TLP187(TPL,E [TOSHIBA]

Darlington Output Optocoupler, 1-Element, 3750V Isolation;
TLP187(TPL,E
型号: TLP187(TPL,E
厂家: TOSHIBA    TOSHIBA
描述:

Darlington Output Optocoupler, 1-Element, 3750V Isolation

输出元件 光电
文件: 总9页 (文件大小:272K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TLP187  
Photocouplers InGaAs Infrared LED & Photo Transistor  
TLP187  
1. Applications  
Programmable Logic Controllers (PLCs)  
I/O Interface Boards  
Home Electric Appliances  
2. General  
TLP187 is a photocoupler that consist of a InGaAs infrared light-emitting diode optically coupled to a darlington  
transistor. HousedinaSO6package, ithas ahighnoiseimmunityandahighinsulation. Withthehighbreakdown  
voltage between the collector and emitter, TLP187 is suitable in applications such as 100 VDC output modules  
of programmable controllers.  
3. Features  
(1) Collector-emitter voltage: 300 V (min)  
(2) Current transfer ratio: 1000 % (min)  
(3) Isolation voltage: 3750 Vrms (min)  
(4) Operation temperature range:-55 to 110  
(5) Safety standards  
UL-approved: UL1577, File No.E67349  
cUL-approved: CSA Component Acceptance Service No.5A File No.E67349  
VDE-approved: EN60747-5-5, EN60065 or EN60950-1 (Note 1)  
: EN62368-1 (Pending) (Note 1)  
CQC-approved: GB4943.1, GB8898 Japan and Thailand Factory  
Note 1: When a VDE approved type is needed, please designate the Option (V4).  
4. Packaging and Pin Configuration  
1: Anode  
3: Cathode  
4: Emitter  
6: Collector  
11-4M1S  
Start of commercial production  
2012-10  
©2015-2018  
Toshiba Electronic Devices & Storage Corporation  
2018-01-30  
Rev.4.0  
1
TLP187  
5. Principle of Operation  
5.1. Mechanical Parameters  
Characteristics  
Min  
Unit  
mm  
Creepage distances  
Clearance  
5.0  
5.0  
0.4  
Internal isolation thickness  
6. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )  
Characteristics  
Input forward current  
Symbol  
Note  
Rating  
Unit  
LED  
IF  
IF/Ta  
IFP  
50  
-1.43  
1
mA  
mA/  
A
Input forward current derating  
Input forward current (pulsed)  
Input reverse voltage  
(Ta 90 )  
(Ta 90 )  
(Note 1)  
VR  
5
V
Input power dissipation  
PD  
100  
-2.86  
mW  
mW/  
Input power dissipation  
derating  
PD/Ta  
Junction temperature  
Tj  
VCEO  
VECO  
IC  
125  
300  
0.3  
Detector Collector-emitter voltage  
Emitter-collector voltage  
Collector current  
V
150  
150  
-1.5  
mA  
mW  
Collector power dissipation  
PC  
Collector power dissipation  
derating  
(Ta 25 )  
PC/Ta  
mW/  
Junction temperature  
Common Operating temperature  
Storage temperature  
Tj  
125  
-55 to 110  
-55 to 125  
260  
Topr  
Tstg  
Tsol  
PT  
Lead soldering temperature  
Total power dissipation  
Isolation voltage  
(10 s)  
200  
mW  
AC, 60 s, R.H. 60 %  
BVS  
(Note 2)  
3750  
Vrms  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Pulse width (PW) 100 µs, f = 1000 Hz  
Note 2: This device is considered as a two-terminal device: Pins 1 and 3 are shorted together, and pins 4 and 6 are  
shorted together.  
©2015-2018  
Toshiba Electronic Devices & Storage Corporation  
2018-01-30  
Rev.4.0  
2
TLP187  
7. Electrical Characteristics (Unless otherwise specified, Ta = 25 )  
Characteristics  
Input forward voltage  
Symbol  
Note  
Test Condition  
IF = 10 mA  
Min  
Typ.  
Max  
Unit  
LED  
VF  
IR  
1.1  
1.25  
1.4  
10  
V
µA  
pF  
V
Input reverse current  
Input capacitance  
VR = 5 V  
Ct  
V = 0 V, f = 1 MHz  
IC = 0.1 mA  
30  
Detector Collector-emitter breakdown  
voltage  
V(BR)CEO  
300  
Emitter-collector breakdown  
voltage  
V(BR)ECO  
IDARK  
IE = 0.1 mA  
0.3  
Dark Current  
VCE = 200 V  
0.01  
0.2  
20  
µA  
VCE = 200 V, Ta = 85   
V = 0 V, f = 1 MHz  
Collector-emitter capacitance  
CCE  
12  
pF  
8. Coupled Electrical Characteristics (Unless otherwise specified, Ta = 25 )  
Characteristics  
Symbol  
Note  
Test Condition  
IF = 1 mA, VCE = 1 V  
Min  
Typ.  
Max  
Unit  
%
Current transfer ratio  
IC/IF  
1000  
500  
4000  
Saturated current transfer ratio  
IC/IF(sat)  
VCE(sat)  
IF = 10 mA, VCE = 1 V  
IC = 10 mA, IF = 1 mA  
Collector-emitter saturation  
voltage  
1.0  
V
IC = 100 mA, IF = 10 mA  
VF = 0.7 V, VCE = 200 V  
0.3  
1.2  
20  
OFF-state collector current  
IC(off)  
µA  
9. Isolation Characteristics (Unless otherwise specified, Ta = 25 )  
Characteristics  
Symbol  
CS  
Note  
Test Conditions  
Min  
Typ.  
0.8  
Max  
Unit  
pF  
Total capacitance (input to  
output)  
(Note 1) VS = 0 V, f = 1 MHz  
Isolation resistance  
Isolation voltage  
RS  
(Note 1) VS = 500 V, R.H. 60 %  
(Note 1) AC, 60 s  
AC, 1s in oil  
1 × 1012  
3750  
1014  
BVS  
Vrms  
10000  
10000  
DC, 60 s in oil  
Vdc  
Note 1: This device is considered as a two-terminal device: Pins 1 and 3 are shorted together, and pins 4 and 6 are  
shorted together.  
10. Switching Characteristics (Unless otherwise specified, Ta = 25 )  
Characteristics  
Symbol  
Note  
Test Condition  
Min  
Typ.  
Max  
Unit  
Rise time  
Fall time  
tr  
VCC = 10 V, IC = 10 mA,  
RL = 100 Ω  
40  
15  
50  
15  
5
µs  
tf  
Turn-on time  
Turn-off time  
Turn-on time  
Storage time  
Turn-off time  
ton  
toff  
ton  
ts  
See Figure 10.1  
RL = 180 , VCC = 10 V,  
IF = 16 mA  
40  
80  
toff  
Fig. 10.1 Switching Time Test Circuit and Waveform  
©2015-2018  
Toshiba Electronic Devices & Storage Corporation  
2018-01-30  
Rev.4.0  
3
TLP187  
11. Characteristics Curves (Note)  
Fig. 11.1 IF - Ta  
Fig. 11.2 PC - Ta  
Fig. 11.3 IFP - DR  
Fig. 11.4 IF - VF  
Fig. 11.5 VF/Ta - IF  
Fig. 11.6 IFP - VFP  
©2015-2018  
2018-01-30  
Rev.4.0  
4
Toshiba Electronic Devices & Storage Corporation  
TLP187  
Fig. 11.7 IC - VCEO  
Fig. 11.8 IC - IF  
Fig. 11.9 IDARK - Ta  
Fig. 11.10 IC/IF - IF  
Fig. 11.11 VCE(sat) - Ta  
Fig. 11.12 IC - Ta  
©2015-2018  
Toshiba Electronic Devices & Storage Corporation  
2018-01-30  
Rev.4.0  
5
TLP187  
Fig. 11.13 Switching Time - RL  
Note: The above characteristics curves are presented for reference only and not guaranteed by production test,  
unless otherwise noted.  
©2015-2018  
Toshiba Electronic Devices & Storage Corporation  
2018-01-30  
Rev.4.0  
6
TLP187  
12. Soldering and Storage  
12.1. Precautions for Soldering  
The soldering temperature should be controlled as closely as possible to the conditions shown below, irrespective  
of whether a soldering iron or a reflow soldering method is used.  
When using soldering reflow.  
The soldering temperature profile is based on the package surface temperature.  
(See the figure shown below, which is based on the package surface temperature.)  
Reflow soldering must be performed once or twice.  
The mounting should be completed with the interval from the first to the last mountings being 2 weeks.  
Fig. 12.1.1 An Example of a Temperature Profile When Lead(Pb)-Free Solder Is Used  
When using soldering flow  
Preheat the device at a temperature of 150 (package surface temperature) for 60 to 120 seconds.  
Mounting condition of 260 within 10 seconds is recommended.  
Flow soldering must be performed once.  
When using soldering Iron  
Complete soldering within 10 seconds for lead temperature not exceeding 260 or within 3 seconds not  
exceeding 350   
Heating by soldering iron must be done only once per lead.  
12.2. Precautions for General Storage  
Avoid storage locations where devices may be exposed to moisture or direct sunlight.  
Follow the precautions printed on the packing label of the device for transportation and storage.  
Keep the storage location temperature and humidity within a range of 5 to 35 and 45 % to 75 %,  
respectively.  
Do not store the products in locations with poisonous gases (especially corrosive gases) or in dusty  
conditions.  
Store the products in locations with minimal temperature fluctuations. Rapid temperature changes during  
storage can cause condensation, resulting in lead oxidation or corrosion, which will deteriorate the  
solderability of the leads.  
When restoring devices after removal from their packing, use anti-static containers.  
Do not allow loads to be applied directly to devices while they are in storage.  
If devices have been stored for more than two years under normal storage conditions, it is recommended  
that you check the leads for ease of soldering prior to use.  
©2015-2018  
2018-01-30  
Rev.4.0  
7
Toshiba Electronic Devices & Storage Corporation  
TLP187  
Package Dimensions  
Unit: mm  
Weight: 0.08 g (typ.)  
Package Name(s)  
TOSHIBA: 11-4M1S  
©2015-2018  
Toshiba Electronic Devices & Storage Corporation  
2018-01-30  
Rev.4.0  
8
TLP187  
RESTRICTIONS ON PRODUCT USE  
Toshiba Corporation and its subsidiaries and affiliates are collectively referred to as "TOSHIBA".  
Hardware, software and systems described in this document are collectively referred to as "Product".  
TOSHIBA reserves the right to make changes to the information in this document and related Product without notice.  
This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's  
written permission, reproduction is permissible only if reproduction is without alteration/omission.  
ThoughTOSHIBAworkscontinuallytoimproveProduct'squalityandreliability,Productcanmalfunctionorfail.Customersareresponsible  
for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which  
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage  
to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate  
the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA  
information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the  
precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application  
with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications,  
including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating  
and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample  
application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications.  
TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.  
PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE  
EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY  
CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT  
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equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles,  
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Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any  
applicable laws or regulations.  
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INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR LOSS, INCLUDING  
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OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS FOR A PARTICULAR  
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GaAs (Gallium Arsenide) is used in Product. GaAs is harmful to humans if consumed or absorbed, whether in the form of dust or vapor.  
Handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose GaAs in Product.  
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Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances,  
including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES OCCURRING  
AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.  
©2015-2018  
2018-01-30  
Rev.4.0  
9
Toshiba Electronic Devices & Storage Corporation  

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