TPC8014 [TOSHIBA]

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III); 东芝场效应晶体管硅N沟道MOS型(U - MOS III )
TPC8014
型号: TPC8014
厂家: TOSHIBA    TOSHIBA
描述:

TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III)
东芝场效应晶体管硅N沟道MOS型(U - MOS III )

晶体 晶体管 场效应晶体管
文件: 总7页 (文件大小:214K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TPC8014  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III)  
TPC8014  
Lithium Ion Battery Applications  
Unit: mm  
Portable Equipment Applications  
Notebook PC Applications  
Small footprint due to small and thin package  
Low drain-source ON resistance: R = 11 m(typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 10 S (typ.)  
fs  
Low leakage current: I  
= 10 µA (max) (V = 30 V)  
DS  
DSS  
Enhancement mode: V = 1.3 to 2.5 V (V  
= 10 V, I = 1 mA)  
D
th DS  
Maximum Ratings  
(Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
30  
30  
V
V
V
DSS  
Drain-gate voltage (R  
= 20 k)  
V
DGR  
GS  
V
±20  
11  
Gate-source voltage  
GSS  
DC  
(Note 1)  
I
D
Drain current  
A
JEDEC  
JEITA  
Pulse (Note 1)  
I
44  
DP  
Drain power dissipation  
Drain power dissipation  
(t = 10 s)  
(Note 2a)  
(t = 10 s)  
(Note 2b)  
P
1.9  
1.0  
W
W
D
D
TOSHIBA  
2-6J1B  
Weight: 0.08 g (typ.)  
P
Single pulse avalanche energy  
(Note 3)  
E
157  
11  
mJ  
A
AS  
Circuit Configuration  
Avalanche current  
I
AR  
8
7
6
5
Repetitive avalanche energy  
E
0.19  
mJ  
AR  
(Note 2a) (Note 4)  
T
150  
°C  
°C  
Channel temperature  
ch  
Storage temperature range  
T
stg  
55 to 150  
Note 1, Note 2, Note 3 and Note 4: See the next page.  
This transistor is an electrostatic-sensitive device. Please handle with  
caution.  
1
2
3
4
1
2004-07-06  
TPC8014  
Thermal Characteristics  
Characteristics  
Symbol  
Max  
65.8  
Unit  
Thermal resistance, channel to ambient  
R
°C/W  
th (ch-a)  
(t = 10 s)  
(Note 2a)  
Thermal resistance, channel to ambient  
R
125  
°C/W  
th (ch-a)  
(t = 10 s)  
(Note 2b)  
Marking (Note 5)  
T P C 8 0 1 4  
Part No. (or abbreviation code)  
Lot No.  
A line indicates  
lead (Pb)-free package or  
lead (Pb)-free finish.  
Note 1:  
Ensure that the channel temperature does not exceed 150°C.  
Note 2: (a) Device mounted on a glass-epoxy board (a)  
(b) Device mounted on a glass-epoxy board (b)  
FR-4  
FR-4  
25.4 × 25.4 × 0.8  
(unit: mm)  
25.4 × 25.4 × 0.8  
(unit: mm)  
(a)  
(b)  
Note 3:  
V
DD  
= 24 V, T = 25°C (initial), L = 1.0 mH, R = 25 , I = 11 A  
ch AR  
G
Note 4: Repetitive rating: pulse width limited by max channel temperature  
Note 5: on lower left of the marking indicates Pin 1.  
Weekly code:  
(Three digits)  
Week of manufacture  
(01 for the first week of a year: sequential number up to 52 or 53)  
Year of manufacture  
(The last digit of a year)  
2
2004-07-06  
TPC8014  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
= ±16 V, V = 0 V  
Min  
Typ.  
Max  
Unit  
I
V
V
30  
15  
1.3  
5
±10  
10  
µA  
µA  
GSS  
GS  
DS  
DS  
Drain cut-OFF current  
I
= 30 V, V  
= 0 V  
DSS  
GS  
GS  
GS  
V
V
I
I
= 10 mA, V  
= 10 mA, V  
= 0 V  
(BR) DSS  
(BR) DSX  
D
D
Drain-source breakdown voltage  
Gate threshold voltage  
V
V
= −20 V  
V
V
V
V
V
= 10 V, I = 1 mA  
2.5  
22  
14  
th  
DS  
GS  
GS  
DS  
D
= 4.5 V, I = 5.5 A  
15  
D
Drain-source ON resistance  
R
mΩ  
S
DS (ON)  
= 10 V, I = 5.5 A  
11  
D
Forward transfer admittance  
Input capacitance  
|Y |  
fs  
= 10 V, I = 5.5 A  
10  
D
C
C
1860  
270  
320  
iss  
V
= 10 V, V  
= 0 V, f = 1 MHz  
pF  
Reverse transfer capacitance  
Output capacitance  
DS  
GS  
rss  
C
oss  
Rise time  
t
9
r
I
= 5.5 A  
D
10 V  
V
GS  
V
OUT  
0 V  
Turn-ON time  
Switching time  
t
19  
20  
69  
39  
on  
ns  
Fall time  
t
f
V
15 V  
DD  
Turn-OFF time  
t
off  
<
Duty 1%, t = 10 µs  
=
w
Total gate charge  
Q
g
(gate-source plus gate-drain)  
V
24 V, V  
= 10 V, I = 11 A  
nC  
DD  
GS  
D
Gate-source charge 1  
Q
4
9
gs1  
Gate-drain (“miller”) charge  
Q
gd  
Source-Drain Ratings and Characteristics  
=
(Ta 25°C)  
Characteristics  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
Drain reverse current  
Forward voltage (diode)  
Pulse (Note 1)  
I
44  
A
V
DRP  
V
I
= 11 A, V = 0 V  
GS  
1.2  
DSF  
DR  
3
2004-07-06  
TPC8014  
I
– V  
I
– V  
DS  
D
DS  
D
20  
16  
12  
8
10  
8
3.3  
3.4  
10  
3.2  
3.1  
8
6
4
3.5  
4
6
8
10  
3.2  
3.3  
3.0  
3.  
3.1  
3.4  
6
2.9  
2.8  
3.0  
4
2.9  
2.8  
2.7  
2.7  
2.6  
4
2
V
= 2.6 V  
V
GS  
= 2.5 V  
GS  
0
0
0
0
1
2
3
4
5
0.2  
0.4  
0.6  
0.8  
1.0  
Drain-source voltage  
V
DS  
(V)  
Drain-source voltage  
V
DS  
(V)  
I
– V  
V – V  
DS GS  
D
GS  
20  
16  
12  
8
1
0.8  
0.6  
0.4  
0.2  
0
Common source  
Ta = 25°C  
Pulse test  
Common source  
= 10 V  
V
DS  
Pulse test  
100  
Ta = −55°C  
25  
2.5  
5.5  
4
I
= 11A  
D
0
0
1
1.5  
2
2.5  
3
2.5  
4
0
4
8
12  
16  
(V)  
20  
0.5  
Gate-source voltage  
V
(V)  
Gate-source voltage  
V
D
GS  
GS  
|Y | – I  
fs  
R
– I  
DS (ON)  
D
100  
Common source  
Ta = 25°C  
Pulse test  
30  
10  
55°C  
Tc = 100°C  
V
GE  
= 4.5 V  
V
GS  
= 10 V  
25°C  
3
1
Common source  
= 10 V  
V
DS  
Pulse test  
0.1  
1
10  
(A)  
100  
1
3
10  
Drain current  
30  
100  
Drain current  
I
D
I
D
(A)  
4
2004-07-06  
TPC8014  
R
Ta (α)  
I
– V  
DS  
DS (ON)  
DR  
25  
20  
15  
10  
5
100  
10  
1
5
I
= 11, 5.5, 2.5 A  
D
10  
1
3
V
= 10 V  
GS  
V
GS  
= 4.5 V  
I
D
= 11, 5.5, 2.5 A  
10  
Common source  
Ta = 25°C  
Pulse test  
Common source  
Pulse test  
0
80  
0.1  
0
40  
0
40  
80  
120  
160  
100  
200  
0.2  
0.4  
0.6  
0.8  
1
1.2  
Ambient temperature Ta (°C)  
Drain-source voltage  
V
(V)  
DS  
Capacitance – V  
V
Ta  
th  
DS  
10000  
1000  
100  
3
2.5  
2
C
iss  
1.5  
1
C
oss  
C
rss  
Common source  
= 10 V  
V
DS  
Common source  
= 10 V  
0.5  
0
V
GS  
= 1 mA  
I
D
= 1 mA  
I
D
Pulse test  
Pulse test  
10  
0.1  
1
10  
80  
40  
0
40  
80  
120  
Drain-source voltage  
V
(V)  
Ambient temperature Ta (°C)  
DS  
P
D
Ta  
Dynamic input/output characteristics  
2
1.6  
1.2  
0.8  
0.4  
0
30  
25  
20  
15  
10  
5
30  
(1) Device mounted on a  
glass-epoxy board (a)  
(Note 2a)  
Common source  
(1)  
(2)  
Ta = 25°C  
25  
20  
15  
10  
5
(2) Device mounted on a  
glass-epoxy board (b)  
(Note 2b)  
I
= 11 A  
D
Pulse test  
V
= 24 V  
DD  
t = 10 s  
V
DS  
6
12  
6
12  
V
= 24 V  
DD  
0
0
0
60  
0
50  
100  
150  
10  
20  
30  
40  
50  
Ambient temperature Ta (°C)  
Total gate charge  
Q
(nC)  
g
5
2004-07-06  
TPC8014  
r
t  
th  
w
1000  
100  
10  
(1) Device mounted on a glass-epoxy board (a)  
(Note 2a)  
(2)  
(1)  
(2) Device mounted on a glass-epoxy board (b)  
(Note 2b)  
t = 10 s  
1
Single pulse  
0.1  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse width  
t
w
(S)  
Safe operating area  
100  
10  
1 ms*  
I
D
max (pluse) *  
10 ms*  
1
0.1  
*
Single pulse  
Ta = 25°C  
Curves must be derated  
linearly with increase in  
temperature.  
V
max  
DSS  
10  
(V)  
0.01  
0.01  
0.1  
1
100  
Drain-source voltage  
V
DS  
6
2004-07-06  
TPC8014  
RESTRICTIONS ON PRODUCT USE  
030619EAA  
The information contained herein is subject to change without notice.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of  
TOSHIBA or others.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced  
and sold, under any law and regulations.  
7
2004-07-06  

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