AGRL8583DAJ-D [ZARLINK]

Telecom Circuit, 1-Func, PDSO28, PLASTIC, SOG-28;
AGRL8583DAJ-D
型号: AGRL8583DAJ-D
厂家: ZARLINK SEMICONDUCTOR INC    ZARLINK SEMICONDUCTOR INC
描述:

Telecom Circuit, 1-Func, PDSO28, PLASTIC, SOG-28

电信 光电二极管 电信集成电路
文件: 总21页 (文件大小:454K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
L8583D Line Card Access Switch  
The L8583D has eight states: the idle talk state (line  
break switches closed, all other switches open), the  
power ringing state (ringing access switches closed,  
all other switches open), loop access state (loop  
access switches closed, all switches open), SLIC test  
state (test in switches closed, all other switches  
open), simultaneous loop and SLIC access state  
(loop and test in switches closed, all others open),  
ringing generator test state (ring test switches closed,  
all others open), simultaneous test-out and ring-test  
state (ring and test out switches closed), and an all-  
off state. The L8583D is appropriate for central office,  
access, digital loop carrier, and other Telcordia Tech-  
nologies™ TR-57 applications.  
Features  
I Small size/surface-mount packaging  
I Monolithic IC reliability  
I Low impulse noise  
I Make-before-break, break-before-make operation  
I Clean, bounce-free switching  
I Low, matched on-resistance  
I Built-in current limiting, thermal shutdown, and  
SLIC protection  
I 5 V only operation, very low power consumption  
I Battery monitor, all-off state upon loss of battery  
I No EMI  
The L8583D offers break-before-make or make-  
before-break switching, with simple logic-level input  
control. Because of the solid-state construction, volt-  
age transients generated when switching into an  
inductive ringing lead during ring cadence or ring trip  
are minimized, possibly eliminating the need for  
external zero cross switching circuitry. State control is  
via logic level inputs, so no additional driver circuitry  
is required.  
I Latched logic level inputs, no driver circuitry  
I Only one external protector required  
Applications  
The line break switch is a linear switch that has  
exceptionally low on-resistance and an excellent  
on-resistance matching characteristic. The ringing  
access switch has a breakdown voltage rating  
>480 V which is sufficiently high, with proper protec-  
tion, to prevent breakdown in the presence of a tran-  
sient fault condition (i.e., passing the transient on to  
the ringing generator).  
I Central office  
I DLC  
I PBX  
I DAML  
I HFC/FITL  
The L8583D provides an integrated diode bridge  
along with current limiting and thermal shutdown for  
protection of the device itself and the subsequent  
subscriber line integrated circuit (SLIC). For LCAS  
protection, power cross is reduced by the current-  
limiting and thermal shutdown circuits and lightning  
reduced by the current-limit circuit. Residue faults are  
shunted from the SLIC by the diode bridge.  
Description  
The Legerity L8583D line card access switch is a  
monolithic solid-state device providing  
the equivalent switching functionality of three 2-form  
C switches. The L8583D is designed to provide  
power ringing access, line test access (test out), and  
SLIC test access (test in) to tip and ring in central  
office, digital loop carrier, private branch exchange,  
digitally added main line, and hybrid fiber coax/fiber-  
in-the-loop analog line card applications. An addi-  
tional pair of solid-state contacts are also available to  
provide access for testing of the ringing generator.  
Document ID# 080990 Date:  
Oct 31, 2002  
1
Rev:  
A
Version:  
Distribution:  
Public  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Description (continued)  
Pin Information  
To protect the L8583D from an overvoltage fault condi-  
tion, use of a secondary protector is required. The  
secondary protector must limit the voltage seen at the  
tip/ring terminals to prevent the breakdown voltage of  
the switches from being exceeded. To minimize stress  
on the solid-state contacts, use of a foldback-type or  
crowbar-type secondary protector is recommended.  
Please contact your Legerity account representative for  
a choice of recommended secondary protection  
device. With proper choice of secondary protection, a  
line card using the L8583D will meet all relevant ITU-T,  
LSSGR, FCC, or UL® protection requirements.  
FGND  
TTESTin  
TBAT  
1
2
3
4
5
6
7
8
9
20 VBAT  
SW1  
SW2  
19 RTESTin  
18 RBAT  
SW3  
SW5  
SW4  
SW6  
TLINE  
17 RLINE  
TRINGING  
TTESTout  
NC  
16 RRINGING  
15 RTESTout  
14 LATCH  
13 INTESTin  
12 INRING  
11 INTESTout  
SW7  
SW9  
SW8  
SW10  
The L8583D operates off of a 5 V supply only. This  
gives the device extremely low idle and active power  
dissipation and allows use with virtually any range of  
battery voltage. This makes the L8583D especially  
appropriate for remote power applications such as  
DAML or FOC/FITL or other Telcordia Technologies  
GR 909 applications where power dissipation is partic-  
ularly critical.  
VDD  
CONTROL  
LOGIC  
TSD  
DGND 10  
1670  
A battery voltage is also used by the L8583D, only as a  
reference for the integrated protection circuit. The  
L8583D will enter an all-off state upon loss of battery.  
Figure 1. 20-Pin Plastic SOG  
During power ringing, to turn on and maintain the on  
state, the ring access switch and ring test switch will  
draw a nominal 2 mA from the ring generator.  
FGND  
1
28 VBAT  
NC  
NC  
2
3
4
27  
26  
NC  
NC  
The L8583D device is packaged in a 20-pin plastic  
SOG (L8583DEY) and a 28-pin plastic SOG  
(L8583DAE). See Figure 1 for an illustration of the  
20-pin package and Figure 2 for an illustration of the  
28-pin package.  
25 NC  
NC  
SW1  
SW2  
TTESTin  
5
6
7
24  
23  
RTESTin  
RBAT  
TBAT  
TLINE  
SW3  
SW5  
SW4  
22  
21  
RLINE  
8
TRINGING  
NC  
SW6  
SW7  
9
10  
11  
20  
19  
18  
NC  
RRINGING  
SW8  
SW10  
RTESTout  
TTESTout  
SW9  
NC  
LATCH  
VDD 12  
17  
16  
INTESTin  
CONTROL  
LOGIC  
INRING  
TSD  
13  
14  
INTESTout  
12-2365 (F).d  
15  
DGND  
Figure 2. 28-Pin Plastic SOG  
2
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Pin Information (continued)  
Table 1. Pin Descriptions  
20-Pin SOG 28-Pin SOG Symbol*  
Description  
1
2
3
4
5
6
7
1
5
6
7
8
FGND  
Fault ground.  
TTESTin Test (in) access on TIP.  
TBAT  
TLINE  
TRINGING Connect to return ground for ringing generator.  
TTESTout Test (out) access on TIP.  
Connect to TIP on SLIC side.  
Connect to TIP on line side.  
10  
2, 3, 4, 9, 11, 21,  
NC  
No connection.  
25, 26, 27  
8
9
12  
13  
VDD  
TSD  
5 V supply.  
Temperature shutdown pin. Can be used as a logic level input or an output. See  
Table 16 and the Switching Behavior section of this data sheet for input pin  
description. As an output flag, this pin will read 5 V when the device is in its  
operational mode and 0 V in the thermal shutdown mode. To disable the thermal  
shutdown mechanism, tie this pin to 5 V (not recommended).  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
14  
15  
16  
17  
18  
19  
20  
22  
23  
24  
28  
DGND Digital ground.  
u
INTESTout Logic level switch input control.  
u
INRING Logic level switch input control.  
d
INTESTin Logic level switch input control.  
LATCHd Data input control, active-high, transparent low.  
RTESTout Test (out) access on RING.  
RRINGING Connect to ringing generator.  
RLINE  
RBAT  
Connect to RING on line side.  
Connect to RING on SLIC side.  
RTESTin Test (in) access on RING.  
VBAT Battery voltage. Used as a reference for protection circuit.  
* u = 75K typical pull-up resistor.  
d = 75K typical pull-down resistor.  
3
Data Sheet  
L8583D Line Card Access Switch  
Absolute Maximum Ratings  
October 2002  
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso-  
lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess  
of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended  
periods can adversely affect device reliability.  
Table 2. Absolute Maximum Ratings  
Parameter  
Min  
–40  
–40  
5
Max  
110  
150  
95  
Unit  
°C  
°C  
%
Operating Temperature Range  
Storage Temperature Range  
Relative Humidity Range  
Pin Soldering Temperature (t = 10 s max)  
5 V Power Supply  
Battery Supply  
260  
7
–85  
7
°C  
V
V
Logic Input Voltage  
V
Input-to-output Isolation  
Pole-to-pole Isolation  
330  
330  
V
V
Handling Precautions  
Although electrostatic discharge (ESD) protection circuitry has been designed into this device, proper precautions  
must be taken to avoid exposure to ESD and electrical overstress (EOS) during all handling, assembly, and test  
operations. Legerity employs both a human-body model (HBM) and a charged-device model (CDM) qualification  
requirement in order to determine ESD-susceptibility limits and protection design evaluation. ESD voltage thresh-  
olds are dependent on the circuit parameters used in each of the models, as defined by JEDEC's JESD22-A114  
(HBM) and JESD22-C101 (CDM) standards.  
Table 3. HBM ESD Threshold Voltage  
Device  
L8583D  
Rating  
1000 V  
4
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Electrical Characteristics  
TA = –40 °C to +85 °C, unless otherwise specified.  
Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are  
the result of engineering evaluations. Typical values are for information purposes only and are not part of the test-  
ing requirements.  
Table 4. Power Supply Specifications  
Supply  
VDD  
Min  
4.5  
Typ  
5
Max  
5.5  
Unit  
V
Supply  
VBAT*  
Min  
–19  
Typ  
Max  
–72  
Unit  
V
* VBAT is used only as a reference for internal protection circuitry. If VBAT rises above –10 V, the device will enter an all-off state and remain in  
this state until the battery voltage drops below –15 V.  
Table 5. Test In Switches, 1 and 2  
Parameter  
Test Condition  
Measure Min Typ Max Unit  
Off-state Leakage Current:  
+25 °C  
Vswitch (differential) = –320 V to Gnd  
Vswitch (differential) = –60 V to +260 V  
Vswitch (differential) = –330 V to Gnd  
Vswitch (differential) = –60 V to +270 V  
Vswitch (differential) = –310 V to Gnd  
Vswitch (differential) = –60 V to +250 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
On-resistance:  
+25 °C  
Iswitch (on) = ±5 mA, ±10 mA  
Iswitch (on) = ±5 mA, ±10 mA  
Iswitch (on) = ±5 mA, ±10 mA  
VON  
VON  
VON  
49  
37  
77  
+85 °C  
–40 °C  
Isolation:  
+25 °C  
Vswitch (both poles) = ±320 V,  
logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
Vswitch (both poles) = ±330 V,  
logic inputs = Gnd  
Vswitch (both poles) = ±310 V,  
logic inputs = Gnd  
dV/dt Sensitivity*  
200  
V/µs  
* Applied voltage is 100 Vp-p square wave at 100 Hz.  
5
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Electrical Characteristics (continued)  
Table 6. Break Switches, 3 and 4  
Parameter  
Off-state Leakage Current:  
+25 °C  
Test Condition  
Measure  
Min Typ Max Unit  
Vswitch (differential) = –320 V to Gnd  
Vswitch (differential) = –60 V to +260 V  
Vswitch (differential) = –330 V to Gnd  
Vswitch (differential) = –60 V to +270 V  
Vswitch (differential) = –310 V to Gnd  
Vswitch (differential) = –60 V to +250 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
On-resistance:  
+25 °C  
TLINE = ±10 mA, ±40 mA, TBAT = –2 V  
TLINE = ±10 mA, ±40 mA, TBAT = –2 V  
TLINE = ±10 mA, ±40 mA, TBAT = –2 V  
VON  
VON  
VON  
21.5  
16  
31  
+85 °C  
–40 °C  
On-resistance Match  
Per on-resistance test  
condition of SW3, SW4  
Magnitude  
RON SW3 – RON SW4  
0.2 1.0  
On-state Voltage*  
Iswitch = ILIMIT at 50 Hz/60 Hz  
VON  
220  
V
dc Current Limit:  
+85 °C  
Vswitch (on) = ±10 V  
Vswitch (on) = ±10 V  
Iswitch  
Iswitch  
80  
mA  
250 mA  
–40 °C  
Dynamic Current Limit  
(t = <0.5 µs)  
Break switches in on state; ringing access  
switches off; apply ±1000 V at 10/1000 µs  
pulse; appropriate secondary protection in  
place  
Iswitch  
2.5  
A
Isolation:  
+25 °C  
Vswitch (both poles) = ±320 V,  
logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
Vswitch (both poles) = ±330 V,  
logic inputs = Gnd  
Vswitch (both poles) = ±310 V,  
logic inputs = Gnd  
dV/dt Sensitivity†  
200  
V/µs  
* This parameter is not tested in production. Choice of secondary protector should ensure this rating is not exceeded.  
† Applied voltage is 100 Vp-p square wave at 100 Hz.  
6
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Electrical Characteristics (continued)  
Table 7. Ring Test Return Switch, 5  
Parameter  
Test Condition  
Measure Min Typ Max Unit  
Off-state Leakage Current:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (differential) = –320 V to Gnd  
Vswitch (differential) = –60 V to +260 V  
Vswitch (differential) = –330 V to Gnd  
Vswitch (differential) = –60 V to +270 V  
Vswitch (differential) = –310 V to Gnd  
Vswitch (differential) = –60 V to +250 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
On-resistance  
Iswitch (on) = ±0 mA, ±10 mA  
VON  
55  
110  
Isolation:  
+25 °C  
Vswitch (both poles) = ±320 V,  
logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
Vswitch (both poles) = ±330 V,  
logic inputs = Gnd  
Vswitch (both poles) = ±310 V,  
logic inputs = Gnd  
dV/dt Sensitivity*  
200  
V/µs  
* Applied voltage is 100 Vp-p square wave at 100 Hz.  
Table 8. Ringing Test Switch, 6  
Parameter  
Test Condition  
Measure  
Min Typ Max Unit  
Off-state Leakage Current:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (differential) = –60 V to +190 V  
Vswitch (differential) = +60 V to –190 V  
Vswitch (differential) = –60 V to +200 V  
Vswitch (differential) = +60 V to –200 V  
Vswitch (differential) = –60 V to +180 V  
Vswitch (differential) = +60 V to –180 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
On-resistance  
On Voltage  
Steady-state Current*  
Release Current  
Iswitch (on) = ±70 mA, ±80 mA  
VON  
20  
1.5  
100 mA  
V
Iswitch (on) = ±1 mA  
500  
µA  
Isolation:  
+25 °C  
Vswitch (both poles) = ±320 V,  
logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
Vswitch (both poles) = ±330 V,  
logic inputs = Gnd  
Vswitch (both poles) = ±310 V,  
logic inputs = Gnd  
dV/dt Sensitivity†  
200  
V/µs  
* Choice of secondary protector and series current-limit resistor should ensure these ratings are not exceeded.  
† Applied voltage is 100 Vp-p square wave at 100 Hz.  
7
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Electrical Characteristics (continued)  
Table 9. Ring Return Switch, 7  
Parameter  
Test Condition  
Measure Min Typ Max Unit  
Off-state Leakage Current:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (differential) = –320 V to Gnd  
Vswitch (differential) = –60 V to +260 V  
Vswitch (differential) = –330 V to Gnd  
Vswitch (differential) = –60 V to +270 V  
Vswitch (differential) = –310 V to Gnd  
Vswitch (differential) = –60 V to +250 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
dc Current Limit  
Dynamic Current Limit  
(t = <0.5 µs)  
Vswitch (on) = ±10 V  
Iswitch  
200  
2.5  
mA  
A
Break and loop switches in off state; ring return switch Iswitch  
on; apply ±1000 V at 10/1000 µs pulse; appropriate sec-  
ondary protection in place  
On-resistance  
On-state Voltage*  
Iswitch (on) = ±0 mA, ±10 mA  
Iswitch = ILIMIT at 50 Hz/60 Hz  
VON  
VON  
110  
130  
V
Isolation:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (both poles) = ±320 V, logic inputs = Gnd  
Vswitch (both poles) = ±330 V, logic inputs = Gnd  
Vswitch (both poles) = ±310 V, logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
dV/dt Sensitivity†  
200  
V/µs  
* This parameter is not tested in production. Choice of secondary protector should ensure this rating is not exceeded.  
† Applied voltage is 100 Vp-p square wave at 100 Hz.  
Table 10. Ringing Access Switch, 8  
Parameter  
Off-state Leakage Current:  
+25 °C  
Test Condition  
Measure Min Typ Max Unit  
Vswitch (differential) = –255 V to +210 V  
Vswitch (differential) = +255 V to –210 V  
Vswitch (differential) = –270 V to +210 V  
Vswitch (differential) = +270 V to –210 V  
Vswitch (differential) = –245 V to +210 V  
Vswitch (differential) = +245 V to –210 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
+85 °C  
–40 °C  
On Voltage  
Ring Generator Current Dur-  
ing Ring  
Iswitch (on) = ±1 mA  
2
3
V
mA  
VCC = 5 V  
IRING-  
INRING = 1  
SOURCE  
INTESTin = 0  
INTESTout = 0  
Steady-state Current*  
Surge Current*  
Release Current  
On-resistance  
500  
150 mA  
2
A
µA  
12  
Iswitch (on) = ±70 mA, ±80 mA  
VON  
Isolation:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (both poles) = ±320 V, logic inputs = Gnd  
Vswitch (both poles) = ±330 V, logic inputs = Gnd  
Vswitch (both poles) = ±310 V, logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
dV/dt Sensitivity†  
200  
V/µs  
* Choice of secondary protector and series current-limit resistor should ensure these ratings are not exceeded.  
† Applied voltage is 100 Vp-p square wave at 100 Hz.  
8
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Electrical Characteristics (continued)  
Table 11. Loop Access Switches, 9 and 10  
Parameter  
Test Condition  
Measure Min Typ Max Unit  
Off-state Leakage Current:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (differential) = –320 V to Gnd  
Vswitch (differential) = –60 V to +260 V  
Vswitch (differential) = –330 V to Gnd  
Vswitch (differential) = –60 V to +270 V  
Vswitch (differential) = –310 V to Gnd  
Vswitch (differential) = –60 V to +250 V  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
On-resistance:  
+25 °C  
Iswitch (on) = ±5 mA, ±10 mA  
Iswitch (on) = ±5 mA, ±10 mA  
Iswitch (on) = ±5 mA, ±10 mA  
Von  
Von  
Von  
49  
37  
77  
+85 °C  
–40 °C  
On-state Voltage*  
Iswitch = ILIMIT at 50 Hz/60 Hz  
VON  
130  
V
dc Current Limit:  
+85 °C  
Vswitch (on) = ±10 V  
Vswitch (on) = ±10 V  
Iswitch  
Iswitch  
80  
mA  
–40 °C  
250 mA  
Dynamic Current Limit  
(t = <0.5 µs)  
Break switches in on state; ringing access switches off; Iswitch  
apply ±1000 V at 10/1000 µs pulse; appropriate second-  
ary protection in place  
2.5  
A
Isolation:  
+25 °C  
+85 °C  
–40 °C  
Vswitch (both poles) = ±320 V, logic inputs = Gnd  
Vswitch (both poles) = ±330 V, logic inputs = Gnd  
Vswitch (both poles) = ±310 V, logic inputs = Gnd  
Iswitch  
Iswitch  
Iswitch  
1
1
1
µA  
µA  
µA  
dV/dt Sensitivity†  
200  
V/µs  
* This parameter is not tested in production. Choice of secondary protector should ensure this rating is not exceeded.  
† Applied voltage is 100 Vp-p square wave at 100 Hz.  
9
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Electrical Characteristics (continued)  
Table 12. Additional Electrical Characteristics  
Parameter  
Test Condition  
Measure Min Typ Max Unit  
Digital Input Characteristics:  
Input Low Voltage  
Input High Voltage  
llogicin  
3.5  
1.5  
500 µA  
V
V
Input Leakage Current (high)  
VDD = 5.5 V, VBAT = –75 V,  
Vlogicin = 5 V  
Input Leakage Current (low)  
VDD = 5.5 V, VBAT = –75 V,  
llogicin  
500 µA  
Vlogicin = 0 V  
Power Requirements:  
Power Dissipation  
VDD = 5 V, VBAT = –48 V,  
idle/talk state  
IDD, IBAT  
IDD, IBAT  
IDD, IBAT  
4.5  
3.8  
4.4  
7
6
mW  
mW  
all-off state,  
ringing state or access state  
11 mW  
VDD Current  
VBAT Current  
VDD = 5 V,  
idle/talk state  
all-off state,  
ringing state  
IDD  
IDD  
IDD  
0.860 1.3 mA  
0.760 1.1 mA  
0.850 2.1 mA  
VBAT = –48 V,  
idle/talk state  
IBAT  
IBAT  
IBAT  
4
4
4
10  
10  
10  
µA  
µA  
µA  
all-off state,  
ringing state or access state  
Digital Input Characteristics:  
Input Low Voltage  
Input High Voltage  
llogicin  
3.5  
0.5  
1.5  
V
V
µA  
Input Leakage Current (high)  
VDD = 5.5 V, VBAT = –58 V,  
INTESTOUT, INRING  
Vlogicin = 5 V  
Input Leakage Current (low)  
INTESTOUT, INRING  
Input Leakage Current (high)  
INTESTIN, LATCH  
Input Leakage Current (low)  
INTESTIN, LATCH  
VDD = 5.5 V, VBAT = –58 V,  
llogicin  
llogicin  
llogicin  
100  
100  
0.5  
µA  
µA  
µA  
Vlogicin = 0 V  
VDD = 5.5 V, VBAT = –58 V,  
Vlogicin = 5 V  
VDD = 5.5 V, VBAT = –58 V,  
Vlogicin = 0 V  
Temperature Shutdown Requirements*:  
Shutdown Activation Temperature  
110  
10  
125  
150  
25  
°C  
°C  
Shutdown Circuit Hysteresis  
* Temperature shutdown flag (TSD) will be high during normal operation and low during temperature shutdown state.  
Zero Cross Current Turn Off  
The ring access switch (SW8) is designed to turn off on the next zero current crossing after application of the  
appropriate logic input control. This switch requires a current zero cross to turn off. Switch 8, once on, will remain in  
the on state (regardless of logic input) until a current zero cross. Therefore, to ensure proper operation of switch 8,  
this switch should be connected, via proper impedance, to the ringing generator or some other ac source. Do not  
attempt to switch pure dc with switch 8. The ringing test access switch, SW6, also has similar characteristics to  
switch 8 and should also only be used to switch signals with zero current crossings. For a detailed explanation of  
the operation of switches 6 and 8, please refer to the An Introduction to L758X Series of Line Card Access  
Switches Application Note.  
10  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Switching Behavior  
When switching from the power ringing state to the idle/talk state, via simple logic level input control, the L8583D is  
able to provide control with respect to the timing when the ringing access contacts are released relative to the state  
of the line break contacts.  
Make-before-break operation occurs when the line break switch contacts are closed (or made) before the ringing  
access switch contact is opened (or broken). Break-before-make operation occurs when the ringing access contact  
is opened before the line break switch contacts are closed.  
Using the logic level input pins RING, TESTin, and TESTout, either make-before-break or break-before-make oper-  
ation of the L8583D is easily achieved. The logic sequences for either mode of operation are given in Table 13 and  
Table 14. See the Truth Table (Table 16) for an explanation of logic states.  
When using an L8583D in the make-before-break mode, during the ring-to-idle transition, for a period of up to one-  
half cycle at the ringing frequency, the ring break switch and the pnpn-type ring access switch can both be in the on  
state. This is the maximum time after the logic signal at INRING has transitioned that the ring access switch is wait-  
ing for the next zero current cross, so it can close. During this interval, current that is limited to the dc break switch  
current-limit value will be sourced from the ring node of the SLIC.  
Table 13. Make-Before-Break Operation—Part I  
RIN TESTin TESTout TSD  
G
State  
Timing  
Break  
Ring  
Ring  
All Other  
Access  
Switches Return  
Access  
3 and 4 Switch 7 Switch 8 Switches  
5 V  
0 V  
0 V  
0 V  
0 V  
0 V  
Float Power  
Ringing  
Float Make- SW8 waiting for next zero cur-  
before- rent crossing to turn off maxi-  
break mum time—one-half of ringing.  
In this transition state, current  
that is limited to the dc break  
Open  
Closed  
Closed  
Closed  
Open  
Open  
Closed  
Open  
switch current-limit value will be  
sourced from the ring node of the  
SLIC.  
0 V  
0 V  
0 V  
Float Idle/Talk Zero cross current has occurred.  
Closed  
Open  
Open  
Open  
11  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Switching Behavior (continued)  
Table 14. Break-Before-Make Operation—Part II  
INPUT TESTin TESTout TSD  
State  
Timing  
Break  
Ring  
Ring  
All Other  
Switches Return Access Switches  
3 and 4 Switch 7 Switch 8  
5 V  
5 V  
0 V  
0 V  
0 V  
5 V  
Float Power  
Ringing  
Float All Off Hold this state for 25 ms. SW8  
Open  
Closed  
Closed  
Open  
Open  
Open  
Closed  
Open  
waiting for zero current to turn  
off.  
5 V  
0 V  
0 V  
5 V  
Float All Off Zero current has occurred and  
Open  
Open  
Open  
Open  
Open  
Open  
Open  
SW8 has opened.  
0 V  
0 V  
Float Idle/Talk Release break switches.  
Closed  
Notes:  
Break-before-make operation can be achieved using TSD as an input. In lines two and three of Table 14, instead of using the logic input pins to  
force the all-off state, force TSD to ground. This will override the logic inputs and also force the all-off state. Hold this state for 25 ms. During this  
25 ms all-off state, toggle the inputs from 100 (ringing state) to 000 (idle/talk state). After 25 ms, release TSD to return switch control to the input  
pins which will set the idle talk state.  
When using the L8583D in this mode, forcing TSD to ground will override the INPUT pins and force an all-off state. Setting TSD to 5 V will allow  
switch control via the logic INPUT pins. However, setting TSD to 5 V will also disable the thermal shutdown mechanism. This is not recom-  
mended. Therefore, to allow switch control via the logic INPUT pins, allow TSD to float.  
Thus, when using TSD as an input, the two recommended states are 0 (overrides logic input pins and forces all-off state) and float (allows switch  
control via logic input pins and thermal shutdown mechanism is active). This may require use of an open-collector buffer.  
Also note that TSD operation in L8583D is different than TSD operation of the L7581, where application of 5 V does not disable the thermal shut-  
down mechanism.  
Power Supplies  
Both the 5 V and battery supply are brought onto the L8583D. The L8583D requires only the 5 V supply for switch  
operation; that is, state control is powered exclusively off of the 5 V supply. Because of this, the L8583D offers  
extremely low power dissipation, both in the idle and active states. The battery voltage is not used for switch state  
control and is only used by the battery monitor circuit.  
Loss of Battery Voltage  
As an additional protection feature, the L8583D monitors the battery voltage. Upon loss of battery voltage, the  
L8583D will automatically enter an all-off state and remain in that state until the battery voltage is restored. The  
L8583D is designed such that the device will enter the all-off state if the battery rises above –10 V and will remain  
off until the battery drops below –15 V. Monitoring the battery for the automatic shutdown feature will draw a small  
current from the battery, typically  
4 µA. This will add slightly to the overall power dissipation of the device.  
Impulse Noise  
Using the L8583D will minimize and possibly eliminate the contribution to the overall system impulse noise that is  
associated with ringing access switches. Because of this characteristic of the L8583D, it may not be necessary to  
incorporate a zero cross switching scheme. This ultimately depends upon the characteristics of the individual sys-  
tem and is best evaluated at the board level.  
12  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Temperature Shutdown Mechanism  
Protection  
When the device temperature reaches a minimum of  
110 °C, the thermal shutdown mechanism will activate  
and force the device into an all-off state, regardless of  
the logic input pins. Pin TSD, when used as an output,  
will read 0 V when the device is in the thermal shut-  
down mode and +VDD during normal operation.  
Integrated SLIC Protection  
Diode Bridge  
In the L8583D, protection to the SLIC device or other  
subsequent circuitry is provided by a combination of  
current-limited break switches, a diode bridge clamping  
circuit, and a thermal shutdown mechanism.  
During a lightning event, due to the relatively short  
duration, the thermal shutdown will not typically acti-  
vate.  
During a positive lightning event, fault current is  
reduced by the dynamic current-limit circuit and  
directed to ground via the diode bridge. Voltage is  
clamped to a diode drop above ground. Negative light-  
ning is again reduced by the dynamic current limit and  
directed to battery via the diode bridge.  
During an extended power cross, the device tempera-  
ture will rise and cause the device to enter the thermal  
shutdown mode. This forces an all-off mode, and the  
current seen at TBAT/RBAT drops to zero. Once in the  
thermal shutdown mode, the device will cool and exit  
the thermal shutdown mode, thus re-entering the state  
it was in prior to thermal shutdown. Current, limited to  
the dc current-limit value, will again begin to flow and  
device heating will begin again. This cycle of entering  
and exiting thermal shutdown will last as long as the  
power-cross fault is present. The frequency of entering  
and exiting thermal shutdown will depend on the mag-  
nitude of the power cross. If the magnitude of the  
power cross is great enough, the external secondary  
protector may trigger shunting all current to ground.  
For power cross and power induction faults, the posi-  
tive cycle of the fault is clamped a diode drop above  
ground and fault currents steered to ground and the  
negative cycle of the power cross is steered to battery.  
Fault currents are limited by the current-limit circuit.  
Current Limiting  
During a lightning event, the current that is passed  
through the break switches and presented to the inte-  
grated protection circuit and subsequent circuitry is lim-  
ited by the dynamic current-limit response of the break  
switches (assuming idle/talk state). When the voltage  
seen at the TLINE/RLINE nodes is properly clamped by  
an external secondary protector, upon application of a  
1000 V, 10 x 1000 pulse (LSSGR lightning), the current  
seen at the TBAT/RBAT nodes will typically be a pulse of  
magnitude 2.5 A and duration less than 0.5 µs.  
In the L8583D, the thermal shutdown mechanism can  
be disabled by forcing the TSD pin to +VDD. This func-  
tionality is different from the L7581, whose thermal  
shutdown mechanism cannot be disabled.  
Electrical specifications relating to the integrated over-  
voltage clamping circuit are outlined in Table 15.  
During a power-cross event, the current that is passed  
through the break switches and presented to the inte-  
grated protection circuit and subsequent circuitry is lim-  
ited by the dc current-limit response of the break  
switches (assuming idle/talk state). The dc current limit  
is specified over temperature between 80 mA and  
250 mA. Note that the current-limit circuitry has a nega-  
tive temperature coefficient. Thus, if the device is sub-  
jected to an extended power cross, the value of current  
seen at TBAT/RBAT will decrease as the device heats  
due to the fault current. If sufficient heating occurs, the  
temperature shutdown mechanism will activate and the  
device will enter an all-off mode.  
13  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
I |Vringingpeakmax| + |VBATmax| < |Vbreakovermin|.  
where:  
Protection (continued)  
Integrated SLIC Protection (continued)  
External Secondary Protector  
I VBATmax—Maximum magnitude of battery voltage.  
I Vbreakovermax—Maximum magnitude breakover  
voltage of external secondary protector.  
With the above integrated protection features, only one  
overvoltage secondary protection device on the loop  
side of the L8583D is required. The purpose of this  
device is to limit fault voltages seen by the L8583D so  
as not to exceed the breakdown voltage or input-output  
isolation rating of the device. To minimize stress on the  
L8583D, use of a foldback-type or crowbar-type device  
is recommended. A detailed explanation and design  
equations on the choice of the external secondary pro-  
tection device are given in the An Introduction to L758X  
Series of Line Card Access Switches Application Note.  
Basic design equations governing the choice of exter-  
nal secondary protector are given below:  
I Vbreakovermin—Minimum magnitude breakover  
voltage of external secondary protector.  
I Vbreakdownmin(break)—Minimum magnitude  
breakdown voltage of L8583D break switch.  
I Vbreakdownmin(ring)—Minimum magnitude break-  
down voltage of L8583D ring access switch.  
I Vringingpeakmax—Maximum magnitude peak volt-  
age of ringing signal.  
Series current-limiting fused resistors or PTCs should  
be chosen so as not to exceed the current rating of the  
external secondary protector. Refer to the manufac-  
turer’s data sheet for requirements.  
I |VBATmax| + |Vbreakovermax| <  
|Vbreakdownmin(break)|.  
I |Vringingpeakmax| + |VBATmax| +  
|Vbreakovermax| < |Vbreakdownmin(ring)|.  
Table 15. Electrical Specifications, Protection Circuitry  
Parameters Related to Diodes (in Diode Bridge)  
Parameter  
Test Condition  
Measure  
Min  
Typ  
Max  
Unit  
Voltage Drop at Continuous Current (50  
Hz/60 Hz)  
Apply ±dc current limit of  
Forward  
Voltage  
3.5  
V
break switches  
Voltage Drop at Surge Current  
Apply ±dynamic current  
limit of break switches  
Forward  
Voltage  
5
V
14  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Typical Performance Characteristics  
+I  
RON  
dc CURRENT-LIMIT  
BREAK SWITCHES  
–VOS  
VBAT – 3  
VBAT  
–V  
+V  
+VOS  
<1 µA  
3 V  
–I  
dc CURRENT LIMIT  
12-2312 (F)  
(OF BREAK SWITCHES)  
Figure 5. Switches 6, 8  
12-2309 (F).b  
Figure 3. Protection Circuit Version  
CURRENT  
+I  
LIMITING  
ILIMIT  
2/3 RON  
RON  
1.5 V  
–1.5 V  
–V  
+V  
RON  
2/3 RON  
ILIMIT  
CURRENT  
LIMITING  
–I  
12-2311 (F)  
Figure 4. Switches 1—5, 7, 9, 10  
15  
Data Sheet  
L8583D Line Card Access Switch  
Application  
October 2002  
VBAT  
(REFERENCE)  
RINGING  
TEST RETURN  
SW5  
SW9  
SW7  
SW1  
TEST IN  
TEST OUT  
RINGING  
RETURN  
R1  
TIP  
TIP  
SW3 BREAK  
BATTERY  
FEED  
CROWBAR  
BATTERY  
MONITOR  
PROTECTION  
BREAK SW4  
RING  
R2  
RING  
SW10  
SW8  
SW2  
RINGING  
ACCESS  
TEST IN  
TEST OUT  
SW6  
RINGING TEST  
RING  
GENERATOR  
BATTERY  
12-2366 (F).g  
Figure 6. Typical LCAS Application, Idle, or Talk State Shown  
16  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Application (continued)  
Table 16. Truth Table for L8583D  
INRING  
INTESTin  
INTESTout  
TSD  
TESTin  
Break  
Ring Test  
Switches  
Ring  
TESTout  
Switches  
Switches  
Switches Switches  
0 V  
0 V  
0 V  
5 V  
5 V  
0 V  
5 V  
5 V  
0 V  
0 V  
5 V  
0 V  
5 V  
5 V  
0 V  
5 V  
0 V  
5 V  
0 V  
0 V  
0 V  
5 V  
5 V  
5 V  
5 V/Float1  
5 V/Float1  
5 V/Float1  
5 V/Float1  
5 V/Float1  
5 V/Float1  
5 V/Float1  
5 V/Float1  
0 V2  
Off  
Off  
On  
Off  
Off  
On  
Off  
Off  
Off  
On  
Off  
Off  
Off  
Off  
Off  
Off  
Off  
Off  
Off  
Off  
Off  
Off  
On  
Off  
Off  
On  
Off  
Off  
Off  
On  
Off  
Off  
Off  
Off  
Off  
Off3  
On4  
Off5  
Off6  
Off7  
On8  
Off9,10  
On11  
Off9  
Don’t Care Don’t Care Don’t Care  
Off  
1. If TSD = 5 V, the thermal shutdown mechanism is disabled. If TSD is floating, the thermal shutdown mechanism is active.  
2. Forcing TSD to ground overrides the logic input pins and forces an all-off state.  
3. Idle/talk state.  
4. TESTout state.  
5. TESTin state.  
6. Power ringing state.  
7. Ringing generator test state.  
8. Simultaneous TESTout and TESTin state.  
9. All-off state.  
10. Device will power up in this state.  
11. Simultaneous TESTout—ring test state.  
A parallel in/parallel out data latch is integrated into the L8583D. Operation of the data latch is controlled by the  
logic-level input pin LATCH. The data input to the latch is the INPUT pin of the L8583D and the output of the data  
latch is an internal node used for state control.  
When the LATCH control pin is at logic 0, the data latch is transparent and data control signals flow directly from  
INPUT, through the data latch to state control. Any changes in INPUT will be reflected in the state of the switches.  
When the LATCH control pin is at logic 1, the data latch is active; the L8583D will no longer react to changes at the  
INPUT control pin. The state of the switches is now latched; that is, the state of the switches will remain as they  
were when the LATCH input transitioned from logic 0 to logic 1. The switches will not respond to changes in INPUT  
as long as LATCH is held high.  
Note that the TSD input is not tied to the data latch. TSD is not affected by the LATCH input. TSD input will override  
state control via INPUT and LATCH.  
The input logic pins INRING and INTESTOUT have internal pull-up resistors. Input logic pins INTESTIN and LATCH  
have internal pull-down resistors. Thus, the device will power up into the disconnect state.  
17  
Data Sheet  
L8583D Line Card Access Switch  
Outline Diagrams  
October 2002  
20-Pin SOG  
Dimensions are in millimeters.  
Note: The dimensions in this outline diagram are intended for informational purposes only. For detailed schemat-  
ics to assist your design efforts, please contact your Legerity Sales Representative.  
L
N
B
1
PIN #1 IDENTIFIER ZONE  
W
H
SEATING PLANE  
0.10  
0.61  
0.51 MAX  
1.27 TYP  
0.28 MAX  
5-4414 (F)  
Package Description  
Number of  
Pins  
Maximum  
Maximum  
Width Without  
Leads  
Maximum  
Width  
Maximum  
Length  
(L)  
Height  
Above  
Board  
(H)  
(N)  
Including  
Leads  
(B)  
(W)  
SOG (Small Outline Gull-Wing)  
20  
13.00  
7.62  
10.64  
2.67  
18  
Data Sheet  
L8583D Line Card Access Switch  
October 2002  
Outline Diagrams (continued)  
28-Pin SOG  
Dimensions are in millimeters.  
Note: The dimensions in this outline diagram are intended for informational purposes only. For detailed schemat-  
ics to assist your design efforts, please contact your Legerity Sales Representative.  
L
N
B
1
PIN #1 IDENTIFIER ZONE  
W
H
SEATING PLANE  
0.10  
0.61  
0.51 MAX  
1.27 TYP  
0.28 MAX  
5-4414 (F)  
Package Description  
Number of  
Pins  
Maximum  
Maximum  
Width Without  
Leads  
Maximum  
Width  
Maximum  
Length  
(L)  
Height  
Above  
Board  
(H)  
(N)  
Including  
Leads  
(B)  
(W)  
SOG (Small Outline Gull-Wing)  
28  
18.11  
7.62  
10.64  
2.67  
19  
L8583D Line Card Access Switch  
Ordering Information  
Device Part Number  
LULC8583DEY-D  
Description  
Line Card Access Switch  
Package  
20-Pin SOG,  
Dry-bagged  
Comcode  
109058099  
LULC8583DEY-DT  
Line Card Access Switch  
20-Pin SOG,  
Dry-bagged,  
Tape and reel*  
109058115  
AGRL8583DAJ-D  
AGRL8583DAJ-DT  
Line Card Access Switch  
Line Card Access Switch  
28-Pin SOG,  
700024229  
700024230  
Dry-bagged  
28-Pin SOG,  
Dry-bagged,  
Tape and reel*  
* Devices on tape and reel must be ordered in 1000-piece increments.  
Telcordia Technologies is a trademark of Telcordia Technologies, Inc.  
UL is a registered trademark of Underwriters Laboratories, Inc.  
Legerity, Inc. reserves the right to make changes to the product(s) or information contained herein without notice. No liability is assumed as a result of their use or application.  
Copyright © 2002 Legerity, Inc.  
All Rights Reserved  
P.O. Box 18200  
Austin, Texas 78760-8200  
Telephone: (512) 228-5400  
Fax: (512) 228-5508  
North America Toll Free: (800) 432-4009  
To contact the Legerity Sales Office  
nearest you, or to download or order  
product literature, visit our website at  
www.legerity.com.  
To order literature in North America,  
call:  
(800) 432-4009, ext. 75592  
or email:  
americalit@legerity.com  
To order literature in Europe or Asia,  
call:  
44-0-1179-341607  
or email:  
Europe — eurolit@legerity.com  
Asia — asialit@legerity.com  

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