S-8239AAF-M6T1U [ABLIC]

OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK;
S-8239AAF-M6T1U
型号: S-8239AAF-M6T1U
厂家: ABLIC    ABLIC
描述:

OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK

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S-8239A Series  
OVERCURRENT MONITORING IC  
FOR MULTI-SERIAL-CELL PACK  
www.ablic.com  
© ABLIC Inc., 2013-2019  
Rev.1.5_00  
The S-8239A Series is an overcurrent monitoring IC for multi-serial-cell pack including high-accuracy voltage detection  
circuits and delay circuits.  
The S-8239A Series is suitable for protection of lithium-ion / lithium polymer rechargeable battery packs from overcurrent.  
Features  
Built-in high-accuracy voltage detection circuit  
Overcurrent 1 detection voltage*1  
Overcurrent 2 detection voltage  
Overcurrent 3 detection voltage  
0.04 V to 0.30 V (10 mV step)  
0.1 V to 0.7 V (100 mV step)  
1.2 V (Fixed)  
Accuracy 15 mV  
Accuracy 100 mV  
Accuracy 300 mV  
Built-in three-step overcurrent detection circuit: Overcurrent 1, overcurrent 2, overcurrent 3  
Overcurrent 3 detection function:  
UVLO (under voltage lock out) function  
UVLO detection voltage  
Available, unavailable  
2.0 V (Fixed)  
Accuracy 100 mV  
High-withstand voltage:  
VM pin, DO pin: Absolute maximum rating 28 V  
Delay times are generated only by an internal circuit (External capacitors are unnecessary).  
Low current consumption  
During normal operation:  
7.0 μA max.  
During UVLO operation:  
6.0 μA max.  
Output logic:  
Active "L", Active "H"  
Wide operation temperature range:  
Lead-free (Sn 100%), halogen-free  
Ta = 40°C to +85°C  
*1. Overcurrent 1 detection voltage 0.06 V should be satisfied in the case of overcurrent 2 detection voltage = 0.1 V.  
Overcurrent 1 detection voltage 0.85 × overcurrent 2 detection voltage 0.05 V should be satisfied in the case of  
overcurrent 2 detection voltage 0.2 V.  
Applications  
Lithium-ion rechargeable battery pack  
Lithium polymer rechargeable battery pack  
Package  
SOT-23-6  
1
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Block Diagram  
DP  
DO  
+
VDD  
Delay circuit  
output control circuit  
UVLO detection  
comparator  
+
VM  
Overcurrent latch  
comparator  
RVMS  
+
Overcurrent 1  
detection comparator  
+
VINI  
Overcurrent 2  
detection comparator  
+
Overcurrent 3  
detection comparator  
VSS  
Remark All the diodes shown in the figure are parasitic diodes.  
Figure 1  
2
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Product Name Structure  
1. Product name  
S-8239A xx  
-
M6T1  
U
Environmental code  
U: Lead-free (Sn 100%), halogen-free  
Package abbreviation and IC packing specifications*1  
M6T1: SOT-23-6, Tape  
Serial code*2  
Sequentially set from AA to ZZ  
*1. Refer to the tape drawing.  
*2. Refer to "3. Product name list".  
2. Package  
Table 1 Package Drawing Codes  
Package Name  
SOT-23-6  
Dimension  
Tape  
Reel  
MP006-A-P-SD  
MP006-A-C-SD  
MP006-A-R-SD  
3. Product name list  
Table 2  
Overcurrent 1  
Detection  
Voltage  
Overcurrent 2  
Detection  
Voltage  
Overcurrent 1  
Detection  
Delay Time  
Overcurrent 2  
Detection  
Delay Time  
Overcurrent 3  
Detection  
Function  
Product Name  
Output Logic  
[VDIOV1  
]
[VDIOV2  
]
[tDIOV1  
]
[tDIOV2]  
S-8239AAA-M6T1U  
S-8239AAB-M6T1U  
S-8239AAC-M6T1U  
S-8239AAD-M6T1U  
S-8239AAE-M6T1U  
S-8239AAF-M6T1U  
S-8239AAG-M6T1U  
S-8239AAH-M6T1U  
S-8239AAI-M6T1U  
S-8239AAJ-M6T1U  
S-8239AAK-M6T1U  
0.08 V  
0.10 V  
0.10 V  
0.10 V  
0.10 V  
0.04 V  
0.10 V  
0.06 V  
0.10 V  
0.11 V  
0.10 V  
0.4 V  
0.5 V  
0.3 V  
0.2 V  
0.7 V  
0.3 V  
0.2 V  
0.1 V  
0.3 V  
0.3 V  
0.3 V  
1150 ms  
1150 ms  
18.0 ms  
290 ms  
18.0 ms  
4600 ms  
1150 ms  
290 ms  
290 ms  
4600 ms  
290 ms  
1.12 ms  
0.28 ms  
0.28 ms  
0.56 ms  
0.56 ms  
0.28 ms  
1.12 ms  
0.56 ms  
0.28 ms  
2.24 ms  
1.12 ms  
Unavailable  
Unavailable  
Unavailable  
Unavailable  
Unavailable  
Unavailable  
Available  
Active "L"  
Active "L"  
Active "L"  
Active "L"  
Active "L"  
Active "L"  
Active "L"  
Active "L"  
Active "L"  
Unavailable  
Unavailable  
Available  
Active "L"  
Active "H"  
Available  
Remark Contact our sales representatives for products other than the above.  
3
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Pin Configuration  
1. SOT-23-6  
Table 3  
Top view  
Pin No.  
1
Symbol  
VINI  
Description  
6
5
4
Voltage detection pin between VINI pin and VSS pin  
(Overcurrent detection pin)  
2
3
4
5
6
VM  
Overcurrent latch pin  
DO  
Connection pin of discharge control FET gate  
Test pin for delay time measurement  
Input pin for positive power supply  
Input pin for negative power supply  
1
2
3
DP*1  
VDD  
VSS  
Figure 2  
*1. The DP pin should be open.  
4
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Absolute Maximum Ratings  
Table 4  
Symbol  
(Ta = +25°C unless otherwise specified)  
Item  
Applied pin  
Absolute Maximum Rating  
VSS 0.3 to VSS +12  
VDD 28 to VDD + 0.3  
VSS 0.3 to VSS + 12  
VSS 0.3 to VSS + 28  
650*1  
Unit  
V
Input voltage between VDD pin and VSS pin VDS  
VDD  
VM  
VINI  
DO  
VM pin input voltage  
VINI pin input voltage  
DO pin output voltage  
Power dissipation  
VVM  
VVINI  
VDO  
PD  
V
V
V
mW  
°C  
°C  
Operation ambient temperature  
Storage temperature  
Topr  
Tstg  
40 to +85  
55 to +125  
*1. When mounted on board  
[Mounted board]  
(1) Board size:  
114.3 mm × 76.2 mm × t1.6 mm  
(2) Board name:  
JEDEC STANDARD51-7  
Caution 1. The DP pin should be open.  
2. The absolute maximum ratings are rated values exceeding which the product could suffer physical  
damage. These values must therefore not be exceeded under any conditions.  
700  
600  
500  
400  
300  
200  
100  
0
100  
150  
50  
0
Ambient temperature (Ta) [°C]  
Figure 3 Power Dissipation of Package (When Mounted on Board)  
5
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Electrical Characteristics  
1. Ta = +25°C  
Table 5  
(Ta = +25°C unless otherwise specified)  
Test  
Condition Circuit  
Test  
Item  
Symbol  
Condition  
Min.  
Typ. Max. Unit  
Detection Voltage  
VDIOV1  
0.015  
VDIOV2  
VDIOV1  
+ 0.015  
VDIOV2  
Overcurrent 1 detection voltage VDIOV1  
Overcurrent 2 detection voltage*1 VDIOV2  
Overcurrent 3 detection voltage VDIOV3  
VDIOV1  
V
V
1
1
1
1
VDIOV2  
0.100  
+ 0.100  
With overcurrent 3 detection  
function  
0.90  
1.90  
1.20  
2.00  
1.50  
2.10  
V
V
1
1
1
1
UVLO detection voltage  
Release Voltage  
VUVLO  
Overcurrent release voltage  
VRIOV VDD criteria, VDD = 3.5 V  
0.7  
1.5  
1.2  
1.5  
8
V
V
1
1
Input Voltage, Operation Voltage  
Operation voltage between  
VDD pin and VSS pin  
VDSOP Output logic is determined*2  
Current Consumption  
Current consumption during  
normal operation  
Current consumption during  
UVLO operation  
IOPE  
VDD = 3.5 V, VVM = 0 V  
VDD = VVM = 1.5 V  
1.0  
0.7  
3.5  
3.0  
7.0  
6.0  
2
2
2
2
μA  
μA  
IUVLO  
Internal Resistance  
Internal resistance between  
VM pin and VSS pin  
Output Resistance (Active "L")  
DO pin resistance "L"  
RVMS  
RDOL  
RDOL  
VDD = VVM = 3.5 V  
210  
2.5  
2.5  
300  
5
390  
10  
3
4
4
3
4
4
kΩ  
kΩ  
kΩ  
VDD = VVINI = 3.5 V, VDO = 0.5 V  
Output Resistance (Active "H")  
VDD = 3.5 V, VVINI = 0 V  
DO pin resistance "L"  
5
10  
VDO = 0.5 V  
Delay Time  
tDIOV1  
× 0.6  
tDIOV2  
× 0.6  
tDIOV1  
× 1.4  
tDIOV2  
× 1.4  
Overcurrent 1 detection delay  
time  
tDlOV1  
tDlOV2  
tDIOV1  
tDIOV2  
ms  
ms  
5
5
5
5
Overcurrent 2 detection delay  
time  
Overcurrent 3 detection delay  
time  
With overcurrent 3 detection  
function  
tDlOV3  
tUVLO  
168  
280  
392  
μs  
5
5
5
5
UVLO detection delay time  
2.94  
4.90  
6.86  
s
*1. Even if overcurrent 1 detection voltage and overcurrent 2 detection voltage are in the same range, VDIOV1 is lower than  
VDIOV2  
.
*2. It indicates that DO pin output logic is determined.  
6
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
2. Ta = 40°C to +85°C*1  
Table 6  
Condition  
(Ta = 40°C to +85°C*1 unless otherwise specified)  
Test  
Test  
Item  
Symbol  
Min.  
Typ. Max. Unit  
Condition Circuit  
Detection Voltage  
VDIOV1  
0.021  
VDIOV2  
VDIOV1  
+ 0.021  
VDIOV2  
Overcurrent 1 detection voltage VDIOV1  
Overcurrent 2 detection voltage*2 VDIOV2  
Overcurrent 3 detection voltage VDIOV3  
VDIOV1  
V
V
1
1
1
1
VDIOV2  
0.130  
+ 0.130  
With overcurrent 3 detection  
function  
0.70  
1.85  
1.20  
2.00  
1.70  
2.15  
V
V
1
1
1
1
UVLO detection voltage  
Release Voltage  
VUVLO  
Overcurrent release voltage  
VRIOV  
VDD criteria, VDD = 3.5 V  
0.5  
1.5  
1.2  
1.7  
8
V
V
1
1
Input Voltage, Operation Voltage  
Operation voltage between  
VDD pin and VSS pin  
VDSOP  
Output logic is determined*3  
Current Consumption  
Current consumption during  
normal operation  
Current consumption during  
UVLO operation  
IOPE  
VDD = 3.5 V, VVM = 0 V  
VDD = VVM = 1.5 V  
0.7  
0.5  
3.5  
3.0  
8.0  
7.0  
2
2
2
2
μA  
μA  
IUVLO  
Internal Resistance  
Internal resistance between  
VM pin and VSS pin  
Output Resistance (Active "L")  
DO pin resistance "L"  
RVMS  
RDOL  
RDOL  
VDD = VVM = 3.5 V  
150  
1.2  
1.2  
300  
5
450  
15  
3
4
4
3
4
4
kΩ  
kΩ  
kΩ  
VDD = VVINI = 3.5 V, VDO = 0.5 V  
Output Resistance (Active "H")  
VDD = 3.5 V, VVINI = 0 V  
DO pin resistance "L"  
5
15  
VDO = 0.5 V  
Delay Time  
tDIOV1  
× 0.2  
tDIOV2  
× 0.2  
tDIOV1  
× 1.8  
tDIOV2  
× 1.8  
Overcurrent 1 detection delay  
time  
tDlOV1  
tDlOV2  
tDIOV1  
tDIOV2  
ms  
ms  
5
5
5
5
Overcurrent 2 detection delay  
time  
Overcurrent 3 detection delay  
time  
With overcurrent 3 detection  
function  
tDlOV3  
tUVLO  
56  
280  
504  
μs  
5
5
5
5
UVLO detection delay time  
0.98  
4.90  
8.82  
s
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is  
guaranteed by design, not tested in production.  
*2. Even if overcurrent 1 detection voltage and overcurrent 2 detection voltage are in the same range, VDIOV1 is lower than  
VDIOV2  
.
*3. It indicates that DO pin output logic is determined.  
7
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Test Circuits  
Caution Unless otherwise specified, the output voltage levels "H" and "L" at the DO pin (VDO) are judged by  
the threshold voltage (1.0 V) of the N-channel FET. Judge the DO pin level with respect to VSS  
.
1. Overcurrent 1 detection voltage, overcurrent 2 detection voltage, overcurrent release voltage,  
UVLO detection voltage  
(Test condition 1, test circuit 1)  
1. 1 Active "L"  
The overcurrent 1 detection voltage (VDIOV1) is defined as the voltage V2 whose delay time for changing VDO from  
"H" to "L" lies between the minimum and the maximum value of the overcurrent 1 detection delay time after the  
voltage V2 is increased instantaneously (within 10 μs) from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
The overcurrent 2 detection voltage (VDIOV2) is defined as the voltage V2 whose delay time for changing VDO from  
"H" to "L" lies between the minimum and the maximum value of the overcurrent 2 detection delay time after the  
voltage V2 is increased instantaneously (within 10 μs) from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
The overcurrent release voltage (VRIOV) is defined as the voltage V3 at which VDO goes from "L" to "H" after  
decreasing V2 to 0 V and the voltage V3 is increased gradually from the set conditions of V1 = V2 = 3.5 V, V3 =  
0 V.  
The UVLO detection voltage (VUVLO) is defined as the voltage V1 at which VDO goes from "H" to "L" after the  
voltages V1 and V3 are decreased gradually from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
1. 2 Active "H"  
The overcurrent 1 detection voltage (VDIOV1) is defined as the voltage V2 whose delay time for changing VDO from  
"L" to "H" lies between the minimum and the maximum value of the overcurrent 1 detection delay time after the  
voltage V2 is increased instantaneously (within 10 μs) from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
The overcurrent 2 detection voltage (VDIOV2) is defined as the voltage V2 whose delay time for changing VDO from  
"L" to "H" lies between the minimum and the maximum value of the overcurrent 2 detection delay time after the  
voltage V2 is increased instantaneously (within 10 μs) from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
The overcurrent release voltage (VRIOV) is defined as the voltage V3 at which VDO goes from "H" to "L" after  
decreasing V2 to 0 V and the voltage V3 is increased gradually from the set conditions of V1 = V2 = 3.5 V, V3 =  
0 V.  
The UVLO detection voltage (VUVLO) is defined as the voltage V1 at which VDO goes from "L" to "H" after the  
voltages V1 and V3 are decreased gradually from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
2. Overcurrent 3 detection voltage (With overcurrent 3 detection function)  
(Test condition 1, test circuit 1)  
2. 1 Active "L"  
The overcurrent 3 detection voltage (VDIOV3) is defined as the voltage V2 whose delay time for changing VDO from  
"H" to "L" lies between the minimum and the maximum value of the overcurrent 3 detection delay time after the  
voltage V2 is increased instantaneously (within 10 μs) from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
2. 2 Active "H"  
The overcurrent 3 detection voltage (VDIOV3) is defined as the voltage V2 whose delay time for changing VDO from  
"L" to "H" lies between the minimum and the maximum value of the overcurrent 3 detection delay time after the  
voltage V2 is increased instantaneously (within 10 μs) from the set conditions of V1 = V3 = 3.5 V, V2 = 0 V.  
3. Current consumption during normal operation, current consumption during UVLO operation  
(Test condition 2, test circuit 2)  
The current consumption during normal operation (IOPE) is the current that flows through the VDD pin (IDD) under the  
set conditions of V1 = 3.5 V, V2 = 0 V.  
The current consumption during UVLO operation (IUVLO) is IDD under the set conditions of V1 = V2 = 1.5 V.  
4. Internal resistance between VM pin and VSS pin  
(Test condition 3, test circuit 3)  
The internal resistance between the VM pin and the VSS pin (RVMS) is the resistance between the VM pin and the  
VSS pin under the set condition of V1 = V2 = V3 = 3.5 V.  
8
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
5. DO pin resistance "L"  
(Test condition 4, test circuit 4)  
5. 1 Active "L"  
The DO pin resistance "L" (RDOL) is the DO pin resistance under the set conditions of V1 = V2 = 3.5 V, V3 = 0.5 V.  
5. 2 Active "H"  
The DO pin resistance "L" (RDOL) is the DO pin resistance under the set conditions of V1 = 3.5 V, V2 = 0 V, V3 =  
0.5 V.  
6. Overcurrent 1 detection delay time  
(Test condition 5, test circuit 5)  
6. 1 Active "L"  
6. 1. 1 VDIOV2 = 0.1 V  
The overcurrent 1 detection delay time (tDIOV1) is the time period from when the voltage V2 exceeds VDIOV1 to  
when VDO goes to "L", after V2 is increased to 0.08V instantaneously (within 10 μs) under the set conditions of  
V1 = 3.5 V, V2 = 0 V.  
6. 1. 2 VDIOV2 0.2 V  
The overcurrent 1 detection delay time (tDIOV1) is the time period from when the voltage V2 exceeds VDIOV1 to  
when VDO goes to "L", after V2 is increased to VDIOV1 max. + 0.01 V instantaneously (within 10 μs) under the set  
conditions of V1 = 3.5 V, V2 = 0 V.  
6. 2 Active "H"  
6. 2. 1 VDIOV2 = 0.1 V  
The overcurrent 1 detection delay time (tDIOV1) is the time period from when the voltage V2 exceeds VDIOV1 to  
when VDO goes to "H", after V2 is increased to 0.08V instantaneously (within 10 μs) under the set conditions of  
V1 = 3.5 V, V2 = 0 V.  
6. 2. 2 VDIOV2 0.2 V  
The overcurrent 1 detection delay time (tDIOV1) is the time period from when the voltage V2 exceeds VDIOV1 to  
when VDO goes to "H", after V2 is increased to VDIOV1 max. + 0.01 V instantaneously (within 10 μs) under the set  
conditions of V1 = 3.5 V, V2 = 0 V.  
7. Overcurrent 2 detection delay time, UVLO detection delay time  
(Test condition 5, test circuit 5)  
7. 1 Active "L"  
The overcurrent 2 detection delay time (tDIOV2) is the time period from when the voltage V2 exceeds VDIOV2 to when  
VDO goes to "L", after V2 is increased to 0.9 V instantaneously (within 10 μs) under the set conditions of V1 = 3.5 V,  
V2 = 0 V.  
The UVLO detection delay time (tUVLO) is the time period from when the voltage V1 falls below VUVLO to when VDO  
goes to "L", after V1 is decreased to 1.8 V instantaneously (within 10 μs) under the set conditions of V1 = 3.5 V, V2  
= 0 V.  
7. 2 Active "H"  
The overcurrent 2 detection delay time (tDIOV2) is the time period from when the voltage V2 exceeds VDIOV2 to when  
VDO goes to "H", after V2 is increased to 0.9 V instantaneously (within 10 μs) under the set conditions of V1 = 3.5  
V, V2 = 0 V.  
The UVLO detection delay time (tUVLO) is the time period from when the voltage V1 falls below VUVLO to when VDO  
goes to "H", after V1 is decreased to 1.8 V instantaneously (within 10 μs) under the set conditions of V1 = 3.5 V, V2  
= 0 V.  
9
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
8. Overcurrent 3 detection delay time (With overcurrent 3 detection function)  
(Test condition 5, test circuit 5)  
8. 1 Active "L"  
The overcurrent 3 detection delay time (tDIOV3) is the time period from when the voltage V2 exceeds VDIOV3 to when  
DO goes to "L", after V2 is increased to 1.6 V instantaneously (within 10 μs) under the set conditions of V1 = 3.5 V,  
V
V2 = 0 V.  
8. 2 Active "H"  
The overcurrent 3 detection delay time (tDIOV3) is the time period from when the voltage V2 exceeds VDIOV3 to when  
VDO goes to "H", after V2 is increased to 1.6 V instantaneously (within 10 μs) under the set conditions of V1 =  
3.5 V, V2 = 0 V.  
10  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
IDD  
DP  
VM  
VDD  
VSS  
A
DP  
VM  
VDD  
VSS  
V1  
V1  
S-8239A Series  
S-8239A Series  
V3  
DO  
VINI  
DO  
VINI  
100 kΩ  
V2  
V
VDO  
V2  
COM  
COM  
Figure 5 Test Circuit 2  
Figure 4 Test Circuit 1  
DP  
VM  
VDD  
DP  
VM  
VDD  
VSS  
V1  
S-8239A Series  
VSS  
S-8239A Series  
V1  
VINI  
DO  
DO  
VINI  
A
IVM  
V3  
A
IDO  
V3  
V2  
V2  
COM  
COM  
Figure 7 Test Circuit 4  
Figure 6 Test Circuit 3  
DP  
VDD  
VSS  
V1  
S-8239A Series  
VM  
DO  
VINI  
100 kΩ  
V2  
Oscilloscope  
Figure 8 Test Circuit 5  
COM  
11  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Operation  
1. Normal status  
The S-8239A Series monitors the voltage between the VINI pin and the VSS pin to control discharging. When the  
VINI pin voltage is equal to or lower than the overcurrent 1 detection voltage (VDIOV1), the DO pin becomes "High-Z"  
(Active "L") or VSS potential (Active "H"). This status is called the normal status.  
Caution When a battery is connected for the first time, the S-8239A Series may not be in the normal status.  
In this case, short the VM pin and VSS pin or connect the charger. The S-8239A Series then  
becomes the normal status.  
2. Overcurrent status (Overcurrent 1, overcurrent 2, overcurrent 3)  
When a battery is in the normal status, if the VINI pin voltage is equal to or higher than the overcurrent detection  
voltage because the discharge current is equal to or higher than the specified value and the status continues for the  
overcurrent detection delay time or longer, the DO pin becomes VSS potential (Active "L") or "High-Z" (Active "H").  
This status is called the overcurrent status. The overcurrent status is retained when the voltage between the VDD pin  
and the VM pin is equal to or lower than the overcurrent release voltage (VRIOV).  
In the overcurrent status, the VM pin and VSS pin are shorted by the internal resistor between the VM pin and the  
VSS pin (RVMS) in the S-8239A Series. However, the VM pin is at VDD potential due to the external load as long as the  
external load is connected. When the external load is disconnected completely, the VM pin returns to VSS potential.  
The overcurrent status is released when the voltage between the VDD pin and the VM pin is equal to or higher than  
VRIOV  
.
3. UVLO status  
The S-8239A Series includes a UVLO (under voltage lock out) function to prevent the IC malfunction due to the  
decrease of the battery voltage when detecting the overcurrent. When the battery voltage in the normal status is  
equal to or lower than the UVLO detection voltage (VUVLO) and the status continues for the UVLO detection delay time  
(tUVLO) or longer, the DO pin becomes VSS potential (Active "L") or "High-Z" (Active "H"). This status is called the  
UVLO status.  
In the UVLO status, the VM pin and VSS pin are shorted by RVMS between the VM pin and the VSS pin in the  
S-8239A Series.  
After that, the UVLO status is released if the battery voltage becomes equal to or higher than VUVLO  
.
12  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
4. Delay circuit  
The detection delay times are determined by dividing a clock of approximately 3.5 kHz with the counter.  
Remark The overcurrent 2 detection delay time (tDIOV2) starts when the overcurrent 1 detection voltage (VDIOV1) is  
detected. When the overcurrent 2 detection voltage (VDIOV2) is detected over tDIOV2 after the detection of  
VDIOV1, the S-8239A Series becomes the overcurrent status within tDIOV2 from the time of detecting VDIOV2.  
DO pin  
High-Z  
0 tD tDIOV2  
VSS  
Time  
tDIOV2  
tD  
VDIOV2  
VINI pin  
VDIOV1  
VSS  
Time  
Figure 9  
5. DP pin  
The DP pin is a test pin for delay time measurement and it should be open in the actual application.  
If a capacitor whose capacitance is 1000 pF or more or a resistor whose resistance is 1 MΩ or less is connected to  
this pin, error may occur in the delay times or in the detection voltages.  
13  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Timing Charts  
1. Overcurrent detection  
1. 1 Active "L"  
1. 1. 1 With overcurrent 3 detection function  
VDIOV3  
VDIOV2  
VDIOV1  
VSS  
VINI pin  
VDD  
VRIOV  
VM pin  
VSS  
High-Z  
High-Z  
High-Z  
High-Z  
DO pin  
VSS  
External load connection  
Overcurrent 1 detection  
delay time (tDIOV1  
Overcurrent 2 detection  
Overcurrent 3 detection  
)
delay time (tDIOV2  
)
delay time (tDIOV3  
)
Status*1  
(1)  
(2)  
(1)  
(2)  
(1) (2)  
(1)  
*1. (1): Normal status  
(2): Overcurrent status  
Figure 10  
14  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
1. 1. 2 Without overcurrent 3 detection function  
VDIOV2  
VINI pin  
VDIOV1  
VSS  
VDD  
VRIOV  
VM pin  
VSS  
High-Z  
High-Z  
High-Z  
DO pin  
VSS  
External load connection  
Overcurrent 2 detection delay time (tDIOV2  
)
Overcurrent 1 detection delay time (tDIOV1  
)
Status*1  
(1)  
(1)  
(2)  
(1)  
(2)  
*1. (1): Normal status  
(2): Overcurrent status  
Figure 11  
15  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
1. 2 Active "H"  
1. 2. 1 With overcurrent 3 detection function  
VDIOV3  
VDIOV2  
VDIOV1  
VSS  
VINI pin  
VDD  
VRIOV  
VM pin  
VSS  
High-Z  
High-Z  
DO pin  
High-Z  
VSS  
External load connection  
Overcurrent 1 detection delay time (tDIOV1  
)
Overcurrent 2 detection delay time (tDIOV2  
)
Overcurrent 3 detection delay time (tDIOV3)  
Status*1  
(1)  
(2)  
(1)  
(2)  
(1)  
(2)  
(1)  
*1. (1): Normal status  
(2): Overcurrent status  
Figure 12  
16  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
1. 2. 2 Without overcurrent 3 detection function  
VDIOV2  
VINI pin  
VDIOV1  
VSS  
VDD  
VRIOV  
VM pin  
VSS  
High-Z  
High-Z  
DO pin  
VSS  
External load connection  
Overcurrent 1 detection delay time (tDIOV1  
)
Overcurrent 2 detection delay time (tDIOV2  
)
Status*1  
(1)  
(2)  
(1)  
(2)  
(1)  
*1. (1): Normal status  
(2): Overcurrent status  
Figure 13  
17  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
2. UVLO detection  
2. 1 Active "L"  
VUVLO  
Battery voltage  
VDD  
VM pin  
VSS  
High-Z  
DO pin  
High-Z  
VSS  
Charger connection  
External load connection  
UVLO detection delay time (tUVLO  
)
Status*1  
(1)  
(2)  
(1)  
*1. (1): Normal status  
(2): UVLO status  
Remark The charger is assumed to charge with a constant current.  
Figure 14  
18  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
2. 2 Active "H"  
VUVLO  
Battery voltage  
VDD  
VM pin  
VSS  
DO pin  
High-Z  
VSS  
Charger connection  
External load connection  
UVLO detection delay time (tUVLO  
)
Status*1  
(1)  
(2)  
(1)  
*1. (1): Normal status  
(2): UVLO status  
Remark The charger is assumed to charge with a constant current.  
Figure 15  
19  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
5-serial-cell Protection Circuit Examples  
Figure 16 and Figure 17 show the 5-serial-cell protection circuit examples used by the S-8239A Series and the S-8225A  
Series. Contact our sales representatives when using the circuit other than the following protection circuit examples.  
1. Active "L"  
EB+  
100 Ω  
1 MΩ  
1 MΩ  
FET4  
CTLD VDD  
0.1 μF 0.1 μF  
0.1 μF  
100 Ω  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
CTLC  
CO  
VC1  
VC2  
VC3  
FET2*2  
0.1 μF  
FET3  
DO  
0.1 μF  
S-8225A  
Series*1  
SEL1  
1 kΩ  
VM  
S-8239A  
Series  
DP  
VC4  
VC5  
VC6  
VSS  
0.1 μF  
FET1*2  
1 kΩ  
1 kΩ  
RVM  
RVDD  
CVDD  
330 kΩ  
RDOP  
RDO  
DO  
VDD  
SEL2  
CDT  
CCT  
0.1 μF  
1 μF  
VINI  
VSS  
0.1 μF  
0.1 μF 0.1 μF  
ZVINI  
RSENSE  
RVINI  
1 MΩ  
CHA−  
DFET  
CFET  
DIS−  
Figure 16  
2. Active "H"  
EB+  
100 Ω  
1 MΩ  
1 MΩ  
FET4  
CTLD VDD  
0.1 μF 0.1 μF  
100 Ω  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
1 kΩ  
CTLC  
CO  
VC1  
VC2  
VC3  
0.1 μF  
0.1 μF  
0.1 μF  
0.1 μF  
0.1 μF  
0.1 μF  
FET2*2  
FET3  
DO  
S-8225A  
RDOP  
1 MΩ  
Series*1  
SEL1  
1 kΩ  
VM  
DP  
S-8239A  
Series  
VC4  
VC5  
VC6  
VSS  
FET1*2  
1 kΩ  
1 kΩ  
RVM  
RVDD  
330 kΩ  
DO  
VDD  
SEL2  
CDT  
CCT  
RDO  
FET5  
CVDD  
1 μF  
VINI  
VSS  
0.1 μF 0.1 μF  
RVINI  
ZVINI  
RSENSE  
1 MΩ  
CHA−  
CFET  
DFET  
DIS−  
Figure 17  
20  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Table 7 Constants for External Components  
Symbol  
Min.  
300  
1
Typ.  
470  
Max.  
1000  
51  
Unit  
Ω
RVDD  
RVINI  
kΩ  
mΩ  
kΩ  
kΩ  
kΩ  
μF  
RSENSE  
RVM  
0
1
5.1  
5.1  
510  
0.1  
*3  
RDO  
330  
RDOP  
CVDD  
2000  
0.022  
1
*1. Refer to the data sheet of the S-8225A Series for the recommended value for external components  
of the S-8225A Series.  
*2. Use the products with the same model number for FET1 and FET2.  
*3. Set up the optimal constant according to the FET in use.  
Caution 1. The constants may be changed without notice.  
2. It has not been confirmed whether the operation is normal or not in circuits other than the connection  
example. In addition, the connection example and the constants do not guarantee proper operation.  
Perform thorough evaluation using the actual application to set the constants.  
3. The DP pin should be open.  
21  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Precautions  
The application conditions for the input voltage, output voltage, and load current should not exceed the package power  
dissipation.  
Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic  
protection circuit.  
ABLIC Inc. claims no responsibility for any and all disputes arising out of or in connection with any infringement by  
products including this IC of patents owned by a third party.  
22  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Characteristics (Typical Data)  
1. Current consumption  
1. 1 IOPE vs. Ta  
1. 2 IOPE vs. VDD  
8
8
6
4
2
0
6
4
2
0
0
40 25  
0
+25  
+50 +75 +85  
2
4
6
8
Ta [°C]  
VDD [V]  
1. 3 IUVLO vs. Ta  
8
6
4
2
0
40 25  
0
+25  
+50 +75 +85  
Ta [°C]  
2. Overcurrent detection / release voltage, UVLO function and delay times  
2. 1 VDIOV1 vs. Ta  
2. 2 VDIOV2 vs. Ta  
VDIOV1 = 0.08 V  
VDIOV2 = 0.4 V  
0.10  
0.09  
0.08  
0.07  
0.6  
0.5  
0.4  
0.3  
0.06  
0.2  
40 25  
0
25  
50 +75 +85  
40 25  
0
25  
50 +75 +85  
Ta [°C]  
Ta [°C]  
2. 3 VDIOV3 vs. Ta  
2. 4 VRIOV vs. Ta  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
1.8  
1.5  
1.2  
0.9  
0.9  
0.6  
40 25  
0
25  
50 +75 +85  
40 25  
0
+25  
+50 +75 +85  
Ta [°C]  
Ta [°C]  
23  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
2. 5 VDIOV1 vs. VDD  
2. 6 VDIOV2 vs. VDD  
VDIOV1 = 0.08 V  
VDIOV2 = 0.4 V  
0.10  
0.09  
0.08  
0.07  
0.06  
0.6  
0.5  
0.4  
0.3  
0.2  
2
3
4
5
6
7
8
2
3
4
5
6
7
8
VDD [V]  
VDD [V]  
2. 7 VDIOV3 vs. VDD  
2. 8 VRIOV vs. VDD  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
0.9  
1.8  
1.5  
1.2  
0.9  
0.6  
2
3
4
5
6
7
8
2
3
4
5
6
7
8
VDD [V]  
VDD [V]  
2. 9 tDIOV1 vs. Ta  
2. 10 tDIOV2 vs. Ta  
tDIOV1 = 1150 ms  
tDIOV2 = 1.12 ms  
1.6  
1.4  
1.2  
1.0  
1.6  
1.4  
1.2  
1.0  
0.8  
0.8  
40 25  
0
+25  
+50 +75 +85  
40 25  
0
+25  
+50 +75 +85  
Ta [°C]  
Ta [°C]  
2. 11 tDIOV3 vs. Ta  
2. 12 tDIOV1 vs. VDD  
tDIOV1 = 1150 ms  
400  
340  
280  
220  
1.6  
1.4  
1.2  
1.0  
0.8  
160  
40 25  
0
+25  
+50 +75 +85  
2
3
4
5
6
7
8
Ta [°C]  
VDD [V]  
24  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
2. 13 tDIOV2 vs. VDD  
2. 14 tDIOV3 vs. VDD  
tDIOV2 = 1.12 ms  
1.6  
1.4  
1.2  
1.0  
0.8  
400  
340  
280  
220  
160  
2
3
4
5
6
7
8
2
3
4
5
6
7
8
VDD [V]  
VDD [V]  
2. 15 VUVLO vs. Ta  
2. 16 tUVLO vs. VDD  
2.2  
2.1  
2.0  
1.9  
6.0  
5.5  
5.0  
4.5  
4.0  
3.5  
3.0  
1.8  
40 25  
0
25  
50 +75 +85  
1.5  
1.6  
1.7  
1.8  
1.9  
2.0  
Ta [°C]  
VDD [V]  
3. Output Resistance  
3. 1 RDOL vs. Ta  
10.0  
8.0  
6.0  
4.0  
2.0  
0.0  
40 25  
0
+25  
+50 +75 +85  
Ta [°C]  
25  
OVERCURRENT MONITORING IC FOR MULTI-SERIAL-CELL PACK  
S-8239A Series  
Rev.1.5_00  
Marking Specification  
1. SOT-23-6  
Top view  
(1) to (3):  
(4):  
Product code (Refer to Product name vs. Product code)  
6
5
4
Lot number  
(1) (2) (3) (4)  
1
2
3
Product name vs. Product code  
Product Name  
Product Code  
(1)  
(2)  
S
S
S
S
S
S
S
S
S
S
S
(3)  
A
B
C
D
E
F
S-8239AAA-M6T1U  
S-8239AAB-M6T1U  
S-8239AAC-M6T1U  
S-8239AAD-M6T1U  
S-8239AAE-M6T1U  
S-8239AAF-M6T1U  
S-8239AAG-M6T1U  
S-8239AAH-M6T1U  
S-8239AAI-M6T1U  
S-8239AAJ-M6T1U  
S-8239AAK-M6T1U  
3
3
3
3
3
3
3
3
3
3
3
G
H
I
J
K
26  
2.9±0.2  
1.9±0.2  
6
5
4
+0.1  
-0.05  
1
3
2
0.15  
0.95  
0.95  
0.35±0.15  
No. MP006-A-P-SD-2.1  
TITLE  
SOT236-A-PKG Dimensions  
MP006-A-P-SD-2.1  
No.  
ANGLE  
UNIT  
mm  
ABLIC Inc.  
4.0±0.1(10 pitches:40.0±0.2)  
+0.1  
-0  
2.0±0.05  
0.25±0.1  
ø1.5  
+0.2  
-0  
ø1.0  
4.0±0.1  
1.4±0.2  
3.2±0.2  
3
4
2 1  
6
5
Feed direction  
No. MP006-A-C-SD-3.1  
TITLE  
SOT236-A-Carrier Tape  
MP006-A-C-SD-3.1  
No.  
ANGLE  
UNIT  
mm  
ABLIC Inc.  
12.5max.  
9.0±0.3  
Enlarged drawing in the central part  
ø13±0.2  
(60°)  
(60°)  
No. MP006-A-R-SD-2.1  
TITLE  
SOT236-A-Reel  
MP006-A-R-SD-2.1  
No.  
ANGLE  
UNIT  
QTY  
3,000  
mm  
ABLIC Inc.  
Disclaimers (Handling Precautions)  
1. All the information described herein (product data, specifications, figures, tables, programs, algorithms and  
application circuit examples, etc.) is current as of publishing date of this document and is subject to change without  
notice.  
2. The circuit examples and the usages described herein are for reference only, and do not guarantee the success of  
any specific mass-production design.  
ABLIC Inc. is not liable for any losses, damages, claims or demands caused by the reasons other than the products  
described herein (hereinafter "the products") or infringement of third-party intellectual property right and any other  
right due to the use of the information described herein.  
3. ABLIC Inc. is not liable for any losses, damages, claims or demands caused by the incorrect information described  
herein.  
4. Be careful to use the products within their ranges described herein. Pay special attention for use to the absolute  
maximum ratings, operation voltage range and electrical characteristics, etc.  
ABLIC Inc. is not liable for any losses, damages, claims or demands caused by failures and / or accidents, etc. due to  
the use of the products outside their specified ranges.  
5. Before using the products, confirm their applications, and the laws and regulations of the region or country where they  
are used and verify suitability, safety and other factors for the intended use.  
6. When exporting the products, comply with the Foreign Exchange and Foreign Trade Act and all other export-related  
laws, and follow the required procedures.  
7. The products are strictly prohibited from using, providing or exporting for the purposes of the development of  
weapons of mass destruction or military use. ABLIC Inc. is not liable for any losses, damages, claims or demands  
caused by any provision or export to the person or entity who intends to develop, manufacture, use or store nuclear,  
biological or chemical weapons or missiles, or use any other military purposes.  
8. The products are not designed to be used as part of any device or equipment that may affect the human body, human  
life, or assets (such as medical equipment, disaster prevention systems, security systems, combustion control  
systems, infrastructure control systems, vehicle equipment, traffic systems, in-vehicle equipment, aviation equipment,  
aerospace equipment, and nuclear-related equipment), excluding when specified for in-vehicle use or other uses by  
ABLIC, Inc. Do not apply the products to the above listed devices and equipments.  
ABLIC Inc. is not liable for any losses, damages, claims or demands caused by unauthorized or unspecified use of  
the products.  
9. In general, semiconductor products may fail or malfunction with some probability. The user of the products should  
therefore take responsibility to give thorough consideration to safety design including redundancy, fire spread  
prevention measures, and malfunction prevention to prevent accidents causing injury or death, fires and social  
damage, etc. that may ensue from the products' failure or malfunction.  
The entire system in which the products are used must be sufficiently evaluated and judged whether the products are  
allowed to apply for the system on customer's own responsibility.  
10. The products are not designed to be radiation-proof. The necessary radiation measures should be taken in the  
product design by the customer depending on the intended use.  
11. The products do not affect human health under normal use. However, they contain chemical substances and heavy  
metals and should therefore not be put in the mouth. The fracture surfaces of wafers and chips may be sharp. Be  
careful when handling these with the bare hands to prevent injuries, etc.  
12. When disposing of the products, comply with the laws and ordinances of the country or region where they are used.  
13. The information described herein contains copyright information and know-how of ABLIC Inc. The information  
described herein does not convey any license under any intellectual property rights or any other rights belonging to  
ABLIC Inc. or a third party. Reproduction or copying of the information from this document or any part of this  
document described herein for the purpose of disclosing it to a third-party is strictly prohibited without the express  
permission of ABLIC Inc.  
14. For more details on the information described herein or any other questions, please contact ABLIC Inc.'s sales  
representative.  
15. This Disclaimers have been delivered in a text using the Japanese language, which text, despite any translations into  
the English language and the Chinese language, shall be controlling.  
2.4-2019.07  
www.ablic.com  

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SI9137LG

Multi-Output, Sequence Selectable Power-Supply Controller for Mobile Applications

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SI9122E

500-kHz Half-Bridge DC/DC Controller with Integrated Secondary Synchronous Rectification Drivers

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