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S25FL Family (Serial Peripheral Interface)  
S25FL004D  
4 Megabit CMOS 3.0 Volt Flash Memory  
with 50 Mhz SPI Bus Interface  
ADVANCE  
INFORMATION  
Distinctive Characteristics  
ARCHITECTURAL ADVANTAGES  
PERFORMANCE CHARACTERISTICS  
„
Single power supply operation  
„
Speed  
— 50 MHz clock rate (maximum)  
Power Saving Standby Mode  
— Standby Mode 1 µA (typical)  
— Full voltage range: 2.7 to 3.6 V read and program  
operations  
Memory Architecture  
„
„
„
— Eight sectors with 512 Kb each  
Program  
— Page Program (up to 256 bytes) in 1.5 ms (typical)  
— Program cycles are on a page by page basis  
Erase  
Memory Protection Features  
„
Memory Protection  
— W# pin works in conjunction with Status Register Bits  
to protect specified memory areas  
„
— Status Register Block Protection bits (BP1, BP0) in  
status register configure parts of memory as read-  
only  
— 0.5 s typical sector erase time  
— 4 s typical bulk erase time  
Endurance  
— 100,000 cycles per sector typical  
Data Retention  
„
„
SOFTWARE FEATURES  
„
SPI Bus Compatible Serial Interface  
— 20 years typical  
„
„
„
Device ID  
— Electronic signature  
Process Technology  
— Manufactured on 0.25 µm process technology  
Package Option  
— Industry Standard Pinouts  
— 8-pin SO (208mil) package  
— 8-contact WSON leadless package (6x5mm)  
Publication Number S25FL004D_00 Revision A Amendment 0 Issue Date June 28, 2004  
A d v a n c e I n f o r m a t i o n  
General Description  
The S25FL004D device is a 3.0 Volt (2.7 V to 3.6 V) single power supply Flash memory  
device. S25FL004D consists of eight sectors, each with 512 Kb memory.  
Data appears on SI input pin when inputting data into the memory and on the SO output  
pin when outputting data from the memory. The devices are designed to be programmed  
in-system with the standard system 3.0 Volt VCC supply.  
The memory can be programmed 1 to 256 bytes at a time, using the Page Program in-  
struction.  
The memory supports Sector Erase and Bulk Erase instructions.  
Each device requires only a 3.0 Volt power supply (2.7 V to 3.6 V) for both read and write  
functions. Internally generated and regulated voltages are provided for the program op-  
erations. This device does not require VPP supply.  
2
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Table of Contents  
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4  
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . .5  
Input/Output Descriptions . . . . . . . . . . . . . . . . . . . 5  
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . .6  
Signal Description . . . . . . . . . . . . . . . . . . . . . . . . . . .7  
SPI Modes ...................................................................................................7  
Figure 1. Bus Master and Memory Devices on the SPI Bus....... 8  
Figure 2. SPI Modes Supported............................................ 8  
Operating Features . . . . . . . . . . . . . . . . . . . . . . . . .9  
Page Programming .................................................................................. 9  
Sector Erase, or Bulk Erase ................................................................. 9  
Polling During a Write, Program, or Erase Cycle ........................ 9  
Status Register ......................................................................................... 9  
Page Program (PP) .................................................................................19  
Figure 11. Page Program (PP) Instruction Sequence .............. 20  
Sector Erase (SE) ..................................................................................20  
Figure 12. Sector Erase (SE) Instruction Sequence................ 21  
Bulk Erase (BE) .......................................................................................21  
Figure 13. Bulk Erase (BE) Instruction Sequence................... 22  
Deep Power Down (DP) ....................................................................22  
Figure 14. Deep Power Down (DP) Instruction Sequence........ 23  
Release from Deep Power Down (RES) ....................................... 23  
Figure 15. Release from Deep Power Down I  
nstruction Sequence.......................................................... 24  
Release from Deep Power Down and Read Electronic  
Signature (RES) ......................................................................................24  
Figure 16. Release from Deep Power Down and Read Electronic  
Signature (RES) Instruction Sequence ................................. 25  
Protection Modes ..................................................................................10  
Table 1. Protected Area Sizes (S25FL004D). .........................10  
Hold Condition Modes ........................................................................10  
Figure 3. Hold Condition Activation...................................... 11  
Memory Organization . . . . . . . . . . . . . . . . . . . . . . 12  
Table 2. Sector Address Table – S25FL004D .........................12  
Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Table 3. Instruction Set. ....................................................13  
Write Enable (WREN) .........................................................................14  
Figure 4. Write Enable (WREN) Instruction Sequence............. 14  
Write Disable (WRDI) ........................................................................14  
Figure 5. Write Disable (WRDI) Instruction Sequence ............ 14  
Read Status Register (RDSR) ............................................................. 15  
Figure 6. Read Status Register (RDSR)  
Instruction Sequence ........................................................ 15  
Figure 7. Status Register Format......................................... 15  
Write Status Register (WRSR) ..........................................................16  
Figure 8. Write Status Register (WRSR)  
Instruction Sequence ........................................................ 17  
Table 4. Protection Modes ..................................................17  
Power-up and Power-down . . . . . . . . . . . . . . . . . . 26  
Figure 17. Power-Up Timing ............................................... 27  
Figure 18. Power-Down and Voltage Drop ............................ 27  
Table 5. Power-Up Timing ................................................. 28  
Initial Delivery State . . . . . . . . . . . . . . . . . . . . . . . 28  
Maximum Rating . . . . . . . . . . . . . . . . . . . . . . . . . . 28  
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . 28  
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 28  
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 29  
Table 6. DC Characteristics ............................................... 29  
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . .30  
Figure 19. AC Measurements I/O Waveform ......................... 30  
Table 7. Test Specifications ............................................... 30  
Table 8. AC Characteristics ................................................ 31  
Figure 20. SPI Mode 0 (0,0) Input Timing............................. 32  
Figure 21. SPI Mode 0 (0,0) Output Timing .......................... 32  
Figure 22. HOLD# Timing .................................................. 33  
Figure 23. Write Protect Setup and Hold Timing during WRSR when  
SRWD=1 ......................................................................... 33  
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . . .34  
S08 wide—8-pin Plastic Small Outline 208mils Body Width  
Package ................................................................................................... 34  
8-Contact WSON (6mm x 5mm) Leadless Package .................35  
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . . 36  
Read Data Bytes (READ) ....................................................................18  
Figure 9. Read Data Bytes (READ) Instruction Sequence ........ 18  
Read Data Bytes at Higher Speed (FAST_READ) .......................18  
Figure 10. Read Data Bytes at Higher Speed  
(FAST_READ) Instruction Sequence..................................... 19  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
3
A d v a n c e I n f o r m a t i o n  
Block Diagram  
SRAM  
PS  
X
D
E
Array - L  
Array - R  
C
Logic  
RD  
DATA PATH  
IO  
4
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Connection Diagrams  
8-contact WSON Package  
8-pin Plastic Small Outline Package (SO)  
V
8
7
V
1
2
8
7
CS#  
SO  
1
2
CS#  
SO  
CC  
CC  
HOLD#  
HOLD#  
6
5
SCK  
SI  
3
4
SCK  
SI  
3
4
6
5
W#  
W#  
GND  
GND  
Input/Output Descriptions  
SCK  
SI  
SO  
CS#  
W#  
HOLD#  
=
=
=
=
=
=
=
=
Serial Clock Input  
Serial Data Input  
Serial Data Output  
Chip Select Input  
Write Protect Input  
Hold Input  
V
Supply Voltage Input  
Ground Input  
CC  
GND  
Logic Symbol  
V
CC  
SO  
SI  
SCK  
CS#  
W#  
HOLD#  
GND  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
5
A d v a n c e I n f o r m a t i o n  
Ordering Information  
The order number (Valid Combination) is formed by the following:  
S25FL  
004  
D
0L 01  
M
A
I
I
PACKING TYPE  
1
3
=
=
Tube (standard) (Note 1)  
13” Tape and Reel (Note 2)  
MODEL NUMBER (Additional Ordering Options)  
01  
= S0-8 Wide (208mil) Package  
TEMPERATURE RANGE  
I
=
Industrial (–40  
°
C to +85 C)  
°
PACKAGE MATERIALS  
A
F
=
=
Standard  
Lead (Pb) -free (Note 2)  
PACKAGE TYPE  
M
N
=
=
8 pin Plastic Small Outline Package  
WSON (Note 2)  
SPEED  
0L  
=
50 MHz  
DEVICE TECHNOLOGY  
D
= 0.25 µm process technology  
DENSITY  
004  
= 4 Mb  
DEVICE FAMILY  
S25FL  
SpansionTM Memory 3.0 Volt-only, Serial Peripheral Interface (SPI) Flash Memory  
S25FL Valid Combinations  
Base  
Ordering  
Part Number Option  
Speed  
Package &  
Temperature  
Model  
Number  
Packing  
Type  
Package Marking  
MAI, MFI, NFI  
1, 3  
FL004D + (Temp) + (Last Digit of Model Number)  
(Note 4)  
S25FL004D  
0L  
01  
(Note 1)  
Notes:  
1. Type 1 is standard. Specify other options as required.  
2. Contact your local sales office for availability.  
3. Package marking omits leading “S25” and speed, package, and leading digit of model number from ordering part  
number.  
4. If “Last Digit of Model Number” is 3, this signifies a S08-Wide body Lead (Pb)-free package. For example: FL004DI3.  
If “Last Digit of Model Number” is 1, this signifies a S08-Wide body standard package. For example: FL004DI1.  
Valid Combinations  
Valid Combination configuration planned to be supported for this device. Note: Ordering  
part number and package marking is pending final product introduction. Contact your sales  
representative for further information.  
6
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Signal Description  
Signal Data Output (SO): This output signal is used to transfer data serially out  
of the device. Data is shifted out on the falling edge of Serial Clock (SCK).  
Serial Data Input (SI): This input signal is used to transfer data serially into  
the device. It receives instructions, addresses, and the data to be programmed.  
Values are latched on the rising edge of Serial Clock (SCK).  
Serial Clock (SCK): This input signal provides the timing of the serial interface.  
Instructions, addresses, and data present at the Serial Data input (SI) are latched  
on the rising edge of Serial Clock (SCK). Data on Serial Data Output (SO) changes  
after the falling edge of Serial Clock (SCK).  
Chip Select (CS#): When this input signal is High, the device is deselected and  
Serial Data Output (SO) is at high impedance. Unless an internal Program, Erase  
or Write Status Register cycle is in progress, the device will be in Standby mode.  
Driving Chip Select (CS#) Low enables the device, placing it in the active power  
mode.  
After Power-up, a falling edge on Chip Select (CS#) is required prior to the start  
of any instruction.  
Hold (HOLD#): The Hold (HOLD#) signal is used to pause any serial communi-  
cations with the device without deselecting the device.  
During the Hold instruction, the Serial Data Output (SO) is high impedance, and  
Serial Data Input (SI) and Serial Clock (SCK) are Don’t Care.  
To start the Hold condition, the device must be selected, with Chip Select (CS#)  
driven Low.  
Write Protect (W#): The main purpose of this input signal is to freeze the size  
of the area of memory that is protected against program or erase instructions (as  
specified by the values in the BP1 and BP0 bits of the Status Register).  
SPI Modes  
These devices can be driven by a microcontroller with its SPI peripheral running  
in either of the two following modes:  
„
„
CPOL = 0, CPHA = 0  
CPOL = 1, CPHA = 1  
For these two modes, input data is latched in on the rising edge of Serial Clock  
(SCK), and output data is available from the falling edge of Serial Clock (SCK).  
The difference between the two modes, as shown in Figure 2, is the clock polarity  
when the bus master is in Standby and not transferring data:  
„
„
SCK remains at 0 for (CPOL = 0, CPHA = 0)  
SCK remains at 1 for (CPOL = 1, CPHA = 1)  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
7
A d v a n c e I n f o r m a t i o n  
SO  
SI  
SPI Interface with  
(CPOL, CPHA) =  
(0, 0) or (1, 1)  
SCK  
SCK SO SI  
SCK SO SI  
SCK SO SI  
Bus Master  
SPI Memory  
Device  
SPI Memory  
Device  
SPI Memory  
Device  
CS3 CS2 CS1  
CS#  
W# HOLD#  
CS#  
W# HOLD#  
CS#  
W# HOLD#  
Figure 1. Bus Master and Memory Devices on the SPI Bus  
Note: The Write Protect (W#) and Hold (HOLD#) signals should be driven, High or Low as appropriate.  
CS#  
CPOL CPHA  
SCK  
0
1
0
1
SCK  
SI  
MSB  
SO  
MSB  
Figure 2. SPI Modes Supported  
8
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Operating Features  
All data into and out of the device is shifted in 8-bit chunks.  
Page Programming  
To program one data byte, two instructions are required: Write Enable (WREN),  
which is one byte, and a Page Program (PP) sequence, which consists of four  
bytes plus data. This is followed by the internal Program cycle. To spread this  
overhead, the Page Program (PP) instruction allows up to 256 bytes to be pro-  
grammed at a time (changing bits from 1 to 0), provided that they lie in  
consecutive addresses on the same page of memory.  
Sector Erase, or Bulk Erase  
The Page Program (PP) instruction allows bits to be programmed from 1 to 0. Be-  
fore this can be applied, the bytes of the memory need to be first erased to all  
1’s (FFh) before any programming. This can be achieved in two ways: 1) a sector  
at a time using the Sector Erase (SE) instruction, or 2) throughout the entire  
memory, using the Bulk Erase (BE) instruction.  
Polling During a Write, Program, or Erase Cycle  
A further improvement in the time to Write Status Register (WRSR), Program (PP)  
or Erase (SE or BE) can be achieved by not waiting for the worst-case delay. The  
Write in Progress (WIP) bit is provided in the Status Register so that the applica-  
tion program can monitor its value, polling it to establish when the previous Write  
cycle, Program cycle, or Erase cycle is complete.  
Active Power and Standby Power Modes  
When Chip Select (CS#) is Low, the device is enabled, and in the Active Power  
mode. When Chip Select (CS#) is High, the device is disabled, but could remain  
in the Active Power mode until all internal cycles have completed (Program,  
Erase, Write Status Register). The device then goes into the Standby Power  
mode. The device consumption drops to I . This can be used as an extra Deep  
SB  
Power Down on mechanism, when the device is not in active use, to protect the  
device from inadvertent Write, Program, or Erase instructions.  
Status Register  
The Status Register contains a number of status and control bits, as shown in Fig-  
ure 7, that can be read or set (as appropriate) by specific instructions  
„ WIP bit: The Write In Progress (WIP) bit indicates whether the memory is  
busy with a Write Status Register, Program or Erase cycle.  
„ WEL bit: The Write Enable Latch (WEL) bit indicates the status of the internal  
Write Enable Latch.  
„ BP2, BP1, BP0 bits: The Block Protect (BP2, BP1, BP0) bits are non-volatile.  
They define the size of the area to be software protected against Program and  
Erase instructions.  
„ SRWD bit: The Status Register Write Disable (SRWD) bit is operated in con-  
junction with the Write Protect (W#) signal. The Status Register Write Disable  
(SRWD) bit and Write Protect (W#) signal allow the device to be put in the  
Hardware Protected mode. In this mode, the non-volatile bits of the Status  
Register (SRWD, BP2, BP1, BP0) become read-only bits.  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
9
A d v a n c e I n f o r m a t i o n  
Protection Modes  
The SPI memory device boasts the following data protection mechanisms:  
„
All instructions that modify data must be preceded by a Write Enable (WREN)  
instruction to set the Write Enable Latch (WEL) bit. This bit is returned to its  
reset state by the following events:  
— Power-up  
— Write Disable (WRDI) instruction completion  
— Write Status Register (WRSR) instruction completion  
— Page Program (PP) instruction completion  
— Sector Erase (SE) instruction completion  
— Bulk Erase (BE) instruction completion  
„
„
The Block Protect (BP2, BP1, BP0) bits allow part of the memory to be con-  
figured as read-only. This is the Software Protected Mode (SPM).  
The Write Protect (W#) signal works in cooperation with the Status Register  
Write Disable (SRWD) bit to enable write-protection. This is the Hardware  
Protected Mode (HPM).  
„
Program, Erase and Write Status Register instructions are checked to verify  
that they consist of a number of clock pulses that is a multiple of eight, before  
they are accepted for execution.  
Table 1. Protected Area Sizes (S25FL004D).  
Protected  
Memory  
Area  
(Top Level)  
Status Register Content  
Memory Content  
Unprotected Area  
BP2 Bit  
BP1 Bit  
BP0  
0
Protected Area  
none  
0
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
00000–7FFFF  
00000–6FFFF  
00000–5FFFF  
00000–3FFFF  
none  
1/8  
1/4  
1/2  
All  
1
70000–7FFFF  
60000–7FFFF  
40000–7FFFF  
00000-7FFFF  
00000-7FFFF  
00000-7FFFF  
00000-7FFFF  
0
1
0
All  
1
none  
All  
0
none  
All  
1
none  
Hold Condition Modes  
The Hold (HOLD#) signal is used to pause any serial communications with the  
device without resetting the clocking sequence. Hold (HOLD#) signal gates the  
clock input to the device. However, taking this signal Low does not terminate any  
Write Status Register, Program or Erase Cycle that is currently in progress.  
To enter the Hold condition, the device must be selected, with Chip Select (CS#)  
Low. The Hold condition starts on the falling edge of the Hold (HOLD#) signal,  
provided that this coincides with Serial Clock (SCK) being Low (as shown in Figure  
3).  
The Hold condition ends on the rising edge of the Hold (HOLD#) signal, provided  
that this coincides with Serial Clock (SCK) being Low.  
10  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
If the falling edge does not coincide with Serial Clock (SCK) being Low, the Hold  
condition starts after Serial Clock (SCK) next goes Low. Similarly, if the rising  
edge does not coincide with Serial Clock (SCK) being Low, the Hold condition ends  
after Serial Clock (SCK) next goes Low (Figure 3). During the Hold condition, the  
Serial Data Output (SO) is high impedance, and Serial Data Input (SI) and Serial  
Clock (SCK) are Don’t Care.  
Normally, the device remains selected, with Chip Select (CS#) driven Low, for the  
entire duration of the Hold condition. This ensures that the state of the internal  
logic remains unchanged from the moment of entering the Hold condition.  
If Chip Select (CS#) goes High while the device is in the Hold condition, this has  
the effect of resetting the internal logic of the device. To restart communication  
with the device, it is necessary to drive Hold (HOLD#) High, and then to drive  
Chip Select (CS#) Low. This prevents the device from going back to the Hold  
condition.  
SCK  
HOLD#  
Hold  
Hold  
Condition  
Condition  
(standard use)  
(non-standard use)  
Figure 3. Hold Condition Activation  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
11  
A d v a n c e I n f o r m a t i o n  
Memory Organization  
The memory is organized as:  
„
„
S25FL004D: Eight sectors of 512 Kbit each  
Each page can be individually programmed (bits are programmed from 1 to  
0).  
„
The device is Sector or Bulk erasable (bits are erased from 0 to 1).  
Table 2. Sector Address Table – S25FL004D  
Sector  
SA7  
SA6  
SA5  
SA4  
SA3  
SA2  
SA1  
SA0  
Address Range  
70000h  
60000h  
50000h  
40000h  
30000h  
20000h  
10000h  
00000h  
7FFFFh  
6FFFFh  
5FFFFh  
4FFFFh  
3FFFFh  
2FFFFh  
1FFFFh  
0FFFFh  
12  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Instructions  
All instructions, addresses, and data are shifted in and out of the device, starting  
with the most significant bit. Serial Data Input (SI) is sampled on the first rising  
edge of Serial Clock (SCK) after Chip Select (CS#) is driven Low. Then, the one-  
byte instruction code must be shifted in to the device, most significant bit first,  
on Serial Data Input (SI), each bit being latched on the rising edges of Serial  
Clock (SCK). The instruction set is listed in Table 3.  
Every instruction sequence starts with a one-byte instruction code. Depending on  
the instruction, this might be followed by address bytes, or by data bytes, or by  
both or none. Chip Select (CS#) must be driven High after the last bit of the in-  
struction sequence has been shifted in.  
In the case of a Read Data Bytes (READ), Read Status Register (RDSR), Fast Read  
(FAST_READ) or Release from Deep Power Down and Read Electronic Signature  
(RES) instruction, the shifted-in instruction sequence is followed by a data-out  
sequence. Chip Select (CS#) can be driven High after any bit of the data-out se-  
quence is being shifted out to terminate the transaction.  
In the case of a Page Program (PP), Sector Erase (SE), Bulk Erase (BE), Write  
Status Register (WRSR), Write Enable (WREN), or Write Disable (WRDI) instruc-  
tion, Chip Select (CS#) must be driven High exactly at a byte boundary,  
otherwise the instruction is rejected, and is not executed. That is, Chip Select  
(CS#) must driven High when the number of clock pulses after Chip Select (CS#)  
being driven Low is an exact multiple of eight.  
All attempts to access the memory array during a Write Status Register cycle,  
Program cycle or Erase cycle are ignored, and the internal Write Status Register  
cycle, Program cycle or Erase cycle continues unaffected  
Table 3. Instruction Set.  
One-Byte Instruction  
Code  
Address  
Bytes  
Dummy  
Byte  
Instruction  
Description  
Data Bytes  
Status Register Operations  
06H (0000 0110)  
WREN  
WRDI  
RDSR  
WRSR  
Write Enable  
Write Disable  
0
0
0
0
0
0
0
0
0
04H (0000 0100)  
0
Read from Status Register  
Write to Status Register  
05H (0000 0101)  
1 to Infinity  
1
01H (0000 0001)  
Read Operations  
03H (0000 0011)  
READ  
Read Data Bytes  
3
3
0
1
1 to Infinity  
1 to Infinity  
FAST_READ  
Read Data Bytes at Higher Speed  
0BH (0000 1011)  
Erase Operations  
SE  
BE  
Sector Erase  
D8H (1101 1000)  
C7H (1100 0111)  
3
0
0
0
0
0
Bulk (Chip) Erase  
Program Operations  
02H (0000 0010)  
PP  
Page Program  
3
0
1 to 256  
Deep Power Down Savings Mode Operations  
DP  
Deep Power Down  
B9H (1011 1001)  
ABH (1010 1011)  
0
0
0
0
0
0
Release from Deep Power Down  
RES  
Release from Deep Power Down and  
Read Electronic Signature  
ABH (1010 1011)  
0
3
1 to Infinity  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
13  
A d v a n c e I n f o r m a t i o n  
Write Enable (WREN)  
The Write Enable (WREN) instruction (Figure 4) sets the Write Enable Latch (WEL)  
bit. The Write Enable Latch (WEL) bit must be set prior to every Page Program  
(PP), Erase (SE or BE) and Write Status Register (WRSR) instruction. The Write  
Enable (WREN) instruction is entered by driving Chip Select (CS#) Low, sending  
the instruction code, and then driving Chip Select (CS#) High.  
CS#  
6
5
7
0
1
2
3
4
SCK  
SI  
Instruction  
High Impedance  
SO  
Figure 4. Write Enable (WREN) Instruction Sequence  
Write Disable (WRDI)  
The Write Disable (WRDI) instruction (Figure 5) resets the Write Enable Latch  
(WEL) bit. The Write Disable (WRDI) instruction is entered by driving Chip Select  
(CS#) Low, sending the instruction code, and then driving Chip Select (CS#)  
High.  
The Write Enable Latch (WEL) bit is reset under the following conditions:  
„
„
„
„
„
„
Power-up  
Write Disable (WRDI) instruction completion  
Write Status Register (WRSR) instruction completion  
Page Program (PP) instruction completion  
Sector Erase (SE) instruction completion  
Bulk Erase (BE) instruction completion  
CS#  
0
3
4
7
6
1 2  
5
SCK  
SI  
Instruction  
High Impedance  
SO  
Figure 5. Write Disable (WRDI) Instruction Sequence  
14  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Read Status Register (RDSR)  
The Read Status Register (RDSR) instruction allows the Status Register to be  
read. The Status Register may be read at any time, even while a Program, Erase,  
or Write Status Register cycle is in progress. When one of these cycles is in  
progress, it is recommended to check the Write In Progress (WIP) bit before  
sending a new instruction to the device. It is also possible to read the Status Reg-  
ister continuously, as shown in Figure 6.  
CS#  
SCK  
7
0
2
3
4
5
6
9
11  
12 13 14  
15  
1
8
10  
Instruction  
SI  
Status Register Out  
Status Register Out  
High Impedance  
SO  
6
4
2
6
7
5
7
5
3
1
0
4
2
7
0
3
1
MSB  
MSB  
Figure 6. Read Status Register (RDSR) Instruction Sequence  
b7  
b0  
WEL  
SRWD  
0
0
BP2  
BP1  
BP0  
WIP  
Status Register  
Write Disable  
Block Protect Bits  
Write Enable Latch Bit  
Write In Progress Bit  
Figure 7. Status Register Format  
The status and control bits of the Status Register are as follows:  
SRWD bit: The Status Register Write Disable (SRWD) bit is operated in conjunc-  
tion with the Write Protect (W#) signal. The Status Register Write Disable  
(SRWD) bit and Write Protect (W#) signal allow the device to be put in the Hard-  
ware Protected mode (when the Status Register Write Disable (SRWD) bit is set  
to 1, and Write Protect (W#) is driven Low). In this mode, the non-volatile bits  
of the Status Register (SRWD, BP2, BP1, BP0) become read-only bits and the  
Write Status Register (WRSR) instruction is no longer accepted for execution.  
BP2, BP1, BP0 bits: The Block Protect (BP2, BP1, BP0) bits are non-volatile.  
They define the size of the area to be software protected against Program and  
Erase instructions. These bits are written with the Write Status Register (WRSR)  
instruction. When one or both of the Block Protect (BP2, BP1, BP0) bits is set to  
1, the relevant memory area (as defined in Table 1) becomes protected against  
Page Program (PP), and Sector Erase (SE) instructions. The Block Protect (BP2,  
BP1, BP0) bits can be written provided that the Hardware Protected mode has not  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
15  
A d v a n c e I n f o r m a t i o n  
been set. The Bulk Erase (BE) instruction is executed if, and only if, all Block Pro-  
tect (BP2, BP1, BP0) bits are 0.  
WEL bit: The Write Enable Latch (WEL) bit indicates the status of the internal  
Write Enable Latch. When set to 1, the internal Write Enable Latch is set; when  
set to 0, the internal Write Enable Latch is reset and no Write Status Register, Pro-  
gram or Erase instruction is accepted.  
WIP bit: The Write In Progress (WIP) bit indicates whether the memory is busy  
with a Write Status Register, Program or Erase cycle. This bit is a read only bit  
and is read by executing a RDSR instruction. If this bit is 1, such a cycle is in  
progress, if it is 0, no such cycle is in progress.  
Write Status Register (WRSR)  
The Write Status Register (WRSR) instruction allows new values to be written to  
the Status Register. Before it can be accepted, a Write Enable (WREN) instruction  
must previously have been executed. After the Write Enable (WREN) instruction  
has been decoded and executed, the device sets the Write Enable Latch (WEL).  
The Write Status Register (WRSR) instruction is entered by driving Chip Select  
(CS#) Low, followed by the instruction code and the data byte on Serial Data  
Input (SI).  
The instruction sequence is shown in Figure 8.  
The Write Status Register (WRSR) instruction has no effect on bits b6, b5, b1 and  
b0 of the Status Register. Bits b6, b5 are always read as 0.  
Chip Select (CS#) must be driven High after the eighth bit of the data byte has  
been latched in. If not, the Write Status Register (WRSR) instruction is not exe-  
cuted. As soon as Chip Select (CS#) is driven High, the self-timed Write Status  
Register cycle (whose duration is t ) is initiated. While the Write Status Register  
W
cycle is in progress, the Status Register may still be read to check the value of  
the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the  
self-timed Write Status Register cycle, and is 0 when it is completed. At some un-  
specified time before the cycle is completed, the Write Enable Latch (WEL) is  
reset.  
The Write Status Register (WRSR) instruction allows the user to change the val-  
ues of the Block Protect (BP2, BP1, BP0) bits, to define the size of the area that  
is to be treated as read-only, as defined in Table 1. The Write Status Register  
(WRSR) instruction also allows the user to set or reset the Status Register Write  
Disable (SRWD) bit in accordance with the Write Protect (W#) signal. The Status  
Register Write Disable (SRWD) bit and Write Protect (W#) signal allow the device  
to be put in the Hardware Protected Mode (HPM). The Write Status Register  
(WRSR) instruction cannot be executed once the Hardware Protected Mode (HPM)  
is entered.  
16  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
CS#  
8
9
10  
12 13 14 15  
11  
4 6  
5
7
0
1
2
3
SCK  
Status  
Register In  
Instruction  
SI  
MSB  
High Impedance  
SO  
Figure 8. Write Status Register (WRSR) Instruction Sequence  
Table 4. Protection Modes  
Write Protection of the Status  
Register  
Protected Area  
(Note 1)  
Unprotected Area  
(Note 1)  
W# Signal SRWD Bit  
Mode  
1
1
1
0
Status Register is Writeable (if the  
WREN instruction has set the WEL ProtectedagainstPage Ready to accept Page  
Protected bit)  
Software  
Program and Erase  
(SE, BE)  
Program and Sector  
Erase Instructions  
(SPM)  
The values in the SRWD, BP2, BP1  
and BP0 bits can be changed  
0
0
Status Register is Hardware write  
protected  
The values in the SRWD, BP2, BP1  
and BP0 bits cannot be changed  
Hardware  
Protected  
(HPM)  
ProtectedagainstPage Ready to accept Page  
0
1
Program and Erase  
(SE, BE)  
Program and Sector  
Erase Instructions  
5. As defined by the values in the Block Protect (BP2, BP1, BP0) bits of the Status Register, as shown in Table 1.  
The protection features of the device are summarized in Table 4.  
When the Status Register Write Disable (SRWD) bit of the Status Register is 0 (its  
initial delivery state), it is possible to write to the Status Register provided that  
the Write Enable Latch (WEL) bit has previously been set by a Write Enable  
(WREN) instruction, regardless of the whether Write Protect (W#) is driven High  
or Low.  
When the Status Register Write Disable (SRWD) bit of the Status Register is set  
to 1, two cases need to be considered, depending on the state of Write Protect  
(W#):  
„
If Write Protect (W#) is driven High, it is possible to write to the Status Reg-  
ister provided that the Write Enable Latch (WEL) bit has previously been set  
by a Write Enable (WREN) instruction.  
„
If Write Protect (W#) is driven Low, it is not possible to write to the Status  
Register even if the Write Enable Latch (WEL) bit has previously been set by  
a Write Enable (WREN) instruction. (Attempts to write to the Status Register  
are rejected, and are not accepted for execution). As a consequence, all the  
data bytes in the memory area that are software protected (SPM) by the  
Block Protect (BP2, BP1, BP0) bits of the Status Register, are also hardware  
protected against data modification.  
Regardless of the order of the two events, the Hardware Protected Mode (HPM)  
can be entered:  
„
by setting the Status Register Write Disable (SRWD) bit after driving Write  
Protect (W#) Low  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
17  
A d v a n c e I n f o r m a t i o n  
„
or by driving Write Protect (W#) Low after setting the Status Register Write  
Disable (SRWD) bit.  
The only way to exit the Hardware Protected Mode (HPM) once entered is to pull  
Write Protect (W#) High.  
If Write Protect (W#) is permanently tied High, the Hardware Protected Mode  
(HPM) can never be activated, and only the Software Protected Mode (SPM),  
using the Block Protect (BP2, BP1, BP0) bits of the Status Register, can be used.  
Read Data Bytes (READ)  
The READ instruction reads the memory at the specified SCK frequency (f  
)
SCK  
with a maximum speed of 33 MHz.  
The device is first selected by driving Chip Select (CS#) Low. The instruction code  
for the Read Data Bytes (READ) instruction is followed by a 3-byte address (A23-  
A0), each bit being latched-in during the rising edge of Serial Clock (SCK). Then  
the memory contents, at that address, are shifted out on Serial Data Output  
(SO), each bit being shifted out, at a frequency f  
Serial Clock (SCK).  
, during the falling edge of  
SCK  
The instruction sequence is shown in Figure 9. The first byte addressed can be at  
any location. The address is automatically incremented to the next higher ad-  
dress after each byte of data is shifted out. The whole memory can, therefore, be  
read with a single Read Data Bytes (READ) instruction. When the highest address  
is reached, the address counter rolls over to 00000h, allowing the read sequence  
to be continued indefinitely.  
The Read Data Bytes (READ) instruction is terminated by driving Chip Select  
(CS#) High. Chip Select (CS#) can be driven High at any time during data output.  
Any Read Data Bytes (READ) instruction, while a Program, Erase, or Write cycle  
is in progress, is rejected without having any effect on the cycle that is in  
progress.  
CS#  
0
1
2
3
4
5
6
7
8
9
10  
28 23 30 31 32 33 34 35 36 37 38 39  
SCK  
Instruction  
24-Bit Address  
2
0
1
22  
23  
21  
3
SI  
MSB  
Data Out 1  
Data Out 2  
High Impedance  
SO  
6
4
2
7
0
7
5
3
1
MSB  
Figure 9. Read Data Bytes (READ) Instruction Sequence  
Read Data Bytes at Higher Speed (FAST_READ)  
The FAST_READ instruction reads the memory at the specified SCK frequency  
(f ) with a maximum speed of 50 MHz. The device is first selected by driving  
SCK  
Chip Select (CS#) Low. The instruction code for (FAST_READ) instruction is fol-  
lowed by a 3-byte address (A23-A0) and a dummy byte, each bit being latched-  
in during the rising edge of Serial Clock (SCK). Then the memory contents, at that  
18  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
address, are shifted out on Serial Data Output (SO), each bit being shifted out,  
at a maximum frequency F  
, during the falling edge of Serial Clock (SCK).  
SCK  
The instruction sequence is shown in Figure 10. The first byte addressed can be  
at any location. The address is automatically incremented to the next higher ad-  
dress after each byte of data is shifted out. The whole memory can, therefore, be  
read with a single (FAST_READ) instruction. When the highest address is  
reached, the address counter rolls over to 00000h, allowing the read sequence to  
be continued indefinitely.  
The (FAST_READ) instruction is terminated by driving Chip Select (CS#) High.  
Chip Select (CS#) can be driven High at any time during data output. Any  
(FAST_READ) instruction, while an Erase, Program or Write cycle is in progress,  
is rejected without having any effects on the cycle that is in progress.  
CS#  
SCK  
33  
0
1
2
5
6
7
8
9
29 30  
32  
38 39 40 41  
44 45 46  
31  
34 35 36 37  
Dummy Byte  
3
4
10  
28  
42 43  
47  
24-Bit  
Address  
Instruction  
23  
3
2
22 21  
1
0
6
5
4
2
0
1
7
3
SI  
DATA OUT 1  
DATA OUT 2  
High Impedance  
3
7
6
4
2
1
0
5
7
SO  
MSB  
MSB  
Figure 10. Read Data Bytes at Higher Speed (FAST_READ) Instruction Sequence  
Page Program (PP)  
The Page Program (PP) instruction allows bytes to be programmed in the memory  
(changing bits from 1 to 0). Before it can be accepted, a Write Enable (WREN)  
instruction must previously have been executed. After the Write Enable (WREN)  
instruction has been decoded, the device sets the Write Enable Latch (WEL).  
The Page Program (PP) instruction is entered by driving Chip Select (CS#) Low,  
followed by the instruction code, three address bytes and at least one data byte  
on Serial Data Input (SI). Chip Select (CS#) must be driven Low for the entire  
duration of the sequence.  
The instruction sequence is shown in Figure 11.  
If more than 256 bytes are sent to the device, the addressing will wrap to the  
beginning of the same page, previously latched data are discarded and the last  
256 data bytes are guaranteed to be programmed correctly within the same  
page. If fewer than 256 Data bytes are sent to device, they are correctly pro-  
grammed at the requested addresses without having any effects on the other  
bytes of the same page.  
Chip Select (CS#) must be driven High after the eighth bit of the last data byte  
has been latched in, otherwise the Page Program (PP) instruction is not executed.  
As soon as Chip Select (CS#) is driven High, the self-timed Page Program cycle  
(whose duration is t ) is initiated. While the Page Program cycle is in progress,  
PP  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
19  
A d v a n c e I n f o r m a t i o n  
the Status Register may be read to check the value of the Write In Progress (WIP)  
bit. The Write In Progress (WIP) bit is 1 during the self-timed Page Program cycle,  
and is 0 when it is completed. At some unspecified time before the cycle is com-  
pleted, the Write Enable Latch (WEL) bit is reset.  
A Page Program (PP) instruction applied to a page that is protected by the Block  
Protect (BP2, BP1, BP0) bits (see Table 1) is not executed.  
CS#  
SCK  
5
8
9
34  
3738 39  
3536  
0
2
4
6
7
10  
28 32 33  
293031  
1
3
24-Bit Address  
Data Byte 1  
Instruction  
4
3
2
22 21  
3
2
1
0
7
6
5
1
0
23  
SI  
MSB  
MSB  
CS#  
SCK  
5354 55  
52  
46  
4950 51  
40  
44 45  
4748  
414243  
Data Byte 2  
Data Byte 3  
Data Byte 256  
0
7
6
0
7
7
6
5
4
3
2
1
0
6
5
4
3
2
1
5
4
3
2
1
SI  
MSB  
MSB  
MSB  
Figure 11. Page Program (PP) Instruction Sequence  
Sector Erase (SE)  
The Sector Erase (SE) instruction sets to 1 (FFh) all bits inside the chosen sector.  
Before it can be accepted, a Write Enable (WREN) instruction must previously  
have been executed. After the Write Enable (WREN) instruction has been de-  
coded, the device sets the Write Enable Latch (WEL).  
The Sector Erase (SE) instruction is entered by driving Chip Select (CS#) Low,  
followed by the instruction code, and three address bytes on Serial Data Input  
(SI). Any address inside the Sector (see Table 1) is a valid address for the Sector  
Erase (SE) instruction. Chip Select (CS#) must be driven Low for the entire du-  
ration of the sequence.  
The instruction sequence is shown in Figure 12.  
Chip Select (CS#) must be driven High after the eighth bit of the last address byte  
has been latched in, otherwise the Sector Erase (SE) instruction is not executed.  
As soon as Chip Select (CS#) is driven High, the self-timed Sector Erase cycle  
(whose duration is tSE) is initiated. While the Sector Erase cycle is in progress,  
the Status Register may be read to check the value of the Write In Progress (WIP)  
bit. The Write In Progress (WIP) bit is 1 during the self-timed Sector Erase cycle,  
20  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
and is 0 when it is completed. At some unspecified time before the cycle is com-  
pleted, the Write Enable Latch (WEL) bit is reset.  
A Sector Erase (SE) instruction applied to any memory area that is protected by  
the Block Protect (BP2, BP1, BP0) bits (see Table 1) is not executed.  
CS#  
SCK  
0
1
2
3
4
5
6
7
8
9
10  
28 29 30 31  
Instruction  
24 Bit Address  
1
SI  
23 22 21  
MSB  
Figure 12. Sector Erase (SE) Instruction Sequence  
3
2
0
Bulk Erase (BE)  
The Bulk Erase (BE) instruction sets to 1 (FFh) all bits inside the entire memory.  
Before it can be accepted, a Write Enable (WREN) instruction must previously  
have been executed. After the Write Enable (WREN) instruction has been de-  
coded, the device sets the Write Enable Latch (WEL).  
The Bulk Erase (BE) instruction is entered by driving Chip Select (CS#) Low, fol-  
lowed by the instruction code, on Serial Data Input (SI). No address is required  
for the Bulk Erase (BE) instruction. Chip Select (CS#) must be driven Low for the  
entire duration of the sequence.  
The instruction sequence is shown in Figure 13.  
Chip Select (CS#) must be driven High after the eighth bit of the last address byte  
has been latched in, otherwise the Bulk Erase (BE) instruction is not executed.  
As soon as Chip Select (CS#) is driven High, the self-timed Bulk Erase cycle  
(whose duration is t ) is initiated. While the Bulk Erase cycle is in progress, the  
BE  
Status Register may be read to check the value of the Write In Progress (WIP)  
bit. The Write In Progress (WIP) bit is 1 during the self-timed Bulk Erase cycle,  
and is 0 when it is completed. At some unspecified time before the cycle is com-  
pleted, the Write Enable Latch (WEL) bit is reset.  
A Bulk Erase (BE) instruction is executed only if all the Block Protect (BP2, BP1,  
BP0) bits (see Table 1) are set to 0. The Bulk Erase (BE) instruction is ignored if  
one or more sectors are protected.  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
21  
A d v a n c e I n f o r m a t i o n  
CS#  
SCK  
SI  
0
1
2
3
4
5
6
7
Instruction  
Figure 13. Bulk Erase (BE) Instruction Sequence  
Deep Power Down (DP)  
The Deep Power Down (DP) instruction puts the device in the lowest current  
mode of 1 µA typical.  
It is recommended that the standard Standby mode be used for the lowest power  
current draw, as well as the Deep Power Down (DP) as an extra software protec-  
tion mechanism when this device is not in active use. In this mode, the device  
ignores all Write, Program and Erase instructions. Chip Select (CS#) must be  
driven Low for the entire duration of the sequence.  
The Deep Power Down (DP) instruction is entered by driving Chip Select (CS#)  
Low, followed by the instruction code on Serial Data Input (SI). Chip Select (CS#)  
must be driven Low for the entire duration of the sequence.  
The instruction sequence is shown in Figure 14.  
Driving Chip Select (CS#) High after the eighth bit of the instruction code has  
been latched puts the device in Deep Power Down mode. The Deep Power Down  
mode can only be entered by executing the Deep Power Down (DP) instruction to  
reduce the standby current (from I to I as specified in Table 6). As soon as  
SB  
DP  
Chip Select (CS#) is driven high, it requires a delay of t currently in progress  
DP  
before Deep Power Down mode is entered.  
Once the device has entered the Deep Power Down mode, all instructions are ig-  
nored except the Release from Deep Power Down (RES) and Read Electronic  
Signature. This releases the device from the Deep Power Down mode. The Re-  
lease from Deep Power Down and Read Electronic Signature (RES) instruction  
also allows the Electronic Signature of the device to be output on Serial Data Out-  
put (SO).  
The Deep Power Down mode automatically stops at Power-down, and the device  
always powers up in the Standby mode.  
Any Deep Power Down (DP) instruction, while an Erase, Program or WRSR cycle  
is in progress, is rejected without having any effect on the cycle in progress.  
22  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
CS#  
t
DP  
0
1
2
3
4
5
6
7
SCK  
SI  
Instruction  
Standby Mode  
Deep Power Down Mode  
Figure 14. Deep Power Down (DP) Instruction Sequence  
Release from Deep Power Down (RES)  
The Release from Deep Power Down (RES) instruction provides the only way to  
exit the Deep Power Down mode. Once the device has entered the Deep Power  
Down mode, all instructions are ignored except the Release from Deep Power  
Down (RES) instruction. Executing this instruction takes the device out of Deep  
Power Down mode.  
The Release from Deep Power Down (RES) instruction is entered by driving Chip  
Select (CS#) Low, followed by the instruction code on Serial Data Input (SI). Chip  
Select (CS#) must be driven Low for the entire duration of the sequence.  
The instruction sequence is shown in Figure 15.  
Driving Chip Select (CS#) High after the 8-bit instruction byte has been received  
by the device, but before the whole of the 8-bit Electronic Signature has been  
transmitted for the first time, still insures that the device is put into Standby  
mode. If the device was previously in the Deep Power Down mode, though, the  
transition to the Stand-by Power mode is delayed by t  
, and Chip Select (CS#)  
RES  
must remain High for at least t  
, as specified in Table 8. Once in the Stand-  
RES(max)  
by Power mode, the device waits to be selected, so that it can receive, decode  
and execute instructions.  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
23  
A d v a n c e I n f o r m a t i o n  
CS#  
SCK  
7
0
2
3
5
1
4
6
t
RES  
Instruction  
SI  
Standby Mode  
Deep Power Down Mode  
Figure 15. Release from Deep Power Down Instruction Sequence  
Release from Deep Power Down and Read Electronic Signature (RES)  
Once the device has entered Deep Power Down mode, all instructions are ignored  
except the RES instruction. The RES instruction can also be used to read the 8-  
bit Electronic Signature of the device on the SO pin. The RES instruction always  
provides access to the Electronic Signature of the device (except while an Erase,  
Program or WRSR cycle is in progress), and can be applied even if DP mode has  
not been entered. Any RES instruction executed while an Erase, Program or  
WRSR cycle is in progress is not decoded, and has no effect on the cycle in  
progress.  
The device features an 8-bit Electronic Signature, whose value for the S25FL004D  
is 12h. This can be read using RES instruction.  
The device is first selected by driving Chip Select (CS#) Low. The instruction code  
is followed by 3 dummy bytes, each bit being latched-in on Serial Data Input (SI)  
during the rising edge of Serial Clock (SCK). Then, the 8-bit Electronic Signature,  
stored in the memory, is shifted out on Serial Data Output (SO), each bit being  
shifted out during the falling edge of Serial Clock (SCK).  
The instruction sequence is shown in Figure 16.  
The Release from Deep Power Down and Read Electronic Signature (RES) is ter-  
minated by driving Chip Select (CS#) High after the Electronic Signature has  
been read at least once. Sending additional clock cycles on Serial Clock (SCK),  
while Chip Select (CS#) is driven Low, causes the Electronic Signature to be out-  
put repeatedly.  
When Chip Select is driven High, the device is put in the Stand-by Power mode.  
If the device was not previously in the Deep Power Down mode, the transition to  
the Stand-by Power mode is immediate. If the device was previously in the Deep  
Power Down mode, though, the transition to the Standby mode is delayed by  
t
, and Chip Select (CS#) must remain High for at lease t  
, as specified  
RES  
RES(max)  
in Table 8. Once in the Stand-by Power mode, the device waits to be selected, so  
that it can receive, decode and execute instructions.  
24  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
CS#  
SCK  
2
28 29 30  
31 32 33 34  
1
8
36 37  
35 38  
9
0
3
4
5
6
7
10  
t
3 Dummy  
Bytes  
RES  
Instruction  
SI  
3
1
0
2
23 22  
21  
Electronic ID  
High Impedance  
7
6
5
4
3
2
1
SO  
0
MSB  
Standby Mode  
Deep Power Down Mode  
Figure 16. Release from Deep Power Down and Read Electronic Signature (RES) Instruction Sequence  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
25  
A d v a n c e I n f o r m a t i o n  
Power-up and Power-down  
The device must not be selected at power-up or power-down (that is, CS# must  
follow the voltage applied on V ) until V reaches the correct value as follows:  
CC  
CC  
„
V
(min) at power-up, and then for a further delay of t (as described in  
CC PU  
Table 5)  
„
V
at power-down  
SS  
A simple pull-up resistor on Chip Select (CS#) can usually be used to insure safe  
and proper power-up and power-down.  
The device ignores all instructions until a time delay of t (as described in Table  
PU  
5) has elapsed after the moment that V rises above the minimum V thresh-  
CC  
CC  
old. However, correct operation of the device is not guaranteed if by this time V  
CC  
is still below V  
(min). No Write Status Register, Program or Erase instructions  
CC  
should be sent until t after V reaches the minimum V threshold (See Figure  
PU  
CC  
CC  
17).  
At power-up, the device is in Standby mode (not Deep Power Down mode) and  
the WEL bit is reset.  
During Power-down or voltage drops, the power down must drop below the V  
CC  
(low) for a period of minimum t for the device to initialize correctly on power  
PD  
up. (See Figure 18).  
Normal precautions must be taken for supply rail decoupling to stabilize the V  
CC  
feed. Each device in a system should have the V rail decoupled by a suitable  
CC  
capacitor close to the package pins (this capacitor is generally of the order of 0.1  
µF).  
At power-down, when V drops from the operating voltage to below the mini-  
CC  
mum V threshold, all operations are disabled and the device does not respond  
CC  
to any instructions. (The designer needs to be aware that if a power-down occurs  
while a Write, Program or Erase cycle is in progress, data corruption can result.)  
26  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Vcc  
Vcc(max)  
Vcc(min)  
tPU  
Full Device Access  
time  
Figure 17. Power-Up Timing  
V
CC  
V
CC  
(max)  
No Device Access Allowed  
V
(min)  
CC  
t
Device Access Allowed  
PU  
V
CC  
(low)  
t
PD  
Time  
Figure 18. Power-Down and Voltage Drop  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
27  
A d v a n c e I n f o r m a t i o n  
Table 5. Power-Up Timing  
Symbol  
Parameter  
(minimum)  
Min  
Max  
Unit  
V
V
V
V
V
V
2.7  
CC(min)  
CC  
CC  
CC  
CC  
V
(low)  
V
CC(low)  
t
(min) to device operation  
(low) duration  
2
ms  
ns  
PU  
PD  
t
Initial Delivery State  
The device is delivered with all bits set to 1 (each byte contains FFh). The Status  
Register contains 00h (all Status Register bits are 0).  
Maximum Rating  
Stressing the device above the rating listed in the Absolute Maximum Ratings  
section below may cause permanent damage to the device. These are stress rat-  
ings only and operation of the device at these or any other conditions above those  
indicated in the Operating sections of this specification is not implied. Exposure  
to Absolute Maximum Rating conditions for extended periods may affect device  
reliability  
Absolute Maximum Ratings  
Ambient Storage Temperature . . . . . . . . . . . . . . . . . . . . . –65°C to +150°C  
Voltage with Respect to Ground:  
All Inputs and I/Os. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.3 V to 4.5 V  
Operating Ranges  
Ambient Operating Temperature (T )  
A
Commercial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C  
Industrial . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C  
Positive Power Supply  
Voltage Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2.7 V to 3.6 V  
Operating ranges define those limits between which functionality of the device is guaranteed.  
28  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
DC Characteristics  
This section summarizes the DC and AC Characteristics of the device. Designers  
should check that the operating conditions in their circuit match the measure-  
ment conditions specified in the Test Specifications in Table 7, when relying on  
the quoted parameters.  
CMOS Compatible  
Table 6. DC Characteristics  
Parameter Description  
Test Conditions  
Min  
Typ.  
Max  
Unit  
V
Supply Voltage  
2.7  
3
3.6  
V
CC  
SCK = 0.1 V /0.9V  
33 MHz  
CC  
CC  
mA  
I
Active Read Current  
CC1  
V
= 3.0V  
50 MHz  
CC  
SCK = 0.1 V /0.9V  
9
12  
CC  
CC  
I
I
I
I
Active Page Program Current  
Active WRSR Current  
CS# = V  
CS# = V  
CS# = V  
CS# = V  
23  
23  
23  
23  
mA  
mA  
mA  
mA  
CC2  
CC3  
CC4  
CC5  
CC  
CC  
CC  
CC  
Active Sector Erase Current  
Active Bulk Erase Current  
V
= 3.0 V  
CC  
I
Standby Current  
50  
5
µA  
µA  
SB  
CS# = V  
CC  
V
= 3.0 V  
CC  
I
Deep Power Down Current  
1
DP  
CS# = V  
CC  
I
Input Leakage Current  
Output Leakage Current  
Input Low Voltage  
V
= GND to V  
= GND to V  
1
1
µA  
µA  
V
LI  
IN  
IN  
CC  
CC  
I
V
LO  
V
–0.3  
0.3 V  
CC  
IL  
IH  
V
Input High Voltage  
Output Low Voltage  
Output High Voltage  
0.7 V  
V
+ 0.5  
V
CC  
CC  
V
I
I
= 1.6 mA, V = V  
CC CC min  
0.4  
V
OL  
OH  
OL  
V
= –0.1 mA  
V
– 0.2  
V
OH  
CC  
Notes:Typical values are at TA = 25°C and 3.0 V.  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
29  
A d v a n c e I n f o r m a t i o n  
Test Conditions  
Input and Output  
Timing Reference levels  
Input Levels  
0.8 VCC  
0.7 VCC  
0.5 VCC  
0.3 VCC  
0.2 VCC  
Figure 19. AC Measurements I/O Waveform  
Table 7. Test Specifications  
Symbol  
Parameter  
Load Capacitance  
Min  
Max  
Unit  
pF  
C
30  
L
Input Rise and Fall Times  
Input Pulse Voltage  
5
ns  
0.2 V to 0.8 V  
V
CC  
CC  
Input and Output Timing  
Reference Voltages  
0.3 V to 0.7 V  
V
CC  
CC  
30  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
AC Characteristics  
Table 8. AC Characteristics  
Symbol  
Parameter  
Min  
Typ  
Max  
Unit  
F
SCK Clock Frequency READ instruction  
D.C.  
33  
MHz  
SCK  
SCK  
CRT  
SCK Clock Frequency for:  
FAST_READ, PP, SE, BE, DP, RES, WREN,  
WRDI, RDSR, WRSR  
F
D.C.  
50  
MHz  
t
Clock Rise Time (Slew Rate)  
Clock Fall Time (Slew Rate)  
SCK High Time  
0.1  
0.1  
9
V/ns  
V/ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
CFT  
t
WH  
t
SCK Low Time  
9
WL  
t
CS# High Time  
100  
5
CS  
t
(Note 3)  
(Note 3)  
(Note 3)  
(Note 3)  
CS# Setup Time  
CSS  
t
CS# HOLD Time  
5
CSH  
t
HOLD# Setup Time (relative to SCK)  
HOLD# Hold Time (relative to SCK)  
HOLD# Setup Time (relative to SCK)  
HOLD# Hold Time (relative to SCK)  
Output Valid  
5
HD  
t
5
CD  
t
t
5
HC  
CH  
5
t
9
V
t
Output Hold Time  
0
5
5
HO  
t
t
Data in Hold Time  
HD:DAT  
SU:DAT  
Data in Setup Time  
t
Input Rise Time  
5
5
9
9
9
R
t
Input Fall Time  
F
t
(Note 3)  
(Note 3)  
(Note 3)  
HOLD# to Output Low Z  
HOLD# to Output High Z  
Output Disable Time  
LZ  
t
HZ  
t
DIS  
t
(Note 3)  
(Note 3)  
Write Protect Setup Time  
Write Protect Hold Time  
Release DP Mode  
20  
WPS  
WPH  
t
100  
t
3
µ
s
s
RES  
t
CS# High to Deep Power Down Mode  
Write Status Register Time  
Page Programming Time  
Sector Erase Time  
3
µ
DP  
t
20 (Note 2)  
2 (Note 2)  
0.8 (Note 2)  
ns  
ms  
sec  
W
PP  
SE  
t
1.5 (Note 1)  
0.5 (Note 1)  
t
Bulk Erase Time  
t
4 (Note 1)  
7 (Note 2)  
sec  
BE  
Note:  
1. Typical program and erase times assume the following conditions: 25C, VCC = 3.0V; 10, 000 cycles; checkerboard  
data pattern  
2. Under worst-case conditions of 90C; VCC = 2.7V; 100,000 cycles  
3. Not 100% tested  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
31  
A d v a n c e I n f o r m a t i o n  
AC Characteristics  
tCS  
CS#  
tCSS  
tCSS  
tCSH  
tCSH  
SCK  
tCRT  
tSU:DAT  
tHD:DAT  
tCFT  
SI  
MSB IN  
LSB IN  
High Impedance  
SO  
Figure 20. SPI Mode 0 (0,0) Input Timing  
CS#  
tWH  
SCK  
SO  
tV  
tWL  
tV  
tDIS  
tHO  
tHO  
LSB OUT  
Figure 21. SPI Mode 0 (0,0) Output Timing  
32  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
AC Characteristics  
CS#  
tHC  
tHD  
tCH  
SCK  
tCD  
tHZ  
tLZ  
SO  
SI  
HOLD#  
Figure 22. HOLD# Timing  
W#  
tWPH  
tWPS  
CS#  
SCK  
SI  
High Impedance  
SO  
Figure 23. Write Protect Setup and Hold Timing during WRSR when SRWD=1  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
33  
A d v a n c e I n f o r m a t i o n  
Physical Dimensions  
S08 wide—8-pin Plastic Small Outline 208mils Body Width Package  
34  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004  
A d v a n c e I n f o r m a t i o n  
Physical Dimensions  
8-Contact WSON (6mm x 5mm) Leadless Package  
June 28, 2004 S25FL004D_00A0  
S25FL Family (Serial Peripheral Interface) S25FL004D  
35  
A d v a n c e I n f o r m a t i o n  
Revision Summary  
Revision A (June 28, 2004)  
Initial release.  
Trademarks and Notice  
The contents of this document are subject to change without notice. This document may contain information on a Spansion product under development by  
FASL LLC. FASL LLC reserves the right to change or discontinue work on any product without notice. The information in this document is provided as is  
without warranty or guarantee of any kind as to its accuracy, completeness, operability, fitness for particular purpose, merchantability, non-infringement of  
third-party rights, or any other warranty, express, implied, or statutory. FASL LLC assumes no liability for any damages of any kind arising out of the use of  
the information in this document.  
Copyright © 2004 FASL LLC. All rights reserved.  
Spansion, the Spansion logo, MirrorBit, combinations thereof, and ExpressFlash are trademarks of FASL LLC. Other company and product names used in this  
publication are for identification purposes only and may be trademarks of their respective companies.  
36  
S25FL Family (Serial Peripheral Interface) S25FL004D  
S25FL004D_00A0 June 28, 2004