5962R0051601VHA [ADI]
Aerospace +5V Precision Voltage Reference;
| 型号： | 5962R0051601VHA |
| 厂家： | 
ADI |
| 描述： | Aerospace +5V Precision Voltage Reference |
| 文件： | 总12页 (文件大小：109K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REVISIONS
LTR
A
DESCRIPTION
DATE (YR-MO-DA)
01-11-16
APPROVED
R. MONNIN
Add case outline H and make change to long term stability test as specified in
table I. - ro
B
C
D
Add case outlines P and 2. Make changes to 1.2.4, 1.3, and figure 1. - lgt
Drawing updated to reflect current requirements. -rrp
02-04-22
08-10-27
12-06-06
R. MONNIN
R. HEBER
C. SAFFLE
Add device type 02. Delete radiation exposure circuit. - ro
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
REV
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
D
D
SHEET
10
11
PREPARED BY
RICK OFFICER
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
STANDARD
MICROCIRCUIT
DRAWING
CHECKED BY
RAJESH PITHADIA
APPROVED BY
RAYMOND MONNIN
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
MICROCIRCUIT, LINEAR, POSITIVE 5-VOLT
ADJUSTABLE PRECISION VOLTAGE
REFERENCE, MONOLITHIC SILICON
DRAWING APPROVAL DATE
00-04-05
REVISION LEVEL
D
SIZE
A
CAGE CODE
AMSC N/A
5962-00516
67268
SHEET
1 OF 11
DSCC FORM 2233
APR 97
5962-E331-12
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and
M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part
or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
R
00516
01
V
G
A
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
REF05A
Circuit function
01
02
+5 volt precision voltage reference
with adjustable output
+5 volt precision voltage reference
with adjustable output
REF05A
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
M
Device requirements documentation
Vendor self-certification to the requirements for MIL-STD-883 compliant, non-
JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V
Certification and qualification to MIL-PRF-38535
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
Terminals
Package style
G
H
P
2
MACY1-X8
8
10
8
Can
Flat pack
Dual-in-line
Square leadless chip carrier
GDFP1-F10 or CDFP2-F10
GDIP1-T8 or CDIP2-T8
CQCC1-N20
20
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
2
DSCC FORM 2234
APR 97
1.3 Absolute maximum ratings. 1/
Input voltage (V ) ....................................................................................... 40 V dc
IN
Power dissipation (P ) ................................................................................ 500 mW
D
Output short circuit duration ......................................................................... Indefinite
Storage temperature .................................................................................... -65°C to +150°C
Lead temperature (soldering, 60 seconds) .................................................. +300°C
Junction temperature (T ) ............................................................................ -65°C to +150°C
J
Thermal resistance, junction-to-case (θ ) .................................................. See MIL-STD-1835
JC
Thermal resistance, junction-to-ambient (θ ):
JA
Case G ..................................................................................................... 150°C/W
Case H ..................................................................................................... 180°C/W
Case P ..................................................................................................... 148°C/W
Case 2 ...................................................................................................... 95°C/W
1.4 Recommended operating conditions.
Input voltage (V ) ....................................................................................... +15 V
IN
Ambient operating temperature range (T ) ................................................. -55°C to +125°C
A
1.5 Radiation features:
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s):
Device type 01 ............................................................................................. 100 krads(Si) 2/
Maximum total dose available (dose rate ≤ 10 mrads(Si)/s):
Device type 02 ............................................................................................. 50 krads(Si) 3/
_____
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883,
method 1019, condition A.
3/ Device type 02 radiation end point limits for the noted parameters are guaranteed only for the conditions specified in
MIL-STD-883 method 1019, condition D.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
3
DSCC FORM 2234
APR 97
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
-
Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 as specified herein, or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document
revision level control and shall be made available to the preparing and acquiring activity upon request.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
4
DSCC FORM 2234
APR 97
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of
MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of
product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime’s agent,
and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore
documentation shall be made available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 59 (see MIL-PRF-38535, appendix A).
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
5
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Conditions 1/ 2/
-55°C ≤ T ≤ +125°C
Test
Symbol
SY
Group A
subgroups
Device
type
Limits
Unit
A
V
= 15 V
IN
unless otherwise specified
No load
Min
Max
1
2,3
1
01, 02
1.4
2.0
1.4
1.4
mA
I
Quiescent supply current
M,D,P,L,R
M,D,P,L
01
02
1
1
01, 02
01, 02
%
V
±3.0
4.985
4.978
4.975
4.975
+15
∆V
R = 10 kΩ 3/
P
Output adjustment range
Output voltage
TRIM
5.015
5.022
5.025
5.025
+60
V
OUT
I = 0 mA
L
2,3
1
M,D,P,L,R
M,D,P,L
01
02
1
1
1
1
01, 02
01, 02
01, 02
01
mA
I
I
V
OUT
= 0 V 3/
Short circuit current
Sink current
OS
3/
-0.3
mA
S
LD reg
0.01
0.015
0.015
0.012
0.01
%/mA
I = 0 mA to 10 mA 4/
L
Load regulation
M,D,P,L,R
M,D,P,L
02
2,3
1
01, 02
01, 02
I = 0 mA to 8 mA 4/
L
LN reg
%/V
mA
V
IN
= 8 V to 33 V 4/
Line regulation
2,3
1
0.015
0.03
M,D,P,L,R
M,D,P,L
01
02
0.03
3/ 5/
1
2,3
4
01, 02
10
8
I
Load current
L
0.1 Hz to 10 Hz
6/
01, 02
01, 02
15
e
µV
Output voltage noise
np-p
P-P
Output voltage
temperature coefficient
8
8.5
ppm/°C
TCV
O
ppm /
1 kHr
∆V
∆t
/
OUT
Lot qualification test
7/
01, 02
100
Long term stability
See footnotes at end of table.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
1/ Device type 01 supplied to this drawing has been characterized through all levels P, L, and R of irradiation.
Device type 02 supplied to this drawing has been characterized to level L of irradiation.
However, device type 01, is only tested at the “R” level and device type 02 is only tested at the ”L” level. Pre and Post
irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical
measurements for any RHA level, T = +25°C.
A
2/ Device type 01 may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect.
Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A for device type 01 and condition D for device type 02. Device type 02 is tested at low dose rate.
3/ Not tested post irradiation.
4/ Line and load regulation specifications include the effect of self-heating.
5/ Minimum load current guaranteed by loading regulation test.
6
6/ TCV = ((V
– V ) / 5 V) x (1 / 180°C) x 10 where -55°C ≤ T ≤ +125°C.
MIN A
O
MAX
7/ Each wafer lot is tested for long-term stability at a chip temperature of 76°C for 168 hours. Maximum percent defective
size is 5 and acceptance number is 2 with sample size of 105.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
7
DSCC FORM 2234
APR 97
Device types
Case outlines
01, 02
G
P
H
2
(see note 2)
Terminal
number
Terminal symbol
NC
1
2
NC
NC
NC
NC
NC
NC
V
V
IN
V
IN
IN
3
TEMP
GND
TEMP
GND
TEMP
GND
4
5
TRIM
TRIM
TRIM
V
IN
6
NC
TEMP
NC
V
V
V
OUT
OUT
OUT
7
NC
NC
---
---
---
---
---
---
---
---
---
---
---
---
NC
NC
---
---
---
---
---
---
---
---
---
---
---
---
NC
NC
NC
NC
---
8
9
NC
10
11
12
13
14
15
16
17
18
19
20
GND
NC
---
TRIM
NC
---
---
NC
---
V
OUT
---
NC
NC
NC
NC
NC
---
---
---
---
NOTES:
1. NC = No connection.
2. Case is ground.
FIGURE 1. Terminal connections.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
SHEET
COLUMBUS, OHIO 43218-3990
D
8
DSCC FORM 2234
APR 97
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a. Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition B or C. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
(2) T = +125°C, minimum.
A
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a. Tests shall be as specified in table IIA herein.
b. Subgroups 5, 6, 7, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
9
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Subgroups
Test requirements
Subgroups
(in accordance with
(in accordance with
MIL-STD-883,
MIL-PRF-38535, table III)
method 5005, table I)
Device
Device
class Q
Device
class V
class M
1
1
1
Interim electrical
parameters (see 4.2)
Final electrical
1,2,3,4,8 1/
1,2,3,4,8 1/
1,2,3,4,8 1/ 2/
parameters (see 4.2)
Group A test
1,2,3,4,8
1,2,3,4,8
1,2,3,4,8
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
1
1
1
1
1
1
1 2/
1
1
1/ PDA applies to subgroup 1.
2/ Delta limits as specified in table IIB shall be required where specified, and delta limits
shall be computed with reference to the previous endpoint electrical parameters.
TABLE IIB. Burn-in and operating life test delta parameters. T = +25°C.
A
Parameter
Device types
01, 02
Limit
Delta
Max
Min
Max
4.985 V
5.015 V
±3 mV
V
OUT
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition B or C. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b. T = +125°C, minimum.
A
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
10
DSCC FORM 2234
APR 97
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a. End-point electrical parameters shall be as specified in table IIA herein.
b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at T = +25°C ±5°C,
A
after exposure, to the subgroups specified in table IIA herein.
4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883
method 1019, condition A for device type 01 and condition D for device type 02 and as specified herein.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
prepared specification or drawing.
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0544.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DLA Land and Maritime -VA and
have agreed to this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DLA Land and Maritime -VA.
SIZE
STANDARD
5962-00516
A
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
REVISION LEVEL
D
SHEET
COLUMBUS, OHIO 43218-3990
11
DSCC FORM 2234
APR 97
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 12-06-06
Approved sources of supply for SMD 5962-00516 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
Vendor
similar
PIN 2/
number
5962-0051601VGA
5962-0051601VHA
5962-0051601V2A
5962-0051601VPA
5962R0051601VGA
5962R0051601VHA
5962R0051601V2A
5962R0051601VPA
5962L0051602VHA
3/
3/
REF05AJ/QMLV
REF05AL/QMLV
REF05ARC/QMLV
REF05AZ/QMLV
REF05AJ/QMLR
REF05AL/QMLR
REF05ARC/QMLR
REF05AZ/QMLR
REF05AL/QMLL
3/
3/
24355
24355
3/
24355
24355
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from an approved source of supply.
Vendor CAGE
number
Vendor name
and address
24355
Analog Devices
Rt 1 Industrial Park
P.O. Box 9106
Norwood, MA 02062
Point of contact: 7910 Triad Center Drive
Greensboro, NC 27409-9605
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
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