AT25DF021-SSHF-B--Datasheet/数据表在线中文翻译

Features

• Single 2.3V - 3.6V or 2.7V - 3.6V Supply

• Serial Peripheral Interface (SPI) Compatible

– Supports SPI Modes 0 and 3

• 66 MHz Maximum Operating Frequency

– Clock-to-Output (t_V) of 6 ns Maximum

• Flexible, Optimized Erase Architecture for Code + Data Storage Applications

– Uniform 4-Kbyte Block Erase

– Uniform 32-Kbyte Block Erase

2-Megabit

2.3-volt or

2.7-volt

Minimum

SPI Serial Flash

Memory

– Uniform 64-Kbyte Block Erase

– Full Chip Erase

• Individual Sector Protection with Global Protect/Unprotect Feature

– Four Sectors of 64 Kbytes Each

• Hardware Controlled Locking of Protected Sectors via WP Pin

• 128-Byte Programmable OTP Security Register

• Flexible Programming

– Byte/Page Program (1 to 256 Bytes)

• Fast Program and Erase Times

– 1.0 ms Typical Page Program (256 Bytes) Time

– 50 ms Typical 4-Kbyte Block Erase Time

– 250 ms Typical 32-Kbyte Block Erase Time

– 450 ms Typical 64-Kbyte Block Erase Time

• Automatic Checking and Reporting of Erase/Program Failures

• JEDEC Standard Manufacturer and Device ID Read Methodology

• Low Power Dissipation

AT25DF021

– 7 mA Active Read Current (Typical at 20 MHz)

– 15 µA Deep Power-Down Current (Typical)

• Endurance: 100,000 Program/Erase Cycles

• Data Retention: 20 Years

• Complies with Full Industrial Temperature Range

• Industry Standard Green (Pb/Halide-free/RoHS Compliant) Package Options

– 8-lead SOIC (150-mil Wide)

– 8-pad Ultra Thin DFN (5 x 6 x 0.6 mm)

1. Description

The AT25DF021 is a serial interface Flash memory device designed for use in a wide

variety of high-volume consumer based applications in which program code is shad-

owed from Flash memory into embedded or external RAM for execution. The flexible

erase architecture of the AT25DF021, with its erase granularity as small as 4 Kbytes,

makes it ideal for data storage as well, eliminating the need for additional data storage

EEPROM devices.

3677D–DFLASH–04/09

The physical sectoring and the erase block sizes of the AT25DF021 have been optimized to

meet the needs of today's code and data storage applications. By optimizing the size of the

physical sectors and erase blocks, the memory space can be used much more efficiently.

Because certain code modules and data storage segments must reside by themselves in their

own protected sectors, the wasted and unused memory space that occurs with large sectored

and large block erase Flash memory devices can be greatly reduced. This increased memory

space efficiency allows additional code routines and data storage segments to be added while

still maintaining the same overall device density.

The AT25DF021 also offers a sophisticated method for protecting individual sectors against

erroneous or malicious program and erase operations. By providing the ability to individually pro-

tect and unprotect sectors, a system can unprotect a specific sector to modify its contents while

keeping the remaining sectors of the memory array securely protected. This is useful in applica-

tions where program code is patched or updated on a subroutine or module basis, or in

applications where data storage segments need to be modified without running the risk of errant

modifications to the program code segments. In addition to individual sector protection capabili-

ties, the AT25DF021 incorporates Global Protect and Global Unprotect features that allow the

entire memory array to be either protected or unprotected all at once. This reduces overhead

during the manufacturing process since sectors do not have to be unprotected one-by-one prior

to initial programming.

The device also contains a specialized OTP (One-Time Programmable) Security Register that

can be used for purposes such as unique device serialization, system-level Electronic Serial

Number (ESN) storage, locked key storage, etc.

Specifically designed for use in 2.5-volt or 3-volt systems, the AT25DF021 supports read, pro-

gram, and erase operations with a supply voltage range of 2.3V to 3.6V or 2.7V to 3.6V. No

separate voltage is required for programming and erasing.

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AT25DF021

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AT25DF021

2. Pin Descriptions and Pinouts

Table 2-1.

Pin Descriptions

Asserted

State

Symbol

Name and Function

Type

CHIP SELECT: Asserting the CS pin selects the device. When the CS pin is deasserted, the

device will be deselected and normally be placed in standby mode (not Deep Power-Down

mode), and the SO pin will be in a high-impedance state. When the device is deselected,

data will not be accepted on the SI pin.

CS

Low

Input

A high-to-low transition on the CS pin is required to start an operation, and a low-to-high

transition is required to end an operation. When ending an internally self-timed operation

such as a program or erase cycle, the device will not enter the standby mode until the

completion of the operation.

SERIAL CLOCK: This pin is used to provide a clock to the device and is used to control the

flow of data to and from the device. Command, address, and input data present on the SI pin

is always latched in on the rising edge of SCK, while output data on the SO pin is always

clocked out on the falling edge of SCK.

SCK

SI

-

Input

SERIAL INPUT: The SI pin is used to shift data into the device. The SI pin is used for all data

input including command and address sequences. Data on the SI pin is always latched in on

the rising edge of SCK.

Data present on the SI pin will be ignored whenever the device is deselected (CS is

deasserted).

SERIAL OUTPUT: The SO pin is used to shift data out from the device. Data on the SO pin

is always clocked out on the falling edge of SCK.

SO

Output

The SO pin will be in a high-impedance state whenever the device is deselected (CS is

deasserted).

WRITE PROTECT: The WP pin controls the hardware locking feature of the device. Please

refer to “Protection Commands and Features” on page 12 for more details on protection

features and the WP pin.

WP

Low

Input

The WP pin is internally pulled-high and may be left floating if hardware controlled protection

will not be used. However, it is recommended that the WP pin also be externally connected

to V_CCwhenever possible.

HOLD: The HOLD pin is used to temporarily pause serial communication without

deselecting or resetting the device. While the HOLD pin is asserted, transitions on the SCK

pin and data on the SI pin will be ignored, and the SO pin will be in a high-impedance state.

The CS pin must be asserted, and the SCK pin must be in the low state in order for

a Hold condition to start. A Hold condition pauses serial communication only and

does not have an effect on internally self-timed operations such as a program or

erase cycle. Please refer to “Hold” on page 29 for additional details on the Hold

operation.

HOLD

Low

Input

The HOLD pin is internally pulled-high and may be left floating if the Hold function will not be

used. However, it is recommended that the HOLD pin also be externally connected to V_CC

whenever possible.

DEVICE POWER SUPPLY: The V_CCpin is used to supply the source voltage to the device.

V_CC

-

Power

Operations at invalid V_CCvoltages may produce spurious results and should not be

attempted.

GROUND: The ground reference for the power supply. GND should be connected to the

system ground.

GND

3

3677D–DFLASH–04/09

Figure 2-1. 8-SOIC Top View

Figure 2-2. 8-UDFN (Top View)

1

2

3

4

8

7

6

5

CS

SO

VCC

HOLD

SCK

SI

CS

SO

1

2

3

4

8

7

6

5

VCC

HOLD

SCK

SI

WP

GND

3. Block Diagram

Figure 3-1. Block Diagram

CONTROL AND

I/O BUFFERS

PROTECTION LOGIC

AND LATCHES

CS

SRAM

DATA BUFFER

SCK

INTERFACE

CONTROL

SI

AND

Y-DECODER

Y-GATING

LOGIC

SO

FLASH

MEMORY

ARRAY

WP

X-DECODER

HOLD

4. Memory Array

To provide the greatest flexibility, the memory array of the AT25DF021 can be erased in four lev-

els of granularity including a full chip erase. In addition, the array has been divided into physical

sectors of uniform size, of which each sector can be individually protected from program and

erase operations. The size of the physical sectors is optimized for both code and data storage

applications, allowing both code and data segments to reside in their own isolated regions. The

Memory Architecture Diagram illustrates the breakdown of each erase level as well as the

breakdown of each physical sector.

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AT25DF021

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AT25DF021

Figure 4-1. Memory Architecture Diagram

Block Erase Detail

Page Program Detail

Internal Sectoring for

Sector Protection

Function

64KB

Block Erase

32KB

Block Erase

4KB

Block Erase

1-256 Byte

Page Program

(02h Command)

Block Address

Range

Page Address

Range

(D8h Command) (52h Command) (20h Command)

4KB

03FFFFh – 03F000h

03EFFFh – 03E000h

03DFFFh – 03D000h

03CFFFh – 03C000h

03BFFFh – 03B000h

03AFFFh – 03A000h

039FFFh – 039000h

038FFFh – 038000h

037FFFh – 037000h

036FFFh – 036000h

035FFFh – 035000h

034FFFh – 034000h

033FFFh – 033000h

032FFFh – 032000h

031FFFh – 031000h

030FFFh – 030000h

02FFFFh – 02F000h

02EFFFh – 02E000h

02DFFFh – 02D000h

02CFFFh – 02C000h

02BFFFh – 02B000h

02AFFFh – 02A000h

029FFFh – 029000h

028FFFh – 028000h

027FFFh – 027000h

026FFFh – 026000h

025FFFh – 025000h

024FFFh – 024000h

023FFFh – 023000h

022FFFh – 022000h

021FFFh – 021000h

020FFFh – 020000h

256 Bytes

03FFFFh – 03FF00h

03FEFFh – 03FE00h

03FDFFh – 03FD00h

03FCFFh – 03FC00h

03FBFFh – 03FB00h

03FAFFh – 03FA00h

03F9FFh – 03F900h

03F8FFh – 03F800h

03F7FFh – 03F700h

03F6FFh – 03F600h

03F5FFh – 03F500h

03F4FFh – 03F400h

03F3FFh – 03F300h

03F2FFh – 03F200h

03F1FFh – 03F100h

03F0FFh – 03F000h

03EFFFh – 03EF00h

03EEFFh – 03EE00h

03EDFFh – 03ED00h

03ECFFh – 03EC00h

03EBFFh – 03EB00h

03EAFFh – 03EA00h

03E9FFh – 03E900h

03E8FFh – 03E800h

4KB

32KB

4KB

64KB

(Sector 3)

64KB

4KB

32KB

4KB

32KB

4KB

64KB

(Sector 2)

64KB

4KB

256 Bytes

0017FFh – 001700h

0016FFh – 001600h

0015FFh – 001500h

0014FFh – 001400h

0013FFh – 001300h

0012FFh – 001200h

0011FFh – 001100h

0010FFh – 001000h

000FFFh – 000F00h

000EFFh – 000E00h

000DFFh – 000D00h

000CFFh – 000C00h

000BFFh – 000B00h

000AFFh – 000A00h

0009FFh – 000900h

0008FFh – 000800h

0007FFh – 000700h

0006FFh – 000600h

0005FFh – 000500h

0004FFh – 000400h

0003FFh – 000300h

0002FFh – 000200h

0001FFh – 000100h

0000FFh – 000000h

32KB

4KB

00FFFFh – 00F000h

00EFFFh – 00E000h

00DFFFh – 00D000h

00CFFFh – 00C000h

00BFFFh – 00B000h

00AFFFh – 00A000h

009FFFh – 009000h

008FFFh – 008000h

007FFFh – 007000h

006FFFh – 006000h

005FFFh – 005000h

004FFFh – 004000h

003FFFh – 003000h

002FFFh – 002000h

001FFFh – 001000h

000FFFh – 000000h

4KB

32KB

4KB

64KB

(Sector 0)

64KB

4KB

32KB

4KB

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5. Device Operation

The AT25DF021 is controlled by a set of instructions that are sent from a host controller, com-

monly referred to as the SPI Master. The SPI Master communicates with the AT25DF021 via the

SPI bus which is comprised of four signal lines: Chip Select (CS), Serial Clock (SCK), Serial

Input (SI), and Serial Output (SO).

The SPI protocol defines a total of four modes of operation (mode 0, 1, 2, or 3) with each mode

differing in respect to the SCK polarity and phase and how the polarity and phase control the

flow of data on the SPI bus. The AT25DF021 supports the two most common modes, SPI

Modes 0 and 3. The only difference between SPI Modes 0 and 3 is the polarity of the SCK signal

when in the inactive state (when the SPI Master is in standby mode and not transferring any

data). With SPI Modes 0 and 3, data is always latched in on the rising edge of SCK and always

output on the falling edge of SCK.

Figure 5-1. SPI Mode 0 and 3

CS

SCK

MSB

LSB

SI

MSB

LSB

SO

6. Commands and Addressing

A valid instruction or operation must always be started by first asserting the CS pin. After the CS

pin has been asserted, the host controller must then clock out a valid 8-bit opcode on the SPI

bus. Following the opcode, instruction dependent information such as address and data bytes

would then be clocked out by the host controller. All opcode, address, and data bytes are trans-

ferred with the most-significant bit (MSB) first. An operation is ended by deasserting the CS pin.

Opcodes not supported by the AT25DF021 will be ignored by the device and no operation will be

started. The device will continue to ignore any data presented on the SI pin until the start of the

next operation (CS pin being deasserted and then reasserted). In addition, if the CS pin is deas-

serted before complete opcode and address information is sent to the device, then no operation

will be performed and the device will simply return to the idle state and wait for the next

operation.

Addressing of the device requires a total of three bytes of information to be sent, representing

address bits A23-A0. Since the upper address limit of the AT25DF021 memory array is

03FFFFh, address bits A23-A18 are always ignored by the device.

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AT25DF021

3677D–DFLASH–04/09

AT25DF021

Table 6-1.

Command

Command Listing

Clock

Frequency

Address

Bytes

Dummy

Bytes

Data

Bytes

Opcode

Read Commands

0Bh

03h

0000 1011

Up to 66 MHz

Up to 33 MHz

3

1

0

1+

Read Array

0000 0011

Program and Erase Commands

Block Erase (4 Kbytes)

20h

52h

D8h

60h

C7h

02h

0010 0000

0101 0010

1101 1000

0110 0000

1100 0111

0000 0010

Up to 66 MHz

3

0

3

0

Block Erase (32 Kbytes)

Block Erase (64 Kbytes)

0

Chip Erase

0

Byte/Page Program (1 to 256 Bytes)

Protection Commands

Write Enable

1+

06h

04h

36h

39h

0000 0110

0000 0100

0011 0110

0011 1001

Up to 66 MHz

0

3

0

Write Disable

Protect Sector

Unprotect Sector

Global Protect/Unprotect

Read Sector Protection Registers

Security Commands

Use Write Status Register Command

3Ch

0011 1100

Up to 66 MHz

3

0

1+

Program OTP Security Register

Read OTP Security Register

Status Register Commands

Read Status Register

9Bh

77h

1001 1011

0111 0111

Up to 66 MHz

3

0

2

1+

05h

01h

0000 0101

0000 0001

Up to 66 MHz

0

1+

1

Write Status Register

Miscellaneous Commands

Read Manufacturer and Device ID

Deep Power-Down

9Fh

B9h

ABh

1001 1111

1011 1001

1010 1011

Up to 66 MHz

0

1 to 4

0

Resume from Deep Power-Down

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3677D–DFLASH–04/09

7. Read Commands

7.1

Read Array

The Read Array command can be used to sequentially read a continuous stream of data from

the device by simply providing the clock signal once the initial starting address has been speci-

fied. The device incorporates an internal address counter that automatically increments on every

clock cycle.

Two opcodes (0Bh and 03h) can be used for the Read Array command. The use of each

opcode depends on the maximum clock frequency that will be used to read data from the

device. The 0Bh opcode can be used at any clock frequency up to the maximum specified by

f

_CLK, and the 03h opcode can be used for lower frequency read operations up to the maximum

specified by f_RDLF

.

To perform the Read Array operation, the CS pin must first be asserted and the appropriate

opcode (0Bh or 03h) must be clocked into the device. After the opcode has been clocked in, the

three address bytes must be clocked in to specify the starting address location of the first byte to

read within the memory array. Following the three address bytes, an additional dummy byte

needs to be clocked into the device if the 0Bh opcode is used for the Read Array operation.

After the three address bytes (and the dummy byte if using opcode 0Bh) have been clocked in,

additional clock cycles will result in data being output on the SO pin. The data is always output

with the MSB of a byte first. When the last byte (03FFFFh) of the memory array has been read,

the device will continue reading back at the beginning of the array (000000h). No delays will be

incurred when wrapping around from the end of the array to the beginning of the array.

Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-

ance state. The CS pin can be deasserted at any time and does not require that a full byte of

data be read.

Figure 7-1. Read Array - 0Bh Opcode

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48

SCK

SI

OPCODE

ADDRESS BITS A23-A0

A

DON'T CARE

0

1

0

1

A

X

MSB

DATA BYTE 1

D

HIGH-IMPEDANCE

D

SO

MSB

Figure 7-2. Read Array - 03h Opcode

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

29 30 31 32 33 34 35 36 37 38 39 40

SCK

SI

OPCODE

ADDRESS BITS A23-A0

0

1

A

MSB

DATA BYTE 1

HIGH-IMPEDANCE

D

SO

MSB

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AT25DF021

8. Program and Erase Commands

8.1

Byte/Page Program

The Byte/Page Program command allows anywhere from a single byte of data to 256 bytes of

data to be programmed into previously erased memory locations. An erased memory location is

one that has all eight bits set to the logical “1” state (a byte value of FFh). Before a Byte/Page

Program command can be started, the Write Enable command must have been previously

issued to the device (see “Write Enable” on page 12) to set the Write Enable Latch (WEL) bit of

the Status Register to a logical “1” state.

To perform a Byte/Page Program command, an opcode of 02h must be clocked into the device

followed by the three address bytes denoting the first byte location of the memory array to begin

programming at. After the address bytes have been clocked in, data can then be clocked into the

device and will be stored in an internal buffer.

If the starting memory address denoted by A23-A0 does not fall on an even 256-byte page

boundary (A7-A0 are not all 0), then special circumstances regarding which memory locations to

be programmed will apply. In this situation, any data that is sent to the device that goes beyond

the end of the page will wrap around back to the beginning of the same page. For example, if the

starting address denoted by A23-A0 is 0000FEh, and three bytes of data are sent to the device,

then the first two bytes of data will be programmed at addresses 0000FEh and 0000FFh while

the last byte of data will be programmed at address 000000h. The remaining bytes in the page

(addresses 000001h through 0000FDh) will not be programmed and will remain in the erased

state (FFh). In addition, if more than 256 bytes of data are sent to the device, then only the last

256 bytes sent will be latched into the internal buffer.

When the CS pin is deasserted, the device will take the data stored in the internal buffer and pro-

gram it into the appropriate memory array locations based on the starting address specified by

A23-A0 and the number of data bytes sent to the device. If less than 256 bytes of data were sent

to the device, then the remaining bytes within the page will not be programmed and will remain

in the erased state (FFh). The programming of the data bytes is internally self-timed and should

take place in a time of t_PPor t_BPif only programming a single byte.

The three address bytes and at least one complete byte of data must be clocked into the device

before the CS pin is deasserted, and the CS pin must be deasserted on even byte boundaries

(multiples of eight bits); otherwise, the device will abort the operation and no data will be pro-

grammed into the memory array. In addition, if the address specified by A23-A0 points to a

memory location within a sector that is in the protected state (see “Protect Sector” on page 13),

then the Byte/Page Program command will not be executed, and the device will return to the idle

state once the CS pin has been deasserted. The WEL bit in the Status Register will be reset

back to the logical “0” state if the program cycle aborts due to an incomplete address being sent,

an incomplete byte of data being sent, the CS pin being deasserted on uneven byte boundaries,

or because the memory location to be programmed is protected.

While the device is programming, the Status Register can be read and will indicate that the

device is busy. For faster throughput, it is recommended that the Status Register be polled

rather than waiting the t_BPor t_PPtime to determine if the data bytes have finished programming.

At some point before the program cycle completes, the WEL bit in the Status Register will be

reset back to the logical “0” state.

The device also incorporates an intelligent programming algorithm that can detect when a byte

location fails to program properly. If a programming error arises, it will be indicated by the EPE

bit in the Status Register.

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3677D–DFLASH–04/09

Figure 8-1. Byte Program

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

29 30 31 32 33 34 35 36 37 38 39

SCK

SI

OPCODE

ADDRESS BITS A23-A0

DATA IN

0

1

0

A

D

MSB

HIGH-IMPEDANCE

SO

Figure 8-2. Page Program

CS

0

1

2

3

4

5

6

7

8

9

29 30 31 32 33 34 35 36 37 38 39

SCK

SI

OPCODE

ADDRESS BITS A23-A0

DATA IN BYTE 1

DATA IN BYTE n

0

1

0

A

D

MSB

HIGH-IMPEDANCE

SO

8.2

Block Erase

A block of 4, 32, or 64 Kbytes can be erased (all bits set to the logical “1” state) in a single oper-

ation by using one of three different opcodes for the Block Erase command. An opcode of 20h is

used for a 4-Kbyte erase, an opcode of 52h is used for a 32-Kbyte erase, and an opcode of D8h

is used for a 64-Kbyte erase. Before a Block Erase command can be started, the Write Enable

command must have been previously issued to the device to set the WEL bit of the Status Reg-

ister to a logical “1” state.

To perform a Block Erase, the CS pin must first be asserted and the appropriate opcode (20h,

52h, or D8h) must be clocked into the device. After the opcode has been clocked in, the three

address bytes specifying an address within the 4-, 32-, or 64-Kbyte block to be erased must be

clocked in. Any additional data clocked into the device will be ignored. When the CS pin is deas-

serted, the device will erase the appropriate block. The erasing of the block is internally self-

timed and should take place in a time of t_BLKE

.

Since the Block Erase command erases a region of bytes, the lower order address bits do not

need to be decoded by the device. Therefore, for a 4-Kbyte erase, address bits A11-A0 will be

ignored by the device and their values can be either a logical “1” or “0”. For a 32-Kbyte erase,

address bits A14-A0 will be ignored, and for a 64-Kbyte erase, address bits A15-A0 will be

ignored by the device. Despite the lower order address bits not being decoded by the device, the

complete three address bytes must still be clocked into the device before the CS pin is deas-

serted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits);

otherwise, the device will abort the operation and no erase operation will be performed.

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AT25DF021

3677D–DFLASH–04/09

AT25DF021

If the address specified by A23-A0 points to a memory location within a sector that is in the pro-

tected state, then the Block Erase command will not be executed, and the device will return to

the idle state once the CS pin has been deasserted.

The WEL bit in the Status Register will be reset back to the logical “0” state if the erase cycle

aborts due to an incomplete address being sent, the CS pin being deasserted on uneven byte

boundaries, or because a memory location within the region to be erased is protected.

While the device is executing a successful erase cycle, the Status Register can be read and will

indicate that the device is busy. For faster throughput, it is recommended that the Status Regis-

ter be polled rather than waiting the t_BLKEtime to determine if the device has finished erasing. At

some point before the erase cycle completes, the WEL bit in the Status Register will be reset

back to the logical “0” state.

The device also incorporates an intelligent erase algorithm that can detect when a byte location

fails to erase properly. If an erase error occurs, it will be indicated by the EPE bit in the Status

Register.

Figure 8-3. Block Erase

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

26 27 28 29 30 31

SCK

SI

OPCODE

ADDRESS BITS A23-A0

C

A

MSB

HIGH-IMPEDANCE

SO

8.3

Chip Erase

The entire memory array can be erased in a single operation by using the Chip Erase command.

Before a Chip Erase command can be started, the Write Enable command must have been pre-

viously issued to the device to set the WEL bit of the Status Register to a logical “1” state.

Two opcodes, 60h and C7h, can be used for the Chip Erase command. There is no difference in

device functionality when utilizing the two opcodes, so they can be used interchangeably. To

perform a Chip Erase, one of the two opcodes (60h or C7h) must be clocked into the device.

Since the entire memory array is to be erased, no address bytes need to be clocked into the

device, and any data clocked in after the opcode will be ignored. When the CS pin is deasserted,

the device will erase the entire memory array. The erasing of the device is internally self-timed

and should take place in a time of t_CHPE

.

The complete opcode must be clocked into the device before the CS pin is deasserted, and the

CS pin must be deasserted on an even byte boundary (multiples of eight bits); otherwise, no

erase will be performed. In addition, if any sector of the memory array is in the protected state,

then the Chip Erase command will not be executed, and the device will return to the idle state

once the CS pin has been deasserted. The WEL bit in the Status Register will be reset back to

the logical “0” state if the CS pin is deasserted on uneven byte boundaries or if a sector is in the

protected state.

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3677D–DFLASH–04/09

While the device is executing a successful erase cycle, the Status Register can be read and will

indicate that the device is busy. For faster throughput, it is recommended that the Status Regis-

ter be polled rather than waiting the t_CHPEtime to determine if the device has finished erasing. At

some point before the erase cycle completes, the WEL bit in the Status Register will be reset

back to the logical “0” state.

The device also incorporates an intelligent erase algorithm that can detect when a byte location

fails to erase properly. If an erase error occurs, it will be indicated by the EPE bit in the Status

Register.

Figure 8-4. Chip Erase

CS

0

1

2

3

4

5

6

7

SCK

OPCODE

C

SI

MSB

HIGH-IMPEDANCE

SO

9. Protection Commands and Features

9.1

Write Enable

The Write Enable command is used to set the Write Enable Latch (WEL) bit in the Status Regis-

ter to a logical “1” state. The WEL bit must be set before a Byte/Page Program, erase, Protect

Sector, Unprotect Sector, Program OTP Security Register, or Write Status Register command

can be executed. This makes the issuance of these commands a two step process, thereby

reducing the chances of a command being accidentally or erroneously executed. If the WEL bit

in the Status Register is not set prior to the issuance of one of these commands, then the com-

mand will not be executed.

To issue the Write Enable command, the CS pin must first be asserted and the opcode of 06h

must be clocked into the device. No address bytes need to be clocked into the device, and any

data clocked in after the opcode will be ignored. When the CS pin is deasserted, the WEL bit in

the Status Register will be set to a logical “1”. The complete opcode must be clocked into the

device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte

boundary (multiples of eight bits); otherwise, the device will abort the operation and the state of

the WEL bit will not change.

Figure 9-1. Write Enable

CS

0

1

2

3

4

5

6

7

SCK

SI

OPCODE

0

1

0

MSB

HIGH-IMPEDANCE

SO

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3677D–DFLASH–04/09

AT25DF021

9.2

Write Disable

The Write Disable command is used to reset the Write Enable Latch (WEL) bit in the Status Reg-

ister to the logical “0” state. With the WEL bit reset, all Byte/Page Program, erase, Protect

Sector, Unprotect Sector, Program OTP Security Register, and Write Status Register com-

mands will not be executed. Other conditions can also cause the WEL bit to be reset; for more

details, refer to the WEL bit section of the Status Register description.

To issue the Write Disable command, the CS pin must first be asserted and the opcode of 04h

must be clocked into the device. No address bytes need to be clocked into the device, and any

data clocked in after the opcode will be ignored. When the CS pin is deasserted, the WEL bit in

the Status Register will be reset to a logical “0”. The complete opcode must be clocked into the

device before the CS pin is deasserted, and the CS pin must be deasserted on an even byte

boundary (multiples of eight bits); otherwise, the device will abort the operation and the state of

the WEL bit will not change.

Figure 9-2. Write Disable

CS

0

1

2

3

4

5

6

7

SCK

SI

OPCODE

0

1

0

MSB

HIGH-IMPEDANCE

SO

9.3

Protect Sector

Every physical 64-Kbyte sector of the device has a corresponding single-bit Sector Protection

Register that is used to control the software protection of a sector. Upon device power-up, each

Sector Protection Register will default to the logical “1” state indicating that all sectors are pro-

tected and cannot be programmed or erased.

Issuing the Protect Sector command to a particular sector address will set the corresponding

Sector Protection Register to the logical “1” state. The following table outlines the two states of

the Sector Protection Registers.

Table 9-1.

Sector Protection Register Values

Value

Sector Protection Status

0

1

Sector is unprotected and can be programmed and erased.

Sector is protected and cannot be programmed or erased. This is the default state.

Before the Protect Sector command can be issued, the Write Enable command must have been

previously issued to set the WEL bit in the Status Register to a logical “1”. To issue the Protect

Sector command, the CS pin must first be asserted and the opcode of 36h must be clocked into

the device followed by three address bytes designating any address within the sector to be pro-

tected. Any additional data clocked into the device will be ignored. When the CS pin is

deasserted, the Sector Protection Register corresponding to the physical sector addressed by

A23-A0 will be set to the logical “1” state, and the sector itself will then be protected from

13

3677D–DFLASH–04/09

program and erase operations. In addition, the WEL bit in the Status Register will be reset back

to the logical “0” state.

The complete three address bytes must be clocked into the device before the CS pin is deas-

serted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits);

otherwise, the device will abort the operation. When the device aborts the Protect Sector opera-

tion, the state of the Sector Protection Register will be unchanged, and the WEL bit in the Status

Register will be reset to a logical “0”.

As a safeguard against accidental or erroneous protecting or unprotecting of sectors, the Sector

Protection Registers can themselves be locked from updates by using the SPRL (Sector Protec-

tion Registers Locked) bit of the Status Register (please refer to the Status Register description

for more details). If the Sector Protection Registers are locked, then any attempts to issue the

Protect Sector command will be ignored, and the device will reset the WEL bit in the Status Reg-

ister back to a logical “0” and return to the idle state once the CS pin has been deasserted.

Figure 9-3. Protect Sector

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

26 27 28 29 30 31

SCK

SI

OPCODE

ADDRESS BITS A23-A0

0

1

0

1

0

A

MSB

HIGH-IMPEDANCE

SO

9.4

Unprotect Sector

Issuing the Unprotect Sector command to a particular sector address will reset the correspond-

ing Sector Protection Register to the logical “0” state (see Table 9-1 for Sector Protection

Register values). Every physical sector of the device has a corresponding single-bit Sector Pro-

tection Register that is used to control the software protection of a sector.

Before the Unprotect Sector command can be issued, the Write Enable command must have

been previously issued to set the WEL bit in the Status Register to a logical “1”. To issue the

Unprotect Sector command, the CS pin must first be asserted and the opcode of 39h must be

clocked into the device. After the opcode has been clocked in, the three address bytes designat-

ing any address within the sector to be unprotected must be clocked in. Any additional data

clocked into the device after the address bytes will be ignored. When the CS pin is deasserted,

the Sector Protection Register corresponding to the sector addressed by A23-A0 will be reset to

the logical “0” state, and the sector itself will be unprotected. In addition, the WEL bit in the Sta-

tus Register will be reset back to the logical “0” state.

The complete three address bytes must be clocked into the device before the CS pin is deas-

serted, and the CS pin must be deasserted on an even byte boundary (multiples of eight bits);

otherwise, the device will abort the operation, the state of the Sector Protection Register will be

unchanged, and the WEL bit in the Status Register will be reset to a logical “0”.

As a safeguard against accidental or erroneous locking or unlocking of sectors, the Sector Pro-

tection Registers can themselves be locked from updates by using the SPRL (Sector Protection

14

AT25DF021

3677D–DFLASH–04/09

AT25DF021

Registers Locked) bit of the Status Register (please refer to the Status Register description for

more details). If the Sector Protection Registers are locked, then any attempts to issue the

Unprotect Sector command will be ignored, and the device will reset the WEL bit in the Status

Register back to a logical “0” and return to the idle state once the CS pin has been deasserted.

Figure 9-4. Unprotect Sector

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

26 27 28 29 30 31

SCK

SI

OPCODE

ADDRESS BITS A23-A0

0

1

0

1

A

MSB

HIGH-IMPEDANCE

SO

9.5

Global Protect/Unprotect

The Global Protect and Global Unprotect features can work in conjunction with the Protect Sec-

tor and Unprotect Sector functions. For example, a system can globally protect the entire

memory array and then use the Unprotect Sector command to individually unprotect certain sec-

tors and individually reprotect them later by using the Protect Sector command. Likewise, a

system can globally unprotect the entire memory array and then individually protect certain sec-

tors as needed.

Performing a Global Protect or Global Unprotect is accomplished by writing a certain combina-

tion of data to the Status Register using the Write Status Register Byte 1 command (see “Write

Status Register” on page 25 for command execution details). The Write Status Register com-

mand is also used to modify the SPRL (Sector Protection Registers Locked) bit to control

hardware and software locking.

To perform a Global Protect, the appropriate WP pin and SPRL conditions must be met, and the

system must write a logical “1” to bits 5, 4, 3, and 2 of the first byte of the Status Register. Con-

versely, to perform a Global Unprotect, the same WP and SPRL conditions must be met but the

system must write a logical “0” to bits 5, 4, 3, and 2 of the first byte of the Status Register. Table

9-2 details the conditions necessary for a Global Protect or Global Unprotect to be performed.

15

3677D–DFLASH–04/09

Table 9-2.

Valid SPRL and Global Protect/Unprotect Conditions

New Write Status

Register Byte 1

Data

Current

SPRL

Value

New

SPRL

Value

WP

State

Bit

7 6 5 4 3 2 1 0

Protection Operation

0 x 0 0 0 0 x x

0 x 0 0 0 1 x x

Global Unprotect – all Sector Protection Registers reset to 0

No change to current protection.

Global Protect – all Sector Protection Registers set to 1

0

0 x 1 1 1 0 x x

0 x 1 1 1 1 x x

0

1

0

1

0

1 x 0 0 0 0 x x

1 x 0 0 0 1 x x

Global Unprotect – all Sector Protection Registers reset to 0

No change to current protection.

Global Protect – all Sector Protection Registers set to 1

1

1 x 1 1 1 0 x x

1 x 1 1 1 1 x x

No change to the current protection level. All sectors currently

protected will remain protected and all sectors currently unprotected

will remain unprotected.

x x x x x x x x

The Sector Protection Registers are hard-locked and cannot be

changed when the WP pin is LOW and the current state of SPRL is 1.

Therefore, a Global Protect/Unprotect will not occur. In addition, the

SPRL bit cannot be changed (the WP pin must be HIGH in order to

change SPRL back to a 0).

0 x 0 0 0 0 x x

0 x 0 0 0 1 x x

Global Unprotect – all Sector Protection Registers reset to 0

No change to current protection.

Global Protect – all Sector Protection Registers set to 1

0

0 x 1 1 1 0 x x

0 x 1 1 1 1 x x

1 x 0 0 0 0 x x

1 x 0 0 0 1 x x

Global Unprotect – all Sector Protection Registers reset to 0

No change to current protection.

Global Protect – all Sector Protection Registers set to 1

1

1 x 1 1 1 0 x x

1 x 1 1 1 1 x x

0 x 0 0 0 0 x x

0 x 0 0 0 1 x x

No change to the current protection level. All sectors

currently protected will remain protected, and all sectors

currently unprotected will remain unprotected.

0

0 x 1 1 1 0 x x

0 x 1 1 1 1 x x

The Sector Protection Registers are soft-locked and cannot

be changed when the current state of SPRL is 1. Therefore,

a Global Protect/Unprotect will not occur. However, the

SPRL bit can be changed back to a 0 from a 1 since the WP

pin is HIGH. To perform a Global Protect/Unprotect, the

Write Status Register command must be issued again after

the SPRL bit has been changed from a 1 to a 0.

1

1 x 0 0 0 0 x x

1 x 0 0 0 1 x x

1

1 x 1 1 1 0 x x

1 x 1 1 1 1 x x

Essentially, if the SPRL bit of the Status Register is in the logical “0” state (Sector Protection

Registers are not locked), then writing a 00h to the first byte of the Status Register will perform a

Global Unprotect without changing the state of the SPRL bit. Similarly, writing a 7Fh to the first

byte of the Status Register will perform a Global Protect and keep the SPRL bit in the logical “0”

state. The SPRL bit can, of course, be changed to a logical “1” by writing an FFh if software-lock-

ing or hardware-locking is desired along with the Global Protect.

If the desire is to only change the SPRL bit without performing a Global Protect or Global Unpro-

tect, then the system can simply write a 0Fh to the first byte of the Status Register to change the

16

AT25DF021

3677D–DFLASH–04/09

AT25DF021

SPRL bit from a logical “1” to a logical “0” provided the WP pin is deasserted. Likewise, the sys-

tem can write an F0h to change the SPRL bit from a logical “0” to a logical “1” without affecting

the current sector protection status (no changes will be made to the Sector Protection

Registers).

When writing to the first byte of the Status Register, bits 5, 4, 3, and 2 will not actually be modi-

fied but will be decoded by the device for the purposes of the Global Protect and Global

Unprotect functions. Only bit 7, the SPRL bit, will actually be modified. Therefore, when reading

the first byte of the Status Register, bits 5, 4, 3, and 2 will not reflect the values written to them

but will instead indicate the status of the WP pin and the sector protection status. Please refer to

“Read Status Register” on page 22 and Table 11-1 on page 22 for details on the Status Register

format and what values can be read for bits 5, 4, 3, and 2.

9.6

Read Sector Protection Registers

The Sector Protection Registers can be read to determine the current software protection status

of each sector. Reading the Sector Protection Registers, however, will not determine the status

of the WP pin.

To read the Sector Protection Register for a particular sector, the CS pin must first be asserted

and the opcode of 3Ch must be clocked in. Once the opcode has been clocked in, three address

bytes designating any address within the sector must be clocked in. After the last address byte

has been clocked in, the device will begin outputting data on the SO pin during every subse-

quent clock cycle. The data being output will be a repeating byte of either FFh or 00h to denote

the value of the appropriate Sector Protection Register.

Table 9-3.

Output Data

Read Sector Protection Register - Output Data

Sector Protection Register Value

00h

FFh

Sector Protection Register value is 0 (sector is unprotected).

Sector Protection Register value is 1 (sector is protected).

Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-

ance state. The CS pin can be deasserted at any time and does not require that a full byte of

data be read.

In addition to reading the individual Sector Protection Registers, the Software Protection Status

(SWP) bits in the Status Register can be read to determine if all, some, or none of the sectors

are software protected (refer to “Read Status Register” on page 22 for more details).

Figure 9-5. Read Sector Protection Register

CS

0

1

2

3

4

5

6

7

8

9

10 11 12

29 30 31 32 33 34 35 36 37 38 39 40

SCK

SI

OPCODE

ADDRESS BITS A23-A0

0

1

0

A

MSB

DATA BYTE

HIGH-IMPEDANCE

D

SO

MSB

17

3677D–DFLASH–04/09

9.7

Protected States and the Write Protect (WP) Pin

The WP pin is not linked to the memory array itself and has no direct effect on the protection sta-

tus or lockdown status of the memory array. Instead, the WP pin, in conjunction with the SPRL

(Sector Protection Registers Locked) bit in the Status Register, is used to control the hardware

locking mechanism of the device. For hardware locking to be active, two conditions must be met-

the WP pin must be asserted and the SPRL bit must be in the logical “1” state.

When hardware locking is active, the Sector Protection Registers are locked and the SPRL bit

itself is also locked. Therefore, sectors that are protected will be locked in the protected state,

and sectors that are unprotected will be locked in the unprotected state. These states cannot be

changed as long as hardware locking is active, so the Protect Sector, Unprotect Sector, and

Write Status Register commands will be ignored. In order to modify the protection status of a

sector, the WP pin must first be deasserted, and the SPRL bit in the Status Register must be

reset back to the logical “0” state using the Write Status Register command. When resetting the

SPRL bit back to a logical “0”, it is not possible to perform a Global Protect or Global Unprotect

at the same time since the Sector Protection Registers remain soft-locked until after the Write

Status Register command has been executed.

If the WP pin is permanently connected to GND, then once the SPRL bit is set to a logical “1”,

the only way to reset the bit back to the logical “0” state is to power-cycle the device. This allows

a system to power-up with all sectors software protected but not hardware locked. Therefore,

sectors can be unprotected and protected as needed and then hardware locked at a later time

by simply setting the SPRL bit in the Status Register.

When the WP pin is deasserted, or if the WP pin is permanently connected to V_CC, the SPRL bit

in the Status Register can still be set to a logical “1” to lock the Sector Protection Registers. This

provides a software locking ability to prevent erroneous Protect Sector or Unprotect Sector com-

mands from being processed. When changing the SPRL bit to a logical “1” from a logical “0”, it is

also possible to perform a Global Protect or Global Unprotect at the same time by writing the

appropriate values into bits 5, 4, 3, and 2 of the first byte of the Status Register.

Tables 9-4 and 9-5 detail the various protection and locking states of the device.

Table 9-4.

Sector Protection Register States

Sector Protection Register

Sector

n⁽¹⁾

WP

n⁽¹⁾

0

Unprotected

Protected

X

(Don't Care)

1

Note:

1. “n” represents a sector number

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3677D–DFLASH–04/09

AT25DF021

Table 9-5.

Hardware and Software Locking

WP

SPRL

Locking

SPRL Change Allowed

Sector Protection Registers

Unlocked and modifiable using the

Protect and Unprotect Sector commands.

Global Protect and Unprotect can also be

performed.

0

1

0

1

Can be modified from 0 to 1

Locked in current state. Protect and

Unprotect Sector commands will be

ignored. Global Protect and Unprotect

cannot be performed.

Hardware

Locked

0

Locked

Unlocked and modifiable using the

Protect and Unprotect Sector commands.

Global Protect and Unprotect can also be

performed.

1

Can be modified from 0 to 1

Can be modified from 1 to 0

Locked in current state. Protect and

Unprotect Sector commands will be

ignored. Global Protect and Unprotect

cannot be performed.

Software

Locked

1

10. Security Commands

10.1 Program OTP Security Register

The device contains a specialized OTP (One-Time Programmable) Security Register that can be

used for purposes such as unique device serialization, system-level Electronic Serial Number

(ESN) storage, locked key storage, etc. The OTP Security Register is independent of the main

Flash memory array and is comprised of a total of 128 bytes of memory divided into two por-

tions. The first 64 bytes (byte locations 0 through 63) of the OTP Security Register are allocated

as a one-time user-programmable space. Once these 64 bytes have been programmed, they

cannot be erased or reprogrammed. The remaining 64 bytes of the OTP Security Register (byte

locations 64 through 127) are factory programmed by Atmel and will contain a unique value for

each device. The factory programmed data is fixed and cannot be changed.

Table 10-1. OTP Security Register

Security Register

Byte Number

0

1

. . .

62

63

64

65

. . .

126

127

One-Time User Programmable

Factory Programmed by Atmel

The user-programmable portion of the OTP Security Register does not need to be erased before

it is programmed. In addition, the Program OTP Security Register command operates on the

entire 64-byte user-programmable portion of the OTP Security Register at one time. Once the

user-programmable space has been programmed with any number of bytes, the user-program-

mable space cannot be programmed again; therefore, it is not possible to only program the first

two bytes of the register and then program the remaining 62 bytes at a later time.

Before the Program OTP Security Register command can be issued, the Write Enable command

must have been previously issued to set the WEL bit in the Status Register to a logical “1”. To

program the OTP Security Register, the CS pin must first be asserted and an opcode of 9Bh

must be clocked into the device followed by the three address bytes denoting the first byte

19

3677D–DFLASH–04/09

location of the OTP Security Register to begin programming at. Since the size of the user-pro-

grammable portion of the OTP Security Register is 64 bytes, the upper order address bits do not

need to be decoded by the device. Therefore, address bits A23-A6 will be ignored by the device

and their values can be either a logical “1” or “0”. After the address bytes have been clocked in,

data can then be clocked into the device and will be stored in the internal buffer.

If the starting memory address denoted by A23-A0 does not start at the beginning of the OTP

Security Register memory space (A5-A0 are not all 0), then special circumstances regarding

which OTP Security Register locations to be programmed will apply. In this situation, any data

that is sent to the device that goes beyond the end of the 64-byte user-programmable space will

wrap around back to the beginning of the OTP Security Register. For example, if the starting

address denoted by A23-A0 is 00003Eh, and three bytes of data are sent to the device, then the

first two bytes of data will be programmed at OTP Security Register addresses 00003Eh and

00003Fh while the last byte of data will be programmed at address 000000h. The remaining

bytes in the OTP Security Register (addresses 000001h through 00003Dh) will not be pro-

grammed and will remain in the erased state (FFh). In addition, if more than 64 bytes of data are

sent to the device, then only the last 64 bytes sent will be latched into the internal buffer.

When the CS pin is deasserted, the device will take the data stored in the internal buffer and pro-

gram it into the appropriate OTP Security Register locations based on the starting address

specified by A23-A0 and the number of data bytes sent to the device. If less than 64 bytes of

data were sent to the device, then the remaining bytes within the OTP Security Register will not

be programmed and will remain in the erased state (FFh). The programming of the data bytes is

internally self-timed and should take place in a time of t_OTPP

.

The three address bytes and at least one complete byte of data must be clocked into the device

before the CS pin is deasserted, and the CS pin must be deasserted on even byte boundaries

(multiples of eight bits); otherwise, the device will abort the operation and the user-programma-

ble portion of the OTP Security Register will not be programmed. The WEL bit in the Status

Register will be reset back to the logical “0” state if the OTP Security Register program cycle

aborts due to an incomplete address being sent, an incomplete byte of data being sent, the CS

pin being deasserted on uneven byte boundaries, or because the user-programmable portion of

the OTP Security Register was previously programmed.

While the device is programming the OTP Security Register, the Status Register can be read

and will indicate that the device is busy. For faster throughput, it is recommended that the Status

Register be polled rather than waiting the t_OTPPtime to determine if the data bytes have finished

programming. At some point before the OTP Security Register programming completes, the

WEL bit in the Status Register will be reset back to the logical “0” state.

If the device is powered-down during the OTP Security Register program cycle, then the con-

tents of the 64-byte user programmable portion of the OTP Security Register cannot be

guaranteed and cannot be programmed again.

The Program OTP Security Register command utilizes the internal 256-buffer for processing.

Therefore, the contents of the buffer will be altered from its previous state when this command is

issued.

20

AT25DF021

3677D–DFLASH–04/09

AT25DF021

Figure 10-1. Program OTP Security Register

CS

0

1

2

3

4

5

6

7

8

9

29 30 31 32 33 34 35 36 37 38 39

SCK

SI

OPCODE

ADDRESS BITS A23-A0

DATA IN BYTE 1

DATA IN BYTE n

1

0

1

0

1

A

D

MSB

HIGH-IMPEDANCE

SO

10.2 Read OTP Security Register

The OTP Security Register can be sequentially read in a similar fashion to the Read Array oper-

ation up to the maximum clock frequency specified by f_CLK. To read the OTP Security Register,

the CS pin must first be asserted and the opcode of 77h must be clocked into the device. After

the opcode has been clocked in, the three address bytes must be clocked in to specify the start-

ing address location of the first byte to read within the OTP Security Register. Following the

three address bytes, two dummy bytes must be clocked into the device before data can be

output.

After the three address bytes and the dummy bytes have been clocked in, additional clock

cycles will result in OTP Security Register data being output on the SO pin. When the last byte

(00007Fh) of the OTP Security Register has been read, the device will continue reading back at

the beginning of the register (000000h). No delays will be incurred when wrapping around from

the end of the register to the beginning of the register.

Deasserting the CS pin will terminate the read operation and put the SO pin into a high-imped-

ance state. The CS pin can be deasserted at any time and does not require that a full byte of

data be read.

Figure 10-2. Read OTP Security Register

CS

SCK

SI

0

1

2

3

4

5

6

7

8

9

10 11 12

29 30 31 32 33 34 35 36

OPCODE

ADDRESS BITS A23-A0

DON'T CARE

0

1

0

1

A

X

MSB

DATA BYTE 1

HIGH-IMPEDANCE

D

SO

MSB

21

3677D–DFLASH–04/09

11. Status Register Commands

11.1 Read Status Register

The Status Register can be read to determine the device’s ready/busy status, as well as the sta-

tus of many other functions such as Hardware Locking and Software Protection. The Status

Register can be read at any time, including during an internally self-timed program or erase

operation.

To read the Status Register, the CS pin must first be asserted and the opcode of 05h must be

clocked into the device. After the opcode has been clocked in, the device will begin outputting

Status Register data on the SO pin during every subsequent clock cycle. After the last bit (bit 0)

of the Status Register has been clocked out, the sequence will repeat itself starting again with bit

7 as long as the CS pin remains asserted and the clock pin is being pulsed. The data in the Sta-

tus Register is constantly being updated, so each repeating sequence will output new data.

Deasserting the CS pin will terminate the Read Status Register operation and put the SO pin

into a high-impedance state. The CS pin can be deasserted at any time and does not require

that a full byte of data be read.

Table 11-1. Status Register Format

Bit⁽¹⁾

Name

Type⁽²⁾

R/W

R

Description

0

1

0

1

0

1

Sector Protection Registers are unlocked (default).

Sector Protection Registers are locked.

Reserved for future use.

7

6

5

SPRL

RES

EPE

Sector Protection Registers Locked

Reserved for future use

Erase/Program Error

Erase or program operation was successful.

Erase or program error detected.

WP is asserted.

R

4

WPP

SWP

WEL

Write Protect (WP) Pin Status

Software Protection Status

Write Enable Latch Status

R

WP is deasserted.

All sectors are software unprotected (all Sector

Protection Registers are 0).

00

01

Some sectors are software protected. Read

individual Sector Protection Registers to determine

which sectors are protected.

3:2

10

11

Reserved for future use.

All sectors are software protected (all Sector

Protection Registers are 1 – default).

0

1

0

1

Device is not write enabled (default).

Device is write enabled.

1

0

R

Device is ready.

RDY/BSY Ready/Busy Status

Device is busy with an internal operation.

Notes: 1. Only bit 7 of the Status Register will be modified when using the Write Status Register command.

2. R/W = Readable and writable

R = Readable only

22

AT25DF021

3677D–DFLASH–04/09

AT25DF021

11.1.1

SPRL Bit

The SPRL bit is used to control whether the Sector Protection Registers can be modified or not.

When the SPRL bit is in the logical “1” state, all Sector Protection Registers are locked and can-

not be modified with the Protect Sector and Unprotect Sector commands (the device will ignore

these commands). In addition, the Global Protect and Global Unprotect features cannot be per-

formed. Any sectors that are presently protected will remain protected, and any sectors that are

presently unprotected will remain unprotected.

When the SPRL bit is in the logical “0” state, all Sector Protection Registers are unlocked and

can be modified (the Protect Sector and Unprotect Sector commands, as well as the Global Pro-

tect and Global Unprotect features, will be processed as normal). The SPRL bit defaults to the

logical “0” state after device power-up. The Reset command has no effect on the SPRL bit.

The SPRL bit can be modified freely whenever the WP pin is deasserted. However, if the WP pin

is asserted, then the SPRL bit may only be changed from a logical “0” (Sector Protection Regis-

ters are unlocked) to a logical “1” (Sector Protection Registers are locked). In order to reset the

SPRL bit back to a logical “0” using the Write Status Register command, the WP pin will have to

first be deasserted.

The SPRL bit is the only bit of the Status Register that can be user modified via the Write Status

Register command.

11.1.2

EPE Bit

The EPE bit indicates whether the last erase or program operation completed successfully or

not. If at least one byte during the erase or program operation did not erase or program properly,

then the EPE bit will be set to the logical “1” state. The EPE bit will not be set if an erase or pro-

gram operation aborts for any reason such as an attempt to erase or program a protected

region, or if the WEL bit is not set prior to an erase or program operation. The EPE bit will be

updated after every erase and program operation.

11.1.3

11.1.4

WPP Bit

The WPP bit can be read to determine if the WP pin has been asserted or not.

SWP Bits

The SWP bits provide feedback on the software protection status for the device. There are three

possible combinations of the SWP bits that indicate whether none, some, or all of the sectors

have been protected using the Protect Sector command or the Global Protect feature. If the

SWP bits indicate that some of the sectors have been protected, then the individual Sector Pro-

tection Registers can be read with the Read Sector Protection Registers command to determine

which sectors are in fact protected.

23

3677D–DFLASH–04/09

11.1.5

WEL Bit

The WEL bit indicates the current status of the internal Write Enable Latch. When the WEL bit is

in the logical “0” state, the device will not accept any Byte/Page Program, erase, Protect Sector,

Unprotect Sector, Program OTP Security Register, or Write Status Register commands. The

WEL bit defaults to the logical “0” state after a device power-up or reset operation. In addition,

the WEL bit will be reset to the logical “0” state automatically under the following conditions:

• Write Disable operation completes successfully

• Write Status Register operation completes successfully or aborts

• Protect Sector operation completes successfully or aborts

• Unprotect Sector operation completes successfully or aborts

• Program OTP Security Register operation completes successfully or aborts

• Byte/Page Program operation completes successfully or aborts

• Block Erase operation completes successfully or aborts

• Chip Erase operation completes successfully or aborts

• Hold condition aborts

If the WEL bit is in the logical “1” state, it will not be reset to a logical “0” if an operation aborts

due to an incomplete or unrecognized opcode being clocked into the device before the CS pin is

deasserted. In order for the WEL bit to be reset when an operation aborts prematurely, the entire

opcode for a Byte/Page Program, erase, Protect Sector, Unprotect Sector, Program OTP Secu-

rity Register, or Write Status Register command must have been clocked into the device.

11.1.6

RDY/BSY Bit

The RDY/BSY bit is used to determine whether or not an internal operation, such as a program

or erase, is in progress. To poll the RDY/BSY bit to detect the completion of a program or erase

cycle, new Status Register data must be continually clocked out of the device until the state of

the RDY/BSY bit changes from a logical “1” to a logical “0”.

Figure 11-1. Read Status Register

CS

0

1

2

3

4

5

6

7

8

9

10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30

SCK

SI

OPCODE

0

1

0

1

MSB

STATUS REGISTER

DATA

STATUS REGISTER

DATA

STATUS REGISTER

DATA

HIGH-IMPEDANCE

D

SO

MSB

24

AT25DF021

3677D–DFLASH–04/09

AT25DF021

11.2 Write Status Register

The Write Status Register command is used to modify the SPRL bit of the Status Register

and/or to perform a Global Protect or Global Unprotect operation. Before the Write Status Regis-

ter command can be issued, the Write Enable command must have been previously issued to

set the WEL bit in the Status Register to a logical “1”.

To issue the Write Status Register command, the CS pin must first be asserted and the opcode

of 01h must be clocked into the device followed by one byte of data. The one byte of data con-

sists of the SPRL bit value, a don’t care bit, four data bits to denote whether a Global Protect or

Unprotect should be performed, and two additional don’t care bits (see Table 11-2). Any addi-

tional data bytes that are sent to the device will be ignored. When the CS pin is deasserted, the

SPRL bit in the Status Register will be modified, and the WEL bit in the Status Register will be

reset back to a logical “0”. The values of bits 5, 4, 3, and 2 and the state of the SPRL bit before

the Write Status Register command was executed (the prior state of the SPRL bit) will determine

whether or not a Global Protect or Global Unprotect will be performed. Please refer to “Global

Protect/Unprotect” on page 15 for more details.

The complete one byte of data must be clocked into the device before the CS pin is deasserted,

and the CS pin must be deasserted on even byte boundaries (multiples of eight bits); otherwise,

the device will abort the operation, the state of the SPRL bit will not change, no potential Global

Protect or Unprotect will be performed, and the WEL bit in the Status Register will be reset back

to the logical “0” state.

If the WP pin is asserted, then the SPRL bit can only be set to a logical “1”. If an attempt is made

to reset the SPRL bit to a logical “0” while the WP pin is asserted, then the Write Status Register

Byte command will be ignored, and the WEL bit in the Status Register will be reset back to the

logical “0” state. In order to reset the SPRL bit to a logical “0”, the WP pin must be deasserted.

Table 11-2. Write Status Register Format

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0

SPRL

X

Global Protect/Unprotect

X

Figure 11-2. Write Status Register

CS

0

1

2

3

4

5

6

7

8

9

10 11 12 13 14 15

SCK

SI

OPCODE

STATUS REGISTER IN

0

1

D

X

D

X

MSB

HIGH-IMPEDANCE

SO

25

3677D–DFLASH–04/09

12. Other Commands and Functions

12.1 Read Manufacturer and Device ID

Identification information can be read from the device to enable systems to electronically query

and identify the device while it is in system. The identification method and the command opcode

comply with the JEDEC standard for “Manufacturer and Device ID Read Methodology for SPI

Compatible Serial Interface Memory Devices”. The type of information that can be read from the

device includes the JEDEC defined Manufacturer ID, the vendor specific Device ID, and the ven-

dor specific Extended Device Information.

Since not all Flash devices are capable of operating at very high clock frequencies, applications

should be designed to read the identification information from the devices at a reasonably low

clock frequency to ensure that all devices to be used in the application can be identified properly.

Once the identification process is complete, the application can then increase the clock fre-

quency to accommodate specific Flash devices that are capable of operating at the higher clock

frequencies.

To read the identification information, the CS pin must first be asserted and the opcode of 9Fh

must be clocked into the device. After the opcode has been clocked in, the device will begin out-

putting the identification data on the SO pin during the subsequent clock cycles. The first byte

that will be output will be the Manufacturer ID followed by two bytes of Device ID information.

The fourth byte output will be the Extended Device Information String Length, which will be 00h

indicating that no Extended Device Information follows. After the Extended Device Information

String Length byte is output, the SO pin will go into a high-impedance state; therefore, additional

clock cycles will have no affect on the SO pin and no data will be output. As indicated in the

JEDEC standard, reading the Extended Device Information String Length and any subsequent

data is optional.

Deasserting the CS pin will terminate the Manufacturer and Device ID read operation and put

the SO pin into a high-impedance state. The CS pin can be deasserted at any time and does not

require that a full byte of data be read.

Table 12-1. Manufacturer and Device ID Information

Byte No.

Data Type

Value

1Fh

43h

1

2

3

4

Manufacturer ID

Device ID (Part 1)

Device ID (Part 2)

00h

Extended Device Information String Length

00h

Table 12-2. Manufacturer and Device ID Details

Hex

Data Type

Bit 7

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0 Value Details

JEDEC Assigned Code

Manufacturer ID

1Fh

43h

00h

JEDEC Code:

0001 1111 (1Fh for Atmel)

0

1

0

1

0

1

0

Family Code

Density Code

0

Family Code:

Density Code:

010 (AT25DF/26DFxxx series)

00011 (2-Mbit)

Device ID (Part 1)

Device ID (Part 2)

1

Sub Code

0

1

Product Version Code

Sub Code:

Product Version: 00000 (Initial version)

000 (Standard series)

0

26

AT25DF021

3677D–DFLASH–04/09

AT25DF021

Figure 12-1. Read Manufacturer and Device ID

CS

0

6

7

8

14 15 16

22 23 24

30 31 32

38

SCK

SI

OPCODE

9Fh

HIGH-IMPEDANCE

1Fh

43h

00h

SO

MANUFACTURER ID

DEVICE ID

BYTE1

DEVICE ID

BYTE2

EXTENDED

DEVICE

INFORMATION

STRING LENGTH

Note: Each transition

shown for SI and SO represents one byte (8 bits)

12.2 Deep Power-Down

During normal operation, the device will be placed in the standby mode to consume less power

as long as the CS pin remains deasserted and no internal operation is in progress. The Deep

Power-Down command offers the ability to place the device into an even lower power consump-

tion state called the Deep Power-Down mode.

When the device is in the Deep Power-Down mode, all commands including the Read Status

Register command will be ignored with the exception of the Resume from Deep Power-Down

command. Since all commands will be ignored, the mode can be used as an extra protection

mechanism against program and erase operations.

Entering the Deep Power-Down mode is accomplished by simply asserting the CS pin, clocking

in the opcode of B9h, and then deasserting the CS pin. Any additional data clocked into the

device after the opcode will be ignored. When the CS pin is deasserted, the device will enter the

Deep Power-Down mode within the maximum time of t_EDPD

.

The complete opcode must be clocked in before the CS pin is deasserted, and the CS pin must

be deasserted on an even byte boundary (multiples of eight bits); otherwise, the device will abort

the operation and return to the standby mode once the CS pin is deasserted. In addition, the

device will default to the standby mode after a power-cycle.

The Deep Power-Down command will be ignored if an internally self-timed operation such as a

program or erase cycle is in progress. The Deep Power-Down command must be reissued after

the internally self-timed operation has been completed in order for the device to enter the Deep

Power-Down mode.

27

3677D–DFLASH–04/09

Figure 12-2. Deep Power-Down

CS

t_EDPD

0

1

2

3

4

5

6

7

SCK

OPCODE

1

0

1

0

1

SI

MSB

HIGH-IMPEDANCE

Active Current

SO

I_CC

Standby Mode Current

Deep Power-Down Mode Current

12.3 Resume from Deep Power-Down

In order to exit the Deep Power-Down mode and resume normal device operation, the Resume

from Deep Power-Down command must be issued. The Resume from Deep Power-Down com-

mand is the only command that the device will recognized while in the Deep Power-Down mode.

To resume from the Deep Power-Down mode, the CS pin must first be asserted and opcode of

ABh must be clocked into the device. Any additional data clocked into the device after the

opcode will be ignored. When the CS pin is deasserted, the device will exit the Deep Power-

Down mode within the maximum time of t_RDPDand return to the standby mode. After the device

has returned to the standby mode, normal command operations such as Read Array can be

resumed.

If the complete opcode is not clocked in before the CS pin is deasserted, or if the CS pin is not

deasserted on an even byte boundary (multiples of eight bits), then the device will abort the

operation and return to the Deep Power-Down mode.

Figure 12-3. Resume from Deep Power-Down

CS

t_RDPD

0

1

2

3

4

5

6

7

SCK

SI

OPCODE

1

0

1

0

1

0

1

MSB

HIGH-IMPEDANCE

Active Current

SO

I

CC

Standby Mode Current

Deep Power-Down Mode Current

28

AT25DF021

3677D–DFLASH–04/09

AT25DF021

12.4 Hold

The HOLD pin is used to pause the serial communication with the device without having to stop

or reset the clock sequence. The Hold mode, however, does not have an affect on any internally

self-timed operations such as a program or erase cycle. Therefore, if an erase cycle is in prog-

ress, asserting the HOLD pin will not pause the operation, and the erase cycle will continue until

it is finished.

The Hold mode can only be entered while the CS pin is asserted. The Hold mode is activated

simply by asserting the HOLD pin during the SCK low pulse. If the HOLD pin is asserted during

the SCK high pulse, then the Hold mode won’t be started until the beginning of the next SCK low

pulse. The device will remain in the Hold mode as long as the HOLD pin and CS pin are

asserted.

While in the Hold mode, the SO pin will be in a high-impedance state. In addition, both the SI pin

and the SCK pin will be ignored. The WP pin, however, can still be asserted or deasserted while

in the Hold mode.

To end the Hold mode and resume serial communication, the HOLD pin must be deasserted

during the SCK low pulse. If the HOLD pin is deasserted during the SCK high pulse, then the

Hold mode won’t end until the beginning of the next SCK low pulse.

If the CS pin is deasserted while the HOLD pin is still asserted, then any operation that may

have been started will be aborted, and the device will reset the WEL bit in the Status Register

back to the logical “0” state.

Figure 12-4. Hold Mode

CS

SCK

HOLD

Hold

29

3677D–DFLASH–04/09

13. System Considerations

In an effort to continue our goal of maintaining world-class quality leadership, Atmel has been

performing extensive testing on the AT25DF021 that would not normally be done with a Serial

Flash device. The testing that has been performed on the AT25DF021 involved extensive, non-

stop reading of the memory array on pre-conditioned devices. The pre-conditioning of the

devices, which entailed erasing and programming the entire memory array 10,000 times, was

done to simulate a customer environment and to exercise the memory cells to a certain degree.

The non-stop reading of the devices was done in three levels of granularity, with the first level

involving a continuous, looped read of 256 bytes (a single page) of memory, the second level

involving a continuous, looped-read of a 4-Kbyte (16 pages) portion of memory, and the third

level entailing non-stop reading of the entire memory array. Read operations were performed at

both +25°C and +125°C and with a supply voltage of 3.7V, which exceeds the specified

datasheet operating voltage range.

The results of all of the extensive tests indicate that the contents of a portion of memory being

read continuously could be altered after 800,000,000 read operations only if that portion of the

memory was not erased or reprogrammed at all during the 800,000,000 read operations. If that

portion of memory was reprogrammed at some point, then it would take another 800,000,000

read operations after reprogramming before the contents could potentially be altered. For exam-

ple, if the Serial Flash is being used for boot code storage, then it would take 800,000,000 boot

operations before that boot code may become altered, provided that the boot code was not

updated or reprogrammed. If an application was to read the entire memory array non-stop at a

clock frequency of 10MHz, it would take over 5 years to reach 800,000,000 read operations.

Atmel firmly believes that this extended testing result should not be a cause for concern. We

also believe that most, if not all, applications will never read the same portion of memory

800,000,000 times throughout the life of the application without ever updating that portion of

memory.

30

AT25DF021

3677D–DFLASH–04/09

AT25DF021

14. Electrical Specifications

14.1 Absolute Maximum Ratings*

Temperature under Bias ................................ -55°C to +125°C

*NOTICE:

Stresses beyond those listed under “Absolute

Maximum Ratings” may cause permanent dam-

age to the device. This is a stress rating only and

functional operation of the device at these or any

other conditions beyond those indicated in the

operational sections of this specification is not

implied. Exposure to absolute maximum rating

conditions for extended periods may affect

device reliability.

Storage Temperature..................................... -65°C to +150°C

All Input Voltages

(including NC Pins)

with Respect to Ground.....................................-0.6V to +4.1V

All Output Voltages

with Respect to Ground.............................-0.6V to V_CC+ 0.5V

14.2 DC and AC Operating Range

AT25DF021

(2.3V Version)

(2.7V Version)

Operating Temperature (Case)

V_CCPower Supply

Ind.

-40°C to 85°C

2.3V to 3.6V

2.7V to 3.6V

14.3 DC Characteristics

Symbol

Parameter

Condition

Min

Typ

Max

Units

CS, WP, HOLD = V_CC

,

I_SB

Standby Current

25

50

µA

all inputs at CMOS levels

CS, WP, HOLD = V_CC

,

I_DPD

Deep Power-down Current

15

11

10

9

25

16

15

14

12

10

all inputs at CMOS levels

f = 66 MHz; I_OUT= 0 mA;

CS = V_IL, V_CC= Max

f = 66 MHz; I_OUT= 0 mA;

CS = V_IL, V_CC= Max

f = 50 MHz; I_OUT= 0 mA;

CS = V_IL, V_CC= Max

I_CC1

Active Current, Read Operation

mA

f = 33 MHz; I_OUT= 0 mA;

CS = V_IL, V_CC= Max

8

f = 20 MHz; I_OUT= 0 mA;

CS = V_IL, V_CC= Max

7

I_CC2

I_CC3

I_LI

Active Current, Program Operation

Active Current, Erase Operation

Input Leakage Current

CS = V_CC, V_CC= Max

V_IN= CMOS levels

V_OUT= CMOS levels

12

14

18

mA

µA

V

20

1

I_LO

Output Leakage Current

Input Low Voltage

V_IL

0.3 x V_CC

31

3677D–DFLASH–04/09

14.3 DC Characteristics (Continued)

Symbol

V_IH

Parameter

Condition

Min

Typ

Max

Units

Input High Voltage

Output Low Voltage

Output High Voltage

0.7 x V_CC

V

V_OL

I_OL= 1.6 mA; V_CC= Min

I_OH= -100 µA; V_CC= Min

0.4

V_OH

V_CC- 0.2V

14.4 AC Characteristics - Maximum Clock Frequencies

AT25DF021

(2.3V Version)

(2.7V Version)

Symbol

Parameter

Min Max

Min

Max

Units

Maximum Clock Frequency for All Operations

(excluding 03h opcode)

f_CLK

50

33

66

33

MHz

Maximum Clock Frequency for 03h Opcode

(Read Array – Low Frequency)

f_RDLF

MHz

14.5 AC Characteristics – All Other Parameters

AT25DF021

(2.3V Version)

AT25DF021

(2.7V Version)

Symbol

t_CLKH

Parameter

Min Max

Units

ns

Clock High Time

8.0

0.1

50

5

6.4

0.1

50

5

t_CLKL

Clock Low Time

ns

(1)

t_CLKR

Clock Rise Time, Peak-to-Peak (Slew Rate)

Clock Fall Time, Peak-to-Peak (Slew Rate)

Chip Select High Time

V/ns

ns

(1)

t_CLKF

t_CSH

t_CSLS

t_CSLH

t_CSHS

t_CSHH

t_DS

Chip Select Low Setup Time (relative to Clock)

Chip Select Low Hold Time (relative to Clock)

Chip Select High Setup Time (relative to Clock)

Chip Select High Hold Time (relative to Clock)

Data In Setup Time

ns

5

ns

5

ns

5

ns

2

ns

t_DH

Data In Hold Time

3

ns

(1)

t_DIS

Output Disable Time

7

6

ns

(2)

t_V

Output Valid Time

ns

t_OH

Output Hold Time

0

5

0

5

ns

t_HLS

t_HLH

t_HHS

t_HHH

HOLD Low Setup Time (relative to Clock)

HOLD Low Hold Time (relative to Clock)

HOLD High Setup Time (relative to Clock)

HOLD High Hold Time (relative to Clock)

HOLD Low to Output High-Z

HOLD High to Output Low-Z

ns

(1)

t_HLQZ

7

6

ns

(1)

t_HHQX

ns

32

AT25DF021

3677D–DFLASH–04/09

AT25DF021

14.5 AC Characteristics – All Other Parameters (Continued)

AT25DF021

(2.3V Version)

AT25DF021

(2.7V Version)

Symbol

Parameter

Min Max

Units

ns

(1)(3)

t_WPS

Write Protect Setup Time

20

(1)(3)

t_WPH

Write Protect Hold Time

100

ns

(1)

t_SECP

Sector Protect Time (from Chip Select High)

Sector Unprotect Time (from Chip Select High)

Chip Select High to Deep Power-Down

Chip Select High to Standby Mode

20

3

20

3

ns

(1)

t_SECUP

ns

(1)

t_EDPD

µs

(1)

t_RDPD

30

µs

Notes: 1. Not 100% tested (value guaranteed by design and characterization).

2. 15 pF load at frequencies above 66 MHz, 30 pF otherwise.

3. Only applicable as a constraint for the Write Status Register command when SPRL = 1.

14.6 Program and Erase Characteristics

Symbol

Parameter

Min

Typ

1.0

7

Max

Units

ms

(1)

t_PP

Page Program Time (256 Bytes)

Byte Program Time

5.0

t_BP

µs

4 Kbytes

32 Kbytes

64 Kbytes

50

200

600

950

3.5

(1)

t_BLKE

Block Erase Time

250

450

2.0

200

ms

(1)(2)

t_CHPE

Chip Erase Time

sec

µs

(1)

t_OTPP

OTP Security Register Program Time

Write Status Register Time

500

200

(2)

t_WRSR

ns

Note:

1. Maximum values indicate worst-case performance after 100,000 erase/program cycles.

2. Not 100% tested (value guaranteed by design and characterization).

14.7 Power-up Conditions

Symbol

t_VCSL

Parameter

Min

Max

Units

ms

V

Minimum V_CCto Chip Select Low Time

Power-up Device Delay Before Program or Erase Allowed

Power-on Reset Voltage

1.2

t_PUW

10

V_POR

1.5

2.2

33

3677D–DFLASH–04/09

14.8 Input Test Waveforms and Measurement Levels

0.9V_CC

AC

DRIVING

LEVELS

V_CC/2

MEASUREMENT

LEVEL

0.1V_CC

t_R, t_F< 2 ns (10% to 90%)

14.9 Output Test Load

DEVICE

UNDER

TEST

15 pF (frequencies above 66 MHz)

or

30pF

34

AT25DF021

3677D–DFLASH–04/09

AT25DF021

15. AC Waveforms

Figure 15-1. Serial Input Timing

t_CSH

CS

t_CSLS

t_CSLH

t_CLKL

t_CSHH

t_CLKH

t_CSHS

SCK

t_DS

t_DH

MSB

LSB

MSB

SI

HIGH-IMPEDANCE

SO

Figure 15-2. Serial Output Timing

CS

t_CLKH

t_CLKL

t_DIS

SCK

SI

t_OH

t_V

SO

Figure 15-3. WP Timing for Write Status Register Command When SPRL = 1

CS

t_WPS

t_WPH

WP

SCK

SI

0

X

MSB

MSB OF

WRITE STATUS REGISTER

OPCODE

LSB OF

WRITE STATUS REGISTER

DATA BYTE

MSB OF

NEXT OPCODE

HIGH-IMPEDANCE

SO

35

3677D–DFLASH–04/09

Figure 15-4. HOLD Timing – Serial Input

CS

SCK

t_HHH

t_HLS

t_HLH

t_HHS

HOLD

SI

HIGH-IMPEDANCE

SO

Figure 15-5. HOLD Timing – Serial Output

CS

SCK

t_HHH

t_HLS

t_HLH

t_HHS

HOLD

SI

t_HLQZ

SO

t_HHQX

36

AT25DF021

3677D–DFLASH–04/09

AT25DF021

16. Ordering Information

16.1 Ordering Code Detail

A T 2 5 D F 0 2 1 – S S H F – B

Atmel Designator

Product Family

Shipping Carrier Option

B = Bulk (tubes)

Y = Bulk (trays)

T = Tape and reel

Operating Voltage

Blank = 2.7V minimum (2.7V to 3.6V)

F

= 2.3V minimum (2.3V to 3.6V)

Device Density

Device Grade

H = Green, NiPdAu lead finish, industrial

temperature range (–40°C to +85°C)

02 = 2-megabit

Interface

1 = Serial

Package Option

SS = 8-lead, 0.150" wide SOIC

M

= 8-pad 5 x 6 x 0.6 mm UDFN

16.2 Green Package Options (Pb/Halide-free/RoHS Compliant)

Max. Freq.

Ordering Code

Package

Lead Finish

Operating Voltage

(MHz)

Operation Range

AT25DF021-SSH-B

AT25DF021-SSH-T

8S1

NiPdAu

2.7V to 3.6V

70

AT25DF021-MH-Y

AT25DF021-MH-T

8MA1

8S1

Industrial

(-40°C to +85°C)

AT25DF021-SSHF-B

AT25DF021-SSHF-T

NiPdAu

2.3V to 3.6V

50

AT25DF021-MHF-Y

AT25DF021-MHF-T

8MA1

Note:

The shipping carrier option code is not marked on the devices.

Package Type

8-lead, 0.150" Wide, Plastic Gull Wing Small Outline Package (JEDEC SOIC)

8-pad, 5 x 6 x 0.6 mm, Thermally Enhanced Ultra Thin Dual Flat No Lead Package (UDFN)

8S1

8MA1

37

3677D–DFLASH–04/09

17. Packaging Information

17.1 8S1 – JEDEC SOIC

C

1

E

E1

L

N

Ø

TOP VIEW

END VIEW

e

b

COMMON DIMENSIONS

(Unit of Measure = mm)

A

MIN

MAX

NOM

NOTE

SYMBOL

A1

0.10

–

0.25

D

SIDE VIEW

Note:

These drawings are for general information only. Refer to JEDEC Drawing MS-012, Variation AA for proper dimensions, tolerances, datums, etc.

3/17/05

TITLE

DRAWING NO.

REV.

1150 E. Cheyenne Mtn. Blvd.

Colorado Springs, CO 80906

8S1, 8-lead (0.150" Wide Body), Plastic Gull Wing

8S1

C

Small Outline (JEDEC SOIC)

R

38

AT25DF021

3677D–DFLASH–04/09

AT25DF021

17.2 8MA1 – UDFN

E

C

Pin 1 ID

SIDE VIEW

D

y

TOP VIEW

A1

A

K

E2

Option A

0.45

Pin #1

8

1

2

3

Pin #1 Notch

(0.20 R)

Chamfer

(C 0.35)

COMMON DIMENSIONS

(Unit of Measure = mm)

(Option B)

MIN

MAX

NOM

NOTE

SYMBOL

7

A

0.45

0.55

0.60

e

D2

A1

b

0.00

0.35

0.02

0.40

0.152 REF

5.00

4.00

6.00

3.40

1.27

0.60

–

0.05

0.48

6

C

D

D2

E

4.90

3.80

5.90

3.20

5.10

4.20

6.10

3.60

5

4

b

BOTTOM VIEW

L

E2

e

L

0.50

0.00

0.20

0.75

0.08

–

y

K

–

4/15/08

GPC

YFG

DRAWING NO.

TITLE

REV.

8MA1, 8-pad (5 x 6 x 0.6 mm Body), Thermally

Enhanced Plastic Ultra Thin Dual Flat No Lead

Package (UDFN)

Package Drawing Contact:

packagedrawings@atmel.com

8MA1

D

39

3677D–DFLASH–04/09

18. Revision History

Revision Level – Release Date History

A – February 2008

Initial release

Changed Deep Power-Down current specifications

– Changed typical value from 4 µA to 8 µA

– Changed maximum value from 8 µA to 15 µA

Changed typical 64 KB Block Erase time from 400 ms to 450 ms

Changed typical Chip Erase time from 1.5s to 2.0s

Changed t_VCSLtime from 1.0 ms minimum to 1.2 ms minimum

Changed V_PORmaximum from 2.5V to 2.2V

B – May 2008

Removed “Preliminary” designation from datasheet

Changed maximum clock frequency from 70 MHz to 66 MHz

Changed maximum Standby Current value from 35 µA to 50 µA

Changed Deep Power-Down Current specifications

– Changed typical value from 8 µA to 15 µA

C – September 2008

D – April 2009

– Changed maximum value from 15 µA to 25 µA

Added System Considerations Section

40

AT25DF021

3677D–DFLASH–04/09

Headquarters

International

Atmel Corporation

2325 Orchard Parkway

San Jose, CA 95131

USA

Tel: 1(408) 441-0311

Fax: 1(408) 487-2600

Atmel Asia

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Tel: (852) 2721-9778

Fax: (852) 2722-1369

Atmel Europe

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Japan

Tel: (81) 3-3523-3551

Fax: (81) 3-3523-7581

8, Rue Jean-Pierre Timbaud

BP 309

78054 Saint-Quentin-en-

Yvelines Cedex

France

Tel: (33) 1-30-60-70-00

Fax: (33) 1-30-60-71-11

Product Contact

Web Site

Technical Support

Sales Contact

www.atmel.com

dataflash@atmel.com

www.atmel.com/contacts

Literature Requests

www.atmel.com/literature

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3677D–DFLASH–04/09