MIR-3301-P [UOT]

SUBMINIATURE PHOTOINTERRUPTER; 微型光斩波器
MIR-3301-P
型号: MIR-3301-P
厂家: UNITY OPTO TECHNOLOGY    UNITY OPTO TECHNOLOGY
描述:

SUBMINIATURE PHOTOINTERRUPTER
微型光斩波器

传感器 换能器 线性位置传感器 斩波器
文件: 总3页 (文件大小:132K)
中文:  中文翻译
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SUBMINIATURE  
PHOTOINTERRUPTER  
MIR-3301-P  
Description  
Package Dimensions  
The MIR-3301-P consists of a Gallium Arsenide in-  
frared emitting diode and a NPN silicon phototran-  
sistor built in a black plastic housing. It is a refl-  
ective subminiature photointerrupter.  
Unit: mm  
Features  
Compact and thin  
MIR-3301 : long lead type  
Optimum detecting diatance : 0.8 - 1.0 mm  
Wavelength : 940nm  
Visible light cut-off type  
Flat lead type  
TOP VIEW  
Emitter  
Anode  
D
A
C
B
Collector  
Cathode  
NOTE :  
(1).Tolerance:±0.2mm  
(2). ( ) Reference dimensions  
Absolute Maximum Ratings  
@ TA=25oC  
Unit  
mA  
Parameter  
Continuous Forward Current  
INPUT Reverse Voltage  
Power Dissipation  
Symbol  
IF  
Minimum Rating Maximum Rating  
50  
VR  
5
V
Pad  
75  
mW  
V
V(BR)CEO  
V(BR)ECO  
PC  
Collector-emitter breakdown voltage  
30  
5
Emitter-Collector breakdown voltage  
Collector power dissipation  
OUTPUT  
V
75  
100  
mW  
mW  
PTOT  
Topr  
Total power dissipation  
o
-25 C to + 85oC  
Operating Temperature Range  
Storage Temperature Range  
Lead Soldering Temperature (within 5 sec, minimum 1.6mm from body) at 260 oC  
-40 C to + 100oC  
o
Tstg  
Unity Opto Technology Co., Ltd.  
12/12/2001  
MIR-3301-P  
Optical-Electrical Characteristics  
Parameter  
Symbol  
VF  
Test Conditions  
Min .  
Typ .  
Max .  
1.4  
Unit .  
V
IF=20mA  
Input  
Forward Voltage  
-
-
1.2  
-
IR  
VR=5V  
Reverse Current  
10  
µA  
nA  
Iceo  
B
Output  
Collector Dark Current  
-
-
100  
75  
Vce=10V  
38  
56  
80  
112  
-
-
C
-
108  
151  
216  
100  
100  
0.1  
*1Collector Current  
IF=4mA,Vce=5V  
Ic  
D
µA  
Transfer Cha-  
racteristics  
-
E
tr  
-
Ic=100µA,Vce=2V  
RL=1K,d=1mm  
Response Time (RISE)  
Response Time (FALL)  
*2Leak Current  
20  
20  
-
µS  
µS  
µA  
tf  
-
ILEAK  
IF=4mA,Vce=5V  
-
*1 THE CONDITION AND ARRANGEMENT OF THE REFLECTIVE OBJECT ARE SHOWN AS FOLLOWING .  
*2 WITHOUT REFLECTIVE OBJECT.  
TEST CONDITION AND ARRANGEMENT FOR COLLECTOR CURRENT  
Al refletive Surface  
2 mm-thick glass  
Device  
Typical Optical-Electrical Characteristic Curves  
60  
50  
40  
30  
20  
10  
0
120  
100  
80  
60  
40  
20  
0
PTOT  
Pad , PC  
-25  
0
25  
50  
75  
100  
-25  
0
25  
50  
75  
100  
Ambient Temperature TA (oC)  
Ambient Temperature TA ( oC )  
Fig.2 Power Dissipation vs.  
Ambient Temperature  
Fig.1 forward Current VS  
Ambient Temperature  
.
50  
40  
30  
20  
10  
0
600  
500  
400  
300  
200  
100  
0
Vce=5V  
Ta=25oC  
0.0  
0.5  
1.0  
1.5  
0
5
10  
15  
20  
Forward Voltage VF (V)  
Fig.3 Forward Current VS  
Forward Voltage  
Forward Current IF (mA)  
Fig.4 Collector Current vs.  
Forward Current  
Unity Opto Technology Co., Ltd.  
02/04/2002  
MIR-3301-P  
Typical Optical-Electrical Characteristic Curves  
350  
120  
100  
80  
60  
40  
20  
0
Ta=25oC  
300  
IF=10mA  
250  
200  
150  
100  
50  
4mA  
1mA  
10  
0
0
2
4
6
8
12  
-25  
0
25  
50  
75  
100  
Ambient Temperature TA (oC)  
Collector-Emitter Voltage Vce (V)  
Fig.5 Collector Current vs. Vce  
Fig.6 Relative Collector Current VS.  
10-6  
100  
10  
1
VCE=10V  
tr  
10-7  
10-8  
td  
tr  
VCE=2V  
ts  
10-9  
IC=100µA  
Ta=25oC  
10-10  
0.1  
0.01  
0
25  
50  
75  
100  
0.1  
1
10  
Ambient Temperature TA (oC)  
Fig.7 Collector Dark Current vs.  
Ambient Temperature  
Load Resistance Rt (K)  
Fig.8 Response Time vs.  
Load Resistance  
100  
80  
60  
40  
20  
0
120  
100  
80  
60  
40  
20  
0
Ta=25oC  
IF=4mA  
VCE=5V  
TA=25oC  
700  
800  
900 1000 1100 1200  
0
1
2
3
4
5
6
7
8
9
10  
Wavelength (nm)  
Fig.9 Spectral Sensitivity (Detecting side)  
Distance (mm)  
Fig.10 Relative Collector Current vs. Distance  
between MIR-3301 and Card  
Test Circuit for Response Time  
Vcc  
RL  
Input  
Input  
R
D  
Output  
Output  
10%  
90%  
td  
ts  
tr  
tf  
Unity Opto Technology Co., Ltd.  
02/04/2002  

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