C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
NP0 Specification Limits
Measuring Conditions
ꢂemperature Cycle Chamber
ꢃreq.: 1.0 MHz ± 10ꢁ for cap ꢆ 1000 pꢃ
1.0 kHz ± 10ꢁ for cap ꢇ 1000 pꢃ
Voltage: 1.0Vrms ± .2V
-55ºC to +125ºC
Within specified tolerance
ꢄ±0 pꢃ: Qꢅ 400+20 x Cap Value
ꢅ±0 pꢃ: Qꢅ 1000
Q
100,000MΩ or 1000MΩ - μꢃ,
whichever is less
Charge device with rated voltage for
60 ± 5 secs ꢈ room tempꢀhumidity
Charge device with ±00ꢁ of rated voltage for
1-5 seconds, wꢀcharge and discharge current
limited to 50 mA (max)
Insulation Resistance
Dielectric Strength
No breakdown or visual defects
Note: Charge device with 150ꢁ of rated
voltage for 500V devices.
Appearance
Capacitance
Variation
No defects
Deflection: 2mm
ꢂest ꢂime: ±0 seconds
±5ꢁ or ±.5 pꢃ, whichever is greater
Resistance to
Flexure
1mm/sec
Q
Meets Initial Values (As Above)
ꢅ Initial Value x 0.±
Stresses
Insulation
Resistance
90 mm
ꢅ 95ꢁ of each terminal should be covered
with fresh solder
No defects, ꢄ25ꢁ leaching of either end terminal
Dip device in eutectic solder at 2±0 ± 5ºC
for 5.0 ± 0.5 seconds
Solderability
Appearance
Capacitance
Variation
ꢆ ±2.5ꢁ or ±.25 pꢃ, whichever is greater
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Resistance to
Solder Heat
Q
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Insulation
Resistance
Dielectric
Meets Initial Values (As Above)
No visual defects
Strength
Appearance
Capacitance
Variation
Step 1: -55ºC ± 2º
Step 2: Room ꢂemp
±0 ± ± minutes
ꢆ ± minutes
ꢆ ±2.5ꢁ or ±.25 pꢃ, whichever is greater
Thermal
Shock
Q
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step ±: +125ºC ± 2º
Step 4: Room ꢂemp
±0 ± ± minutes
ꢆ ± minutes
Insulation
Resistance
Dielectric
Repeat for 5 cycles and measure after
24 hours at room temperature
Meets Initial Values (As Above)
No visual defects
Strength
Appearance
Capacitance
Variation
ꢆ ±±.0ꢁ or ± .± pꢃ, whichever is greater
Charge device with twice rated voltage in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0).
ꢅ ±0 pꢃ:
ꢅ10 pꢃ, ꢄ±0 pꢃ:
ꢄ10 pꢃ:
Qꢅ ±50
Qꢅ 275 +5Cꢀ2
Qꢅ 200 +10C
Q
Load Life
(C=Nominal Cap)
Insulation
Resistance
Dielectric
Remove from test chamber and stabilize at
room temperature for 24 hours
before measuring.
ꢅ Initial Value x 0.± (See Above)
Meets Initial Values (As Above)
No visual defects
Strength
Appearance
Capacitance
Variation
ꢆ ±5.0ꢁ or ± .5 pꢃ, whichever is greater
Store in a test chamber set at 85ºC ± 2ºCꢀ
85ꢁ ± 5ꢁ relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
ꢅ ±0 pꢃ:
ꢅ10 pꢃ, ꢄ±0 pꢃ:
ꢄ10 pꢃ:
Qꢅ ±50
Qꢅ 275 +5Cꢀ2
Qꢅ 200 +10C
Load
Q
Humidity
Insulation
Resistance
Dielectric
Strength
Remove from chamber and stabilize at
room temperature for 24 ± 2 hours
before measuring.
ꢅ Initial Value x 0.± (See Above)
Meets Initial Values (As Above)
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