X7R Dielectric  
					Specifications and Test Methods  
					Parameter/Test  
					Operating Temperature Range  
					Capacitance  
					X7R Specification Limits  
					Measuring Conditions  
					Temperature Cycle Chamber  
					-11ºC to +±21ºC  
					Within specified tolerance  
					≤ 2.15 for ≥ 10V DC rating  
					≤ 3.05 for 21V DC rating  
					≤ 3.15 for 21V and ±6V DC rating  
					≤ 1.05 for ≤ ±0V DC rating  
					±00,000MΩ or ±000MΩ - μF,  
					whichever is less  
					Freq.: ±.0 kHz ± ±05  
					Voltage: ±.0Vrms ± .2V  
					Dissipation Factor  
					Charge device with rated voltage for  
					±20 ± 1 secs ꢀ room temp/humidity  
					Charge device with 3005 of rated voltage for  
					±-1 seconds, w/charge and discharge current  
					limited to 10 mA (max)  
					Insulation Resistance  
					Dielectric Strength  
					No breakdown or visual defects  
					Note: Charge device with ±105 of rated  
					voltage for 100V devices.  
					Appearance  
					Capacitance  
					Variation  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					No defects  
					≤ ±±25  
					Deflection: 2mm  
					Test Time: 30 seconds  
					Resistance to  
					Flexure  
					1mm/sec  
					Meets Initial Values (As Above)  
					≥ Initial Value x 0.3  
					Stresses  
					90 mm  
					≥ 915 of each terminal should be covered  
					with fresh solder  
					No defects, <215 leaching of either end terminal  
					Dip device in eutectic solder at 230 ± 1ºC  
					for 1.0 ± 0.1 seconds  
					Solderability  
					Appearance  
					Capacitance  
					Variation  
					≤ ±7.15  
					Dip device in eutectic solder at 260ºC for 60  
					seconds. Store at room temperature for 24 ± 2  
					hours before measuring electrical properties.  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					Dielectric  
					Strength  
					Resistance to  
					Solder Heat  
					Meets Initial Values (As Above)  
					Meets Initial Values (As Above)  
					Meets Initial Values (As Above)  
					No visual defects  
					≤ ±7.15  
					Appearance  
					Capacitance  
					Variation  
					Step ±: -11ºC ± 2º  
					Step 2: Room Temp  
					30 ± 3 minutes  
					≤ 3 minutes  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					Dielectric  
					Strength  
					Appearance  
					Capacitance  
					Variation  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					Dielectric  
					Strength  
					Appearance  
					Capacitance  
					Variation  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					Dielectric  
					Strength  
					Thermal  
					Shock  
					Meets Initial Values (As Above)  
					Meets Initial Values (As Above)  
					Step 3: +±21ºC ± 2º  
					Step 4: Room Temp  
					30 ± 3 minutes  
					≤ 3 minutes  
					Repeat for 1 cycles and measure after  
					24 ± 2 hours at room temperature  
					Meets Initial Values (As Above)  
					No visual defects  
					Charge device with ±.1 rated voltage (≤ ±0V) in  
					test chamber set at ±21ºC ± 2ºC  
					for ±000 hours (+48, -0)  
					≤ ±±2.15  
					≤ Initial Value x 2.0 (See Above)  
					≥ Initial Value x 0.3 (See Above)  
					Load Life  
					Remove from test chamber and stabilize  
					at room temperature for 24 ± 2 hours  
					before measuring.  
					Meets Initial Values (As Above)  
					No visual defects  
					Store in a test chamber set at 81ºC ± 2ºC/  
					815 ± 15 relative humidity for ±000 hours  
					(+48, -0) with rated voltage applied.  
					≤ ±±2.15  
					Load  
					Humidity  
					≤ Initial Value x 2.0 (See Above)  
					≥ Initial Value x 0.3 (See Above)  
					Meets Initial Values (As Above)  
					Remove from chamber and stabilize at  
					room temperature and humidity for  
					24 ± 2 hours before measuring.  
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