W3EG7263S-JD3 [WEDC]

512MB- 64Mx72 DDR SDRAM REGISTERED w/PLL; 512MB- 64Mx72 DDR SDRAM挂号W / PLL
W3EG7263S-JD3
型号: W3EG7263S-JD3
厂家: WHITE ELECTRONIC DESIGNS CORPORATION    WHITE ELECTRONIC DESIGNS CORPORATION
描述:

512MB- 64Mx72 DDR SDRAM REGISTERED w/PLL
512MB- 64Mx72 DDR SDRAM挂号W / PLL

动态存储器 双倍数据速率
文件: 总13页 (文件大小:219K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY*  
512MB- 64Mx72 DDR SDRAM REGISTERED w/PLL  
FEATURES  
DESCRIPTION  
Double-data-rate architecture  
The W3EG7263S is a 64Mx72 Double Data Rate  
SDRAM memory module based on 256Mb DDR SDRAM  
component. The module consists of eighteen 64Mx4 DDR  
SDRAMs in 66 pin TSOP package mounted on a 184 Pin  
FR4 substrate.  
Clock Speeds: 100MHz, 133MHz and 166MHz  
Bi-directional data strobes (DQS)  
Differential clock inputs (CK & CK#)  
Programmable Read Latency 2,2,5 (clock)  
Programmable Burst Length (2,4,8)  
Programmable Burst type (sequential & interleave)  
Edge aligned data output, center aligned data input  
Auto and self refresh  
Synchronous design allows precise cycle control with the  
use of system clock. Data I/O transactions are possible on  
both edges and Burst Lenths allow the same device to be  
useful for a variety of high bandwidth, high performance  
memory system applications.  
Serial presence detect  
Power supply: VCC: 2.5V 0.2V  
This product is under development, is not qualified or characterized and is subject to  
change without notice.  
JEDEC standard 184 pin DIMM package  
Package height options:  
JD3: 30.48mm (1.20") and  
AJD3: 28.70mm (1.13")  
OPERATING FREQUENCIES  
DDR333 @CL=2.5  
DDR266 @CL=2  
133MHz  
DDR266 @CL=2  
133MHz  
DDR266 @CL=2.5  
133MHz  
DDR200 @CL=2  
100MHz  
Clock Speed  
CL-tRCD-tRP  
166MHz  
2.5-3-3  
2-2-2  
2-3-3  
2.5-3-3  
2-2-2  
April 2004  
Rev. # 2  
1
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
PIN CONFIGURATION  
PIN NAMES  
A0-A12  
Address input (Multiplexed)  
Bank Select Address  
Data Input/Output  
Check bits  
PIN SYMBOL PIN SYMBOL PIN SYMBOL PIN SYMBOL  
BA0-BA1  
DQ0-DQ63  
CB0-CB7  
1
VREF  
DQ0  
VSS  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
57  
58  
59  
60  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
73  
74  
75  
76  
77  
78  
79  
80  
81  
82  
83  
84  
85  
86  
87  
88  
89  
90  
91  
92  
DQS8  
A0  
93  
94  
VSS  
DQ4  
DQ5  
VCCQ  
DQS9  
DQ6  
DQ7  
VSS  
139  
140  
141  
142  
143  
144  
145  
146  
147  
148  
149  
150  
151  
152  
153  
154  
155  
156  
157  
158  
159  
160  
161  
162  
163  
164  
165  
166  
167  
168  
169  
170  
171  
172  
173  
174  
175  
176  
177  
178  
179  
180  
181  
182  
183  
184  
VSS  
DQS17  
A10  
2
3
CB2  
95  
DQS0-DQS17 Data Strobe Input/Output  
CK0  
4
DQ1  
DQS0  
DQ2  
VCC  
DQ3  
NC  
RESET#  
VSS  
DQ8  
DQ9  
DQS1  
VCCQ  
NC  
VSS  
96  
CB6  
Clock Input  
Clock Input  
5
CB3  
BA1  
97  
VCCQ  
CK0#  
CKE0  
CS0#  
RAS#  
CAS#  
WE#  
VCC  
6
98  
CB7  
Clock Enable input  
Chip Select Input  
Row Address Strobe  
Column Address Strobe  
Write Enable  
Power Supply (2.5V)  
Power Supply for DQS (2.5V)  
Ground  
Power Supply for Reference  
Serial EEPROM Power Supply  
(2.3V to 3.6V)  
Serial data I/O  
Serial clock  
7
DQ32  
VCCQ  
DQ33  
DQS4  
DQ34  
VSS  
99  
VSS  
8
100  
101  
102  
103  
104  
105  
106  
107  
108  
109  
110  
111  
112  
113  
114  
115  
116  
117  
118  
119  
120  
121  
122  
123  
124  
125  
126  
127  
128  
129  
130  
131  
132  
133  
134  
135  
136  
137  
138  
DQ36  
DQ37  
VCC  
DQS13  
DQ38  
DQ39  
VSS  
DQ44  
RAS#  
DQ45  
VCCQ  
CS0#  
NC  
9
NC  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
NC  
NC  
VCCQ  
DQ12  
DQ13  
DQS10  
VCC  
VCCQ  
BA0  
VSS  
DQ35  
DQ40  
VCCQ  
WE#  
DQ41  
CAS#  
VSS  
VREF  
VCCSPD  
NC  
VSS  
DQ14  
DQ15  
NC  
VCCQ  
NC  
DQ20  
A12  
VSS  
SDA  
SCL  
SA0-SA2  
VCCID  
NC  
RESET#  
DQ10  
DQ11  
CKE0  
VCCQ  
DQ16  
DQ17  
DQS2  
VSS  
A9  
DQ18  
A7  
VCCQ  
DQ19  
A5  
DQ24  
VSS  
Address in EEPROM  
VCC Indentification Flag  
No Connect  
DQS5  
DQ42  
DQ43  
VCC  
DQS14  
VSS  
Reset Enable  
DQ46  
DQ47  
NC  
NC  
DQ21  
A11  
DQ48  
DQ49  
VSS  
VCCQ  
DQS11  
VCC  
DQ22  
A8  
DQ52  
DQ53  
NC  
NC  
NC  
VCC  
VCCQ  
DQS6  
DQ50  
DQ51  
VSS  
VCCID  
DQ56  
DQ57  
VCC  
DQS7  
DQ58  
DQ59  
VSS  
DQ23  
VSS  
DQS15  
DQ54  
DQ55  
VCCQ  
A6  
DQ28  
DQ29  
VCCQ  
DQS12  
A3  
DQ25  
DQS3  
A4  
NC  
DQ60  
DQ61  
VSS  
VCC  
DQ26  
DQ27  
A2  
DQ30  
VSS  
DQS16  
DQ62  
DQ63  
VCCQ  
DQ31  
CB4  
CB5  
VCCQ  
CK0  
CK0#  
VSS  
A1  
CB0  
CB1  
VCC  
SA0  
NC  
SDA  
SCL  
SA1  
SA2  
VCCSPD  
April 2004  
Rev. # 2  
2
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
FUNCTIONAL BLOCK DIAGRAM  
DQS9  
-AJD3  
PRELIMINARY  
VSS  
RS0A#  
DQS0  
DQS  
I/O3  
DM  
CS#  
DQS  
DM  
CS#  
DQ0  
DQ1  
DQ2  
I/O3  
DQ4  
DQ5  
DQ6  
DQ7  
I/O2  
I/O1  
I/O0  
I/O2  
I/O1  
I/O0  
D0  
D9  
DQ3  
DQS1  
DQS10  
DQS11  
DQS12  
DQS13  
DQS14  
DQS  
CS#  
DM  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
DM  
CS#  
D1  
I/O3  
I/O2  
I/O1  
DQ8  
DQ9  
DQ10  
DQ12  
DQ13  
DQ14  
DQ15  
D10  
I/O0  
DQ11  
DQS2  
CS#  
D11  
CS#  
D2  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
DM  
DM  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
DM  
DM  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQS3  
DQS4  
DQS5  
DQS6  
CS#  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
CS#  
D3  
DQS  
I/O3  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
I/O2  
D12  
I/O1  
I/O0  
CS#  
D4  
DQS  
I/O3  
I/O2  
I/O1  
DM  
DQS  
CS#  
DM  
DM  
CK0  
SDRAM  
PLL  
DQ32  
DQ33  
DQ34  
DQ36  
DQ37  
DQ38  
DQ39  
I/O3  
I/O2  
D13  
I/O1  
I/O0  
I/O0  
DQ35  
CK0#  
REGISTER  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
CS#  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
DM  
DM  
CS#  
D5  
DQ44  
DQ45  
DQ46  
DQ40  
DQ41  
DQ42  
DQ43  
D14  
DQ47  
DQS15  
DQS16  
DQS17  
Serial PD  
DQS  
CS#  
D6  
DQS  
I/O3  
I/O2  
I/O1  
CS#  
DM  
DM  
I/O3  
I/O2  
I/O1  
I/O0  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
SCL  
WP  
D15  
SDA  
I/O0  
A0  
A1  
A2  
DQS7  
DQS8  
SA0 SA1  
SA2  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
CS#  
D7  
DM  
DM  
DQS  
I/O3  
I/O2  
CS#  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
D16  
DQ62  
DQ63  
I/O1  
I/O0  
VCCSPD  
SPD  
VCC/VCCQ  
D0 - D17  
D0 - D17  
DQS  
I/O3  
I/O2  
I/O1  
I/O0  
CS#  
D8  
DQS  
CS#  
DM  
DQ56  
DQ57  
DQ58  
DQ59  
I/O3  
CB4  
CB5  
CB6  
I/O2  
D17  
VREF  
VSS  
D0 - D17  
D0 - D17  
I/O1  
I/O0  
CB7  
CS0#  
RS0A#  
RS0B#  
R
E
G
I
S
T
E
R
Notes:  
RBA0- RBA1  
RA0- RA12  
RRAS#  
BA0-BA1: SDRAMs DQ0-D17  
A0-A12: SDRAMs DQ0-D17  
RAS#: SDRAMs DQ0-D17  
CAS#: SDRAMs DQ0-D17  
CKE: SDRAMs DQ0-D8  
CKE: SDRAMs DQ9-D17  
WE#: SDRAMs DQ0-D17  
BA0-BA1  
.
A0-A12  
RAS#  
CAS#  
CKE0  
1. DQ-to-I/O wiring is shown as recommended but may be changed.  
2. DQ/DQS/DM/CKE/S relationships must be maintained as shown.  
3. DQ, DQSresistors: 22 Ohms  
RCAS  
RCKE0A  
RCKE0B  
RWE#  
WE#  
PCK  
PCK#  
RESET#  
April 2004  
Rev. # 2  
3
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
ABSOLUTE MAXIMUM RATINGS  
Symbol  
Parameter  
Value  
-0.5 - 3.6  
-1.0 - 3.6  
-55 - +150  
27  
Units  
V
V
°C  
W
Voltage on any pin relative to VSS  
Voltage on VCC supply relative to VSS  
Storage Temperature  
VIN, VOUT  
VCC, VCCQ  
TSTG  
Power Dissipation  
PD  
Short Circuit Current  
I0S  
50  
mA  
Note: Permanent device damage may occur if ‘ABSOLUTE MAXIMUM RATINGS’ are exceeded.  
Functional operation should be restricted to recommended operating condition.  
Exposure to higher than recommended voltage for extended periods of time could affect device reliability  
DC CHARACTERISTICS  
0°C £ TA £ 70°C, VCC = 2.5V 0.2V  
Parameter  
Supply Voltage  
Symbol  
VCC  
Min  
2.3  
Max  
2.7  
Unit  
V
Supply Voltage  
VCCQ  
VREF  
VTT  
VIH  
VIL  
2.3  
1.15  
1.15  
2.7  
1.35  
1.35  
V
V
V
V
V
V
V
Reference Voltage  
Termination Voltage  
Input High Voltage  
Input Low Voltage  
Output High Voltage  
Output Low Voltage  
VREF + 0.15  
-0.3  
VTT + 0.76  
VCCQ + 0.3  
VREF - 0.15  
VOH  
VOL  
VTT - 0.76  
CAPACITANCE  
TA = 25°C, f = 1MHz, VCC = 2.5V  
Parameter  
Input Capacitance (A0-A12)  
Input Capacitance (RAS#, CAS#, WE#)  
Input Capacitance (CKE0)  
Input Capacitance (CK0,CK0#)  
Input Capacitance (CS0#)  
Input Capacitance (DQM0-DQM8)  
Input Capacitance (BA0-BA1)  
Data input/output capacitance (DQ0-DQ63)(DQS)  
Data input/output capacitance (CB0-CB7)  
Symbol  
CIN1  
CIN2  
CIN3  
CIN4  
CIN5  
CIN6  
CIN7  
COUT  
COUT  
Min  
Max  
6.5  
6.5  
6.5  
5.5  
6.5  
8
6.5  
8
8
Unit  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
April 2004  
Rev. # 2  
4
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
IDD SPECIFICATIONS AND TEST CONDITIONS  
Recommended operating conditions, 0°C £ TA £ +70°C, VCCQ = 2.5V 0.2V, VCC = 2.5V 0.2V.  
Includes DDR SDRAM components and PLL and Register  
Rank 2  
Standby  
State  
Rank 1  
DDR333@CL=2.5 DDR266:@CL=2, 2.5 DDR200@CL=2 S  
Parameter  
Symbol Conditions  
Max  
Max  
Max  
Units  
Operating Current  
IDD0  
One device bank; Active - Precharge;  
TBD  
1715  
1715  
mA  
IDD3N  
t
RC = tRC (MIN); tCK = tCK (MIN); DQ,DM  
and DQS inputs changing once per  
clock cycle; Address and control inputs  
changing once every two cycles.  
Operating Current  
IDD1  
One device bank; Active-Read-  
TBD  
2255  
2255  
mA  
IDD3N  
Precharge Burst = 2; tRC = tRC (MIN);  
t
CK = tCK (MIN); lOUT = 0mA; Address  
and control inputs changing once per  
clock cycle.  
Precharge Power-  
IDD2P  
IDD2F  
All device banks idle; Power-down  
mode; tCK = tCK (MIN); CKE = (low)  
TBD  
TBD  
54  
54  
rnA  
mA  
IDD2P  
IDD2F  
Down Standby Current  
Idle Standby Current  
CS# = High; All device banks idle;  
671  
671  
t
CK = tCK (MIN); CKE = High; Address  
and other control inputs changing once  
per clock cycle. VIN = VREF for DQ, DQS  
and DM.  
Active Power-Down  
Standby Current  
IDD3P  
IDD3N  
One device bank active; Power-Down  
mode; tCK (MIN); CKE = (low)  
TBD  
TBD  
540  
540  
mA  
mA  
IDD3P  
IDD3N  
Active Standby Current  
CS# = High; CKE = High; One device  
bank; Active-Precharge;tRC = tRAS  
(MAX); tCK = tCK (MIN); DQ, DM and  
DQS inputs changing twice per clock  
cycle; Address and other control inputs  
changing once per clock cycle.  
1121  
1121  
Operating Current  
Operating Current  
IDD4R  
Burst = 2; Reads; Continuous burst;  
One device bank active; Address and  
control inputs changing once per clock  
cycle; tCK = tCK (MIN); lOUT = 0mA.  
TBD  
TBD  
2795  
2795  
2795  
2795  
mA  
rnA  
IDD3N  
IDD4W  
Burst = 2; Writes; Continuous burst;  
One device bank active; Address and  
control inputs changing once per clock  
cycle; tCK = tCK (MIN); DQ,DM and DQS  
inputs changing once per clock cycle.  
IDD3N  
Auto Refresh Current  
Self Refresh Current  
Operating Current  
IDD5  
IDD6  
tRC = tRC (MIN)  
TBD  
TBD  
TBD  
3281  
365  
3281  
365  
mA  
mA  
mA  
IDD3N  
IDD6  
CKE £ 0.2V  
IDD7A  
Four bank interleaving Reads (BL=4)  
with auto precharge with tRC=tRC (MIN);  
5315  
5315  
IDD3N  
t
CK=tCK(MIN); Address and control  
inputs change only during Active Read  
or Write commands.  
April 2004  
Rev. # 2  
5
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
DETAILED TEST CONDITIONS FOR DDR SDRAM IDD1 & IDD7A  
IDD1 : OPERATING CURRENT: ONE BANK  
IDD7A: OPERATING CURRENT: FOUR BANKS  
1. Typical Case: VCC = 2.5V, T = 25°C  
2. Worst Case: VCC = 2.7V, T = 10°C  
1. Typical Case: VCC = 2.5V, T = 25°C  
2. Worst Case: VCC = 2.7V, T = 10°C  
3. Only one bank is accessed with tRC (min), Burst  
Mode, Address and Control inputs on NOP edge are  
changing once per clock cycle. lOUT = 0mA  
4. Timing patterns  
3. Four banks are being interleaved with tRC (min), Burst  
Mode, Address and Control inputs on NOP edge are  
not changing.  
lout = 0mA  
• DDR200 (100MHz, CL = 2) : tCK = 10ns, CL2, BL =  
4, tRCD = 2*tCK, tRAg = 5*tCK  
4. Timing patterns  
• DDR200 (100MHz, CL = 2) : tCK = 10ns, CL2, BL =  
4, tRRD = 2*tCK, tRCD = 3*tCK, Read with autoprecharge  
Read: A0 N A1 R0 A2 R1 A3 R2 A0 R3 A1 R0  
- repeat the same timing with random address  
changing; 100% of data changing at every burst  
• DDR266 (133MHz, CL = 2.5) : tCK = 7.5ns, CL  
= 2.5, BL = 4, tRRD = 3*tCK, tRCD = 3*tCK Read with  
autoprecharge  
Read: A0 N R0 N N P0 N A0 N - repeat the same  
timing with random address changing; 50% of data  
changing at every burst  
• DDR266 (133MHz, CL = 2.5) : tCK = 7.5ns, CL = 2.5,  
BL = 4, tRCD = 3*tCK, tRC = 9*tCK, tRAg = 5*tCK  
Read: A0 N N R0 N P0 N N N A0 N - repeat the  
same timing with random address changing; 50% of  
data changing at every burst  
• DDR266 (133MHz, CL = 2) : tCK = 7.5ns, CL = 2, BL  
= 4, tRCD = 3*tCK, tRC = 9*tCK, tRAg = 5*tCK  
Read: A0 N N R0 N P0 N N N A0 N - repeat the  
same timing with random address changing; 50% of  
data changing at every burst  
• DDR333 (166MHz, CL = 2.5) : tCK = 6ns, BL = 4,  
tRCD = 10*tCK, tRAg = 7*tCK  
Read: A0 N N R0 N P0 N N N A0 N — repeat the  
same timing with random address changing; 50% of  
data changing at every burst  
Read: A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1  
R0 - repeat the same timing with random address  
changing; 100% of data changing at every burst  
• DDR266 (133MHz, CL = 2): tCK = 7.5ns, CL2 = 2,  
BL = 4, tRRD = 2*tCK, tRCD = 3*tCK  
Read: A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1  
R0 - repeat the same timing with random address  
changing; 100% of data changing at every burst  
• DDR333 (166MHz, CL = 2.5) : tCK = 6ns, BL = 4,  
tRRD = 3*tCK, tRCD = 3*tCK, Read with autoprecharge  
Read: A0 N A1 R0 A2 R1 A3 R2 N R3 A0 N A1  
R0 - repeat the same timing with random address  
changing; 100% of data changing at every burst  
Legend: A = Activate, R = Read, W = Write, P =  
Precharge, N = NOP  
A (0-3) = Activate Bank 0-3  
R (0-3) = Read Bank 0-3  
April 2004  
Rev. # 2  
6
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND  
RECOMMENDED AC OPERATING CONDITIONS  
Notes 1-5, 7; notes appear following parameter tables; 0°C ≤ TA ≤ +70°C; VCC = +2.5V 0.2V, VCCQ = +2.5V 0.2V  
AC Characteristics  
335  
262/263/265  
202  
Parameter  
Symbol  
tAC  
Min  
-0.7  
0.45  
0.45  
6
Max  
+0.7  
0.55  
0.55  
13  
Min  
Max  
+0.75  
0.55  
0.55  
13  
Min  
-0.8  
0.45  
0.45  
8
Max  
+0.8  
0.55  
0.55  
13  
Units  
ns  
tCK  
tCK  
ns  
ns  
ns  
ns  
ns  
ns  
tCK  
tCK  
ns  
tCK  
tCK  
tCK  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Notes  
Access window of DQs from CK, CK#  
CK high-level width  
CK low-level width  
-0.75  
0.45  
0.45  
7.5  
tCH  
16  
16  
tCL  
Clock cycle time  
CL=2.5  
CL=2  
t
CK (2.5)  
tCK (2)  
tDH  
22  
7.5  
13  
7.5/10  
0.5  
13  
10  
13  
22  
DQ and DM input hold time relative to DQS  
DQ and DM input setup time relative to DQS  
DQ and DM input pulse width (for each input)  
Access window of DQS from CK, CK#  
DQS input high pulse width  
0.45  
0.45  
1.75  
-0.60  
0.35  
0.35  
0.6  
0.6  
2
14,17  
14,17  
17  
tDS  
0.5  
tDIPW  
tDQSCK  
tDQSH  
tDQSL  
tDQSQ  
tDQSS  
tDSS  
tDSH  
tHP  
1.75  
-0.75  
0.35  
0.35  
+0.60  
+0.75  
-0.8  
0.35  
0.35  
+0.8  
DQS input low pulse width  
DQS-DQ skew, DQS to last DQ valid, per group, per access  
Write command to first DQS latching transition  
DQS falling edge to CK rising - setup time  
DQS falling edge from CK rising - hold time  
Half clock period  
0.35  
1.25  
0.5  
0.6  
13,14  
0.75  
0.2  
0.75  
0.2  
1.25  
0.75  
0.2  
1.25  
0.2  
0.2  
0.2  
tCH, tCL  
+0.70  
tCH, tCL  
+0.75  
tCH, tCL  
18  
8,19  
8,20  
6
Data-out high-impedance window from CK, CK#  
Data-out low-impedance window from CK, CK#  
Address and control input hold time (fast slew rate)  
Address and control input set-up time (fast slew rate)  
Address and control input hold time (slow slew rate)  
Address and control input setup time (slow slew rate)  
Address and control input pulse width (for each input)  
LOAD MODE REGISTER command cycle time  
DQ-DQS hold, DQS to first DQ to go non-valid, per access  
Data hold skew factor  
tHZ  
+0.8  
tLZ  
-0.70  
0.75  
0.75  
0.80  
0.80  
2.2  
-0.75  
0.90  
0.90  
1
-0.8  
1.1  
1.1  
1.1  
1.1  
2.2  
16  
tIHf  
tISf  
6
tIHs  
6
tISs  
1
6
tIPW  
2.2  
15  
tMRD  
tQH  
12  
tHP-tQHS  
0.50  
120,000  
tHP-tQHS  
tHP-tQHS  
13,14  
15  
tQHS  
tRAS  
tRAP  
tRC  
0.75  
1
ACTIVE to PRECHARGE command  
42  
18  
60  
72  
40  
20  
65  
75  
120,000  
40  
20  
70  
80  
120,000  
ACTIVE to READ with Auto precharge command  
ACTIVE to ACTIVE/AUTO REFRESH command period  
AUTO REFRESH command period  
tRFC  
21  
April 2004  
Rev. # 2  
7
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
DDR SDRAM COMPONENT ELECTRICAL CHARACTERISTICS AND  
RECOMMENDED AC OPERATING CONDITIONS (continued)  
Notes 1-5, 7; notes appear following parameter tables; 0°C ≤ TA ≤ +70°C; VCC = +2.5V 0.2V, VCCQ = +2.5V 0.2V  
AC Characteristics  
335  
262/263/265  
202  
Parameter  
Symbol  
tRCD  
Min  
18  
Max  
Min  
Max  
Min  
20  
Max  
Units  
ns  
ns  
tCK  
tCK  
ns  
tCK  
ns  
tCK  
ns  
tCK  
ns  
μs  
μs  
ns  
ns  
tCK  
Notes  
ACTIVE to READ or WRITE delay  
PRECHARGE command period  
DQS read preamble  
20  
20  
0.9  
0.4  
15  
0.25  
0
tRP  
18  
20  
tRPRE  
tRPST  
tRRD  
0.9  
0.4  
12  
1.1  
0.6  
1.1  
0.6  
0.9  
0.4  
15  
1.1  
0.6  
19  
DQS read postamble  
ACTIVE bank a to ACTIVE bank b command  
DQS write preamble  
tWPRE  
tWPRES  
tWPST  
tWR  
0.25  
0
0.25  
0
DQS write preamble setup time  
DQS write postamble  
10,11  
9
0.4  
15  
0.6  
0.4  
15  
1
0.6  
0.4  
15  
0.6  
Write recovery time  
Internal WRITE to READ command delay  
Data valid output window  
tWTR  
1
1
NA  
tQH-tDQSQ  
tQH-tDQSQ  
tQH-tDQSQ  
13  
12  
12  
REFRESH to REFRESH command interval  
Average periodic refresh interval  
Terminating voltage delay to VCC  
Exit SELF REFRESH to non-READ command  
Exit SELF REFRESH to READ command  
tREFC  
tREFI  
70.3  
7.8  
70.3  
7.8  
70.3  
7.8  
tVTD  
0
0
0
tXSNR  
tXSRD  
75  
75  
80  
200  
200  
200  
April 2004  
Rev. # 2  
8
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
Notes  
12. The refresh period is 64ms. This equates to an average refresh  
rate of 15.625µs (256Mb component) or 7.8125µs (512 Mb  
component). However, an AUTO REFRESH command must be  
asserted at least once every 140.6µs (256 Mb component) or  
70.3µs (512Mb component); burst refreshing or posting by the  
DRAM controller greater than eight refresh cycles is not allowed.  
1.  
2.  
All voltages referenced to VSS  
Tests for AC timing, IDD, and electrical AC and DC characteristics  
may be conducted at normal reference / supply voltage levels, but  
the related specifications and device operations are guaranteed for  
the full voltage range specified.  
3.  
Outputs are measured with equivalent load:  
13. The valid data window is derived by achieving other specifications  
- tHP (tCK/2), tDQSQ, and tQH (tQH = tHP - tQHS). The data valid window  
derates directly proportional with the clock duty cycle and a  
practical data valid window can be derived. The clock is allowed  
a maximum duty cycled variation of 45/55. Functionality is  
uncertain when operating beyond a 45/55 ratio. The data valid  
window derating curves are provided below for duty cycles ranging  
between 50/50 and 45/55.  
VTT  
50  
RReeffeerreennccee  
Outputt  
Point  
30ppFF  
(VOUT  
)
14. Referenced to each output group: x4 = DQS with DQ0-DQ4.  
4.  
AC timing and IDD tests may use a VIL-to-VIH swing of up to 1.5V in  
the test environment, but input timing is still referenced to VREF (or  
to the crossing point for CK/CK#), and parameter specifications  
are guaranteed for the specified AC input levels under normal use  
conditions. The minimum slew rate for the input signals used to  
test the device is 1V/ns in the range between VIL(AC) and VIH(AC).  
15. READs and WRITEs with auto precharge are not allowed to be  
issued until tRAS (MIN) can be satisfied prior to the internal precharge  
command being issued.  
16. JEDEC specifies CK and CK# input slew rate must be > 1V/ns  
(2V/ns differentially).  
17. DQ and DM input slew rates must not deviate from DQS by more  
than 10%. If the DQ/DM/DQS slew rate is less than 0.5V/ns,  
timing must be derated: 50ps must be added to tDS and tDH for  
each 100mV/ns reduction in slew rate. If slew rates exceed 4V/ns,  
functionality is uncertain.  
5.  
6.  
The AC and DC input level specifications are defined in the SSTL_  
2 standard (i.e., the receiver will effectively switch as a result of the  
signal crossing the AC input level, and will remain in that state as  
long as the signal does not ring back above [below] the DC input  
LOW [high] level).  
18.  
t
HP min is the lesser of tCL min and tCH min actually applied to the  
Command/Address input slew rate = 0.5V/ns. For -75 with slew  
rates 1V/ns and faster, tIS and tIH are reduced to 900ps. If the  
slew rate is less than 0.5V/ns, timing must be derated: tIS has an  
additional 50ps per each 100mV/ns reduction in slew rate from the  
500mV/ns. tIH has 0ps added, that is, it remains constant. If the  
slew rate exceeds 4.5V/ns, functionality is uncertain.  
device CK and CK# inputs, collectively during bank active.  
19. This maximum value is derived from the referenced test load. In  
practice, the values obtained in a typical terminated design may  
reflect up to 310ps less for tHZ (MAX) and last DVW. tHZ (MAX) will  
prevail over the tDQSCK (MAX) + tRPST (MAX) condition. tLZ (MIN) will  
prevail over tDQSCK (MIN) + PRE (MAX) condition.  
7.  
8.  
Inputs are not recognized as valid until VREF stabilizes. Exception:  
during the period before VREF stabilizes, CKE £ 0.3 x VCCQ is  
recognized as LOW.  
20. For slew rates greater than 1V/ns the (LZ) transition will start about  
310ps earlier.  
tHZ and tLZ transitions occur in the same access time windows as  
21. CKE must be active (High) during the entire time a refresh  
command is executed. That is, from the time the AUTO REFRESH  
command is registered, CKE must be active at each rising clock  
edge, until tREF later.  
valid data transitions. These parameters are not referenced to a  
specific voltage level, but specify when the device output is no  
longer driving (HZ) and begins driving (LZ).  
9.  
The maximum limit for this parameter is not a device limit. The  
device will operate with a greater value for this parameter, but  
system performance (bus turnaround) will degrade accordingly.  
22. Whenever the operating frequency is altered, not including jitter,  
the DLL is required to be reset. This is followed by 200 clock cycles  
(before READ commands).  
10. This is not a device limit. The device will operate with a negative  
value, but system performance could be degraded due to bus  
turnaround.  
11. It is recommended that DQS be valid (HIGH or LOW) on or before  
the WRITE command. The case shown (DQS going from High-Z to  
logic LOW) applies when no WRITEs were previously in progress  
on the bus. If a previous WRITE was in progress, DQS could be  
high during this time, depending on tDQSS  
.
April 2004  
Rev. # 2  
9
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
ORDERING INFORMATION FOR JD3  
Part Number  
Speed  
CAS Latency  
tRCD  
3
tRP  
3
Height*  
W3EG7263S335JD3  
W3EG7263S262JD3  
W3EG7263S263JD3  
W3EG7263S265JD3  
W3EG7263S202JD3  
166MHz/333Mb/s  
133MHz/266Mb/s  
133MHz/266Mb/s  
133MHz/266Mb/s  
100MHz/200Mb/s  
2.5  
2
30.48 (1.20")  
30.48 (1.20")  
30.48 (1.20")  
30.48 (1.20")  
30.48 (1.20")  
2
2
2
3
3
2.5  
2
3
3
2
2
PACKAGE DIMENSIONS FOR JD3  
133.48  
(5.255" MAX.)  
131.34  
(5.171")  
4.06  
(0.160 MAX)  
128.95  
(5.077")  
3.99  
(0.157 (2x))  
3.99  
(0.157)  
(MIN)  
30.48  
(1.20 MAX)  
17.78  
(0.700)  
2.31  
(0.091)  
(2x)  
3.00  
(0.118)  
(4x)  
1.27  
10.01  
(0.050 TYP.)  
(0.394)  
6.35  
49.53  
(0.250)  
(1.950)  
64.77  
1.27 0.10  
(2.550)  
(0.050 0.004)  
6.35  
1.78  
(0.070)  
(0.250)  
* All Dimensions are in millimeters and (inches).  
April 2004  
Rev. # 2  
10  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
ORDERING INFORMATION FOR AJD3  
Part Number  
Speed  
CAS Latency  
tRCD  
3
tRP  
3
Height*  
W3EG7263S335AJD3  
W3EG7263S262AJD3  
W3EG7263S263AJD3  
W3EG7263S265AJD3  
W3EG7263S202AJD3  
166MHz/333Mb/s  
133MHz/266Mb/s  
133MHz/266Mb/s  
133MHz/266Mb/s  
100MHz/200Mb/s  
2.5  
2
28.70 (1.13")  
28.70 (1.13")  
28.70 (1.13")  
28.70 (1.13")  
28.70 (1.13")  
2
2
2
3
3
2.5  
2
3
3
2
2
PACKAGE DIMENSIONS FOR AJD3  
133.48  
(5.255" MAX.)  
131.34  
(5.171")  
4.06  
(0.160 MAX)  
128.95  
(5.077")  
3.99  
(0.157 (2x))  
3.99  
(0.157)  
(MIN)  
28.70  
(1.13 MAX)  
17.78  
(0.700)  
2.31  
(0.091)  
(2x)  
3.00  
(0.118)  
(4x)  
1.27  
10.01  
(0.050 TYP.)  
(0.394)  
6.35  
49.53  
(0.250)  
(1.950)  
64.77  
1.27 0.10  
(2.550)  
(0.050 0.004)  
6.35  
1.78  
(0.070)  
(0.250)  
* All Dimensions are in millimeters and (inches).  
April 2004  
Rev. # 2  
11  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
ORDERING INFORMATION FOR D3  
Part Number  
Speed  
CAS Latency  
tRCD  
3
tRP  
3
Height*  
W3EG7263S335D3  
W3EG7263S262D3  
W3EG7263S263D3  
W3EG7263S265D3  
W3EG7263S202D3  
166MHz/333Mb/s  
133MHz/266Mb/s  
133MHz/266Mb/s  
133MHz/266Mb/s  
100MHz/200Mb/s  
2.5  
2
28.58 (1.125")  
28.58 (1.125")  
28.58 (1.125")  
28.58 (1.125")  
28.58 (1.125")  
2
2
2
3
3
2.5  
2
3
3
2
2
PACKAGE DIMENSIONS FOR D3  
NOT RECOMMENDED FOR NEW DESIGNS  
133.48  
(5.255" MAX.)  
131.34  
(5.171")  
4.06  
(0.160 MAX)  
128.95  
(5.077")  
3.99  
(0.157 (2x))  
3.99  
28.58  
(0.157)  
(MIN)  
(1.125 MAX)  
17.78  
(0.700)  
2.31  
(0.091)  
(2x)  
3.00  
(0.118)  
(4x)  
1.27  
10.01  
(0.050 TYP.)  
(0.394)  
6.35  
49.53  
(0.250)  
(1.950)  
64.77  
1.27 0.10  
(0.050 0.004)  
(2.550)  
6.35  
1.78  
(0.250)  
(0.070)  
* All Dimensions are in millimeters and (inches).  
April 2004  
Rev. # 2  
12  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
W3EG7263S-D3  
-JD3  
White Electronic Designs  
-AJD3  
PRELIMINARY  
Document Title  
512MB- 64Mx72 DDR SDRAM REGISTERED w/PLL  
Revision History  
Rev #  
History  
Release Date Status  
Rev 0  
Rev 1  
Created Datasheet  
3-5-02  
Advanced  
Advanced  
Added 333MHz Speed  
4-16-03  
Rev 2  
2.1 Added JD3 and AJD3 Package Height Options  
2.2 Added "Not Recommended for New Designs" to D3  
2.3 Updated Document Title Page  
4-04  
Preliminary  
2.4 Removed "ED" from Part Marking  
April 2004  
Rev. # 2  
13  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  

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