SSM6L14FE(TE85L,F) [TOSHIBA]

TRANSISTOR,MOSFET,PAIR,COMPLEMENTARY,20V V(BR)DSS,800MA I(D),TSOP;
SSM6L14FE(TE85L,F)
型号: SSM6L14FE(TE85L,F)
厂家: TOSHIBA    TOSHIBA
描述:

TRANSISTOR,MOSFET,PAIR,COMPLEMENTARY,20V V(BR)DSS,800MA I(D),TSOP

文件: 总9页 (文件大小:233K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSM6L14FE  
TOSHIBA Field-Effect Transistor Silicon N / P Channel MOS Type  
SSM6L14FE  
Power Management Switch Applications  
High-Speed Switching Applications  
Unit: mm  
1.6±0.05  
N-ch: 1.5-V drive  
P-ch: 1.5-V drive  
1.2±0.05  
N-ch, P-ch, 2-in-1  
Low ON-resistance Q1 N-ch:R  
= 330 mΩ (max) (@V  
= 2.5 V)  
GS  
DS(ON)  
R
1
2
3
6
= 240 mΩ (max) (@V = 4.5 V)  
GS  
= 440 mΩ (max) (@V = -2.5 V)  
GS  
DS(ON)  
DS(ON)  
Q2 P-ch:R  
5
4
R
= 300 mΩ (max) (@V = -4.5 V)  
GS  
DS(ON)  
Q1 Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
V
20  
±10  
0.8  
1.6  
V
V
DSS  
Gate-source voltage  
GSS  
DC  
I
D
1.Source1  
2.Gate1  
4.Source2  
5.Gate2  
Drain current  
A
Pulse  
I
DP  
3.Drain2  
6.Drain1  
Q2 Absolute Maximum Ratings (Ta = 25°C)  
ES6  
JEDEC  
JEITA  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
V
20  
±8  
V
V
DSS  
TOSHIBA  
2-2N1D  
Gate-source voltage  
GSS  
DC  
I
0.72  
1.44  
Weight: 3.0 mg (typ.)  
D
Drain current  
A
Pulse  
I
DP  
Absolute Maximum Ratings (Ta = 25 °C) (Q1, Q2 Common)  
Characteristics  
Power dissipation  
Symbol  
P (Note 1)  
Rating  
Unit  
150  
150  
mW  
°C  
D
Channel temperature  
T
ch  
Storage temperature range  
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the  
operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling  
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated  
failure rate, etc).  
Note1: Mounted on an FR4 board. (total dissipation)  
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 0.135 mm2 × 6 )  
Marking  
Equivalent Circuit (top view)  
6
5
4
6
5
4
Q1  
Q2  
LL5  
1
2
3
1
2
3
1
2010-03-25  
SSM6L14FE  
Q1 Electrical Characteristics (Ta = 25°C)  
Characteristics  
Symbol  
Test Conditions  
Min  
Typ.  
Max  
Unit  
V
V
V
I
I
= 1 mA, V  
= 1 mA, V  
= 0 V  
20  
12  
(BR) DSS  
(BR) DSX  
D
D
GS  
GS  
Drain-source breakdown voltage  
= - 10 V  
Drain cutoff current  
I
V
V
V
V
= 20 V, V = 0 V  
GS  
1
μA  
μA  
V
DSS  
GSS  
DS  
GS  
DS  
DS  
Gate leakage current  
Gate threshold voltage  
Forward transfer admittance  
I
= ±8 V, V = 0 V  
±1  
1.0  
DS  
V
= 3 V, I = 1 mA  
0.35  
1.05  
th  
D
|Y |  
fs  
= 3 V, I = 500 mA  
(Note 2)  
= 4.5 V (Note 2)  
= 2.5 V (Note 2)  
= 1.8 V (Note 2)  
= 1.5 V (Note 2)  
2.1  
185  
245  
310  
370  
90  
S
D
I
I
I
I
= 500 mA, V  
= 400 mA, V  
= 250 mA, V  
= 150 mA, V  
240  
330  
450  
600  
D
D
D
D
GS  
GS  
GS  
GS  
Drain-source ON-resistance  
R
mΩ  
DS (ON)  
Input capacitance  
C
C
iss  
V
= 10 V, V  
= 0 V, f = 1 MHz  
GS  
pF  
nC  
Output capacitance  
Reverse transfer capacitance  
Total gate charge  
21  
DS  
oss  
C
15  
rss  
Q
g
2.00  
1.02  
0.98  
18  
V
V
= 10 V, I = 0.8 A  
D
DS  
GS  
Gate-source charge  
Gate-drain charge  
Q
gs  
Q
gd  
= 4.5 V  
Turn-on time  
Switching time  
t
t
V
V
= 10 V, I = 200 mA  
D
on  
off  
DD  
GS  
ns  
V
= 0 to 2.5 V, R = 4.7 Ω  
Turn-off time  
50  
G
Drain-source forward voltage  
V
I
= -0.8 A, V = 0 V  
GS  
(Note 2)  
-0.84  
-1.2  
DSF  
D
Q2 Electrical Characteristics (Ta = 25°C)  
Characteristics  
Symbol  
Test Conditions  
Min  
Typ.  
Max  
Unit  
V
V
V
I
I
= -1 mA, V  
= -1 mA, V  
= 0 V  
= 8 V  
-20  
-12  
(BR) DSS  
(BR) DSX  
D
D
GS  
GS  
Drain-source breakdown voltage  
Drain cutoff current  
I
V
V
V
V
= -20 V, V = 0 V  
GS  
-10  
μA  
μA  
V
DSS  
GSS  
DS  
GS  
DS  
DS  
Gate leakage current  
Gate threshold voltage  
Forward transfer admittance  
I
= ±8 V, V = 0 V  
-0.3  
850  
±1  
-1.0  
DS  
V
= -3 V, I = -1 mA  
th  
D
|Y |  
fs  
= -3 V, I = -400 mA  
(Note2)  
mS  
D
I
I
I
I
= -400 mA, V  
= -4.5 V (Note2)  
= -2.5 V (Note2)  
= -1.8 V (Note2)  
0.25  
0.34  
0.44  
0.55  
110  
28  
0.30  
0.44  
0.67  
1.04  
D
D
D
D
GS  
GS  
GS  
= -200 mA, V  
= -100 mA, V  
Drain-source ON-resistance  
R
Ω
DS (ON)  
= -50 mA, V  
= -1.5 V  
(Note2)  
GS  
Input capacitance  
Output capacitance  
C
C
iss  
V
= -10 V, V  
= 0 V, f = 1 MHz  
GS  
pF  
nC  
DS  
oss  
Reverse transfer capacitance  
Total gate charge  
C
rss  
20  
Q
g
1.76  
1.22  
0.54  
11  
V
V
= -10 V, I = -720 mA  
DS  
DS  
GS  
Gatesource charge  
Gatedrain charge  
Q
Q
gs  
= -4.5 V  
gd  
Turn-on time  
Switching time  
t
t
on  
off  
V
V
= -10 V, I = -100 mA  
D
DD  
GS  
ns  
V
= 0 to -2.5 V, R = 50 Ω  
G
Turn-off time  
38  
Drain-source forward voltage  
Note 2: Pulse test  
V
I
= 720 mA, V = 0 V  
GS  
(Note2)  
0.85  
1.2  
DSF  
D
2
2010-03-25  
SSM6L14FE  
Q1 Switching Time Test Circuit  
(a) Test Circuit  
(b) V  
(c) V  
IN  
2.5 V  
0 V  
90%  
OUT  
2.5 V  
0
IN  
10%  
V
DD  
OUT  
10 μs  
= 10 V  
90%  
10%  
V
DD  
V
R
DD  
V
DS (ON)  
= 4.7 Ω  
t
f
t
r
G
Duty 1%  
: t , t < 5 ns  
t
t
off  
on  
V
IN  
r f  
Common Source  
Ta = 25°C  
Q2 Switching Time Test Circuit  
(a) Test Circuit  
(b) V  
(c) V  
IN  
0 V  
90%  
OUT  
0
IN  
10%  
2.5 V  
2.5V  
R
L
V
DS (ON)  
90%  
10%  
OUT  
10 μs  
V
DD  
V
=− 10 V  
= 50 Ω  
DD  
V
DD  
R
G
t
t
f
r
Duty 1%  
: t , t < 5 ns  
Common Source  
V
IN  
r f  
t
t
off  
on  
Ta = 25°C  
Q1 Usage Considerations  
Let V be the voltage applied between gate and source that causes the drain current (I ) to below (1 mA for the Q1 of  
th  
D
the SSM6L14FE). Then, for normal switching operation, V  
must be higher than V and V  
must be lower  
GS(off)  
GS(on)  
th,  
than V This relationship can be expressed as: V  
< V < V  
th GS(on).  
th.  
GS(off)  
Take this into consideration when using the device.  
Q2 Usage Considerations  
Let V be the voltage applied between gate and source that causes the drain current (I ) to below (1 mA for the Q2  
th  
D
of the SSM6L14FE). Then, for normal switching operation, V  
must be higher than V and V  
th,  
must be lower  
GS(off)  
GS(on)  
than V This relationship can be expressed as: V  
< V < V  
th GS(on).  
th.  
GS(off)  
Take this into consideration when using the device.  
Handling Precaution  
When handling individual devices that are not yet mounted on a circuit board, make sure that the environment is  
protected against electrostatic discharge. Operators should wear antistatic clothing, and containers and other objects that  
come into direct contact with devices should be made of antistatic materials.  
Thermal resistance R  
and power dissipation P vary depending on board material, board area, board thickness  
D
th (ch-a)  
and pad area. When using this device, please take heat dissipation into consideration  
3
2010-03-25  
SSM6L14FE  
Q1 (N-ch MOSFET)  
I
– V  
DS  
D
I – V  
D GS  
10000  
1000  
100  
10  
2000  
Common Source  
Ta = 25°C  
Common Source  
= 3 V  
V
DS  
Pulse Test  
Pulse Test  
10 V 4 V 2.5 V 1.8 V  
1.5 V  
1000  
Ta = 100°C  
25°C  
V
= 1.2 V  
GS  
25°C  
1
0.1  
0
0
1
2
0
0.2  
0.4  
0.6  
0.8  
1.0  
Drain–source voltage  
V
(V)  
Gate–source voltage  
V
(V)  
DS  
GS  
R
– V  
GS  
R
– V  
DS (ON)  
DS (ON)  
GS  
1000  
500  
0
1000  
500  
0
Common Source  
= 0.15 A  
Common Source  
= 0.5 A  
I
I
D
D
Pulse Test  
Pulse Test  
25°C  
25°C  
Ta = 100°C  
Ta = 100°C  
25°C  
25°C  
0
2
4
6
8
10  
0
2
4
6
8
10  
Gate–source voltage  
V
(V)  
Gate–source voltage  
V
(V)  
GS  
GS  
R
– I  
R
Ta  
DS (ON)  
D
DS (ON)  
1000  
500  
0
1000  
500  
0
Common Source  
Ta = 25°C  
Common Source  
Pulse Test  
Pulse Test  
1.8 V, 0.25 A  
V
= 1.5 V  
V
= 1.5 V, I = 0.15 A  
D
GS  
GS  
1.8 V  
2.5 V  
4.5 V  
4.5 V, 0.5 A  
0
2.5 V, 0.4 A  
50  
0
1000  
2000  
50  
100  
150  
Drain current  
I
(mA)  
Ambient temperature Ta (°C)  
D
4
2010-03-25  
SSM6L14FE  
Q1 (N-ch MOSFET)  
Y – I  
fs  
V
Ta  
D
th  
10  
1.0  
Common Source  
= 1 mA  
5
3
I
D
V
= 3 V  
DS  
1
0.5  
0.3  
0.5  
0.1  
0.05  
0.03  
Common Source  
V
= 3 V  
DS  
Ta = 25°C  
Pulse Test  
0.01  
0
50  
1
10  
100  
1000  
10000  
0
50  
100  
150  
Drain current  
I
(mA)  
D
Ambient temperature Ta (°C)  
Capacitance – V  
I
– V  
DS  
DS  
DR  
1000  
500  
10000  
1000  
100  
Common Source  
= 0 V  
Pulse Test  
V
GS  
D
IDR  
100  
50  
C
iss  
G
S
25°C  
Ta = 100°C  
C
oss  
25°C  
C
10  
5
rss  
10  
1
Common Source  
= 0 V  
V
GS  
f = 1 MHz  
Ta = 25°C  
1
0
0.5  
1  
1.5  
0.1  
0.5  
1
5
10  
50 100  
Drain–source voltage  
V
(V)  
DS  
Drain–source voltage  
V
(V)  
DS  
Dynamic Input Characteristic  
t – I  
D
10  
10000  
5000  
Common Source  
= 0.8 A  
Ta = 25°C  
Common Source  
I
V
V
= 10 V  
= 0 to 2.5 V  
D
DD  
GS  
Ta = 25°C  
8
6
t
1000  
500  
off  
t
f
100  
50  
V
= 10 V  
V
= 16 V  
DD  
DD  
4
2
0
t
on  
10  
5
t
r
1
1
0
1
2
3
4
10  
100  
1000  
10000  
Drain current  
I
(mA)  
Total Gate Charge Qg (nC)  
D
5
2010-03-25  
SSM6L14FE  
Q2 (P-ch MOSFET)  
I
– V  
I – V  
D GS  
D
DS  
-1.6  
-10  
-1  
Common Source  
Ta = 25 °C  
-2.5 V  
-4.5 V  
Common Source  
= -3 V  
-8 V  
V
DS  
-1.4  
-1.2  
Pulse Test  
Pulse Test  
-1.8 V  
-1  
-0.8  
-0.6  
-0.4  
-0.2  
-0.1  
-1.5 V  
Ta = 100 °C  
25 °C  
-0.01  
-0.001  
25 °C  
V
=-1.2 V  
GS  
0
-0.0001  
0
-0.2  
-0.4  
-0.6  
-0.8  
(V)  
-1.0  
0
-1.0  
-2.0  
Drain-source voltage  
V
DS  
Gate-source voltage  
V
GS  
(V)  
R
– V  
GS  
R
– I  
D
DS (ON)  
DS (ON)  
1.4  
1.4  
1.2  
1.0  
I
= -100 mA  
D
Common Source  
Ta = 25°C  
Common Source  
Pulse Test  
1.2  
1.0  
0.8  
0.6  
0.4  
Pulse Test  
0.8  
0.6  
-1.5 V  
-1.8 V  
-2.5 V  
25 °C  
0.4  
0.2  
0
Ta = 100 °C  
25 °C  
VGS = -4.5 V  
0.2  
0
0
-500  
-1000  
(mA)  
-1500  
0
-2  
-4  
-6  
-8  
Gate-source voltage  
V
GS  
(V)  
Drain current I  
D
V
Ta  
R
Ta  
th  
DS (ON)  
1
-1.0  
-0.5  
0
Common Source  
Pulse Test  
Common Source  
= -3 V  
V
DS  
= -1 mA  
-50 mA / -1.5 V  
0.8  
0.6  
0.4  
I
D
-100 mA / -1.8 V  
-200 mA / -2.5 V  
I
= -400 mA / V  
= -4.5 V  
D
GS  
0.2  
0
50  
0
50  
100  
150  
50  
100  
150  
0
50  
Ambient temperature Ta (°C)  
Ambient temperature Ta (°C)  
6
2010-03-25  
SSM6L14FE  
Q2 (P-ch MOSFET)  
|Y | – I  
fs  
I
– V  
D
DR  
DS  
10000  
10000  
Common Source  
= 0 V  
Pulse Test  
Common Source  
V
GS  
V
= -3 V  
DS  
Ta = 25°C  
D
1000  
100  
10  
Pulse Test  
I
G
DR  
1000  
100  
S
Ta =100 °C  
25 °C  
1
25 °C  
0.1  
10  
-1  
-10  
-100  
-1000  
-10000  
-100  
3
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
Drain current  
I
(mA)  
Drain-source voltage  
V
DS  
(V)  
D
t – I  
Capacitance – V  
D
DS  
10000  
1000  
1000  
Common Source  
V
V
= -10 V  
DD  
GS  
500  
300  
= 0 to -2.5 V  
t
t
Ta = 25 °C  
= 50Ω  
off  
f
R
G
C
iss  
100  
100  
50  
30  
t
on  
10  
1
Common Source  
Ta = 25°C  
C
oss  
t
r
f = 1 MHz  
C
rss  
V
= 0 V  
GS  
10  
-0.1  
-1  
-10  
-10  
-100  
-1000  
(mA)  
-10000  
-1  
Drain-Source voltage  
V
DS  
(V)  
Drain current  
I
D
Dynamic Input Characteristic  
-8  
-6  
-4  
-2  
0
Common Source  
I
= -0.72 A  
D
Ta = 25°C  
V
= - 10 V  
DD  
V
= - 16 V  
DD  
0
1
2
Total Gate Charge Qg (nC)  
7
2010-03-25  
SSM6L14FE  
Q1, Q2 Common  
P * – T  
D
a
250  
Mounted on FR4 board.  
(25.4mm × 25.4mm × 1.6mm , Cu Pad : 0.135 mm2 × 6)  
200  
150  
100  
150  
0
-40 -20  
0
20  
40  
60 80 100 120 140 160  
*:Total Rating  
Ambient temperature Ta (°C)  
8
2010-03-25  
SSM6L14FE  
RESTRICTIONS ON PRODUCT USE  
Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information  
in this document, and related hardware, software and systems (collectively “Product”) without notice.  
This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with  
TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission.  
Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are  
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and  
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily  
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the  
Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of  
all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes  
for Product and the precautions and conditions set forth in the “TOSHIBA Semiconductor Reliability Handbook” and (b) the  
instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their  
own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such  
design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts,  
diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating  
parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS’ PRODUCT DESIGN OR  
APPLICATIONS.  
Product is intended for use in general electronics applications (e.g., computers, personal equipment, office equipment, measuring  
equipment, industrial robots and home electronics appliances) or for specific applications as expressly stated in this document.  
Product is neither intended nor warranted for use in equipment or systems that require extraordinarily high levels of quality and/or  
reliability and/or a malfunction or failure of which may cause loss of human life, bodily injury, serious property damage or serious  
public impact (“Unintended Use”). Unintended Use includes, without limitation, equipment used in nuclear facilities, equipment used  
in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling  
equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric  
power, and equipment used in finance-related fields. Do not use Product for Unintended Use unless specifically permitted in this  
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Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any  
applicable laws or regulations.  
The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any  
infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to  
any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise.  
ABSENT A WRITTEN SIGNED AGREEMENT, EXCEPT AS PROVIDED IN THE RELEVANT TERMS AND CONDITIONS OF SALE  
FOR PRODUCT, AND TO THE MAXIMUM EXTENT ALLOWABLE BY LAW, TOSHIBA (1) ASSUMES NO LIABILITY  
WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR  
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Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product.  
Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,  
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noncompliance with applicable laws and regulations.  
9
2010-03-25  

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