TH58BYG2S3HBAI6 [TOSHIBA]
SLC NAND & BENAND Reliability and Performance;型号: | TH58BYG2S3HBAI6 |
厂家: | TOSHIBA |
描述: | SLC NAND & BENAND Reliability and Performance |
文件: | 总2页 (文件大小:868K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
NAND FLASH MEMORY
SLC NAND & BENAND
Reliability and Performance
Toshiba’s SLC NAND advanced flash memory
products provide cutting-edge endurance and data
retention for sensitive or frequently used system data.
For long-lasting products or systems working with
extremely high data throughput between the host and
the memory, Toshiba's SLC is a suitable solution.
Toshiba’s new BENAND™ removes the burden of
error correction code (ECC) from the host processor
by embedding ECC directly in the hardware while
maintaining the same specifications, reliability and
performance as raw SLC NAND.
APPLICATIONS
• Industrial
INVEꢀTOR OF
• Consumer Electronics
• Multimedia
• Smart Metering & Intelligent Lighting
FLASH
M
ꢁ
ꢂ
O
R
Y
FEATURES
ADVANTAGES
BENEFITS
• Broad lineup to meet customer
demand for different densities
• 24nm technology for cost optimization
• Long data retention, extreme write/
erase performance
• Small package available to reduce
board space
• No ECC operation is required on the
host side (BENAND)
• A suitable solution for long-lasting
storage of significant or frequently
changed data
• Reduced BOM cost due to latest
24nm production technology
• Supports smaller board size (e.g.
for mobile devices)
• Using Toshiba BENAND, it is
possible to utilize the latest 24nm
SLC NAND flash technology even
if the existing platform cannot
support higher bit ECC. No
hardware change necessary.
• SLC NAND 24nm
• 1Gb – 128Gb
• Extended temperature range
• TSOP and BGA package
• BENAND 24nm
Built-in ECC SLC NAND
• 1Gb – 8Gb
• On-chip H/W ECC
• Same reliability and performance
as raw SLC
• Produced in Toshiba's cutting-edge
technology flash factory
• Same hardware interface and
package as raw SLC
SPECIFICATIONS
Product / Features
Density
SLC NAND
BENAND™ (SLC+ECC)
1Gb – 8Gb
1Gb – 128Gb
Technology
24nm
ECC (Error Correction Code)
Required on Host Side
Embedded on Memory Chip
-40°C to 85°C
0°C to 70°C
Temperature
Package
TSOP and BGA
BENAND – SLC WITH EMBEDDED ECC FOR BOM REDUCTION AND SYSTEM FLEXIBILITY
HOST SYSTEM
BENAND
Data read from the SLC is
already error corrected
8bit
ECC
Main CPU
Raw SLC NAND 24nm
Memory Controller
Data read from the SLC is
1bit ECC
Raw SLC NAND 43nm
not error corrected
www.toshiba.semicon-storage.com
SLC NAND – PRODUCT LIST
Density
Part Number
Techn.
Page Size
Vcc
ECC
Temperature
Package
TC58NVG0S3HTA00
TC58NYG0S3HBAI4
TC58NVG0S3HTAI0
TC58NVG0S3HBAI4
TC58NYG0S3HBAI6
TC58NVG0S3HBAI6
TC58NVG1S3HTA00
TC58NYG1S3HBAI4
TC58NVG1S3HTAI0
TC58NVG1S3HBAI4
TC58NYG1S3HBAI6
TC58NVG1S3HBAI6
TH58NVG2S3HTA00
TC58NVG2S0HTA00
TC58NVG2S0HTAI0
TH58NVG2S3HTAI0
TH58NVG2S3HBAI4
TH58NYG2S3HBAI4
TC58NVG2S0HBAI4
TC58NYG2S0HBAI4
TC58NVG2S0HBAI6
TC58NYG2S0HBAI6
TH58NVG3S0HTA00
TH58NVG3S0HBAI4
TH58NYG3S0HBAI4
TH58NVG3S0HTAI0
TH58NVG3S0HBAI6
TH58NYG3S0HBAI6
TH58NVG4S0FTA20
TH58NVG4S0FTAK0
TH58NVG4S0FBAID
TH58NVG4S0HTA20
TH58NVG4S0HTAK0
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
32nm
32nm
32nm
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(2048+128)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
(4096+256)x8 bit
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
1.8V
3.3V
1.8V
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
3.3V
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
8bit/512B
4bit/512B
4bit/512B
4bit/512B
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
48TSOP 12x20
63BGA 9x11
48TSOP 12x20
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
63BGA 9x11
48TSOP 12x20
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
63BGA 9x11
63BGA 9x11
63BGA 9x11
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
63BGA 9x11
63BGA 9x11
48TSOP 12x20
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
48TSOP 12x20
63BGA 10x11
1Gb
2Gb
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
4Gb
8Gb
16Gb
-40°C to 85°C
-40°C to 85°C
24nm
(4096+256)x8 bit
3.3V
8bit/512B
0°C to 70°C
48TSOP 12x20
24nm
24nm
24nm
24nm
24nm
(4096+256)x8 bit
(8192+1024)x8 bit
(8192+1024)x8 bit
(8192+1024)x8 bit
(8192+1024)x8 bit
3.3V
3.3V
3.3V
3.3V
3.3V
8bit/512B
24bit/1024B
24bit/1024B
24bit/1024B
24bit/1024B
-40°C to 85°C
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
TC58NVG5H2HTA00
TC58NVG5H2HTAI0
TH58NVG6H2HTAK0
TH58NVG7H2HTA20
32Gb
64Gb
128Gb
BENAND™ – PRODUCT LIST
Density
1Gb
Part Number
Techn.
Page Size
Vcc
ECC
Temperature
Package
TC58BVG0S3HTA00
TC58BYG0S3HBAI4
TC58BVG0S3HTAI0
TC58BVG0S3HBAI4
TC58BYG0S3HBAI6
TC58BVG0S3HBAI6
TC58BVG1S3HTA00
TC58BYG1S3HBAI4
TC58BVG1S3HTAI0
TC58BVG1S3HBAI4
TC58BYG1S3HBAI6
TC58BVG1S3HBAI6
TH58BVG2S3HTA00
TC58BVG2S0HTA00
TC58BVG2S0HTAI0
TH58BVG2S3HTAI0
TH58BVG2S3HBAI4
TH58BYG2S3HBAI4
TC58BVG2S0HBAI4
TC58BYG2S0HBAI4
TC58BVG2S0HBAI6
TC58BYG2S0HBAI6
TH58BYG2S3HBAI6
TH58BVG3S0HTA00
TH58BYG3S0HBAI4
TH58BVG3S0HTAI0
TH58BVG3S0HBAI4
TH58BVG3S0HBAI6
TH58BYG3S0HBAI6
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
24nm
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(2048+64)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(2048+64)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
(4096+128)x8 bit
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
1.8V
3.3V
3.3V
3.3V
3.3V
3.3V
3.3V
1.8V
3.3V
1.8V
3.3V
1.8V
1.8V
3.3V
1.8V
3.3V
3.3V
3.3V
1.8V
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
internal ECC
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
48TSOP 12x20
63BGA 9x11
48TSOP 12x20
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
63BGA 9x11
48TSOP 12x20
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
48TSOP 12x20
63BGA 9x11
63BGA 9x11
63BGA 9x11
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
67BGA 6.5x8
48TSOP 12x20
63BGA 9x11
48TSOP 12x20
63BGA 9x11
67BGA 6.5x8
67BGA 6.5x8
2Gb
4Gb
8Gb
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
0°C to 70°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
-40°C to 85°C
BENAND™ is the trademark of Toshiba Corporation.
Product density is identified based on the maximum density of memory chip(s) within the Product, not the amount of memory capacity available for data storage by the end user
Consumer-usable capacity will be less due to overhead data areas, formatting, bad blocks, and other constraints, and may also vary based on the host device and application.
Maximum read and write speed may vary depending on the host device, read and write conditions, and file size.
Copyright August 2016 Toshiba America Electronic Components, Inc. (TAEC) - All Rights Reserved
www.toshiba.semicon-storage.com
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