XXX3490 [TI]
3.3 V FULL-DUPLEX RS-485 DRIVERS AND RECEIVERS; 3.3 V全双工RS - 485驱动器和接收
| 型号： | XXX3490 |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | 3.3 V FULL-DUPLEX RS-485 DRIVERS AND RECEIVERS |
| 文件： | 总28页 (文件大小：835K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
RHL (QFN)
D-8 (SOIC)
D-14 (SOIC)
SN65HVD30 – SN65HVD39
www.ti.com
SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
3.3 V FULL-DUPLEX RS-485 DRIVERS AND RECEIVERS
Each driver and receiver has separate input and
1
FEATURES
output pins for full-duplex bus communication
designs. They are designed for balanced
transmission lines and inter-operation with ANSI
TIA/EIA-485A, TIA/EIA-422-B, ITU-T v.11 and ISO
8482:1993 standard-compliant devices.
•
1/8 Unit-Load Option Available (Up to
256 Nodes on the Bus)
•
•
Bus-Pin ESD Protection Exceeds 15 kV HBM
Optional Driver Output Transition Times for
Signaling Rates(1) of 1 Mbps, 5 Mbps and
26 Mbps
The SN65HVD30, SN65HVD31, SN65HVD32,
SN65HVD36 and SN65HVD37 are fully enabled with
no external enabling pins.
•
•
Low-Current Standby Mode: < 1 µA
Glitch-Free Power-Up and Power-Down
Protection for Hot-Plugging Applications
The SN65HVD33, SN65HVD34, SN65HVD35,
SN65HVD38, and SN65HVD39 have active-high
driver enables and active-low receiver enables. A low,
less than 1µA, standby current can be achieved by
disabling both the driver and receiver.
•
•
•
•
5-V Tolerant Inputs
Bus Idle, Open, and Short Circuit Failsafe
Driver Current Limiting and Thermal Shutdown
All devices are characterized for ambient
temperatures from –40°C to 85°C. Low power
dissipation allows operation at temperatures up to
105°C or 125°C, depending on package option.
Meets or Exceeds the Requirements of ANSI
TIA/EIA-485-A and RS-422 Compatible
•
5-V Devices available, SN65HVD50-59
(1)
Line Signaling Rate is the number of voltage transitions made
per second expressed in units of bps (bits per second).
The preview devices SN65HVD36 and SN65HVD38
implement receiver equalization technology for
improved jitter performance on differential bus
applications with data rates up to 20 Mbps at cable
lengths up to 160 meters.
APPLICATIONS
•
•
•
•
Utility Meters
DTE/DCE Interfaces
Industrial, Process, and Building Automation
Point-of-Sale (POS) Terminals and Networks
The preview devices SN65HVD37 and SN65HVD39
implement receiver equalization technology for
improved jitter performance on differential bus
applications with data rates in the range of 1 to 5
Mbps at cable lengths up to 1000 meters.
DESCRIPTION
The SN65HVD3X devices are 3-state differential line
drivers and differential-input line receivers that
operate with 3.3-V power supply.
IMPROVED REPLACEMENT FOR:
Part Number
Replace with
xxx3491
xxx3490
SN65HVD33:
SN65HVD30:
Better ESD protection (15kV vs 2kV or not specified) Higher Signaling Rate (26Mbps vs 20Mbps)
Fractional Unit Load (64 Nodes vs 32)
MAX3491E
MAX3490E
SN65HVD33:
SN65HVD30:
Higher Signaling Rate (26Mbps vs 12Mbps) Fractional Unit Load (64 Nodes vs 32)
Higher Signaling Rate (26Mbps vs 16Mbps) Lower Standby Current (1 µA vs 10 µA)
Higher Signaling Rate (5Mbps vs 500kbps) Lower Standby Current (1 µA vs 10 µA)
Higher Signaling Rate (1Mbps vs 250kbps) Lower Standby Current (1 µA vs 10 µA)
MAX3076E
MAX3077E
SN65HVD33:
SN65HVD30:
MAX3073E
MAX3074E
SN65HVD34:
SN65HVD31:
MAX3070E
MAX3071E
SN65HVD35:
SN65HVD32:
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005–2008, Texas Instruments Incorporated
SN65HVD30 – SN65HVD39
www.ti.com
SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SN65HVD30, SN65HVD31, SN65HVD32,
SN65HVD36, SN65HVD37
SN65HVD33, SN65HVD34, SN65HVD35,
SN65HVD38, SN65HVD39
D PACKAGE (TOP VIEW)
NC
R
VCC
VCC
A
1
2
3
4
5
6
7
14
13
12
11
10
9
VCC
R
1
2
3
4
8
7
6
5
A
B
Z
Y
RE
D
DE
B
GND
D
Z
GND
GND
Y
8
7
8
NC
2
A
R
NC - No internal connection
B
5
6
3
Y
Z
D
SN65HVD33
RHL PACKAGE (TOP VIEW)
VCC VCC
NC
R
NC
A
2
3
19
18
17
16
15
14
13
12
1
20
RE
NC
DE
B
4
5
18
A
17
B
3
4
NC
Z
R
RE
DE
6
7
D
NC
NC
Y
6
7
NC
14
Y
15
Z
8
9
D
10
11
NC
GND
NC - No internal connection
GND
2
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Product Folder Link(s) :SN65HVD30 – SN65HVD39
SN65HVD30 – SN65HVD39
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
AVAILABLE OPTIONS
SIGNALING
RATE
RECEIVER
EQUALIZATION
BASE
UNIT LOADS
ENABLES
SOIC MARKING
PART NUMBER
26 Mbps
5 Mbps
1 Mbps
26 Mbps
5 Mbps
1 Mbps
26 Mbps
5 Mbps
26 Mbps
5 Mbps
No
No
No
No
SN65HVD30
SN65HVD31
SN65HVD32
SN65HVD33
SN65HVD34
SN65HVD35
SN65HVD36
SN65HVD37
SN65HVD38
SN65HVD39
VP30
1/8
1/8
VP31
No
No
VP32
No
Yes
Yes
Yes
No
65HVD33
65HVD34
65HVD35
PREVIEW
PREVIEW
PREVIEW
PREVIEW
1/8
1/8
No
No
Yes
Yes
Yes
Yes
1/8
1/8
No
Yes
Yes
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
(2)
UNIT
VCC
Supply voltage range
–0.3 V to 6 V
–9 V to 14 V
–50 to 50 V
V(A), V(B), V(Y), V(Z)
Voltage range at any bus terminal (A, B, Y, Z)
Voltage input, transient pulse through 100 Ω. See Figure 12 (A, B, Y, Z)(3)
V(TRANS)
VI
PD(cont)
IO
Input voltage range (D, DE, RE)
-0.5 V to 7 V
Internally limited(4)
11 mA
Continuous total power dissipation
Output current (receiver output only, R)
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3) This tests survivability only and the output state of the receiver is not specified.
(4) The thermal shutdown protection circuit internally limits the continuous total power dissipation. Thermal shutdown typically occurs when
the junction temperature reaches 165°C.
DISSIPATION RATINGS
JEDEC THERMAL
MODEL
TA < 25°C
RATING
DERATING FACTOR
ABOVE TA = 25°C
TA = 85°C
RATING
TA = 105°C
RATING
TA = 125°C
RATING
PACKAGE
Low k
High k
Low k
High k
High k
625 mW
1000 mW
765 mW
5 mW/°C
8 mW/°C
325 mW
520 mW
400 mW
705 mW
890 mW
SOIC (D) 8 pin
360 mW
275 mW
485 mW
6150 mW
6.1 mW/°C
10.8 mW/°C
13.7 mW/°C
SOIC (D) 14 pin
1350 mW
1710 mW
270 mW
340 mW
QFN (RHL) 20 pin
Copyright © 2005–2008, Texas Instruments Incorporated
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range unless otherwise noted
MIN NOM
MAX UNIT
VCC
Supply voltage
3
–7(1)
3.6
V
VI or VIC
Voltage at any bus terminal (separately or common mode)
12
SN65HVD30, SN65HVD33, SN65HVD36, SN65HVD38
26
1/tUI
Signaling rate
SN65HVD31, SN65HVD34, SN65HVD37, SN65HVD39
SN65HVD32, SN65HVD35
5
1
Mbps
Ω
RL
Differential load resistance
High-level input voltage
Low-level input voltage
Differential input voltage
54
2
60
VIH
VIL
VID
D, DE, RE
D, DE, RE
VCC
0.8
12
0
V
–12
–60
–8
Driver
IOH
High-level output current
mA
Receiver
Driver
60
8
IOL
TJ
Low-level output current
Junction temperature
mA
Receiver
–40
150
°C
(1) The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
ELECTROSTATIC DISCHARGE PROTECTION
PARAMETER
TEST CONDITIONS
Bus terminals and GND
MIN TYP(1)
MAX UNIT
Human body model
Human body model(2)
Charged-device-model(3)
±16
±4
All pins
All pins
kV
±1
(1) All typical values at 25°C with 3.3-V supply.
(2) Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(3) Tested in accordance with JEDEC Standard 22, Test Method C101.
4
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Product Folder Link(s) :SN65HVD30 – SN65HVD39
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
DRIVER ELECTRICAL CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN TYP(1)
–1.5
MAX UNIT
VI(K)
Input clamp voltage
II = –18 mA
V
IO = 0
2.5
VCC
RL = 54 Ω, See Figure 1 (RS-485)
RL = 100 Ω, See Figure 1 ,(2) (RS-422)
Vtest = –7 V to 12 V, See Figure 2
1.5
2
2
|VOD(SS)
|
Steady-state differential output voltage
V
2.3
1.5
Change in magnitude of steady-state
differential output voltage between
states
Δ|VOD(SS)
|
RL = 54 Ω, See Figure 1 and Figure 2
–0.2
0.2
V
V
Differential Output Voltage overshoot
and undershoot
RL = 54 Ω, CL = 50 pF, See Figure 5 and
Figure 3
VOD(RING)
10%(3)
HVD30, HVD33,
HVD36, HVD38
0.5
Peak-to-peak
common-mode
output voltage
VOC(PP)
See Figure 4
V
V
HVD31, HVD34,
HVD37, HVD39,
HVD32, HVD35
0.25
Steady-state common-mode output
voltage
VOC(SS)
1.6
2.3
0.05
90
See Figure 4
Change in steady-state common-mode
output voltage
ΔVOC(SS)
–0.05
VCC = 0 V, VZ or VY = 12 V,
Other input at 0 V
HVD30, HVD31,
HVD32, HVD36,
HVD37
VCC = 0 V, VZ or VY = –7 V,
Other input at 0 V
–10
IZ(Z) or
IY(Z)
High-impedance
state output current
HVD33, HVD34,
HVD35, HVD38,
HVD39
µA
VCC = 3 V or 0 V, DE = 0 V
VZ or VY = 12 V
90
Other input
at 0 V
VCC = 3 V or 0 V, DE = 0 V
VZ or VY = –7 V
–10
VZ or VY = –7 V
VZ or VY = 12 V
–250
–250
0
250
250
100
IZ(S) or
IY(S)
Other input
at 0 V
Short Circuit output Current
mA
II
Input current
D, DE
µA
C(OD)
Differential output capacitance
VOD = 0.4 sin (4E6πt) + 0.5 V, DE at 0 V
16
pF
(1) All typical values are at 25°C and with a 3.3-V supply.
(2) VCC is 3.3 Vdc ± 5%
(3) 10% of the peak-to-peak differential output voltage swing, per TIA/EIA-485
Copyright © 2005–2008, Texas Instruments Incorporated
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
DRIVER SWITCHING CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN TYP(1) MAX UNIT
HVD30, HVD33, HVD36, HVD38
Propagation delay time,
low-to-high-level output
4
25
10
38
18
65
tPLH
tPHL
tr
HVD31, HVD34, HVD37, HVD39
HVD32, HVD35
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
120
4
175
9
305
18
HVD30, HVD33, HVD36, HVD38
HVD31, HVD34, HVD37, HVD39
HVD32, HVD35
Propagation delay time,
high-to-low-level output
25
38
65
120
2.5
20
175
5
305
12
HVD30, HVD33, HVD36, HVD38
HVD31, HVD34, HVD37, HVD39
HVD32, HVD35
Differential output signal rise
time
RL = 54 Ω, CL = 50 pF,
See Figure 5
37
60
120
2.5
20
185
5
300
12
HVD30, HVD33, HVD36, HVD38
HVD31, HVD34, HVD37, HVD39
HVD32, HVD35
Differential output signal fall
time
tf
35
60
120
180
0.6
2.0
5.1
300
HVD30, HVD33, HVD36, HVD38
HVD31, HVD34, HVD37, HVD39
HVD32, HVD35
tsk(p)
tPZH1
tPHZ
tPZL1
tPLZ
tPZH2
tPZL2
Pulse skew (|tPHL – tPLH|)
HVD33, HVD38
45
235
490
25
Propagation delay time,
high-impedance-to-high-level
output
HVD34, HVD39
RL = 110 Ω, RE at 0 V,
D = 3 V and S1 = Y, or
D = 0 V and S1 = Z
See Figure 6
HVD35
HVD33, HVD38
Propagation delay time,
high-level-to-high-impedance
output
HVD34, HVD39
65
HVD35
165
35
HVD33, HVD38
Propagation delay time,
high-impedance-to-low-level
output
HVD34, HVD39
190
490
30
RL = 110 Ω, RE at 0 V,
D = 3 V and S1 = Z, or
D = 0 V and S1 = Y
See Figure 7
HVD35
HVD33, HVD38
Propagation delay time,
low-level-to-high-impedance
output
HVD34, HVD39
120
290
HVD35
RL = 110 Ω, RE at 3 V,
D = 3 V and S1 = Y, or
D = 0 V and S1 = Z
See Figure 6
Propagation delay time, standby-to-high-level output
Propagation delay time, standby-to-low-level output
4000
4000
RL = 110 Ω, RE at 3 V,
D = 3 V and S1 = Z, or
D = 0 V and S1 = Y
See Figure 7
(1) All typical values are at 25°C and with a 3.3-V supply.
6
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
RECEIVER ELECTRICAL CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN TYP(1)
MAX UNIT
Positive-going differential input threshold
voltage
VIT+
VIT-
IO = –8 mA
IO = 8 mA
–0.02
V
Negative-going differential input threshold
voltage
–0.20
Vhys Hysteresis voltage (VIT+ - VIT-
)
50
mV
V
VIK
Enable-input clamp voltage
II = –18 mA
–1.5
2.4
VID = 200 mV, IO = –8 mA, See Figure 8
VID = –200 mV, IO = 8 mA, See Figure 8
VO = 0 or VCC, RE at VCC
VA or VB = 12 V
VO
Output voltage
V
0.4
IO(Z) High-impedance-state output current
HVD31, HVD32,
–1
1
0.1
0.1
µA
0.05
0.06
VA or VB = 12 V, VCC = 0 V
VA or VB = -7 V
Other input at
0V
HVD34, HVD35,
HVD37, HVD39
mA
–0.10 –0.04
–0.10 –0.03
0.20
VA or VB = -7 V, VCC = 0 V
VA or VB = 12 V
IA or
IB
Bus input current
0.35
0.4
VA or VB = 12 V, VCC = 0 V
VA or VB = -7 V
0.24
HVD30, HVD33,
HVD36, HVD38
Other input at
0V
mA
–0.35 –0.18
–0.25 –0.13
–60
VA or VB = -7 V, VCC = 0 V
VIH = 0.8 V or 2 V
IIH
Input current, RE
µA
CID
Differential input capacitance
VID = 0.4 sin (4E6πt) + 0.5 V, DE at 0 V
15
pF
(1) All typical values are at 25°C and with a 3.3-V supply.
SUPPLY CURRENT CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN TYP(1)
MAX
UNIT
HVD30
2.1
6.4
7.9
1.8
2.2
3.8
HVD31, HVD32
D at 0 V or VCC and No Load
mA
HVD36, HVD37
HVD33
RE at 0 V, D at 0 V or VCC, DE at 0 V,
No load (Receiver enabled and driver disabled)
HVD34, HVD35
HVD38, HVD39
mA
RE at VCC, D at VCC, DE at 0 V,
No load (Receiver disabled and driver
disabled)
HVD33, HVD34, HVD35,
HVD38, HVD39
0.022
1
µA
ICC
Supply current
HVD33
2.1
6.5
3.5
8
HVD34, HVD35
HVD38
RE at 0 V, D at 0 V or VCC, DE at VCC
No load (Receiver enabled and driver enabled)
,
HVD39
mA
HVD33
1.8
6.2
2.5
7
HVD34, HVD35
HVD38
RE at VCC, D at 0 V or VCC, DE at VCC
No load (Receiver disabled and driver enabled)
HVD39
(1) All typical values are at 25°C and with a 3.3-V supply.
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
RECEIVER SWITCHING CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN TYP(1)
MAX UNIT
HVD30, HVD33, HVD36, HVD38
Propagation delay time,
low-to-high-level output
26
45
tPLH
tPHL
tsk(p)
HVD31, HVD32, HVD34, HVD35,
HVD37, HVD39
47
29
49
70
45
70
HVD30, HVD33, HVD36, HVD38
Propagation delay time,
high-to-low-level output
HVD31, HVD32, HVD34, HVD35,
HVD37, HVD39
VID = -1.5 V to 1.5 V,
CL = 15 pF, See Figure 9
HVD30, HVD33, HVD36, HVD37,
HVD38, HVD39
7
Pulse skew (|tPHL – tPLH|)
HVD31, HVD34, HVD32, HVD35
10
ns
5
tr
Output signal rise time
Output signal fall time
tf
6
20
tPHZ
tPZH1
tPZH2
tPLZ
tPZL1
tPZL2
Output disable time from high level
DE at 3 V
DE at 0 V
DE at 3 V
DE at 0 V
CL = 15 pF,
See Figure 10
Output enable time to high level
20
Propagation delay time, standby-to-high-level output
Output disable time from low level
4000
20
CL = 15 pF,
See Figure 11
Output enable time to low level
20
Propagation delay time, standby-to-low-level output
4000
(1) All typical values are at 25°C and with a 3.3-V supply
RECEIVER EQUALIZATION CHARACTERISTICS
over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
DEVICE
MIN
TYP(1)
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
PREVIEW
MAX UNIT
0 m
HVD36, HVD38
HVD33(2)
100 m
HVD36, HVD38
HVD33(2)
25 Mbps
150 m
200 m
200 m
250 m
300 m
500 m
HVD36, HVD38
HVD33(2)
HVD36, HVD38
HVD33(2)
HVD36, HVD38
HVD33(2)
Pseudo-random NRZ code
with a bit pattern length of
216–1, Belden 3105A cable
10 Mbps
Peak-to-peak
eye-pattern jitter
tj(pp)
HVD36, HVD38
HVD33(2)
ns
HVD36, HVD38
HVD34(2)
5 Mbps
3 Mbps
1 Mbps
HVD37, HVD39
HVD33(2)
HVD34(2)
500 m
HVD36, HVD38
HVD37, HVD39
HVD34(2)
1000 m
HVD37, HVD39
(1) All typical values are at VCC = 5 V, and temperature = 25°C.
(2) The HVD33 and the HVD34 do not have receiver equalization but are specified for comparison.
8
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
DEVICE POWER DISSIPATION – PD
PARAMETER
TEST CONDITIONS
JEDEC Low-K model
VALUE
231
135
163
92
UNITS
SOIC-8
JEDEC High-K model
JEDEC Low-K model
JEDEC High-K model
θJA
Junction-to-Ambient Thermal Resistance
Junction-to- Board Thermal Resistance
°C/W
SOIC-14
QFN-20
73
SOIC-8
44
θJB
SOIC-14
QFN-20
61
°C/W
°C/W
mW
SOIC-8
43
59
14
θJC
Junction-to-Case Thermal Resistance
Power Dissipation
Driver and receiver enabled, 50% duty cycle
square-wave signal at signaling rate:
HVD30,33 at 25 Mbps,
SOIC-14
QFN-20
HVD30,33
HVD31,34
HVD32,35
HVD30,33
HVD31,34
HVD32,35
VCC = 3.3V, TJ = 25°C, RL = 60 Ω,
CL = 50 pF (driver),
CL = 15 pF (receiver)
Typical
PD
HVD31,34 at 5 Mbps,
HVD32,35 at 1 Mbps
VCC = 3.6V, TJ = 140°C, RL = 54
Ω, CL = 50 pF (driver),
CL = 15 pF (receiver)
197
213
248
170
Worst-case
mW
TSD
Thermal Shut-down Junction Temperature
°C
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
PARAMETER MEASUREMENT INFORMATION
V
CC
I
DE
Y
Z
I
I
Y
Z
V
OD
RL
0 or 3 V
I
V
I
V
Z
V
Y
Figure 1. Driver VOD Test Circuit and Voltage and Current Definitions
375 Ω ±1%
V
CC
DE
Y
Z
D
V
OD
60 Ω ±1%
0 or 3 V
+
_
−7 V < V
< 12 V
(test)
375 Ω ±1%
Figure 2. Driver VOD With Common-Mode Loading Test Circuit
V
OD(SS)
V
OD(RING)
0 V Differential
V
OD(RING)
-V
OD(SS)
Figure 3. VOD(RING) Waveform and Definitions
VOD(RING) is measured at four points on the output waveform, corresponding to overshoot and undershoot from
the VOD(H) and VOD(L) steady state values.
V
Y
Y
V
CC
27 Ω ± 1%
27 Ω ± 1%
V
DE
Z
Z
Y
Z
D
V
OC(PP)
∆V
Input
OC(SS)
V
OC
V
C
L
= 50 pF ±20%
OC
C
L
Includes Fixture and
Instrumentation Capacitance
Input: PRR = 500 kHz, 50% Duty Cycle,t <6ns, t <6ns, Z = 50 Ω
O
r
f
Figure 4. Test Circuit and Definitions for the Driver Common-Mode Output Voltage
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
PARAMETER MEASUREMENT INFORMATION (continued)
Y
Z
»
»
W
W
W
Figure 5. Driver Switching Test Circuit and Voltage Waveforms
3 V
D
S1
Y
3 V
0 V
1.5 V
Z
1.5 V
Y
Z
VI
S1
D
0 V
VO
0.5 V
tPZH(1 & 2)
VOH
DE
RL = 110 W
1ꢀ
VO
2.3 V
CL = 50 pF
20ꢀ
~ 0 V
Input
Generator
VI 50 W
tPHZ
Generator: PRR = 50 kHz, 50ꢀ Duty Cycle, t
= 50 W
r < 6 ns, tf
< 6 ns, Z0
CL Includes Fixture and Instrumentation Capacitance
Figure 6. Driver High-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
VCC
D
3 V
0 V
S1
Z
Y
R
= 110 Ω
3 V
L
± 1%
Y
V
I
1.5 V
1.5 V
S1
D
V
O
0 V
Z
t
t
PZL(1&2)
PLZ
DE
50 Ω
VCC
C
L
= 50 pF ±20%
Input
V
I
0.5 V
Generator
V
O
2.3 V
V
OL
Generator: PRR = 50 kHz, 50% Duty Cycle, t
= 50 W
r < 6 ns, tf
< 6 ns, Z0
CL Includes Fixture and Instrumentation Capacitance
Figure 7. Driver Low-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
PARAMETER MEASUREMENT INFORMATION (continued)
I
A
A
B
I
O
R
V
A
V
I
ID
V
B
V
IC
V
O
B
V
A
+ V
B
RE
2
I
I
V
I
Figure 8. Receiver Voltage and Current Definitions
A
3 V
0 V
V
O
R
Input
1.5 V
1.5 V
V
I
V
I
50 Ω
Generator
B
1.5 V
0 V
C
L
= 15 pF
t
t
PHL
PLH
±20%
RE
V
OH
OL
90% 90%
V
O
1.5 V
10%
1.5 V
10%
CL Includes Fixture and Instrumentation Capacitance
Generator: PRR = 500 kHz, 50% Duty Cycle, t <6 ns, t <6 ns, Z = 50 Ω
V
t
t
r
f
o
r
f
Figure 9. Receiver Switching Test Circuit and Voltage Waveforms
V
CC
A
3 V
1.5 V
0 V
V
A
B
S1
1 kW ±1ꢀ
V
R
O
V
1.5V
1.5V
I
B
C
= 15 pF
L
±±0ꢀ
0V
V
RE
t
t
PHZ
PZH(1 & ±)
Input
Generator
OH
50 W
I
1.5 V
0.5V
~0 V
V
C
Includes Fixture and
O
L
Instrumentation Capacitance
Generator: PRR = 50 kHz, 50ꢀ Duty Cycle, t
= 50 W
r < 6 ns, tf
< 6 ns, Z0
Figure 10. Receiver High-Level Enable and Disable Time Test Circuit and Voltage Waveforms
V
CC
A
3 V
0 V
1.5 V
V
A
S1
1 k W ±1ꢀ
V
R
O
V
1.5V
1.5V
I
B
C
= 15 pF
L
±±0ꢀ
B
0V
V
RE
t
PZL(1 & ±)
t
PLZ
Input
Generator
CC
50 W
I
1.5 V
V
0.5V
O
C
Includes Fixture
L
V
and Instrumentation
Capacitance
OL
Generator: PRR = 50 kHz, 50ꢀ Duty Cycle, t
= 50 W
r < 6 ns, tf
< 6 ns, Z0
Figure 11. Receiver Enable Time From Standby (Driver Disabled)
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
PARAMETER MEASUREMENT INFORMATION (continued)
0 V or 3 V
DE
A
B
Y
D
R
Z
100 W
1ꢀ
100 W
1ꢀ
RE
Pulse Generator
15 ms duration
1ꢀ Duty Cycle
tr, tf £ 100 ns
0 V or 3 V
+
-
+
-
Figure 12. Test Circuit, Transient Over Voltage Test
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
DEVICE INFORMATION
LOW-POWER STANDBY MODE
When both the driver and receiver are disabled (DE low and RE high) the device is in standby mode. If the
enable inputs are in this state for less than 60 ns, the device does not enter standby mode. This guards against
inadvertently entering standby mode during driver/receiver enabling. Only when the enable inputs are held in this
state for 300 ns or more, the device is assured to be in standby mode. In this low-power standby mode, most
internal circuitry is powered down, and the supply current is typically less than 1 nA. When either the driver or the
receiver is re-enabled, the internal circuitry becomes active.
12
A
2
R
11
B
3
RE
Low-Power
Standby
4
DE
9
Y
5
D
10
Z
Figure 13. Low-Power Standby Logic Diagram
If only the driver is re-enabled (DE transitions to high) the driver outputs are driven according to the D input after
the enable times given by tPZH2 and tPZL2 in the driver switching characteristics. If the D input is open when the
driver is enabled, the driver outputs defaults to A high and B low, in accordance with the driver failsafe feature.
If only the receiver is re-enabled (RE transitions to low) the receiver output is driven according to the state of the
bus inputs (A and B) after the enable times given by tPZH2 and tPZL2 in the receiver switching characteristics. If
there is no valid state on the bus the receiver responds as described in the failsafe operation section.
If both the receiver and driver are re-enabled simultaneously, the receiver output is driven according to the state
of the bus inputs (A and B) and the driver output is driven according to the D input. Note that the state of the
active driver affects the inputs to the receiver. Therefore, the receiver outputs are valid as soon as the driver
outputs are valid.
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
FUNCTION TABLES
SN65HVD33, SN65HVD34, SN65HVD35, SN65HVD38,
SN65HVD39 DRIVER
INPUTS
OUTPUTS
D
H
DE
Y
H
L
Z
L
H
L
H
L or open
H
H
Z
H
X
Z
L
Open
SN65HVD33, SN65HVD34, SN65HVD35, SN65HVD38,
SN65HVD39 RECEIVER
DIFFERENTIAL INPUTS
VID = V(A) - V(B)
ENABLE
RE
OUTPUT
R
VID ≤ −0.2 V
−0.2 V < VID < −0.02 V
−0.02 V ≤ VID
X
L
L
?
L
L
H
Z
H
H
H
H or open
Open Circuit
L
L
L
Idle circuit
Short Circuit, V(A) = V(B)
SN65HVD30, SN65HVD31, SN65HVD32, SN65HVD36,
SN65HVD37 DRIVER
OUTPUTS
INPUT
D
Y
Z
H
L
H
L
L
L
H
H
Open
SN65HVD30, SN65HVD31, SN65HVD32, SN65HVD36,
SN65HVD37 RECEIVER
DIFFERENTIAL INPUTS
VID = V(A) - V(B)
OUTPUT
R
V
ID ≤ −0.2 V
L
?
−0.2 V < VID < −0.02 V
−0.02 V ≤ VID
H
H
H
H
Open Circuit
Idle circuit
Short Circuit, V(A) = V(B)
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
RE Input
D and DE Input
VCC
VCC
130 kW
470 W
470 W
Input
Input
9 V
9 V
125 kW
A Input
B Input
R1
VCC
VCC
R1
22 V
R3
22 V
R3
Input
Input
R2
22 V
R2
22 V
R Output
Y and Z Outputs
VCC
VCC
16 V
5 W
Output
9 V
Output
16 V
R1/R2
R3
SN65HVD30, SN65HVD33, SN65HVD36, SN65HVD38
9 kΩ
45 kΩ
SN65HVD31, SN65HVD32, SN65HVD34, SN65HVD35 SN65HVD37,
SN65HVD38, SN65HVD39
36 kΩ
180 kΩ
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
TYPICAL CHARACTERISTICS
HVD30, HVD33
HVD31, HVD34
RMS SUPPLY CURRENT
vs
RMS SUPPLY CURRENT
vs
SIGNALING RATE
SIGNALING RATE
55
60
55
50
45
40
35
30
TA =25°C RL = 54 W
TA =25°C RL = 54 W
RE = VCC CL = 50 pF
DE = VCC
RE = VCC CL = 50 pF
DE = VCC
50
45
40
35
30
VCC = 3.3 V
VCC = 3.3 V
0
5
10
15
Signaling Rate - Mbps
Figure 14.
20
25
0
1
2
3
Signaling Rate - Mbps
Figure 15.
4
5
HVD32, HVD35
RMS SUPPLY CURRENT
vs
SIGNALING RATE
60
55
50
45
40
35
TA =25°C RL = 54 W
RE = VCC CL = 50 pF
DE = VCC
VCC = 3.3 V
30
0
0.2
0.4
0.6
Signaling Rate - Mbps
Figure 16.
0.8
1
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
TYPICAL CHARACTERISTICS (continued)
HVD30, HVD33
BUS INPUT CURRENT
vs
HVD31, HVD32, HVD34, HVD35
BUS INPUT CURRENT
vs
INPUT VOLTAGE
INPUT VOLTAGE
250
200
150
100
50
60
40
20
0
TA = 25°C
TA = 25°C
RE = 0 V
DE = 0 V
RE = 0 V
DE = 0 V
VCC = 3.3 V
VCC = 3.3 V
0
-50
-20
-40
-60
-100
-150
-200
-7
-4
-1
2
5
8
11
14
-7
-4
-1
2
5
8
11
14
VI - Bus Input Voltage - V
VI - Bus Input Voltage - V
Figure 17.
Figure 18.
DRIVER LOW-LEVEL OUTPUT CURRENT
DRIVER HIGH-LEVEL OUTPUT CURRENT
vs
vs
LOW-LEVEL OUTPUT VOLTAGE
HIGH-LEVEL OUTPUT VOLTAGE
0.01
-0.01
-0.03
-0.05
-0.07
-0.09
-0.11
-0.13
0.14
0.12
0.1
VCC = 3.3 V
DE = VCC
D = 0 V
VCC = 3.3 V
DE = VCC
D = 0 V
0.08
0.06
0.04
0.02
0
-0.02
0
0.5
1
1.5
2
2.5
3
3.5
0
0.5
1
1.5
2
2.5
3
3.5
VOL - Low-Level Output Voltage - V
VOH - High-Level Output Voltage - V
Figure 19.
Figure 20.
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
TYPICAL CHARACTERISTICS (continued)
DRIVER DIFFERENTIAL OUTPUT VOLTAGE
DRIVER OUTPUT CURRENT
vs
vs
FREE-AIR TEMPERATURE
SUPPLY VOLTAGE
2.5
2.4
40
35
30
25
20
15
10
5
TA = 25°C
3.6 V
RL = 60 W
RL = 54 W
D = VCC
2.3
2.2
DE = VCC
3.3 V
2.1
2
1.9
3 V
1.8
1.7
1.6
1.5
0
-60
-40
-20
0
20
40
60
80 90
0
0.5
1
1.5
2
2.5
3
3.5
TA − Free-Air Temperature − oC
VCC Supply Voltage - V
Figure 21.
Figure 22.
HVD30, HVD33
HVD30, HVD33
DRIVER PROPAGATION DELAY
vs
DRIVER RISE/FALL TIME
vs
FREE-AIR TEMPERATURE
FREE-AIR TEMPERATURE
14
13
12
11
10
9
5
4.5
4
3 V
3 V
3.6 V
3.6 V
3.5
3
8
2.5
2
7
6
-60
-40
-20
0
20
40
60
80 90
-60
-40
-20
0
20
40
60
80 90
TA − Free-Air Temperature − oC
TA − Free-Air Temperature − oC
Figure 23.
Figure 24.
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
TYPICAL CHARACTERISTICS (continued)
RECEIVER THRESHOLD
vs
AMBIENT TEMPERATURE
RECEIVER THRESHOLD
vs
COMMON-MODE VOLTAGE
0.00
−0.02
−0.04
−0.06
−0.08
−0.10
−0.12
−0.14
−0.16
−0.18
−0.20
0.00
−0.02
−0.04
−0.06
−0.08
−0.10
−0.12
−0.14
−0.16
−0.18
−0.20
V
V
IT+
IT+
V
IT−
V
IT−
−50
−25
0
25
50
75
100
125
−7 −5 −3 −1
1
3
5
7
9
11
T − Ambient Temperature − °C
A
V
CM
− Common-Mode Voltage − V
Figure 25.
Figure 26.
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
ENABLE TIME
vs
COMMON-MODE VOLTAGE (SEE Figure 29)
1.4
800
700
600
500
400
1.2
1
3.6 V
HVD35
HVD34
3 V
0.8
0.6
0.4
300
200
Static,
No Load
HVD33
0.2
0
100
0
-7
-2
3
8
13
-60
-40
-20
0
20
40
60
80 90
TA − Free-Air Temperature − oC
V
− Common-Mode Voltage − V
(TEST)
Figure 27.
Figure 28.
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SLLS665E–SEPTEMBER 2005–REVISED MARCH 2008
TYPICAL CHARACTERISTICS (continued)
375 W ± 1%
Y
-7 V < V(TEST) < 12 V
D
60 W
± 1%
VOD
0 or 3 V
Z
DE
375 W ± 1%
Input
Generator
V
50 W
50%
tpZH(diff)
VOD (high)
1.5 V
0 V
tpZL(diff)
-1.5 V
VOD (low)
Figure 29. Driver Enable Time From DE to VOD
The time tpZL(x) is the measure from DE to VOD(x). VOD is valid when it is greater than 1.5 V.
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PACKAGE OPTION ADDENDUM
www.ti.com
12-Feb-2008
PACKAGING INFORMATION
Orderable Device
SN65HVD30D
Status (1)
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
Package Package
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)
Qty
Type
Drawing
SOIC
D
8
75 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65HVD30DG4
SN65HVD30DR
SN65HVD30DRG4
SN65HVD31D
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
D
8
75 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
75 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65HVD31DG4
SN65HVD31DR
SN65HVD31DRG4
SN65HVD32D
8
75 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
75 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65HVD32DG4
SN65HVD32DR
SN65HVD32DRG4
SN65HVD33D
8
75 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
8
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
14
14
14
14
14
14
14
14
14
14
14
14
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65HVD33DG4
SN65HVD33DR
SN65HVD33DRG4
SN65HVD34D
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65HVD34DG4
SN65HVD34DR
SN65HVD34DRG4
SN65HVD35D
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
SN65HVD35DG4
SN65HVD35DR
SN65HVD35DRG4
50 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
2500 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM
no Sb/Br)
(1) The marketing status values are defined as follows:
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
12-Feb-2008
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
11-Mar-2008
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0 (mm)
B0 (mm)
K0 (mm)
P1
W
Pin1
Diameter Width
(mm) W1 (mm)
(mm) (mm) Quadrant
SN65HVD30DR
SN65HVD31DR
SN65HVD32DR
SN65HVD33DR
SN65HVD34DR
SN65HVD35DR
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
D
D
D
D
D
D
8
8
2500
2500
2500
2500
2500
2500
330.0
330.0
330.0
330.0
330.0
330.0
12.4
12.4
12.4
16.4
16.4
16.4
6.4
6.4
6.4
6.5
6.5
6.5
5.2
5.2
5.2
9.0
9.0
9.0
2.1
2.1
2.1
2.1
2.1
2.1
8.0
8.0
8.0
8.0
8.0
8.0
12.0
12.0
12.0
16.0
16.0
16.0
Q1
Q1
Q1
Q1
Q1
Q1
8
14
14
14
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
11-Mar-2008
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
SN65HVD30DR
SN65HVD31DR
SN65HVD32DR
SN65HVD33DR
SN65HVD34DR
SN65HVD35DR
SOIC
SOIC
SOIC
SOIC
SOIC
SOIC
D
D
D
D
D
D
8
8
2500
2500
2500
2500
2500
2500
346.0
346.0
346.0
346.0
346.0
346.0
346.0
346.0
346.0
346.0
346.0
346.0
29.0
29.0
29.0
33.0
33.0
33.0
8
14
14
14
Pack Materials-Page 2
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