UR5596-S08-T [UTC]
MOS IC; MOS IC型号: | UR5596-S08-T |
厂家: | Unisonic Technologies |
描述: | MOS IC |
文件: | 总11页 (文件大小:202K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
UNISONIC TECHNOLOGIES CO.,LTD
UR5596
MOS IC
DDR TERMINATION
REGULATOR
ꢀ
DESCRIPTION
The UTC UR5596 is a linear bus termination regulator and
designed to meet JEDEC SSTL-2(Stub-Series Terminated
Logic) specifications for termination of DDR-SDRAM. It also can
be used in SSTL-3 or HSTL(High-Speed Transceiver Logic)
scheme. The device contains a high-speed OP AMP to provide
excellent response to the load transients, and can deliver 1.5A
continuous current and transient peaks up to 3A in the
application as required for DDR-SDRAM termination.
SOP-8
The UTC UR5596 also incorporates a VSENSE pin to provide
superior load regulation and a VREF output as a reference for the
chipset and DIMMs. Besides, an active low shutdown (SHDN)
pin provides Suspend To RAM (STR) functionality. When SHDN
is pulled low the VTT output will tri-state providing a high
impedance output, but, VREF will remain active. A power savings
advantage can be obtained in this mode through lower
quiescent current.
*Pb-free plating product number: UR5596L
Regarding the output, VTT is capable of sinking and sourcing
current while regulating the output voltage equal to VDDQ/2. The
output stage has been designed to maintain excellent load
regulation while preventing shoot through. The UTC UR5596
also incorporates two distinct power rails that separates the
analog circuitry from the power output stage. This allows a split
rail approach to be utilized to decrease internal power
dissipation and permits UTC UR5596 to provide a termination
solution for DDRII SDRAM.
ꢀ
FEATURES
* Source and sink current
* Low output voltage offset
* No external resistors required
* Linear topology
* Suspend To Ram (STR) functionality
* Low external component count
* Thermal shutdown protection
ꢀ ORDERING INFORMATION
Ordering Number
Package
Packing
Normal
Lead Free Plating
UR5596-S08-R
UR5596-S08-T
UR5596L-S08-R
UR5596L-S08-T
SOP-8
SOP-8
Tape Reel
Tube
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Copyright © 2005 Unisonic Technologies Co.,LTD
QW-R502-045,A
UR5596
MOS IC
ꢀ
PIN CONFIGURATION
1
2
3
4
8
7
6
VTT
GND
SHDN
VSENSE
PVIN
AVIN
VREF
5
VDDQ
ꢀ
PIN DESCRIPTION
PIN NO.
PIN NAME
GND
PIN FUNCTION
1
2
3
4
5
6
7
8
Ground
SHDN
VSENSE
VREF
Shutdown
Feedback pin for regulating VTT.
Buffered internal reference voltage of VDDQ/2
Input for internal reference equal to VDDQ/2
Analog input pin
VDDQ
AVIN
PVIN
Power input pin
VTT
Output voltage for connection to termination resistors
ꢀ
BLOCK DIAGRAM
AVIN
PVIN
VDDQ
SHDN
50k
50k
+
-
VREF
VTT
-
+
VSENSE
GND
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QW-R502-045,A
UR5596
MOS IC
ꢀ
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
VDD
RATINGS
-0.3 ~ +6
2.2 ~ 5.5
125
UNIT
V
PVIN, AVIN, VDDQ to GND
AVIN to GND(Note 1)
Supply Voltage
VDD
V
℃
Junction Temperature
TJ
℃
TOPR
TSTG
θJA
Operation Temperature(Note 2)
Storage Temperature
-20 ~ +85
-40 ~ +150
150
℃
Thermal Resistance Junction-Ambient
℃/W
Note: 1.Signified recommend operating range that indicates conditions for which the device is intended to be
functional, but does not guarantee specific performance limits.
2.The device is guaranteed to meet performance specification within 0℃~70℃ operating temperature range
and assured by design from –20℃~+85℃.
3.Absolute maximum ratings indicate limits beyond which damage to the device may occur.
ꢀ
ELECTRICAL CHARACTERISTICS
(TJ=25°C, VIN=AVIN=PVIN=2.5V, VDDQ=2.5V, unless otherwise specified).
PARAMETER
SYMBOL
TEST CONDITIONS
VIN = VDDQ = 2.3V
MIN
1.135
1.235
1.335
1.125
1.225
1.325
1.125
1.225
1.325
1.9
TYP
MAX
UNIT
V
1.158 1.185
1.258 1.285
1.358 1.385
1.159 1.190
1.259 1.290
1.359 1.390
1.159 1.190
1.259 1.290
1.359 1.390
VREF Voltage
VREF
V
V
IN = VDDQ = 2.5V
IN = VDDQ = 2.7V
VIN = VDDQ = 2.3V
IOUT = 0A
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
VTT Output Voltage
VTT
V
IOUT = ±1.5A
High
Low
VIH
VIL
Minimum Shutdown Level
V
0.8
I
I
I
OUT = 0A
OUT = -1.5A
OUT = +1.5A
-20
-25
-25
0
0
0
20
25
25
VosTT
VTT
VTT Output Voltage Offset (VREF - VTT)
mV
Quiescent Current
IQ
ISD
IOUT = 0A
SD = 0V
SD = 0V
SD = 0V
320
115
2
500
150
5
µA
µA
µA
Quiescent Current in Shutdown
Shutdown Leakage Current
IQ_SD
VTT Leakage Current in Shutdown
IV
1
10
µA
VTT = 1.25V
VSENSE Input Current
ISENSE
13
2.5
100
165
10
nA
kΩ
kΩ
℃
VREF Output Impedance
VDDQ Input Impedance
Thermal Shutdown
ZVREF IREF = -30 ~ +30 µA
ZVDDQ
TSD
℃
Thermal Shutdown Hysteresis
TSD-HYS
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QW-R502-045,A
UR5596
MOS IC
ꢀ
PIN DESCRIPTIONS
AVIN , PVIN
Input supply pins. AVIN is used to supply all the internal analog circuits and PVIN is used to provide the output stage
to create VTT. These pins have the capability to work off separate supplies depending on the application. Higher
voltages on PVIN will increase the maximum continuous output current because of output RDSON limitations at
voltages close to VTT. But the internal power loss will also increase, thermally limiting the design. If the junction
temperature exceeds the thermal shutdown than the part will enter a shutdown state identical to the manual
shutdown where VTT is tri-stated and VREF remains active.
For SSTL-2 applications, a good compromise would be to connect the AVIN and PVIN directly together at 2.5V. This
eliminates the need for bypassing the two supply pins separately. The only limitation on input voltage selection is
that PVIN must be equal to or lower than AVIN. It is recommended to connect PVIN to voltage rails equal to or less
than 3.3V to prevent the thermal limit from tripping because of excessive internal power dissipation.
VDDQ
The input pin used to create the internal reference voltage from a resistor divider of two internal 50kΩ resistors for
regulating VTT and to guarantee VTT will track VDDQ/2 precisely. As a remote sense by connecting VDDQ directly to the
2.5V rail for SSTL-2 applications is an optimal implementation of VDDQ at the DIMM. This ensures that the reference
voltage tracks the DDR memory rails precisely without a large voltage drop from the power lines.
VSENSE
The sense pin supply improved remote load regulation, if remote load regulation is not used then the VSENSE pin
must still be connected to VTT. A long trace will cause a significant IR drop resulting in a termination voltage lower at
one end of the bus than the other. Connect VSENSE pin to the middle of the bus to provide a better distribution across
the entire termination bus then DDR performance will be improved. Take notice of when a long VSENSE trace is
implemented in close proximity to the memory, noise pickup in the VSENSE trace can cause problems with precise
regulation of VTT. A ceramic capacitor of 0.1uF is placed to next the VSENSE pin can help filter any high frequency
signals and preventing errors.
VREF
VREF supply the buffered output of the internal reference voltage VDDQ/2. This output delivers the reference voltage
for the Northbridge chipset and memory. Since these inputs are typically extremely high impedance, there should be
little current drawn from VREF. A 0.1µF~0.01µF ceramic capacitor could be used to acquire better performance,
located close to the pin to help with noise. This output remains active during the shutdown state and thermal
shutdown events for the suspend to RAM functionality.
VTT
VTT is a regulated output for the bus resistors termination of DDR-SDRAM. It can track precisely the VDDQ/2
voltage with the sinking and sourcing current capability. The UTC UR5596 is designed to handle peak transient
currents of up to ± 3A with a fast transient response. If a transient is expected to remain above the maximum
continuous current rating for a significant amount of time then the output capacitor size should be large enough to
prevent an excessive voltage drop.
Although UTC UR5596 can handle large transient output currents, but it can not handling these for long durations
since the limited thermal dissipation capability of SOP-8 package. If large currents are required for longer durations,
then must ensure the maximum junction temperature is not exceeded, otherwise, the maximum output current will be
degraded with heating. Proper thermal de-rating should always be used. While the temperature beyond the junction
temperature, the thermal shutdown protection will be functioned, then VTT will tri-state until the part returns below the
hysteretic trigger point.
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UR5596
MOS IC
ꢀ
CAPACITOR SELECTION
A capacitor is recommended for improve performance during large load transients to prevent the input rail from
dropping, even though UR5596 does not require for input stability. The input capacitor should be located as close as
possible to the PVIN pin. The typical recommended value for AL electrolytic capacitors is 50 µF and 10 µF with X5R
or better for Ceramic capacitors. If AVIN and PVIN are separated, the 47µF capacitor should be placed as close to
possible to the PVIN rail. An additional 0.1uF ceramic capacitor can be placed on the AVIN rail to prevent excessive
noise from coupling into the device.
UTC UR5596 has been designed to be insensitive of output capacitor size or ESR (Equivalent Series Resistance).
The choice for output capacitor depends on the application and the requirements for load transient response of VTT.
As a general recommendation the output capacitor should be sized above 100 µF with a low ESR for SSTL
applications with DDR-SDRAM. The value of ESR should be determined by the maximum current spikes expected
and the extent at which the output voltage is allowed to droop.
ꢀ
THERMAL DISSIPATION
The UR5596 will generate heat result from internal power dissipation when current flow working. The device might
be damaged any beyond maximum junction temperature rating. The maximum allowable internal temperature rise
(TRmax) can be calculated given the maximum ambient temperature (TAmax) of the application and the maximum
allowable junction temperature (TJmax).
TRmax = TJmax − TAmax
From this equation, the maximum power dissipation (PDmax) of the part can be calculated:
PDmax = TRmax / θJA
The θJA of UR5596 can be calculated (refer to JEDEC standard) and will depend on several package type,
materials, ambient air temperature and so on.
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QW-R502-045,A
UR5596
MOS IC
ꢀ
TYPICAL APPLICATION CIRCUITS
Following demonstrate several different application circuits to illustrate some of the options that are possible in
configuring the UTC UR5596. The individual circuit performance can be found in the Typical Performance
Characteristics that curve graphs illustrate how the maximum output current is affected by changes in AVIN and PVIN.
STUB-SERIES TERMINATED LOGIC(SSTL) TERMINATION SCHEME
SSTL was created to improve signal integrity of the data transmission across the memory bus. This termination
scheme is essential to prevent data error from signal reflections while transmitting at high frequencies encountered
with DDR-SDRAM. Class II single parallel termination(SSTL-2) is the most popular termination form. It involves one
RS series resistor from the chipset to the memory and one RT termination resistor (refer to Figure 1). RS and RT are
changeable to meet the current requirement from UR5596, the recommended values both RS and RT are 25Ω.
VTT
VDD
R
T
MEMORY
RS
CHIPSET
VREF
Figure 1. SSTL-Termination Scheme
FOR SSTL-2 APPLICATIONS
For the majority of applications that implement the SSTL- 2 termination scheme, it is recommended to connect all
the input rails to the 2.5V rail as Figure 2. This provides an optimal trade-off between power dissipation and
component count and selection.
UTC UR5596
V
REF=1.25V
SHDN
SHDN
VDDQ
VREF
+
+
C
REF
V
DDQ=2.5V
AVIN
PVIN
VSENSE
VTT
V
DD=2.5V
VTT=1.25V
+
C
IN
GND
C
OUT
Figure 2. Recommended SSTL-2 Implementation
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QW-R502-045,A
UR5596
MOS IC
Figure 3 illustrate another application that the power rails are split when power dissipation or efficiency are
concerned. The output stage (PVIN) can be as lower as 1.8V, and the analog circuitry (AVIN) can be connected to a
higher rail such as 2.5V, 3.3V or 5V. This allows the internal power dissipation to be lowered when sourcing current
from VTT, but the disadvantage of this circuit is the maximum continuous current is reduced.
UTC UR5596
V
REF=1.25V
SHDN
SHDN
VDDQ
VREF
+
+
C
REF
V
DDQ=2.5V
AVIN
PVIN
VSENSE
VTT
AVIN=2.2V ~ 5.5V
PVIN=1.8V
VTT=1.25V
+
C
IN
GND
C
OUT
Figure 3. Lower Power Dissipation SSTL-2 Implementation
The third optional application is that PVIN connect to 3.3V and AVIN will be always limited to operation on the 3.3V
or 5V to always equal or higher than PVIN. This configuration has the ability to provide the maximum continuous
output current at the downside of higher thermal dissipation. The power dissipation increasing problem must be
careful to prevent the junction temperature to exceed the maximum ranting. Because of this risk it is not
recommended to supply the output stage with a voltage higher than a nominal 3.3V rail.
UTC UR5596
V
REF=1.25V
SHDN
SHDN
VDDQ
VREF
+
+
C
REF
V
DDQ=2.5V
AVIN
PVIN
VSENSE
VTT
AVIN=3.3V or 5.5V
PVIN=3.3V
VTT=1.25V
+
C
IN
GND
C
OUT
Figure 4. SSTL-2 Implementation with higher voltage rails
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QW-R502-045,A
UR5596
MOS IC
FOR DDR-II APPLICATIONS
As a result of the separate VDDQ pin and an internal resistor divider, UR5596 can be utilized in DDR-II system,
figure 5 and 6 show two recommended circuits in DDR-II SDRAM application. The output stage is connected to the
1.8V rail and the AVIN pin can be connected to either a 3.3V or 5V rail. If it is not desirable to use the 1.8V rail it is
possible to connect the output stage to a 3.3V rail. The power dissipation increasing concern must be careful as well
SSTL-II application. The advantage of configuration of figure 6 is that it has the ability to source and sink a higher
maximum continuous current.
UTC UR5596
V
REF=0.9V
SHDN
SHDN
VDDQ
VREF
+
+
C
REF
V
DDQ=1.8V
AVIN
PVIN
VSENSE
VTT
AVIN=2.2V ~ 5.5V
PVIN=1.8V
VTT=0.9V
+
GND
C
IN
C
OUT
Figure 5. Recommended DDR-II Termination
UTC UR5596
V
REF=0.9V
SHDN
SHDN
VDDQ
VREF
+
+
C
REF
V
DDQ=1.8V
AVIN
PVIN
VSENSE
VTT
AVIN=3.3V or 5.5V
PVIN=3.3V
V
TT=0.9V
+
GND
C
IN
C
OUT
Figure 6. DDR-II Termination with higher voltage rails
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UR5596
MOS IC
ꢀ
TYPICAL PERFORMANCE CHARACTERISTICS
VIH and V
VREF vs IREF
IL
4
1.40
3.5
1.35
1.30
3
2.5
1.25
1.20
2
1.5
1
1.15
1.10
0.5
2
2.5
3
3.5
4
4.5
5
5.5
-30
-20
-10
0
10
20
30
I
REF(μA)
AVIN (V)
VREF vs VDDQ
VTT vs IOUT
3
2.5
2
1.275
1.270
1.265
1.260
1.255
1.5
1
0.5
1.250
1.245
0
0
1
2
3
4
5
6
-100 -75 -50 -25
0
25 50 75 100
VDDQ(V)
I
OUT (mA)
VTT vs VDDQ
Maximum Sourcing Current vs AV
IN
3
2.5
2
1.4
1.2
1
(VDDQ=2.5V, PVIN=1.8V)
0.8
1.5
1
0.6
0.4
0.2
0
0.5
0
0
1
2
3
4
5
6
3
4
2
2.5
3.5
4.5
5
5.5
V
DDQ(V)
AVIN (V)
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UR5596
MOS IC
ꢀ
TYPICAL PERFORMANCE CHARACTERISTICS(cont.)
Maximum Sourcing Current vs AV
Maximum Sourcing Current vs AV
IN
IN
3
2.8
2.6
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
(VDDQ=2.5V, PVIN=2.5V)
(VDDQ=2.5V, PVIN=3.3V)
2.4
2.2
2
2
2.5
3
3.5
4
4.5
5
5.5
3
3.5
4
4.5
AVIN (V)
5
5.5
AVIN (V)
Maximum Sinking Current vs AV
Maximum Sourcing Current vs AV
IN
IN
(VDDQ=2.5V)
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
1.4
1.2
VDDQ=2.5V
(VDDQ=1.8V, PVIN=1.8V)
1
0.8
0.6
0.4
0.2
0
3
4
2
2.5
3.5
4.5
5
5.5
2
2.5
3
3.5
4
4.5
5
5.5
AVIN (V)
AVIN (V)
Maximum Sourcing Current vs AV
IN
Maximum Sinking Current vs AV
IN
(VDDQ=1.8V, PVIN=3.3V)
(VDDQ=1.8V)
3
2.8
2.6
2.4
VDDQ=1.8V
(VDDQ=1.8V, PVIN=3.3V)
2.2
2
1.8
1.6
1.4
1.2
1
2.4
2.2
2
3
3.5
4
4.5
AVIN (V)
5
5.5
2
2.5
3
3.5
4
4.5
5
5.5
AVIN (V)
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QW-R502-045,A
UR5596
MOS IC
UTC assumes no responsibility for equipment failures that result from using products at values that
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specifications of any and all UTC products described or contained
herein. UTC products are not designed for use in life support appliances, devices or systems where
malfunction of these products can be reasonably expected to result in personal injury. Reproduction in
whole or in part is prohibited without the prior written consent of the copyright owner. The information
presented in this document does not form part of any quotation or contract, is believed to be accurate
and reliable and may be changed without notice.
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QW-R502-045,A
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