5962-9320401MEA [ADI]

CMOS, 12-Bit Serial DACPORT;


型号：	5962-9320401MEA
厂家：	ADI
描述：	CMOS, 12-Bit Serial DACPORT 转换器
文件：	总12页 (文件大小：78K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

REVISIONS

LTR

DESCRIPTION

DATE (YR-MO-DA)

00-08-25

APPROVED

Correction to table I differential nonlinearity test limit. Editorial changes

throughout. - drw

Raymond Monnin

Update drawing to current requirements. – drw

06-08-30

Raymond Monnin

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

PMIC N/A

REV

SHEET

PREPARED BY

Sandra Rooney

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

http://www.dscc.dla.mil

CHECKED BY

Sandra Rooney

STANDARD

MICROCIRCUIT

DRAWING

APPROVED BY

Michael A. Frye

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

MICROCIRCUIT, LINEAR, 12-BIT SERIAL

DACPORT, MONOLITHIC SILICON

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

94-01-20

AMSC N/A

REVISION LEVEL

SIZE

CAGE CODE

5962-93204

67268

SHEET

DSCC FORM 2233

APR 97

5962-E637-06

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)

and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or

Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

1.2 PIN. The PIN is as shown in the following example:

5962

93204

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

(see 1.2.3)

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are

marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type. The device type identifies the circuit function as follows:

Device type

Generic number

AD7243

Circuit function

12-bit serial DACPORT

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as

follows:

Device class

Device requirements documentation

Vendor self-certification to the requirements for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V

Certification and qualification to MIL-PRF-38535

1.2.4 Case outline. The case outline is as designated in MIL-STD-1835 as follows:

Outline letter

Descriptive designator

Terminals

Package style

Dual-in-line

GDIP1-T16 or CDIP2-T16

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

1.3 Absolute maximum ratings. 1/,2/

_DDto AGND, DGND ....................................................................................... -0.3 V dc to +17 V dc

_SSto AGND, DGND ....................................................................................... +0.3 V dc to -17 V dc

AGND to DGND............................................................................................... -0.3 V dc to V_DD+ 0.3 V dc

_OUTto AGND 3/ ............................................................................................ -6 V dc to V_DD+ 0.3 V dc

REFOUT to AGND........................................................................................... 0 V dc to V_DD

REFIN to AGND............................................................................................... -0.3 V dc to V_DD+ 0.3 V dc

Digital inputs to DGND..................................................................................... -0.3 V dc to V_DD+ 0.3 V dc

SDO to DGND.................................................................................................. -0.3 V dc to V_DD+ 0.3 V dc

Storage temperature range.............................................................................. -65°C to +150°C

Lead temperature (soldering, 10 seconds)....................................................... +300°C

Power dissipation (P_D) (T_A= +75°C) 4/ .......................................................... 450 mW

1.4 Recommended operating conditions.

Positive supply voltage range (V_DD) ................................................................. +12 V dc to +15 V dc 5/

Negative supply voltage range (V_SS)................................................................ 0 V dc or -12 V dc to -15 V dc 5/

Voltage reference input (REFIN)...................................................................... +5 V dc

Ambient operating temperature range.............................................................. -55°C to +125°C

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883

Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or

from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

________

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ T_A= +25°C unless otherwise specified.

3/ The outputs may be shorted to voltages in this range provided the power dissipation of the package is as specified. Short

circuit current is typically 80 mA.

4/ Derate power dissipation above T_A= +75°C by 6 mW/°C.

5/ Power supply tolerance ±5%.

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in

MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

ambient operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be

marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be

in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this

drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and

herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2

herein) involving devices acquired to this drawing is required for any change that affects this drawing.

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the

option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made

available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number 80 (see MIL-PRF-38535, appendix A).

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics.

Conditions 1/

Group A

subgroups

Device

type

-55°C ≤ T_A≤+125°C

unless otherwise specified

Limits

Max

Unit

Test

Symbol

Min

DNL

1, 2, 3

LSB

±1

±0.9

±5

Relative accuracy 2/

Differential nonlinearity 2/

Unipolar offset error 2/

Bipolar zero error

Guaranteed monotonic

DAC latch contents all 0s

DAC latch contents 2048

UOE

BZE

±6

±7

Full scale error 2/ 3/

Voltage reference output

REFOUT

4.95

5.05

Reference load current (I_L)

change (0-100 µA)

REFLC

1, 2, 3

-1

Reference load change

REFIN

RIN

V_INH

V_INL

I_IN

1, 2, 3

7. 8

4.95

2.4

5.05

µA

Reference input range 4/

Reference input current

Digital input high

voltage

Digital input low

voltage

7, 8

0.8

V_IN= 0 V to V_DD

1, 2, 3

±1

µA

Digital input current

Input capacitance

V_DD= 15.75 V, V_SS= -15.75 V

C_IN

See 4.4.1c

V_OL

I_SINK= 1 mA

1, 2, 3

0.4

Digital output low voltage

Digital output high voltage

V_OH

R_OUT

V_OUT

4.0

_SOURCE= 400 µA

Analog output range

resistor

Analog output voltage 5/

ranges

kΩ

Single supply, V_SS= 0 V

Dual supplies, V_SS= -12 V to -

15 V

-5

V_DD= 15.75 V, V_SS= -15.75 V,

output unloaded, 10 V range

Positive power supply

current

I_DD

1, 2, 3

V_DD= 15.75 V, V_SS= -15.75 V,

output unloaded, 10 V range,

dual supplies

Negative power supply

current

I_SS

See footnotes at end of table.

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

TABLE I. Electrical performance characteristics - continued.

Conditions 1/

Group A

subgroups

Device

type

-55°C ≤ T_A≤+125°C

unless otherwise specified

Limits

Max

Unit

Test

Symbol

Min

Voltage output settling

time, positive full scale 6/

change

Voltage output settling

time, negative full scale 6/

change

t_PS

See 4.4.1c

µs

V_SS= -12 V to -15 V

See 4.4.1c

t_NS

µs

SCLK mark/space ratio range

is 40/60 to 60/40, see figure 2

t₁

9, 10, 11

200

SCLK cycle time

7/ 8/

t₂

See figure 2

SYNC to SCLK falling

edge setup time

7/ 8/

t₃

120

190

SYNC to SCLK hold time

7/ 8/

10, 11

t₄

See figure 2

9, 10, 11

Data setup time

Data hold time

7/ 8/

100

t₆

t₇

t₆

See figure 2

9, 10, 11

SYNC high to LDAC low

7/ 8/

LDAC pulse width 7/ 8/

LDAC high to SYNC low

7/ 8/

t₉

9, 10, 11

CLR pulse width

7/ 8/

t₁₀

SD0 load capacitance is no

Greater than 50 pF

120

180

SCLK falling edge to SD0

Valid 7/ 8/ 9/

10, 11

1/ V_DD= +11.4 V to +15.75 V. V_SS= 0 V or –11.4 V to –15.75 V. AGND = DGND = 0 V. REFIN = +5 V. R_L= 2 kΩ.

C_L

= 100 pF to AGND. Parts are guaranteed over this supply range. Individual tests are performed with known worst case

supply conditions. Unless otherwise noted V_DD= +11.4 V and V_SS= –11.4 V

2/ V_DD= 14.25 V, V_SS= 0 V on 10 V range. V_DD= 14.25 V, V_SS= –14.25 V on 10 V range. V_DD= 11.4 V, V_SS= –11.4 V on

V range

3/ Measured with respect to REFIN and includes unipolar and bipolar offset error.

4/ REFIN is connected to REFOUT for all tests except R_IN.

5/ Analog output voltage ranges are guaranteed by passing of DC accuracy tests.

6/ 0 V to +10 V output range is available only with V_DD≥ +14.25 V.

7/ All input signals are specified with t_r= t_f= 5 ns (10% to 90% 0f 5 V) and timed from a voltage level of 1.6 V.

8/ Subgroups 10 and 11 are measured only at initial design characterization and after process or design changes which might

affect this parameter. This limit is guaranteed even though it is not tested.

9/ t₁₀measured only at initial design characterization and after process or design changes which might affect this parameter.

This limit is guaranteed even though it is not tested.

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

Device type

Case outline

Terminal number

Terminal symbol

REFIN

REFOUT

CLR

BIN/COMP

SCLK

SDIN

SYNC

DGND

LDAC

DCEN

SD0

AGND

R_OFS

V_OUT

V_SS

V_DD

FIGURE 1. Terminal connections.

SIZE

STANDARD

MICROCIRCUIT DRAWING

5962-93204

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

FIGURE 2. Timing waveforms.

SIZE

STANDARD

MICROCIRCUIT DRAWING

5962-93204

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

4. VERIFICATION

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in

accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015.

(2) T_A= +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table II herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table II herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

4.4.1 Group A inspection.

a. Tests shall be as specified in table II herein.

b. Subgroups 5, 6, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

c. Subgroup 4 shall be measured only for initial qualification and after any process or design changes which may affect

the parameter. Sample size is 15 devices with no failures, and all inputs tested.

TABLE II. Electrical test requirements.

Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Test requirements

(in accordance with

MIL-PRF-38535, table III)

Device

class M

Device

class Q

Device

class V

Interim electrical

parameters (see 4.2)

1, 7

Final electrical

parameters (see 4.2)

1, 2, 3, 4, 7, 8, 9 1/ 1, 2, 3, 4, 7, 8, 9 1/

1, 2, 3, 4, 7, 8, 9 1/

Group A test

requirements (see 4.4)

1, 2, 3, 4, 7, 8, 9

Group C end-point electrical

parameters (see 4.4)

1, 2, 3, 4, 7, 8, 9

Group D end-point electrical

parameters (see 4.4)

Group E end-point electrical

parameters (see 4.4)

1/ PDA applies to subgroup 1.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of

MIL-STD-883.

b. T_A= +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-

883.

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured

(see 3.5 herein).

a. End-point electrical parameters shall be as specified in table II herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device

classes must meet the postirradiation end-point electrical parameter limits as defined in table I at T_A= +25°C ±5°C,

after exposure, to the subgroups specified in table II herein.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes

Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor

prepared specification or drawing.

6.1.2 Substitutability. Device class Q devices will replace device class M devices.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system

application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users

and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic

devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43218-3990, or telephone

(614) 692-0547.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to

this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DSCC-VA.

SIZE

STANDARD

5962-93204

MICROCIRCUIT DRAWING

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

SHEET

DSCC FORM 2234

APR 97

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 06-08-30

Approved sources of supply for SMD 5962-93204 are listed below for immediate acquisition information only and shall

be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised

to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate

of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next

dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of

supply at http://www.dscc.dla.mil/Programs/Smcr/.

Vendor

CAGE

number

Standard microcircuit

drawing PIN 1/

Vendor similar

PIN 2/

5962-9320401MEA

24355

AD7243SQ/883B

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item

acquisition. Items acquired to this number may not

satisfy the performance requirements of this drawing.

Vendor CAGE

number

Vendor name

and address

24355

Analog Devices

Rt 1 Industrial Park

PO Box 9106

Norwood, MA 02062

Point of contact: (35361)495999

Raheen Business Park

Limerick, Ireland

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.

5962-9320401MEA [ADI]

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