TPS65735_16 [TI]

PMU for Active Shutter 3D Glasses;
TPS65735_16
型号: TPS65735_16
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

PMU for Active Shutter 3D Glasses

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TPS65735  
PMU For Active Shutter 3D Glasses  
Data Manual  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Literature Number: SLVSAI6  
June 2011  
TPS65735  
SLVSAI6JUNE 2011  
www.ti.com  
Contents  
1
2
INTRODUCTION .................................................................................................................. 5  
1.1  
1.2  
1.3  
1.4  
Features ...................................................................................................................... 5  
Description ................................................................................................................... 5  
Pin Descriptions ............................................................................................................. 6  
Package Pin Assignments ................................................................................................. 7  
POWER MANAGEMENT CORE .............................................................................................. 8  
2.1  
2.2  
2.3  
2.4  
Recommended Operating Conditions .................................................................................... 8  
Absolute Maximum Ratings ................................................................................................ 8  
Thermal Information ........................................................................................................ 9  
Quiescent Current ........................................................................................................... 9  
2.5  
2.6  
Electrical Characteristics ................................................................................................... 9  
System Operation ......................................................................................................... 13  
2.6.1  
2.6.2  
2.6.3  
System Power Up .............................................................................................. 13  
System Operation Using Push Button Switch .............................................................. 14  
System Operation Using Slider Switch ...................................................................... 15  
2.7  
Linear Charger Operation ................................................................................................ 16  
2.7.1  
Battery and TS Detection ...................................................................................... 16  
Battery Charging ................................................................................................ 16  
2.7.2  
2.7.2.1 Pre-charge .......................................................................................... 17  
2.7.2.2 Charge Termination ................................................................................ 17  
2.7.2.3 Recharge ............................................................................................ 17  
2.7.2.4 Charge Timers ...................................................................................... 17  
Charger Status (nCHG_STAT Pin) ........................................................................... 18  
2.7.3  
2.8  
2.9  
LDO Operation ............................................................................................................. 18  
LDO Internal Current Limit .................................................................................... 18  
Boost Converter Operation ............................................................................................... 19  
2.8.1  
2.9.1  
Boost Thermal Shutdown ...................................................................................... 19  
Boost Load Disconnect ........................................................................................ 20  
2.9.2  
2.10 Full H-Bridge Analog Switches .......................................................................................... 20  
2.10.1 H-Bridge Switch Control ....................................................................................... 20  
2.11 Power Management Core Control ....................................................................................... 22  
2.11.1 SLEEP / Power Control Pin Function ........................................................................ 22  
2.11.2 COMP Pin Functionality ....................................................................................... 22  
2.11.3 SW_SEL Pin Functionality .................................................................................... 23  
2.11.4 SWITCH Pin ..................................................................................................... 23  
2.11.5 Slider Switch Behavior ......................................................................................... 23  
2.11.6 Push-Button Switch Behavior ................................................................................. 24  
APPLICATION INFORMATION ............................................................................................. 26  
3
3.1  
Applications Schematic ................................................................................................... 26  
3.2  
3.3  
Reducing System Quiescent Current (IQ) .............................................................................. 26  
Boost Converter Application Information ............................................................................... 27  
3.3.1  
3.3.2  
3.3.3  
Setting Boost Output Voltage ................................................................................. 27  
Boost Inductor Selection ....................................................................................... 28  
Boost Capacitor Selection ..................................................................................... 28  
3.4  
Bypassing Default Push-Button SWITCH Functionality .............................................................. 28  
2
Contents  
Copyright © 2011, Texas Instruments Incorporated  
TPS65735  
www.ti.com  
SLVSAI6JUNE 2011  
List of Figures  
1-1  
TPS65735 Functional Block Diagram...........................................................................................  
TPS65735 Package Pin Assignments ..........................................................................................  
5
7
1-2  
2-1  
System Power Up State Diagram .............................................................................................. 14  
Push Button State Diagram..................................................................................................... 15  
System Operation Using Slider Switch ........................................................................................ 15  
Thermistor Detection and Circuit .............................................................................................. 16  
Battery Charge Phases.......................................................................................................... 17  
Boost Load Disconnect.......................................................................................................... 20  
H-Bridge States................................................................................................................... 21  
H-Bridge States from Oscilloscope ............................................................................................ 22  
SLEEP Signal to Force System Power Off ................................................................................... 22  
COMP Pin Internal Connection................................................................................................. 22  
SWITCH, Slider Power On-Off Behavior...................................................................................... 24  
SWITCH, Push-button Power On Behavior................................................................................... 25  
SWITCH, Push-button Power Off Behavior................................................................................... 25  
TPS65735 Applications Schematic ............................................................................................ 26  
Reducing System IQ with Addition of a FET .................................................................................. 27  
Boost Feedback Network Schematic .......................................................................................... 27  
Bypassing Default TPS65735 Push Button SWITCH Timing............................................................... 29  
SWITCH Press and SLEEP Signal to Control System Power Off ......................................................... 29  
2-2  
2-3  
2-4  
2-5  
2-10  
2-11  
2-12  
2-13  
2-14  
2-15  
2-16  
2-17  
3-1  
3-2  
3-3  
3-4  
3-5  
Copyright © 2011, Texas Instruments Incorporated  
List of Figures  
3
TPS65735  
SLVSAI6JUNE 2011  
www.ti.com  
List of Tables  
1-1  
1-2  
2-1  
2-2  
2-3  
2-4  
2-5  
2-6  
3-1  
Pin Descriptions ...................................................................................................................  
Pin Absolute Maximum Ratings..................................................................................................  
6
7
nCHG_STAT Functionality ...................................................................................................... 18  
VLDO_SET Functionality........................................................................................................ 18  
H-Bridge States from Inputs .................................................................................................... 21  
Scaling Resistors for COMP Pin Function (VVLDO = 2.2 V) ................................................................. 23  
Scaling Resistors for COMP Pin Function (VVLDO = 3.0 V) ................................................................. 23  
SW_SEL Settings ................................................................................................................ 23  
Recommended RFB1 and RFB2 Values (for IQ(FB) = 5 µA) .................................................................... 28  
4
List of Tables  
Copyright © 2011, Texas Instruments Incorporated  
TPS65735  
www.ti.com  
SLVSAI6JUNE 2011  
PMU For Active Shutter 3D Glasses  
Check for Samples: TPS65735  
1
INTRODUCTION  
Boost Converter  
1.1 Features  
Adjustable Output Voltage: 8 V to 16 V  
Boost Output Internally Connected to  
H-Bridge Analog Switches  
Full H-Bridge Analog Switches  
Controlled by an External Microcontroller for  
System Operation  
Output Pin for Divided Down Battery Voltage  
1
Linear Charger  
Three Charger Phases: Pre-charge, Fast  
Charge, and Charge Termination  
Externally Set Charge Current, Supports up  
to 100 mA  
LED Current Sinks for Power Good and  
Charger Status Indication  
LDO Supply for External Modules  
Useful for ADC or Comparator Input of an MCU  
(Microcontroller, RF Module, IR Module)  
LDO Continuous Output Current up to 30 mA  
1.2 Description  
The TPS65735 is a PMU for active shutter 3D glasses consisting of an integrated power path, linear  
charger, LDO, boost converter, and full H-bridge analog switches for left and right shutter operation in a  
pair of active shutter 3D glasses. In addition to the power devices, a typical 3D glasses system contains  
both a microcontroller and a communications front end (IR, RF, or other) in order to handle the  
communication and synchronous operation along with a 3D television.  
Figure 1-1. TPS65735 Functional Block Diagram  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2011, Texas Instruments Incorporated  
TPS65735  
SLVSAI6JUNE 2011  
www.ti.com  
1.3 Pin Descriptions  
Table 1-1. Pin Descriptions  
PIN NAME  
I/O  
PIN NO.  
DESCRIPTION  
POWER MANAGEMENT CORE (PMIC)  
VIN  
I
20  
15  
AC or USB Adapter Input  
ISET  
I/O  
Fast-Charge Current Setting Resistor  
Pin for 10 kΩ NTC Thermistor Connection  
FLOAT IF THERMISTOR / TS FUNCTION IS NOT USED  
TS  
I
16  
29  
Open-drain Output, Charge Status Indication  
CONNECT TO GROUND IF FUNCTION IS NOT USED  
nCHG_STAT  
O
BAT  
I/O  
O
O
I
18  
19  
21  
22  
25  
26  
11  
13  
10  
8
Charger Power Stage Output and Battery Voltage Sense Input  
Output Terminal to System  
SYS  
VLDO  
LDO Output  
VLDO_SET  
SWITCH  
SW_SEL  
BST_SW  
BST_FB  
BST_OUT  
HBR1  
Sets LDO Output Voltage (see Table 2-2)  
Switch Input for Device Power On/Off  
Selects Type of Switch Connected to SWITCH Pin (see Table 2-6)  
Boost Switch Node  
I
I
O
I
Boost Feedback Node  
O
I
Boost Output  
H-Bridge Input 1 for Right LC Shutter  
H-Bridge Input 2 for Right LC Shutter  
H-Bridge Input 1 for Left LC Shutter  
HBR2  
I
9
HBL1  
I
32  
7
HBL2  
I
H-Bridge Input 2 for Left LC Shutter  
LCRN  
O
O
O
O
6
H-Bridge Output for Right LC Shutter, "Negative" Terminal  
H-Bridge Output for Right LC Shutter, "Positive" Terminal  
H-Bridge Output for Left LC Shutter, "Negative" Terminal  
H-Bridge Output for Left LC Shutter, "Positive" Terminal  
LCRP  
5
LCLN  
4
LCLP  
3
Scaled Battery Voltage for MCU Comparator or ADC Input (Battery Voltage Monitoring)  
DO NOT CONNECT IF COMP FUNCTION IS NOT USED  
COMP  
O
23  
SLEEP  
I/O  
31  
1
Sleep Enable Input from an MCU (edge triggered, only for system shutdown)  
Boost Enable Input from an MCU, High = Boost Enabled  
BST_EN  
CHG_EN  
I
I
30  
Charger Enable Input from an MCU, High = Boost Enabled  
I2C Clock Pin (only used for TI debug and test)  
GROUND PIN IN APPLICATION  
PSCL  
PSDA  
I/O  
I/O  
28  
27  
I2C Data Pin (only used for TI debug and test)  
GROUND PIN IN APPLICATION  
PGNDBST  
AGND  
-
-
-
12  
24  
2
Boost Power Ground  
Analog Ground  
DGND  
Digital Ground  
MISC. AND PACKAGE  
There is an internal electrical connection between the exposed thermal pad and the AGND ground  
pin of the device. The thermal pad must be connected to the same potential as the AGND pin on  
the printed circuit board. Do not use the thermal pad as the primary ground input for the device.  
AGND pin must be connected to ground at all times.  
Thermal PAD  
N/C  
-
-
33  
14, 17  
All N/C should be connected to the main system ground.  
6
INTRODUCTION  
Copyright © 2011, Texas Instruments Incorporated  
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TPS65735  
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SLVSAI6JUNE 2011  
Table 1-2. Pin Absolute Maximum Ratings  
PIN  
VALUE / UNIT  
Input voltage range on all pins (except for VIN, BST_OUT, BST_SW, BST_FB, VLDO, LCLP, LCLN, LCRP,  
LCRN, AGND, DGND, and PGNDBST) with respect to AGND  
-0.3 V to 7.0 V  
VIN with respect to AGND  
-0.3 V to 28.0 V  
-0.3 V to 18.0 V  
-0.3 V to 3.6 V  
BST_OUT, BST_SW, LCLP, LCLN, LCRP, and LCRN with respect to PGNDBST  
BST_FB with respect to PGNDBST, VLDO with respect to DGND  
1.4 Package Pin Assignments  
Figure 1-2. TPS65735 Package Pin Assignments  
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INTRODUCTION  
7
Product Folder Link(s): TPS65735  
TPS65735  
SLVSAI6JUNE 2011  
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2
POWER MANAGEMENT CORE  
2.1 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
SUBSYSTEM AND PARAMETER  
MIN  
NOM  
MAX  
UNIT  
CHARGER / POWER PATH  
VVIN  
Voltage range at charger input pin  
Input current at VIN pin  
Capacitor on VIN pin  
3.7  
28  
200  
10  
V
mA  
µF  
µH  
V
IVIN  
CVIN  
0.1  
0
LVIN  
Inductance at VIN pin  
2
VSYS  
Voltage range at SYS pin  
Output current at SYS pin  
Capacitor on SYS pin  
2.5  
6.4  
100  
10  
ISYS(OUT)  
CSYS  
mA  
µF  
V
0.1  
2.5  
4.7  
320  
VBAT  
Voltage range at BAT pin  
Capacitor on BAT pin  
6.4  
10  
CBAT  
µF  
Ω
REXT(nCHG_STAT)  
Resistor connected to nCHG_STAT pin to limit  
current into pin  
BOOST CONVERTER / H-BRIDGE SWITCHES  
VIN(BST_SW)  
VBST_OUT  
CBST_OUT  
Input voltage range for boost converter  
2.5  
8
6.5  
16  
10  
10  
V
V
Output voltage range for boost converter  
Boost output capacitor  
3.3  
4.7  
µF  
µH  
(1)  
LBST_SW  
Inductor connected between SYS and BST_SW pins  
Device optimized for operation with 10 µH inductor  
LDO  
CVLDO  
External decoupling cap on pin VLDO  
1
10  
µF  
POWER MANAGEMENT CORE CONTROL (LOGIC LEVELS FOR GPIOs)  
VIL(PMIC)  
GPIO low level (BST_EN, CHG_EN, SW_SEL,  
VLDO_SET and to switch H-Bridge inputs to a low, 0,  
level)  
0.4  
V
VIH(PMIC)  
GPIO high level (BST_EN, CHG_EN, SW_SEL,  
VLDO_SET and to switch H-Bridge inputs to a high,  
1, level)  
1.2  
V
(1) See Section 2.9 for information on boost converter inductor selection.  
2.2 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
MINIMUM  
MAXIMUM  
UNITS  
°C  
Operating free-air temperature, TA  
0
0
0
60  
Max Junction Temperature, TJ, Electrical Characteristics Guaranteed  
Max Junction temperature, TJ, Functionality Guaranteed(1)  
85  
°C  
105  
°C  
(1) Device has a thermal shutdown feature implemented that shuts down at 105 °C  
8
POWER MANAGEMENT CORE  
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2.3 Thermal Information  
TPS65735  
RSN  
32 PINS  
38.9  
THERMAL METRIC  
UNITS  
θJA  
Junction-to-ambient thermal resistance(1)  
Junction-to-case (top) thermal resistance(2)  
Junction-to-board thermal resistance(3)  
Junction-to-top characterization parameter(4)  
Junction-to-board characterization parameter(5)  
Junction-to-case (bottom) thermal resistance(6)  
θJCtop  
θJB  
26.5  
9.8  
°C/W  
ψJT  
0.3  
ψJB  
9.8  
θJCbot  
3.5  
(1) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as  
specified in JESD51-7, in an environment described in JESD51-2a.  
(2) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific  
JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.  
(3) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB  
temperature, as described in JESD51-8.  
(4) The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted  
from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).  
(5) The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted  
from the simulation data for obtaining θJA , using a procedure described in JESD51-2a (sections 6 and 7).  
(6) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific  
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.  
2.4 Quiescent Current  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
IQ(SLEEP)  
Power management core quiescent @ 25° C  
8.6  
10.5  
µA  
current in sleep mode  
VBAT = 3.6 V  
VVIN = 0 V  
No load on LDO  
CHG_EN, BST_EN grounded  
BST_FB = 300 mV  
Power management core in sleep  
mode / device 'off'  
IQ(ACTIVE)  
Power management core quiescent @ 25° C  
current in active mode VBAT = 3.6 V  
39  
53.5  
µA  
VVIN = 0 V  
Boost enabled but not switching,  
H-bridge in grounded state  
No load on LDO  
Power management core in active  
mode  
2.5 Electrical Characteristics  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
BATTERY CHARGER POWER PATH  
VUVLO(VIN) Undervoltage lockout at power path VVIN: 0 V 4 V  
3.2  
200  
40  
3.3  
3.45  
300  
140  
V
input, VIN pin  
VHYS-  
UVLO(VIN)  
Hysteresis on UVLO at power path  
input, VIN pin  
VVIN: 4 V 0 V  
mV  
mV  
VIN-DT  
Input power detection threshold  
Input power detected if: (VVIN > VBAT  
+ VIN-DT);  
VBAT = 3.6 V  
VVIN: 3.5 V 4 V  
VHYS-INDT  
Hysteresis on VIN-DT  
VBAT = 3.6 V  
20  
mV  
VVIN: 4 V 3.5 V  
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POWER MANAGEMENT CORE  
9
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Electrical Characteristics (continued)  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VOVP  
Input over-voltage protection  
threshold  
VVIN: 5 V 7 V  
6.4  
6.6  
6.8  
V
VHYS-OVP  
Hysteresis on OVP  
VVIN: 11 V 5 V  
105  
mV  
mV  
VDO(VIN-  
SYS)  
VIN pin to SYS pin dropout voltage  
ISYS = 150 mA (including IBAT  
VVIN = 4.35 V  
VBAT = 3.6 V  
)
350  
150  
VVIN VSYS  
VDO(BAT-  
SYS)  
BAT pin to SYS pin dropout voltage ISYS = 100 mA  
BAT VSYS VVIN = 0 V  
BAT > 3 V  
mV  
V
V
IVIN(MAX)  
Maximum power path input current  
at pin VIN  
VVIN = 5 V  
200  
mA  
V
VSUP(ENT)  
Enter battery supplement mode  
VSYS  
(VBAT - 40  
mV)  
VSUP(EXIT) Exit battery supplement mode  
VSYS  
V
(VBAT - 20  
mV)  
VSUP(SC)  
VO(SC)  
Output short-circuit limit in  
supplement mode  
250  
mV  
V
Output short-circuit detection  
threshold, power-on  
0.9  
BATTERY CHARGER  
ICC  
Active supply current into VIN pin  
VVIN = 5 V  
2
mA  
No load on SYS pin  
VBAT > VBAT(REG)  
IBAT(SC)  
Source current for BAT pin  
short-circuit detection  
1
mA  
V
VBAT(SC)  
BAT pin short-circuit detection  
threshold  
1.6  
1.8  
2.0  
VBAT(REG) Battery charger output voltage  
1%  
4.20  
3.0  
1%  
3.1  
V
V
VLOWV  
Pre-charge to fast-charge transition  
threshold  
2.9  
ICHG  
Charger fast charge current range  
ICHG = KISET / RISET  
VVIN = 5 V  
BAT(REG) > VBAT > VLOWV  
5
100  
mA  
V
KISET  
Battery fast charge current set factor VVIN = 5 V  
20%  
450  
20%  
AΩ  
ICHG = KISET / RISET  
IVIN(MAX) > ICHG  
ICHG = 100 mA  
No load on SYS pin, thermal loop  
not active.  
IPRECHG  
ITERM  
Pre-charge current  
0.07 ×  
ICHG  
0.10 ×  
ICHG  
0.15 ×  
ICHG  
mA  
mA  
mV  
Charge current value for termination ICHG = 100 mA  
detection threshold  
7
10  
15  
VRCH  
Recharge detection threshold  
VBAT below nominal charger voltage,  
55  
100  
170  
VBAT(REG)  
IBAT(DET)  
tCHG  
Sink current for battery detection  
1
mA  
s
Charge safety timer  
18000  
(18000 seconds = 5 hours)  
tPRECHG  
VDPPM  
Pre-charge timer  
(1800 seconds = 30 minutes)  
1800  
s
V
DPPM threshold  
VBAT +  
100 mV  
ILEAK(nCHG) Leakage current for nCHG_STAT  
pin  
VnCHG_STAT = 4.2 V  
CHG_EN = LOW (Charger disabled)  
100  
60  
nA  
Ω
RDSON(nCH On resistance for nCHG_STAT  
20  
MOSFET switch  
G)  
10  
POWER MANAGEMENT CORE  
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Electrical Characteristics (continued)  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
IMAX(nCHG) Maximum input current to  
nCHG_STAT pin  
50  
mA  
BATTERY CHARGER NTC MONITOR  
ITSBIAS  
VCOLD  
TS pin bias current  
75  
µA  
0°C charge threshold for 10kΩ NTC  
(β = 3490)  
2100  
mV  
VHYS(COLD) Low temperature threshold  
hysteresis  
Battery charging and battery / NTC  
temperature increasing  
300  
300  
mV  
mV  
VHOT  
50°C charge threshold for 10kΩ  
NTC  
(β = 3490)  
VHYS(HOT) High temperature threshold  
hysteresis  
Battery charging and battery / NTC  
temperature decreasing  
30  
mV  
BATTERY CHARGER THERMAL REGULATION  
TJ(REG_LO Charger lower thermal regulation  
75  
95  
°C  
°C  
°C  
°C  
limit  
WER)  
TJ(REG_UPP Charger upper thermal regulation  
limit  
ER)  
TJ(OFF)  
Charger thermal shutdown  
temperature  
105  
20  
TJ(OFF-HYS) Charger thermal shutdown  
hysteresis  
LDO  
IMAX(LDO)  
Maximum LDO output current,  
VVLDO = 2.2 V  
VSYS = 4.2 V  
VVIN = 0 V  
VLDO_SET = 0 V  
30  
30  
mA  
Maximum LDO output current,  
VVLDO = 3.0 V  
VSYS = 4.2 V  
VVIN = 0 V  
mA  
VLDO_SET = VSYS  
ISC(LDO)  
VVLDO  
Short circuit current limit  
LDO output voltage  
30  
100  
mA  
V
VLDO_SET = LOW  
(VLDO_SET pin connected to  
DGND)  
3.7 V VVIN 6.5 V  
ILOAD(LDO) = -10 mA  
2.13  
2.2  
3.0  
2.27  
VVLDO  
LDO output voltage  
VLDO_SET = HIGH  
2.91  
3.09  
V
(VVLDO_SET = VSYS  
)
3.7 V VVIN 6.5 V  
ILOAD(LDO) = -10 mA  
VDO(LDO)  
LDO Dropout voltage  
Line regulation  
VVIN - VLDO when in dropout  
ILOAD(LDO) = -10 mA  
200  
1
mV  
%
3.7 V VVIN 6.5 V  
ILOAD(LDO) = -10 mA  
-1  
-2  
Load regulation  
VVIN = 3.5 V  
2
%
0.1 mA ILOAD(LDO) -10 mA  
PSRR  
Power supply rejection ratio  
@20 KHz, ILOAD(LDO) = 10 mA  
VDO(LDO) = 0.5 V  
45  
dB  
CVLDO = 10 µF  
BOOST CONVERTER  
IQ(BST) Boost operating quiescent current  
Boost Enabled, BST_EN = High  
IOUT(BST) = 0 mA  
(boost is not switching)  
VBAT = 3.6 V  
2
4.5  
1.2  
µA  
RDSON(BST) Boost MOSFET switch on-resistance VIN(BST) = 2.5 V  
ISW(MAIN) = 200 mA  
0.8  
Ω
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Electrical Characteristics (continued)  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
ILKG(BST_S Leakage into BST_SW pin  
BST_EN signal = LOW (Boost  
disabled)  
90  
nA  
(includes leakage into analog  
W)  
h-bridge switches)  
VBST_SW = 4.2 V  
No load on BST_OUT pin  
ISWLIM(BST) Boost MOSFET switch current limit  
VDIODE(BST Voltage across integrated boost  
100  
150  
200  
1.0  
mA  
V
BST_EN signal = HIGH  
VBST_SW = 16.0 V  
diode during normal operation  
)
IBST_OUT = - 2 mA  
VREF(BST)  
Boost reference voltage on BST_FB  
pin  
1.17  
2
1.2  
2.5  
6.5  
1.23  
3.2  
8
V
%
µs  
VREFHYS(BS Boost reference voltage hysteresis  
T)  
on BST_FB pin  
TON(BST)  
Maximum on time detection  
threshold  
5
TOFF(BST)  
Minimum off time detection threshold  
1.4  
1.75  
105  
20  
2.1  
µs  
°C  
°C  
TSHUT(BST) Boost thermal shutdown threshold  
TSHUT-  
HYS(BST)  
Boost thermal shutdown threshold  
hysteresis  
FULL H-BRIDGE ANALOG SWITCHES  
IQ(HSW)  
Operating quiescent current for  
h-bridge switches  
5
µA  
Ω
RDSON(HSW H-bridge switches on resistance  
20  
40  
)
TDELAY(HS H-bridge switch propagation delay,  
VHBxy = 0 V VVLDO  
100  
ns  
input switched from low to high  
W-H)  
state.  
TDELAY(HS H-bridge switch propagation delay,  
VHBxy = VVLDO 0 V  
100  
ns  
input switched from high to low  
W-L)  
state.  
POWER MANAGEMENT CORE CONTROLLER  
VIL(PMIC)  
Low logic level for logic signals on  
power management core  
(BST_EN, CHG_EN, SLEEP, HBR1, IIN = 1 mA  
HBR2, HBL1, HBL2)  
IO logic level decreasing:  
0.4  
V
V
VSYS 0 V  
VIH(PMIC)  
High logic level for signals on power IO logic level increasing:  
1.2  
management core  
0 V VSYS  
(BST_EN, CHG_EN, SLEEP, HBR1, IIN = 1 mA  
HBR2, HBL1, HBL2)  
VGOOD(LDO Power fault detection threshold  
)
VVLDO decreasing  
1.96  
V
mV  
V
VGOOD_HYS Power fault detection hysteresis  
(LDO)  
VVLDO increasing  
50  
1.85  
1.10  
VBATCOMP COMP pin voltage (scaled down  
battery voltage)  
VBAT = 4.2 V  
VVLDO = 2.2 V  
VBAT = 2.5 V  
VVLDO = 2.2 V  
V
V
V
VBAT = 4.2 V  
VVLDO = 3.0 V  
1.90  
1.50  
VBAT = 3.3 V  
VVLDO = 3.0 V  
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2.6 System Operation  
The system must complete the power up routine before it enters normal operating mode. The specific  
system operation depends on the setting defined by the state of the SW_SEL pin. The details of the  
system operation for each configuration of the SW_SEL pin are contained in this section.  
2.6.1 System Power Up  
Figure 2-1. System Power Up State Diagram  
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2.6.2 System Operation Using Push Button Switch  
Figure 2-2. Push Button State Diagram  
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2.6.3 System Operation Using Slider Switch  
Figure 2-3. System Operation Using Slider Switch  
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2.7 Linear Charger Operation  
This device has an integrated Li-Ion battery charger and system power path management feature targeted  
at space-limited portable applications. The architecture powers the system while simultaneously and  
independently charging the battery. This feature reduces the number of charge and discharge cycles on  
the battery, allows for proper charge termination, and enables the system to run with a defective or absent  
battery pack. It also allows instant system turn-on even with a totally discharged battery.  
The input power source for charging the battery and running the system can be an AC adapter or USB  
port connected to the VIN pin as long as the input meets the device operating conditions outlined in this  
datasheet. The power-path management feature automatically reduces the charging current if the system  
load increases. Note that the charger input, VIN, has voltage protection up to 28 V.  
2.7.1 Battery and TS Detection  
To detect and determine between a good or damaged battery, the device checks for a short circuit on the  
BAT pin by sourcing IBAT(SC) to the battery and monitoring the voltage on the BAT pin. While sourcing this  
current if the BAT pin voltage exceeds VBAT(SC), a battery has been detected. If the voltage stays below  
the VBAT(SC) level, the battery is presumed to be damaged and not safe to charge.  
The device will also check for the presence of a 10 kΩ NTC thermistor attached to the TS pin of the  
device. The check for the NTC thermistor on the TS pin is done much like the battery detection feature  
described previously. The voltage on the TS pin is compared against a defined level and if it is found to be  
above the threshold, the NTC thermistor is assumed to be disconnected or not used in the system. To  
reduce the system quiescent current, the NTC thermistor temperature sensing function is only enabled  
when the device is charging and when the thermistor has been detected.  
Figure 2-4. Thermistor Detection and Circuit  
2.7.2 Battery Charging  
The battery is charged in three phases: conditioning pre-charge, constant-current fast charge (current  
regulation), and a constant-voltage tapering (voltage regulation). In all charge phases, an internal control  
loop monitors the IC junction temperature and reduces the charge current if an internal temperature  
threshold is exceeded. Figure 2-5 shows what happens in each of the three charge phases:  
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Figure 2-5. Battery Charge Phases  
In the pre-charge phase, the battery is charged with the pre-charge current that is scaled to be 10% of the  
fast-charge current set by the resistor connected to the ISET pin. Once the battery voltage crosses the  
VLOWV threshold, the battery is charged with the fast-charge current (ICHG). As the battery voltage reaches  
VBAT(REG), the battery is held at a constant voltage of VBAT(REG) and the charge current tapers off as the  
battery approaches full charge. When the battery current reaches ITERM, the charger indicates charging is  
done by making the nCHG_STAT pin high impedance. Note that termination detection is disabled  
whenever the charge rate is reduced from the set point because of the actions of the thermal loop, the  
DPM loop, or the VIN(LOWV) loop.  
2.7.2.1 Pre-charge  
The value for the pre-charge current is set to be 10% of the charge current that is set by the external  
resistor, RISET. Pre-charge current is scaled to lower currents when the charger is in thermal regulation.  
2.7.2.2 Charge Termination  
In the fast charge state, once VBAT VBAT(REG), the charger enters constant voltage mode. In constant  
voltage mode, the charge current will taper until termination when the charge current falls below the I(TERM)  
threshold (typically 10% of the programmed fast charge current). Termination current is not scaled when  
the charger is in thermal regulation. When the charging is terminated, the nCHG_STAT pin will be high  
impedance (effectively turning off any LED that is connected to this pin).  
2.7.2.3 Recharge  
Once a charge cycle is complete and termination is reached, the battery voltage is monitored. If VBAT  
VBAT(REG) - VRCH, the device determines if the battery has been removed. If the battery is still present, then  
the recharge cycle begins and will end when VBAT VBAT(REG)  
<
.
2.7.2.4 Charge Timers  
The charger in this device has internal safety timers for the pre-charge and fast charge phases to prevent  
potential damage to either the battery or the system. The default values for these timers are found as  
follows: Pre-charge timer = 0.5 hours (30 minutes) and Fast charge timer = 5 hours (300 minutes).  
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During the fast charge phase, the following events may increase the timer durations:  
1. The system load current activates the DPM loop which reduces the available charging current  
2. The input current is reduced because the input voltage has fallen to VIN(LOW)  
3. The device has entered thermal regulation because the IC junction temperature has exceeded TJ(REG)  
During each of these events, the internal timers are slowed down proportionately to the reduction in  
charging current.  
If the pre-charge timer expires before the battery voltage reaches VLOWV, the charger indicates a fault  
condition.  
2.7.3 Charger Status (nCHG_STAT Pin)  
The nCHG_STAT pin is used to indicate the charger status by an externally connected resistor and LED  
circuit. The pin is an open drain input and the internal switch is controlled by the logic inside of the  
charger. This pin may also be connected to a GPIO of the system MCU to indicate charging status. The  
table below details the status of the nCHG_STAT pin for various operating states of the charger.  
Table 2-1. nCHG_STAT Functionality  
Charging Status  
nCHG_STAT FET / LED  
Pre-charge / Fast Charge / Charge Termination  
ON  
Recharge  
OVP  
OFF  
OFF  
OFF  
SLEEP  
2.8 LDO Operation  
The power management core has a low dropout linear regulator (LDO) with variable output voltage  
capability. This LDO is used for supplying the microcontroller and may be used to supply either an  
external IR or RF module, depending on system requirements. The LDO can supply a continuous current  
of up to 30 mA.  
The output voltage (VVLDO) of the LDO is set by the state of the VLDO_SET pin. See Table 2-2 for details  
on setting the LDO output voltage.  
Table 2-2. VLDO_SET Functionality  
VLDO_SET State  
VLDO Output Voltage (VVLDO)  
Low (VLDO_SET < VIL(PMIC)  
)
2.2 V  
3.0 V  
High (VLDO_SET > VIH(PMIC)  
)
2.8.1 LDO Internal Current Limit  
The internal current limit feature helps to protect the LDO regulator during fault conditions. During current  
limit, the output sources a fixed amount of current that is defined in the electrical specification table. The  
voltage on the output in this stage can not be regulated and will be VOUT = ILIMIT × RLOAD. The pass  
transistor integrated into the LDO will dissipate power, (VIN - VOUT) × ILIMIT, until the device enters thermal  
shutdown. In thermal shutdown the device will enter the "SLEEP / POWER OFF" state which means that  
the LDO will then be disabled and shut off.  
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2.9 Boost Converter Operation  
The boost converter in this device is designed for the load of active shutter 3D glasses. This load is  
typically a light load where the average current is 2 mA or lower and the peak current out of a battery is  
limited in operation. This asynchronous boost converter operates with a minimum off time / maximum on  
time for the integrated low side switch, these values are specified in the electrical characteristics table of  
this datasheet.  
The peak output voltage from the boost converter is adjustable and set by using an external resistor  
divider connected between BST_OUT, the BST_FB pin, and ground. The peak output voltage is set by  
choosing resistors for the feedback network such that the voltage on the BST_FB pin is VREF(BST) = 1.2 V.  
See Section 3.3 for more information on calculating resistance values for this feedback network.  
The efficiency curves for various input voltages over the typical 3D glasses load range (2 mA and lower)  
are shown below. All curves are for a target VOUT of 16 V. For output voltages less than 16 V, a higher  
efficiency at each operating input voltage should be expected. Note that efficiency is dependent upon the  
external boost feedback network resistances, the inductor used, and the type of load connected.  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
VIN = 3.0 V  
0.01  
VOUT = 16.0 V  
1
VIN = 3.7 V  
0.01  
VOUT = 16.0 V  
1 2  
0.1  
2
0.1  
Output Current (mA)  
Output Current (mA)  
G000  
G000  
Figure 2-6. Boost Efficiency vs. IOUT, VIN = 3.0 V,  
Figure 2-7. Boost Efficiency vs. IOUT, VIN = 3.7 V,  
VOUT = 16 V  
VOUT = 16 V  
100  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
90  
80  
70  
60  
50  
40  
30  
20  
10  
VIN = 4.2 V  
0.01  
VOUT = 16.0 V  
1
VIN = 5.5 V  
0.01  
VOUT = 16.0 V  
1 2  
0
0
0.1  
2
0.1  
Output Current (mA)  
Output Current (mA)  
G000  
G000  
Figure 2-8. Boost Efficiency vs. IOUT, VIN = 4.2 V,  
VOUT = 16 V  
Figure 2-9. Boost Efficiency vs. IOUT, VIN = 5.5 V,  
VOUT = 16 V  
2.9.1 Boost Thermal Shutdown  
An internal thermal shutdown mode is implemented in the boost converter that shuts down the device if  
the typical junction temperature of 105°C is exceeded. If the device is in thermal shutdown mode, the  
main switch of the boost is open and the device enters the "SLEEP / POWER OFF" state.  
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2.9.2 Boost Load Disconnect  
When the boost is disabled (BST_EN = LOW), the H-bridge is automatically placed into the OFF state. In  
the OFF state the high side H-bridge switches are open and the low side switches of the H-bridge are  
closed. The OFF state grounds and discharges the load, potentially prolonging the life of the LC shutters  
by eliminating any DC content (see Section 2.10.1 for more information regarding the H-bridge states).  
The disconnection of the load is done with the H-Bridge and can be seen in the next figure (Figure 2-10).  
Figure 2-10. Boost Load Disconnect  
An advantage to this topology for disconnecting the load is that the boost output capacitor is charged to  
approximately the SYS voltage level, specifically VSYS - VDIODE(BST), when the boost is disabled. This  
design ensures that there is not a large in-rush current into the boost output capacitor when the boost is  
enabled. The boost operation efficiency is also increased because there is no load disconnect switch in  
the boost output path, such a switch would decrease efficiency because of the resistance that it would  
introduce.  
2.10 Full H-Bridge Analog Switches  
The TPS65735 has two integrated full H-bridge analog switches that can be connected to GPIOs of a host  
microcontroller. There is an internal level shifter that takes care of the input signals to the H-Bridge  
switches.  
2.10.1 H-Bridge Switch Control  
The H-Bridge switches are controlled by an external microcontroller for system operation - specifically to  
control charge polarity on the LCD shutters. Depending on the state of the signals from the  
microcontroller, the H-Bridge will be put into 4 different states. These states are:  
OPEN: All Switches Opened  
CHARGE+: Boost Output Voltage Present on Pins LCLP or LCRP  
CHARGE-: Boost Output Voltage Present on Pins LCLN or LCRN  
GROUNDED: High side switches are opened and low side switches are closed  
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If CHARGE+ state is followed by the CHARGE- state, the voltage across the capacitor connected to the  
H-Bridge output terminals will be reversed. The system is automatically put into the GROUNDED state  
when the boost is disabled by the BST_EN pin - for more details see Section 2.6.  
Table 2-3. H-Bridge States from Inputs  
HBx2 [HBL2 & HBR2]  
HBx1 [HBL1 & HBR1]  
H-Bridge State  
OPEN  
0
0
1
1
0
1
0
1
CHARGE +  
CHARGE -  
GROUNDED  
Figure 2-11. H-Bridge States  
Figure 2-12. H-Bridge States from Oscilloscope  
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2.11 Power Management Core Control  
Various functions of the power management core can be controlled by GPIOs of an external MCU or by  
setting the default state by connecting these function pins to a logic high or low level on the PCB.  
2.11.1 SLEEP / Power Control Pin Function  
The internal SLEEP signal between the power management device and the MSP430 can be used to  
control the power down behavior of the device. This has multiple practical applications such as a  
watchdog implementation for the communication between the sender (TV) and the 3D glasses (receiver)  
or different required system on and off times; typically when the push-button press timing for an off event  
is a few seconds in length, programmable by software in the system MCU.  
If there is a requirement that the push-button press for system on and off events are different, the SLEEP  
signal must be set to a logic high value (VSLEEP > VIH(PMIC)) upon system startup. This implementation  
allows the device to power down the system on the falling edge of the SLEEP signal  
(when: VSLEEP < VIL(PMIC)).  
Figure 2-13. SLEEP Signal to Force System Power Off  
2.11.2 COMP Pin Functionality  
The COMP pin is used to output a scaled down voltage level related to the battery voltage for input to a  
comparator of a microcontroller. Applications for this COMP feature could be to generate an interrupt on  
the microcontroller when battery voltage drops under a threshold and the device can then be shut down or  
indicate to the end user with an LED that the battery requires charging.  
Figure 2-14. COMP Pin Internal Connection  
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Table 2-4. Scaling Resistors for COMP Pin Function  
(VVLDO = 2.2 V)  
Scaling Resistors for COMP Pin  
Value  
Function  
RBSCL1  
RBSCL2  
3.0 MΩ  
2.36 MΩ  
Table 2-5. Scaling Resistors for COMP Pin Function  
(VVLDO = 3.0 V)  
Scaling Resistors for COMP Pin  
Value  
Function  
RBSCL1  
RBSCL2  
3.0 MΩ  
2.48 MΩ  
Using the designed values in Table 2-4 or Table 2-5, the voltage on the COMP pin will be: VCOMP = 0.5 ×  
VVLDO + 300 mV. This assures that the COMP pin voltage will be close to half of the LDO output voltage  
plus the LDO dropout voltage of the device. The COMP pin can also be used as the input to an ADC  
channel of an external microcontroller if greater accuracy or more functionality is desired than a simple  
comparison.  
2.11.3 SW_SEL Pin Functionality  
The SW_SEL pin is used to select what type of switch is connected to the SWITCH pin of the device.  
Selection between a push-button and a slider switch can be made based on the state of this pin.  
Table 2-6. SW_SEL Settings  
SW_SEL State  
Type of Switch Selected  
Low  
Slider Switch  
(VSW_SEL < VIL(PMIC)  
)
High  
Push-button  
(VSW_SEL > VIH(PMIC)  
)
When the push button switch type is selected, the device will debounce the SWITCH input with a 32 ms  
timer for both the ON and OFF events and either power on or off the device. Using the push-button switch  
function, the on and off timings are equal; tON = tOFF. If the system requirements are such that the on and  
off timings should be different, tON tOFF, then refer to the following section for the correct system setup:  
Section 3.4. When the slider switch operation is selected, the SWITCH pin must be externally pulled up to  
the SYS voltage with a resistor and the output connected to the slider switch. When the SWITCH pin is  
pulled to ground, the device will turn on and enter the power up sequence.  
2.11.4 SWITCH Pin  
The SWITCH pin behavior is defined by the SW_SEL pin (Section 2.11.3) which defines the type of switch  
that is connected to the system; either a slider switch or push-button.  
2.11.5 Slider Switch Behavior  
If a slider switch is connected in the system then the system power state and VLDO output (which can  
power an external MCU) is defined by the state of the slider switch. If the slider is in the "off" position than  
the SWITCH pin should be connected to the SYS pin. If the slider is in the "on" position than the SWITCH  
pin should be connected to ground. Figure 2-15 details the system operation using the slider switch  
configuration.  
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Figure 2-15. SWITCH, Slider Power On-Off Behavior  
2.11.6 Push-Button Switch Behavior  
The system is powered on or off by a push-button press after a press that is greater than 32 ms. The  
following figures (Figure 2-16 and Figure 2-17) show the system behavior and the expected VLDO output  
during the normal push-button operation where the on and off press timings are the same value,  
tON = tOFF  
.
Figure 2-16. SWITCH, Push-button Power On Behavior  
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Figure 2-17. SWITCH, Push-button Power Off Behavior  
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3
APPLICATION INFORMATION  
3.1 Applications Schematic  
Figure 3-1. TPS65735 Applications Schematic  
3.2 Reducing System Quiescent Current (IQ)  
This PMU device has been optimized for low power applications. If an even lower quiescent current is  
desired, the following circuit and configuration can be utilized to reduce system off / sleep quiescent  
current further. Please note that this will cause a slight efficiency drop to the overall system due to the  
addition of the resistance of the FET that has been added. With this circuit, achieving an IQ of less than 1  
µA is possible. Please refer to the datasheet of the MCU used in the system to determine the system IQ  
that is possible.  
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Figure 3-2. Reducing System IQ with Addition of a FET  
Along with this system configuration, the MCU code must be written such that the MCU sits in the lowest  
power state that can support an interrupt on a GPIO from a switch (slider or push button). After a valid  
button press or switch action, the device can begin the power on sequence and open the FET in the  
previous figure (Figure 3-2). This will allow power flow into the PMU and the system can then operate  
normally.  
3.3 Boost Converter Application Information  
3.3.1 Setting Boost Output Voltage  
To set the boost converter output voltage of this device, two external resistors that form a feedback  
network are required. The values recommended below (in Table 3-1) are given for a desired quiescent  
current of 5 µA when the boost is enabled and switching. See Figure 3-3 for the detail of the applications  
schematic that shows the boost feedback network and the resistor names used in the table below.  
Figure 3-3. Boost Feedback Network Schematic  
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Table 3-1. Recommended RFB1 and RFB2 Values (for IQ(FB) = 5 µA)  
(1)  
(1)  
Targeted VBST_OUT  
RFB1  
RFB2  
8 V  
1.3 MΩ  
1.8 MΩ  
2.2 MΩ  
2.4 MΩ  
3.0 MΩ  
240 kΩ  
240 kΩ  
240 kΩ  
240 kΩ  
240 kΩ  
10 V  
12 V  
14 V  
16 V  
(1) Resistance values given in closest standard value (5% tolerance, E24 grouping).  
These resistance values can also be calculated using the following information. To start, it is helpful to  
target a quiescent current through the boost feedback network while the device is operating (IQ(FB)). When  
the boost output voltage and this targeted quiescent current is known, the total feedback network  
resistance can be found.  
The value for RFB2 can be found by using the boost feedback pin voltage (VFB = 1.2 V, see "Electrical  
Characteristics" in Section 2) and IQ(FB) in the following equation:  
RFB1 + RFB2 = VBST_OUT / IQ(FB)  
RFB2 = (1.2 V) / IQ(FB)  
To find RFB1, simply subtract the RFB2 from RFB(TOT)  
RFB1 = RFB(TOT) - RFB2  
:
3.3.2 Boost Inductor Selection  
The selection of the boost inductor and output capacitor is very important to the performance of the boost  
converter. The boost has been designed for optimized operation when a 10 µH inductor is used. Smaller  
inductors, down to 4.7 µH, may be used but there will be a slight loss in overall operating efficiency. A few  
inductors that have been tested and found to give good performance can be found in the list below:  
Recommended 10 µH inductors  
TDK VLS201612ET-100M (10 µH, IMAX = 0.53 A, RDC = 0.85 Ω)  
Taiyo Yuden CBC2016B100M (10 µH, IMAX = 0.41 A, RDC = 0.82 Ω)  
3.3.3 Boost Capacitor Selection  
The recommended minimum value for the capacitor on the boost output, BST_OUT pin, is 4.7 µF. Values  
that are larger can be used with the measurable impact being a slight reduction in the boost converter  
output voltage ripple while values smaller than this will result in an increased boost output voltage ripple.  
Note that the voltage rating of the capacitor should be sized for the maximum expected voltage at the  
BST_OUT pin.  
3.4 Bypassing Default Push-Button SWITCH Functionality  
If the SWITCH pin functionality is not required to power on and off the device because of different system  
requirements (when the SWITCH timing requirements of system will be controlled by an external  
microcontroller), then the feature can be bypassed. The following diagram shows the connections required  
for this configuration, note that INT. I/O refers to an interruptible I/O on the microcontroller.  
28  
APPLICATION INFORMATION  
Copyright © 2011, Texas Instruments Incorporated  
Submit Documentation Feedback  
Product Folder Link(s): TPS65735  
TPS65735  
www.ti.com  
SLVSAI6JUNE 2011  
Figure 3-4. Bypassing Default TPS65735 Push Button SWITCH Timing  
In a system where a different push-button SWITCH off timing is required, the SLEEP pin is used to control  
the power off of the device. After system power up, the MCU must force the SLEEP pin to a high state  
(VSLEEP > VIH(PMIC)). Once the SWITCH push-button is pressed to shut the system down, a timer in the  
MCU should be active and counting the desired tOFF time of the device. Once this tOFF time is detected,  
the MCU can assert the SLEEP signal to a logic low level (VSLEEP < VIL(PMIC)). It is on the falling edge of  
the SLEEP signal where the system will be powered off (see Figure 3-5)  
Figure 3-5. SWITCH Press and SLEEP Signal to Control System Power Off  
Copyright © 2011, Texas Instruments Incorporated  
APPLICATION INFORMATION  
29  
Submit Documentation Feedback  
Product Folder Link(s): TPS65735  
 
PACKAGE OPTION ADDENDUM  
www.ti.com  
23-Jun-2011  
PACKAGING INFORMATION  
Status (1)  
Eco Plan (2)  
MSL Peak Temp (3)  
Samples  
Orderable Device  
Package Type Package  
Drawing  
Pins  
Package Qty  
Lead/  
Ball Finish  
(Requires Login)  
TPS65735RSNR  
TPS65735RSNT  
ACTIVE  
QFN  
QFN  
RSN  
RSN  
32  
32  
3000  
250  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-2-260C-1 YEAR  
PREVIEW  
TBD  
Call TI  
Call TI  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
22-Jun-2011  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TPS65735RSNR  
QFN  
RSN  
32  
3000  
330.0  
12.4  
4.3  
4.3  
1.5  
8.0  
12.0  
Q2  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
22-Jun-2011  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
QFN RSN 32  
SPQ  
Length (mm) Width (mm) Height (mm)  
340.5 338.1 20.6  
TPS65735RSNR  
3000  
Pack Materials-Page 2  
IMPORTANT NOTICE  
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