XCR3128A [XILINX]

CPLD with Enhanced Clocking; CPLD具有增强的时钟
XCR3128A
型号: XCR3128A
厂家: XILINX, INC    XILINX, INC
描述:

CPLD with Enhanced Clocking
CPLD具有增强的时钟

时钟
文件: 总17页 (文件大小:252K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
APPLICATION NOTE  
0
XCR3128A: 128 Macrocell  
CPLD with Enhanced Clocking  
0
14*  
DS035 (v1.2) August 10, 2000  
Product Specification  
Features  
Description  
Industry's first TotalCMOS™ PLD - both CMOS design  
and process technologies  
Fast Zero Power (FZP™) design technique provides  
ultra-low power and very high speed  
3V, In-System Programmable (ISP) using a JTAG  
interface  
The XCR3128A CPLD (Complex Programmable Logic  
Device) is a member of the CoolRunner® family of CPLDs  
from Xilinx. These devices combine high speed and zero  
power in a 128 macrocell CPLD. With the FZP design tech-  
nique, the XCR3128A offers true pin-to-pin speeds of 7.5  
ns, while simultaneously delivering power that is less than  
100 µA at standby without the need for turbo bits' or other  
power-down schemes. By replacing conventional sense  
amplifier methods for implementing product terms (a tech-  
nique that has been used in PLDs since the bipolar era)  
with a cascaded chain of pure CMOS gates, the dynamic  
power is also substantially lower than any competing  
CPLD. These devices are the first TotalCMOS PLDs, as  
they use both a CMOS process technology and the pat-  
ented full CMOS FZP design technique.  
-
-
On-chip supervoltage generation  
ISP commands include: Enable, Erase, Program,  
Verify  
-
-
-
Supported by multiple ISP programming platforms  
4-pin JTAG interface (TCK, TMS, TDI, TDO)  
JTAG commands include: Bypass, Idcode  
High-speed pin-to-pin delays of 7.5 ns  
Ultra-low static power of less than 100 µA  
5V tolerant I/Os to support mixed voltage systems  
100% routable with 100% utilization while all pins and  
all macrocells are fixed  
Deterministic timing model that is extremely simple to  
use  
Up to 20 clocks available  
Support for complex asynchronous clocking  
Innovative XPLA™ architecture combines high-speed  
with extreme flexibility  
1000 erase/program cycles guaranteed  
20 years data retention guaranteed  
Logic expandable to 37 product terms  
Advanced 0.35µ E2CMOS process  
Security bit prevents unauthorized access  
Design entry and verification using industry standard  
and Xilinx CAE tools  
The Xilinx FZP CPLDs utilize the patented XPLA  
(eXtended Programmable Logic Array) architecture. The  
XPLA architecture combines the best features of both PLA  
and PAL type structures to deliver high-speed and flexible  
logic allocation that results in superior ability to make  
design changes with fixed pinouts. The XPLA structure in  
each logic block provides a fast 7.5 ns PAL path with five  
dedicated product terms per output. This PAL path is joined  
by an additional PLA structure that deploys a pool of 32  
product terms to a fully programmable OR array that can  
allocate the PLA product terms to any output in the logic  
block. This combination allows logic to be allocated effi-  
ciently throughout the logic block and supports as many as  
37 product terms on an output. The speed with which logic  
is allocated from the PLA array to an output is only 1.5 ns,  
regardless of the number of PLA product terms used, which  
results in worst case tPD's of only 9 ns from any pin to any  
other pin. In addition, logic that is common to multiple out-  
puts can be placed on a single PLA product term and  
shared across multiple outputs via the OR array, effectively  
increasing design density.  
Reprogrammable using industry standard device  
programmers  
Innovative Control Term structure provides either sum  
terms or product terms in each logic block for:  
-
-
-
Programmable 3-state buffer  
Asynchronous macrocell register preset/reset  
Up to two, asynchronous clocks  
The XCR3128A CPLDs are supported by industry standard  
CAE tools (Cadence/OrCAD, Exemplar Logic, Mentor, Syn-  
opsys, Synario, Viewlogic, and Synplicity), using text  
(ABEL, VHDL, Verilog) and/or schematic entry. Design ver-  
ification uses industry standard simulators for functional  
and timing simulation. Development is supported on per-  
sonal computer, Sparc, and HP platforms. Device fitting  
uses a Xilinx developed tool, XPLA Professional (available  
on the Xilinx web site).  
Programmable global 3-state pin facilitates "bed of  
nails" testing without using logic resources  
Available in TQFP and VQFP packages  
Available in both commercial and industrial grades  
Industrial grade operates from 2.7V to 3.6V  
DS035 (v1.2) August 10, 2000  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
The XCR3128A CPLD is electrically reprogrammable using  
industry standard device programmers from vendors such  
as Data I/O, BP Microsystems, SMS, and others. The  
XCR3128A also includes an industry-standard, IEEE  
1149.1, JTAG interface through which In-System Program-  
ming (ISP) and reprogramming of the device are sup-  
ported.  
Logic Block Architecture  
Figure 2 illustrates the logic block architecture. Each logic  
block contains control terms, a PAL array, a PLA array, and  
16 macrocells. The six control terms can individually be  
configured as either SUM or PRODUCT terms, and are  
used to control the preset/reset and output enables of the  
16 macrocellsflip-flops. In addition, two of the control  
terms can be used as clock signals (see Macrocell Archi-  
tecture section for details). The PAL array consists of a pro-  
grammable AND array with a fixed OR array, while the PLA  
array consists of a programmable AND array with a pro-  
grammable OR array. The PAL array provides a high speed  
path through the array, while the PLA array provides  
increased product term density.  
XPLA Architecture  
Figure 1 shows a high-level block diagram of a 128 macro-  
cell device implementing the XPLA architecture. The XPLA  
architecture consists of logic blocks that are interconnected  
by a zero-power Interconnect Array (ZIA). The ZIA is a vir-  
tual crosspoint switch. Each logic block is essentially a  
36V16 device with 36 inputs from the ZIA and 16 macro-  
cells. Each logic block also provides 32 ZIA feedback paths  
from the macrocells and I/O pins.  
Each macrocell has five dedicated product terms from the  
PAL array. The pin-to-pin tPD of the XCR3128A device  
through the PAL array is 7.5 ns. If a macrocell needs more  
than five product terms, it simply gets the additional product  
terms from the PLA array. The PLA array consists of 32  
product terms, which are available for use by all 16 macro-  
cells. The additional propagation delay incurred by a mac-  
rocell using one or all 32 PLA product terms is just 1.5 ns.  
So the total pin-to-pin tPD for the XCR3128A using six to 37  
product terms is 9 ns (7.5 ns for the PAL + 1.5 ns for the  
PLA).  
From this point of view, this architecture looks like many  
other CPLD architectures. What makes the CoolRunner  
family unique is what is inside each logic block and the  
design technique used to implement these logic blocks.  
The contents of the logic block will be described next.  
MC0  
MC0  
MC1  
MC1  
36  
36  
LOGIC  
BLOCK  
LOGIC  
BLOCK  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
MC15  
MC15  
16  
16  
16  
16  
MC0  
MC1  
MC0  
MC1  
36  
36  
LOGIC  
BLOCK  
LOGIC  
BLOCK  
MC15  
MC15  
16  
16  
16  
16  
ZIA  
MC0  
MC1  
MC0  
MC1  
36  
36  
LOGIC  
BLOCK  
LOGIC  
BLOCK  
MC15  
MC15  
16  
16  
16  
16  
MC0  
MC1  
MC0  
MC1  
36  
36  
LOGIC  
BLOCK  
LOGIC  
BLOCK  
I/O  
MC15  
MC15  
16  
16  
16  
16  
SP00464  
Figure 1: Xilinx XPLA CPLD Architecture  
DS035 (v1.2) August 10, 2000  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
36 ZIA INPUTS  
6
CONTROL  
5
PAL  
ARRAY  
PLA  
ARRAY  
(32)  
SP00435A  
Figure 2: Xilinx XPLA Logic Block Architecture  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
nous Preset/Reset of the macrocells flip-flop. Note that the  
Power-on Reset leaves all macrocells in the "zero" state  
Macrocell Architecture  
Figure 3 shows the architecture of the macrocell used in  
the CoolRunner XCR3128A. The macrocell can be config-  
ured as either a D- or T-type flip-flop or a combinatorial logic  
function. A D-type flip-flop is generally more useful for  
implementing state machines and data buffering while a  
T-type flip-flop is generally more useful in implementing  
counters. Each of these flip-flops can be clocked from any  
one of six sources. Four of the clock sources (CLK0, CLK1,  
CLK2, CLK3) are connected to low-skew, device-wide clock  
networks designed to preserve the integrity of the clock sig-  
nal by reducing skew between rising and falling edges.  
Clock 0 (CLK0) is designated as a "synchronous" clock and  
must be driven by an external source. Clock 1 (CLK1),  
Clock 2 (CLK2), and Clock 3 (CLK3) can be used as "syn-  
chronous" clocks that are driven by an external source, or  
as "asynchronous" clocks that are driven by a macrocell  
equation. CLK0, CLK1, CLK2, and CLK3 can clock the  
macrocell flip-flops on either the rising edge or the falling  
edge of the clock signal. The other clock sources are two of  
the six control terms (CT2 and CT3) provided in each logic  
block. These clocks can be individually configured as either  
a PRODUCT term or SUM term equation created from the  
36 signals available inside the logic block. The timing for  
asynchronous and control term clocks is different in that the  
tCO time is extended by the amount of time that it takes for  
the signal to propagate through the array and reach the  
clock network, and the tSU time is reduced.  
when power is properly applied, and that the Preset/Reset  
feature for each macrocell can also be disabled. Control  
terms CT2 and CT3 can be used as a clock signal to the  
flip-flops of the macrocells, and as the Output Enable of the  
macrocells output buffer. Control terms CT4 and CT5 can  
be used to control the Output Enable of the macrocells out-  
put buffer. Having four dedicated Output Enable control  
terms ensures that the CoolRunner devices are PCI com-  
pliant. The output buffers can also be always enabled or  
always disabled. All CoolRunner devices also provide a  
Global 3-state (GTS) pin, which, when enabled and pulled  
Low, will 3-state all the outputs of the device. This pin is  
provided to support "In-Circuit Testing" or "Bed-of-Nails"  
testing.  
There are two feedback paths to the ZIA: one from the mac-  
rocell, and one from the I/O pin. The ZIA feedback path  
before the output buffer is the macrocell feedback path,  
while the ZIA feedback path after the output buffer is the I/O  
pin feedback path. When the macrocell is used as an out-  
put, the output buffer is enabled, and the macrocell feed-  
back path can be used to feedback the logic implemented  
in the macrocell. When the I/O pin is used as an input, the  
output buffer will be 3-stated and the input signal will be fed  
into the ZIA via the I/O feedback path, and the logic imple-  
mented in the buried macrocell can be fed back to the ZIA  
via the macrocell feedback path. It should be noted that  
unused inputs or I/Os should be properly terminated (see  
the section on Terminations in this data sheet and the appli-  
cation note Terminating Unused I/O Pins in Xilinx XPLA1  
and XPLA2 CoolRunner CPLDs.  
The six control terms of each logic block are used to control  
the asynchronous Preset/Reset of the flip-flops and the  
enable/disable of the output buffers in each macrocell. Con-  
trol terms CT0 and CT1 are used to control the asynchro-  
TO ZIA  
PAL  
PLA  
D/T  
Q
INIT  
(P or R)  
CLK0  
CLK0  
CLK1  
CLK1  
CLK2  
CLK2  
CLK3  
CLK3  
GTS  
GND  
CT0  
CT1  
GND  
SP00558  
Figure 3: XCR3128A Macrocell Architecture  
DS035 (v1.2) August 10, 2000  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
because the timing models of competing architectures are  
very complex and include such things as timing dependen-  
cies on the number of parallel expanders borrowed, shar-  
able expanders, varying number of X and Y routing  
channels used, etc. In the XPLA architecture, the user  
knows up front whether the design will meet system timing  
requirements. This is due to the simplicity of the timing  
model.  
Simple Timing Model  
Figure 4 shows the CoolRunner Timing Model. The Cool-  
Runner timing model looks very much like a 22V10 timing  
model in that there are three main timing parameters,  
including tPD, tSU, and tCO. In other competing architec-  
tures, the user may be able to fit the design into the CPLD,  
but is not sure whether system timing requirements can be  
met until after the design has been fit into the device. This is  
t
= COMBINATORIAL PAL ONLY  
= COMBINATORIAL PAL + PLA  
PD_PAL  
t
PD_PLA  
INPUT PIN  
OUTPUT PIN  
REGISTERED  
= PAL ONLY  
t
t
REGISTERED  
SU_PAL  
= PAL + PLA  
t
SU_PLA  
CO  
INPUT PIN  
D
Q
OUTPUT PIN  
GLOBAL CLOCK PIN  
SP00553  
Figure 4: CoolRunner Timing Model  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
gate implementation allows Xilinx to offer CPLDs which are  
TotalCMOS Design Technique for Fast Zero  
Power  
both high-performance and low power, breaking the para-  
digm that to have low power, you must have low perfor-  
mance. Refer to Figure 5 and Table 1 showing the ICC vs.  
Frequency of the XCR3128A TotalCMOS CPLD (data  
taken with eight up/down, loadable 16-bit counters at 3.3V,  
25°C).  
Xilinx is the first to offer a TotalCMOS CPLD, both in pro-  
cess technology and design technique. Xilinx employs a  
cascade of CMOS gates to implement its Sum of Products  
instead of the traditional sense amp approach. This CMOS  
70  
60  
50  
40  
I
CC  
(mA)  
30  
20  
10  
0
1
20  
40  
60  
80  
100  
120  
FREQUENCY (MHz)  
SP00617  
Figure 5: ICC vs. Frequency @ VCC = 3.3V, 25°C  
Table 1: ICC vs. Frequency (VCC = 3.3V, 25°C)  
Frequency (MHz)  
0
1
20  
40  
60  
38.1  
80  
50.5  
100  
62.8  
120  
Typical ICC (mA)  
0.03  
0.7  
12.7  
25.5  
74.7  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
device. The devices come from the factory with these I/O  
pins set to perform JTAG functions, but through the soft-  
ware, the final function of these pins can be controlled. If  
the end application will require the device to be repro-  
grammed at some future time with ISP, then the pins can be  
left as dedicated JTAG functions, which means they are not  
available for use as general purpose I/O pins. However,  
unlike competing CPLDs, the Xilinx XCR3128A allow the  
macrocells associated with these pins to be used as buried  
logic when the JTAG/ISP function is enabled. This is the  
default state for the software, and no action is required to  
leave these pins enabled for the JTAG/ISP functions. If,  
however, JTAG/ISP is not required in the end application,  
the software can specify that this function be turned off and  
that these pins be used as general purpose I/O. Because  
the devices initially have the JTAG/ISP functions enabled,  
the JEDEC file can be downloaded into the device once,  
after which the JTAG/ISP pins will become general purpose  
I/O. This feature is good for manufacturing because the  
devices can be programmed during test and assembly of  
the end product and yet still use all of the I/O pins after the  
programming is done. It eliminates the need for a costly,  
separate programming step in the manufacturing process.  
Of course, if the JTAG/ISP function is never required, this  
feature can be turned off in the software and the device can  
be programmed with an industry-standard programmer,  
leaving the pins available for I/O functions. Table 4 defines  
the dedicated pins used by the four mandatory JTAG sig-  
nals for each of the XCR3128A package types.  
JTAG Testing Capability  
JTAG is the commonly-used acronym for the  
Boundary-scan Test (BST) feature defined for integrated  
circuits by IEEE Standard 1149.1. This standard defines  
input/output pins, logic control functions, and commands  
which facilitate both board and device level testing without  
the use of specialized test equipment. The Xilinx  
XCR3128A devices use the JTAG Interface for In-System  
Programming/Reprogramming. Although only a subset of  
the full JTAG command set is implemented (see Table 2),  
the devices are fully capable of sitting in a JTAG scan chain.  
The Xilinx XCR3128As JTAG interface includes a TAP Port  
defined by the IEEE 1149.1 JTAG Specification. As imple-  
mented in the Xilinx XCR3128A, the TAP Port includes four  
of the five pins (refer to Table 3) described in the JTAG  
specification: TCK, TMS, TDI, and TDO. The fifth signal  
defined by the JTAG specification is TRST* (Test Reset).  
TRST* is considered an optional signal, since it is not actu-  
ally required to perform BST or ISP. The Xilinx XCR3128A  
saves an I/O pin for general purpose use by not implement-  
ing the optional TRST* signal in the JTAG interface.  
Instead, the Xilinx XCR3128A supports the test reset func-  
tionality through the use of its power-up reset circuit, which  
is included in all Xilinx CPLDs. The pins associated with the  
TAP Port should connect to an external pull-up resistor to  
keep the JTAG signals from floating when they are not  
being used. In the Xilinx XCR3128A, the four mandatory  
JTAG pins each require a unique, dedicated pin on the  
Table 2: XCR3128A Low-level JTAG Boundary-scan Commands  
Instruction  
(Instruction Code)  
Register Used  
Description  
Bypass  
(1111)  
Bypass Register  
Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST  
data to pass synchronously through the selected device to adjacent devices during  
normal device operation. The Bypass instruction can be entered by holding TDI at a  
constant high value and completing an Instruction-scan cycle.  
Idcode  
(0001)  
Boundary-scan Register  
Selects the IDCODE register and places it between TDI and TDO, allowing the  
IDCODE to be serially shifted out of TDO. The IDCODE instruction permits blind  
interrogation of the components assembled onto a printed circuit board. Thus, in  
circumstances where the component population may vary, it is possible to determine  
what components exist in a product.  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
Table 3: JTAG Pin Description  
Pin  
Name  
Description  
TCK  
Test Clock Output  
Clock pin to shift the serial data and instructions in and out of the TDI and TDO pins,  
respectively.  
TMS  
TDI  
Test Mode Select  
Test Data Input  
Test Data Output  
Serial input pin selects the JTAG instruction mode. TMS should be driven High  
during user mode operation.  
Serial input pin for instructions and test data. Data is shifted in on the rising edge of  
TCK.  
TDO  
Serial output pin for instructions and test data. Data is shifted out on the falling edge  
of TCK. The signal is 3-stated if data is not being shifted out of the device.  
Table 4: XCR3128A JTAG Pinout by Package Type  
Device  
(Pin Number / Macrocell #)  
XCR3128A  
100-pin VQFP  
128-pin TQFP  
TCK  
TMS  
TDI  
TDO  
62/F15  
82/F15  
15/C15  
21/C15  
4/B15  
8/B15  
73/G15  
95/G15  
-
Improved quality and reliability  
3.3V, In-System Programming (ISP)  
Field Support  
-
-
ISP is the ability to reconfigure the logic and functionality of  
a device, printed circuit board, or complete electronic sys-  
tem before, during, and after its manufacture and shipment  
to the end customer. ISP provides substantial benefits in  
each of the following areas:  
Easy remote upgrades and repair  
Support for field configuration, reconfiguration, and  
customization  
The Xilinx XCR3128A allows for 3.3V in-system program-  
ming/reprogramming of its EEPROM cells via its JTAG  
interface. An on-chip charge pump eliminates the need for  
externally provided supervoltages, so that the XCR3128A  
may be easily programmed on the circuit board using only  
the 3V supply required by the device for normal operation.  
A set of low-level ISP basic commands implemented in the  
XCR3128A enable this feature. The ISP commands imple-  
mented in the Xilinx XCR3128A are specified in Table 5.  
Please note that an ENABLE command must precede all  
ISP commands unless an ENABLE command has already  
been given for a preceding ISP command.  
Design  
-
-
-
-
Faster time-to-market  
Debug partitioning and simplified prototyping  
Printed circuit board reconfiguration during debug  
Better device and board level testing  
Manufacturing  
-
-
-
Multi-functional hardware  
Reconfigurability for test  
Eliminates handling of "fine lead-pitch" components  
for programming  
-
Reduced inventory and manufacturing costs  
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Table 5: Low Level ISP Commands  
Instruction  
Instruction Code  
(Register Used)  
Description  
Enable  
(ISP Shift Register)  
1001  
1010  
1011  
1100  
Enables the Erase, Program, and Verify commands.  
Erases the entire EEPROM array.  
Erase  
(ISP Shift Register)  
Program  
(ISP Shift Register)  
Programs the data in the ISP Shift Register into the addressed  
EEPROM row.  
Verify  
(ISP Shift Register)  
Transfers the data from the addressed row to the ISP Shift  
Register. .  
There are no on-chip pull-down structures associated with  
the dedicated input pins. Xilinx recommends that any  
unused dedicated inputs be terminated with external 10kΩ  
pull-up resistors. These pins can be directly connected to  
VCC or GND, but using the external pull-up resistors main-  
tains maximum design flexibility should one of the unused  
dedicated inputs be needed due to future design changes.  
Terminations  
The CoolRunner XCR3128A CPLDs are TotalCMOS  
devices. As with other CMOS devices, it is important to  
consider how to properly terminate unused inputs and I/O  
pins when fabricating a PC board. Allowing unused inputs  
and I/O pins to float can cause the voltage to be in the linear  
region of the CMOS input structures, which can increase  
the power consumption of the device. The XCR3128A  
CPLDs have programmable on-chip pull-down resistors on  
each I/O pin. These pull-downs are automatically activated  
by the fitter software for all unused I/O pins. Note that an I/O  
macrocell used as buried logic that does not have the I/O  
pin used for input is considered to be unused, and the  
pull-down resistors will be turned on. We recommend that  
any unused I/O pins on the XCR3128A device be left  
unconnected.  
When using the JTAG/ISP functions, it is also recom-  
mended that 10kpull-up resistors be used on each of the  
pins associated with the four mandatory JTAG signals. Let-  
ting these signals float can cause the voltage on TMS to  
come close to ground, which could cause the device to  
enter JTAG/ISP mode at unspecified times. See the appli-  
cation notes JTAG and ISP Overview for Xilinx XPLA1 and  
XPLA2 CPLDs and Terminating Unused I/O Pins in Xilinx  
XPLA1 and XPLA2 CoolRunner CPLDs for more informa-  
tion.  
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Embedded Processor  
Automated test equipment  
Third party programmers  
High-end ISP tools  
JTAG and ISP Interfacing  
A number of industry-established methods exist for  
JTAG/ISP interfacing with CPLDs and other integrated cir-  
cuits. The Xilinx XCR3128A supports the following meth-  
ods:  
For more details on JTAG and ISP for the XCR3128A, refer  
to the related application note: JTAG and ISP Overview for  
Xilinx XPLA1 and XPLA2 CPLDs  
PC parallel port  
Workstation or PC serial port  
Table 6: Programming Specifications  
Symbol  
Parameter  
Min.  
Max.  
Unit  
DC Parameters  
VCCP  
ICCP  
VCC supply program/verify  
3.0  
3.6  
V
ICC limit program/verify  
200  
mA  
VIH  
Input voltage (High)  
Input voltage (Low)  
Output voltage (Low)  
Output voltage (High)  
Output current (Low)  
Output current (High)  
2.0  
V
V
VIL  
0.8  
0.5  
VSOL  
V
VSOH  
2.4  
8
V
TDO_IOL  
TDO_IOH  
AC Parameters  
fMAX  
mA  
mA  
-8  
CLK maximum frequency  
Pulse width erase  
Pulse width program  
Pulse width verify  
10  
100  
10  
MHz  
ms  
ms  
µs  
PWE  
PWP  
PWV  
10  
INIT  
Initialization time  
100  
10  
µs  
ns  
TMS_SU  
TDI_SU  
TMS_H  
TDI_H  
TDO_CO  
TMS setup time before TCK goes High  
TDI setup time before TCK goes High  
TMS hold time after TCK goes High  
TDI hold time after TCK goes High  
TDO valid after TCK goes Low  
10  
ns  
25  
ns  
25  
ns  
40  
ns  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
Absolute Maximum Ratings1  
Symbol  
Parameter  
Min.  
Max.  
Unit  
VCC  
Supply voltage 2  
Input voltage  
Output voltage  
Input current  
-0.5  
4.6  
V
VI  
-1.2  
-0.5  
-30  
-40  
-65  
5.75  
5.5  
V
V
VOUT  
IIN  
30  
mA  
°C  
°C  
TJ  
Maximum junction temperature  
Storage temperature  
150  
150  
Tstr  
Notes:  
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only.  
Functional operation at these or any other condition above those indicated in the operational and programming specification  
is not implied.  
2. The chip supply voltage must rise monotonically.  
Operating Range  
Product Grade  
Commercial  
Industrial  
Temperature  
0 to +70°C  
-40 to +85°C  
Voltage  
3.0 to 3.6 V  
2.7 to 3.6 V  
DC Electrical Characteristics For Commercial Grade Devices  
Commercial: 0°C TAMB +70°C; 3.0V VCC 3.6V  
Symbol  
VIL  
Parameter  
Input voltage Low  
Test Conditions  
Min.  
Max.  
Unit  
V
VCC = 3.0V  
VCC = 3.6V  
0.8  
VIH  
VI  
Input voltage High  
2.0  
V
Input clamp voltage  
Output voltage Low  
Output voltage High  
Input leakage current  
3-stated output leakage current  
Standby current  
VCC = 3.0V, IIN = -18 mA  
VCC = 3.0V, IOL = 12 mA  
VCC = 3.0V, IOH = -12 mA  
VIN = 0 to 5.5V  
-1.2  
0.5  
V
VOL  
VOH  
II  
V
2.4  
-10  
-10  
V
10  
10  
µA  
µA  
µA  
mA  
mA  
mA  
IOZ  
ICCQ  
ICCD  
VIN = 0 to 5.5V  
1
VCC = 3.6V, TAMB = 0°C  
VCC = 3.6V, TAMB = 0°C @ 1 MHz  
VC = 3.6V, TAMB = 0°C @ 50 MHz  
100  
2
1, 2  
Dynamic current  
50  
IOS  
CIN  
Short circuit output current 3  
One pin at a time for no longer than one  
second  
-50  
5
-200  
Input pin capacitance 3  
Clock input capacitance 3  
I/O pin capacitance3  
TAMB = 25°C, f = 1 MHz  
TAMB = 25°C, f = 1 MHz  
TAMB = 25°C, f = 1 MHz  
8
pF  
pF  
pF  
CCLK  
CI/O  
12  
10  
Notes:  
1. See Table 2 on page 7 typical values.  
2. This parameter measured with a 16-bit, loadable up/down counter loaded into every logic block, with all outputs disabled  
and unloaded. Inputs are tied to VCC or ground. This parameter guaranteed by design and characterization, not testing.  
3. Typical values, not tested.  
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AC Electrical Characteristics1 For Commercial Grade Devices  
Commercial: 0°C TAMB +70°C; 3.0V VCC 3.6V  
7
10  
12  
Unit  
Symbol  
tPD_PAL  
Parameter  
Min.  
Max.  
Min.  
Max.  
Min.  
Max.  
Propagation delay time, input (or  
feedback node) to output through PAL  
2
7.5  
2
10  
2
12  
ns  
ns  
tPD_PLA  
Propagation delay time, input (or  
feedback node) to output through PAL +  
PLA  
3
9
3
11.5  
7
3
13.5  
8
tCO  
Clock to out (global synchronous clock  
from pin)  
2
3.5  
5
5.5  
2
4
2
6
ns  
ns  
ns  
tSU_PAL  
tSU_PLA  
Setup time (from input or feedback node)  
through PAL  
Setup time (from input or feedback node)  
through PAL + PLA  
5.5  
7.5  
tH  
Hold time 2  
0
0
0
ns  
ns  
tCH  
tCL  
Clock High time 2  
Clock Low time 2  
Input rise time 2  
Input fall time2  
2
2
2.5  
2.5  
3
3
ns  
tR  
100  
100  
100  
100  
100  
100  
ns  
tF  
ns  
fMAX1  
fMAX2  
Maximum FF toggle rate2 1/(tCH + tCL  
Maximum internal frequency 2  
)
250  
143  
200  
118  
167  
91  
MHz  
MHz  
1/(tSUPAL + tCF  
)
fMAX3  
Maximum external frequency 2  
111  
91  
71  
MHz  
1/(tSUPAL + tCO  
)
tBUF  
Output buffer delay time 2  
2
2
2
8
ns  
ns  
tPDF_PAL  
Input (or feedback node) to internal  
feedback node delay time through PAL2  
2
3
5.5  
2
3
7.5  
2
3
tPDF_PLA  
Input (or feedback node) to internal  
feedback node delay time through  
PAL+PLA 2  
7
9
9.5  
5
ns  
ns  
tCF  
Clock to internal feedback node delay  
time 2  
3.5  
4.5  
tINIT  
tER  
Delay from valid VCC to valid reset 2  
Input to output disable 2, 3  
Input to output valid 2  
Input to register preset 2  
Input to register reset 2  
20  
8
20  
9.5  
9.5  
9.5  
9.5  
20  
10  
10  
10  
10  
µs  
ns  
ns  
ns  
ns  
tEA  
8
tRP  
9
tRR  
9
Notes:  
1. Specifications measured with one output switching. See Figure 6 and Table 7 for derating.  
2. This parameter guaranteed by design and characterization, not by test.  
3. Output CL = 5 pF.  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
DC Electrical Characteristics For Industrial Grade Devices  
Industrial: -40°C TAMB +85°C; 2.7V VCC 3.6V  
Symbol  
VIL  
Parameter  
Input voltage Low  
Test Conditions  
Min.  
Max.  
Unit  
V
VCC = 2.7V  
VCC = 3.6V  
0.8  
VIH  
VI  
Input voltage High  
Input clamp voltage  
Output voltage Low  
2.0  
V
VCC = 2.7V, IIN = -18 mA  
VCC = 2.7V, IOL = 8 mA  
VCC= 3.0V, IOL = 12 mA  
VCC = 2.7V, IOH = -8 mA  
VCC = 3.0V, IOH = -12 mA  
VIN = 0 to 5.5V  
-1.2  
0.5  
0.5  
V
VOL  
V
V
VOH  
Output voltage High  
Input leakage current  
2.4  
2.4  
-10  
-10  
V
V
II  
10  
10  
100  
2
µA  
µA  
µA  
mA  
mA  
mA  
pF  
pF  
pF  
IOZ  
ICCQ  
ICCD  
3-stated output leakage current VIN = 0 to 5.5V  
1
Standby current  
Dynamic current  
VCC = 3.6V, TAMB = -40°C  
1 2  
VCC = 3.6V, TAMB = -40°C @ 1 MHz  
VCC = 3.6V, TAMB = -40°C @ 50 MHz  
1 pin at a time for no longer than 1 second  
TAMB = 25°C, f = 1 MHz  
50  
-230  
8
IOS  
Short circuit output current 3  
Input pin capacitance 3  
Clock input capacitance 3  
I/O pin capacitance 3  
-50  
5
CIN  
CCLK  
CI/O  
TAMB = 25°C, f = 1 MHz  
12  
10  
TAMB = 25°C, f = 1 MHz  
Notes:  
1. See Table 1 on page 6 for typical values.  
2. This parameter measured with a 16-bit, loadable up/down counter loaded into every logic block, with all outputs disabled  
and unloaded. Inputs are tied to VCC or ground. This parameter guaranteed by design and characterization, not testing.  
3. Typical values, not tested.  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
AC Electrical Characteristics1 For Industrial Grade Devices  
Industrial: -40°C TAMB +85°C; 2.7V VCC 3.6V  
10  
15  
Symbol  
Parameter  
Unit  
Min.  
Max.  
Min.  
Max.  
tPD_PAL  
Propagation delay time, input (or feedback node) to out-  
put through PAL  
2
10  
2
15  
ns  
tPD_PLA  
Propagation delay time, input (or feedback node) to out-  
put through PAL + PLA  
3
11.5  
7
3
16.5  
8
ns  
tCO  
Clock to out (global synchronous clock from pin)  
2
4
2
6
ns  
ns  
ns  
tSU_PAL  
tSU_PLA  
Setup time (from input or feedback node) through PAL  
Setup time (from input or feedback node) through  
PAL + PLA  
5.5  
7.5  
tH  
Hold time  
0
0
ns  
ns  
tCH  
Clock High time  
Clock Low time  
Input rise time  
Input fall time  
3
3
4
4
tCL  
ns  
tR  
100  
100  
100  
100  
ns  
tF  
ns  
fMAX1  
fMAX2  
fMAX3  
tBUF  
tPDF_PAL  
Maximum FF toggle rate 2 1/(tCH + tCL  
Maximum internal frequency 2 1/(tSUPAL + tCF  
Maximum external frequency 2 1/(tSUPAL + tCO  
Output buffer delay time 2  
)
167  
111  
91  
125  
87  
MHz  
MHz  
MHz  
ns  
)
)
77  
2
8
2
9
Input (or feedback node) to internal feedback node delay  
time through PAL 2  
2
3
2
3
ns  
tPDF_PLA  
Input (or feedback node) to internal feedback node delay  
time through PAL+PLA 2  
9.5  
10.5  
ns  
tCF  
tINIT  
tER  
tEA  
tRP  
tRR  
Clock to internal feedback node delay time 2  
Delay from valid VCC to valid reset 2  
Input to output disable 2, 3  
5
5.5  
20  
12  
12  
12  
12  
ns  
µs  
ns  
ns  
ns  
ns  
20  
10  
10  
10  
10  
Input to output valid 2  
Input to register preset 2  
Input to register reset 2  
Notes:  
1. Specifications measured with one output switching. See Figure 6 and Table 7 for derating.  
2. This parameter guaranteed by design and characterization, not by test.  
3. Output CL = 5 pF.  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
Switching Characteristics  
The test load circuit and load values for the AC Electrical Characteristics are illustrated below.  
V
DD  
Component  
Values  
390Ω  
390Ω  
35 pF  
S1  
R1  
R2  
C1  
R1  
R2  
V
IN  
V
OUT  
Measurement  
S1  
S2  
C1  
t
Open  
Closed  
Open  
PZH  
t
Closed  
Closed  
PZL  
t
P
Closed  
S2  
NOTE: For t  
and t  
C = 5 pF, and 3-state levels are  
PHZ  
PLZ  
0.5V from steady state active level.  
measured  
SP00699  
V
= 3.3V, 25°C  
DD  
6.1  
6.0  
+3.0V  
90%  
5.9  
5.8  
5.7  
5.6  
5.5  
10%  
0V  
t
R
t
F
t
PD_PAL  
(ns)  
1.5ns  
1.5ns  
SP00368  
MEASUREMENTS:  
All circuit delays are measured at the +1.5V level of  
inputs and outputs, unless otherwise specified.  
5.4  
5.3  
Input Pulses  
Figure 7: Voltage Waveform  
5.2  
5.1  
Table 7: tPD_PAL vs. Number of Outputs Switching  
1
2
4
8
12  
16  
(VCC = 3.3 V, T = 25°C)  
NUMBER OF OUTPUTS SWITCHING  
SP00698  
Number of  
Outputs  
Figure 6: tPD_PAL vs. Outputs Switching  
1
2
4
8
12  
16  
Typical (ns) 5.3  
5.3  
5.4  
5.6  
5.9  
6.1  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
Pin Function and Laynout  
XCR3128A: 100-pin VQFP, and 128-pin TQFP Pin Function Table  
Function  
100-pin  
VQFP  
I/O-A2  
I/O-A0  
Function  
Function  
Function  
Pin  
#
Pin  
#
Pin  
#
Pin  
#
128-pin  
TQFP  
I/O-A3  
I/O-A2  
I/O-A0  
NC  
100-pin  
VQFP  
128-pin  
TQFP  
NC  
100-pin  
VQFP  
128-pin  
TQFP  
100-pin  
VQFP  
128-pin  
TQFP  
NC  
1
2
3
4
5
6
7
8
33  
34  
35  
36  
I/O-D5  
65  
66  
67  
68  
69  
70  
71  
72  
I/O-G4  
I/O-E15  
97  
98  
I/O-A8  
V
NC  
V
V
CC  
I/O-A7  
NC  
CC  
CC  
V
I/O-D4  
I/O-D2  
NC  
I/O-G5  
I/O-G7  
I/O-F0  
NC  
99  
I/O-A5  
NC  
CC  
I/O-B15 (TDI)  
I/O-B13  
I/O-C0  
GND  
100  
101  
102  
103  
104  
I/O-A4  
I/O-H0  
I/O-H2  
I/O-H3  
I/O-H4  
I/O-H5  
NC  
37 I/O-D0/CLK2  
I/O-G8  
NC  
-
-
-
-
I/O-B12  
NC  
38  
39  
GND  
I/O-D15  
I/O-D13  
I/O-D12  
I/O-G10  
I/O-G12  
I/O-G13  
NC  
I/O-B10  
V
V
I/O-F2  
I/O-F3  
CC  
CC  
I/O-E0/  
CLK1  
I/O-B8  
I/O-B15 (TDI) 40  
9
I/O-B7  
I/O-B13  
41  
I/O-E2  
I/O-D11  
73  
I/O-G15  
(TDO)  
I/O-F4  
105  
-
I/O-H7  
10  
11  
12  
13  
14  
15  
I/O-B5  
GND  
I/O-B12  
I/O-B11  
I/O-B10  
I/O-B8  
I/O-B7  
I/O-B5  
42  
43  
44  
45  
46  
47  
I/O-E4  
GND  
I/O-D10  
I/O-D8  
I/O-D7  
I/O-D5  
74  
75  
76  
77  
78  
79  
GND  
I/O-F5  
I/O-F7  
I/O-F8  
I/O-F10  
GND  
106  
107  
108  
109  
110  
111  
-
-
-
-
-
-
I/O-H8  
I/O-H0  
I/O-H2  
I/O-H4  
I/O-H5  
I/O-H7  
I/O-H10  
I/O-B4  
I/O-B2  
I/O-B0  
I/O-E5  
I/O-E7  
I/O-E8  
I/O-E10  
V
CC  
I/O-H11  
I/O-H12  
I/O-H13  
V
CC  
I/O-C15  
(TMS)  
I/O-D4  
I/O-F11  
16  
17  
18  
I/O-C13  
I/O-C12  
GND  
I/O-B4  
I/O-B3  
48  
49  
50  
I/O-E12  
I/O-E13  
I/O-E15  
I/O-D3  
I/O-D2  
80  
81  
I/O-H8  
I/O-F12  
I/O-F13  
112  
113  
114  
-
-
-
I/O-H15  
GND  
I/O-H10  
V
I/O-D0/CLK2 82  
V
I/O-F15  
(TCK)  
IN0/CLK0  
CC  
CC  
19  
20  
21  
I/O-C10  
I/O-C8  
I/O-C7  
I/O-B2  
I/O-B0  
51  
52  
53  
V
GND  
83  
84  
85  
I/O-H12  
I/O-H13  
I/O-H15  
I/O-G0  
I/O-G2  
I/O-G3  
115  
116  
117  
-
-
-
IN2/gtsn  
IN1  
CC  
I/O-F0  
I/O-F2  
V
CC  
I/O-C15  
(TMS)  
I/O-E0/  
CLK1  
IN3  
22  
23  
I/O-C5  
I/O-C4  
I/O-C13  
I/O-C12  
54  
55  
I/O-F4  
I/O-F5  
I/O-E2  
I/O-E3  
86  
87  
GND  
I/O-G4  
118  
119  
-
-
V
CC  
IN0/CLK0  
V
I/O-A15/  
CLK3  
CC  
24  
25  
26  
27  
28  
29  
30  
I/O-C2  
I/O-C0  
GND  
I/O-C11  
56  
57  
58  
59  
60  
61  
62  
I/O-F7  
I/O-F8  
I/O-F10  
GND  
I/O-E4  
GND  
88  
89  
90  
91  
IN2/gtsn  
IN1  
I/O-G5  
I/O-G7  
120  
121  
122  
123  
124  
125  
126  
-
-
-
-
-
-
-
I/O-A13  
I/O-A12  
I/O-A12  
GND  
V
CC  
I/O-C10  
I/O-C8  
I/O-C7  
I/O-C5  
I/O-C4  
I/O-E5  
I/O-E7  
I/O-E8  
I/O-E10  
I/O-E11  
IN3  
I/O-G8  
I/O-D15  
I/O-D13  
I/O-D12  
I/O-D10  
V
I/O-G10  
I/O-G11  
I/O-G12  
I/O-G13  
CC  
I/O-F12  
I/O-F13  
92 I/O-A15/CLK3  
I/O-A10  
I/O-A8  
I/O-A7  
93  
94  
I/O-A13  
I/O-A12  
I/O-F15  
(TCK)  
31  
32  
I/O-D8  
I/O-D7  
I/O-C3  
I/O-C2  
63  
64  
I/O-G0  
I/O-E12  
I/O-E13  
95  
96  
GND  
I/O-G15  
(TDO)  
127  
128  
-
-
I/O-A5  
I/O-A4  
I/O-G2  
I/O-A10  
GND  
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XCR3128A: 128 Macrocell CPLD with Enhanced Clocking  
100-pin VQFP  
128-pin TQFP  
128  
103  
100  
76  
1
102  
75  
1
VQFP  
TQFP  
25  
51  
38  
65  
26  
50  
39  
64  
SP00485A  
SP00469B  
Ordering Information  
Example: XCR3128A -7 VQ 100 C  
Temperature Range  
Number of Pins  
Package Type  
Device Type  
Speed Options  
Temperature Range  
Speed Options  
C = Commercial, TA = 0°C to +70°C  
I = Industrial, TA = 40°C to +85°C  
-15: 15 ns pin-to-pin delay  
-12: 12 ns pin-to-pin delay  
-10: 10 ns pin-to-pin delay  
-7: 7.5 ns pin-to-pin delay  
Packaging Options  
VQ100: 100-pin VQFP  
TQ128: 128-pin TQFP  
Component Availability  
Pins  
100  
128  
Type  
Plastic VQFP  
Plastic TQFP  
Code  
VQ100  
TQ128  
XCR3128A  
-15  
-12  
-10  
-7  
I
C
I
C
C, I  
C
C, I  
C
Revision History  
Date  
Version #  
Revision  
7/22/99  
2/10/00  
8/10/00  
1.0  
1.1  
1.2  
Initial Xilinx release  
Converted to Xilinx format and updated.  
Updated pinout table.  
17  
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XILINX

XCR3128A-12TQ128C

CPLD with Enhanced Clocking
XILINX

XCR3128A-12TQ128I

CPLD with Enhanced Clocking
XILINX

XCR3128A-12VQ100C

CPLD with Enhanced Clocking
XILINX

XCR3128A-12VQ100I

CPLD with Enhanced Clocking
XILINX

XCR3128A-15TQ128C

CPLD with Enhanced Clocking
XILINX

XCR3128A-15TQ128I

CPLD with Enhanced Clocking
XILINX

XCR3128A-15VQ100C

CPLD with Enhanced Clocking
XILINX

XCR3128A-15VQ100I

CPLD with Enhanced Clocking
XILINX