1N5221B~1N5281B  
					ELECTRICAL CHARACTERISTICS (TA  
					= 25ºC unless  
					otherwise noted. Based on DC measurements at thermal  
					equilibrium; lead length = 3/8”; thermal resistance of heat sink =  
					30°C/W, VF = 1.1 V Max @ IF = 200mA for all types)  
					Symbol  
					Parameter  
					VZ  
					IZT  
					ZZT  
					IZk  
					IR  
					Reverse Zener Voltage @ IZT  
					Reverse Zener Current  
					Maximum Zener Impedance @ IZT  
					Reverse Zener Current  
					Reverse Leakage Current @ VR  
					Reverse Voltage  
					VR  
					IF  
					Forward Current  
					VF  
					θVZ  
					Forward Voltage @ IF  
					Maximum Zener Voltage Temperature Coefficient  
					ELECTRICAL CHARACTERISTICS (TA = 25ºC unless otherwise noted, VF = 1.1 V Max @ IF = 200mA for all types)  
					(Note 3.)  
					(Note 4.)  
					Zener Voltage  
					VZ (Volts)  
					Nom  
					Zener Impedance  
					ZZT @ IZT ZZK @ IZK  
					Ω)  
					Leakage Current  
					IR @ VR  
					θVZ  
					@ IZT  
					(mA)  
					(Note 5.)  
					(%/ºC)  
					Device  
					Device  
					Min  
					Max  
					(mA)  
					(Volts)  
					Marking  
					(
					(Ω)  
					(µA)  
					(Note 2.)  
					1N5221B  
					1N5222B  
					1N5223B  
					1N5224B  
					1N5225B  
					1N5221B  
					1N5222B  
					1N5223B  
					1N5224B  
					1N5225B  
					2.28  
					2.375  
					2.565  
					2.66  
					2.4  
					2.5  
					2.7  
					2.8  
					3
					2.52  
					2.625  
					2.835  
					2.94  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					20  
					30  
					30  
					30  
					30  
					29  
					28  
					24  
					23  
					22  
					19  
					17  
					11  
					7
					1200  
					1250  
					1300  
					1400  
					1600  
					1600  
					1700  
					1900  
					2000  
					1900  
					1600  
					1600  
					1600  
					1000  
					750  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					0.25  
					100  
					100  
					75  
					75  
					50  
					25  
					15  
					10  
					5
					1
					1
					-0.085  
					-0.085  
					-0.08  
					1
					1
					-0.08  
					2.85  
					3.15  
					1
					-0.075  
					-0.07  
					1N5226B 1N5226B  
					1N5227B 1N5227B  
					1N5228B 1N5228B  
					3.135  
					3.42  
					3.3  
					3.6  
					3.9  
					4.3  
					4.7  
					5.1  
					5.6  
					6
					3.465  
					3.78  
					1
					1
					-0.065  
					-0.06  
					3.705  
					4.085  
					4.465  
					4.845  
					5.32  
					4.095  
					4.515  
					4.935  
					5.355  
					5.88  
					1
					1N5229B  
					1N5230B  
					1N5229B  
					1N5230B  
					1
					±0.055  
					±0.03  
					±0.03  
					+0.038  
					+0.038  
					+0.045  
					+0.05  
					5
					2
					1N5231B 1N5231B  
					1N5232B 1N5232B  
					5
					2
					5
					3
					1N5233B  
					1N5233B  
					5.7  
					6.3  
					5
					3.5  
					4
					1N5234B 1N5234B  
					1N5235B 1N5235B  
					5.89  
					6.2  
					6.8  
					6.51  
					7
					5
					6.46  
					7.14  
					5
					3
					5
					2. TOLERANCE AND TYPE NUMBER DESIGNATION (VZ)  
					The type numbers listed have a standard tolerance on the nominal zener voltage of ±5%.  
					3. ZENER VOLTAGE (VZ) MEASUREMENT  
					Nominal zener voltage is measured with the device junction in the thermal equilibrium at the lead temperature (TL) at 30°C  
					±1°C and 3/8” lead length.  
					4. ZENER IMPEDANCE (ZZ) DERIVATION  
					ZZT and ZZK are measured by dividing the AC voltage drop across the device by the AC current applied. The specified limits  
					are for IZ(AC) = 0.1 IZ(DC) with AC frequency = 60Hz.  
					5. TEMPERATURE COEFFICIENT (θVZ  
					)
					Test conditions for temperature coefficient are as follows:  
					A. IZT = 7.5mA, T1 = 25°C, T2 = 125°C (1N5221B through 1N5242B)  
					B. IZT = Rated IZT, T1 = 25°C, T2 = 125°C (1N5243B through 1N5281B)  
					Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient  
					temperature.  
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					2
					REV.03 20121003