SSM5H01TU [TOSHIBA]

DC-DC Converter; DC-DC变换器
SSM5H01TU
型号: SSM5H01TU
厂家: TOSHIBA    TOSHIBA
描述:

DC-DC Converter
DC-DC变换器

晶体 小信号场效应晶体管 开关 光电二极管
文件: 总10页 (文件大小:194K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSM5H01TU  
Silicon N Channel MOS Type (U-MOSII)/Silicon Epitaxial Schottky Barrier Diode  
SSM5H01TU  
DC-DC Converter  
Unit: mm  
Combined Nch MOSFET and Schottky Diode into one Package.  
Low R and Low V  
DS (ON)  
F
Absolute Maximum Ratings (Ta = 25°C) MOSFET  
Characteristics  
Drain-Source voltage  
Symbol  
Rating  
Unit  
V
30  
±20  
1.4  
2.8  
0.5  
0.8  
150  
V
V
DS  
Gate-Source voltage  
V
GSS  
DC  
I
D
Drain current  
A
Pulse  
I
(Note 2)  
(Note 1)  
DP  
P
D
Drain power dissipation  
Channel temperature  
W
t = 10s  
T
ch  
°C  
UFV  
Absolute Maximum Ratings (Ta = 25°C) SCHOTTKY  
DIODE  
JEDEC  
JEITA  
Characteristics  
Symbol  
Rating  
Unit  
TOSHIBA  
2-2R1A  
Maximum (peak) reverse voltage  
Reverse voltage  
V
25  
20  
V
V
A
RM  
V
Weight: 7 mg (typ.)  
R
Average forward current  
I
0.5  
O
Peak one cycle surge forward current  
(non-repetitive)  
I
2 (50 Hz)  
125  
A
FSM  
Junction temperature  
T
j
°C  
Absolute Maximum Ratings (Ta = 25°C) MOSFET, DIODE COMMON  
Characteristics  
Storage temperature  
Operating temperature  
Symbol  
Rating  
55~125  
40~100  
Unit  
°C  
T
stg  
T
opr  
°C  
(Note 3)  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Mounted on FR4 board  
(25.4 mm × 25.4 mm × 1.6 t, Cu pad: 645 mm2)  
Note 2: The pulse width limited by max channel temperature.  
Note 3: Operating temperature limited by max channel temperature and max junction temperature.  
1
2007-11-01  
SSM5H01TU  
Marking  
Equivalent Circuit  
5
4
5
4
KEF  
2
1
3
1
2
3
Handling Precaution  
When handling individual devices (which are not yet mounting on a circuit board), be sure that the  
environment is protected against electrostatic discharge. Operators should wear anti-static clothing and use  
containers and other objects that are made of anti-static materials.  
The Channel-to-Ambient thermal resistance R  
and the drain power dissipation P vary according to  
D
th (ch-a)  
the board material, board area, board thickness and pad area. When using this device, please take heat  
dissipation fully into account.  
2
2007-11-01  
SSM5H01TU  
MOSFET  
Electrical Characteristics (Ta = 25°C)  
Characteristic  
Gate leakage current  
Symbol  
Test Condition  
= ±16 V, V = 0  
Min  
Typ.  
Max  
Unit  
I
V
30  
15  
1.0  
0.9  
±1  
μA  
GSS  
GS  
DS  
V
V
I
I
= 1 mA, V  
= 1 mA, V  
= 0  
(BR) DSS  
(BR) DSX  
D
D
GS  
GS  
Drain-Source breakdown voltage  
V
= -20 V  
Drain Cut-off current  
I
V
V
V
= 30 V, V  
= 0  
1
μA  
V
DSS  
DS  
DS  
DS  
GS  
Gate threshold voltage  
Forward transfer admittance  
V
= 5 V, I = 0.1 mA  
2.4  
th  
D
|Y |  
fs  
= 5 V, I = 0.7 A  
(Note 4)  
(Note 4)  
(Note 4)  
1.8  
140  
250  
106  
15  
S
D
I
I
= 0.7 A, V  
= 10 V  
= 4 V  
200  
450  
D
D
GS  
GS  
Drain-Source ON resistance  
R
mΩ  
DS (ON)  
= 0.7 A, V  
Input capacitance  
C
V
V
V
V
V
= 15 V, V  
= 15 V, V  
= 15 V, V  
= 0, f = 1 MHz  
= 0, f = 1 MHz  
= 0, f = 1 MHz  
pF  
pF  
pF  
iss  
rss  
oss  
on  
DS  
DS  
DS  
DD  
GS  
GS  
GS  
GS  
Reverse transfer capacitance  
Output capacitance  
C
C
t
28  
Turn-on time  
Turn-off time  
= 15 V, I = 0.7 A  
18  
D
Switching time  
ns  
= 0~4 V, R = 10 Ω  
t
10  
G
off  
Note 4: Pulse measurement  
Switching Time Test Circuit  
4 V  
90%  
(a)Test circuit  
(b) V  
(c) V  
IN  
10%  
10 μs  
0
V
= 15 V  
= 10 Ω  
DD  
I
D
4 V  
0
OUT  
V
R
DD  
G
IN  
90%  
10%  
<
Duty 1%  
=
OUT  
V
: t , t < 5 ns  
IN  
r
f
Common source  
V
DS (ON)  
t
t
f
r
Ta = 25°C  
V
t
t
off  
DD  
on  
Precaution  
V
th  
can be expressed as voltage between gate and source when low operating current value is I = 100 μA for  
D
this product. For normal switching operation, V  
requires higher voltage than V and V  
requires  
GS (on)  
th  
GS (off)  
lower voltage than V  
.
th  
(Relationship can be established as follows: V  
< V < V  
)
GS (off)  
th  
GS (on)  
Please take this into consideration for using the device.  
3
2007-11-01  
SSM5H01TU  
Schottky Diode  
Electrical Characteristics (Ta = 25°C)  
Characteristic  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
V
V
I
I
= 0.3 A  
= 0.5 A  
0.38  
0.43  
0.45  
V
V
F (1)  
F (2)  
F
F
Forward voltage  
Reverse current  
I
V
V
= 20 V  
50  
μA  
pF  
R
R
R
Total capacitance  
C
= 0 V, f = 1 MHz  
46  
T
Precaution  
The schottky barrier diode of this product are having large-reverse-current-leakage characteristic compare to  
the other switching diodes. This current leakage and not proper operating temperature or voltage may cause  
thermal runaway. Please take forward and reverse loss into consideration when you design.  
4
2007-11-01  
SSM5H01TU  
MOSFET Electrical Characteristics Graph  
I
– V (MOSFET)  
DS  
I
– V (MOSFET)  
GS  
D
D
3
2.5  
2
10000  
1000  
100  
10  
Common Source  
Common Source  
V = 5 V  
10V  
4.0V  
Ta = 25°C  
DS  
3.5V  
25°C  
Ta = 100°C  
1.5  
1
25°C  
VGS=3.0V  
1
0.5  
0
0.1  
V
= 2.5 V  
GS  
0.01  
0
0.5  
1
1.5  
2
0
1
2
3
4
5
Drain-Source voltage  
V
(V)  
Gate-Source voltage  
V
(V)  
DS  
GS  
R
– I (MOSFET)  
D
DS (ON)  
R
– V  
(MOSFET)  
GS  
DS (ON)  
0.5  
0.4  
0.3  
0.2  
0.1  
0
1.0  
0.8  
0.6  
0.4  
0.2  
0
Common Source  
Common Source  
= 0.7 A  
Ta = 25°C  
I
D
4 V  
V
= 10 V  
GS  
Ta = 100°C  
25°C  
15  
25°C  
3
0
5
10  
20  
0
0.5  
1
1.5  
2
2.5  
Drain current  
I
(A)  
Gate-Source voltage  
V
(V)  
D
GS  
R
Ta (MOSFET)  
V
Ta (MOSFET)  
th  
DS (ON)  
0.5  
3
Common Source  
= 0.7A  
Common Source  
V = 5 V  
DS  
I
D
2.5  
2
0.4  
0.3  
0.2  
0.1  
0
I
= 0.1 mA  
D
4 V  
1.5  
1
V
= 10 V  
GS  
0.5  
0
50  
0
50  
100  
25  
0
25  
50  
75  
100  
Ambient temperature Ta (°C)  
Ambient temperature Ta (°C)  
5
2007-11-01  
SSM5H01TU  
|Y | – I (MOSFET)  
fs  
C – V (MOSFET)  
DS  
D
3
1
500  
300  
C
iss  
100  
0.3  
0.1  
50  
30  
C
oss  
C
rss  
10  
0.01  
0.03  
5
3
Common Source  
= 5 V  
Common Source  
Ta = 25°C  
f = 1 MHz  
V
DS  
Ta = 25°C  
V
= 0 V  
GS  
0.001  
1
0.1  
1
10  
100  
1000  
10000  
1
10  
100  
Drain current  
I
(mA)  
Drain-Source voltage  
V
(V)  
D
DS  
Dynamic input characteristic (MOSFET)  
t – I (MOSFET)  
D
10  
9
8
7
6
5
4
3
2
1
0
1000  
Common Source  
V
V
= 15 V  
DD  
GS  
= 04 V  
Ta = 25°C  
= 10 Ω  
10 V  
R
G
100  
10  
1
t
off  
V
= 24 V  
DD  
t
f
t
on  
Common Source  
= 1.4 A  
Ta = 25°C  
I
D
t
r
0
0.5  
1
1.5  
2
2.5  
3
3.5  
0.01  
0.1  
1
10  
Total gate charge  
Q
g
(nC)  
Drain current  
I
(A)  
D
I
– V (MOSFET)  
DS  
DR  
3
2.5  
2
Common Source  
= 0  
V
GS  
Ta = 25°C  
I
DR  
1.5  
1
0.5  
0
0
0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2  
Drain-Source voltage  
V
(V)  
DS  
6
2007-11-01  
SSM5H01TU  
Safe operating area (MOSFET)  
3
1 ms*  
I
max (pulse)  
D
I
max (continuous)  
D
10 ms*  
1
10 s*  
DC operation  
Ta = 25°C  
0.3  
0.1  
Mounted on FR4 board  
(25.4 mm × 25.4 mm × 1.6 t,  
Cu Pad: 645 mm2)  
0.03  
0.01  
*: Single pulse  
Ta = 25°C  
Curves must be derated  
linearly with increase in  
temperature.  
V
DSS  
max  
.
0.1  
1
10  
100  
Drain-Source voltage  
V
(V)  
DS  
P
Ta (MOSFET)  
D
1.2  
1
Mounted on FR4 board  
(25.4 mm × 25.4 mm × 1.6 t,  
2
Cu Pad: 645 mm  
)
t = 10 s  
0.8  
0.6  
DC  
0.4  
0.2  
0
0
50  
100  
150  
Ambient temperature Ta (°C)  
7
2007-11-01  
SSM5H01TU  
SBD Electrical Characteristics Graph  
I
– V (SBD)  
F
I
– V (SBD)  
R R  
F
1000  
100  
10  
10  
1
100  
75  
75  
50  
100  
0.1  
50  
Ta = 25°C  
Ta = 25°C  
0.01  
0
Pulse measurement  
5
1
0
0.001  
0.1  
0.2  
0.3  
0.4  
0.5  
0.6  
0.7  
0
10  
15  
20  
Forward voltage  
V
(V)  
Reverse voltage  
V
(V)  
F
R
C – V (SBD)  
T R  
3000  
1000  
f = 1 MHz  
Ta = 25°C  
100  
10  
1
0.01  
0.1  
1
10  
100  
Reverse voltage  
V
(V)  
R
8
2007-11-01  
SSM5H01TU  
Transient thermal impedance Graph  
r
th  
– t (MOSFET)  
w
1000  
Single pulse  
Mounted on FR4 board  
(25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 645 mm  
2
)
100  
10  
1
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse width  
t
(s)  
w
r
th  
– t (SBD)  
w
1000  
100  
10  
Single pulse  
Mounted on FR4 board  
(25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 645 mm2)  
1
0.001  
0.01  
0.1  
1
10 100  
1000  
Pulse width  
t
(s)  
w
9
2007-11-01  
SSM5H01TU  
RESTRICTIONS ON PRODUCT USE  
20070701-EN GENERAL  
The information contained herein is subject to change without notice.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc.  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his  
document shall be made at the customer’s own risk.  
The products described in this document shall not be used or embedded to any downstream products of which  
manufacture, use and/or sale are prohibited under any applicable laws and regulations.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patents or other rights of  
TOSHIBA or the third parties.  
Please contact your sales representative for product-by-product details in this document regarding RoHS  
compatibility. Please use these products in this document in compliance with all applicable laws and regulations  
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses  
occurring as a result of noncompliance with applicable laws and regulations.  
10  
2007-11-01  

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