, primary DRAM  
x16  
x16  
x16  
Error-checking SDRAM data  
width  
14  
N/A  
00h  
N/A  
00h  
N/A  
00h  
62  
63  
SPD revision  
Rev. 1  
38  
01h  
26h  
Rev. 1  
50  
01h  
32h  
Rev. 1  
62  
01h  
3Eh  
Checksum for bytes 062  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
data  
128−166  
TBD  
TBD  
TBD  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
15  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢂꢊ  
ꢁꢕ  
ꢖꢀ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 4. Serial-Presence-Detect Data for the TM8EJ64KPU  
’8EJ64KPU-40  
’8EJ64KPU-50  
’8EJ64KPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
02h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
02h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
02h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
10  
10  
10  
Number of module banks on  
this assembly  
2 banks  
64 bits  
2 banks  
64 bits  
2 banks  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
12  
13  
Refresh rate/type  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
DRAM width, primary DRAM  
x16  
x16  
x16  
Error-checking SDRAM data  
width  
14  
N/A  
00h  
N/A  
00h  
N/A  
00h  
62  
63  
SPD revision  
Rev. 1  
39  
01h  
27h  
Rev. 1  
51  
01h  
33h  
Rev. 1  
63  
01h  
3Fh  
Checksum for bytes 062  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
data  
128−166  
TBD  
TBD  
TBD  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
16  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢃꢄ  
ꢁꢂ  
ꢎꢂ  
ꢓꢑ  
ꢃꢄ  
ꢁꢕ  
ꢓꢑ  
ꢖꢀ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 5. Serial-Presence-Detect Data for the TM8EJ64NPU  
8EJ64NPU-40  
’8EJ64NPU-50  
’8EJ64NPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
08h  
02h  
0Dh  
09h  
02h  
256 bytes  
08h  
02h  
0Dh  
09h  
02h  
256 bytes  
08h  
02h  
0Dh  
09h  
02h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
EDO  
13  
EDO  
13  
EDO  
13  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
9
9
9
Number of module banks on  
this assembly  
2 banks  
64 bits  
2 banks  
64 bits  
2 banks  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
12  
13  
Refresh rate/type  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
15.6 µs  
00h  
10h  
DRAM width, primary DRAM  
x16  
x16  
x16  
Error-checking SDRAM data  
width  
14  
N/A  
00h  
N/A  
00h  
N/A  
00h  
62  
63  
SPD revision  
Rev. 1  
39  
01h  
27h  
Rev. 1  
51  
01h  
33h  
Rev. 1  
63  
01h  
3Fh  
Checksum for bytes 062  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
data  
128−166  
TBD  
TBD  
TBD  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
17  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢀꢁ  
ꢁꢕ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 6. Serial-Presence-Detect Data for the TM4FJ64KPU  
’4FJ64KPU-40  
’4FJ64KPU-50  
’4FJ64KPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
01h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
01h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
01h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
10  
10  
10  
Number of module banks on  
this assembly  
1 banks  
64 bits  
1 banks  
64 bits  
1 banks  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
12  
13  
14  
Refresh rate/type  
80h  
10h  
00h  
80h  
10h  
00h  
80h  
10h  
00h  
DRAM width, primary DRAM  
x16  
N/A  
x16  
N/A  
x16  
N/A  
Error-checking SDRAM data  
width  
62  
63  
SPD revision  
Rev. 1  
166  
01h  
A6h  
Rev. 1  
178  
01h  
B2h  
Rev. 1  
190  
01h  
Checksum for bytes 062  
BEh  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
128−166  
TBD  
TBD  
TBD  
data  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
18  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢁꢂ  
ꢁꢂ  
ꢎꢂ  
ꢃꢄ  
ꢁꢕ  
ꢁꢕ  
ꢖꢀ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 7. Serial-Presence-Detect Data for the TM4FJ64NPU  
’4FJ64NPU-40  
’4FJ64NPU-50  
’4FJ64NPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
08h  
02h  
0Dh  
09h  
01h  
256 bytes  
08h  
02h  
0Dh  
09h  
01h  
256 bytes  
08h  
02h  
0Dh  
09h  
01h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
EDO  
13  
EDO  
13  
EDO  
13  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
9
9
9
Number of module banks on  
this assembly  
1 bank  
64 bits  
1 bank  
64 bits  
1 bank  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
12  
13  
14  
Refresh rate/type  
80h  
10h  
00h  
80h  
10h  
00h  
80h  
10h  
00h  
DRAM width, primary DRAM  
x16  
N/A  
x16  
N/A  
x16  
N/A  
Error-checking SDRAM data  
width  
62  
63  
SPD revision  
Rev. 1  
166  
01h  
A6h  
Rev. 1  
178  
01h  
B2h  
Rev. 1  
190  
01h  
Checksum for bytes 062  
BEh  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
128−166  
TBD  
TBD  
TBD  
data  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
19  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢂꢊ  
ꢀꢁ  
ꢖꢀ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 8. Serial-Presence-Detect Data for the TM8FJ64KPU  
’8FJ64KPU-40  
’8FJ64KPU-50  
’8FJ64KPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
02h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
02h  
256 bytes  
EDO  
12  
08h  
02h  
0Ch  
0Ah  
02h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
10  
10  
10  
Number of module banks on  
this assembly  
2 banks  
64 bits  
2 banks  
64 bits  
2 banks  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
SODIMM configuration type  
t
= 40 ns  
= 11 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
t
CAC  
CAC  
CAC  
11  
(non-parity,  
parity,  
error  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
12  
13  
14  
Refresh rate/type  
80h  
10h  
00h  
80h  
10h  
00h  
80h  
10h  
00h  
DRAM width, primary DRAM  
x16  
N/A  
x16  
N/A  
x16  
N/A  
Error-checking SDRAM data  
width  
62  
63  
SPD revision  
Rev. 1  
167  
01h  
A7h  
Rev. 1  
179  
01h  
B3h  
Rev. 1  
191  
01h  
BFh  
Checksum for bytes 062  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
128−166  
TBD  
TBD  
TBD  
data  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
20  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢃꢄ  
ꢁꢂ  
ꢃꢄ  
ꢁꢕ  
ꢁꢕ  
ꢕꢕ  
ꢓꢑ  
ꢖꢀ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
serial presence detect (continued)  
Table 9. Serial-Presence-Detect Data for the TM8FJ64NPU  
8FJ64NPU-40  
’8FJ64NPU-50  
’8FJ64NPU-60  
BYTE  
NO.  
FUNCTION DESCRIBED  
ITEM  
DATA  
ITEM  
DATA  
ITEM  
DATA  
Defines number of bytes written  
into serial memory during  
module manufacturing  
0
128 bytes  
80h  
128 bytes  
80h  
128 bytes  
80h  
Total number of bytes of SPD  
memory device  
1
2
3
4
5
256 bytes  
08h  
02h  
0Dh  
09h  
02h  
256 bytes  
08h  
02h  
0Dh  
09h  
02h  
256 bytes  
08h  
02h  
0Dh  
09h  
02h  
Fundamental memory type  
(FPM, EDO, SDRAM)  
EDO  
13  
EDO  
13  
EDO  
13  
Number of row addresses on  
this assembly  
Number of column addresses  
on this assembly  
9
9
9
Number of module banks on  
this assembly  
2 banks  
64 bits  
2 banks  
64 bits  
2 banks  
64 bits  
6
7
Data width of this assembly  
Data width continuation  
40h  
00h  
40h  
00h  
40h  
00h  
Voltage interface standard of  
this assembly  
8
LVTTL  
01h  
LVTTL  
01h  
LVTTL  
01h  
9
RASx access time of module  
CASx access time of module  
t
t
= 40 ns  
= 19 ns  
28h  
0Bh  
t
t
= 50 ns  
= 13 ns  
32h  
0Dh  
t
t
= 60 ns  
= 15 ns  
3Ch  
0Fh  
RAC  
RAC  
RAC  
10  
CAC  
CAC  
CAC  
DIMM  
(non-parity,  
configuration  
parity,  
type  
error  
11  
Non-parity  
00h  
Non-parity  
00h  
Non-parity  
00h  
correcting code [ECC])  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
15.6 µs/self-  
refresh  
12  
13  
14  
Refresh rate/type  
80h  
10h  
00h  
80h  
10h  
00h  
80h  
10h  
00h  
DRAM width, primary DRAM  
x16  
N/A  
x16  
N/A  
x16  
N/A  
Error-checking SDRAM data  
width  
62  
63  
SPD revision  
Rev. 1  
167  
01h  
A7h  
Rev. 1  
179  
01h  
B3h  
Rev. 1  
191  
01h  
BFh  
Checksum for bytes 062  
Manufacturer’s JEDEC ID code  
per JEP-106E  
64−71  
97h  
9700...00h  
97h  
9700...00h  
97h  
9700...00h  
72  
73−90  
91  
Manufacturing location  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
TBD  
Manufacturer’s part number  
Die revision code  
PCB revision code  
92  
93−94  
95−98  
Manufacturing date  
Assembly serial number  
99−125 Manufacturer specific data  
126−127 Vendor specific data  
System integrator’s specific  
128−166  
TBD  
TBD  
TBD  
data  
167−255 Open  
TBD indicates values are determined at manufacturing time and are module dependent.  
These TBD values are determined and programmed by the customer (optional).  
21  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢀꢁ  
ꢁꢕ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
device symbolization (TM4EJ64KPU illustrated)  
TM4EJ64KPU  
-SS  
YYMMT  
YY = Year Code  
MM = Month Code  
T = Assembly Site Code  
-SS = Speed Code  
NOTES: A. Location of symbolization may vary.  
22  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
ꢁꢂ  
ꢁꢂ  
ꢀꢁ  
ꢃꢄ  
ꢁꢕ  
ꢕꢕ  
ꢓꢑ  
ꢖꢀ  
ꢗꢔ  
SMMS693A − AUGUST 1997 − REVISED NOVEMBER 1997  
MECHANICAL DATA  
BDM (R-SODIMM-N144)  
SMALL OUTLINE DUAL IN-LINE MEMORY MODULE  
2.665 (67,69)  
2.655 (67,44)  
0.044 (1,12)  
Notch 0.060 (1,52) x 0.158 (4,01) Deep  
0.036 (0,91)  
Notch 0.157 (4,00) x 0.079 (2,00) Deep  
(2 Places)  
0.031 (0,79)  
0.024 (0,61) TYP  
0.098 (2,49)  
0.010 (0,25) MAX  
0.788 (20,00) TYP  
1.005 (25,53)  
0.995 (25,27)  
0.157 (4,00)  
0.126 (3,20)  
0.196 (4,98)  
0.095 (2,41) MAX  
0.150 (3,81) MAX  
(For Double Sided Module Only)  
4088187/A 07/97  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
C. Falls within JEDEC MO-190  
23  
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  
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