6N137-X007 [TOSHIBA]
High Speed Optocoupler, 10 Mbd; 高速光耦， 10万桶
| 型号： | 6N137-X007 |
| 厂家： | 
TOSHIBA |
| 描述： | High Speed Optocoupler, 10 Mbd |
| 文件： | 总8页 (文件大小：203K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
6N137
TOSHIBA Photocoupler GaAℓAs Ired & Photo IC
6N137
Degital Logic Isolation
Tele-Communication
Unit in mm
Analog Data Equipment Control
The TOSHIBA 6N137 consist of a high emitting diode and a one chip
photo IC. This unit is 8-lead DIP package.
•
•
•
•
•
LSTTL / TTL compatible: 5V Supply
Ultra high speed: 10MBd
Guaranteed performance over temperature: 0°C to 70°C
High isolation voltage: 2500Vrms min.
UL recognized: UL1577, file no. E67349
Truth Table
Input
Enable
Output
TOSHIBA
11−10C4
H
L
H
H
L
L
H
H
H
Weight: 0.54g
H
L
Pin Configurations (top view)
L
8
7
6
5
1
2
3
I
I
F
CC
V
V
CC
I
8
O
2
3
V
F
O
4
6
GND
5
I
1 : N.C.
E
7
2 : Anode
3 : Cathode
4 : N.C.
V
E
5 : GND
6 : Output(Open collector)
7 : Enable
8 : V
CC
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2007-10-01
6N137
Absolute Maximum Ratings
Characteristic
Symbol
Rating
Unit
Forward current
I
20
40
5
mA
mA
V
F
Pulse forward current
Reverse voltage
(Note 1)
I
FP
V
R
Output current
I
50
7
mA
V
O
Output voltage
V
O
Supply voltage (1 minute maximum)
V
V
7
V
CC
Enable input voltage
5.5
V
EH
(not to exceed V
by more than 500mV)
CC
Output collector power dissipation
Operating temperature range
Storage temperature range
P
85
0~70
mW
°C
O
T
opr
T
−55~125
260
°C
stg
sol
Lead solder temperature (10 s)
(Note 2)
T
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) 50% duty cycle, 1ms pulse width.
(Note 2) Soldering portion of lead: Up to 2mm from the body of the device.
Recommended Operating Conditions
Characteristic
Symbol
Min.
Max.
Unit
Input current, low level each channel
Input current, high level each channel
High level enable voltage
I
0
7
250
20
μA
mA
V
FL
I
FH
V
2.0
0
V
CC
EH
Low level enable voltage (output high)
Supply voltage, output*
V
0.8
5.5
8
V
EL
V
4.5
―
0
V
CC
Fan out (TTL load)
N
―
°C
Operating temperature
Ta
70
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
*This item denotes operating ranges, not meaning of recommended operating conditions.
Precaution
Please be careful of the followings.
A ceramic capacitor(0.1μF)should be connected from pin 8 to pin 5 to stabilize the operation of the high gain
linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead length
between capacitor and coupler should not exceed 1cm.
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2007-10-01
6N137
Electrical Characteristics
Over Recommended Temperature (Ta = 0~70°C unless otherwise noted)
Characteristic
Symbol
Test Condition
Min.
(**)Typ.
1
Max.
250
Unit
V
F
=5.5V, V =5.5V
CC
O
High level output current
I
―
μA
OH
I =250μA, V = 2.0V
E
V
V
=5.5V, I =5mA
F
=2.0V
CC
EH
Low level output voltage
V
―
0.4
0.6
V
OL
I
(sinking)=13mA
OL
High level enable current
Low level enable current
High level supply current
I
V
V
V
V
=5.5V, V =2.0V
―
―
―
−1.0
−1.6
7
―
−2.0
15
mA
mA
mA
EH
CC
CC
CC
CC
E
I
=5.5V, V =0.5V
E
EL
I
=5.5V, I =0, V =0.5V
F E
CCH
=5.5V, I =10mA
F
Low level supply current
I
―
―
12
18
mA
CCL
V =0.5V
E
Resistance (input−output)
V
=500V, Ta=25°C
−
I O
R
C
1012
―
Ω
I−O
(Note 3)
(Note 3)
R.H.≤60%
Capacitance (input−output)
f=1MHz, Ta=25°C
―
―
5
0.6
1.65
―
―
1.75
―
pF
V
I−O
Input forward voltage
V
I =10mA, Ta=25°C
F
F
Input reverse breakdown
voltage
BV
I =10μA, Ta=25°C
R
V
R
Input capacitance
C
V =0, f=1MHz
―
―
45
―
―
pF
%
IN
F
Current transfer ratio
CTR
I =5.0mA, R =100Ω
1000
F
L
(**) All typical values are at V =5V, Ta=25°C
CC
(Note 3) Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7 and 8 shorted together.
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2007-10-01
6N137
Switching Characteristics (Ta = 25°C, V = 5V)
CC
Test
Characteristic
Symbol
Test Condition
R =350Ω, C =15pF
Min.
―
Typ.
60
Max.
75
Unit
ns
Circuit
Propagation delay time to high
output level
L
L
t LH
p
1
I =7.5mA
F
Propagation delay time to
low output level
R =350Ω, C =15pF
L L
F
t HL
p
1
60
75
ns
―
I =7.5mA
Output rise−fall time
(10−90%)
R =350Ω, C =15pF
L L
F
t , t
―
30
―
ns
―
r
f
I =7.5mA
R =350Ω, C =15pF
L
L
Propagation delay time of
I =7.5mA
F
t
t
2
2
3
3
25
25
―
―
―
―
ns
―
―
―
―
ELH
EHL
enable from V
to V
V
V
=3.0V
EH
EL
EH
EL
=0.5V
R =350Ω, C =15pF
L
L
Propagation delay time of
enable from V to V
I =7.5mA
F
ns
V
V
=3.0V
EH
EL
EL
EH
=0.5V
V
=10V
CM
Common mode transient
immunity at logic high
output level
R =350Ω
L
CM
200
−500
V / μs
V / μs
H
V
=2V
O(min.)
I =0mA
F
V
=10V
CM
Common mode transient
Immunity at logic low
output level
R =350Ω
L
CM
L
V
=0.8V
O(max.)
I =5mA
F
4
2007-10-01
6N137
Test Circuit 1.
5V
t
and t
pLH
pHL
Pulse
8
1
2
VCC
generator
ZO = 50Ω
tr = 5ns
350mV(IF = 7.5mA)
175mV(IF = 3.75mA)
0.1μF
R
L
Input
7
By-
t
pass
pHL
6
5
3
4
IF
Output
t
VOH
CL
pLH
Monitoring
V
O
monitor-
ing
GND
Node
Output V
O
1.5V
VOL
node
･ C is approximately 15pF which includes probe and stray wiring capacitance.
L
Test Circuit 2.
Input V
Monitoring node
E
t
and t
ELH
EHL
Pulse
generator
ZO = 50Ω
tr = 5ns
5V
8
1
2
VCC
3.0V
1.5V
0.1μF
R
L
7.5mA
dc
7
Input V
E
By-
V
O
t
pass
EHL
I
F
6
5
3
4
Output
monitor-
ing
VOH
VOL
t
CL
ELH
GND
Output V
O
1.5V
node
･ C is approximately 15pF which includes prove and stray wiring capacitance.
L
Test Circuit 3.
Transient immunity and typical waveforms
8
7
1
2
5V
L
VCC
10V
0V
0.1μF
IF
90%
tr
10%
R
By-
pass
90%
tf
10%
A
6
5
3
V
O
B
4
GND
5V
VO
V
FF
Pulse gen.
Switch at A : IF = 0mA
VCM
Z
O
= 50Ω.
VO
VOL
Switching at B : IF = 5mA
5
2007-10-01
6N137
ΔV / ΔTa – I
I
– V
F
F
F
F
100
10
-2.6
Ta = 25°C
-2.4
-2.2
1
0.1
-2.0
-1.8
-1.6
-1.4
0.01
0.1
3
1
1.0
1.6
0.3
10
30
1.2
1.4
1.8
Forward voltage
V
(V)
F
Forward current
I
(mA)
F
I
- Ta
OH
V
– I
F
10
O
V
V
V
= 1V
F
8
6
= 5.5V
CC
5
3
V
= 5V
CC
= 5.5V
O
Ta = 25°C
1
R
L
350Ω
1kΩ
=
4
0.5
0.3
4kΩ
2
0
0.1
3
1
6
20
40
2
5
60
80
0
4
0
Forward current
I
(mA)
Ambient temperature Ta (°C)
F
V
– Ta
O L
V
– I
F
O
I
= 5mA
F
V
V
= 5.5V
CC
8
0.5
V
= 5V
= 2V
CC
E
R
L
= 350Ω
R
L
= 4kΩ
6
4
I
= 16mA
OL
0.4
0.3
12.8mA
9.6mA
Ta = 70°C
0°C
6.4mA
2
0.2
0
6
5
20
80
4
0
40
1
0
2
60
3
Forward current
I
(mA)
Ambient temperature Ta (°C)
F
6
2007-10-01
6N137
t
t
- I
pHL, pLH F
t
t
- Ta
pHL, pLH
120
120
100
R
L
4kΩ
=
t
pLH
tp
LH
RL = 4kΩ
100
80
350Ω
1kΩ
tp
tpLH
1kΩ
LH
80
350Ω
350Ω
350Ω
tpHL tpLH
60
60
40
1kΩ
4kΩ
tp
HL
1kΩ
4kΩ
40
20
0
V
= 5V
CC
Ta = 25°C
= 5V
20
0
I
= 7.5mA
F
V
CC
50
10
20
60
30
40
0
70
5
7
9
11
13
15
17
19
Forward current
I
(mA)
F
Ambient temperature Ta (°C)
t
t
- T
EHL, ELH a
t t – T
r, f
a
80
70
320
300
V
V
= 5V
= 3V
V
I
= 5V
CC
EH
CC
= 7.5mA
F
R
L
= 4kΩ
t
R
L
= 4kΩ
1kΩ
ELH
I
= 7.5mA
F
t
f
280
80
60
50
40
30
20
t
f
60
40
20
350Ω
350Ω
t
f
1kΩ
t
ELH
t
r
350Ω
350Ω
t
ELH
1kΩ
4kΩ
0
0
t
10
20
30
40
50
60
70
EHL
1kΩ
4kΩ
10
0
Ambient temperature Ta (°C)
70
20
30
40
50
60
0
10
Ambient temperature Ta (°C)
7
2007-10-01
6N137
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,
cut, crush or dissolve chemically.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
8
2007-10-01
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