MG150J7KS60 [TOSHIBA]
TOSHIBA GTR MODULE SILICON N CHANNEL IGBT; 东芝GTR模块硅N沟道IGBT型号: | MG150J7KS60 |
厂家: | TOSHIBA |
描述: | TOSHIBA GTR MODULE SILICON N CHANNEL IGBT |
文件: | 总5页 (文件大小:298K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MG150J7KS60
TOSHIBA GTR Module Silicon N Channel IGBT
MG150J7KS60 (600V/150A 7in1)
High Power Switching Applications
Motor Control Applications
·
·
·
·
Integrates inverter and brake power circuit into a single package
The electrodes are isolated from case.
Low thermal resistance
V
= 1.6 V (typ.)
CE (sat)
Equivalent Circuit
P
14
3
4
7
8
11
12
15
U
V
W
B
16
17
18
19
20
N
Signal Terminal
1. Open
5. Open
9. Open
13. Open
17. G (X)
2. Open
3. G (U)
7. G (V)
11. G (W)
15. TH2
19. G (Z)
4. E (U)
8. E (V)
12. E (W)
16. G (B)
20. E (L)
6. Open
10. Open
14. TH1
18. G (Y)
1
2001-10-03
MG150J7KS60
Package Dimensions: 2-108G1B
1. Open
5. Open
9. Open
13. Open
17. G (X)
2. Open
6. Open
10. Open
14. TH1
18. G (Y)
3. G (U)
7. G (V)
11. G (W)
15. TH2
19. G (Z)
4. E (U)
8. E (V)
12. E (W)
16. G (B)
20. E (L)
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MG150J7KS60
Maximum Ratings (Ta = 25°C)
Stage
Characteristics
Symbol
Rating
Unit
Collector-emitter voltage
Gate-emitter voltage
V
V
600
±20
V
V
CES
GES
DC
1 ms
DC
I
150
C
Collector current
Forward current
A
A
Inverter
I
300
CP
I
150
F
1 ms
I
300
FM
Collector power dissipation (Tc = 25°C)
Collector-emitter voltage
P
750
W
V
C
V
CES
V
GES
600
Gate-emitter voltage
±20
V
DC
1 ms
I
75
C
Collector current
A
I
150
CP
Brake
Collector power dissipation (Tc = 25°C)
P
375
W
V
C
R
Reverse voltage
V
600
DC
I
75
F
Forward current
A
1 ms
I
150
FM
Junction temperature
Storage temperature range
Isolation voltage
T
150
°C
°C
V
j
T
-40~125
2500 (AC 1 min)
2 (M4)
3 (M5)
stg
isol
Module
V
Terminal
Mounting
¾
¾
Screw torque
N・m
Electrical Characteristics (T = 25°C)
j
1. Inverter stage
Characteristics
Gate leakage current
Symbol
Test Condition
= ±20 V, V = 0
Min
Typ.
Max
Unit
I
I
V
V
V
¾
¾
5.0
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
±500
1.0
nA
mA
V
GES
GE
CE
CE
CE
Collector cut-off current
= 600 V, V
= 0
GE
CES
Gate-emitter cut-off voltage
V
= 5 V, I = 150 mA
6.5
1.6
¾
8.0
GE (off)
C
T = 25°C
j
2.2
V
= 15 V,
GE
Collector-emitter saturation voltage
V
V
CE (sat)
I
= 150 A
C
T = 125°C
j
2.2
Input capacitance
Turn-on delay time
C
ies
V
= 10 V, V = 0, f = 1 MHz
GE
25000
¾
¾
pF
CE
t
1.00
1.20
0.50
0.30
2.2
d (on)
V
V
= 300 V, I = 150 A
C
Switching time
Turn-off time
Fall time
t
CC
GE
¾
off
= ±15 V, R = 15 W
ms
G
t
f
¾
(Note 1)
Reverse recovery time
Forward voltage
t
¾
rr
V
I
= 150 A
F
2.0
V
F
Note 1: Switching time test circuit & timing chart
3
2001-10-03
MG150J7KS60
2. Brake stage
Characteristics
Symbol
Test Condition
= ±20 V, V = 0
Min
Typ.
Max
Unit
Gate leakage current
I
I
V
V
V
¾
¾
5.0
¾
¾
¾
¾
¾
¾
¾
¾
¾
¾
±500
1.0
nA
mA
V
GES
GE
CE
CE
CE
Collector cut-off current
Gate-emitter cut-off voltage
= 600 V, V
= 0
GE
CES
V
= 5 V, I = 75 mA
6.5
1.6
¾
8.0
GE (off)
C
T = 25°C
j
2.2
V
= 15 V,
GE
Collector-emitter saturation voltage
V
V
CE (sat)
I
= 75 A
C
T = 125°C
j
2.2
Input capacitance
Turn-on delay time
C
ies
V
= 10 V, V
= 0, f = 1MHz
GE
12000
¾
¾
pF
CE
t
1.00
1.20
0.50
1.0
d (on)
V
V
= 300 V, I = 75 A
CC
GE
C
Switching time
= ±15 V, R = 24 W
ms
Turn-off time
Fall time
t
¾
G
off
(Note 1)
t
¾
f
Reverse current
Forward voltage
I
V
= 600 V
R
¾
mA
V
R
V
I
= 75 A
F
2.1
2.6
F
Note 1: Switching time test circuit & timing chart
3. Module (Tc = 25°C)
Characteristics
Zero-power resistance
Symbol
Test Condition
Min
Typ.
Max
Unit
R25
ITM = 0.2 mA
¾
¾
¾
¾
¾
¾
¾
100
4390
¾
¾
kW
B value
B25/85
Tc = 25°C/Tc = 85°C
Inverter IGBT stage
Inverter FRD stage
Brake IGBT stage
Brake FRD stage
¾
¾
K
0.167
0.313
0.333
1.000
¾
¾
Junction to case thermal resistance
Case to fin thermal resistance
R
°C/W
°C/W
th (j-c)
th (c-f)
¾
¾
R
0.05
Switching Time Test Circuit & Timing Chart
90%
V
GE
10%
R
G
G
-V
GE
V
CC
I
rr
90%
t
rr
I
C
R
10%
10%
t
t
t
f
d (on)
d (off)
4
2001-10-03
MG150J7KS60
RESTRICTIONS ON PRODUCT USE
000707EAA
· TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
· The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
· The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
· The information contained herein is subject to change without notice.
5
2001-10-03
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