ACE25AC400GUA8TH [ACE]

SPI NOR FLASH;
ACE25AC400GUA8TH
型号: ACE25AC400GUA8TH
厂家: ACE TECHNOLOGY CO., LTD.    ACE TECHNOLOGY CO., LTD.
描述:

SPI NOR FLASH

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中文:  中文翻译
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ACE25AC400G  
SPI NOR FLASH  
Description  
The ACE25AC400G is 4M-bit Serial flash supports the standard Serial Peripheral Interface (SPI). SPI  
clock frequency of up to 120MHz is supported for fast read command.  
Features  
4M-bit/2M-bit Serial Flash  
512K-byte/256K-byte  
256 bytes per programmable page  
Standard SPI  
Standard SPI: SCLK, CS#, SI, SO,  
High Speed Clock Frequency  
120MHz for fast read with 30PF load  
Program/Erase Speed  
Page Program time: 1.5ms typical  
Sector Erase time: 150ms typical  
Block Erase time: 0.8s typical  
Chip Erase time: 6s typical  
Flexible Architecture  
Sector of 4K-byte  
Block of 64k-byte  
Low Power Consumption  
10mA maximum active current  
5uA maximum standby current  
Single Power Supply Voltage: Full voltage range:2.7~3.6V  
Endurance 100,000 Program/Erase Cycle (Typical)  
Tem perature Grade: Default Industrial ( - 40to + 85 )  
Absolute Maximum Ratings  
Parameter  
Value  
-40 to 85  
-65 to 150  
200  
Unit  
Ambient Operating Temperature  
Storage Temperature  
Output Short Circuit Current  
Applied Input/Output Voltage  
VCC  
mA  
V
-0.5 to 4.0  
-0.5 to 4.0  
V
VER 1.3  
1
ACE25AC400G  
SPI NOR FLASH  
Packaging Type  
SOP-8/SOP-8L  
TSSOP-8  
DIP-8  
USON3*2-8  
Pin Configurations  
I/O  
I
Pin Name  
CS#  
Functions  
Chip Select Input  
Data Output  
Ground  
SO  
O
VSS  
SI  
I
I
Data Input  
SCLK  
VCC  
Serial Clock Input  
Power Supply  
Ordering information  
ACE25AC400G XX + X H  
Halogen-free  
U: Tube  
T: Tape and Reel  
Pb - free  
FM: SOP-8  
FML: SOP-8L (208mil)  
TM: TSSOP-8  
DP: DIP-8  
UA8: USON3*2-8  
VER 1.3  
2
ACE25AC400G  
SPI NOR FLASH  
Block Diagram  
Uniform Block Sector Architecture  
ACE25AC400G 64K Bytes Block SectorArchitecture  
Block  
Sector  
127  
……  
112  
Address Range  
07F000H  
……  
07FFFFH  
……  
7
070000H  
06F000H  
……  
070FFFH  
06FFFFH  
……  
111  
6
……  
96  
060000H  
……  
060FFFH  
……  
……  
……  
……  
……  
……  
……  
47  
……  
……  
2
……  
……  
……  
……  
……  
……  
……  
……  
……  
……  
02F000H  
……  
02FFFFH  
……  
……  
32  
020000H  
01F000H  
……  
020FFFH  
01FFFFH  
……  
31  
1
0
……  
16  
15  
……  
010000H  
00F000H  
……  
010FFFH  
00FFFFH  
……  
0
000000H  
000FFFH  
VER 1.3  
3
ACE25AC400G  
SPI NOR FLASH  
Device Operation  
The ACE25AC400G features a serial peripheral interface on 4 signals bus: Serial Clock (SCLK), Chip  
Select (CS#), Serial Data Input (SI) and Serial Data Output (SO). Both SPI bus mode 0 and 3 are  
supported. Input data is latched on the rising edge of SCLK and data shifts out on the falling edge of  
SCLK.  
Data Protection  
The ACE25AC400G provides the following data protection methods:  
Write Enable (WREN) command: The WREN command is set the Write Enable Latch bit (WEL). TheWEL  
bit will return to reset by the following situation:  
Power-Up  
Write Disable (WRDI)  
Write Status Register (WRSR)  
Page Program (PP)  
Sector Erase (SE) / Block Erase (BE) / Chip Erase (CE)  
Software Protection Mode:  
The Block Protect (BP2, BP1, BP0) bits define the section of the memory array that can be read but  
cannot be changed.  
Table 1.ACE25AC400G Protected Area Sizes  
Status bit  
Protect level  
Protect Block  
BP2  
0
BP1  
0
BP0  
0
0(none)  
1 (1 block)  
2 (2 blocks)  
3 (4 blocks)  
4 (8 blocks)  
5 (All)  
None  
Block 7  
Block 6-7  
Block 4-7  
All  
0
0
1
0
1
0
0
1
1
1
0
0
1
0
1
All  
1
1
0
6 (All)  
All  
1
1
1
7 (All)  
All  
VER 1.3  
4
ACE25AC400G  
SPI NOR FLASH  
Status Register  
S7  
S6  
Reserved  
S5  
S4  
S3  
S2  
S1  
S0  
Reserved  
Reserved  
BP2  
BP1  
BP0  
WEL  
WIP  
The status and control bits of the Status Register are as follows:  
WIP bit.  
The Write In Progress (WIP) bit indicates whether the memory is busy in program/erase/write status  
register progress. When WIP bit sets to 1, the device is busy in program/erase/write status register  
progress. When WIP bit sets 0, the device is not in program, erase or write status register.  
WEL bit.  
The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch. When set to 1,  
the internal Write Enable Latch is set. When set to 0, the internal Write Enable Latch is reset and no Write  
Status Register, Program or Erase command is accepted.  
BP2, BP1, BP0 bits.  
The Block Protect (BP2, BP1, and BP0) bits are non-volatile. They define the size of the area to be  
software protected against Program and Erase commands. These bits are written with the Write Status  
Register (WRSR) command. When the Block Protect (BP2, BP1, and BP0) bits are set to 1, the relevant  
memory area (as defined in Table1) becomes protected against Page Program (PP), Sector Erase (SE)  
and Block Erase (BE) commands. Chip Erase command will be ignored if one or more of the Block  
Protect (BP2, BP1, and BP0) bits are 1.  
VER 1.3  
5
ACE25AC400G  
SPI NOR FLASH  
Commands Description  
All commands, addresses and data are shifted in and out of the device, beginning with the most  
significant bit on the first rising edge of SCLK after CS# is driven low. Then, the one-byte command code  
must be shifted in to the device, most significant bit first on SI, each bit being latched on the rising edges  
of SCLK.  
See Table2, every command sequence starts with a one-byte command code. Depending on the  
command, this might be followed by address bytes, or by data bytes, or by both or none. CS# must be  
driven high after the last bit of the command sequence has been shifted in. For the command of Read,  
Fast Read, Read Status Register, and Read Device ID, the shifted-in command sequence is followed by a  
data-out sequence. CS# can be driven high after any bit of the data-out sequence is being shifted out.  
For the command of Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register, Write  
Enable, Write Disable, CS# must be driven high exactly at a byte boundary, otherwise the command is  
rejected. That is CS# must be driven high when the number of clock pulses after CS# being driven low is  
an exact multiple of eight. For Page Program, if at any time the input byte is not a full byte, nothing will  
happen and WEL will not be reset.  
Table2. Commands  
Command Name  
Write Enable  
Byte1  
06H  
Byte2  
Byte3  
Byte4  
Byte5  
Byte6  
n-Bytes  
Write Disable  
Read Status Register  
Write Status Register  
Read Data  
04H  
05H  
(S7-S0)  
(S7-S0)  
(continuous)  
(continuous)  
01H  
03H  
A23-A16  
A23-A16  
A23-A16  
A23-A16  
A23-A16  
A15-A8  
A15-A8  
A15-A8  
A15-A8  
A15-A8  
A7-A0  
A7-A0  
A7-A0  
A7-A0  
A7-A0  
(D7-D0)  
dummy  
(D7-D0)  
(Next byte) (continuous)  
Fast Read  
0BH  
02H  
(D7-D0)  
(continuous)  
Page Program  
Sector Erase  
(Next byte)  
20H  
Block Erase  
D8H  
C7/60H  
Chip Erase  
Manufacturer/Device  
ID  
90H  
9FH  
dummy  
dummy  
00H  
(MID7-MID0) (DID7-DID0) (continuous)  
(continuous)  
(JDID15-JDI (JDID7-JDID  
Read Identification  
(MID7-MID0)  
D8)  
0)  
VER 1.3  
6
ACE25AC400G  
SPI NOR FLASH  
ID Definitions  
Operation Code  
M7-M0  
0E  
ID15-ID8  
40  
ID7-ID0  
13  
9FH  
90H  
0E  
12  
Write Enable (WREN) (06H)  
The Write Enable (WREN) command is for setting the Write Enable Latch (WEL) bit. The Write Enable  
Latch (WEL) bit must be set prior to every Page Program (PP), Sector Erase (SE), Block Erase (BE), Chip  
Erase (CE) and Write Status Register (WRSR) command. The Write Enable (WREN) command  
sequence: CS# goes lowSend Write Enable commandCS# goes high.  
Figure1. Write Enable Sequence Diagram  
Write Disable (WRDI) (04H)  
The Write Disable command is for resetting the Write Enable Latch (WEL) bit. The Write Disable  
command sequence: CS# goes low Send Write Disable command CS# goes high. The WEL bit is reset by  
following condition: Power-up and upon completion of the Write Status Register, Page Program, Sector  
Erase, Block Erase and Chip Erase commands.  
Figure2. Write Disable Sequence Diagram  
VER 1.3  
7
ACE25AC400G  
SPI NOR FLASH  
Read Status Register (RDSR) (05H)  
The Read Status Register (RDSR) command is for reading the Status Register. The Status Register may  
be read at any time, even while a Program, Erase or Write Status Register cycle is in progress. When one  
of these cycles is in progress, it is recommended to check the Write In Progress (WIP) bit before sending  
a new command to the device. It is also possible to read the Status Register continuously.  
Figure3. Read Status Register Sequence Diagram  
Write Status Register (WRSR) (01H)  
The Write Status Register (WRSR) command allows new values to be written to the Status Register.  
Before it can be accepted, a Write Enable (WREN) command must previously have been executed. After  
the Write Enable (WREN) command has been decoded and executed, the device sets the Write Enable  
Latch (WEL).  
The Write Status Register (WRSR) command allows the user to change the values of the Block Protect  
(BP2, BP1, BP0) bits, to define the size of the area that is to be treated as read-only, as defined in  
Table1.0.  
The Write Status Register (WRSR) command has no effect on S6, S5, S1 and S0 of the Status Register.  
CS# must be driven high after the eighth bit of the data byte has been latched in. If not, the Write Status  
Register (WRSR) command is not executed. As soon as CS# is driven high, the self-timed Write Status  
Register cycle (whose duration is tW) is initiated. While the Write Status Register cycle is in progress, the  
Status Register may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress  
(WIP) bit is 1 during the self-timed Write Status Register cycle, and is 0 when it is completed. When the  
cycle is completed, the Write Enable Latch (WEL) is reset.  
Figure4. Write Status Register Sequence Diagram  
VER 1.3  
8
ACE25AC400G  
SPI NOR FLASH  
Read Data Bytes (READ) (03H)  
The Read Data Bytes (READ) command is followed by a 3-byte address (A23-A0), each bit being  
latched-in during the rising edge of SCLK. Then the memory content, at that address, is shifted out on SO,  
each bit being shifted out, at a Max frequency fR, during the falling edge of SCLK. The first byte  
addressed can be at any location. The address is automatically incremented to the next higher address  
after each byte of data is shifted out. Therefore, the whole memory can be read with a single Read Data  
Bytes (READ) command. During an Erase, Program or Write cycle, Read Data Byte (READ) command  
will be rejected without affecting the cycle in progress.  
Figure5. Read Data Bytes Sequence Diagram  
Read Data Bytes At Higher Speed (Fast Read)(0BH)  
The Read Data Bytes at Higher Speed (Fast Read) command is for quickly reading data out. It is followed  
by a 3-byte address (A23-A0) and a dummy byte, each bit being latched-in during the rising edge of SCLK.  
Then the memory content, at that address, is shifted out on SO, each bit being shifted out, at a Max  
frequency f , during the falling edge of SCLK. The first byte address can be at any location. The address  
C
is automatically incremented to the next higher address after each byte of data is shifted out.  
Figure6. Read Data Bytes at Higher Speed Sequence Diagram  
VER 1.3  
9
ACE25AC400G  
SPI NOR FLASH  
Page Program (PP) (02H)  
The Page Program (PP) command is for programming the memory. A Write Enable (WREN) command  
must previously have been executed to set the Write Enable Latch (WEL) bit before sending the Page  
Program command.  
The Page Program (PP) command is entered by driving CS# Low, followed by the command code, three  
address bytes and at least one data byte on SI. If the 8 least significant address bits (A7-A0) are not all  
zero, all transmitted data that goes beyond the end of the current page are programmed from the start  
address of the same page (from the address whose 8 least significant bits (A7-A0) are all zero). CS# must  
be driven low for the entire duration of the sequence. The Page Program command sequence: CS# goes  
low sending Page Program command 3-byte address on SI at least 1 byte data on SI CS# goes high. The  
command sequence is shown in Figure7. If more than 256 bytes are sent to the device, previously latched  
data are discarded and the last 256 data bytes are guaranteed to be programmed correctly within the  
same page. If less than 256 data bytes are sent to device, they are correctly programmed at the  
requested addresses without having any effects on the other bytes of the same page. CS# must be driven  
high after the eighth bit of the last data byte has been latched in; otherwise the Page Program (PP)  
command is not executed.  
As soon as CS# is driven high, the self-timed Page Program cycle (whose duration is tPP) is initiated.  
While the Page Program cycle is in progress, the Status Register may be read to check the value of the  
Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Page Program cycle,  
and is 0 when it is completed. Write Enable Latch (WEL) bit is reset to 0 at the end of the Page Program  
Cycle..  
Page Program (PP) command applied to a page which is protected by the Block Protect (BP2, BP1, BP0)  
bit (see Table1) is not executed.  
Figure7. Page Program Sequence Diagram  
VER 1.3 10  
ACE25AC400G  
SPI NOR FLASH  
Sector Erase (SE) (20H)  
The Sector Erase (SE) command is for erasing the all data of the chosen sector. A Write Enable (WREN)  
command must previously have been executed to set the Write Enable Latch (WEL) bit. The Sector Erase  
(SE) command is entered by driving CS# low, followed by the command code, and 3-address byte on SI.  
Any address inside the sector is a valid address for the Sector Erase (SE) command. CS# must be driven  
low for the entire duration of the sequence.  
The Sector Erase command sequence: CS# goes low sending Sector Erase command 3-byte address on  
SI CS# goes high. The command sequence is shown in Figure8. CS# must be driven high after the eighth  
bit of the last address byte has been latched in; otherwise the Sector Erase (SE) command is not  
executed. As soon as CS# is driven high, the self-timed Sector Erase cycle (whose duration is tSE) is  
initiated.  
While the Sector Erase cycle is in progress, the Status Register may be read to check the value of the  
Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Sector Erase cycle,  
and is 0 when it is completed. Write Enable Latch (WEL) bit is reset to 0 at the end of the Sector Erase  
cycle. Sector Erase (SE) command applied to a sector which is protected by the Block Protect (BP2, BP1,  
and BP0) bit (see Table1) is not executed.  
Figure8. Sector Erase Sequence Diagram  
Block Erase (BE) (D8H)  
The Block Erase (BE) command is for erasing the all data of the chosen block. A Write Enable (WREN)  
command must previously have been executed to set the Write Enable Latch (WEL) bit. The Block Erase  
(BE) command is entered by driving CS# low, followed by the command code, and three address bytes  
on SI. Any address inside the block is a valid address for the Block Erase (BE) command. CS# must be  
driven low for the entire duration of the sequence.  
The Block Erase command sequence: CS# goes low send Block Erase command 3-byte address on SI  
CS# goes high. The command sequence is shown in Figure9. CS# must be driven high after the eighth bit  
of the last address byte has been latched in; otherwise the Block Erase (BE) command is not executed.  
As soon as CS# is driven high, the self-timed Block Erase cycle (whose duration is tBE) is initiated. While  
the Block Erase cycle is in progress, the Status Register may be read to check the value of the Write In  
Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Block Erase cycle, and is 0  
when it is completed. Write Enable Latch (WEL) bit is reset to 0 at the end of the Block Erase cycle. Block  
Erase (BE) commands applied to a block which is protected by the Block Protect (BP2, BP1, BP0) bits  
(see Table1) is not executed.  
VER 1.3 11  
Figure9. Block Erase Sequence Diagram  
ACE25AC400G  
SPI NOR FLASH  
Chip Erase (CE) (60/C7H)  
The Chip Erase (CE) command is for erasing the all data of the chip. A Write Enable (WREN) command  
must previously have been executed to set the Write Enable Latch (WEL) bit .The Chip Erase (CE)  
command is entered by driving CS# Low, followed by the command code on Serial Data Input (SI). CS#  
must be driven Low for the entire duration of the sequence.  
The Chip Erase command sequence: CS# goes low send Chip Erase command CS# goes high. The  
command sequence is shown in Figure10. CS# must be driven high after the eighth bit of the command  
code has been latched in, otherwise the Chip Erase command is not executed. As soon as CS# is driven  
high, the self-timed Chip Erase cycle (whose duration is tCE) is initiated. While the Chip Erase cycle is in  
progress, the Status Register may be read to check the value of the Write In Progress (WIP) bit. The Write  
In Progress (WIP) bit is 1 during the self-timed Chip Erase cycle, and is 0 when it is completed. Write  
Enable Latch (WEL) bit is reset to 0 at the end of the Chip Erase cycle. The Chip Erase (CE) command is  
ignored if one or more sectors are protected by (BP2, BP1, and BP0) bits.  
Figure10. Chip Erase Sequence Diagram  
Read Manufacture ID/ Device ID (REMS) (90H)  
The Read Manufacturer/Device ID command is for reading both the JEDEC assigned Manufacturer ID  
and the specific Device ID. The command is initiated by driving the CS# pin low and shifting the command  
code “90H” followed by a 24-bit address (A23-A0) of 000000H. After which, the Manufacturer ID and the  
Device ID are shifted out on the falling edge of SCLK with most significant bit (MSB) first as shown in  
Figure11. If the 24-bit address is initially set to 000001H, the Device ID will be read first.  
Figure11. Read Manufacture ID/ Device ID Sequence Diagram  
VER 1.3 12  
ACE25AC400G  
SPI NOR FLASH  
Read Identification (RDID) (9FH)  
The Read Identification (RDID) command allows the 8-bit manufacturer identification to be read, followed  
by two bytes of device identification. The device identification indicates the memory type in the first byte,  
and the memory capacity of the device in the second byte. Any Read Identification (RDID) command  
while an Erase or Program cycle is in progress, is not decoded, and has no effect on the cycle that is in  
progress.  
The device is first selected by driving CS# to low. Then, the 8-bit command code for the command is  
shifted in.  
This is followed by the 24-bit device identification, stored in the memory, being shifted out on Serial Data  
Output, each bit being shifted out during the falling edge of Serial Clock. The command sequence is  
shown in Figure12. The Read Identification (RDID) command is terminated by driving CS# to high at any  
time during data output. After CS# is driven high, the device returns to Standby Mode and awaits for new  
command.  
Figure12. Read Identification ID Sequence Diagram  
VER 1.3 13  
ACE25AC400G  
SPI NOR FLASH  
Electrical Characteristics  
Power-On Timing  
Table3. Power-Up Timing and Write Inhibit Threshold  
Symbol  
Parameter  
VCC(min) To CS# Low  
Min  
10  
1
Max  
Unit  
us  
t
VSL  
t
Time Delay Before Write Instruction  
Write Inhibit Voltage  
10  
ms  
V
PUW  
V
WI  
1
2.5  
Initial Delivery State  
The device is delivered with the memory array erased: all bits are set to 1(each byte contains FFH).The  
Status Register contains 00H (all Status Register bits are 0).  
Data Retention and Endurance  
Parameter  
Test Condition  
150℃  
Min  
10  
Unit  
Years  
Years  
Cycles  
Minimum Pattern Data Retention Time  
Erase/Program Endurance  
125℃  
20  
-40 to 85℃  
100K  
Latch up Characteristics  
Parameter  
Min  
Max  
Input Voltage Respect To VSS On I/O Pins  
VCC Current  
-1.0V  
VCC+1.0V  
100mA  
-100mA  
VER 1.3 14  
ACE25AC400G  
SPI NOR FLASH  
Capacitance Measurement Condition  
Symbol  
Parameter  
Input Capacitance  
Min  
Typ  
Max  
6
Unit  
Conditions  
VIN=0V  
C
IN  
pF  
pF  
pF  
ns  
V
C
OUT  
Output Capacitance  
8
VOUT=0V  
C
L
Load Capacitance  
30  
Input Rise And Fall time  
Input Pulse Voltage  
5
0.1VCC to 0.8VCC  
0.2VCC to 0.7VCC  
0.5VCC  
Input Timing Reference Voltage  
Output Timing Reference Voltage  
V
V
Maximum Negative Overshoot Waveform  
Maximum Positive Overshoot Waveform  
Figure13. Input Test Waveform and MeasurementLevel  
VER 1.3 15  
ACE25AC400G  
SPI NOR FLASH  
DC Characteristics(T=-40~85,VCC=2.7~3.6V)  
Symbol  
Parameter  
Test Condition  
Min.  
Typ  
Max.  
±2  
Unit  
μA  
I
Input Leakage Current  
Output Leakage Current  
Standby Current  
LI  
I
±2  
μA  
LO  
CS#=VCC VIN=VCC or  
VSS  
I
1
5
μA  
CC1  
CLK=0.1VCC/0.9VCC at  
120MHz for Fast Read  
CLK=0.1VCC/0.9VCC at  
40MHz for Read  
15  
13  
20  
I
Operating Current(Read)  
mA  
CC3  
18  
I
Operating Current(PP)  
Operating Current(WRSR)  
Operating Current(SE)  
Operating Current(BE)  
Input Low Voltage  
CS#=VCC  
CS#=VCC  
CS#=VCC  
CS#=VCC  
10  
mA  
mA  
mA  
mA  
V
CC4  
I
10  
CC5  
I
10  
CC6  
I
10  
CC7  
V
-0.5  
0.2VCC  
VCC+0.4  
0.4  
IL  
V
Input High Voltage  
0.7VCC  
V
IH  
V
Output Low Voltage  
Output High Voltage  
IOL=1.6mA  
IOH=-100uA  
V
OL  
V
VCC-0.2  
V
OH  
VER 1.3 16  
ACE25AC400G  
SPI NOR FLASH  
AC Characteristics(T=-40~85,VCC=2.7~3.6VCL=30pf)  
Symbol  
Parameter  
Min.  
Typ  
Max.  
Unit  
f
Serial Clock Frequency For:Fast Read(0BH),  
Serial Clock Frequency For: Read (03H); Read  
ID (9FH), (90H)  
DC  
120  
MHz  
C
f
R
DC  
40  
MHz  
t
CLH  
Serial Clock High Time  
Serial Clock Low Time  
4
4
ns  
ns  
V/ns  
V/ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
CLL  
t
t
CLCH  
CHCL  
Serial Clock Rise Time(Slew Rate)  
Serial Clock Fall Time(Slew Rate)  
CS# Active Setup Time  
0.2  
0.2  
5
t
SLCH  
t
t
CHSH  
SHCH  
CS# Active Hold Time  
5
CS# Not Active Setup Time  
CS# Not Active Hold Time  
5
t
CHSL  
5
t
SHSL  
SHQZ  
CLQX  
DVCH  
CHDX  
CS# High Time (read/write)  
Output Disable Time  
20  
t
t
6
Output Hold Time  
1
2
2
5
5
5
5
t
t
Data In Setup Time  
Data In Hold Time  
t
HLCH  
Hold# Low Setup Time(relative to Clock)  
Hold# High Setup Time(relative to Clock)  
Hold# High Hold Time(relative to Clock)  
Hold# Low Hold Time(relative to Clock)  
Hold# Low To High-Z Output  
Hold# Low To Low-Z Output  
Clock Low To Output Valid  
t
t
t
HHCH  
t
CHHL  
CHHH  
t
HLQZ  
6
6
HHQX  
t
CLQV  
6.5  
t
WHSL  
Write Protect Setup Time Before CS# Low  
Write Protect Hold Time After CS# High  
20  
t
SHWL  
100  
CS# High To Standby Mode With Electronic  
Signature Read  
t
RES2  
0.1  
us  
t
Write Status Register Cycle Time  
Page Programming Time  
Sector Erase Time  
100  
1.5  
120  
0.8  
6
200  
5
ms  
ms  
ms  
s
W
t
t
t
PP  
SE  
BE  
CE  
300  
1.5  
10  
Block Erase Time  
t
Chip Erase Time  
s
VER 1.3 17  
ACE25AC400G  
SPI NOR FLASH  
Figure14. Serial Input Timing  
Figure15. Output Timing  
VER 1.3 18  
ACE25AC400G  
SPI NOR FLASH  
Packaging information  
DIP-8  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Max  
Min  
Max  
A
A1  
A2  
B
3.710  
0.510  
3.200  
0.380  
4.310  
0.146  
0.020  
0.126  
0.015  
0.170  
3.600  
0.570  
0.142  
0.022  
B1  
C
1.524BSC)  
0.060BSC)  
0.204  
9.000  
6.200  
7.320  
0.360  
9.400  
6.600  
7.920  
0.008  
0.354  
0.244  
0.288  
0.014  
0.370  
0.260  
0.312  
D
E
E1  
e
2.540 (BSC)  
0.100BSC)  
L
3.000  
8.400  
3.600  
9.000  
0.118  
0.331  
0.142  
0.354  
E2  
VER 1.3 19  
ACE25AC400G  
SPI NOR FLASH  
Packaging information  
SOP-8  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Max  
Min  
Max  
A
A1  
A2  
b
1.350  
0.100  
1.350  
0.330  
0.170  
4.700  
3.800  
5.800  
1.750  
0.250  
1.550  
0.510  
0.250  
5.100  
4.000  
6.200  
0.053  
0.004  
0.053  
0.013  
0.006  
0.185  
0.150  
0.228  
0.069  
0.010  
0.061  
0.020  
0.010  
0.200  
0.157  
0.244  
c
D
E
E1  
e
1.270 (BSC)  
0.050 (BSC)  
L
0.400  
0°  
1.270  
8°  
0.016  
0°  
0.050  
8°  
θ
VER 1.3 20  
ACE25AC400G  
SPI NOR FLASH  
Packaging information  
SOP-8L (208mil)  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Max  
Min  
Max  
A
A1  
A2  
b
2.150  
0.250  
1.900  
0.500  
0.250  
5.330  
8.100  
5.380  
0.085  
0.010  
0.075  
0.020  
0.010  
0.210  
0.319  
0.212  
0.050  
1.700  
0.350  
0.100  
5.130  
7.700  
5.180  
0.002  
0.067  
0.014  
0.004  
0.202  
0.303  
0.204  
c
D
E
E1  
e
1.270 (BSC)  
0.050 (BSC)  
L
0.500  
0°  
0.850  
8°  
0.020  
0°  
0.033  
8°  
θ
VER 1.3 21  
ACE25AC400G  
SPI NOR FLASH  
Packaging information  
TSSOP-8  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Max  
Min  
Max  
D
E
2.900  
4.300  
0.190  
0.090  
6.250  
3.100  
4.500  
0.300  
0.200  
6.550  
1.200  
1.000  
0.150  
0.114  
0.169  
0.007  
0.004  
0.246  
0.122  
0.177  
0.012  
0.008  
0.258  
0.047  
0.039  
0.006  
b
c
E1  
A
A2  
A1  
e
0.800  
0.050  
0.031  
0.002  
0.65 (BSC)  
0.25 (TYP)  
0.026 (BSC)  
L
0.500  
1°  
0.700  
7°  
0.020  
1°  
0.028  
H
0.01 (TYP)  
θ
7°  
VER 1.3 22  
ACE25AC400G  
SPI NOR FLASH  
Packaging information  
USON3*2-8  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Max  
Min  
Max  
A
A1  
b
0.450  
0.000  
0.180  
0.550  
0.050  
0.300  
0.017  
0.000  
0.007  
0.021  
0.002  
0.039  
b1  
c
0.160REF  
0.006REF  
0.100  
1.900  
1.400  
0.200  
2.100  
1.600  
0.004  
0.075  
0.055  
0.008  
0.083  
0.062  
D
D2  
e
0.500BSC  
1.500BSC  
3.100  
0.020BSC  
0.059BSC  
0.114  
Nd  
E
2.900  
1.500  
0.300  
0.200  
0.122  
0.067  
0.020  
0.12  
E2  
L
1.700  
0.500  
0.300  
0.059  
0.012  
0.066  
h
VER 1.3 23  
ACE25AC400G  
SPI NOR FLASH  
Revision History  
Revision  
Description  
Date  
1. Modify AC CHARACTERISTICS: tBE and tCE  
2. Revise data retention & Endurance cycling parameter  
3. Revise to new format with menu/bookmark capability and change 2M tCE  
to 6s.  
1.2  
May-21-2019  
4. Revise to add (90H) to FR serial clock parameter at page #17  
5. Revise to delete all content about SRWD.  
VER 1.3 24  
ACE25AC400G  
SPI NOR FLASH  
Notes  
ACE does not assume any responsibility for use as critical components in life support devices or systems  
without the express written approval of the president and general counsel of ACE Technology Co., LTD.  
As sued herein:  
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and shoes failure to perform when properly used in  
accordance with instructions for use provided in the labeling, can be reasonably expected to result in  
a significant injury to the user.  
2. A critical component is any component of a life support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life support device or system, or to affect its safety  
or effectiveness.  
ACE Technology Co., LTD.  
http://www.ace-ele.com/  
VER 1.3 25  

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