WBC-C0202AA-102-M [TTELEC]

Wire Bondable Chip Capacitor; 线可粘接贴片电容
WBC-C0202AA-102-M
型号: WBC-C0202AA-102-M
厂家: TT Electronics    TT Electronics
描述:

Wire Bondable Chip Capacitor
线可粘接贴片电容

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中文:  中文翻译
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Wire Bondable  
Chip Capacitor  
WBC Capacitor Series  
Silicon Dioxide/Silicon Nitride dielectric  
Capacitance range from 10pF to 1000pF  
Silicon substrate with gold or aluminum backing  
IRC’s wire-bondable chip capacitors are based on the successful  
TaNCAP® line of RC networks on silicon. The new chip capacitors have  
the advantage of excellent performance in extremely small sizes ranging from  
20 to 60 mils square.  
Capacitors are 100% electrically tested with mil screening to MIL-STD-883 also available.  
For demanding hybrid circuit and/or chip and wire applications, specify IRC’s WBC capacitor series.  
Physical Data  
C0606  
C0404  
Top Bonding Pad  
Top Bonding Pad  
C0303  
C0202  
C0505  
Back of chip  
Back of chip  
Manufacturing Capabilities Data  
Style  
Size  
Capacitance Range  
Voltage  
40  
0.020± 0.001 sq.  
(0.508mm ±0.025)  
C0202  
C0303  
C0404  
C0505  
C0606  
10pF to 51pF  
33pF to 100pF  
56pF to 220pF  
160pF to 360pF  
160pF to 1000pF  
0.030± 0.001 sq.  
(0.762mm ±0.025)  
55  
0.040± 0.001 sq.  
(1.016mm ±0.025)  
50  
0.055± 0.001 sq.  
(1.397mm ±0.025)  
20  
0.060± 0.001 sq.  
(1.524mm ±0.025)  
20  
General Note  
IRC reserves the right to make changes in product specification without notice or liability.  
All information is subject to IRC’s own data and is considered accurate at time of going to print.  
A subsidiary of  
TT electronics plc  
© IRC Advanced Film Division 4222 South Staples Street • Corpus Christi Texas 78411 USA  
Telephone: 361 992 7900 • Facsimile: 361 992 3377 • Website: www.irctt.com  
WBC Capacitor Series Issue January 2009 Sheet 1 of 2  
Wire Bondable  
Chip Capacitor  
Electrical Data  
Capacitance Range  
Dissipation Factor 1Khz, +25°C, 1VRMS  
Absolute Tolerance  
10pF to 1000pF  
0.5% min  
to ±5%  
-55°C to +125°C  
<-30dB  
Operating Temperature  
Noise  
Substrate Material  
Semiconductor Silicon (10KÅ SiO2 minimum)  
0.010˝ ±0.001  
(0.254mm ±0.025)  
Substrate Thickness  
Bond Pad Metallization  
Backside  
Aluminum: 10KÅ minimum  
Aluminum: 10KÅ minimum  
Gold: 3KÅ minimum  
Dielectric  
Silicon Dioxide and/or Silicon Nitride  
Silicon Dioxide or Silicon Nitride  
Passivation  
Environmental Data  
Ordering Data  
Prefix  
WBC  
-
C0606  
A
G
- 102 - K  
Test  
Method  
Max C  
Style  
MIL-STD-202  
Method 107  
C0202; C0303; C0404; C0505; C0606  
Thermal Shock  
±0.25% + 0.25pF max  
Test condition F  
Bonding pads  
A = Aluminum  
MIL-STD-202  
Method 106  
Moisture  
Resistance  
±1.0% + 0.25pF max  
±0.25% + 0.25pF mx  
Backside  
A = Aluminum; G = Gold  
Capacitance  
3-Digit Capacitance Code  
Ex: 102 = 1000pF; 221 = 220pF; 470 = 47pF  
+25°C, 5 seconds  
1.5 X rated voltage  
Short  
Time Overload  
MIL-STD-202  
Method 108  
125°C, 1000 hours  
Absolute Tolerance Code  
M = ±20%; K = ±10%; J = ±5%  
Life at Elevated  
Temperature  
±0.25% + 0.25pF max  
±0.25% + 0.25pF max  
Packaging  
Standard packaging is 2˝ x 2˝ chip tray. For additional information  
or to discuss your specific requirements, please contact our  
Applications Team using the contact details below.  
High Temperature  
Exposure  
100 hours @ 150°C  
ambient  
© IRC Advanced Film Division 4222 South Staples Street • Corpus Christi Texas 78411 USA  
Telephone: 361 992 7900 • Facsimile: 361 992 3377 • Website: www.irctt.com  
WBC Capacitor Series Issue January 2009 Sheet 2 of 2  

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