X7R Dielectric  
					Specifications and Test Methods  
					Parameter/Test  
					Operating Temperature Range  
					Capacitance  
					X7R Specification Limits  
					Measuring Conditions  
					Temperature Cycle Chamber  
					-55ºC to +125ºC  
					Within specified tolerance  
					Freq.: 1.0 kHz ± 10%  
					Voltage: 1.0Vrms ± .2V  
					For Cap > 10µF, 0.5Vrm @ 120Hz  
					≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating  
					≤ 12.5% for 25V and 16V DC rating  
					≤ 12.5% for ≤ 10V DC rating  
					Dissipation Factor  
					Contact Factory for DF by PN  
					100,000MΩ or 1000MΩ - µF,  
					whichever is less  
					Charge device with rated voltage for  
					120 ± 5 secs @ room temp/humidity  
					Insulation Resistance  
					Charge device with 250% of rated voltage for 1-5 seconds, w/  
					charge and discharge current limited to 50 mA (max)  
					Note: Charge device with 150% of rated voltage for 500V devices.  
					Dielectric Strength  
					No breakdown or visual defects  
					Appearance  
					Capacitance  
					Variation  
					No defects  
					≤ ±12%  
					Resistance to  
					Flexure  
					Stresses  
					Deflection: 2mm  
					Test Time: 30 seconds  
					Dissipation  
					Meets Initial Values (As Above)  
					≥ Initial Value x 0.3  
					Factor  
					Insulation  
					Resistance  
					≥ 95% of each terminal should be covered with  
					fresh solder  
					Dip device in eutectic solder at 230 ± 5ºC  
					for 5.0 ± 0.5 seconds  
					Solderability  
					Appearance  
					Capacitance  
					Variation  
					No defects, <25% leaching of either end terminal  
					≤ ±7.5%  
					Dissipation  
					Dip device in eutectic solder at 260ºC for 60 seconds. Store at  
					room temperature for 24 ± 2hours before measuring electrical  
					properties.  
					Meets Initial Values (As Above)  
					Meets Initial Values (As Above)  
					Meets Initial Values (As Above)  
					Resistance to  
					Solder Heat  
					Factor  
					Insulation  
					Resistance  
					Dielectric  
					Strength  
					Appearance  
					Capacitance  
					Variation  
					No visual defects  
					≤ ±7.5%  
					Step 1: -55ºC ± 2º  
					30 ± 3 minutes  
					≤ 3 minutes  
					Step 2: Room Temp  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					Meets Initial Values (As Above)  
					Meets Initial Values (As Above)  
					Step 3: +125ºC ± 2º  
					30 ± 3 minutes  
					Thermal Shock  
					Step 4: Room Temp  
					≤ 3 minutes  
					Dielectric  
					Repeat for 5 cycles and measure after 24 ± 2 hours at room  
					temperature  
					Pre-treatment: After mounting, perform heat treatment 150+0/-  
					10C for 2 hour, then stabilise for 24+/-2 hour at room temp,  
					then measure.  
					Meets Initial Values (As Above)  
					No visual defects  
					Strength  
					Appearance  
					Capacitance  
					Variation  
					≤ ±12.5%  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					≤ Initial Value x 2.0 (See Above)  
					≥ Initial Value x 0.3 (See Above)  
					Charge device with ≥ rated voltage in test chamber set at  
					125ºC ± 2ºC for 1000 hours (+48, -0).  
					Load Life  
					Pre-treatment: After remove from test chamber, perform heat  
					treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour  
					at room temp, then measure.  
					Dielectric  
					Strength  
					Meets Initial Values (As Above)  
					Contact AVX for datasheet of specific parts.  
					Appearance  
					Capacitance  
					Variation  
					No visual defects  
					≤ ±12.5%  
					Pre-treatment: After mounting, perform heat treatment 150+0/-  
					10C for 2 hour, then stabilise for 24+/-2 hour at room temp,  
					then measure.  
					Dissipation  
					Factor  
					Insulation  
					Resistance  
					Dielectric  
					Strength  
					≤ Initial Value x 2.0 (See Above)  
					≥ Initial Value x 0.3 (See Above)  
					Load  
					Humidity  
					Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative  
					humidity for 1000 hours (+48, -0) with rated voltage applied.  
					Pre-treatment: After remove from test chamber, perform heat  
					treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour  
					at room temp, then measure.  
					Meets Initial Values (As Above)  
					The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or  
					available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.  
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