TLP260J(V4-TPR) [TOSHIBA]
TLP260J(V4-TPR);
TOSHIBA 
TLP260J(V4)
TOSHIBA PHOTOCOUPLER
TLP260J(V4)
ATTACHMENT : Specifications for VDE0884 option
Types : TLP260J
Type designations for ‘Option: (V4)’, which are tested under VDE0884 requirements.
Ex. TLP260J (V4-TPR)
V4 : VDE0884 option
TPR : standard taping name
Note: Use Toshiba standard type number for safety standard application.
Ex. TLP260J (V4-TPR) → TLP260J
VDE0884 Isolation Characteristics
Description
Symbol
Rating
Unit
Application classification (DIN VDE0110 Teil 1/01.89, table 1)
<
for rated mains voltage 150 V
=
=
I-IV
I-III
―
RMS
<
for rated mains voltage 300 V
RMS
Climatic classification (DIN IEC68 Teil 1/09.80)
Pollution degree (DIN VDE0110 Teil 1/01.89)
Maximum operating insulation voltage
55/100/21
―
―
2
U
565
Vpk
IORM
Input to output test voltage, method A
Upr = 1.5 ´ V
, Type and sample test
Upr
850
Vpk
IORM
t
= 60 sec, Partial discharge < 5 pC
p
Input to output test voltage, method B
Upr = 1.875 ´ V , 100% production test
Upr
1060
6000
Vpk
Vpk
IORM
t
= 1 sec, Partial discharge < 5 pC
p
Highest permissible overvoltage (Transient overvoltage, t = 10 s)
U
TR
pr
Safety limiting values (Max permissible ratings in case of fault, also refer to
thermal derating curve)
Current (Input current If, Ps = 0)
Isi
250
400
150
mA
mW
°C
Power (Output or total power dissipation)
Temperature
Psi
Tsi
Insulation resistance,
V
V
V
= 500 V、Ta = 25°C
= 500 V、Ta = 100°C
= 500 V、Ta = Ts
≥ 1012
≥ 1011
≥ 109
IO
IO
IO
Rsi
Ω
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2002-02-13
TLP260J(V4)
Insulation Related Characteristics
Minimum creepage distance
Minimum clearance
(*)
(*)
Cr
Cl
ti
4.0 mm
4.0 mm
0.4 mm
175
Minimum insulation thickness
Comperative tracking index
CTI
(DIN IEC112/VDE0303, part 1)
(VDE0110 Teil 1/01.89 Group IIIa)
*:
In accordance with DIN VDE0110 Teil 1/01.89, table 2, & 4
1. If a printed circuit is incorporated, the creepage distance and clearance may be reduced below this value. If
this is not permissible, the user shall take suitable measures.
2. This photocoupler is suitable for ‘safe electrical isolation’ only within the safety limit data.
Maintenance of the safety data shall be ensured by means of protective circuits.
(Dieses Koppelelement ist fur “Sichere Elektrische Trennung” nur innerhalb der Sicherheitsgrenzdaten
geeignet. Die Einhaltung der Sicherheitsgrenzen mub durch Schutzschaltungen sichergestellt sein.)
VDE test sign:
Marking on product for VDE0884
Marking on paking for VDE0884
V
:
VDE
Marking example: TLP260J
Lot No.
P260J
Type No.
V
mark for VDE0884 “V4”
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2002-02-13
TLP260J(V4)
Figure
1
Partial discharge measurement procedure according to VDE0884
Destructive test for qualification and sampling tests.
V
(6 kV)
INITIAL
Method A
(for type and sampling tests, destructive tests)
V
V
pr
(850 V)
t , t
= 1 to 10 s
= 1 s
1
2
4
t , t
3
t (Measuring time for partial discharge) = 60 s
V
IROM
(565 V)
p
b
t
t
= 62 s
= 10 s
ini
t
0
t
t
t
t
t
4
3
2
p
t
t
ini
1
b
Figure
2
Partial discharge measurement procedure according to VDE0884
Non-destructive test for 100% inspection.
V
V
pr
(1060 V)
Method B
V
IROM
(565 V)
(for sample test, non-destructive test)
t , t
= 0.1 s
t (Measuring time for partial discharge) = 1 s
3
4
p
t
= 1.2 s
b
t
t
t
t
t
3
4
p
b
Figure
3
Dependency of maximum safety ratings on ambient temperature
Isi (mA)
500
Psi (mW)
1000
800
400
300
600
400
200
100
Isi
200
Psi
0
0
0
25
50
75
100
125
150
175
Ta (°C)
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2002-02-13
TLP260J(V4)
RESTRICTIONS ON PRODUCT USE
000707EBC
· TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
· The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
· Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes
are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the
products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with
domestic garbage.
· The products described in this document are subject to the foreign exchange and foreign trade laws.
· The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
· The information contained herein is subject to change without notice.
4
2002-02-13
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